Academic literature on the topic 'Kirk effect'
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Journal articles on the topic "Kirk effect"
Sun, Zhilin, Weifeng Sun, and Longxing Shi. "Modeling Kirk effect of RESURF LDMOS." Solid-State Electronics 49, no. 12 (December 2005): 1896–99. http://dx.doi.org/10.1016/j.sse.2005.09.006.
Full textQin, Z., E. M. Sankara Narayanan, and M. M. De Souza. "The Kirk effect in the DELDI technology." Microelectronics Journal 31, no. 3 (March 2000): 175–85. http://dx.doi.org/10.1016/s0026-2692(99)00119-6.
Full textEranen, S., M. M. Gronlund, M. Blomberg, and J. Kiihamaki. "The Kirk effect in the LIGBT devices." IEEE Transactions on Electron Devices 38, no. 8 (1991): 1919–24. http://dx.doi.org/10.1109/16.119034.
Full textNie, Weidong, Fayou Yi, and Zongguang Yu. "Kirk effect and suppression for 20 V planar active-gap LDMOS." Journal of Semiconductors 34, no. 5 (May 2013): 054003. http://dx.doi.org/10.1088/1674-4926/34/5/054003.
Full textMazhari, B., and H. Morkoç. "Effect of collector‐base valence‐band discontinuity on Kirk effect in double‐heterojunction bipolar transistors." Applied Physics Letters 59, no. 17 (October 21, 1991): 2162–64. http://dx.doi.org/10.1063/1.106115.
Full textTao, N. G., and C. R. Bolognesi. "Kirk effect mechanism in type-II InP∕GaAsSb double heterojunction bipolar transistors." Journal of Applied Physics 102, no. 6 (September 15, 2007): 064511. http://dx.doi.org/10.1063/1.2783764.
Full textZhou, D. B., D. J. Han, C. M. Sun, R. Yang, and K. Liang. "Low-threshold-switch phototransistor based on Kirk effect and float-zone silicon." Applied Physics Letters 90, no. 11 (March 12, 2007): 113513. http://dx.doi.org/10.1063/1.2713129.
Full textZampardi, P. J., and Dee-Son Pan. "Delay of Kirk effect due to collector current spreading in heterojunction bipolar transistors." IEEE Electron Device Letters 17, no. 10 (October 1996): 470–72. http://dx.doi.org/10.1109/55.537078.
Full textElias, D. C., and D. Ritter. "Kirk effect in bipolar transistors with a nonuniform dopant profile in the collector." IEEE Electron Device Letters 27, no. 1 (January 2006): 25–27. http://dx.doi.org/10.1109/led.2005.861401.
Full textLai, Ciou Jhong, Gene Sheu, Ting Yao Chien, Chieh Chih Wu, Tzu Chieh Lee, Ravi Deivasigamani, Ching Yuan Wu, Chandrashekhar, and Shao Ming Yang. "Analysis of Kirk effect of an innovated high side Side-Isolated N-LDMOS device." MATEC Web of Conferences 44 (2016): 02006. http://dx.doi.org/10.1051/matecconf/20164402006.
Full textDissertations / Theses on the topic "Kirk effect"
Ndoye, Mamadou Mustapha. "Contribution à l'étude du transistor bipolaire hyperfréquence sur puce de silicium." Bordeaux 1, 1997. http://www.theses.fr/1997BOR10682.
Full textThis work is a contribution to the study of the high-speed bipolar transistor on silicon chip. First, it presents two original methods allowing to reduce the Base-Collector extrinsic Capacitance, to increase the Base-Collector breakdown voltage, to increase the Voltage Early VA, to increase the maximum power gain Gpmax and to increase the transition frequency FT. Then, it presents a new transistor, hybrid structure between the vertical NPN and the lateral NPN, named bipolar-CLEV (lateral collector-vertical emitter). This study can be generalized to other high speed transistor technologies such as III-V substrate transistors or heterojunction transistors
Ndoye, Mamadou Moustapha. "Contribution à l'étude du transistor bipolaire hyperfréquence sur puce de silicium." Bordeaux 1, 1997. http://www.theses.fr/1997BOR10688.
