Dissertations / Theses on the topic 'Film roughness'
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Lee, Hyunjin. "Radiative properties of silicon wafers with microroughness and thin-film coatings." Diss., Available online, Georgia Institute of Technology, 2006, 2006. http://etd.gatech.edu/theses/available/etd-07092006-181152/.
Full textZhang, Zhuomin, Committee Chair ; Joshi, Yogendra, Committee Member ; Lee, Kok-Meng, Committee Member ; Gallivan, Martha, Committee Member ; Zhao, Yiping, Committee Member.
Guegan, Johan. "Experimental investigation into the influence of roughness on friction and film thickness in EHD contacts." Thesis, Imperial College London, 2015. http://hdl.handle.net/10044/1/53388.
Full textCardwell, Nicholas Don. "Effects of Realistic First-Stage Turbine Endwall Features." Thesis, Virginia Tech, 2005. http://hdl.handle.net/10919/36121.
Full textMaster of Science
Shioya, Nobutaka. "Development of Analytical Technique of Molecular Orientation in a Thin Film and Its Application to Low-Crystallinity Organic Thin Films Having a Surface Roughness." Kyoto University, 2018. http://hdl.handle.net/2433/232268.
Full textAghasi, Paul P. "Dependence of Film Cooling Effectiveness on 3D Printed Cooling Holes." University of Cincinnati / OhioLINK, 2016. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1458893416.
Full textWebb, Joshua J. "The Effect of Particle Size and Film Cooling on Nozzle Guide Vane Deposition." The Ohio State University, 2011. http://rave.ohiolink.edu/etdc/view?acc_num=osu1313528110.
Full textPavlík, František. "Studium vlivu parametru elipticity na rozložení tloušťky mazacího filmu." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2011. http://www.nusl.cz/ntk/nusl-229941.
Full textFratini, Christopher M. "Study of the Morphology and Optical Properties of Propylene/Ethylene Copolymer Films." Diss., Virginia Tech, 2006. http://hdl.handle.net/10919/27211.
Full textPh. D.
Sugar, Joshua D. "Mechanisms of microstructure development at metallic-interlayer/ceramic interfaces during liquid-film-assisted bonding." Berkeley, Calif. : Oak Ridge, Tenn. : Lawrence Berkeley National Laboratory ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 2003. http://www.osti.gov/servlets/purl/825347-j6A0Su/native/.
Full textPublished through the Information Bridge: DOE Scientific and Technical Information. "LBNL--54185" Sugar, Joshua D. USDOE Director. Office of Science. Basic Energy Sciences (US) 12/01/2003. Report is also available in paper and microfiche from NTIS.
Simon, Darren, and s3027589@student rmit edu au. "Chemistry and Morphology of Polymer Thin Films for Electro-Optical Application." RMIT University. Applied Sciences, 2006. http://adt.lib.rmit.edu.au/adt/public/adt-VIT20070123.122707.
Full textBock, Bradley D. "Surface influences on falling film boiling and pool boiling of saturated refrigerants : influences of nanostructures, roughness and material on heat transfer, dryout and critical heat flux of tubes." Thesis, University of Pretoria, 2020. http://hdl.handle.net/2263/78711.
Full textThesis (PhD)--University of Pretoria, 2020.
Mechanical and Aeronautical Engineering
PhD (Mechanical Engineering)
Unrestricted
Moraru, Laurentiu Eugen. "Numerical Predictions and Measurements in the Lubrication of Aeronautical Engine and Transmission Components." University of Toledo / OhioLINK, 2005. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1125769629.
Full textŠperka, Petr. "In-situ studium změny topografie třecích povrchů v elastohydrodynamickém kontaktu." Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2011. http://www.nusl.cz/ntk/nusl-233978.
Full textDahal, Lila R. "Spectroscopic Ellipsometry Studies of Thin Film a-Si:H Solar Cell Fabrication by Multichamber Deposition in the n-i-p Substrate Configuration." University of Toledo / OhioLINK, 2013. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1365202814.
Full textFabricius, John. "Homogenization of some problems in hydrodynamic lubrication involving rough boundaries." Doctoral thesis, Luleå tekniska universitet, Matematiska vetenskaper, 2011. http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-25734.
