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Journal articles on the topic 'Inelastic electron scattering'

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Published: 4 June 2021

Last updated: 9 February 2022

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1

VITKALOV, SERGEY, JING QIAO ZHANG, A. A. BYKOV, and A. I. TOROPOV. "NONLINEAR TRANSPORT OF 2D ELECTRONS IN MAGNETIC FIELD." International Journal of Modern Physics B 23, no. 12n13 (May 20, 2009): 2689–92. http://dx.doi.org/10.1142/s0217979209062190.

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Electric field induced, spectacular reduction of longitudinal resistivity of two dimensional electrons placed in strong magnetic field is studied in broad range of temperatures. The data are in good agreement with theory, considering the strong nonlinearity of the resistivity as result of non-uniform spectral diffusion of 2D electrons induced by the electric field. Comparison with the theory gives inelastic scattering time τin of the 2D electrons. In temperature range T = 2 - 20 K for overlapping Landau levels, the inelastic scattering rate 1/τin is found to be proportional to T2, indicating dominant contribution of the electron-electron interaction to the inelastic electron relaxation. At strong magnetic field, at which Landau levels are well separated, the inelastic scattering rate is proportional to T3 at high temperatures. We suggest the electron-phonon scattering as the dominant mechanism of the inelastic electron relaxation in this regime. At low temperature and separated Landau levels an additional regime of the inelastic electron relaxation is observed: τin ~ T-1.26.

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2

Wise, J. E., J. S. McCarthy, R. Altemus, B. E. Norum, R. R. Whitney, J. Heisenberg, J. Dawson, and O. Schwentker. "Inelastic electron scattering fromCa48." Physical Review C 31, no. 5 (May 1, 1985): 1699–714. http://dx.doi.org/10.1103/physrevc.31.1699.

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3

Braunstein, M. R., J. J. Kraushaar, R. P. Michel, J. H. Mitchell, R. J. Peterson, H. P. Blok, and H. de Vries. "Inelastic electron scattering fromNi64." Physical Review C 37, no. 5 (May 1, 1988): 1870–77. http://dx.doi.org/10.1103/physrevc.37.1870.

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4

Millener, D. J., D. I. Sober, H. Crannell, J. T. O’Brien, L. W. Fagg, S. Kowalski, C. F. Williamson, and L. Lapikás. "Inelastic electron scattering fromC13." Physical Review C 39, no. 1 (January 1, 1989): 14–46. http://dx.doi.org/10.1103/physrevc.39.14.

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5

Van Dyck, D. "Inelastic Scattering and Interference." Microscopy and Microanalysis 3, S2 (August 1997): 1033–34. http://dx.doi.org/10.1017/s1431927600012058.

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Recently it has been a matter of controversy whether inelastically scattered electrons can yield interference fringes so as to obtain holograms, and in particular whether compensation of energy loss in the object by energy gain in the source will maintain coherence [1]. In discussions about coherence (and wave mechanisms in general) it is always dangerous to rely on intuitive arguments (exchange of energy, time of interaction, etc.). In this work we will start from the most general approach, which is inspired by the treatment of inelastic electron diffraction crystals by Yoshioka in 1957 [2]. Energy exchanges are always described quantummechanically by an Hamiltonian. Therefore we can only investigate the balance between energy exchange properly if electron, object, and source are described by one global Hamiltonian. With source we mean the whole electron generating system (emitter, accelerator, condensor).Consider a global system consisting of an electron, with position vector r, an object with particle vectors ri, and a source with particles at rα.

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6

Wang, L., J. Liu, and J. M. Cowley. "Zero-Loss Energy Filtered REM and RHEED Observations on Rutile (110) Surface." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 968–69. http://dx.doi.org/10.1017/s0424820100150678.