Full textThis work is a contribution to the study of the high-speed bipolar transistor on silicon chip. First, it presents two original methods allowing to reduce the Base-Collector extrinsic Capacitance, to increase the Base-Collector breakdown voltage, to increase the Voltage Early VA, to increase the maximum power gain Gpmax and to increase the transition frequency FT. Then, it presents a new transistor, hybrid structure between the vertical NPN and the lateral NPN, named bipolar-CLEV (lateral collector-vertical emitter). This study can be generalized to other high speed transistor technologies such as III-V substrate transistors or heterojunction transistors
Ernst, Alexander N. (Alexander Nicolai). "Dynamics of the kink effect in InAlAs/InGaAs/InP HEMTs." Thesis, Massachusetts Institute of Technology, 1997. http://hdl.handle.net/1721.1/42741.
Full textIncludes bibliographical references (leaves 68-72).
by Alexander N. Ernst.
M.Eng.
Workman, Craig D. "Effects of Static Stretching on Foot Velocity During the Instep Soccer Kick." DigitalCommons@USU, 2010. https://digitalcommons.usu.edu/etd/602.
Full textMelton, Steven Allen. "Cryogenic temperature characteristics of bulk silicon and Silicon-on-Sapphire devices." Thesis, Kansas State University, 2012. http://hdl.handle.net/2097/14864.
Full textDepartment of Electrical and Computer Engineering
William Kuhn
Studies of Silicon-on-Sapphire (SOS) CMOS device operation in cryogenic environments are presented. The main focus was to observe the characteristic changes in high, medium and low threshold SOS NFETs as well as SOS silicide blocked (SN) resistors when the operational temperature is in the devices’ freeze-out range below 77 Kelvin. The measurements taken will be useful to any integrated circuit (IC) designer creating devices based on an SOS process intended to operate in cryogenic environments such as superconducting electronics and planetary probes. First, a 1N4001 rectifier and a 2N7000 NFET were tested to see how freeze-out effects standard diode and MOS devices. These devices were tested to see if the measurement setup could induce carrier freeze-out. Next, SOS devices were studied. Data was collected at room temperature and as low as 5 Kelvin to observe resistance changes in an SN resistor and kink effect, threshold voltage shifts and current level changes in transistors. A 2μm high threshold NFET was tested at room temperature, 50 Kelvin, 30 Kelvin and 5 Kelvin to observe effects on I-V curves at different temperatures with-in the freeze-out range. A 2μm medium threshold NFET was tested down to 56 Kelvin to see if the behavior is similar to the high threshold FET. A 2μm intrinsic, or low threshold, NFET was also tested with the assumption it would be the most susceptible to carrier freeze-out. All of the devices were found to behave well with only mild effects noted.
Lade, Per Magnar. "The effect of instep kick in intermittent sprint on heart rate and external workload." Thesis, Norges teknisk-naturvitenskapelige universitet, Institutt for bevegelsesvitenskap, 2010. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-11347.
Full textLerbinger, Klaus. "Problèmes spectraux en MHD : effets non idéaux, stabilité du kink interne." Paris 11, 1988. http://www.theses.fr/1988PA112109.
Full textLee, Jia-Hui Jane. "Effect of donor KIR Genotype on the outcome of bone marrow transplantation." Thesis, Lee, Jia-Hui Jane (2013) Effect of donor KIR Genotype on the outcome of bone marrow transplantation. Honours thesis, Murdoch University, 2013. https://researchrepository.murdoch.edu.au/id/eprint/16228/.
Full textLangdon, Samantha Jayne. "Crassula helmsii (Kirk) Cockayne in the UK : comparative studies investigating direct and indirect effects on native plants and newt breeding." Thesis, University of Liverpool, 2005. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.423359.
Full textPittari, Gianfranco. "NK Cell Tolerance of Self-Specific Apecific Activating Receptor KIR2DS1 in Individuals with Cognate HLA-C2 Ligand." Thesis, Paris 11, 2013. http://www.theses.fr/2013PA11T043.
