Academic literature on the topic 'ESD'
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Journal articles on the topic "ESD"
Hirasawa, D. "ESD." Nihon Kikan Shokudoka Gakkai Kaiho 72, no. 2 (April 10, 2021): 88–92. http://dx.doi.org/10.2468/jbes.72.88.
Full textKim, Yong Lyun, and Eun Young Jang. "ESD reflected in the 2022 revised national curriculum: Focusing on the general introduction and the middle school curriculum." Association of Global Studies Education 15, no. 1 (March 30, 2023): 5–33. http://dx.doi.org/10.19037/agse.15.1.01.
Full textLee, Han Yong, and Yeon-A. Son. "A Development of Science-ESD Instructional Model for Integration of Science Education and Education for Sustainable Development (ESD)." Journal of Curriculum Integration 12, no. 4 (November 30, 2018): 197–225. http://dx.doi.org/10.35304/jci.12.4.09.
Full textSaito, Yutaka, Taku Sakamoto, Takeshi Nakajima, and Takahisa Matsuda. "Colorectal ESD." Gastrointestinal Endoscopy Clinics of North America 24, no. 2 (April 2014): 245–55. http://dx.doi.org/10.1016/j.giec.2013.11.005.
Full textYamamoto, Hironori, and Yoshimasa Miura. "Duodenal ESD." Gastrointestinal Endoscopy Clinics of North America 24, no. 2 (April 2014): 235–44. http://dx.doi.org/10.1016/j.giec.2013.11.007.
Full textGotoda, Takuji, Khek-Yu Ho, Roy Soetikno, Tonya Kaltenbach, and Peter Draganov. "Gastric ESD." Gastrointestinal Endoscopy Clinics of North America 24, no. 2 (April 2014): 213–33. http://dx.doi.org/10.1016/j.giec.2013.11.009.
Full textOyama, Tsuneo. "Esophageal ESD." Gastrointestinal Endoscopy Clinics of North America 24, no. 2 (April 2014): 201–12. http://dx.doi.org/10.1016/j.giec.2013.12.001.
Full textToyonaga, Takashi, Mariko Man-I, Yoshinori Morita, and Takeshi Azuma. "Endoscopic Submucosal Dissection (ESD) Versus Simplified/Hybrid ESD." Gastrointestinal Endoscopy Clinics of North America 24, no. 2 (April 2014): 191–99. http://dx.doi.org/10.1016/j.giec.2013.11.004.
Full textAlvarez, D., M. J. Abou-Khalil, C. Russ, K. Chatty, R. Gauthier, D. Kontos, J. Li, C. Seguin, and R. Halbach. "Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant." Microelectronics Reliability 46, no. 9-11 (September 2006): 1597–602. http://dx.doi.org/10.1016/j.microrel.2006.07.041.
Full textbinti Abd Ghani, Nabilah Fathiah, Mohammad Zakariya bin Bakhri, Ismail bin Mohamadiah, Khairol Amali bin Ahmad, and Anis Shahida Niza binti Mokhtar. "Ionizers as Major ESD Countermeasure in 12nm Gate Oxide Semiconductor Manufacturing." Key Engineering Materials 908 (January 28, 2022): 308–15. http://dx.doi.org/10.4028/p-i68anb.
Full textDissertations / Theses on the topic "ESD"
Soldner, Wolfgang Wilhelm. "HF-ESD-Codesign." Aachen Shaker, 2009. http://d-nb.info/996579168/04.
Full textDrüen, Stephan [Verfasser]. "Virtual ESD Test – : An ESD Analysis Methodology at Chip Level / Stephan Drüen." Aachen : Shaker, 2007. http://d-nb.info/1166508595/34.
Full textSoldner, Wolfgang W. [Verfasser]. "HF ESD CODESIGN / Wolfgang W Soldner." Aachen : Shaker, 2009. http://d-nb.info/1159834857/34.
Full textChung, Youngeun. "Education for Sustainable Development (ESD) in Sweden: A study of ESD within a transition affected by PISA reports." Thesis, Uppsala universitet, Institutionen för geovetenskaper, 2013. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-210157.
Full textDukhan, Al-Hytham, and Dastan Hassan. "Undersökning av alternativa ESD-skydd inom produktion." Thesis, Högskolan i Skövde, Institutionen för ingenjörsvetenskap, 2020. http://urn.kb.se/resolve?urn=urn:nbn:se:his:diva-19657.