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In reflection electron microscopy (REM), the surface reflection electrons undergo both elastic and inelastic scattering within a crystal. The dominant inelastic processes are phonon scattering, valence electron excitation, bulk and surface plasmon excitation and combinations of these processes. Multiple inelastic scattering processes are also probable as the mean traveling distance of surface reflection electrons is about 10 to 100 nm. In reflection high energy electron diffraction pattern (RHEED), 50% to 90% of the electrons contributing to surface reflection spots used for imaging have suffered energy loss of more than 10 eV, thus the main limitation on REM image resolution is due to the chromatic aberration effects given by the energy spread from inelastic scattering. An energy filter fitted inside a TEM microscope can remove most of the inelastic scattering contribution and so improve the contrast and resolution. Oxygen-annealed rutile (001), (100) and (110) surfaces were previously studied by REM and RHEED techniques without energy filtering.

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7

Wang, Z. L. "Modified multislice theory for calculating the energy-filtered inelastic images in REM and HREM." Acta Crystallographica Section A Foundations of Crystallography 45, no. 2 (February 1, 1989): 193–99. http://dx.doi.org/10.1107/s0108767388011511.

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Inelastic plasmon diffuse scattering (PDS) is treated as an effective position-dependent potential perturbing the incident electron wavelength in a solid surface, resulting in an extra phase grating term in the slice transmission function. This potential is derived for the geometry of reflection electron microscopy (REM) and high-resolution electron microscopy (HREM). The energy-filtered inelastic images can be calculated following the routine image simulation procedures by using different slice transmission functions for the elastic and inelastic waves, by considering the 'transitions' of the elastic scattered electrons to the inelastic scattered electrons. It is predicted that the inelastic scattering could modify the electron intensity distribution at a surface. It is possible to take high-resolution energy-filtered inelastic images of crystals, the resolution of which is about the same as that taken from the elastic scattered electrons.

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8

Luo, Suichu, John R. Dunlap, Richard W. Williams, and David C. Joy. "Local thickness determination by Electron Energy Loss Spectroscopy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 944–45. http://dx.doi.org/10.1017/s0424820100172450.

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In analytical electron microscopy, it is often important to know the local thickness of a sample. The conventional method used for measuring specimen thickness by EELS is:where t is the specimen thickness, λi is the total inelastic mean free path, IT is the total intensity in an EEL spectrum, and I0 is the zero loss peak intensity. This is rigorouslycorrect only if the electrons are collected over all scattering angles and all energy losses. However, in most experiments only a fraction of the scattered electrons are collected due to a limited collection semi-angle. To overcome this problem we present a method based on three-dimension Poisson statistics, which takes into account both the inelastic and elastic mixed angular correction.The three-dimension Poisson formula is given by:where I is the unscattered electron intensity; t is the sample thickness; λi and λe are the inelastic and elastic scattering mean free paths; Si (θ) and Se(θ) are normalized single inelastic and elastic angular scattering distributions respectively ; F(E) is the single scattering normalized energy loss distribution; D(E,θ) is the plural scattering distribution,

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9

Marinelli, J. R., and J. R. Moreira. "Inelastic transverse electron scattering onMg25." Physical Review C 45, no. 4 (April 1, 1992): 1556–63. http://dx.doi.org/10.1103/physrevc.45.1556.

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10

Rossouw, C. J. "Coherence in inelastic electron scattering." Ultramicroscopy 16, no. 2 (January 1985): 241–54. http://dx.doi.org/10.1016/0304-3991(85)90078-6.

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11

Draxl, Claudia. "Fundamentals of inelastic electron scattering." Few-Body Systems 2, no. 3 (1987): N49. http://dx.doi.org/10.1007/bf01080838.

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12

Cheng, S. C., Y. Y. Wang, and V. P. Dravid. "The measurements of the elastic-inelastic multiple scattering electron intensity in EELS." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 300–301. http://dx.doi.org/10.1017/s0424820100137872.

