Books on the topic 'High temperature semiconductors'

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1

M, Willander, and Hartnagel Hans 1934-, eds. High temperature electronics. London: Chapman & Hall, 1997.

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2

National Research Council (U.S.). Committee on Materials for High-Temperature Semiconductor Devices., ed. Materials for high-temperature semiconductor devices. Washington, D.C: National Academy Press, 1995.

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3

Bakker, Anton. High-accuracy CMOS smart temperature sensors. Boston, MA: Kluwer Academic Publishers, 2000.

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4

Christou, A. Reliability of high temperature electronics. College Park, Md: Center for Reliability Engineering, University of Maryland, 1996.

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5

Bakker, Anton. High-Accuracy CMOS Smart Temperature Sensors. Boston, MA: Springer US, 2000.

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6

universitet, Uppsala, ed. Dynamic magnetic properties of high temperature superconductors at low fields. Uppsala: Acta Universitatis Upsaliensis, 1997.

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7

Corvasce, Chiara. Mobility and impact ionization in silicon at high temperature. Konstanz: Hartung-Gorre, 2007.

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8

Corvasce, Chiara. Mobility and impact ionization in silicon at high temperature. Konstanz: Hartung-Gorre, 2007.

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9

L, Shindé Subhash, and Rudman David Albert, eds. Interfaces in high-Tc superconducting systems. New York: Springer-Verlag, 1994.

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10

Longya, Xu, Zhu Lu, and United States. National Aeronautics and Space Administration., eds. A thermal and electrical analysis of power semiconductor devices: Research report. [Washington, DC: National Aeronautics and Space Administration, 1997.

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11

Longya, Xu, Zhu Lu, and United States. National Aeronautics and Space Administration., eds. A thermal and electrical analysis of power semiconductor devices: Research report. [Washington, DC: National Aeronautics and Space Administration, 1997.

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12

M, Singer J., ed. Phase transition approach to high temperature superconductivity: Universal properties of cuprate superconductors. London: Imperial College Press, 2000.

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13

Symposium E on High-Temperature Electronics: Materials, Devices, and Applications (1994 Strasbourg, France). High temperature electronics: Proceedings of Symposium E on High-Temperature Electronics: Materials, Devices, and Applications of the 1994 E-MRS Spring Conference, Strasbourg, France, May 24-27, 1994. Amsterdam: Elsevier, 1995.

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14

Carpinero, Gullerno. Semiconductor terahertz technology: Devices and systems at room temperature operation. Hoboken: John Wiley & Sons, Inc., 2015.

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15

A, Smirnov I., Institut fiziki (Akademii͡a︡ nauk SSSR), and Vsesoi͡u︡znai͡a︡ shkola "Aktualʹnye voprosy fiziki i khimii redkozemelʹnykh poluprovodnikov" (7th : 1987 : Makhachkala, Russia), eds. Aktualʹnye voprosy fiziki i khimii redkozemelʹnykh poluprovodnikov: Tematicheskiĭ sbornik. Makhachkala: Institut fiziki, Dagestanskiĭ filial AN SSSR, 1988.

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16

L, Shindé Subhash, and Rudman David A, eds. Interfaces in high-T(subscript c) superconducting systems. New York: Springer-Verlag, 1994.

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17

A, Madhukar, Society of Photo-optical Instrumentation Engineers., Society of Vacuum Coaters, and SPIE Symposium on Advances in Semiconductors and Superconductors: Physics Toward Device Applications (1990 : San Diego, Calif.), eds. Growth of semiconductor structures and high-Tc thin films on semiconductors: 20-21 March 1990, San Diego, Calfiornia. Bellingham, Wash., USA: The Society, 1990.

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18

European Conference on High Temperature Electronics (3rd 1999 Berlin, Germany). HITEN 99: The Third European Conference on High Temperature Electronics. Abingdon, Oxfordshire, England: AEA Technology, 1999.

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19

D, Hochheimer Hans, Etters Richard D, North Atlantic Treaty Organization. Scientific Affairs Division., and NATO Advanced Research Workshop on Frontiers of High-Pressure Research (1991 : Fort Collins, Colo.), eds. Frontiers of high-pressure research. New York: Plenum Press, 1991.

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20

Dammann, Michael. Defects in silicon induced by high temperature treatment and their influence on MOS-devices: A thesis submitted to the Swiss Federal Institute of Technology Zurich for the degree of Doctor of Technical Sciences. Zurich: Physical Electronics Laboratory, Swiss Federal Institute of Technology, 1994.

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21

Christian, Fazi, Parsons James D, and United States. National Aeronautics and Space Administration., eds. Fast risetime reverse bias pulse failures in SiC PN junction diodes. [Washington, DC]: National Aeronautics and Space Administration, 1996.

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22

1949-, Simons Rainee, and United States. National Aeronautics and Space Administration., eds. Characteristics of III-V semiconductor devices at high temperature. [Washington, D.C.]: National Aeronautics and Space Administration, 1994.