Full textGodkänd; 2011; 20110408 (johfab); DISPUTATION Ämnesområde: Matematik/Mathematics Opponent: Professor Guy Bayada, Institut National des Sciences Appliquées de Lyon (INSA-LYON), Lyon, France, Ordförande: Professor Lars-Erik Persson, Institutionen för teknikvetenskap och matematik, Luleå tekniska universitet Tid: Tisdag den 7 juni 2011, kl 10.00 Plats: D2214/15, Luleå tekniska universitet
Wang, Guoqing. "Thin water films driven by air through surface roughness." [Ames, Iowa : Iowa State University], 2008.
Find full textFong, Tsz Wang. "Surface roughness parameter at synthesis of cubic boron nitride films." access abstract and table of contents access full-text, 2005. http://libweb.cityu.edu.hk/cgi-bin/ezdb/dissert.pl?msc-ap-b21174143a.pdf.
Full textAt head of title: City University of Hong Kong, Department of Physics and Materials Science, Master of Science in materials engineering & nanotechnology dissertation. Title from title screen (viewed on Aug. 31, 2006) Includes bibliographical references.
Picard, Loïc. "Mise au point d'additifs siliciés pour l'adhérisation d'élastomères silicone sur supports métalliques." Thesis, Lyon, INSA, 2014. http://www.theses.fr/2014ISAL0114.
Full textThis PhD work aimed at developing a stable primer of adhesion, allowing the bonding of all types of silicone elastomers onto a vast majority of metallic surfaces, in a reproducible way. In a first approach, a detailed bibliographic study was performed on the different primer based-silane formulations used for the adhesion of any types of silicone elastomers (HCR, RTV and LSR). To better understand the metal/primer/silicone elastomer system, three primer formulations, including a homemade formulation, and three silicone elastomers were analyzed and their compositions, and adhesive properties, were determined. The characterization of different silicone resins entering in the composition of the homemade primer formulation was also carried out. The latter was optimized by synthetizing new silicone resins, by adjusting the content of each component and by changing the type of catalyst. In a second step, the characterization of the physical chemistry of the primer formulations coated on a metal surface (aluminum) was performed. The topology of the primer films (thickness, roughness and uniformity) and their wettability were determined. These information were completed by the characterization of fracture profiles of the composite part metal/primer/silicone elastomer. Following these additional analyses, the parameter governing the selectivity of a primer formulation for a grade of HCR was isolated and a model curve for the formulation of a polyvalent primer was proposed. This curve was validated by the formulation of a primer which can bond the different grades of HCR selected for this study
Watson, Shannon M. "Impact of large scale substrate roughness on giant magnetoresistive thin films." W&M ScholarWorks, 2005. https://scholarworks.wm.edu/etd/1539623488.
Full textYousaf, Yusra. "Surface roughness characterisation of the polymeric films by atomic force microscopy." Thesis, University of Manchester, 2015. https://www.research.manchester.ac.uk/portal/en/theses/surface-roughness-characterisation-of-the-polymeric-films-by-atomic-force-microscopy(84735afa-6dd4-419a-9821-0646311ab4cd).html.
Full textHu, Jin. "Experimental and theoretical investigation of roughness effects on thin laminar fluid films." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1997. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp02/NQ27957.pdf.
Full textRahman, Mohammed Magfurar. "MAPPING SURFACE SOIL MOISTURE AND ROUGHNESS BY RADAR REMOTE SENSING IN THE SEMI-ARID ENVIRONMENT." Diss., Tucson, Arizona : University of Arizona, 2005. http://etd.library.arizona.edu/etd/GetFileServlet?file=file:///data1/pdf/etd/azu%5Fetd%5F1193%5F1%5Fm.pdf&type=application/pdf.
Full textROGER, JEAN-PAUL. "Contributions a l'etude des surfaces, interfaces et films minces par la methode mirage." Paris 6, 1988. http://www.theses.fr/1988PA066509.
Full textTrigoulet, Nicolas. "Probing barrier-type anodic alumina films on nano-patterned substrates." Thesis, University of Manchester, 2010. https://www.research.manchester.ac.uk/portal/en/theses/probing-barriertype-anodic-alumina-films-on-nanopatterned-substrates(7c888ffd-f901-4993-b30d-05fc0a3bf514).html.