Full textAs time goes on, the manufacturing of electronic products is increasing and evolving, which calls for the introduction of protective measures on electronic components. Electronic components can be problematic as they produce electrostatic discharge (ESD), something that the manufacturing industry aims to reduce. By implementing safety measures in various ESD-protective systems, which leads to a minimized risk of ESD damage. A project has been carried out at the company Veoneer, the project is based on a study regarding the current ESD-system and a study on two other ESD-protection systems. Literature study and experimentation have been accomplished in relation to the three ESD-protective systems to evaluate the costs and implementation possibilities of production and to further evaluate the effectiveness of neutralization of the static charge. The following ESD-protective systems examined are the currently using ESD-packaging, replacement of ESD-plastic to plastic trays only in combination with ionizers and finally adjustment of the relative humidity. The current ESD-system protects production from electrostatic discharges. The problem with the current system is the costly price ratio of the ESD-packaging. Veoneer carried out a project based on a study regarding the current ESD-system and a study on two other ESD-protective systems. Through the study of relevant literature and experimentation, the three ESD-protective systems have been analyzed to evaluate the costs and implementation possibilities of production and further evaluate the static charge's effectiveness of neutralization. The following ESD-protective systems currently use ESD-packaging, replacement of ESD-plastic trays to plastic trays with ionizers, and finally, adjusting the relative humidity. On the one hand, the current ESD-system protects production from electrostatic discharges, but the current system's problem is the costly price ratio of the ESD-packaging. Project management is centered around the project-based approach. The project-management method consists of four stages of feasibility: studies, planning, implementation, and closure. The control methodology has ensured that the project runs smoothly. The current ESD and ionizer systems were investigated through research studies and experiments, whereas adjustment of humidity was investigated solely through literature studies and company reports. To begin the experiments, measuring tools were arranged to calculate the electrostatic charge in regards to the ESD-packaging and the plastic packaging. Ionizers were utilized for the final experiment to measure the electrostatic neutralization capacity with plastic packaging. Economic calculations have been carried out by the ESD-plastic packaging in conjunction with ionizers and discovered that plastic packaging alone can determine the price difference between the ESD-systems. The experiment resulted in safe and approved readings, meaning that from an experimental perspective, the ionizer system and the current system do not expose products to any ESD-risk. The introduction of ionizers could lead to huge savings if they were to be used as a replacement option. The ionizer should not be implemented directly; more detailed studies need to be carried out before a new ESD-system is acquired. The company's humidity studies showed negative results, implying that the company could not carry out physical experiments concerning humidity. Several proposed improvements have been suggested regarding the current ESD-protection and ionizer system. The improvement proposals includes change of material from an economic and ecological sustainability perspective, and several proposals havebeen made regarding the working standards.
Muthukrishnan, Swaminathan. "ESD Protected SiGe HBT RFIC Power Amplifiers." Thesis, Virginia Tech, 2005. http://hdl.handle.net/10919/31705.
Full textMaster of Science
Černá, Martina. "Překážky volného pohybu pracovníků v judikatuře ESD." Master's thesis, Vysoká škola ekonomická v Praze, 2009. http://www.nusl.cz/ntk/nusl-18117.
Full textZupac, Dragan 1961. "ESD-induced noncatastrophic damage in power MOSFETs." Thesis, The University of Arizona, 1990. http://hdl.handle.net/10150/291470.
Full textCao, Yiqun [Verfasser], Stephan [Akademischer Betreuer] Frei, and Bernd [Gutachter] Deutschmann. "High-voltage ESD structures and ESD protection concepts in smart power technologies / Yiqun Cao ; Gutachter: Bernd Deutschmann ; Betreuer: Stephan Frei." Dortmund : Universitätsbibliothek Dortmund, 2019. http://d-nb.info/1200209605/34.
Full textEscudié, Fabien. "Optimisation de modèles comportementaux de composants pour la prédiction de défaillances fonctionnelles et matérielles liées aux décharges électrostatiques (ESD)." Thesis, Toulouse 3, 2018. http://www.theses.fr/2018TOU30266/document.
Full textElectrical Fast Transient (EFT) are one of the concerns of embedded system engineers. They can lead to system malfunction. EFT are the cause of a large number of hardware and software failures. Our study is mainly focused on the impact of Electro Static Discharge (ESD) on embedded electronic systems, focusing on car's applications. According to a Renault's study, a car can suffer two discharges per day during its entire life. System engineers do not have any tools to predict the ESD impact on the systems. In order to predict the ESD path throughout the electronic system and adjust the ESD protection strategy to provide proper protection for all critical components, some researches around the world are in process. The research results from ESE working group from the LAAS-CNRS laboratory, were mainly on passive components, integrated circuits and electronics boards modeling methods, implemented in VHDL-AMS language. Integrated circuits have an internal ESD protection network that helps to deflect the stress from critical areas. The methodology developed in the last few years allows to model the behavior of this protection network. However, these models are basically made, they are made of the triggering level of the protection and the impedance value of the component depending on the ESD stress amplitude. No information on the transient behavior of the protections is included in this model. It is not possible to predict some failures related to the transient phenomenon of the protection like triggering and turning on time that induce very high overvoltage or mismatch on the current levels estimation. The various topics covered during this thesis allows to solve these problems by using a, proposed dynamic model. Different methods are proposed to extract the parameters used into the dynamic model. One important point also aborted into this document is that the model have to be able to predict the soft failure which can appear in the system during an ESD stress.[...]
