Relevant bibliographies by topics / Focused Ion Beam machining / Books
To see the other types of publications on this topic, follow the link: Focused Ion Beam machining.

Books on the topic 'Focused Ion Beam machining'

Author: Grafiati
Published: 6 September 2023

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the top 34 books for your research on the topic 'Focused Ion Beam machining.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Browse books on a wide variety of disciplines and organise your bibliography correctly.

1

Foster, C. P. J. A comparison of electro discharge machining, laser & focused ion beam micromachining technologies. Cambridge: TWI, 1998.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
2

Yao, Nan, ed. Focused Ion Beam Systems. Cambridge: Cambridge University Press, 2007. http://dx.doi.org/10.1017/cbo9780511600302.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Nan, Yao, ed. Focused ion beam systems: Basics and applications. Cambridge: Cambridge University Press, 2007.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
4

Bachmann, Maja D. Manipulating Anisotropic Transport and Superconductivity by Focused Ion Beam Microstructuring. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-51362-7.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Córdoba Castillo, Rosa. Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-02081-5.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Orloff, Jon. High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology. Boston, MA: Springer US, 2003.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
7

1934-, Swanson Lynwood, and Utlaut Mark William 1949-, eds. High resolution focused ion beams: FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology. New York: Kluwer Academic/Plenum Publishers, 2003.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
8

Orloff, Jon. High resolution focused ion beams: FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology. New York, NY: Kluwer Academic/Plenum Publishers, 2003.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
9

Fernandez-Pacheco, Amalio. Studies of Nanoconstrictions, Nanowires and Fe₃O₄ Thin Films: Electrical Conduction and Magnetic Properties. Fabrication by Focused Electron/Ion Beam. Berlin, Heidelberg: Springer-Verlag Berlin Heidelberg, 2011.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
10

Japan-U.S. Seminar on Focused Ion Beam Technology and Applications (1987 Osaka, Japan and Mie-ken, Japan). Proceedings of the Japan-U.S. Seminar on Focused Ion Beam Technology and Applications: 15-19 November 1987, Senri Hankyu Hotel, Osaka, and 20 November 1987, Shima Kanko Hotel, Mie Prefect, Japan. Edited by Harriott Lloyd R, Nihon Gakujutsu Shinkōkai, National Science Foundation (U.S.), and American Vacuum Society. New York: Published for the American Vacuum Society by the American Institute of Physics, 1988.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
11

Yao, Nan. Focused Ion Beam Systems. Cambridge University Press, 2011.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
12

Cox, David C. Introduction to Focused Ion Beam Nanometrology. Morgan & Claypool Publishers, 2015.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
13

Cox, David C. Introduction to Focused Ion Beam Nanometrology. Morgan & Claypool Publishers, 2015.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
14

Cox, David C. Introduction to Focused Ion Beam Nanometrology. Morgan & Claypool Publishers, 2015.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
15

Yao, Nan. Focused Ion Beam Systems: Basics and Applications. Cambridge University Press, 2010.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
16

Yao, Nan. Focused Ion Beam Systems: Basics and Applications. Cambridge University Press, 2011.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
17

Vijgen, Lucas Joseph. Coulomb Interactions in Focused Ion Beam Systems. Delft Univ Pr, 1994.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
18

Finch, Dudley, and Alexander Buxbaum. Focused Ion Beam Instrumentation: Techniques and Applications. Wiley & Sons, Limited, John, 2014.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
19

Finch, Dudley, and Alexander Buxbaum. Focused Ion Beam Instrumentation: Techniques and Applications. Wiley & Sons, Incorporated, John, 2019.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
20

Yao, Nan. Focused Ion Beam Systems: Basics and Applications. Cambridge University Press, 2007.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
21

Keskinbora, Kahraman. Prototyping Micro- and Nano-Optics with Focused Ion Beam Lithography. SPIE, 2019. http://dx.doi.org/10.1117/3.2531118.

