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Journal articles on the topic 'HRTEM'

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Published: 4 June 2021

Last updated: 30 May 2022

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1

Howe, J. M. "Quantitative in situ hot-stage high-resolution Transmission Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 758–59. http://dx.doi.org/10.1017/s0424820100171523.

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In situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the dynamics of interfaces at the atomic level. Such information complements detailed static observations and calculations of interfacial structure, and is essential for understanding interface theory and solid-state phase transformations. This paper provides a brief description of particular requirements for performing in situ hot-stage HRTEM and illustrates the use of this technique to obtain quantitative data on the atomic mechanisms and kinetics of interface motion during precipitation of {111} θ phase in an Al-Cu-Mg-Ag alloy.The specimen and microscope requirements for in situ hot-stage HRTEM are not much different from those of static HRTEM, except that one must have a heating holder and equipment for recording and analyzing dynamic images. At present, most HRTEMs are equipped with a TV-rate camera, possibly combined with a charge-coupled device camera. An inexpensive way to record in situ HRTEM images is to send the output from the TV-rate camera directly into a standard VHS format videocassette recorder (VCR).

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2

Lakshmi, R. Radha, D. Sruthi, K. Prithiv, S. Harippriya, and K. R. Aranganayagam. "Synthesis of ZnO and Ag/ZnO Nanorods: Characterization and Synergistic In Vitro Biocidal Studies." Advanced Science Letters 24, no. 8 (August 1, 2018): 5490–95. http://dx.doi.org/10.1166/asl.2018.12135.

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The ZnO semiconductor has gained substantial interest in the research community in part because of its large exciton binding energy (60 meV) and direct wide band gap (3.72 eV). ZnO and Ag doped ZnO (Agx Zn1−xO (where x = 0.01, 0.02 and 0.03)) were synthesized by using soft chemical route. The synthesized materials were characterized by using XRD, HRSEM, EDS and HRTEM. The powder XRD pattern indicates that the ZnO and Agx Zn1−xO (where x = 0.01, 0.02 and 0.03) samples exhibits hexagonal wurtzite structure and also the Ag doping decreases the grain size of ZnO nano particles. The micro structural characterizations (HRSEM and HRTEM) reveal the incorporation of Ag into the ZnO lattice and also the formation of nano rods. At the length, the antimicrobial response was also brought against human pathogenic Gram +ve (S. aureus), Gram −ve (E. coli) bacteria and Fungi (C. albicans). Thus the above work brings out the presence of antimicrobial response against the microbes from these nano composites.

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3

Xing, Y. T., L. Y. Liu, D. F. Franceschini, W. C. Nunes, D. J. Smith, and I. G. Solorzano. "HRTEM and HRSTEM Study of Nanostructured Materials Prepared by Pulsed Laser Deposition." Microscopy and Microanalysis 22, S3 (July 2016): 2012–13. http://dx.doi.org/10.1017/s1431927616010904.

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4

Arumugam, J., A. Dhayal Raj, and A. Albert Irudayaraj. "Morphology Manipulation and Related Properties of High Crystalline Bi2S3 Nanorods by Reflux Approach." Volume 4,Issue 5,2018 4, no. 5 (November 12, 2018): 524–26. http://dx.doi.org/10.30799/jnst.159.18040516.

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One dimensional Bi2S3 nanorods have been successfully synthesized by a very simple reflux method with different precursor concentration for 2 hours at 180 �C. The as-synthesized Bi2S3 powders were characterized by X-ray diffraction (XRD), high resolution scanning electron microscope (HRSEM), high resolution transmission microscope (HRTEM), UV-Vis spectrometer, Fourier transform infrared (FTIR) spectrometer. X-ray diffraction (XRD) results show that the resulting nanocrystals have an orthorhombic structure. X-ray diffraction patterns indicate a polycrystalline nature and the crystallite sizes seem increase with increase in the concentration. The HRSEM and HRTEM images reveal that the diameter of the nanorods increase with increasing concentration of the precursor. Morphological analysis reveals that the as-prepared Bi2S3 nanorods can be tuned to morphology by varying precursor concentration from 0.01 M to 0.001 M. The bismuth nitrate, which is known to be a linear polymer, plays a critical role as a precursor and a template for the growth of uniform Bi2S3 nanorods. Bi2S3 nanorods are good absorbents of solar radiation and hence can be used in solar cells.

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5

Barman, Jayanta, Archana Das, Bapan Banik, and Farhana Sultana. "Optimizing ZnO/CdS Nano Composite Controlled by Fe Doping Towards Efficiency in Water Treatment and Antimicrobial Activity." Current World Environment 16, no. 3 (December 31, 2021): 726–32. http://dx.doi.org/10.12944/cwe.16.3.6.

