Dissertations / Theses on the topic 'ESD physics'
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Chen, Tze Wee. "A physics-based design methodology for digital systems robust to ESD-CDM events /." May be available electronically:, 2009. http://proquest.umi.com/login?COPT=REJTPTU1MTUmSU5UPTAmVkVSPTI=&clientId=12498.
Full textErtenberg, Randolph. "CoGe&esc;b1&esc;s&&dotb;esc;b5&esc;sSe&esc;b1&esc;s&&dotb;esc;b5&esc;s [electronic resource] : structural and transport properties characterization / by Randolph Ertenberg." University of South Florida, 2003. http://purl.fcla.edu/fcla/etd/SFE0000130.
Full textDocument formatted into pages; contains 43 pages.
Thesis (M.S.)--University of South Florida, 2003.
Includes bibliographical references.
Text (Electronic thesis) in PDF format.
ABSTRACT: Skutterudites have been of great interest for thermoelectric applications over the last ten years. Scientific interest has focused on the unique transport properties Skutterudites possess due to the unique crystal structure. Technical interest has grown since it was discovered that some compounds rival the current best thermoelectric materials. To further the understanding of this material system, and optimize its thermoelectric properties, the synthesis and characterization of polycrystalline n- and p-type CoGe&esc;b1&esc;s&&dotb;esc;b5&esc;sSe&esc;b1&esc;s&&dotb;esc;b5&esc;s was undertaken. Structural, morphological, chemical, electrical, thermal and magnetic properties were studied. These data are compared to those of the binary Skutterudite CoSb3. The results of this study show a very sensitive dependence of the physical properties on stoichiometry.
ABSTRACT: While the thermoelectric figure of merit is low in these materials, it is apparent that optimization via doping and "void filling" will lead to improved thermoelectric properties.
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Xu, Chen. "Advanced Topographic Characterization of Variously Prepared Niobium Surfaces and Linkage to RF Losses." W&M ScholarWorks, 2013. https://scholarworks.wm.edu/etd/1539623621.
Full textBertin, Mathieu. "Processus induits par les électrons de basse énergie (0-20 eV) dans les systèmes condensés." Phd thesis, Université Paris Sud - Paris XI, 2007. http://tel.archives-ouvertes.fr/tel-00280603.
Full textWeidong, Yang. "Pupil phase apodization for achromatic imaging of extra-solar planets." Available online. Click here, 2004. http://services.lib.mtu.edu/etd/DISS/2004/Physics/yangw/diss.pdf.
Full textVoyantzis, Mitchell D. "CloudMEMS Platform for Design and Simulation of MEMS: Physics Modules & End-to-End Testing." University of Toledo / OhioLINK, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1533226484963866.
Full textde, la Puente Alejandro M. "Kaon photoproduction of the proton: contribution of higher angular momentum and energy resonances to the cross-section and polarization asymmetries through an effective Lagrangian model." FIU Digital Commons, 2008. http://digitalcommons.fiu.edu/etd/3014.
Full textDominquez, Alberto Luis. "Meson-meson scattering in 2+1 dimensional lattice quantum electrodynamics." FIU Digital Commons, 1994. http://digitalcommons.fiu.edu/etd/3634.
Full textFaxas, Miguel A. Jr. "Experiments in the dissociative recombination of xenon and krypton." FIU Digital Commons, 2005. http://digitalcommons.fiu.edu/etd/3288.
Full textKhammang, Alex. "Investigating Mechanical Properties of Metallic Nanowires using Molecular Dynamics." VCU Scholars Compass, 2014. http://scholarscompass.vcu.edu/etd/3409.
Full textFerguson, Josephus. "Local Charging Behavior on GaN Surfaces." VCU Scholars Compass, 2010. http://scholarscompass.vcu.edu/etd/82.
Full textMUTISYA, STEPHEN. "SYNTHESIS OF NANOCOMPOSITES BY LASER ABLATION." VCU Scholars Compass, 2011. http://scholarscompass.vcu.edu/etd/231.
Full textWang, Cheng-Zhang. "First principles linear response calculations of lattice dynamics." W&M ScholarWorks, 1995. https://scholarworks.wm.edu/etd/1539623874.
Full textLiu, Ming. "A High-end Reconfigurable Computation Platform for Particle Physics Experiments." Licentiate thesis, Stockholm, Elektronik, dator- och programvarusystem, Electronic, Computer, and Software Systems, Kungliga Tekniska högskolan, 2008. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-9360.
