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Journal articles on the topic 'In-situ TEM'

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Published: 4 June 2021
Last updated: 20 February 2023

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1

Huang, Jianyu, Liqiang Zhang, and Yongfu Tang. "In Situ TEM Nano Electrochemistry." Microscopy and Microanalysis 27, S1 (July 30, 2021): 2720–22. http://dx.doi.org/10.1017/s1431927621009582.

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2

Warren, Oden L., Zhiwei Shan, S. A. Syed Asif, Eric A. Stach, J. W. Morris, and Andrew M. Minor. "In situ nanoindentation in the TEM." Materials Today 10, no. 4 (April 2007): 59–60. http://dx.doi.org/10.1016/s1369-7021(07)70051-2.

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3

Canavan, Megan, Dermot Daly, Andreas Rummel, Eoin K. McCarthy, Cathal McAuley, and Valeria Nicolosi. "Novel in-situ lamella fabrication technique for in-situ TEM." Ultramicroscopy 190 (July 2018): 21–29. http://dx.doi.org/10.1016/j.ultramic.2018.03.024.

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4

Huang, Jianyu. "(Invited) In Situ TEM Nano Electrochemistry." ECS Meeting Abstracts MA2021-02, no. 2 (October 19, 2021): 225. http://dx.doi.org/10.1149/ma2021-022225mtgabs.

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5

Shahbazian-Yassar, Reza. "In Situ TEM for Rechargeable Batteries." Microscopy and Microanalysis 22, S3 (July 2016): 758–59. http://dx.doi.org/10.1017/s1431927616004645.

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6

Gibson, J. Murray, F. M. Ross, and R. D. Twesten. "In situ TEM of silicon oxidation." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 324–25. http://dx.doi.org/10.1017/s0424820100122022.

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Oxidation is an important process in materials science. Silicon oxidation is particularly relevant for electronic device fabrication, but it also provides a model system. We report here the use of in-situ TEM for the examination of the microstructural details of the oxidation process.
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7

Nagpal, P., I. Baker, and J. A. Horton. "TEM in-situ straining of NiAl." Intermetallics 2, no. 1 (January 1994): 23–29. http://dx.doi.org/10.1016/0966-9795(94)90047-7.

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8

Carlton, C. E., and P. J. Ferreira. "In situ TEM nanoindentation of nanoparticles." Micron 43, no. 11 (November 2012): 1134–39. http://dx.doi.org/10.1016/j.micron.2012.03.002.

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9

Dillon, S. J., and Y. Liu. "In-Situ TEM in Complex Environments: Photocatalysis." Microscopy and Microanalysis 18, S2 (July 2012): 1072–73. http://dx.doi.org/10.1017/s1431927612007210.

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10

Allen, F. I., E. Kim, S. G. Ryu, B. Ozdol, C. P. Grigoropoulos, and A. M. Minor. "In-situ Raman Spectroscopy in a TEM." Microscopy and Microanalysis 19, S2 (August 2013): 394–95. http://dx.doi.org/10.1017/s1431927613003966.

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11

Fahrenkrug, Eli, Daan Hein Alsem, Norman Salmon, and Stephen Maldonado. "Electrochemical Measurements in In Situ TEM Experiments." Journal of The Electrochemical Society 164, no. 6 (2017): H358—H364. http://dx.doi.org/10.1149/2.1041706jes.

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12

Lang, Eric, Mike Marshall, Henry Padilla, Brad Boyce, and Khalid Hattar. "In-situ TEM Cryoindentation of Nanocrystalline Copper." Microscopy and Microanalysis 27, S1 (July 30, 2021): 1492–93. http://dx.doi.org/10.1017/s1431927621005493.

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13

Rankin, Janet. "In Situ TEM Heating of Nanosized ZrO2." Journal of the American Ceramic Society 82, no. 6 (December 21, 2004): 1560–64. http://dx.doi.org/10.1111/j.1151-2916.1999.tb01955.x.

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14

Rodriguez Manzo, Julio A., Norman J. Salmon, and Daan Hein Alsem. "In Situ TEM Observation of Water Splitting." Microscopy and Microanalysis 23, S1 (July 2017): 936–37. http://dx.doi.org/10.1017/s1431927617005347.