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Nanocrystalline composite zinc oxide (ZnO) and CdS with Fe doping thin films grown on glass substrate by chemical method. The parameters like temperature of the solution, UV exposure, pH of solution, immersion time, immersion cycles, have been controlled and standardized for nanocrystalline film. The synthesis NPs were analyzed by X-ray diffraction (XRD). Rietveld method shows that Fe-doped composite ZnO/CdS is a single pure phase and wurtzite structure. Samples were analyzed by sophisticated various instrument like XRD, UV- Visible spectrometer, HRTEM, HRSEM and composition was analyzed by EDX attached with HRTEM. The band gap was calculated by absorption spectroscopy and found that absorption was blue-shifted. The electron structure shows that doping changes the crystal structure and transition level create better efficiency and creates octahedral symmetry. The antibacterial studies showed that the 5.0 wt% Fe-doped exhibited maximum antibacterial effect.

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6

Howe, J. M., T. M. Murray, K. T. Moore, A. A. Csontos, M. M. Tsai, A. Garg, and W. E. Benson. "Understanding Interphase Boundary Dynamics by In Situ High-Resolution and Energy-Filtering Transmission Electron Microscopy and Real-Time Image Simulation." Microscopy and Microanalysis 4, no. 3 (June 1998): 235–47. http://dx.doi.org/10.1017/s1431927698980230.

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This study discusses the use of in situ high-resolution transmission electron microscropy (HRTEM) techniques to determine the structure, composition, and interphase boundary dynamics during phase transformations at the atomic level. Three main in situ HRTEM techniques are described: (1) in situ HRTEM dynamic studies that are performed on the same precipitate plates from different viewing directions to determine the three-dimensional structure of the interfaces; (2) in situ compositional mapping of precipitate interfaces obtained by energy-filtering TEM experiments at temperature in a HRTEM, and (3) real-time HRTEM image simulations that are being created for comparison with and interpretation of experimental in situ HRTEM dynamic observations. The results from these studies demonstrate that it is possible to understand the mechanisms and kinetics of interphase boundary motion at the atomic level.

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7

Cohen, Dov, Geoffrey H. Campbell, Wayne E. King, and C. Barry Carter. "Quantitative Hrtem of Twin Boundaries in Compound Semiconductors and Metals Using Non-Linear Least-Squares Methods." Microscopy and Microanalysis 4, S2 (July 1998): 784–85. http://dx.doi.org/10.1017/s1431927600024041.

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The analysis of the atomic structure of grain boundaries is often performed through the use of high-resolution transmission electron microscopy (HRTEM). A complication of the HRTEM technique is the inability to analyze directly the experimental images in order to determine projected atomic models of lattice defects. Since contrast features in HRTEM images, in general, do not correspond directly to atomic positions, experimental images are typically evaluated qualitatively through comparison with image simulation. Recently, the interest in quantitatively measuring the atomic structure of internal interfaces for comparison with theoretical calculations has motivated the development of computational methodologies to analyze HRTEM images.123 In this paper, the quantitative analysis of HRTEM images of twin boundaries in semiconductors and metals is described.AΣ=3 coherent twin boundary in GaP was imaged along the <110> zone in a JEOL-4000EX HRTEM at Sandia National Laboratories, Livermore.

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8

González, Gema, Werner Stracke, Zoraya Lopez, Ulrike Keller, Andrea Ricker, and Rudolf Reichelt. "Characterization of Defects and Surface Structures in Microporous Materials by HRTEM, HRSEM, and AFM." Microscopy and Microanalysis 10, no. 02 (March 17, 2004): 224–35. http://dx.doi.org/10.1017/s1431927604040097.

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9

Pailloux, Frédéric, Marie-Laure David, and Laurent Pizzagalli. "Quantitative HRTEM investigation of nanoplatelets." Micron 41, no. 2 (February 2010): 135–42. http://dx.doi.org/10.1016/j.micron.2009.09.005.

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10

Ohnishi, N., T. Ohsuna, Y. Sakamoto, O. Terasaki, and K. Hiraga. "Quantitative HRTEM study of zeolite." Microporous and Mesoporous Materials 21, no. 4-6 (May 1998): 581–88. http://dx.doi.org/10.1016/s1387-1811(98)00026-2.

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11

Marcks, CH, H. Wachsmuth, and H. Graf V. Reichenbach. "Preparation of vermiculites for HRTEM." Clay Minerals 24, no. 1 (March 1989): 23–32. http://dx.doi.org/10.1180/claymin.1989.024.1.02.

