Relevant bibliographies by topics / Fast scanning probe

Academic literature on the topic 'Fast scanning probe'

Author: Grafiati
Published: 10 December 2022
Last updated: 29 January 2023

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Journal articles on the topic "Fast scanning probe"

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Аkhmetova, А., and I. Yaminskiy. "Fast-scanning probe microscopy." Nanoindustry Russia 11, no. 7-8 (2018): 530–33. http://dx.doi.org/10.22184/1993-8578.2018.11.7-8.530.533.

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Boedo, J., D. Gray, L. Chousal, R. Conn, B. Hiller, and K. H. Finken. "Fast scanning probe for tokamak plasmas." Review of Scientific Instruments 69, no. 7 (July 1998): 2663–70. http://dx.doi.org/10.1063/1.1148995.

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Tabak, F. C., E. C. M. Disseldorp, G. H. Wortel, A. J. Katan, M. B. S. Hesselberth, T. H. Oosterkamp, J. W. M. Frenken, and W. M. van Spengen. "MEMS-based fast scanning probe microscopes." Ultramicroscopy 110, no. 6 (May 2010): 599–604. http://dx.doi.org/10.1016/j.ultramic.2010.02.018.

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Watkins, J. G., J. Salmonson, R. Moyer, R. Doerner, R. Lehmer, L. Schmitz, and D. N. Hill. "A fast scanning probe for DIII–D." Review of Scientific Instruments 63, no. 10 (October 1992): 4728–30. http://dx.doi.org/10.1063/1.1143621.

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DENG, Tijian, Tao LAN, Mingsheng TAN, Junfeng ZHU, Jie WU, Hangqi XU, Chen CHEN, et al. "Fast radial scanning probe system on KTX." Plasma Science and Technology 22, no. 4 (January 13, 2020): 045602. http://dx.doi.org/10.1088/2058-6272/ab5b1a.

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Boedo, J. A., N. Crocker, L. Chousal, R. Hernandez, J. Chalfant, H. Kugel, P. Roney, and J. Wertenbaker. "Fast scanning probe for the NSTX spherical tokamak." Review of Scientific Instruments 80, no. 12 (December 2009): 123506. http://dx.doi.org/10.1063/1.3266065.

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Tokarev, V. A., V. K. Gusev, N. A. Khromov, M. I. Patrov, Yu V. Petrov, N. V. Sakharov, V. B. Minaev, et al. "Fast scanning probe for the Globus-M2 tokamak." Journal of Physics: Conference Series 1400 (November 2019): 077019. http://dx.doi.org/10.1088/1742-6596/1400/7/077019.

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Klapetek, Petr, Anna Charvátová Campbell, and Vilma Buršíková. "Fast mechanical model for probe–sample elastic deformation estimation in scanning probe microscopy." Ultramicroscopy 201 (June 2019): 18–27. http://dx.doi.org/10.1016/j.ultramic.2019.03.010.

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Wen, Yongbing, Jianmin Song, Xinjian Fan, Danish Hussain, Hao Zhang, and Hui Xie. "Fast Specimen Boundary Tracking and Local Imaging with Scanning Probe Microscopy." Scanning 2018 (2018): 1–11. http://dx.doi.org/10.1155/2018/3979576.

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An efficient and adaptive boundary tracking method is developed to confine area of interest for high-efficiency local scanning. By using a boundary point determination criterion, the scanning tip is steered with a sinusoidal waveform while estimating azimuth angle and radius ratio of each boundary point to accurately track the boundary of targets. A local scan region and path are subsequently planned based on the prior knowledge of boundary tracking to reduce the scan time. Boundary tracking and local scanning methods have great potential not only for fast dimension measurement but also for sample surface topography and physical characterization, with only scanning region of interest. The performance of the proposed methods was verified by using the alternate current mode scanning ion-conductance microscopy, tapping, and PeakForce modulation atomic force microscopy. Experimental results of single/multitarget boundary tracking and local scanning of target structures with complex boundaries demonstrate the flexibility and validity of the proposed method.
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Tsois, N., C. Dorn, G. Kyriakakis, M. Markoulaki, M. Pflug, G. Schramm, P. Theodoropoulos, P. Xantopoulos, and M. Weinlich. "A fast scanning Langmuir probe system for ASDEX-Upgrade divertor." Journal of Nuclear Materials 266-269 (March 1999): 1230–33. http://dx.doi.org/10.1016/s0022-3115(98)00569-8.

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Dissertations / Theses on the topic "Fast scanning probe"

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Huang, Rongxin 1978. "Brownian motion at fast time scales and thermal noise imaging." 2008. http://hdl.handle.net/2152/18009.