Books on the topic "ESD"
Voldman, Steven H. ESD. Chichester, UK: John Wiley & Sons, Ltd, 2015. http://dx.doi.org/10.1002/9781118954492.
Full textVoldman, Steven H. ESD. Chichester, UK: John Wiley & Sons, Ltd, 2005. http://dx.doi.org/10.1002/0470033479.
Full textVoldman, Steven H. ESD. Chichester, UK: John Wiley & Sons, Ltd, 2011. http://dx.doi.org/10.1002/9781119991137.
Full textVoldman, Steven H. ESD. Chichester, United Kingdom: John Wiley & Sons, Ltd, 2014. http://dx.doi.org/10.1002/9781118701409.
Full textVoldman, Steven H. ESD. Chichester, UK: John Wiley & Sons, Ltd, 2004. http://dx.doi.org/10.1002/0470013508.
Full textVoldman, Steven H. ESD. New York: John Wiley & Sons, Ltd., 2006.
Find full textVoldman, Steven H. ESD. New York: John Wiley & Sons, Ltd., 2006.
Find full textVoldman, Steven H. ESD Testing. Chichester, UK: John Wiley & Sons Ltd, 2016. http://dx.doi.org/10.1002/9781118707128.
Full textVoldman, Steven H. ESD Basics. Chichester, UK: John Wiley & Sons, Ltd, 2012. http://dx.doi.org/10.1002/9781118443323.
Full textDangelmayer, G. Theodore. ESD Program Management. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4613-1179-9.
Full textBook chapters on the topic "ESD"
Tooley, Mike. "ESD." In Aircraft Digital Electronic and Computer Systems, 197–206. 3rd ed. London: Routledge, 2022. http://dx.doi.org/10.1201/9781003215516-12.
Full textHarris, John. "ESD Control." In The Electronics Assembly Handbook, 469–73. Berlin, Heidelberg: Springer Berlin Heidelberg, 1988. http://dx.doi.org/10.1007/978-3-662-13161-9_74.
Full textOka, Shiro, and Shinji Tanaka. "Hybrid ESD." In Endoscopic Management of Colorectal T1(SM) Carcinoma, 87–91. Singapore: Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-13-6649-9_11.
Full textVashchenko, Vladislav A., and Andrei Shibkov. "ESD Clamps." In ESD Design for Analog Circuits, 155–212. Boston, MA: Springer US, 2010. http://dx.doi.org/10.1007/978-1-4419-6565-3_4.
Full textVinson, James E., Joseph C. Bernier, Gregg D. Croft, and Juin J. Liou. "ESD Modeling." In ESD Design and Analysis Handbook, 181–200. Boston, MA: Springer US, 2003. http://dx.doi.org/10.1007/978-1-4615-0321-7_6.
Full textBarnes, John R. "ESD Testing." In Robust Electronic Design Reference Book, 957–62. New York, NY: Springer US, 2004. http://dx.doi.org/10.1007/1-4020-7830-7_43.
Full textHellström, Sten. "Indirect ESD." In ESD — The Scourge of Electronics, 93–107. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-642-80302-4_7.
Full textMejía Pérez, Lady Katherine, Seiichiro Abe, Raja Siva, John Vargo, and Amit Bhatt. "Esophageal ESD." In Gastrointestinal Interventional Endoscopy, 83–95. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-21695-5_6.
Full textGotoda, Takuji. "Gastric ESD." In Gastrointestinal Interventional Endoscopy, 97–106. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-21695-5_7.
Full textNamasivayam, Vikneswaran, and Yutaka Saito. "Colonic ESD." In Gastrointestinal Interventional Endoscopy, 107–25. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-21695-5_8.
Full textConference papers on the topic "ESD"
"Paper 3B.1 has been withdrawn." In 2019 41st Annual EOS/ESD Symposium (EOS/ESD). IEEE, 2019. http://dx.doi.org/10.23919/eos/esd.2019.8869965.
Full textStockinger, Michael. "Low-Leakage NMOS Clamps with Gate-Assisted Bipolar Triggering." In 2019 41st Annual EOS/ESD Symposium (EOS/ESD). IEEE, 2019. http://dx.doi.org/10.23919/eos/esd.2019.8869969.