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15

Noh, K., L. Sun, X. Chen, J. Wen, and S. Dillon. "In Situ TEM Characterization of Electrochemical Systems." Microscopy and Microanalysis 17, S2 (July 2011): 1572–73. http://dx.doi.org/10.1017/s1431927611008737.

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16

Hintsala, E. D., A. J. Wagner, P. K. Suri, K. A. Mkhoyan, and W. W. Gerberich. "In-Situ TEM Compression of MgO Nanocubes." Microscopy and Microanalysis 19, S2 (August 2013): 524–25. http://dx.doi.org/10.1017/s1431927613004613.

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17

Wang, Z. L., R. P. Gao, Z. G. Bai, Z. R. Dai, P. Poncharal, and W. A. de Heer. "Towards Property Nanomeasurments By In-Situ TEM." Microscopy and Microanalysis 6, S2 (August 2000): 64–65. http://dx.doi.org/10.1017/s1431927600032815.

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Characterizing the physical properties of individual nanostructures is rather challenging because of the difficulty in manipulating the objects of sizes from nanometer to micrometer. Most of the nanomeasurements have been carried using STM and AFM. In this presentation, we demonstrate that transmission electron microscopy can be a powerful tool for quantitative measurements the mechanical, electrical and thermodynamic properties of a single nanostructure, such as a carbon nanotube or a nanoparticle.Using a customer-built specimen holder, in-situ measurements on the mechanical properties of carbon nanotubes has been carried out using the resonance phenomenon induced by an externally applied alternating voltage [1]. If an oscillating voltage is applied on the nanotube with tunable frequency, resonance can be induced (Fig. 1). The bending modulus is calculated from the resonance frequency. The bending modulus is as high as 1.2 TPa (as strong as diamond) for nanotubes with diameters smaller than 8 nm, and it drops to as low as 0.2 TPa for those with diameters larger than 30 nm.
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18

Hsiao, Ming-Siao, Yifei Yuan, Christopher Grabowski, Anmin Nie, Reza Shabazian-Yassar, and Lawrence F. Drummy. "In Situ TEM Characterization of Nanostructured Dielectrics." Microscopy and Microanalysis 21, S3 (August 2015): 1813–14. http://dx.doi.org/10.1017/s1431927615009848.

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19

Sun, Litao. "In-situ TEM Study on Solar Cell." Microscopy and Microanalysis 26, S2 (July 30, 2020): 3160. http://dx.doi.org/10.1017/s1431927620024010.

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20

ARITA, Masashi, Atsushi TSURUMAKI-FUKUCHI, and Yasuo TAKAHASHI. "In-situ TEM of Nanoscale ReRAM Devices." Vacuum and Surface Science 61, no. 12 (December 10, 2018): 766–71. http://dx.doi.org/10.1380/vss.61.766.

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21

Milne, R. J., A. J. Lockwood, and B. J. Inkson. "In-situ TEM deformation of aluminium nanopillars." Journal of Physics: Conference Series 241 (July 1, 2010): 012059. http://dx.doi.org/10.1088/1742-6596/241/1/012059.

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22

Gibson, J. M., and M. Y. Lanzerotti. "Silicon oxidation studied by in-situ tem." Ultramicroscopy 31, no. 1 (September 1989): 29–35. http://dx.doi.org/10.1016/0304-3991(89)90031-4.

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23

Sharma, Renu. "Kinetic measurements from in situ TEM observations." Microscopy Research and Technique 72, no. 3 (March 2009): 144–52. http://dx.doi.org/10.1002/jemt.20667.

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24

Tanase, Mihaela, and Amanda K. Petford-Long. "In situ TEM observation of magnetic materials." Microscopy Research and Technique 72, no. 3 (March 2009): 187–96. http://dx.doi.org/10.1002/jemt.20671.

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25

Ohmura, Takahito, Zhang Ling, Kaoru Sekido, Kaneaki Tsuzaki, and Toru Hara. "TEM in-situ Observation of Indentation-induced Deformation Behavior." Materia Japan 48, no. 12 (2009): 614. http://dx.doi.org/10.2320/materia.48.614.