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AbstractA technique for preparing vermiculites for examination by high-resolution transmission electron microscopy (HRTEM) has been developed. A TEM-stable expanded phase can be obtained by intercalating n-alkylammonium ions between the silicate layers of a parent biotite. The vermiculite particles were embedded in Spurr resin and centrifuged to improve orientation. Ultra-thin specimens were prepared using an ultramicrotome, the quality and thickness of the sections being monitored by TEM. Lattice images of biotite, Ba-vermiculite and octylammonium-vermiculite, the latter showing a perpendicular arrangement of the alkyl chains relative to the silicate layers, were obtained with a resolution ∼2 Å. The reliability of these images was confirmed by computer simulation.

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12

O’Keefe, Michael A., and Margaret L. Sattler. "HRTEM simulation of amorphous materials." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (August 1990): 112–13. http://dx.doi.org/10.1017/s0424820100173698.

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Image simulation has become one of the preferred techniques for analysis of high-resolution transmission electron micrographs, in both bright-field and dark-field modes. This is especially true of microscope images used in stuctural studies, both for perfect crystal structures, and for defects within periodic structures. In using image simulation for structural analysis, comparison is made point-by-point (pixel by pixel) between the experimental image and one simulated under identical imaging conditions for a model structure. Comparison with a matching simulated image enables features in the experimental image to be identified as belonging to structural features in the specimen, such as groups of atoms, or individual atoms. In the case of amorphous structures, however, no such one-to-one correspondence between simulations and experimental high-resolution images can be expected. It is thus much more difficult to determine whether the model from which one is simulating images really does describe the appropriate amorphous structure. Amorphous structures are characterized not in terms of atom positions within a well-defined unit cell, but interms of a “radial distribution function” (RDF), a function that gives the average number of atoms lying at any given distance from an average atom. The RDF is thus a non-periodic Patterson function, and a single RDF can arise from many different arrangements of atoms, provided only that atomic positions within the structure have the “right” statistical distribution.

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13

Michel, Daniel, Léo Mazerolles, and Richard Portier. "HRTEM studies on oxide ceramics." Microscopy Microanalysis Microstructures 1, no. 5-6 (1990): 433–42. http://dx.doi.org/10.1051/mmm:0199000105-6043300.

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14

Hassan, Ishmael, Yasuhiro Kudoh, Peter R. Buseck, and Eui Ito. "MgSiO3 perovskite: a HRTEM study." Mineralogical Magazine 60, no. 402 (October 1996): 799–804. http://dx.doi.org/10.1180/minmag.1996.060.402.10.

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AbstractSelected-area electron diffraction patterns for the [110] zone of MgSiO3 perovskite are consistent with the orthorhombic unit cell obtained by X-ray diffraction (a = 4.775, b = 4.929, c = 6.897 Å). Various areas of a crystal fragment show diffuse streaking along c*, and well-developed satellite reflections that give a 3-fold repeat along [10]*. Another fragment shows doubled cell dimensions when viewed down [30]. The variable occurrence of the satellite reflectioncs and diffuse streaking indicate subtle variations in ordering, chemistry, or both. Images obtained by high-resolution transmission electron microscopy contain perfectly ordered regions, out-of-phase boundaries, and intergrowths of the two orthorhombic forms of perovskite.

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15

Op de Beeck, Marc, and Dirk Van Dyck. "Direct structure reconstruction in HRTEM." Ultramicroscopy 64, no. 1-4 (August 1996): 153–65. http://dx.doi.org/10.1016/0304-3991(96)00006-x.

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16

O'Keefe, Michael A. "Advances in image simulation for high-resolution TEM." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 38–39. http://dx.doi.org/10.1017/s0424820100136568.

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The original high-resolution transmission electron microscope (HRTEM) image simulation program was written as a tool to confirm interpretation of HRTEM images of niobium oxides. Thorough testing on known structures showed that image simulation could reliably duplicate the imaging process occurring in the HRTEM, and could thus be confidently used to interpret images of unknown structures. Mainstream application of image simulation to routine structure determination by HRTEM was ushered in by the establishment of the wide applicability of the SHRLI (simulated high-resolution lattice image) programs. Structure determination of the mineral takéuchiite by HRTEM and image simulation was the first such determination accepted by the KJCr without x-ray data. Of course, once the reliability of image simulation had been established, it was realized that the technique could be put to work for applications other than structure determination. Early on, simulations were used to explore various HRTEM imaging parameters, including specimen ionicity, validity of the projection approximation, and the resolutionlimiting effects of incident-beam convergence. Since the inception of HRTEM image simulation, its range of uses has continued to expand, and so has the number of programs available; distribution of the SHRLI code spawned improved versions as well as some new programs.

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17

Mao, Fuqi, Xiaohan Guan, Ruoyu Wang, and Wen Yue. "Super-Resolution Based on Generative Adversarial Network for HRTEM Images." International Journal of Pattern Recognition and Artificial Intelligence 35, no. 10 (May 27, 2021): 2154027. http://dx.doi.org/10.1142/s0218001421540276.