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The Electron energy loss function in the low energy range is determined by collective excitation of valence electrons and charge carriers, i.e. plasmons, as well as interband and intraband excitations. The explicit dependence of the cross-section on the momentum transfer q allows the observation of nonvertical interband transition and a measurement of the dispersion of plasmon excitations. The drawback of the momentum resolved electron spectroscopy is the multiple scattering, which often obscure the single scattering events. Under relatively small scattering angles, both strong elasticinelastic multiple (E-I-M) scattering and elastic scattering events compared to the inelastic scattering have been reported. In order to find out in what momentum range the E-I-M scattering intensity can be ignored in the momentum resolved electron spectroscopy, we have measured the angular dependency of the intensities of the E-I-M scattering electrons Ie+in. The intensities of the elastic scattering electrons Ie as well as of the inelastic scattering electrons Iin were also measured and are presented in this paper together. A simple relationship between Ie and Ie+in is found.

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13

Shimizu, Ryuichi, and Hideki Yoshikawa. "Monte Carlo Simulation of Background in electron spectroscopies." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1664–65. http://dx.doi.org/10.1017/s0424820100132959.

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Recent progress in getting precise knowledge on inelastic scattering, particularly, on dielectric functions for various types of material has been enabling the electron spectroscopic spectra obtained by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS) and reflection electron energy loss spectroscopy (REELS) to be reproduced theoretically with considerable success. For this Monte Carlo simulation is probably most powerful tool, leading to more comprehensive understanding of not only the signal generation but also the background formation.In this paper we present a Monte Carlo simulation approach based on the uses of Mott-scattering cross section and appropriate dielectric function for describing elastic scattering and inelastic scatterings, respectively. With respect to the dielectric function one can use, to good approximation in general, the optical dielectric constants from the data base provided by synchrotron radiation facilities.As typical examples of the Monte Carlo simulation the applications to the AES, XPS, and REELS are shown in Figs. 1, 2, and 3, respectively. The N(E)-spectrum in Fig.l demonstrates how the Monte Carlo simulation describes the energy loss spectrum due to plasmon excitation near at primary energy, general shape of energy distributions of backscattered electrons and secondary electrons.

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14

Sanborn, B. A. "Total Dielectric Function Approach to the Electron Boltzmann Equation for Scattering from a Two-Dimensional Coupled Mode System." VLSI Design 6, no. 1-4 (January 1, 1998): 69–72. http://dx.doi.org/10.1155/1998/70276.

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The nonequilibrium total dielectric function lends itself to a simple and general method for calculating the inelastic collision term in the electron Boltzmann equation for scattering from a coupled mode system. Useful applications include scattering from plasmon-polar phonon hybrid modes in modulation doped semiconductor structures. This paper presents numerical methods for including inelastic scattering at momentum-dependent hybrid phonon frequencies in the low-field Boltzmann equation for two-dimensional electrons coupled to bulk phonons. Results for electron mobility in GaAs show that the influence of mode coupling and dynamical screening on electron scattering from polar optical phonons is stronger for two dimensional electrons than was previously found for the three dimensional case.

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15

Паршин, А. С., Ю. Л. Михлин, and Г. А. Александрова. "Спектроскопия потерь энергии отраженных электронов γ-Fe-=SUB=-2-=/SUB=-O-=SUB=-3-=/SUB=-." Физика твердого тела 63, no. 8 (2021): 1049. http://dx.doi.org/10.21883/ftt.2021.08.51152.053.

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The reflection electron energy losses spectra, obtained in a wide primary electron energy range of 200 - 3000 eV, are investigated. From these experimental spectra, for each primary electron energy, the spectra of the inelastic scattering cross section of electrons are calculated as the dependence of the product of the inelastic electron mean free path and the differential inelastic scattering cross section of electrons on the electron energy loss. The analysis of the fine structure of the reflection electron energy losses was carried out by decomposing the electron energy losses spectra in the region of energy losses of valence electrons into elementary peaks. A relationship is established between each of their elementary peaks with single and multiple energy losses due to the excitation of bulk and surface plasmons and interband transitions of electrons from the valence band to free states above the Fermi level. The analysis of the obtained results was carried out on the basis of experimental and theoretical literature data on the band structure of  Fe2O3.