Full text
APA, Harvard, Vancouver, ISO, and other styles
22

Castillo, Rosa Córdoba. Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition. Springer, 2013.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
23

Castillo, Rosa Córdoba Córdoba. Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition. Springer, 2016.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
24

Castillo, Rosa Córdoba. Functional Nanostructures Fabricated by Focused Electron/Ion Beam Induced Deposition. Springer London, Limited, 2013.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
25

Bachmann, Maja D. Manipulating Anisotropic Transport and Superconductivity by Focused Ion Beam Microstructuring. Springer, 2020.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
26

Bachmann, Maja D. Manipulating Anisotropic Transport and Superconductivity by Focused Ion Beam Microstructuring. Springer International Publishing AG, 2021.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
27

Fernandez-Pacheco, Amalio. Studies of Nanoconstrictions, Nanowires and Fe3O4 Thin Films: Electrical Conduction and Magnetic Properties. Fabrication by Focused Electron/Ion Beam. Springer, 2013.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
28

Fernandez-Pacheco, Amalio. Studies of Nanoconstrictions, Nanowires and Fe3O4 Thin Films: Electrical Conduction and Magnetic Properties. Fabrication by Focused Electron/Ion Beam. Springer, 2011.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
29

Fernández-Pacheco Chicón, Amalio. Electrical conduction and magnetic properties of nanoconstrictions and nanowires created by focused electron/ion beam and of Fe3O4 thin films. Prensas Universitarias de Zaragoza, 2009. http://dx.doi.org/10.26754/uz.978-84-92774-52-4.

Full text
APA, Harvard, Vancouver, ISO, and other styles
30

Proceedings of the Japan-U.S. Seminar on Focused Ion Beam Technology and Applications: 15-19 November 1987, Senri Hankyu Hotel, Osaka, and 20 November 1987, Shima Kanko Hotel, Mie Prefect, Japan. Published for the American Vacuum Society by the American Institute of Physics, 1988.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
31

The 2006-2011 World Outlook for Pattern-Generating Wafer Processing Equipment Used to Produce Masks and Reticles from Photoresist Coated Substrates Excluding Focused Ion Beam Milling Machines. Icon Group International, Inc., 2005.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
32

Parker, Philip M. The 2007-2012 World Outlook for Pattern-Generating Wafer Processing Equipment Used to Produce Masks and Reticles from Photoresist Coated Substrates Excluding Focused Ion Beam Milling Machines. ICON Group International, Inc., 2006.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
33

Gallop, J., and L. Hao. Superconducting Nanodevices. Edited by A. V. Narlikar. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780198738169.013.17.

Full text
Abstract:
This article reviews recent progress in superconducting nanodevices, with particular emphasis on fabrication methods developed for superconducting nanowires and nanoscale Josephson junctions based on different barrier materials. It evaluates the future potential of superconducting nanodevices, including nano-superconducting quantum interference devices (nanoSQUIDs), in light of improvements in nanoscale fabrication and manipulation techniques, along with their likely impacts on future quantum technology and measurement. The article first considers efforts to realize devices at the physical scale of 100 nm and below before discussing different types of Josephson junction such as trilayer junctions. It also describes the use of focused ion beam milling and electron beam lithography techniques for junction fabrication at the nanoscale and the improved energy sensitivity detectable with a nanoSQUID. Finally, it looks at a range of applications for nanoSQUIDs, superconducting single photon detectors, and other superconducting nanodevices.
APA, Harvard, Vancouver, ISO, and other styles
34

Hong, M. H. Laser applications in nanotechnology. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533060.013.24.

Full text
Abstract:
This article discusses a variety of laser applications in nanotechnology. The laser has proven to be one of many mature and reliable manufacturing tools, with applications in modern industries, from surface cleaning to thin-film deposition. Laser nanoengineering has several advantages over electron-beam and focused ion beam processing. For example, it is a low-cost, high-speed process in air, vacuum or chemical environments and also has the capability to fulfill flexible integration control. This article considers laser nanotechnology in the following areas: pulsed laser ablation for nanomaterials synthesis; laser nanoprocessing to make nanobumps for disk media nanotribology and anneal ultrashort PN junctions; surface nanopatterning with near-field, and light-enhancement effects; and large-area parallel laser nanopatterning by laser interference lithography and laser irradiation through a microlens array. Based on these applications, the article argues that the laser will continue to be one of the highly potential nanoengineering means in next-generation manufacturing.
APA, Harvard, Vancouver, ISO, and other styles
You might also be interested in the bibliographies on the topic 'Focused Ion Beam machining' for other source types:
Journal articles Dissertations / Theses
We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!

To the bibliography