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As an important tool to study the microstructure and properties of materials, High Resolution Transmission Electron Microscope (HRTEM) images can obtain the lattice fringe image (reflecting the crystal plane spacing information), structure image and individual atom image (which reflects the configuration of atoms or atomic groups in crystal structure). Despite the rapid development of HTTEM devices, HRTEM images still have limited achievable resolution for human visual system. With the rapid development of deep learning technology in recent years, researchers are actively exploring the Super-resolution (SR) model based on deep learning, and the model has reached the current best level in various SR benchmarks. Using SR to reconstruct high-resolution HRTEM image is helpful to the material science research. However, there is one core issue that has not been resolved: most of these super-resolution methods require the training data to exist in pairs. In actual scenarios, especially for HRTEM images, there are no corresponding HR images. To reconstruct high quality HRTEM image, a novel Super-Resolution architecture for HRTEM images is proposed in this paper. Borrowing the idea from Dual Regression Networks (DRN), we introduce an additional dual regression structure to ESRGAN, by training the model with unpaired HRTEM images and paired nature images. Results of extensive benchmark experiments demonstrate that the proposed method achieves better performance than the most resent SISR methods with both quantitative and visual results.

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18

O’Keefe, Michael A. "Interpretation of HRTEM images by image simulation: An introduction to theory and practice." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 394–95. http://dx.doi.org/10.1017/s0424820100169705.

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High-resolution transmission electron microscope (HRTEM) image simulation was conceived in 1970 in response to a referee's questioning of the interpretation of images of a niobium oxide. Two years later a suite of HRTEM image simulation programs had been established and shown to accurately reproduce experimental HRTEM images when imaging parameters were accurately known. These first simulated images proved that the original interpretation of the niobium oxide images was indeed correct. Once these programs were available, it was possible to explore HRTEM imaging parameters including specimen ionicity, validity of the projection approximation, and the resolution-limiting effects of incident-beam convergence. Over the twenty years since then, the range of uses of HRTEM simulation has continued to expand, as has the number of programs available. World-wide distribution of the SHRLI (simulated high-resolution lattice image) code inspired some researchers to produce new or modified simulation programs and others to compare the results produced by these programs (fig.1).

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19

Baik, H. S., T. Epicier, and E. Van Cappellen. "Quantitative analysis of HRTEM images from amorphous materials. I: About the estimation ofCsandδffrom HRTEM diffractograms." European Physical Journal Applied Physics 4, no. 1 (October 1998): 11–26. http://dx.doi.org/10.1051/epjap:1998240.

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20

Nakagawa, D., T. Kawabata, S. Ikeno, and K. Matsuda. "Hrtem Observation of Age-Precipitation in Mg-Gd-Y Alloys." Archives of Metallurgy and Materials 58, no. 2 (June 1, 2013): 361–62. http://dx.doi.org/10.2478/v10172-012-0199-9.

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Precipitation in Mg-Gd-Y alloys which have the different total amount of RE were investigated by HRTEM and SAED technique, and calculation of HRTEM images and electron density by first principles to understand the relationship between precipitation in these alloys and HRTEM images. The diffuse scattering by SAED was obtained in as-quenched samples in each alloy, and mono-layer zones have been confirmed by HRTEM observation. The atomic position just consisted of the RE and Mg columns show the black contrast, and the bright dots correspond to the space surrounding by the six Mg columns of hexagonal network with 0.18 nm. This is also corresponded the distribution of electron density of the cluster according to calculation by first principles.

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21

Howe, James M. "In Situ hot-stage high-resolution Transmission Electron Microscope studies of the mechanisms and kinetics of precipitation reactions." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 228–29. http://dx.doi.org/10.1017/s0424820100137513.

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In situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the mechanisms and kinetics of precipitation reactions at the atomic level. Such information is required to understand phase transformations and the behavior of material interfaces. This paper provides a brief summary of the in situ hot-stage HRTEM technique and illustrates the use of this technique to obtain information about heterogeneous nucleation processes in precipitation and crystallization reactions. Examples of other types of in situ HRTEM studies can be found in previous papers by Sinclair et al. and Howe et al.The specimen and microscope requirements for in situ hot-stage HRTEM are the same as those for static HRTEM except that one must have a hot-stage specimen holder and equipment for recording and analyzing dynamic images. A high-resolution television-rate camera connected to a standard videocassette recorder (VCR) can be used to store hours of data for low cost. The dynamic images can then be analyzed directly during playback or sent to a computer for image processing and analysis.

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22

Howe, J. M., and S. J. Rozeveld. "Effect of crystal and beam tilt on simulated high-resolution TEM images of interfaces." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (August 1990): 358–59. http://dx.doi.org/10.1017/s0424820100174928.