Full textRESTA, FEDERICA. "Integrated Read-out Front-end for High-Energy Physics Experiments." Doctoral thesis, Università degli Studi di Milano-Bicocca, 2017. http://hdl.handle.net/10281/158121.
Full textPhysic researches and discoveries depend heavily from efficient and reliability of the High-Energy Physics (HEP) experiments. The main goal is to study the fundamental constituents of the matter in terms of elementary charge particles, their interactions and their secondary products. The Large Hadron Collider (LHC) at the CERN works every day to discover details on new charged particles as neutrinos and Higgs Bosons. Charges are generated and accelerated from beam collisions inside the LHC. Different detectors are organized in shell structures and are designed to detect few particles topology. Typically, the parameters useful to identify a charged particle are momentum, electrical charge, energy, time of flight and distance. Detectors design is important but it is enhanced from proper electronic readout systems. In the last years, electronics parts are more and more efficient and compact. CMOS integrated solution are preferred to discrete one allowing major reliability, cost reduction and performance improvement. The design is not trivial but not impossible. Some characteristics depend on the electronic designer and his capability to manage the external parasitic effects, as the parasitic capacitance of the connected detector. Unfortunately, phenomena as radiation effects on electronics must be taken in account but they are not completely eliminated. CMOS technology influences strongly the integrated circuit performance and radiation hardness. In this scenario, 3 readout frontend circuits for HEP experiments have been designed, integrated and measured. 2 of them represent 2 different prototypes realized in IBM 130nm technology for ATLAS experiment at CERN laboratory with Max-Plank Institute for Physics collaboration. They include an analog chain in cascade with a digital one. Input charges (up to 100fC) are detected and converted into voltage signals. Their amplitude are proportional to the input and are sent to the following digital part. The digital part provides information about arrival time and amount of the input charge. When the discriminator switches, an event is detected and the Wilkinson ADC starts the voltage-to-time conversion. The full chips have a JTAG section to manage all programmable parameters (i.e. thresholds, hysteresis, deadtime, etc.) The second prototype is designed improving the previous version in terms of supply rejection noise, deadtime range and hysteresis management. The third circuit presented in this thesis is the first readout frontend for Pixel detectors in 28nm technology. The channel includes a charge sensitive preamplifier with an inverter switched based comparator. Reduced supply voltage and 28nm technology imply some difficult in the design with a major tolerance to the radiations, a lower area occupancy and a lower power consumption. The circuits are been designed for 2 different scenarios in terms of detector parasitic capacitance, detectable input charges, supply voltage, threshold voltage, power consumption and noise. In overall cases, the integrated systems provide information about amount of detected input charge and arrival time within 25ns. This aspect is very important and allows avoiding mistakes. Successive collisions lead to spurious signals presence and a single detection could have information about two different events. Maintaining the processing time within 25ns, consecutive collisions are detected as different events. This work is organized as follows. Part I includes a brief summary of the entire work in order to fix the goals of my activities. Then, the Part II is dedicated on a simplified description of the application field and the next target of the future experiments. In particular, some details on the effects induced by the radiation to integrated electronic component are provided. Part III and Part IV represent the core, including 3 readout frontend circuits design and measurements. Finally, there are correlated publications and conclusions.
Joshi, Yagya R. "Search for Supersymmetry in Proton-Proton Collisions at 13 TeV with the CMS Detector using Identified Top Quarks." FIU Digital Commons, 2018. https://digitalcommons.fiu.edu/etd/3801.
Full textGaumer, Clément. "Caractérisation physico-chimique front-end : canal-diélectrique-métal." Grenoble INPG, 2010. http://www.theses.fr/2010INPG0010.