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16

CAI, W., T. F. ZHENG, P. HU, and M. LAX. "ONE-DIMENSIONAL ELECTRON TUNNELING IN SEMICONDUCTOR INCLUDING INELASTIC SCATTERING." Modern Physics Letters B 05, no. 03 (February 10, 1991): 173–80. http://dx.doi.org/10.1142/s0217984991000216.

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17

Wang, Z. L. "Multiple-inelastic phonon, single electron, and valence excitations in high-energy electron scattering." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 1012–13. http://dx.doi.org/10.1017/s0424820100089378.

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In this paper, inelastic scattering theory, as described in Reference 1, is applied to multiple-elastic and -inelastic electron scattering in crystals. Under the small angle approximation, the inelastically scattered wave Ψn of energy En=E-en after exciting the nth crystal excited state can be taken as a position modification to the elastically scattered wave,(1)where Ψn0(r) is the elastic wave of wave vector kn and satisfies the elastic scattering Schrödinger equation,(2)and V = H'nn is the crystal potential; . Under the small angle and forward scattering approximations(3)

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18

Vincent, R. "Quantitative energy-filtered electron diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 992–93. http://dx.doi.org/10.1017/s0424820100172693.

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Microanalysis and diffraction on a sub-nanometre scale have become practical in modern TEMs due to the high brightness of field emission sources combined with the short mean free paths associated with both elastic and inelastic scattering of incident electrons by the specimen. However, development of electron diffraction as a quantitative discipline has been limited by the absence of any generalised theory for dynamical inelastic scattering. These problems have been simplified by recent innovations, principally the introduction of spectrometers such as the Gatan imaging filter (GIF) and the Zeiss omega filter, which remove the inelastic electrons, combined with annual improvements in the speed of computer workstations and the availability of solid-state detectors with high resolution, sensitivity and dynamic range.Comparison of experimental data with dynamical calculations imposes stringent requirements on the specimen and the electron optics, even when the inelastic component has been removed. For example, no experimental CBED pattern ever has perfect symmetry, departures from the ideal being attributable to residual strain, thickness averaging, inclined surfaces, incomplete cells and amorphous surface layers.

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19

Sellers, R. M., D. M. Manley, M. M. Niboh, D. S. Weerasundara, R. A. Lindgren, B. L. Clausen, M. Farkhondeh, B. E. Norum, and B. L. Berman. "Inelastic electron scattering fromO18at backward angles." Physical Review C 51, no. 4 (April 1, 1995): 1926–44. http://dx.doi.org/10.1103/physrevc.51.1926.

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20

Sharrad, FI, AK Hamoudi, RA Radhi, and HY Abdullah. "Inelastic electron scattering from light nuclei." Journal of the National Science Foundation of Sri Lanka 41, no. 3 (September 15, 2013): 209. http://dx.doi.org/10.4038/jnsfsr.v41i3.6053.

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21

Gerber, Sheldon H. "Inelastic electron scattering from organic compounds." Journal of Polymer Science Part C: Polymer Symposia 29, no. 1 (March 7, 2007): 211–16. http://dx.doi.org/10.1002/polc.5070290121.

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22

Manley, D. M., B. L. Berman, W. Bertozzi, T. N. Buti, J. M. Finn, F. W. Hersman, C. E. Hyde-Wright, et al. "High-resolution inelastic electron scattering fromO17." Physical Review C 36, no. 5 (November 1, 1987): 1700–1726. http://dx.doi.org/10.1103/physrevc.36.1700.

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23

Yabana, K., and G. F. Bertsch. "Inelastic electron scattering on C60 clusters." Journal of Chemical Physics 100, no. 8 (April 15, 1994): 5580–87. http://dx.doi.org/10.1063/1.467125.

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24

Sevely, J. "Theoretical analysis of inelastic electron scattering." Ultramicroscopy 28, no. 1-4 (April 1989): 72–73. http://dx.doi.org/10.1016/0304-3991(89)90273-8.

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25

Luo, Suichu, and David C. Joy. "A new method for quantitative analysis of EELS." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 950–51. http://dx.doi.org/10.1017/s0424820100172486.