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It is well known that only a few milliradians of crystal or beam tilt can produce image artifacts in HRTEM images of perfect crystals. One important application of HRTEM is for determining the atomic structures of interfaces. While it is intuitive that alignment of an interface parallel to the electron beam should be critical for obtaining reliable HRTEM images of interfaces, a systematic study of the effects of crystal and beam tilt on HRTEM images of interfaces has not been performed.In this investigation, the effects of crystal and beam tilt on HRTEM images of planar, coherent interfaces were determined by multislice image simulations. Interfaces in metallic systems ranging from simple twin boundaries in f.c.c. Al and b.c.c. Ti to relatively complex interphase boundaries between ordered h.c.p. and b.c.c. phases in the Ti-Al system were examined and compared. Although this study was limited to coherent interfaces, similar effects are expected to occur in comparable nonmetallic systems such as semiconductors and ceramics and for less coherent interfaces as well.

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23

Auzende, Anne-Line, Bertrand Devouard, Sté phane Guillot, Isabelle Daniel, Alain Baronnet, and Jean-Marc Lardeaux. "Serpentinites from Central Cuba: petrology and HRTEM study." European Journal of Mineralogy 14, no. 5 (September 27, 2002): 905–14. http://dx.doi.org/10.1127/0935-1221/2002/0014-0905.

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24

Deng, Yu-Hao. "Common Phase and Structure Misidentifications in High-Resolution TEM Characterization of Perovskite Materials." Condensed Matter 6, no. 1 (December 29, 2020): 1. http://dx.doi.org/10.3390/condmat6010001.

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High-resolution TEM (HRTEM) is a powerful tool for structure characterization. However, methylammonium lead iodide (MAPbI3) perovskite is highly sensitive to electron beams and easily decomposes into lead iodide (PbI2). Misidentifications, such as PbI2 being incorrectly labeled as perovskite, are widely present in HRTEM characterization and would negatively affect the development of perovskite research field. Here misidentifications in MAPbI3 perovskite are summarized, classified, and corrected based on low-dose imaging and electron diffraction (ED) simulations. Corresponding crystallographic parameters of intrinsic tetragonal MAPbI3 and the confusable hexagonal PbI2 are presented unambiguously. Finally, the method of proper phase identification and some strategies to control the radiation damage in HRTEM are provided. This warning paves the way to avoid future misinterpretations in HRTEM characterization of perovskite and other electron beam-sensitive materials.

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25

Kaiser, U., A. Chuvilin, P. D. Brown, and W. Richter. "Origin of Threefold Periodicity in High-Resolution Transmission Electron Microscopy Images of Thin Film Cubic SiC." Microscopy and Microanalysis 5, no. 6 (November 1999): 420–27. http://dx.doi.org/10.1017/s1431927699990487.

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Abstract: High-resolution transmission electron microscopy (HRTEM) images of the [1–10] zone of cubic SiC layers grown by molecular beam epitaxy (MBE) often reveal regions of material exhibiting an unusual threefold periodicity. The same contrast was found in earlier works of Jepps and Page, who attributed this contrast in HRTEM images of polycrystalline SiC to the 9R-SiC polytype. In this report we demonstrate by HRTEM image simulations that the model of the 9R polytype and an alternative twinning model can fit qualitatively the experimental HRTEM images. However, by comparing the fast Fourier transform (FFT) patterns of the experiments and the simulations, as well as by using dark-field imaging, we show unambiguously that only the model of overlapping twinned 3C-SiC crystals fully agrees with the experiments.

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26

XU HUI-FANG, LUO GU-FENG, HU MEI-SHENG, and CHEN JUN. "HRTEM STUDY OF THE SUPERLATTICE ORTHOCLASE." Acta Physica Sinica 38, no. 9 (1989): 1527. http://dx.doi.org/10.7498/aps.38.1527.

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27

Werckmann, J., R. Chelly, C. Ulhaq-Bouillet, M. Romeo, C. Teodorescu, and C. Ghica. "HRTEM study of Si1−xGex multilayer." Thin Solid Films 294, no. 1-2 (February 1997): 80–83. http://dx.doi.org/10.1016/s0040-6090(96)09298-x.

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28

Zhou, W. "HRTEM investigation of mesoporous molecular sieves." Micron 31, no. 5 (October 2000): 605–11. http://dx.doi.org/10.1016/s0968-4328(99)00143-2.

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29

Kilaas, Roar. "Image Processing and Analysis in HRTEM." Microscopy and Microanalysis 9, S02 (July 31, 2003): 764–65. http://dx.doi.org/10.1017/s1431927603443821.

