Dissertations / Theses on the topic 'Interfacial defect'
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Augustine, Anusree. "Swelling induced debonding of thin hydrogel films grafted on silicon substrate : the role of interface physical-chemistry." Electronic Thesis or Diss., Université Paris sciences et lettres, 2022. http://www.theses.fr/2022UPSLS040.
Full textHydrogel coatings are transparent and hydrophilic polymer networks that absorb a lot of water and can be suitable candidates for anti-mist coatings. However, swelling-induced stresses within the film can result in detrimental debonding of hydrogel and may fail. In this study, these debonding processes are investigated in the relation to the grafting density at the film/substrate interface, so as to control and predict the failure of the coatings during swelling or under contact stresses. For that purpose, we have developed a methodology consisting in monitoring the initiation and the propagation of swelling-induced delamination from well-controlled preexisting interface defects.Surface-attached poly(dimethylacrylamide) (PDMA) hydrogel thin films are prepared on silicon wafers from the simultaneous Cross-Linking And Grafting (CLAG) of functionalized polymer chains by thiol-ene click chemistry. This strategy allows to tune the film thickness (0.1-2 µm) while ensuring a homogeneous crosslinking density. In order to vary the strength of the film/substrate interface, the silicon wafer is grafted by mixing reactive mercaptosilane and unreactive propylsilane in various proportions prior to the formation of the hydrogel film. We characterize the mercaptosilane surface fraction thus obtained by XPS and TOF-SIMS analyses. Well-controlled line defects (width between 2 and 100 µm) are also created to nucleate delamination of the hydrogel from the substrate.Swelling-induced debonding of the film is achieved under a constant vapor flow ensuring water saturation. Optical observations show the progressive debonding of the film from the pre-existing line defects under the action of localized swelling stresses. We obtain a delamination pattern of typical so-called telephone cord instability. We measure the debonding propagation velocity where the hydrogel is grafted to the substrate. The debonding rate is found to decrease over two orders of magnitude when the amount of mercaptosilane in the reactive silane mixture is increased from 10% to 100% while increasing the covalent bonds between hydrogel and substrate. A threshold thickness for debonding is also observed. This threshold thickness increases with the amount of mercaptosilane used to graft the substrate. We derived quantitative values of the interface fracture energy from the measured thickness threshold with a simple fracture mechanics model
Hariharan, Avinash [Verfasser], Gunther [Gutachter] Eggeler, and Dierk [Gutachter] Raabe. "On the interfacial defect formation mechanism during laser additive manufactering of polycrystalline superalloys / Avinash Hariharan ; Gutachter: Gunther Eggeler, Dierk Raabe ; Fakultät für Maschinenbau." Bochum : Ruhr-Universität Bochum, 2020. http://d-nb.info/1204258333/34.
Full textPitthan, Filho Eduardo. "Investigação de defeitos e de métodos passivadores da região interfacial SiO2/SiC." reponame:Biblioteca Digital de Teses e Dissertações da UFRGS, 2017. http://hdl.handle.net/10183/156795.
Full textSilicon carbide (SiC) is a semiconductor with adequate properties to substitute silicon in electronic devices in applications that require high power, high frequency, and/or high temperature. Besides, a silicon dioxide (SiO2) film can be thermally grown on SiC in a similar way to that on Si. However, these films present higher density of electrical defects in the SiO2/SiC interfacial region when compared to the SiO2/Si interface, which limits the quality of the fabricated devices. Thus, it is important to understand the origin of the electrical degradation and to develop methods to passivate the defects in the SiO2/SiC interfacial region in order to develop the SiC technology. Aiming at a better understanding of the nature of defects at the SiO2/SiC interfacial region, the interaction of SiO2/SiC structures with water vapor isotopically enriched (D2 18O) and the interaction with carbon monoxide (CO), one of the SiC thermal oxidation by-products, were investigated. It was observed that the interaction with CO generates positive charges in the structure and that the deuterium incorporation from the water vapor is strongly dependent on the formation route of the SiO2 film. Knowing that nitrogen and phosphorous incorporation in the SiO2/SiC interfacial region are efficient methods to reduce the number of electrical defects in this region, the nitrogen incorporation in SiC structures by isotopically enriched ammonia (15NH3) annealings was investigated and a new method to incorporate phosphorous, by sputtering deposition was developed The proposed incorporation methods resulted in higher amounts of nitrogen and phosphorous then those found in literature, making them promising candidates to the electrical passivation of SiC. Besides the physico-chemical characterization using different techniques, the electrical characterization of Metal-Oxide-Semiconductor (MOS) capacitors was also performed, testing SiO2 films obtained by sputtering deposition or thermally grown. Additionally, a route to synthesize 18O standards for nuclear reaction analyses that are more stable over time was developed. Besides, a methodology to quantify phosphorous by nuclear reaction analysis was proposed. From the results obtained in this PhD thesis, a better understanding of the nature and the origin of defects present in the SiO2/SiC interfacial region was obtained, as well as a better understanding on how the passivating elements nitrogen and phosphorous interact in this region.