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This dissertation presents experimental studies on Brownian motion at fast time scales, as well as our recent developments in Thermal Noise Imaging which uses thermal motions of microscopic particles for spatial imaging. As thermal motions become increasingly important in the studies of soft condensed matters, the study of Brownian motion is not only of fundamental scientific interest but also has practical applications. Optical tweezers with a fast position-sensitive detector provide high spatial and temporal resolution to study Brownian motion at fast time scales. A novel high bandwidth detector was developed with a temporal resolution of 30 ns and a spatial resolution of 1 °A. With this high bandwidth detector, Brownian motion of a single particle confined in an optical trap was observed at the time scale of the ballistic regime. The hydrodynamic memory effect was fully studied with polystyrene particles of different sizes. We found that the mean square displacements of different sized polystyrene particles collapse into one master curve which is determined by the characteristic time scale of the fluid inertia effect. The particle’s inertia effect was shown for particles of the same size but different densities. For the first time the velocity autocorrelation function for a single particle was shown. We found excellent agreement between our experiments and the hydrodynamic theories that take into account the fluid inertia effect. Brownian motion of a colloidal particle can be used to probe three-dimensional nano structures. This so-called thermal noise imaging (TNI) has been very successful in imaging polymer networks with a resolution of 10 nm. However, TNI is not efficient at micrometer scale scanning since a great portion of image acquisition time is wasted on large vacant volume within polymer networks. Therefore, we invented a method to improve the efficiency of large scale scanning by combining traditional point-to-point scanning to explore large vacant space with thermal noise imaging at the proximity of the object. This method increased the efficiency of thermal noise imaging by more than 40 times. This development should promote wider applications of thermal noise imaging in the studies of soft materials and biological systems.
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Books on the topic "Fast scanning probe"

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Tiwari, Sandip. Electromechanics and its devices. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780198759874.003.0005.

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Electromechanics—coupling of mechanical forces with others—exhibits a continuum-to-discrete spectrum of properties. In this chapter, classical and newer analysis techniques are developed for devices ranging from inertial sensors to scanning probes to quantify limits and sensitivities. Mechanical response, energy storage, transduction and dynamic characteristics of various devices are analyzed. The Lagrangian approach is developed for multidomain analysis and to bring out nonlinearity. The approach is extended to nanoscale fluidic systems where nonlinearities, fluctuation effects and the classical-quantum boundary is quite central. This leads to the study of measurement limits using power spectrum and, correlations with slow and fast forces. After a diversion to acoustic waves and piezoelectric phenomena, nonlinearities are explored in depth: homogeneous and forced conditions of excitation, chaos, bifurcations and other consequences, Melnikov analysis and the classic phase portaiture. The chapter ends with comments on multiphysics such as of nanotube-based systems and electromechanobiological biomotor systems.
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Book chapters on the topic "Fast scanning probe"

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Suzuki, Yuki, Masatoshi Yokokawa, Shige H. Yoshimura, and Kunio Takeyasu. "Biological Application of Fast-Scanning Atomic Force Microscopy." In Scanning Probe Microscopy in Nanoscience and Nanotechnology 2, 217–46. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-10497-8_8.

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Hashimoto, Ken-ya, Nan Wu, Keisuke Kashiwa, Tatsuya Omori, Masatsune Yamaguchi, Osamu Takano, Sakae Meguro, Naoki Kasai, and Koichi Akahane. "Phase-Sensitive and Fast-Scanning Laser Probe System for RF SAW/BAW Devices." In IUTAM Symposium on Recent Advances of Acoustic Waves in Solids, 235–45. Dordrecht: Springer Netherlands, 2010. http://dx.doi.org/10.1007/978-90-481-9893-1_22.

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Conference papers on the topic "Fast scanning probe"

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Gao, S., H. Wolff, K. Herrmann, U. Brand, K. Hiller, S. Hahn, A. Sorger, and J. Mehner. "A comb-drive scanning-head array for fast scanning-probe microscope measurements." In SPIE Microtechnologies, edited by Ulrich Schmid, José Luis Sánchez-Rojas, and Monika Leester-Schaedel. SPIE, 2011. http://dx.doi.org/10.1117/12.886938.

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Seo, Yongho, and Wonho Jhe. "Fast-scanning near-field scanning optical microscopy using a high-frequency dithering probe." In International Symposium on Optical Science and Technology, edited by Aaron Lewis, H. Kumar Wickramasinghe, and Katharina H. Al-Shamery. SPIE, 2001. http://dx.doi.org/10.1117/12.449529.