Full textRayan, Mihir K. "Spray deposition of biomolecular thin films." [Tampa, Fla] : University of South Florida, 2008. http://purl.fcla.edu/usf/dc/et/SFE0002681.
Full textLehmann, Daniel, Falko Seidel, and Dietrich R. T. Zahn. "Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometry." Universitätsbibliothek Chemnitz, 2014. http://nbn-resolving.de/urn:nbn:de:bsz:ch1-qucosa-136724.
Full textBodart, Vincent. "Controle de la croissance d'empilements ultra-minces carbone tungstene et silicium-tungstene par ellipsometrie cinetique in-situ : application aux miroirs pour x-mous." Paris 7, 1987. http://www.theses.fr/1987PA077094.
Full textEspinosa, Jorge D. "De-wetting of cobalt thin films on sapphire." Morgantown, W. Va. : [West Virginia University Libraries], 2007. https://eidr.wvu.edu/etd/documentdata.eTD?documentid=5314.
Full textTitle from document title page. Document formatted into pages; contains ix, 106 p. : ill. (some col.). Vita. Includes abstract. Includes bibliographical references (p. 102-105).
Agra-Kooijman, Deña Mae G. "Liquid Crystal Alignment and Relaxation Dynamics at Surface Modified Thin Polymer Films." Kent State University / OhioLINK, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=kent1228148263.
Full textGilliam, David R. "A study of contact between a profile meter stylus and polymer films on roughened substrates." Thesis, Virginia Tech, 1985. http://hdl.handle.net/10919/45727.
Full textMaster of Science
Nemani, Lingeshwar. "Effect of SnO2 Roughness and CdS Thickness on the Performance of CdS/CdTe Solar Cells." Scholar Commons, 2005. https://scholarcommons.usf.edu/etd/790.
Full textHerffurth, Tobias [Verfasser], Andreas [Akademischer Betreuer] Tünnermann, Richard [Akademischer Betreuer] Kowarschick, and Miloslav [Akademischer Betreuer] Ohlidal. "Light scattering and roughness analysis of optical surfaces and thin films / Tobias Herffurth. Gutachter: Andreas Tünnermann ; Richard Kowarschick ; Miloslav Ohlidal." Jena : Thüringer Universitäts- und Landesbibliothek Jena, 2015. http://d-nb.info/1072622106/34.
Full textMallett, Jonathan James. "Electrochemical deposition, characterisation of metal films, and the modification of electrodes by near-field photolithography." Thesis, University of Bristol, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.324298.
Full textAvila, Solis Sandra Milagros. "Evaluación in vitro de la microrugosidad superficial de dos resinas tipo Bulk Fill inmersas a dos bebidas rehidratantes con pH de 2,79 y 3,3." Bachelor's thesis, Universidad Peruana de Ciencias Aplicadas (UPC), 2019. http://hdl.handle.net/10757/628127.
Full textObjective: To compare in vitro the surface roughness of a BulkFill composite resin: Aura® BulkFill (SDI) with Tetric N-Ceram® BulkFill resin (Ivoclar Vivadent) when immersed in two rehydration drinks: Sporade® and Gatorade®. Materials and methods: 88 resin specimens divided into four groups were used, with a metal matrix (10 mm x 4 mm). The resins were inserted with a resin spatula, and photo-activated with the Elipar LedTM lamp, with an intensity of 1200 mW/cm2. The specimens were immersed in distilled water. After 24 hours, the roughness was measured with the Mitutoyo SJ-210P rugosimeter. Then, the immersion in rehydration drinks was performed and the final roughness was measured after 7 days. Results: The initial and final roughness of the resins Aura® BulkFill (SDI) and Tetric N-Ceram® BulkFill (Ivoclar Vivadent) showed significant differences after immersion in rehydration drinks. For specimens of Aura® BulkFill (SDI) when subjected to Sporade® an initial mean of 1.20 and a final average of 1.76 was found and the values for Gatorade® were 0.77 and 1.73. While the surface roughness of Tetric N-Ceram® BulkFill (Ivoclar Vivadent) when immersed in Sporade® was 0.82 and 1.55, and in Gatorade® 0.77 and 1.73. When comparing the difference of the final and initial surface roughness (deltas), the Aura® BulkFill resin showed significant differences while, Tetric N-Ceram® BulkFill did not have differences when immersing them in both rehydration drinks. Conclusions: The resins studied increased their roughness after being immersed in the aforementioned beverages.