Full textNK cells are regulated by inhibiting and activating cell surface receptors. Most inhibitory receptors recognize MHC-class I antigens, and protect healthy cells from NK cell-mediated auto-aggression. However, certain activating receptors, including the human killer cell Ig-like receptor (KIR) 2DS1, also recognize MHC-class I. This raises the question of how NK cells expressing such activating receptors are tolerized to host tissues. We investigated whether the presence of HLA-C2, the cognate ligand for 2DS1, induces tolerance in 2DS1-expressing NK cells. Anti-HLA-C2 activity could be detected in vitro in some 2DS1 positive NK clones irrespective of presence or absence of HLA-C2 ligand in the donor. The frequency of anti-HLA-C2 reactivity was high in donors homozygous for HLA-C1. Surprisingly, there was no significant difference in frequency of anti-HLA-C2 cytotoxicity in donors heterozygous for HLA-C2 and donors without HLA-C2 ligand. However, donors homozygous for HLA-C2 had significantly reduced frequency of anti-HLA-C2 reactive clones as compared to all other donors. 2DS1 positive clones that express inhibitory KIR for self-HLA class I were commonly non-cytotoxic, and anti-HLA-C2 cytotoxicity was nearly exclusively restricted to 2DS1 single positive clones lacking inhibitory KIR. 2DS1 single positive NK clones with anti-HLA-C2 reactivity were also present post-transplantation in HLA-C2 positive recipients of hematopoietic stem cell transplants from 2DS1 positive donors. These results demonstrate that many NK cells with anti-HLA-C2 reactivity are present in HLA-C1 homozygous and heterozygous donors with 2DS1. In contrast, 2DS1 positive clones from HLA-C2 homozygous donors are frequently tolerant to HLA-C2
Books on the topic "Kirk effect"
Tokto kangch'i myŏlchongsa: Ok'i kyŏnmunnok : chong myŏngchong e kwanhan panmunmyŏngsajŏk kirok. Kyŏnggi-do P'aju-si: Sŏhae Munjip, 2016.
Find full textWright, Keith T. Kick the sugar kraving before it kicks you: Sugar and its effects on your body and mind. Brooklyn, NY: A&B Publishers Group, 2001.
Find full textHirschfelder, Arlene. Kick Butts! Scarecrow Press, 2001.
Find full textWright, Keith T. Kick the Sugar Kraving Before It Kicks You: Sugar and Its Effects on Your Body and Mind. A & B Book Dist Inc, 2004.
Find full textauthor, Heffernan Andrew, ed. Your new prime: 30 days to better sex, eternal strength, and a kick-ass life after 40. 2015.
Find full textPathrose, Plato. ADAS and Automated Driving: A Practical Approach to Verification and Validation. SAE International, 2022. http://dx.doi.org/10.4271/9781468604146.
Full textRothenberger, Liane, Joachim Krause, Jannis Jost, and Kira Frankenthal, eds. Terrorismusforschung. Nomos Verlagsgesellschaft mbH & Co. KG, 2022. http://dx.doi.org/10.5771/9783748904212.
Full textHeinisch, Reinhard, Christina Holtz-Bacha, and Oscar Mazzoleni, eds. Political Populism. Nomos Verlagsgesellschaft mbH & Co. KG, 2021. http://dx.doi.org/10.5771/9783748907510.
Full textBook chapters on the topic "Kirk effect"
Hafez, I. M., G. Ghibaudo, and F. Balestra. "Analytical Modelling of the Kink Effect in MOS Transistors." In ESSDERC ’89, 897–900. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-52314-4_186.
Full textUkrainskii, I. I., M. K. Sheinkman, and K. I. Pokhodnia. "Kink Nature of Current Carriers in High-T c Superconductor-Oxides." In Electron-Electron Correlation Effects in Low-Dimensional Conductors and Superconductors, 41–47. Berlin, Heidelberg: Springer Berlin Heidelberg, 1991. http://dx.doi.org/10.1007/978-3-642-76753-1_5.
Full textEberlein, T. A. G., R. Jones, and A. T. Blumenau. "Theory of Dislocations in SiC: The Effect of Charge on Kink Migration." In Silicon Carbide and Related Materials 2005, 321–26. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-425-1.321.