Full textMalobabic, Slavica, David Marreiro, and Vladislav Vashchenko. "Dual Injection Latchup Phenomenon in HV Rail Based ESD Protection Networks." In 2019 41st Annual EOS/ESD Symposium (EOS/ESD). IEEE, 2019. http://dx.doi.org/10.23919/eos/esd.2019.8869970.
Full textMarreiro, David, and Vladislav Vashchenko. "HV Latch-up at System Level ESD Current Injection." In 2019 41st Annual EOS/ESD Symposium (EOS/ESD). IEEE, 2019. http://dx.doi.org/10.23919/eos/esd.2019.8869971.
Full textMatsubara, Ryo, and Katsuo Inokuchi. "Development of EMC analysis technology using large-scale electromagnetic field analysis." In 2019 41st Annual EOS/ESD Symposium (EOS/ESD). IEEE, 2019. http://dx.doi.org/10.23919/eos/esd.2019.8870011.
Full text"EOS/ESD 2019 Future Events Page." In 2019 41st Annual EOS/ESD Symposium (EOS/ESD). IEEE, 2019. http://dx.doi.org/10.23919/eos/esd.2019.8869960.
Full textDannenberger, Stefan, Danielle Griffith, and Oddgeir Fikstvedt. "ESD Design Considerations for Ultra-Low Power Crystal Oscillators in Automotive Products." In 2019 41st Annual EOS/ESD Symposium (EOS/ESD). IEEE, 2019. http://dx.doi.org/10.23919/eos/esd.2019.8869961.
Full text"EOS/ESD 2019 Awards [9 awards]." In 2019 41st Annual EOS/ESD Symposium (EOS/ESD). IEEE, 2019. http://dx.doi.org/10.23919/eos/esd.2019.8869962.
Full textNarita, Koki, and Mototsugu Okushima. "A Variable VH Combined Power Clamp for System Level ESD/Surge Immunity Enhancement with Low Leakage." In 2019 41st Annual EOS/ESD Symposium (EOS/ESD). IEEE, 2019. http://dx.doi.org/10.23919/eos/esd.2019.8869963.
Full textViheriakoski, Toni, Rita Fung, Richard Wong, Reinhold Gartner, Friedrich zur Nieden, and Pasi Tamminen. "Characterization of ESD Shielding Bag with Capacitive Probe and IEC 61000-4-2 Generator." In 2019 41st Annual EOS/ESD Symposium (EOS/ESD). IEEE, 2019. http://dx.doi.org/10.23919/eos/esd.2019.8869964.
Full textReports on the topic "ESD"
Whinnery, LeRoy L.,, April Nissen, Patrick Keifer, and Alexander Tyson. Imaging indicator for ESD safety testing. Office of Scientific and Technical Information (OSTI), May 2013. http://dx.doi.org/10.2172/1088073.
Full textPfeifer, Kent Bryant. Modeling of ESD events from polymeric surfaces. Office of Scientific and Technical Information (OSTI), March 2014. http://dx.doi.org/10.2172/1200667.
Full textWilson, Issa, and Jeanette Varela. Everything Safety: Technical Terms to ESD Experiments. Office of Scientific and Technical Information (OSTI), August 2014. http://dx.doi.org/10.2172/1150686.
Full textSain, Joseph A. ESD/MITRE Software Acquisition Symposium Proceedings; an ESD/Industry Dialogue held in Bedford, Massachusetts on May 6-7, 1986. Fort Belvoir, VA: Defense Technical Information Center, May 1986. http://dx.doi.org/10.21236/ada178785.
Full textJones, R. D., K. C. Chen, and S. W. Holmes. Vacuum cleaner modifications leading to reduced ESD hazards. Office of Scientific and Technical Information (OSTI), March 1994. http://dx.doi.org/10.2172/10148472.
Full textSnyder, Hans R. Fiber Optic Point Sensors for ESD Data Experiments. Office of Scientific and Technical Information (OSTI), August 2018. http://dx.doi.org/10.2172/1463586.
Full textJones, R. D., K. C. Chen, and S. W. Holmes. ESD hazards associated with CO{sub 2} refrigeration. Office of Scientific and Technical Information (OSTI), August 1994. http://dx.doi.org/10.2172/10181984.
Full textCollins, Jr., David H. Analysis of Type 17 Actuator Response to ESD insults. Office of Scientific and Technical Information (OSTI), October 2018. http://dx.doi.org/10.2172/1479890.
Full textWilson, M. J. Projected Response of Typical Detonators to Electrostatic Discharge (ESD) Environments. Office of Scientific and Technical Information (OSTI), December 2002. http://dx.doi.org/10.2172/15003275.
Full textBarnard, Casey. Packaging a liquid metal ESD with micro-scale Mercury droplet. Office of Scientific and Technical Information (OSTI), August 2011. http://dx.doi.org/10.2172/1088095.
Full text