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26

Ferreira, P. J., K. Mitsuishi, and E. A. Stach. "In Situ Transmission Electron Microscopy." MRS Bulletin 33, no. 2 (February 2008): 83–90. http://dx.doi.org/10.1557/mrs2008.20.

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AbstractThe articles in this issue of MRS Bulletin provide a sample of what is novel and unique in the field of in situ transmission electron microscopy (TEM). The advent of improved cameras and continued developments in electron optics and stage designs have enabled scientists and engineers to enhance the capabilities of previous TEM analyses. Currently, novel in situ experiments observe and record the behavior of materials in various heating, cooling, straining, or growth environments. In situ TEM techniques are invaluable for understanding and characterizing dynamic microstructural changes. They can validate static TEM experiments and inspire new experimental approaches and new theories.
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27

Krakow, William. "In situ evaporation in a high-resolution TEM." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 446–47. http://dx.doi.org/10.1017/s0424820100086532.

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In recent years there has been a growing interest in the structure and stability of small particles at the atomic resolution level. In a number of cases, metal clusters were prepared ex situ and placed in a HREM which allowed significant contamination to be present. The one successful application to in situ work has been achieved by Takayanagi and his associates who have used a narrow gap pole piece 200 kV microscope modified to UHV conditions which achieves pressures in the 10-9 Torr range. Studies with this microscope have shown small gold clusters of a few tens of atoms extending over edges of graphite surfaces and small clusters 20-30Å in lateral extent.
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28

Guo, Hua, Will J. Hardy, Panpan Zhou, Douglas Natelson, and Jun Lou. "In-situ Thermal Testing on Nanostructures in TEM." Microscopy and Microanalysis 22, S3 (July 2016): 770–71. http://dx.doi.org/10.1017/s1431927616004700.

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29

Sumigawa, Takashi, Takuya Nakano, and Takayuki Kitamura. "OS06-1-3 In-situ TEM observation on fracture of dissimilar interface in nanoscale component." Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics 2011.10 (2011): _OS06–1–3—. http://dx.doi.org/10.1299/jsmeatem.2011.10._os06-1-3-.

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30

Kryshtal’, O. P., S. I. Bogatyrenko, R. V. Sukhov, O. O. Minenkov, and A. I. Taliashvili. "In Situ TEM Investigation of Homogenization Kinetics of Polycrystalline Ag—Pd Film System." METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 36, no. 1 (August 30, 2016): 31–38. http://dx.doi.org/10.15407/mfint.36.01.0031.

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31

Clark, Trevor, Ethan Scott, Ping Lu, David Adams, and Khalid Hattar. "In-situ TEM irradiation induced amorphization of Ge2Sb2Te5." Microscopy and Microanalysis 27, S1 (July 30, 2021): 1232–34. http://dx.doi.org/10.1017/s1431927621004621.

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32

Falqui, Andrea, Danilo Loche, and Alberto Casu. "In Situ TEM Crystallization of Amorphous Iron Particles." Crystals 10, no. 1 (January 17, 2020): 41. http://dx.doi.org/10.3390/cryst10010041.

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Even though sub-micron and nano-sized iron particles generally display single or polycrystalline structures, a growing interest has also been dedicated to the class of amorphous ones, whose absence of a crystal structure is capable of modifying their physical properties. Among the several routes so far described to prepare amorphous iron particles, we report here about the crystallization of those prepared by chemical reduction of Fe3+ ions using NaBH4, with sizes ranging between 80 and 200 nm and showing a high stability against oxidation. Their crystallization was investigated by differential scanning calorimetry (DSC), X-ray diffraction (XRD), and in situ heating transmission electron microscopy (TEM). The latter technique was performed by the combined use of electron diffraction of a selected sample area, and bright and dark field TEM imaging, and allowed determining that the crystallization turns the starting amorphous particles into polycrystalline α-Fe ones. Also, under the high vacuum of the TEM column, the crystallization temperature of the particles shifted to 550 °C from the 465 °C, previously observed by DSC and XRD under 105 Pa of Ar. This indicates the pivotal role of the external pressure in influencing the starting point of phase transition. Conversely, upon both the DSC/XRD pressure and the TEM vacuum conditions, the mean size of the crystal domains increases as a consequence of further thermal increase, even if with some pressure-related differences.
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33

Wang, X. Y., S. X. Zhou, and W. Z. Chen. "In-Situ TEM Observation of Fe80P12C6Mo0.5Si1.5 Amorphous Alloy." Journal of the Magnetics Society of Japan 23, no. 1_2 (1999): 203–5. http://dx.doi.org/10.3379/jmsjmag.23.203.