Tesis
Mammei, Russell Rene. "Thin Films for the Transport of Polarized Ultracold Neutrons for Fundamental Symmetry Study." Diss., Virginia Tech, 2010. http://hdl.handle.net/10919/28714.
Full textUCN guides facilitate the transfer of UCN from the source to the spectrometer. Common guide materials include stainless steel, copper, aluminum, and quartz. Often a thin film is applied to these components to increase their ability to transport/bottle and preserve the polarization of UCN. In the region of the SD2 UCN source, nickel-58 films are applied, whereas once the UCN are polarized, diamond-like carbon (DLC) films are employed. This dissertation covers the application, process developments, and characterization of these coatings. In addition a study concerning the surface finish resulting from the mechanical polishing and electropolishing of the guides that make up the UCNA beamline is presented.
Ph. D.
Melo, Leonidas Lopes de. "Dinâmica de crescimento de filmes de platina e ouro." Universidade de São Paulo, 2004. http://www.teses.usp.br/teses/disponiveis/43/43134/tde-26022014-093131/.
Full textThe randomness and inhomogeneities in the growth of thin films generate a rough surface obeying, in general, fractal geometry. The growth dynamics of film surface can be described by theoretical discrete models, numerical simulations and stochastic differential equations. Models and equations give the critical exponents that describe the behavior of roughness with the observation scale and deposition time. We have synthesized platinum and gold films by metal plasma immersion ion implantation and deposition. We have measured the critical exponents by Scanning Tunneling Microscopy. Our experimental results were compared with some theoretical models predictions. We verified that there is a good agreement between them and the theoretical predictions given by the Kardar, Parisi and Zhang stochastic equation. The crystallographic structure was also analyzed by X-ray diffraction.
Duvivier, Pierre-Yves. "Étude expérimentale et modélisation du contact électrique et mécanique quasi statique entre surfaces rugueuses d'or : application aux micro-relais mems." Phd thesis, Ecole Nationale Supérieure des Mines de Saint-Etienne, 2010. http://tel.archives-ouvertes.fr/tel-00740248.
Full textPepenene, Refuoe Donald. "Macroscopic and Microscopic surface features of Hydrogenated silicon thin films." University of the Western Cape, 2018. http://hdl.handle.net/11394/6414.
Full textAn increasing energy demand and growing environmental concerns regarding the use of fossil fuels in South Africa has led to the challenge to explore cheap, alternative sources of energy. The generation of electricity from Photovoltaic (PV) devices such as solar cells is currently seen as a viable alternative source of clean energy. As such, crystalline, amorphous and nanocrystalline silicon thin films are expected to play increasingly important roles as economically viable materials for PV development. Despite the growing interest shown in these materials, challenges such as the partial understanding of standardized measurement protocols, and the relationship between the structure and optoelectronic properties still need to be overcome.
Boukezzata, Messaoud. "Mecanismes d'oxydation des si-lpcvd fortement dopes au bore." Toulouse 3, 1988. http://www.theses.fr/1988TOU30183.
Full textSilva, Marcelo de Assumpção Pereira da. "Análise de superfícies de filmes finos de polianilina depositados em diferentes substratos por microscopia de força atômica." Universidade de São Paulo, 2001. http://www.teses.usp.br/teses/disponiveis/88/88131/tde-06062007-191316/.
Full textThis work presents a detailed study about the characteristic of thin films of polyaniline, fabricated by different methods and deposited over different substrates using Atomic Force Microscopy technique (AFM). The processes used for film depositions were casting, spin-coating, self-assembly, and the electrochemistry methods. The substrata used were: glass plates, gold/chromium/glass, quartz, ITO, silicon, and mica. Besides the visual analysis, that observes the film uniformity and verifies the coating degree of the substratum, the application of some mathematical models was employed to obtain quantitative parameters about the roughness of the film surfaces. From the ballistic deposition model, developed to explain growing processes, and the power spectrum density that takes the Fourier transform of the roughness in function of the spectral frequency, both developed for self-affine surfaces, it was obtained parameters as: the roughness exponent, the correlation characteristic length, and the fractal dimension. Despite the highly complex structure of the polyaniline - composed by macromolecules forming a semicrystalline structure- the obtained parameters by such models developed for very simple systems, provided reasonable and self-coherent results. As a final result of this work we showed that the synergy between the AFM technique and the above mentioned models compose a powerful method for the study of thin organic films.