Full textBažant, Zdeněk P., Jang-Jay H. Kim, Isaac M. Daniel, Emilie Becq-Giraudon, and Goangseup Zi. "Size effect on compression strength of fiber composites failing by kink band propagation." In Fracture Scaling, 103–41. Dordrecht: Springer Netherlands, 1999. http://dx.doi.org/10.1007/978-94-011-4659-3_7.
Full textFuse, M., Y. Sakata, T. Inoue, K. Yamauchi, and Y. Yatsuda. "Kink Effect in the Double-Gate Accumulation-Mode N-Channel Polysilicon Thin-Film Transistors." In Springer Proceedings in Physics, 370–75. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-93413-1_50.
Full textKalogera, V. "The Effects of Kick Velocities on the Formation of Low-Mass X-ray Binaries." In The Many Faces of Neutron Stars, 505–11. Dordrecht: Springer Netherlands, 1998. http://dx.doi.org/10.1007/978-94-015-9139-3_31.
Full textSarajlić, M., and R. M. Ramović. "N-Type Silicon Electron Mobility and its Relationship to the Kink Effect for Nano-Scaled SOI NMOS Devices." In Materials Science Forum, 153–58. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-441-3.153.
Full textChen, Li Qun, and Zheng Chen Qiu. "Electronic structure and doping effect of Ni and Co in the kink on the edge dislocation of bcc iron." In Defect and Diffusion Forum, 37–46. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/3-908451-37-x.37.
Full textMinguez, Rikardo, Erlantz Lizundia, Maider Iturrondobeitia, Ortzi Akizu-Gardoki, and Estibaliz Saez-de-Camara. "Education in Circular Economy: Focusing on Life Cycle Thinking at the University of the Basque Country." In Lecture Notes in Mechanical Engineering, 360–65. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-70566-4_57.
Full textQiu, Zheng Chen, and Li Qun Chen. "First-Principles Investigation of the Alloying Effect of Mn and Cr in the Kink on the Edge Dislocation in BCC Iron." In Defect and Diffusion Forum, 61–70. Stafa: Trans Tech Publications Ltd., 2008. http://dx.doi.org/10.4028/3-908451-54-x.61.
Full textConference papers on the topic "Kirk effect"
Jiang, Hao, Jie Zheng, and Marco Racanelli. "Kirk Effect Induced Bias Dependency of Thermal Resistance in SiGe HBTs." In 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. IEEE, 2008. http://dx.doi.org/10.1109/smic.2007.25.
Full textJiang, Hao, Jie Zheng, and Marco Racanelli. "Kirk Effect Induced Bias Dependency of Thermal Resistance in SiGe HBTs." In 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. IEEE, 2008. http://dx.doi.org/10.1109/smic.2008.25.
Full textJeon, Byung-Chul, Seung-Chul Lee, and Min-Koo Han. "Second Breakdown of 18V GGNMOS induced by Kirk Effect Under ESD." In 2002 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 2002. http://dx.doi.org/10.7567/ssdm.2002.p2-7.
Full textHuang, Y.-H., P. J. Liao, Y.-H. Lee, M. J. Chen, T. Y. Ho, and Lucy Chang. "Investigation of Kirk-Effect Induced Hot-Carrier-Injection in High-Voltage Power Devices." In 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2018. http://dx.doi.org/10.1109/ipfa.2018.8452525.
Full textLiu, H. G., Y. P. Zeng, O. Ostinelli, and C. R. Bolognesi. "Kirk Effect in Type-II InP/GaAsSb DHBTs with a Collector Doping Spike." In 2007 International Conference on Indium Phosphide and Related Materials. IEEE, 2007. http://dx.doi.org/10.1109/iciprm.2007.381211.
Full textYan, C. R., J. F. Chen, C. Y. Lin, H. T. Hsiu, Y. C. Liao, M. T. Yang, Y. C. Lin, and H. H. Chen. "Study of Off-State Breakdown and Hot-Carrier improvement by Suppression of Kirk Effect in LDMOS with Gradual Junction Structure." In 2012 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 2012. http://dx.doi.org/10.7567/ssdm.2012.ps-3-30.