Full textLa miniaturisation des dispositifs MOSFET au-delà du nœud technologique 32 nm requiert l'utilisation d'un oxyde à forte permittivité (high-k), associé à une électrode de grille métallique. Côté high-k, les oxydes à base d'hafnium constituent la meilleure option. Côté métal, les nitrures de titane et de tantale sont pressentis. Ce travail porte sur la 1 caractérisation des interdiffusions dans des empilements à grille TiN et TaN sur HfOz, élaborés selon le schéma i d'intégration Gate First. Nous montrons que le dépôt du métal nitruré provoque une diffusion d'azote dans le EfOz i et le SiOz piédestal. Les forts budgets thermiques associés au dépôt du poly-Si et au recuit d'activation des dopants induisent une diffusion d'oxygène et amplifient la quantité d'azote dans le SiOz. La quantité d'atomes diffusant est plus importante pour un métal épais. Ceci explique la dégradation de l'EOT et de la mobilité des porteurs pour les 1 dispositifs comportant des grilles plus épaisses. Enfin, la nitruration du Hf Oz par plasma permet de montrer que les défauts dans le high-k agissent comme des pièges à atomes diffusant lors de l'élaboration du module de grille
PIPINO, ALESSANDRA. "Design of Analog Circuits in 28nm CMOS Technology for Physics Applications." Doctoral thesis, Università degli Studi di Milano-Bicocca, 2017. http://hdl.handle.net/10281/158126.
Full textThe exponential trend of the complementary metal-oxide-semiconductor (CMOS) technologies predicted by Moores law has been successfully demonstrated over the last three decades. A constant downscaling of CMOS technologies with smaller and smaller device size has been developed, in order to comply with requirements on speed, complexity, circuit density and power consumption of advanced high performance digital applications. The minimum reachable length, which corresponds to the half the length of the channel of the smallest transistor that can be manufactured, represents every following technological node. With the arrival of nanoscale (sub-100nm) CMOS technologies, digital performance improve further, but many new challenges have been introduced for analog designers. In fact, for the digital circuits CMOS scaling-down leads to several benefits: speed improvement, reduced power consumption, high integration and complexity level. The analog circuits, instead, strongly suffers from the ScalTech trend, because the MOS behavior dramatically changes through the different technological nodes and especially for the ultra-scaled ones, where second order effects, previously negligible, become very important and start to be dominant, affecting its performance. For instance, lower intrinsic DC-gain, reduced dynamic range, operating point issues and larger parameter variability are some of the problems due to scaling-down. Analog designers must face this problems at different phases of the design, circuital and layout. Despite that, the design of analog circuit in sub-nm technologies is mandatory in some cases or can be even helpful in others. For example, in mainly mixed-signal systems, the read-out electronic requires high frequency performance, so the choice of deep submicron technology is mandatory, also for the analog part. Other types of applications where using scaled technology is even strategical are the high-energy physics experiments, where read-out circuits are exposed to very high radiation levels with consequent performance degradation and breakdown events. Since radiation damage is proportional to gate oxide volume, smaller devices exhibit lower radiation detriment. It has been demonstrated in fact, that 28nm CMOS technology devices are capable to sustain 1Grad-TID exposure, not possible with previous technologies. In this thesis, the main key challenges in ultra-scaled technologies are analyzed in the first chapter, and then integrated circuits designed in 28nm CMOS technology are presented. The first circuit design, presented in the second chapter and integrated in 28nm CMOS technology, is a Fast-Tracker front-end (FTfe) for charge detection. The read-out system has been developed starting from the main specifications and circuital solutions already adopted for muon detection in ATLAS experiment. The proposed front-end is able to detect an event and soon after to reset the system in order to make the FTfe already available for the following event, avoiding long dead times. The architecture is analyzed in detail, followed by the layout choices and the performance results. The second circuit design presented in the third chapter and always integrated in 28nm CMOS technology, is a Chopper instrumentation amplifier. Instrumentation amplifiers are the key building blocks in sensor and monitoring applications, where they are used to sense and amplify usually very small (sub-mV) and low frequency signals. For this reason it is important to reduce or eliminate the input offset and flicker noise, which cover and disturb the main signal to be detected. The proposed amplifier use a modulation technique, called chopper, in order to meet the low offset and low flicker noise requirements. Moreover it has been modeled to operate in sub-threshold region, in order to address the scaling problems. After the architecture description, layout and results of the integrated prototype are shown.
Esser, M. J. Daniel. "Diode-end-pumped solid-state lasers." Thesis, Link to the online version, 2005. http://hdl.handle.net/10019/1020.
Full textCollett, Oliver John Philip. "Modelling of end-pumped Ho:YLF amplifiers." Thesis, Stellenbosch : Stellenbosch University, 2013. http://hdl.handle.net/10019.1/80330.