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Techniques to remove plural scattering from electron energy loss spectra (EELS) are important in bot hmicroanalysis and other quantitative applications of electron spectroscopy. The techniques used are either based on convolution, or Fourier transform deconvolution, methods, in which either the elastic scattering angular correction or both elastic and inelastic angular corrections are not included. In this work we propose a new method based on both angular and energy loss three-dimension Poisson statistics which includes elastic and inelastic mixed angular scattering correction in order to obtain more accurate quantitative analysis for EELS.The electron scattering distribution determined by angular and energy loss three-dimension Poissonstatistics is given by:where IT is the total incident electron intensity; t is the sample thickness; λi, λe and λT are inelastic , elastic and total scattering mean free paths; Si (θ) and Se(θ) are normalized single inelastic and elastic angular scattering distributions respectively, F(E) is the single scattering normalized energy loss distribution.

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26

Yan, Tung-Mow, and Sidney D. Drell. "The parton model and its applications." International Journal of Modern Physics A 29, no. 30 (December 8, 2014): 1430071. http://dx.doi.org/10.1142/s0217751x14300713.

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This is a review of the program we started in 1968 to understand and generalize Bjorken scaling and Feynman's parton model in a canonical quantum field theory. It is shown that the parton model proposed for deep inelastic electron scatterings can be derived if a transverse momentum cutoff is imposed on all particles in the theory so that the impulse approximation holds. The deep inelastic electron–positron annihilation into a nucleon plus anything else is related by the crossing symmetry of quantum field theory to the deep inelastic electron–nucleon scattering. We have investigated the implication of crossing symmetry and found that the structure functions satisfy a scaling behavior analogous to the Bjorken limit for deep inelastic electron scattering. We then find that massive lepton pair production in collisions of two high energy hadrons can be treated by the parton model with an interesting scaling behavior for the differential cross-sections. This turns out to be the first example of a class of hard processes involving two initial hadrons.

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27

Rez, Peter. "Scattering Cross Sections in Electron Microscopy and Analysis." Microscopy and Microanalysis 7, no. 4 (July 2001): 356–62. http://dx.doi.org/10.1007/s10005-001-0003-5.

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AbstractThe scattering cross section is the fundamental measure of the strength of a scattering interaction. All scattering in electron microscopy arises from the Coulomb interaction, and scattering cross sections, whether elastic or inelastic, will therefore all have common features. Simple forms of both elastic and inelastic cross sections are reviewed in the context of high resolution and analytical microscopy. Some recent developments, such as the calculation of Fano resonances in electron energy loss spectra of transition metals and rare earth elements are also discussed.

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28

Kotera, Masatoshi, Keiji Yamamoto, and Hiroshi Suga. "Applications of a direct simulation of electron scattering to quantitative electron-probe microanalysis." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1670–71. http://dx.doi.org/10.1017/s0424820100132984.

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A direct simulation of electron scatterings in solids is developed. The simulation takes into account elastic processes, and inelastic processes including inner-shell electron ionization, conduction electron ionization, bulk plasmon excitation, and bulk plasmon decay. After the ionization and the plasmon decay processes, the trajectories of hot electrons which are liberated from atomic electrons are calculated, and cascade multiplication of hot electrons is simulated in the solid. The theoretical equations used in the present simulation are in the following. For the elastic scattering of electrons by an atomic potential, we use the Mott cross section, which is obtained by the partial wave expansion method of the solution of the Dirac wave equation. For the inner-shell electron ionization, we use the cross section obtained from the generalized oscillator strength for each sub-shell in an atom. Under a condition of the Born approximation, cross section of an inner-shell electron excitation to the various continuum angular momentum channels for ionization is calculated using the generalized oscillator strength.

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29

Wang, Z. L. "Towards quantitative simulations of inelastic electron diffraction patterns and images." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1170–71. http://dx.doi.org/10.1017/s0424820100130481.