Full textКозаченко, Екатерина, Ekaterina Kozachenko, Евгения Давыдова, and Evgenia Davydova. "A "Labyrinth" toy for 6-7 Years Old Children as a Way of Intellectual Development of a Child." In 29th International Conference on Computer Graphics, Image Processing and Computer Vision, Visualization Systems and the Virtual Environment GraphiCon'2019. Bryansk State Technical University, 2019. http://dx.doi.org/10.30987/graphicon-2019-2-202-206.
Full textPrager, Aaron A., Hubert C. George, Alexei O. Orlov, and Gregory L. Snider. "Cryogenic MOSFET kink effect abatement." In 2008 IEEE Silicon Nanoelectronics Workshop (SNW). IEEE, 2008. http://dx.doi.org/10.1109/snw.2008.5418490.
Full textAlficandra, Tandiyo Rahayu, Oktia Woro Kasmini Handayani, and Heny Setyawati. "Effect of Exercise Variations Against Kick Accuracy Into Hurdles (Shooting): Game Football Extracurricular Male Students of SMA Negeri 1 Kampar Kiri." In International Conference on Science and Education and Technology (ISET 2019). Paris, France: Atlantis Press, 2020. http://dx.doi.org/10.2991/assehr.k.200620.076.
Full textPark, H. J., M. Bawedin, K. Sasaki, J.-A. Martino, and S. Cristoloveanu. "Is there a kink effect in FDSOI MOSFETs?" In 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS). IEEE, 2017. http://dx.doi.org/10.1109/ulis.2017.7962564.
Full textReports on the topic "Kirk effect"
Wu, Yanlin, and C. Z. Cheng. Alpha particle effects on the internal kink modes. Office of Scientific and Technical Information (OSTI), August 1994. http://dx.doi.org/10.2172/10176063.
Full textWu, Y., C. Z. Cheng, and R. B. White. Alpha particle effects on the internal kink and fishbone modes. Office of Scientific and Technical Information (OSTI), June 1994. http://dx.doi.org/10.2172/10156796.
Full textCard, David, David S. Lee, Zhuan Pei, and Andrea Weber. Inference on Causal Effects in a Generalized Regression Kink Design. W.E. Upjohn Institute, January 2015. http://dx.doi.org/10.17848/wp15-218.
Full textSharma, Praveen Kumar, and Lloyd Smith. The effect of pressure and kick speed in soccer on head injury and goalkeeper movement. Purdue University, 2022. http://dx.doi.org/10.5703/1288284317535.
Full textCard, David, David Lee, Zhuan Pei, and Andrea Weber. Nonlinear Policy Rules and the Identification and Estimation of Causal Effects in a Generalized Regression Kink Design. Cambridge, MA: National Bureau of Economic Research, November 2012. http://dx.doi.org/10.3386/w18564.
Full textFerron, J. R., L. L. Lao, T. H. Osborne, E. J. Strait, T. S. Taylor, S. J. Thompson, A. D. Turnbull, and O. Sauter. The effect of the edge current density on confinement and kink mode stability in H-mode and VH-mode discharges. Office of Scientific and Technical Information (OSTI), July 1994. http://dx.doi.org/10.2172/10169668.
Full textG.Y. Fu, W. Park, H.R. Strauss, J. Breslau, J. Chen, S. Jardin, and L.E. Sugiyama. Global Hybrid Simulations of Energetic Particle Effects on the n=1 Mode in Tokamaks: Internal Kink and Fishbone Instability. Office of Scientific and Technical Information (OSTI), August 2005. http://dx.doi.org/10.2172/842537.
Full textCard, David, Andrew Johnston, Pauline Leung, Alexandre Mas, and Zhuan Pei. The Effect of Unemployment Benefits on the Duration of Unemployment Insurance Receipt: New Evidence from a Regression Kink Design in Missouri, 2003-2013. Cambridge, MA: National Bureau of Economic Research, January 2015. http://dx.doi.org/10.3386/w20869.
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