Full textThis work is a thesis regarding the energy scaling of end-pumped Ho:YLF amplifiers. The work includes: a brief review of laser physics and models, the development of a suitable three dimensional time resolved numerical model, a parametric study of double pass ampli ers simulated using the model, comparison between the simulation and the experimental results of a double pass ampli er system, and simulation of a high energy single pass ampli er. A three dimensional time resolved numerical model of an end-pumped ampli er was developed. A rate equation model was used to simulate the absorption and emission of light, energy transfer upconversion, and spontaneous emission within the gain medium. In the traveling wave approximation the propagation of light through the gain medium was modelled with the use of a split step method that included di raction and gain. A parametric study was performed to nd the design parameters for an end-pumped two pass ampli- er. Limited optimisation of several ampli er parameters was performed. The study focused on the optimisation of the energy per pulse through changes to the following parameters: crystal length, laser beam size, pump beam sizes, and pump wavelength. The nal design speci cations for an experimental system were for a 100 mm long 0.5 % (atm.) doped Ho:YLF gain medium, pump and seed beams with spot sizes with e ective beam sizes of 1 mm and 0.95 mm respectively and a pump wavelength of 1892 nm. The simulation predicted pulse energies above 480 mJ when seeded by a 55 mJ pulse at repetition rates of 50 Hz. The experimentally realised system with similar design parameters produced the highest reported energy, 330 mJ, from an end-pumped Ho:YLF ampli er. Comparison between the simulation and the experimental results showed signi cant deviation. The deviation was explained by the e ect of parameters not included previously in the simulation. These parameters were the power of the continuous component of the seed beam, and the energy transfer upconversion rate. Limitations and delity of the numerical model with respect to the experimental system are discussed, notably the model of the highly divergent pump beam was simplistic. Preliminary simulation results of a high energy single pass ampli er predict that energy scaling in Ho:YLF follows linearly with respect to pump power and that in the ideal case, multi-Joule operation is possible at 50 Hz with optical to optical e ciencies of 19%.
Schoenthal, Gerhard Siegbert. "Integrated diode circuits for greater than 1 THz." Full text, Acrobat Reader required, 2003. http://viva.lib.virginia.edu/etd/diss/ArtsSci/Physics/2003/Schoenthal/Dissertation.pdf.
Full textUlizio, Vincent Michael. "The Dosimetric Importance of Six Degree of Freedom Couch End to End Quality Assurance for SRS/SBRT Treatments when Comparing Intensity Modulated Radiation Therapy to Volumetric Modulated Arc Therapy." University of Toledo Health Science Campus / OhioLINK, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=mco1431091144.
Full textOlsen, Anita. "Thermal Quenching of Photoluminescence from GaN." VCU Scholars Compass, 2012. http://scholarscompass.vcu.edu/etd/2796.
Full textAlrrshedan, Marrwa. "Photoluminescence from Bulk GaN Substrates." VCU Scholars Compass, 2012. http://scholarscompass.vcu.edu/etd/2802.
Full textWalls, Jay Woodsworth. "Physics through collaboration." Montana State University, 2012. http://etd.lib.montana.edu/etd/2012/walls/WallsJ0812.pdf.
Full textCorn, John Russell. "Optimization Problems in Hilbert Space with POSS Complexes." Digital Commons @ East Tennessee State University, 2011. https://dc.etsu.edu/etd/1381.
Full textAuer, Mathias. "Preferentially Orienting Ag Nanoparticles Using CaF2 Nanorods." VCU Scholars Compass, 2012. http://scholarscompass.vcu.edu/etd/2730.
Full textBehera, Swayamprabha. "STABILITY AND SPECTROSCOPIC PROPERTIES OF NEGATIVE IONS." VCU Scholars Compass, 2011. http://scholarscompass.vcu.edu/etd/210.
Full textVaccari, Simone. "Analysis of defects and physical mechanisms that limit the ESD robustness of Light Emitting Diodes." Doctoral thesis, Università degli studi di Padova, 2014. http://hdl.handle.net/11577/3423829.