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30

ICHINOSE, Hideki, Hidetaka SAWADA, and Eriko TAKUMA. "Grain Boundary Structure Analysis by HRTEM." Nihon Kessho Gakkaishi 47, no. 1 (2005): 3–8. http://dx.doi.org/10.5940/jcrsj.47.3.

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31

Medina-Flores, A., L. Béjar-Gómez, L. Zamora, A. Medina-Almazán, and J. Bernal. "HRTEM Analysis of Au-Cu Nanoparticles." Microscopy and Microanalysis 17, S2 (July 2011): 1052–53. http://dx.doi.org/10.1017/s1431927611006131.

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32

Sörgel, Timo, Lorenz Kienle, and Martin Jansen. "HRTEM and SAED investigations of CuxMTe2 ()." Solid State Sciences 8, no. 10 (October 2006): 1187–92. http://dx.doi.org/10.1016/j.solidstatesciences.2006.04.015.

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33

Tao, CHEN, WANG Hejing, ZHANG Xiaoping, and ZHENG Nan. "SAED and HRTEM Investigation of Palygorskite." Acta Geologica Sinica - English Edition 82, no. 2 (September 7, 2010): 385–91. http://dx.doi.org/10.1111/j.1755-6724.2008.tb00588.x.

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34

Ernst, F., P. Pirouz, and A. H. Heuer. "HRTEM study of a Cu/Al2O3interface." Philosophical Magazine A 63, no. 2 (February 1991): 259–77. http://dx.doi.org/10.1080/01418619108204849.

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35

Zhou, Wuzong, and John M. Thomas. "HRTEM surface profile imaging of solids." Current Opinion in Solid State and Materials Science 5, no. 1 (January 2001): 75–83. http://dx.doi.org/10.1016/s1359-0286(00)00037-1.

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36

Miyazawa, K. "Hrtem Investigation of Pzt–c60Thin Films." Surface Engineering 17, no. 1 (February 2001): 38–40. http://dx.doi.org/10.1179/026708401101517584.

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37

Kilaas, Roar. "Defect modeling in HRTEM image simulation." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 528–29. http://dx.doi.org/10.1017/s0424820100086957.

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One practical problem in High Resolution Transmission Electron Microscopy (HRTEM) image simulation is the creation of atomistic models of defect structures. The ideal crystal structures are readily represented by a relatively small number of “basis” atoms and the crystallographic space group. On the other hand, the specification of a grain boundary between two crystals requires the atomic location of possibly thousands of atoms, and a HRTEM simulation program will need all this information before a calculation can be carried out. Users comfortable with writing computer code will write a computer program to generate the hundreds or thousands of atomistic locations, while others may be forced to enter the data by hand or search around for a ready made program that can generate the required data To the authors knowledge, no such suitable program is readily available. There are existing programs that will generate geometric interface models, but these programs were designed to create input to atomistic relaxation calculations, not as generalized tools for creating defect structures.

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38

Glaisher, R. W., D. J. Smith, and A. E. C. Spargo. "Systematic HRTEM imaging of tetrahedral semiconductors." Acta Crystallographica Section A Foundations of Crystallography 43, a1 (August 12, 1987): C257. http://dx.doi.org/10.1107/s0108767387078589.

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39

Bai, Yu-Jun, Cheng-Guo Wang, Ning Lun, Yan-Xiang Wang, Mei-Jie Yu, and Bo Zhu. "HRTEM microstructures of PAN precursor fibers." Carbon 44, no. 9 (August 2006): 1773–78. http://dx.doi.org/10.1016/j.carbon.2005.12.041.

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Nitsche, R., M. Rodewald, G. Skandan, H. Fuess, and H. Hahn. "Hrtem study of nanocrystalline zirconia powders." Nanostructured Materials 7, no. 5 (July 1996): 535–46. http://dx.doi.org/10.1016/0965-9773(96)00027-x.

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41

Gruehn, R. "High resolution transmission electron microscopy (HRTEM)." Fresenius' Zeitschrift für analytische Chemie 333, no. 7 (January 1989): 781–82. http://dx.doi.org/10.1007/bf00476638.

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Howe, James M., Hirotaro Mori, and Zhong Lin Wang. "In Situ High-Resolution Transmission Electron Microscopy in the Study of Nanomaterials and Properties." MRS Bulletin 33, no. 2 (February 2008): 115–21. http://dx.doi.org/10.1557/mrs2008.24.

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AbstractThis article introduces the use of in situ high-resolution transmission electron microscopy (HRTEM) techniques for the study and development of nanomaterials and their properties. Specifically, it shows how in situ HRTEM (and TEM) can be used to understand diverse phenomena at the nanoscale, such as the behavior of alloy phase formation in isolated nanometer-sized particles, the mechanical and transport properties of carbon nanotubes and nanowires, and the dynamic behavior of interphase boundaries at the atomic level. Current limitations and future potential advances in in situ HRTEM of nanomaterials are also discussed.