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34

Hoppe, S. M., B. A. Hernandez-Sanchez, K. Hattar, and D. Y. Sasaki. "Progress Towards In Situ TEM Observation of Biofouling." Microscopy and Microanalysis 18, S2 (July 2012): 1132–33. http://dx.doi.org/10.1017/s1431927612007519.

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35

Nagpal, P., and I. Baker. "TEM in situ straining of polycrystalline stoichiometric NiAl." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 586–87. http://dx.doi.org/10.1017/s0424820100087240.

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The purpose of this paper is to present a comparison of the dislocation structures that are present in polycrystalline samples of the B2 (ordered body-centered cubic) compound NiAI after straining in bulk and after in-situ straining of thin foils in the TEM.A dumbell-shaped tensile specimen (gauge length ∼ 10mm; diameter ∼ 3mm) of ∼15μm grain-sized stoichiometric NiAl which had a low initial dislocation density was strained to fracture under tension. The fracture strain was ∼ 2%. Discs were cut from the gauge and thin foils were prepared as described elsewhere. (Processing conditions to obtain this fine-grained material are also described elsewhere.) TEM in-situ straining samples (7mm long; 3 mm wide; 0.25 mm thick, with 1mm diameter loading holes located 1.5mm from the ends, see reference 4 for details) were prepared from the same material and strained in a modified JEOL straining holder. Both sets of samples were viewed in a JEOL 2000FX operated at 200 KeV. For the in-situ experiments images were recorded either on film after a given strain increment or dynamically during straining using a Gatan camera, an image intensifier and a VCR.
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36

Wang, CM, W. Xu, B. Arey, LV Saraf, DW Choi, J. Liu, ZG Yang, JG Zhang, S. Thevuthasan, and DR Baer. "In-Situ TEM studies of Lithium Ion Battery." Microscopy and Microanalysis 16, S2 (July 2010): 316–17. http://dx.doi.org/10.1017/s1431927610054929.

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37

Gao, P., C. Nelson, J. Jokisaari, S. Baek, C. Eom, E. Wang, and X. Pan. "In situ TEM Studies of Ferroelectric Thin Films." Microscopy and Microanalysis 17, S2 (July 2011): 1362–63. http://dx.doi.org/10.1017/s1431927611007689.

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38

Robertson, I. M., T. C. Lee, D. K. Dewald, and H. K. Birnbaum. "In situ TEM studies of deformation and fracture." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 622–23. http://dx.doi.org/10.1017/s0424820100155086.

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The in-situ TEM straining technique has been used to investigate the micromechanisms of deformation and fracture in several ductile and semi-brittle systems. Attention has been focussed on the dislocation structures ahead of advancing cracks and on the interaction between lattice dislocations and grain boundaries.The deformation experiments were performed in-situ in a transmission electron microscope equipped with a video camera system. The dynamic events were recorded on video tape with a time resolution of l/30th of a second. Static interactions were recorded using the regular microscope plate system. The straining stage deforms the samples in Mode I and can operate at a displacement rate of 4 in sec-1.An example of one of the possible interactions between lattice dislocations and a ∑- 3 ([ll)/60°) grain boundary in 310 stainless steel is shown in the micrograph in Figure 1. The dislocations on slip systems A (a/2[110)1 (ll) 1 ) and B (a/2[101] (11) 1 ) impinge on the grain boundary, generating slip systems C (a/2[l0) 2/(111) 2) and D (a/2[l0) 2/(111) 2). To understand this effect three conditions were considered:
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39

Sinclair, Robert, Toshio Itoh, and Richard Chin. "In Situ TEM Studies of Metal–Carbon Reactions." Microscopy and Microanalysis 8, no. 4 (August 2002): 288–304. http://dx.doi.org/10.1017/s1431927602020226.