Guttman, Jeremy. "Polymer-based Tunnel Diodes Fabricated using Ultra-thin, ALD Deposited, Interfacial Films." The Ohio State University, 2016. http://rave.ohiolink.edu/etdc/view?acc_num=osu1469125487.
Full textMcAuley, Nigel Anthony. "A study of interfacial defects in hexagonal based bicrystals." Thesis, University of Liverpool, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.235507.
Full textKamal, Alm Hajer. "Interfacial Adhesion Failure : Impact on print-coating surface defects." Doctoral thesis, KTH, Fiber- och polymerteknologi, 2016. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-194166.
Full textQC 20161019
Casey, Siobhan. "A study of interfacial defects in semiconductor materials and metals." Thesis, University of Liverpool, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.240588.
Full textBesson, Rémy. "Simulation à l'échelle atomique de quelques propriétés volumiques et interfaciales d'alliages ordonnés fer-aluminium." Grenoble INPG, 1997. http://www.theses.fr/1997INPG4201.
Full textAdamczyk, Leslie Ann. "Understanding the Structure and Properties of Self-Assembled Monolayers for Interfacial Patterning." Diss., Virginia Tech, 2009. http://hdl.handle.net/10919/28018.
Full textPh. D.
Chen, Jhewn-Kuang. "The role of defects during precipitate growth in a Ni-45wt% Cr alloy." Diss., This resource online, 1995. http://scholar.lib.vt.edu/theses/available/etd-06062008-162241/.
Full textZhao, Yanfei. "Fundamental Solutions and Numerical Modeling of Internal and Interfacial Defects in Magneto-Electro-Elastic Bi-Materials." University of Akron / OhioLINK, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=akron1433529049.
Full textBondon, Arnaud. "Stabilité des écoulements stratifiés en coextrusion : Etude multi-échelle du rôle de l’architecture du copolymère aux interfaces." Thesis, Lyon, INSA, 2015. http://www.theses.fr/2015ISAL0100.
Full textSeveral polymers can be combined in one multilayer structure by reactive coextrusion. Tie-layers are often used to compatibilize the adjacent layers and may reduce or suppress the interfacial instabilities and the defects in the multilayer coextrusion flow. However, an additional defect defined as the “grainy” defect can be observed. In the best of our knowledge, no study in literature has been devoted to understand its origin. The phenomena are quite complex due to the coupling of the effects of flow and the physico-chemical mechanisms at the interface. The aim of this work is to understand the relations between the instabilities and the defects encountered in multilayer coextruded films and the role of the copolymer formed in-situ between tie and barrier layers. Polyamide 6 (PA6) and ethylene-vinyl alcohol copolymer (EVOH) were used as the barrier layers sandwiched in a polypropylene (PP) with or without a polypropylene grafted maleic anhydride (PP-g-MA) as a tie-layer. The effect of the process parameters and the structure of the polymers on the generation of the “grainy” defect was assessed in correlation with the rheological and the physicochemical properties of the layers. These experiments have shown that this defect appeared mainly in the compatibilized EVOH system and could be distinguished from the usual coextrusion instabilities. The interfacial properties between tie and barrier layers were investigated. The characterization of the interfacial morphology by TEM and AFM highlighted an irregular and rough interface between PP-g-MA and EVOH while a flat interface was observed with PA6 and PP-g-MA. Step shear and startup elongation rheology was shown to be sensitive to the copolymer at the polymer/polymer interface. The study of the interfacial properties highlighted that the copolymer architecture significantly impacts the interfacial roughness and the rheology of the multilayer stuctures. Hence, relations between the relaxation process, the interfacial morphology and the copolymer architecture were established in correlation with the generation of the macroscopic grainy defect in coextrusion
Fernando, Joseph F. S. "Crystal seeding and photochemistry of gold-zinc oxide hybrid nanoparticles." Thesis, Queensland University of Technology, 2016. https://eprints.qut.edu.au/101206/1/Joseph_Fernando_Thesis.pdf.
Full textRuffini, Antoine. "Influence de la plasticité sur le délaminage et le flambage de films minces déposés sur substrats." Phd thesis, Université de Poitiers, 2013. http://tel.archives-ouvertes.fr/tel-00931401.
Full textDyer, Michael R. El-Azab Anter. "Interfacial and defect structure in nanoscale ceria/zirconia superlattices." Diss., 2006. http://etd.lib.fsu.edu/theses/available/etd-04102006-132136.