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23

1949-, Simons Rainee, and United States. National Aeronautics and Space Administration., eds. Characteristics of III-V semiconductor devices at high temperature. [Washington, D.C.]: National Aeronautics and Space Administration, 1994.

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24

Anthony, Powell J., Petit Jeremy B, and United States. National Aeronautics and Space Administration., eds. Development of silicon carbide semiconductor devices for high temperature applications. [Washington, DC]: National Aeronautics and Space Administration, 1991.

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25

K, Yeoh W., ed. Improvement of vortex pinning in MgB₂ by doping. New York: Nova Science Publishers, 2008.

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26

Nagaev, Edouard. Magnetic Semiconductors and High Temperature Superconductivity. University of Cambridge ESOL Examinations, 1999.

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27

Spencer, Michael, Michael Shur, Steven Denbaars, and John Palmour. Wide-Bandgap Semiconductors for High Power, High Frequency and High Temperature: Volume 512. University of Cambridge ESOL Examinations, 2014.

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28

(Editor), Magnus Willander, and H. L. Hartnagel (Editor), eds. High Temperature Electronics (Electronic Materials Series). Springer, 1996.

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29

Jeon, Deok-Su. Modeling the temperature dependence of the silicon-on-insulator mosfet for high-temperature applications. 1990.

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30

Characteristics of III-V semiconductor devices at high temperature. [Washington, D.C.]: National Aeronautics and Space Administration, 1994.

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31

Wide-bandgap semiconductors for high power, high frequency, and high temperature: Symposium held April 13-15, 1998, San Francisco, California, U.S.A. Warrendale, Penn: Materials Research Society, 1998.

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32

Shinde, Subhash. Interfaces in High-Tc Superconducting Systems. Springer, 2013.

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33

Han, Weimin. NMR study of GaAs at high temperature. 1992.

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34

Germany) European Conference on High Temperature Electronics (3rd : 1999 : Berlin. Hiten 99: The Third European Conference on High Temperature Electronics. Institute of Electrical & Electronics Enginee, 1999.

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35

Hartnagel, Hans, Guillermo Carpintero, Enrique Garcia-Munoz, Sascha Preu, and Antti Räisänen. Semiconductor TeraHertz Technology: Devices and Systems at Room Temperature Operation. Wiley & Sons, Limited, John, 2015.

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36

Hartnagel, Hans, Guillermo Carpintero, Enrique Garcia-Munoz, Sascha Preu, and Antti Raisanen. Semiconductor TeraHertz Technology: Devices and Systems at Room Temperature Operation. Wiley & Sons, Incorporated, John, 2015.

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37

Hartnagel, Hans, Guillermo Carpintero, Enrique Garcia-Munoz, Sascha Preu, and Antti Raisanen. Semiconductor TeraHertz Technology: Devices and Systems at Room Temperature Operation. Wiley & Sons, Incorporated, John, 2015.

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38

Dikmen, Cemal Tamer. Modeling and design of semiconductor devices and integrated circuits for high-temperature electronics. 1994.

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39

Wide-Bandgap Semiconductors for High Power, High Frequency and High Temperature: Symposium Held April 13-15, 1998, San Francisco, California, U.S.A (Materials Research Society Symposium Proceedings). Materials Research Society, 1998.

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40

(Editor), Hans D. Hochheimer, and Richard E. Etters (Editor), eds. Frontiers of High Pressure Research (NATO Science Series: B:). Springer, 1992.

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41

Bakker, Anton, and Johan H. Huijsing. High-Accuracy CMOS Smart Temperature Sensors (The Kluwer International Series in Engineering and Computer Science Volume 595) (The Springer International Series in Engineering and Computer Science). Springer, 2000.

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42

Atomic layer growth and processing: Symposium held April 29 - May 1, Anaheim, California, U.S.A. Pittsburgh: Materials Research Society, 1991.

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43

Fast risetime reverse bias pulse failures in SiC PN junction diodes. [Washington, DC]: National Aeronautics and Space Administration, 1996.

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44

Materials for High-Temperature Semiconductor Devices. Washington, D.C.: National Academies Press, 1995. http://dx.doi.org/10.17226/5023.

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45

Committee on Materials for High-Temperature Semiconductor Devices. Materials for High-Temperature Semiconductor Devices. National Academies Press, 1995.

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46

Committee on Materials for High-Temperature Semiconductor Devices. Materials for High-Temperature Semiconductor Devices. National Academies Press, 1995.

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47

Committee on Materials for High-Temperature Semiconductor Devices. Materials for High-Temperature Semiconductor Devices. National Academies Press, 1995.

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48

Characteristics of III-V semiconductor devices at high temperature. [Washington, D.C.]: National Aeronautics and Space Administration, 1994.

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49

Neuenschwander, Jürg. A high pressure low temperature study on rare earth compounds: Semiconductor to metal transition. 1988.

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50

Queisser, H. J. Festkörper Probleme: Plenary Lectures of the Divisions Semiconductor Physics, Surface Physics, Low Temperature Physics, High Polymers, Thermodynamics and Statistical Mechanics, of the German Physical Society, Münster, March 19-24 1973. Elsevier Science & Technology Books, 2013.

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