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A new dynamical theory has been developed based on Yoshioka's coupled equations for describing inelastic electron scattering in thin crystals. Compared to existing theories, the primary advantage of this theory is that the incoherent summation of the diffracted intensities contributed by electrons after exciting vast numbers of different excited states has been evaluated before any numerical calculation. An additional advantage is that the phase correlations of atomic vibrations are considered, so that full lattice dynamics can be combined in the phonon scattering calculation. The new theory has been proven to be equivalent to the inelastic multislice theory, and has been applied to calculate energy-filtered diffraction patterns and images formed by phonon, single electron and valence scattered electrons.A calculated diffraction pattern of elastic and phonon scattered electrons for a parallel incident beam case is in agreement with the one observed (Fig. 1), showing thermal diffuse scattering (TDS) streaks and Kikuchi pattern.

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30

Salman, A. D., N. Al-Dahan, F. I. Sharrad, and I. Hossain. "Calculation of inelastic electron–nucleus scattering form factors of 29Si." International Journal of Modern Physics E 23, no. 09 (September 2014): 1450046. http://dx.doi.org/10.1142/s0218301314500463.

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Inelastic electron scattering form factors for 29 Si nucleus with total angular momentum and positive parity (Jπ) and excited energy (3/2+, 1.273 MeV; 5/2+, 2.028 MeV; 3/2+, 2.425 MeV and 7/2+, 4.079 MeV) have been calculated using higher energy configurations outside the sd-shell. The calculations of inelastic form factors up to the first- and second-order with and without core-polarization (CP) effects were compared with the available experimental data. The calculations of inelastic electron scattering form factors up to the first-order with CP effects are in agreement with the experimental data, excepted for states 3/2+(1.273 MeV) and 5/2+(2.028 MeV) and without this effect are failed for all states. Furthermore, the calculations of inelastic electron scattering form factors up to the second-order with CP effects are in agreement with the experimental data for 3/2+(1.273 MeV) and 5/2+(2.028 MeV).

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31

ZHANG, C. "EFFECT OF INELASTIC SCATTERING OF HOT ELECTRONS ON THERMIONIC COOLING IN A SINGLE-BARRIER STRUCTURE." International Journal of Modern Physics B 14, no. 14 (June 10, 2000): 1451–57. http://dx.doi.org/10.1142/s0217979200001503.

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One of the important problems in thermionics using layered structures is the inelastic scattering of hot electrons in the electrodes and in the barrier region. Scattering in these systems is mainly via the electron–phonon interaction, or indirectly via the electron–electron interaction. In semiconductor heterostructures at room temperature, the LO-phonon plays a crucial role in thermalising electrons. In this work we study the effect of electron–phonon scattering on thermionic cooling in a single-barrier structure. Because of the asymmetry of the barrier under a bias, a larger fraction of the total energy loss will be dissipated in the hot electrode. As a result, we find that the theoretical thermal efficiency can increase due to limited electron–phonon scattering.

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32

Lee, Yeonghun, Xiaolong Yao, Massimo V. Fischetti, and Kyeongjae Cho. "Real-time ab initio simulation of inelastic electron scattering using the exact, density functional, and alternative approaches." Physical Chemistry Chemical Physics 22, no. 16 (2020): 8616–24. http://dx.doi.org/10.1039/c9cp06376e.

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Inelastic electron scattering phenomena in chemical/physical/materials interests: electron radiation damage in materials; DNA damaged by electron scattering; electron therapy; electron microscope; electron-beam-induced deposition for nanofabrication.

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33

Harvey, Tyler R., Jan-Wilke Henke, Ofer Kfir, Hugo Lourenço-Martins, Armin Feist, F. Javier García de Abajo, and Claus Ropers. "Probing Chirality with Inelastic Electron-Light Scattering." Nano Letters 20, no. 6 (May 8, 2020): 4377–83. http://dx.doi.org/10.1021/acs.nanolett.0c01130.

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34

Peterson, R. J., J. J. Kraushaar, M. R. Braunstein, and J. H. Mitchell. "Inelastic electron scattering to collective states ofSn118." Physical Review C 44, no. 1 (July 1, 1991): 136–44. http://dx.doi.org/10.1103/physrevc.44.136.