Full textLa seguente tesi riporta i principali risultati ottenuti dall’attività di ricerca di Dottorato del candidato. L’attività è stata focalizzata sullo studio dei difetti e dei meccanismi fisici the limitano la robustezza alle scariche elettrostatiche (ESD) dei diodi emettitori di luce (LED). In particolare, la maggior parte dell’attività di ricerca è stata principalmente focalizzata sull’analisi dei LED basati su nitruro di gallio (GaN), che sono la base per la realizzazione di emettitori blu e UV e di LED bianchi basati sulla conversione dei fosfori. Dopo una panoramica iniziale dei concetti teorici più importanti necessari per la comprensione dei risultati fisici, in questa tesi possono essere identificate quattro sezioni principali che riguardano la presentazione dell’attività di ricerca: - In primo luogo riportiamo un’estesa analisi dei processi di emissione localizzati legati ai difetti, che si verificano nei diodi emettitori di luce basati sulla struttura InGaN/GaN. L’analisi è basata su una caratterizzazione elettrica combinata con misure di elettroluminescenza (EL) risolte spettralmente e spazialmente. I risultati di questa analisi mostrano che: (i) in condizioni di polarizzazione inversa i LED possono emettere un debole segnale di luminescenza, che è direttamente proporzionale alla corrente inversa iniettata. L’emissione in polarizzazione inversa è localizzata in spot di dimensione submicrometrica; l’intensità del segnale è fortemente correlata alla densità di threading dislocation (TD), suggerendo quindi che le threading dislocation sono percorsi preferenziali per la conduzione della corrente di leakage. (ii) In condizioni di bassa polarizzazione diretta, l’intensità del segnale EL non è uniforme sull’area del dispositivo. L’analisi EL risolta spettralmente dei LED verdi identifica la presenza di spot localizzati che emettono nella regione spettrale gialla, la cui origine è stata attribuita a tunneling localizzato che si verifica tra le buche quantiche e gli strati di barriera dei diodi, con successiva ricombinazione radiativa assistita da difetti. - Successivamente proponiamo uno studio esteso delle caratteristiche di elettroluminescenca dei LED basati su InGaN con struttura color-coded, cioè una struttura a tripla buca quantica nella quale ciascuna buca quantica ha un contenuto di indio differente, allo scopo di analizzare la distribuzione di portatori all’interno delle buche quantiche della regione attiva. L’analisi è basata su misure di elettroluminescenza combinate con simulazioni bidimensionali, eseguite a differenti livelli di corrente e temperatura. I risultati indicano che: (i) l’efficienza di ciascuna delle buche quantiche dipende fortemente dalle condizioni operative del dispositivo (corrente e temperatura); (ii) a bassi livelli di corrente e temperatura solo la buca quantica più vicina al lato p ha un’emissione significativa; (iii) l’emissione dalle altre buche quantiche è favorita ad elevati livelli di corrente. Sarà anche discusso il ruolo dell’iniezione dei portatori, della mobilità delle lacune, della densità di portatori e della ricombinazione non radiativa nel determianre l’intensità relativa delle buche quantiche. - A questo punto proponiamo i risultati ottenuti dall’analisi dei meccanismi fisici che limitano la robustezza alle scariche elettrostatiche (ESD) dei LED basati su GaN. L’analisi è stata eseguita su numerose famiglie di LED con differenti robustezze ESD. Ciascuna delle famiglie di campioni analizzate è caratterizzata da due differenti parametri: il tasso di failure misurato dopo l’applicazione di un singolo impulso ESD, denominato First level failure F1, e il tasso di failure misurato dopo l’applicazione di un secondo impulso ESD, denominato Secondo level failure F2. Dopo un’iniziale caratterizzazione elettro-ottica, abbiamo analizzato i LED per mezzo di misure di transienti capacitivi lenti, deep level optical spectroscopy (DLOS) e deep level transient spectroscopy (DLTS). I risultati sperimentali mostrano che: (i) la capacità di giunzione complessiva è fortemente correlata al First level failure F1, suggerendo quindi anche una correlazione tra il massimo campo elettrico di giunzione e il First level failure F1 dei LED; (ii) l’ampiezza dei transienti capacitivi, legata a fenomeni di intrappolamento, è fortemente correlata al parametro Relative failure, che è definito come il rapporto Second level failure F2/First level failure F1. Quindi la presenza di difetti nelle strutture LED può influenzare la robustezza ESD misurata dopo l’applicazione consecutiva di due impulsi ESD; (iii) la correlazione tra il trapping e il Relative failure è confermata sia dalle misure di DLOS, sia da quelle DLTS. - Per concludere lo studio dei meccanismi fisici che limitano la robustezza ESD dei diodi emettitori di luce (LED), presentiamo una caratterizzazione ESD eseguita su dei LED disponibili commercialmente. In particolare presentiamo un’estesa analisi dei meccanismi di failure dei LED RGB (multichip) sottoposti a test ESD: i test sono stati eseguiti su numerosi LED disponibili commercialmente di quattro differenti produttori. Allo scopo di comprendere meglio i meccanismi di failure, abbiamo sottoposto i LED a test ESD in condizioni di polarizzazione inversa e diretta separatamente, per mezzo di un Transmission Line Pulser (TLP). I risultati sperimentali indicano che: (i) i LED rossi (basati su AlInGaP) hanno una robustezza ESD più alta rispetto ai campioni verdi e blu (basati su InGaN), sia nei test in polarizzazione inversa, sia in quelli in polarizzazione diretta; (ii) impulsi TLP negativi con una corrente inferiore alla soglia di failure possono indurre una diminuzione della corrente di leakage nei LED basati su GaN, a causa di un parziale annientamento dei percorsi difettosi responsabili per la conduzione inversa; (iii) il tipico meccanismo di failure dei dispositivi è rappresentato da un evento catastrofico, con cortocircuitazione della giunzione. Tuttavia, alcuni dei LED rossi analizzati hanno mostrato “soft” failure, con graduale aumento della corrente di leakage ed una corrispondente diminuzione della potenza ottica, anche in assenza di un danno castastrofico. Infine, è stata studiata anche la dipendenza dalla temperatura della robustezza ESD dei dispositivi basati su GaN. Utili informazioni sull’attività di ricerca possono essere trovate negli articoli in cui ha collaborato il candidato ed elencati nella successiva sezione.