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Tanaka, Nobuo, Jun Yamasaki, Shingo Fuchi, and Yoshikazu Takeda. "First Observation of InxGa1−xAs Quantum Dots in GaP by Spherical-Aberration-Corrected HRTEM in Comparison with ADF-STEM and Conventional HRTEM." Microscopy and Microanalysis 10, no. 1 (January 22, 2004): 139–45. http://dx.doi.org/10.1017/s1431927604040231.

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InxGa1−xAs quantum dots in GaP(100) crystals prepared by the OMVPE technique are observed along the [011] direction with a newly developed 200-kV spherical aberration(Cs)-corrected HRTEM, a 200-kV annular dark-field (ADF)-STEM, and a 200-kV conventional HRTEM equipped with a thermal field-emission gun. The dots are 6–10 nm in size and strongly strained due to the misfit of about 9% with the GaP substrate and GaP cap layer. All of the cross-sectional high-resolution electron micrographs show dumbbell images of Ga and P atomic columns separated by 0.136 nm in well-oriented and perfect GaP areas, but the interpretable images are limited to those taken with the Cs-corrected HRTEM and ADF-STEM with Fourier filtering of the images. The Cs-corrected HRTEM and ADF-STEM are comparable from the viewpoint of interpretable resolution. A detailed comparison between the Cs-corrected HRTEM images and the simulated ones with electron incidence tilted by 1° to 5° from the [011] zone axis gives information on local lattice bending in the dots from the images around 0.1 nm resolution. This becomes one of the useful techniques newly available from electron microscopy with sub-Ångstrom resolution.

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Matsuoka, Yuki, Katsumi Watanabe, Seiji Saikawa, Susumu Ikeno, and Kenji Matsuda. "HRTEM Observation of Age-Precipitation in Mg-2.9at.% Alloys." Advanced Materials Research 922 (May 2014): 503–6. http://dx.doi.org/10.4028/www.scientific.net/amr.922.503.

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The magnesium alloy containing rare earth element is known to show good heat resistance. In this study, Mg-Y, Mg-Gd and Mg-Gd-Y alloys including the same total amount of solute elements have been investigated to clarified the effect of the Y atom on age-hardening and precipitation using HRTEM, SAED technique and HRTEM simulation. The diffuse scattering by SAED was obtained in as-quenched condition in all alloys. In the specimen at as-quenched condition, the row contrasts consisted of bright and dark dots lying on the {100}Mgplanes, which were considered to mono-layer were observed by HRTEM.

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Keller, Bob. "What's in a 'NYM?" Microscopy Today 21, no. 4 (July 2013): 72. http://dx.doi.org/10.1017/s1551929513000758.

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The field of electron microscopy, by its diverse nature, abounds with acronyms: AEM, EF-TEM, ESEM, FE-SEM, HREM, HRTEM, HVEM, SEM, STEM, TEM, and VP-SEM, to name a few of the instruments. Add in the different forms of data that these instruments might collect, and it can be overwhelming: ADF, BF, BSE, CBED, CL, DF, EBIC, EBSD/BEKP/BKD/EBSP, ECCI, EDS/EDX, EELS, HAADF, NBD, SAD, and SE. For the brave reader, check out the acronym listing at the beginning of DB Williams and CB Carter's series on TEM.

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Sutrisno, H., E. D. Siswani, and K. S. Budiasih. "The effect of sintering temperatures of TiO2(B)-nanotubes on its microstructure." Science of Sintering 50, no. 3 (2018): 291–98. http://dx.doi.org/10.2298/sos1803291s.

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Titanium dioxide (TiO2)-nanotubes were prepared by a simple technique reflux. The morphologies and microstructures of nanotubes were characterized by high resolution scanning electron microscopy (HRSEM), high resolution transmission electron microscopy (TEM), powder X-ray diffraction (XRD,) energy dispersive X-ray spectroscopy (EDS) and surface area analyzer. The microstructures of TiO2 phases obtained from the sintering process of TiO2-nanotubes for 1 hour at various temperatures from 100 to 1000?C at intervals of 50?C were investigated from the XRD diffractograms. The analyses of morphologies and microstructures from HRSEM and HRTEM images describe the sample as nanotubes. The nanotube is single phase exhibiting TiO2(B) structure. The XRD patterns show that TiO2(B)-nanotubes transform into anatase phase and then become rutile due to increasing sintering temperatures.