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35

Sahu, R., K. H. Bhatt, and D. P. Ahalparas. "Inelastic electron scattering from fp-shell nuclei." Journal of Physics G: Nuclear and Particle Physics 16, no. 5 (May 1, 1990): 733–43. http://dx.doi.org/10.1088/0954-3899/16/5/010.

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36

Marrian, C. R. K. "Modeling of electron elastic and inelastic scattering." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 14, no. 6 (November 1996): 3864. http://dx.doi.org/10.1116/1.588683.

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37

Marinkovic, B., V. Pejcev, D. Filipovic, and L. Vuskovic. "Elastic and inelastic electron scattering by cadmium." Journal of Physics B: Atomic, Molecular and Optical Physics 24, no. 7 (April 14, 1991): 1817–37. http://dx.doi.org/10.1088/0953-4075/24/7/029.

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38

Sergeev, A. "Inelastic electron–boundary scattering in thin films." Physica B: Condensed Matter 263-264 (March 1999): 217–19. http://dx.doi.org/10.1016/s0921-4526(98)01338-6.

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39

Бандурина, Л. О., and С. В. Гедеон. "Inelastic electron scattering from excited barium atoms." Scientific Herald of Uzhhorod University.Series Physics 43 (June 30, 2018): 108–16. http://dx.doi.org/10.24144/2415-8038.2018.43.108-116.

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40

Hersman, F. W., W. Bertozzi, T. N. Buti, J. M. Finn, C. E. Hyde-Wright, M. V. Hynes, J. Kelly, et al. "Inelastic electron scattering from collective levels ofGd154." Physical Review C 33, no. 6 (June 1, 1986): 1905–16. http://dx.doi.org/10.1103/physrevc.33.1905.

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41

Sanyal, S., and S. N. Mukherjee. "Inelastic electron scattering charge form factor ofHe4." Physical Review C 36, no. 1 (July 1, 1987): 67–72. http://dx.doi.org/10.1103/physrevc.36.67.

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42

Cholach, A. R., N. N. Bulgakov, and V. M. Tapilin. "Inelastic electron scattering in the adsorbed system." Journal of Structural Chemistry 52, S1 (December 2011): 13–20. http://dx.doi.org/10.1134/s002247661107002x.

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43

Panajotovic, R., V. Pejcev, M. Konstantinovic, D. Filipovic, V. Bocvarski, and B. Marinkovic. "Elastic and inelastic electron scattering by mercury." Journal of Physics B: Atomic, Molecular and Optical Physics 26, no. 5 (March 14, 1993): 1005–24. http://dx.doi.org/10.1088/0953-4075/26/5/020.

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Gehrmann, T., and W. J. Stirling. "Deep inelastic electron-pomeron scattering at HERA." Zeitschrift für Physik C: Particles and Fields 70, no. 1 (March 1996): 89–102. http://dx.doi.org/10.1007/s002880050085.

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Schattschneider, P. "The dielectric description of inelastic electron scattering." Ultramicroscopy 28, no. 1-4 (April 1989): 1–15. http://dx.doi.org/10.1016/0304-3991(89)90262-3.

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Khanna, F. C., L. P. Kaptari, and A. Yu Umnikov. "Deep inelastic electron scattering from the deuteron." Czechoslovak Journal of Physics 45, no. 4-5 (April 1995): 363–93. http://dx.doi.org/10.1007/bf01698014.

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Sanjosé, V., V. Vento, and S. Noguera. "Pionic effects in inelastic electron-nucleus scattering." Nuclear Physics A 470, no. 3-4 (August 1987): 509–22. http://dx.doi.org/10.1016/0375-9474(87)90584-7.

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Barreau, P., E. Bernheim, P. Bradu, G. Fournier, A. Gerard, A. Magnon, C. Marchand, et al. "Deep inelastic electron scattering on light nuclei." Czechoslovak Journal of Physics B 36, no. 2 (February 1986): 296–99. http://dx.doi.org/10.1007/bf01597162.

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