Zbinden, Jonas. "Full Physics Orbital Simulation around Comet Didymos for CubeSat MissionAPEX on HERA, ESA." Thesis, Uppsala universitet, Institutionen för fysik och astronomi, 2020. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-427433.
Full textCHAI, JUNYING. "Power Management Circuits for Front-End ASICs Employed in High Energy Physics Applications." Doctoral thesis, Politecnico di Torino, 2018. http://hdl.handle.net/11583/2713038.
Full textLintanf, Amélie. "Dépôts par ESD et ALD et caractérisations physico-chimiques de couches d'oxydes à l'échelle nanométrique pour la microélectronique." Grenoble INPG, 2008. http://www.theses.fr/2008INPG0088.
Full textCooper, Katherine. "AFM and C-AFM Studies of GaN Films." VCU Scholars Compass, 2005. http://scholarscompass.vcu.edu/etd/1246.
Full textLanderville, Aaron Christopher. "First-Principles Atomistic Simulations of Energetic Materials." Scholar Commons, 2014. https://scholarcommons.usf.edu/etd/5056.
Full textMattern, Danny Duane. "The effects of physics ranking tasks on student understanding of conceptual physics concepts." Montana State University, 2011. http://etd.lib.montana.edu/etd/2011/mattern/MatternD0811.pdf.
Full textHu, Zhonghan. "Transport properties, optical response and slow dynamics of ionic liquids." Diss., University of Iowa, 2007. http://ir.uiowa.edu/etd/160.
Full textStrauss, Hencharl Johan. "Thermo-optical effects in high-power end-pumped vanadate lasers." Thesis, Stellenbosch : University of Stellenbosch, 2010. http://hdl.handle.net/10019.1/4007.
Full textENGLISH ABSTRACT: The output power of end-pumped lasers is mainly limited by thermal effects in the bulk crystal gain material. The thermal effects either fracture the crystal or cause degradation in the laser beam quality and output power. This is especially pronounced in Nd:YVO4 and Nd:GdVO4 which exhibit strong thermal lensing. These two Nd3+ vanadate materials are of great value because of their high emission cross sections which makes them excellent gain materials for mode-locked, high repetition rate Q-switched and intra-cavity frequency doubled lasers. The two Nd3+ vanadates have very similar spectral properties but many publications claim that the more expensive Nd:GdVO4 is thermo-optically superior to Nd:YVO4. However, a debate ensued after theoretical calculations as well as measurements of the thermal conductivity and thermo-optical coefficients indicated that the opposite is true. To our knowledge there has never been a direct comparison of the thermal lensing of these two materials under identical pumping and lasing conditions. In order to contribute to the debate we did such measurements for different crystals of these two materials with equal low doping using three different measurement methods. We subsequently determined that Nd:YVO4 has slightly lower thermal lensing for the stronger gain -polarisation. One of the measurement methods we used is a novel more reproducible one that we developed for this purpose. It is more reproducible because it selectively measures only the focal length of the central, relatively unaberrated part of the thermal lens. Another measurement, utilising a probe beam through the laser crystal, found that there was almost no increase in the temperature when lasing is interrupted. This indicated that there is almost no upconversion present in the crystals which is probably due to their optimally chosen low doping. A further consequence of the vanadate debate is that there is still confusion about the value of the important thermo-optical coefficient for the higher gain -polarisation (dne/dT ) of Nd:YVO4. This parameter is of great importance in thermal calculations since the strength of the thermal lens is largely dependent on it. We therefore numerically modelled the thermal lensing in our crystals using different dne/dT values and found that the value given by Sato & Taira (2007) matches our experimental results the best. Our measurements also indicated that the thermal lens dioptric power increased nonlinearly with pump power. This appeared to contradict theory of thermal lensing since we knew that there was no upconversion in the crystals (which is the standard explanation for the nonlinear increase). We proceeded to use our numerical modelling to identify the main source of the nonlinear increase as the varying spectral output of the diode pump laser. The findings in this thesis therefore extend knowledge of the thermo-optical properties of the vanadates and increase understanding of the strongly aberrated thermal lenses formed inside them. Furthermore, the findings now enable the power-scaling of end-pumped vanadates lasers to higher levels.