Full textAdvisor: Anter El-Azab, Florida State University, College of Engineering, Dept. of Mechanical Engineering. Title and description from dissertation home page (viewed June 9, 2006). Document formatted into pages; contains xi, 64 pages. Includes bibliographical references.
Tseng, Eric Nestor, and 曾瀚輝. "The Study of Interfacial Defect of Metal/Oxide and its Room Temperature Ferromagnetism." Thesis, 2019. http://ndltd.ncl.edu.tw/handle/936eh5.
Full text國立臺灣科技大學
材料科學與工程系
107
In order to establish the relationship between interface structure and magnetic properties, in this study, defect structure of different types of cerium oxide-metal composite structures were analyzed and their room temperature ferromagnetic properties were discussed. Two composite structures were chosen: one was using silver as the core, the ceria nanoparticle as the shell; the other was using ceria hollow sphere as the substrate on which the silver nanoparticle was deposited. The main microstructure analysis techniques used were transmission electron microscopy, electron energy loss spectroscopy and X-ray absorption spectroscopy. In the silver/ceria core/shell structure, X-ray absorption spectroscopy results demonstrated electron transfer in p-orbital and the d-orbital of silver. The valence state of Ce was decreased after the interface formation. The proportion of Ce3+ was increased from 6% to 14%. The scanning transmission electron microscope and electron energy loss spectrum analysis of the further pointed out the distribution of Ce3+ was inhomogeneous. At the interface, the Ce3+ ratio was up to 40% and concentrated in a thin area of 7 Å; on the surface of the ceria shell, the Ce3+ ratio was 80%, and the Ce3+-rich region extended to 4 nm thick. Further changing the thickness of the shell layer from 15 nm to 35 nm effectively enhanced the saturation magnetization of the silver/ceria core shell structure. In the hollow composite structure, ceria hollow spheres were synthesized by spray pyrolysis at first. The sphere size was about 100 nm to 1 m, and the shell thickness was about 30 nm. Electron energy loss spectroscopy indicated that the cerium oxide hollow sphere had a high defect content, and the Ce3+ ratio was over 99% at a surface depth of 2.5 nm; the Ce3+ ratio inside the hollow sphere was also as high as 37%. The defect content and distribution could be controlled by post-annealing and treatment with an acidic solution. After annealing, the Ce3+ content on the surface of the hollow sphere was reduced to 22%, and the width of defect-rich region was reduced to 1.2 nm. On the other hand, the acidic solution treatment will further increase the Ce3+ content of the hollow sphere, especially in the hollow sphere. In this study, Ag nanoparticle deposition was performed on the ceria hollow spheres which were annealed for 2 hours to form a hollow composite structure. The electron transfer phenomena of silver was also observed at this interface by X-ray absorption spectroscopy. However, the electron energy loss spectrum analysis indicated that the Ce3+ concentration was about 56% at the interface of the hollow composite structure, and the defect-rich region was about 1 nm. It was worth noting that the Ce3+ concentration at the interface and the depth of the defect-rich region were lower than those of the exposed hollow sphere. Magnetic analysis indicated that the contribution of this interface to magnetism was smaller than that of the surface. Finally, the interface analysis results of the two composite structures were compared. It was found that the defect structure at the interface closely depended on the interface formation process, not only relate to the material. In addition, magnetic analysis results confirmed that the formation of the interface benefit to concentrate the defects, thereby enhancing the ferromagnetic strength. Combined the analysis of hollow composites, it was also demonstrated that as the defects were concentrated at the surface of the sphere had the greatest contribution to the formation of ferromagnetism. This result could be used as a reference for subsequent process development and theoretical calculations.
Hou, Shih-Jye, and 侯世傑. "Investigations of Interfacial Defects in the InGaP/GaAs Heterostructures." Thesis, 1996. http://ndltd.ncl.edu.tw/handle/17099200139456474811.
Full textAljubran, Murtadha A. "Arsenic Removal via Defect-Free Interfacially-Polymerized Thin-Film Composite Membranes." Thesis, 2020. http://hdl.handle.net/10754/666211.
Full textAli, Zain. "Development of State-Of-The-Art Interfacially Polymerized Defect-Free Thin-Film Composite Membranes for Gas- and Liquid Separations." Diss., 2019. http://hdl.handle.net/10754/646800.
Full textLi, Tzuyuan, and 李自原. "The Effect of Interfacial Defects on the Exchange Bias in the MgO/NiO/Ni3Fe System." Thesis, 2013. http://ndltd.ncl.edu.tw/handle/90899245158584528434.
