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Relevant bibliographies by topics / Fib-Sem-Dic

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Academic literature on the topic 'Fib-Sem-Dic'

Author: Grafiati

Published: 3 May 2023

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Journal articles on the topic "Fib-Sem-Dic"

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Somov, Pavel A., Eugene S. Statnik, Yuliya Kan, et al. "FIB-DIC Residual Stress Evaluation in Shot Peened VT6 Alloy Validated by X-ray Diffraction and Laser Speckle Interferometry." Nanomaterials 12, no. 7 (2022): 1235. http://dx.doi.org/10.3390/nano12071235.

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Ga-ion micro-ring-core FIB-DIC evaluation of residual stresses in shot peened VT6 (Ti-6Al-4V) alloy was carried out and cross-validated against other non-destructive and semi-destructive residual stresses evaluation techniques, namely, the conventional sin2ψ X-ray diffraction and mechanical hole drilling. The Korsunsky FIB-DIC method of Ga-ion beam micro-ring-core milling within FIB-SEM with Digital Image Correlation (DIC) deformation analysis delivered spatial resolution down to a few micrometers, while the mechanical drilling of circular holes of ~2 mm diameter with laser speckle interferome

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2

Keller, J., A. Gollhardt, Dietmar Vogel, et al. "FibDAC - Residual Stress Determination by Combination of Focused Ion Beam Technique and Digital Image Correlation." Materials Science Forum 524-525 (September 2006): 121–26. http://dx.doi.org/10.4028/www.scientific.net/msf.524-525.121.

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New challenges for design, manufacturing and packaging of MEMS/NEMS arise from the ongoing miniaturization process. Therefore there is a demand on detailed information on thermo-mechanical material properties of the applied materials. Because of size effects and the strong dependency of the thermo-mechanical behavior of active and passive components on process parameters often unsolved questions of residual stresses lead to system failure due to crack formation. With the fibDAC (Focused Ion Beam based Deformation Analysis by Correlation) method which is presented in this paper the classical ho

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Mammadi, Y., A. Joseph, A. Joulain, et al. "Nanometric metrology by FIB-SEM-DIC measurements of strain field and fracture separation on composite metallic material." Materials & Design 192 (July 2020): 108665. http://dx.doi.org/10.1016/j.matdes.2020.108665.

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Dang, Nhat Minh, Wen-Yen Lin, Zhao-Ying Wang, et al. "Mechanical Properties and Residual Stress Measurement of TiN/Ti Duplex Coating Using HiPIMS TiN on Cold Spray Ti." Coatings 12, no. 6 (2022): 759. http://dx.doi.org/10.3390/coatings12060759.

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This study investigated the mechanical properties and the residual stress of high-power impulse magnetron sputtering (HiPIMS) titanium nitride (TiN) thin film capping on cold spray titanium (Ti) coating. This TiN/Ti duplex coating was deposited on the Ti substrate, and the cold spray titanium (Ti) coating was prepared in three cases with different numbers of layers. The study determined Young’s modulus, hardness, and roughness of TiN thin film and cold spray Ti coatings by nano-indentation and AFM. The residual stress measurement of TiN/Ti duplex coating was conducted using the ring-core drill

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Chen, Terry Yuan-Fang, Yun-Chia Chou, Zhao-Ying Wang, Wen-Yen Lin, and Ming-Tzer Lin. "Using Digital Image Correlation on SEM Images of Strain Field after Ion Beam Milling for the Residual Stress Measurement of Thin Films." Materials 13, no. 6 (2020): 1291. http://dx.doi.org/10.3390/ma13061291.

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The residual stress of thin films during the deposition process can cause the components to have unpredictable deformation and damage, which could affect the service life and reliability of the microsystems. Developing an accurate and reliable method for measuring the residual stress of thin films at the micrometer and nanometer scale is a great challenge. To analyze the residual stress regarding factors such as the mechanical anisotropy and preferred orientation of the materials, information related to the in-depth lattice strain function is required when calculating the depth profiles of the

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Dissertations / Theses on the topic "Fib-Sem-Dic"

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Mammadi, Younes. "Métrologie optique à petite échelle sous Microscope Électronique à Balayage : mesures de champs cinématiques en présence de discontinuités, par couplage FIB-MEB-CIN." Electronic Thesis or Diss., Poitiers, 2020. http://www.theses.fr/2020POIT2288.

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Le travail qui suit est divisé en trois grandes parties. Premièrement, lorsque nous souhaitons réaliser des études à des échelles plus petites telles que l’échelle micrométrique, nous devons non seulement utiliser un moyen d’observation plus complexe, tel que le microscope électronique à balayage «MEB-FEG» pour obtenir des images exploitables en métrologie optique, mais aussi avoir un marquage (mouchetis) à ces échelles.Actuellement, la corrélation d’images numériques est la technique de mesure de champs cinématique la plus utilisée pour étudier le comportement mécanique des matériaux et des s

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Book chapters on the topic "Fib-Sem-Dic"

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Mammadi, Y., A. Joseph, A. Joulain, et al. "Development of Optical Technique For Measuring Kinematic Fields in Presence of Cracks, FIB-SEM-DIC." In Advancements in Optical Methods & Digital Image Correlation in Experimental Mechanics, Volume 3. Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-30009-8_9.

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