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Matsuda, Kenji, Junya Nakamura, Tokimasa Kawabata, Susumu Ikeno, Tatsuo Sato, Calin D. Marioara, Sigmund J. Andersen, and Randi Holmestad. "Effect of Additional Elements (Cu, Ag) on Precipitation in 6xxx (Al-Mg-Si) Alloys." Materials Science Forum 706-709 (January 2012): 357–60. http://dx.doi.org/10.4028/www.scientific.net/msf.706-709.357.

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It has been known that Cu- or Ag-addition Al-1.0mass%Mg2Si (balanced) alloys shows higher hardness and elongation than Cu-free or Ag-free balance alloy. In this study, the alloys with Cu or Ag addition and the alloys with Si / Mg in excess have been investigated by hardness and tensile tests and HRTEM observation. Cu addition is effective for higher hardness, and Ag-addition is useful for improvement of elongation for peak-aged samples. Precipitates in peak aged these alloys have been confirmed by HRTEM. Cu-addition alloy almost includes Q’-phase, and Ag-addition alloy includes b’-phase. The precipitation sequence of Ag- or Cu addition Al-Mg-Si alloy was investigated using HRTEM, SAED, and EDS. The precipitates obtained in the two alloys were classified into several kinds by HRTEM images and SAED patterns. The relative frequencies of precipitates were also investigated and compared with that in the alloy.

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Medlin, D. L., J. E. Smugeresky, and D. Cohen. "Image Periodicities Introduced by Three-Fold Astigmatism in HRTEM Images of α-Al2O3 and Related Materials." Microscopy and Microanalysis 4, S2 (July 1998): 596–97. http://dx.doi.org/10.1017/s1431927600023102.

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HRTEM images of α-Al2O3 oriented along [1100] often exhibit a modulation of the basal fringe intensity with a period that corresponds to twice the basal plane spacing. In the example shown in figure 1, note the strong basal fringe contrast in the A12O3 with a period of 4.33 Å. HRTEM image simulations for ideal imaging conditions fail to reproduce this doubling of the lattice fringe period. Instead, simulated images predict that the (0006) fringes (d0006=2.17 Å) should be of equal intensity (e.g., see Figure 3a). Incorrect beam and/or crystal tilt can strongly affect HRTEM image contrast. In particular, anomalous periodicities can arise under beam and crystal tilt conditions for which normally kinematically and dynamically forbidden diffracted beams contribute to the image. More recently, the importance of 3-fold astigmatism on HRTEM imaging has been recognized. As with beam tilt, this lens aberration produces asymmetrical phase shifts in the diffracted beams.

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Taylor, S., J. Mardinly, M. A. O'Keefe, and R. Gronsky. "HRTEM Image Simulations of Structural Defects in Gate Oxides." Microscopy and Microanalysis 6, S2 (August 2000): 1078–79. http://dx.doi.org/10.1017/s1431927600037880.

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High-resolution transmission electron microscopy (HRTEM) is used extensively in the semiconductor industry for device characterization, and has become one of the highly favored techniques for characterizing the latest generation of ultra-thin gate oxides in MOSFET devices. However, relatively little is understood (either quantitatively or experimentally) about the limitations of HRTEM in detecting structural defects in gate oxides that could affect device performance. To investigate model defects experimentally, it would be necessary to construct “perfect” gate oxides, introduce defects with size and morphology known perfectly a priori, successfully make thin specimens that capture the defects, and then perform imaging experiments in the HRTEM. Since that task is virtually impossible, we have performed HRTEM image simulations to assess the visibility of various structural defects in gate oxides. The gate oxide was modeled as an amorphous silicon oxide 16.3Å-thick, sandwiched between a gate and substrate. The substrate was (100) silicon viewed along the [110] direction.

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Kiss, Ákos K., Edgar F. Rauch, Béla Pécz, János Szívós, and János L. Lábár. "A Tool for Local Thickness Determination and Grain Boundary Characterization by CTEM and HRTEM Techniques." Microscopy and Microanalysis 21, no. 2 (March 24, 2015): 422–35. http://dx.doi.org/10.1017/s1431927615000112.

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AbstractA new approach for measurement of local thickness and characterization of grain boundaries is presented. The method is embodied in a software tool that helps to find and set sample orientations useful for high-resolution transmission electron microscopic (HRTEM) examination of grain boundaries in polycrystalline thin films. The novelty is thesimultaneoustreatment of the two neighboring grains and orienting both grains and the boundary planesimultaneously. The same metric matrix-based formalism is used for all crystal systems. Input into the software tool includes orientation data for the grains in question, which is determined automatically for a large number of grains by the commercial ASTAR program. Grain boundaries suitable for HRTEM examination are automatically identified by our software tool. Individual boundaries are selected manually for detailed HRTEM examination from the automatically identified set. Goniometer settings needed to observe the selected boundary in HRTEM are advised by the software. Operation is demonstrated on examples from cubic and hexagonal crystal systems.

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