Full text國立清華大學
材料科學工程學系
101
Exchange bias(EB) is an interfacial magnetic phenomenon. After a bilayer film made of a ferromagnet and antiferromagnet goes through a field-cooling process from above the antiferromagnet's Néel temperature, these two materials will couple magnetically at their interface. Thus, a nickel-iron/nickel-oxide bilayer can magnetically couple and enable EB. This phenomenon is related to the interfacial arrangement of atomic magnetic moments. However, it is quite difficult to experimentally observe the direction of magnetic moments for individual atoms, and even harder to resolve the necessary atomic arrangement in polycrystalline films such as NiFe/NiO. Thus, we try to simulate the magnetic moments of each atom coupling to permit EB at the interface of nickel-iron/nickel-oxide system by theoretical simulations and mapping these results onto experiments on the films grown on a crystalline MgO substrate. According to random-field model, we can obtain the exchange bias from the difference of interfacial energies before and after the change of magnetic field direction, then incorporating the thickness effects of the ferromagnetic layer and its magnetization. Afterwards, we compared the simulated results with the experimental data and determined reasonable configurations of atomic magnetic moments by comparison with results from HRTEM (high resolution transmission electron microscopy). The result of VASP simulations for exchange bias without roughness and with two kinds of roughness (2.20Å and 4.43Å) at the interface is 3.08±4.59(Oe), -24.27±3.13(Oe) and -195.53±10.88(Oe), respectively, and 0.00±3.88(Oe), -4.17±1.96(Oe) and -11.02±3.12(Oe) for different directions of applied field. All simulations revealed that interfacial roughness can strengthen the EB, which is consistent with experimental results. Thus, we can conclude that the configuration of atomic magnetic moments is similar to real case with the interfacial roughness as also shown from HRTEM. Afterwards, we calculated for the effect of interfacial dislocations on EB. When dislocations appear around the interface with 2.20Å roughness, EB increased from -24.27±3.13(Oe) to -143.46±4.37(Oe), and from -4.17±1.96(Oe) to -82.30±7.29(Oe) for different directions of applied field. As EB is essentially a spin-spin interaction between ferromagnet and antiferromagnet at the interface, any kind of modification of the interfacial spin configuration (e.g. quantity of the uncompensated interfacial antiferromagnetic spins and the relative orientation between antiferromagnetic and ferromagnetic spins) will affect the final exchange coupling. Thus, it is reasonable to conclude that an interface roughness can strengthen the interfacial exchange coupling by enhancing the defect-generated uncompensated condition. This is in agreement with recent Monte Carlo simulations [J. Spray and U. Nowak, J. Phys. D: Appl. Phys. 39, 4536 (2006)].
Liu, Tai-Kang, and 劉代康. "First-principles Analyses of Unusual Ferromagnetism in CoSi-SiO2 Core-Shell Nanowires from Internal and Interfacial Defects." Thesis, 2014. http://ndltd.ncl.edu.tw/handle/41297275361016902786.
Full text國立清華大學
材料科學工程學系
102
The diamagnetic semimetal CoSi presents unanticipated ferromagnetism as CoSi/SiO2 nanowires.[1] Using first-principles calculations, we offer physical insights into the origins of this unusual magnetism. Due to the distorted and dangling bonds near the nanowire surface with different bond lengths, the transition metal (Co) d-orbital electron spin up and spin down populations become asymmetric from the exchange interactions, providing the mechanism for some of the measured magnetization. However, the distorted and dangling bonds are clearly not the only factor contributing to the magnetization of the nanowires. The transmission electron microscopy selected area diffraction (SAD) analysis of the CoSi region suggested a superlattice structure existed in the cubic CoSi, and defects existing as ordered vacancies in the CoSi resulted in the observed SAD lower contrast image components. The simulation’s results for the Co moment in the CoSi nanowires without these ordered vacancies, but incorporating the surface and internal spin moments, is only 0.1638μB/atom, which is a ~80% shortfall compared to the experimental value of 0.8400μB/atom. When the effects of ordered vacancies are incorporated into the simulation, 0.8074μB per Co atom, a much better match with the experimental value (within ~3.881%) results, indicating that the internal ordered vacancies in the CoSi nanowires is a dominant mechanism of the ferromagnetism. Investigation on the density of states (DOS) of Co atoms around the ordered vacancies shows that the Co atoms with lower coordination number induce more magnetization due to the unpaired electrons created by the break of Co-Si bonds, which cause the unbalance between spin up and spin down states. But in some cases, the magnetization of Co in the structure without ordered vacancies is higher than the Co in the structure with ordered vacancies. In such case, the bond length of Co in the structure without ordered vacancies falls in a range that leads to stronger interacting spin-exchange through the overlap between magnetic orbitals.
"Multiscale Modeling of Mechanical Shock Behavior of Environmentally-Benign Lead-Free Solders in Electronic Packaging." Doctoral diss., 2011. http://hdl.handle.net/2286/R.I.9321.
Full textDissertation/Thesis
Ph.D. Mechanical Engineering 2011