AFRIKAANSE OPSOMMING: Die uitset drywing van longitudinale-gepompte vaste-toestand lasers word hoofsaaklik beperk deur termiese effekte in die laser kristal. Die kristal word of gekraak of die laser se bundel kwaliteit en uitset drywing verminder. Dit is veral ’n problem in Nd:YVO4 en Nd:GdVO4 kristalle waarin sterk termiese lense voorkom. Hierdie twee Nd3+ vanadaat kristalle is waardevol vanwee hulle ho¨e emissie deursnitte wat hulle uitstekend maak as versterkings materiale vir modus-gesinkroniseerde, ho¨e repitisie, Q-geskakelde en binne-resonator frekwensie-verdubbelde lasers. Die twee vanadate het baie soortgelyke spektrale eienskappe, maar verskeie publikasies beweer dat die duurder Nd:GdVO4 materiaal termo-opties beter is as Nd:YVO4. Onlangse teoretiese berekeninge asook metings van die termiese en termo-optiese kwaliteite van die twee kristalle toon egter die teenoorgestelde. Sover ons weet is daar nog geen direkte vergelyking van die termiese lens in hierdie twee materiale onder identiese kondisies gedoen nie. Ons het dus so ’n meting aangepak vir kristalle met identiese lae konsentrasie van die Nd3+ ioon deur drie verskillende meet metodes te gebruik. Een van die meet metodes is ’n nuwe, meer reproduseerbare metode wat ons ontwikkel het vir hierdie doel. Dit is meer reproduseerbaar omdat dit slegs die binneste deel van die termiese lens meet wat min sferiese aberrasie het. ’n Ander meeting, wat ’n toets-bundel deur die kristal stuur, het getoon dat daar byna geen verhoging in die die temperatuur van die kristal was toe ossilasie in die resonator onderbreek was nie. Dit is ’n aanduiding dat dat daar byna geen op-omskepping teenwoordig is in die kristalle nie wat te danke is aan hul optimale lae konsentrasie van die Nd3+ ioon. ’n Verdere gevolg van die debat is dat daar nog verwarring in die literatuur bestaan oor die waarde van Nd:YVO4 se termo-optiese dne/dT koeffisi¨ent. Hierdie parameter is van groot belang in berekinge van die termiese lens se fokale lengte vir die ho¨er wins -polarisasie. Deur numeriese modellering te gebruik het ons bevind dat die waarde wat verskaf word deur Sato & Taira (2007) ons eksperimentele data die beste pas. Ons metings het ook aangedui dat die dioptriese krag van die termiese lens nie linie¨er toeneem ten opsigte van die geabsorbeerde pomp krag nie. Dit was o¨enskynlik teenstryding met teorie oor termiese lense. Dit is omdat ons bevestig het dat daar geen op-omskepping in die kristalle teenwoordig was nie, wat die standaard verklaring vir die nie linie¨eriteit is. Ons het dus ons numeriese modellering gebruik om die hoofbron van die nie-lini¨ere toename te identifiseer as die veranderende spektrale uitset van die diode pomp laser. Die bevindings in hierdie tesis bou dus kennis op oor die termo-optiese eienskappe van die vanadate en versterk begrip van die sterk termiese lense binne hulle. Verder stel die bevindings ons nou in staat om die uitset drywing van longitudinale-gepompte vanadaat lasers na ho¨er vlakke te skaal.
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