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Li, Tao, Jiwen Cui, and He Zhang. "Image segmentation and fast scanning method of vision-probe measurement system." In Tenth International Symposium on Precision Mechanical Measurements, edited by Liandong Yu, Lian X. Yang, and Haojie Xia. SPIE, 2021. http://dx.doi.org/10.1117/12.2611427.

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Omori, Tatsuya, Keisuke Kashiwa, Ken-ya Hashimoto, and Masatsune Yamaguchi. "Time-delay compensation in detection electronics of fast scanning 2D SAW/BAW laser probe." In 2009 IEEE International Ultrasonics Symposium. IEEE, 2009. http://dx.doi.org/10.1109/ultsym.2009.5441688.

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Wang, Mingkang, Diego J. Perez-Morelo, Georg Ramer, Goerges Pavlidis, Jeffrey Schwartz, Andrea Centrone, and Vladimir Aksyuk. "Nanophotonic Scanning Probes for Nanoscale Imaging of Thermal Conductivity and Interfacial Thermal Conductance." In CLEO: Applications and Technology. Washington, D.C.: Optica Publishing Group, 2022. http://dx.doi.org/10.1364/cleo_at.2022.atu4m.4.

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Nanophotonic resonator integration and miniaturization decrease detection noise of nanomechanical scanning probe microscopy and increase its throughput. Using pulsed laser excitation, we demonstrate fast imaging (≈500,000× faster than a commercial probe) of thermal properties with 35nm spatial resolution.
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Yong, Y. K., A. Bazaei, S. O. R. Moheimani, and F. Allgower. "Design and control of a novel non-raster scan pattern for fast scanning probe microscopy." In 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM 2012). IEEE, 2012. http://dx.doi.org/10.1109/aim.2012.6266062.

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Clayton, G. M., and S. Devasia. "Image-Based Control of Dynamic Effects in Scanning Tunneling Microscopes." In ASME 2004 International Mechanical Engineering Congress and Exposition. ASMEDC, 2004. http://dx.doi.org/10.1115/imece2004-59473.

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In this article, we present an image-based control scheme to address the problem of low operating speed in scanning tunneling microscopes (STMs). Low operating speeds are used because dynamic effects cause error in positioning the STM probe over the sample. The STM’s low operating speed limits its capability to investigate fast surface phenomena and its throughput during nanofabrication. The proposed image-based approach to achieve high speed operation exploits the extant imaging capabilities of STMs. In practice, distortions in high-speed images are used to identify and correct errors in the STM probe position. The approach is applied to an STM and experimental results are presented.
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Chu, Wei, Joseph Fu, and Theodore Vorburger. "An Improved Digital Image Correlation Method Applied to Scanning Probe Microscope Images." In ASME 2009 International Manufacturing Science and Engineering Conference. ASMEDC, 2009. http://dx.doi.org/10.1115/msec2009-84274.

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Digital image correlation (DIC) is a method for measuring the surface displacements and displacement gradients in materials under deformation. The method has also been applied to the calculation of image distortion for scanning probe microscopy (SPM). The traditional DIC method directly uses the intensity values of compared images but does not take out-of-plane nonlinearity error into account. However, in SPM measurements, the recorded z-direction value is a sum of the real surface height of the sample and any longitudinal deformation of the piezoelectric tube. In order to improve the calculation accuracy of the displacement fields, an improved DIC method is performed here. Two new parameters related to out-of-plane error are introduced in the mathematical modeling. The in-plane displacements between two compared images are then calculated pixel by pixel, with the z-direction error accounted for. This method is tested by applying it to two pairs of atomic force microscopy (AFM) images along the fast and slow scan directions.
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Hashimoto, Ken-ya, and Tatsuya Omori. "Phase-sensitive and fast-scanning laser probe system for radio frequency surface/bulk acoustic wave devices." In 2014 European Frequency and Time Forum (EFTF). IEEE, 2014. http://dx.doi.org/10.1109/eftf.2014.7331425.

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Ken-ya Hashimoto, Keisuke Kashiwa, Tatsuya Omori, Masatsune Yamaguchi, Osamu Takano, Sakae Meguro, and Koichi Akahane. "A fast scanning laser probe based on Sagnac interferometer for RF surface and bulk acoustic wave devices." In 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008. IEEE, 2008. http://dx.doi.org/10.1109/mwsym.2008.4632966.

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Reports on the topic "Fast scanning probe"

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Lehmer, R. D., B. LaBombard, and R. W. Conn. A fast spatial scanning combination emissive and mach probe for edge plasma diagnosis. Office of Scientific and Technical Information (OSTI), April 1989. http://dx.doi.org/10.2172/6356314.

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