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The reactions which occur between amorphous carbon and a number of first transition metals (Ti, Cr, Fe, Co, Ni, and Cu) have been studied by transmission electron microscopy (TEM). The materials are in thin-film form with the metal layer sandwiched between thicker carbon layers. In four cases, the predominant reaction is the graphitization of the amorphous carbon, at temperatures well below 800°C. This is brought about by the elements themselves in the case of Co and Ni, and by metastable carbides in the case of Fe (Fe3C) and Cr (Cr3C2−x). The Ti–C and Cu–C systems do not exhibit graphitization. For the former, only TiC is produced up to 1000°C, while the carbon does not react at all with copper. In situ TEM studies show the mechanism to be of the dissolution-precipitation type, which is equivalent to the metal-mediated crystallization process for amorphous silicon and germanium. The heat of graphitization is found to be 18–19 kcal/mol-C by differential scanning calorimetry.
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40

Eduardo Ortega, J., Diego Alducin, and Arturo Ponce. "TEM In situ Plastic Deformation of Silver Nanowires." Microscopy and Microanalysis 21, S3 (August 2015): 941–42. http://dx.doi.org/10.1017/s1431927615005504.

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41

Merkle, A., and L. Marks. "Dynamic In-situ TEM Investigations of Tribological Interfaces." Microscopy and Microanalysis 12, S02 (July 31, 2006): 950–51. http://dx.doi.org/10.1017/s1431927606063811.

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42

Nasibulin, Albert G., Litao Sun, Sampsa Hämäläinen, Sergey D. Shandakov, Florian Banhart, and Esko I. Kauppinen. "In Situ TEM Observation of MgO Nanorod Growth." Crystal Growth & Design 10, no. 1 (January 6, 2010): 414–17. http://dx.doi.org/10.1021/cg9010168.

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43

Morgiel, Jerzy, Maciej Szlezynger, Małgorzata Pomorska, Łukasz Maj, Konstanty Marszałek, and Ryszard Mania. "In-situ TEM heating of Ni/Al multilayers." International Journal of Materials Research 106, no. 7 (July 4, 2015): 703–10. http://dx.doi.org/10.3139/146.111219.

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44

Bufford, D. C., C. S. Snow, and K. Hattar. "Cavity Formation in Molybdenum Studied In Situ in TEM." Fusion Science and Technology 71, no. 3 (February 28, 2017): 268–74. http://dx.doi.org/10.1080/15361055.2016.1273700.

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45

Han, Bo, Shulin Chen, Jian Zou, Ruiwen Shao, Zhipeng Dou, Chen Yang, Xiumei Ma, et al. "Tracking sodium migration in TiS2 using in situ TEM." Nanoscale 11, no. 15 (2019): 7474–80. http://dx.doi.org/10.1039/c9nr00483a.

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46

Mirsaidov, Utkur, Utkarsh Anand, Guanhua Lin, Duane Loh, Ermanno Miele, and Zainul Aabdin. "Visualizing Nanoscale Assembly in Solution Using In Situ TEM." Microscopy and Microanalysis 22, S5 (November 2016): 34–35. http://dx.doi.org/10.1017/s1431927616012198.

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47

Zheng, H., AM Minor, AP Alivisatos, and U. Dahmen. "In-Situ TEM Observations of Colloidal Particles in Liquids." Microscopy and Microanalysis 16, S2 (July 2010): 324–25. http://dx.doi.org/10.1017/s1431927610062926.

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48

Yao, Ke-Fu, Jianzhong Xiao, and Junlin Zhang. "In-situ deformation of TiAl PST crystals in TEM." Intermetallics 8, no. 5-6 (May 2000): 569–73. http://dx.doi.org/10.1016/s0966-9795(99)00158-2.

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49

Janssen, Arne, Eric Prestat, Matthew Smith, Sarah J. Haigh, and M. G. Burke. "In situ Analytical TEM of Ilmenite Reduction in Hydrogen." Microscopy and Microanalysis 21, S3 (August 2015): 565–66. http://dx.doi.org/10.1017/s1431927615003621.

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50

Xin, Huolin L., Lili Han, and Ruoqian Lin. "Toward 5D Imaging in an In-Situ Environmental TEM." Microscopy and Microanalysis 21, S3 (August 2015): 795–96. http://dx.doi.org/10.1017/s1431927615004778.

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