Blažková, Naďa. "Povrchová topografie a-CSi:H vrstev připravených v kontinuálním režimu PECVD." Master's thesis, Vysoké učení technické v Brně. Fakulta chemická, 2018. http://www.nusl.cz/ntk/nusl-376884.
Full textAlbuquerque, Diego Aparecido Carvalho. "Deposição e caracterização de filmes ultrafinos de óxido de titânio depositados por Sputtering RF." Universidade Federal de São Carlos, 2012. https://repositorio.ufscar.br/handle/ufscar/1167.
Full textFinanciadora de Estudos e Projetos
This work studied ultrathin films of titanium oxide deposited by the technique r. f. reactive sputtering with different oxygen flows and different deposition times. Optical properties were studied (ultra-violeta/Visível) and the surface morphology (Atomic Force Microscopy). The composition and structural properties of the films were analyzed by X-ray diffraction and Rutherford Backscattering Spectroscopy. The films are amorphous and rough (fractal dimension around 2.6 to 2.7 and roughness around 1.6 to 2.5 nm). The stoichiometry was fairly close to the titanium dioxide (TiO2). The optical energy Gap obtained by three different models presented values between 3.0 to 3.5 eV.
Neste trabalho foram estudados filmes ultrafinos de óxido de titânio depositados pela técnica sputtering reativo r.f., com diferentes fluxos de oxigênio e diferentes tempos de deposição. Foram estudadas as propriedades ópticas (Ultra-Violeta/Visível), bem como a morfologia da superfície (Microscopia de Força Atômica). As propriedades estruturais e a composição dos filmes foram estudadas por Difração de raios-X e por Rutherford Backscattering Spectroscopy. Os filmes são amorfos e com superfície rugosa (dimensão fractal em torno de 2,6 - 2,7 e rugosidade em torno de 1,6 - 2,5 nm). A estequiometria ficou bastante próxima do dióxido de titânio (TiO2). A energia do Gap óptico obtido por três modelos distintos apresentou valores entre 3,0 3,5 eV.
Abreu, Caio Palumbo de. "Deposição e caracterizações óptica e morfológica de filmes finos de TIOX depositados por sputtering R.F." Universidade Federal de São Carlos, 2013. https://repositorio.ufscar.br/handle/ufscar/1168.
Full textThis work studied ultrathin films of titanium oxide were deposited on two substrates, such as pure Si (100) and glass corning 7059, by using r.f. magnetron sputtering with different oxygen flows and maintaining another parameters constant. For the purpose of this work, while keeping all parameters constant, varying only the oxygen flow (reactive gas), it was expected to identify the flow of transition between films of substoichiometric TiOx and TiO2 films, and analyze whether there forming nanostructured TiO2 films because the literature shows that variation of control parameters important characteristics of the nanoparticles as medium sized fraction of coverage of the substrate crystal structure and stoichiometry. The chemistries of the ultrathin films were analyzed through technique of Rutherford Backscattering Spectroscopy (RBS), the surface morphology by Atomic Force Microscopy (AFM), the crystallinity by X-Ray Diffraction (XRD) and the optical properties by UV-vis Spectroscopy. Were deposited ultrathin films with substoichiometric compositions for depositions with 0.10% O2 and 0.35% O2. For depositions between 0.67% O2 and 6.00% O2, films were obtained with concentrations of [O]/[Ti] of about 1.9, near the chemical composition of titanium dioxide (TiO2). Films with concentrations close to the TiO2 showed amorphous, but with characteristics of formation of anatase phase. The optical properties presented optical gap values between 3.33 eV and 3,78 eV and had no significant variation, as calculated by E03, E04 and ETauc methods. The roughness of the films decreased proportionally with increasing oxygen flow in the depositions.
No presente trabalho foram estudados filmes finos de óxido de titânio, depositados em dois substratos, Si (100) e vidro Corning 7059, por meio da utilização da técnica de pulverização catódica por rádio freqüência - magnetron sputtering r.f. - com diferentes fluxos de oxigênio e os outros parâmetros mantidos constantes. Com isso, esperava-se identificar o fluxo de transição entre os filmes de TiOx subestequiométricos e filmes de TiO2, analisar se haveria formação de filmes de TiO2 nanoestruturados e diferenças entre os gaps ópticos. As composições químicas dos filmes finos foram analisadas por meio da técnica de espectroscopia de retroespalhamento Rutherford (RBS), a morfologia da superfície por Microscopia de Força Atômica (AFM), a cristalinidade por difração de raios-X (XRD) e as propriedades ópticas por espectroscopia UV-Visível. Foram depositados filmes finos com composições subestequiométricas nas deposições com 0,10% de O2 e 0,35% de O2. Para deposições de O2 entre 0,67% e 6,00%, os filmes foram obtidos com concentrações de [O]/[Ti] de aproximadamente 1,9, ou seja, perto da composição química do dióxido de titânio (TiO2). Filmes com concentrações de [O]/[Ti] próximas ao TiO2 apresentaram-se amorfas, mas com características de formação de fase anatase. As propriedades ópticas não apresentaram nenhuma variação significativa nos valores de gap óptico, com valor entre 3,33 eV e 3,78 eV, calculado pelos métodos E03, E04 e ETauc. A rugosidade dos filmes diminuiu proporcionalmente com o aumento do fluxo de oxigênio nas deposições.
Pereira, Anderson de Jesus. "Efeito de uma barreira cinética em modelos de crescimento de interfaces com mobilidade limitada." Universidade Federal de Viçosa, 2012. http://locus.ufv.br/handle/123456789/4264.
Full textCoordenação de Aperfeiçoamento de Pessoal de Nível Superior
In thin film growth, morphology is one of the most important characteristics. In particular, the appearance of self-assembled three-dimensional structures, characterized by mounds, with origin attributed to barriers that cause an imbalance between up- and downhill currents in stepped surfaces. In this dissertation we study the effects of the introdution of a kinetic barrier that appears when we include the normal diffusion to the substrate in the migration between different planes in the models ofWolf-Villain and Das Sarma-Tamborenea. The aim is to investigate the morphological changes and growth dynamics of interfaces due to this barrier in one and two-dimensional substrates. In our simulations simulations, we observed interfaces with structures characterized by the presence of mounds, with typical morphological patterns observed in films with self-assembled three-dimensional structures, not observed for the WV and DT models without the kinetic barrier. In the WV and DT models with kinetic barrier in d = 1 + 1 and d = 2 + 1 dimensions, we find that the growth exponent goes to 1=2 in the asymptotic limit. We calculate the ascendent and descendent currents between terraces and determine the average flow of particles in steps per site. We observe a descendent current in the steps for both models, approaching an zero value after a long time, where we would expect a balance between upward and downward particle flow and also saturating the width interface.
No crescimento de filmes finos, a morfologia é uma das mais importantes características. Em particular, o aparecimento de estruturas tridimensionais auto-arranjadas, caracterizada por morros, com origem atribuída a barreiras que causam um desequilíbrio entre o fluxo de partículas ascendente e descendente em superfícies com degraus. Nessa dissertação estudamos os efeitos da introdução de uma barreira cinética que aparece quando incluímos a difusão normal ao substrato na migração entre planos diferentes nos modelos de Wolf-Villain (WV) e Das Sarma-Tamborenea (DT). O objetivo é investigar as alterações morfológicas e a dinâmica de crescimento de interfaces devido a essa barreira em substratos unidimensionais e bidimensionais. Em nossas simulações observamos inferfaces com estruturas caracterizadas pela presença de morros, com padrões morfológicos típicos observados em filmes com estruturas tridimensionais auto-arranjadas o que não é observado para os modelos WV e DT, sem a barreira cinética. Nos modelos WV e DT com barreira cinética em d = 1 + 1 e d = 2 + 1 dimensões, encontramos que o expoente de crescimento vai para 1=2 no limite assintótico. Calculamos a corrente ascendente e descendente entre terraços e determinamos o fluxo médio de partículas nos degraus por sítio. Observamos uma corrente descendente nos degraus para ambos os modelos, que se aproxima de um valor nulo após um tempo longo, onde esperamos um equilíbrio entre o fluxo de partículas ascendentes e descendentes e além disso, a saturação da largura da interface.
Brunot-Gohin, Céline. "Optimisation des états de surface du titane et des alliages en nickel-titane par des films multicouches de polyélectrolytes." Phd thesis, Université Claude Bernard - Lyon I, 2009. http://tel.archives-ouvertes.fr/tel-00771411.
Full textChagroune, Lakhdar. "Modélisation de l'émissivité d'une surface en utilisant une approche fractale." Vandoeuvre-les-Nancy, INPL, 1995. http://www.theses.fr/1995INPL115N.
Full textOrtega, Luc. "Caractérisation par rayons X des isolants amorphes d'oxynitrures de silicium, SiOxNyHz, préparés en couches minces par PECVD." Grenoble 1, 1993. http://www.theses.fr/1993GRE10169.
Full text劉性義. "In type Ⅱ roughness Superconductor film the Nucleation fieldΗc3." Thesis, 2000. http://ndltd.ncl.edu.tw/handle/55911786058063365720.
Full textLiao, Yi-Chiann, and 廖怡茜. "Effect of surface roughness of SnO2 film for light trapping phenomenon." Thesis, 2009. http://ndltd.ncl.edu.tw/handle/35808422006810899802.
Full text國立成功大學
材料科學及工程學系碩博士班
97
Transparent Conductive Oxide (TCO) thin films, which show high conductivity and high transmittance in the visible wavelength range, have been used as the transparent electrode in solar cell devices. For application in solar cell, increasing surface roughness of transparent conductive oxide thin films is able to enhance light scattering at the rough surface and increase light path. This is so-called light trapping effect. Such an effect can increase the light absorption in solar cell and enhance the efficiency of solar cell. TCO material used in this study was RF-magnetron-sputtered tin dioxide thin film. The surface of SnO2 film was treated by chemical etching method. The etching effect on surface morphology of SnO2 film before and after heat-treatment was investigated. The effect of different sputter pressure on the surface morphology and light scattering was also examined. In addition, a patterned structure was established on glass substrates using lithography method and then followed by sputtering SnO2 film. The light scattering of patterned substrates was also discussed. The experimental results show the electrical and optical properties of SnO2 film increased after heat treatment, and the etched SnO2 film had different appearance. The etching effect is more pronounced on as-deposited film than the heat-treated film because of the densification on heat-treated film. Also, the structure of SnO2 film was influenced by different sputter pressure. The surface of SnO2 film after etching show island-like structure, and the island-like structure was more noticeable with decreasing sputter pressure, and it also enhance light scattering. SnO2 film at 1*10-2torr have the strongest light scattering with Haze value about 30% to 50% (1000nm~350nm). In addition, the regular pattern on glass substrates using lithography method was prepared, and followed by sputtering of SnO2 film. So the SnO2 film with patterned surface can be prepared without sacrificing electrical property of SnO2 film. The results showed that the SnO2 film with micrometer size (about 10μm) pattern can increase the Haze value. The SnO2 film with 2-D pattern show better light trapping effect than that with 1-D pattern. The Haze value of SnO2 film with pyramidal pattern is about 22%.
Hwu, Chwan-Jing, and 胡傳菁. "Surface Roughness Effects on the Squeeze Film Characteristics of Partial Journal Bearing." Thesis, 2000. http://ndltd.ncl.edu.tw/handle/18904834786032075178.
Full text中原大學
機械工程學系
88
The present study examines the surface roughness effects on the squeeze film characteristics of a finite partial journal bearing. We can derive the Reynolds’ equation from the momentum equations and the continuity equation and further adopt the stochastic models to develop the stochastic Reynolds’ equation describing the uniform, isotropic roughness. After obtaining the pressure distribution of the squeeze film, we can calculate the surface roughness effects on the squeeze film characteristics. The results of the study show that the surface roughness effects have negative influence both on the load-carrying capacity or the time-height relationship.