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1

Kapustin, Vladimir, and Illarion Li. Theory, electronic structure and physical chemistry of materials cathodes for microwave devices. ru: INFRA-M Academic Publishing LLC., 2020. http://dx.doi.org/10.12737/1041298.

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In the monograph the kinetic theory of cathode materials based on metal and oxide phases, analytical methods of research of the cathodes, methods of study of their emission properties. Details the authors discuss the theory and physico-chemistry of oxide-Nickel, metalloplastic, and metal alloyed oxide-yttrium cathodes, including a cathode for magnetrons with cold start. Designed for scientific and engineering-technical workers, specializing in electronic materials and electronic devices.
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2

Kapustin, Vladimir, Aleksandr Sigov, Illarion Li, and Vladimir Mel'nikov. Point defects in oxides and emission properties. ru: INFRA-M Academic Publishing LLC., 2022. http://dx.doi.org/10.12737/1846464.

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The monograph discusses the influence of point defects in oxides, which are the main emission component of cathodes of electrovacuum microwave devices, on their emission properties. The theory of electron emission of oxides, analytical methods for studying cathodes, methods for studying their emission properties are described. The issues of the theory and physicochemistry of nickel-oxide, metal-porous, metal-alloy and yttrium oxide cathodes, including cathodes for cold-start magnetrons, are considered in detail. It is intended for scientific and engineering workers specializing in the field of electronic materials science and electronic devices. It can also serve as a textbook useful for teachers, graduate students, undergraduates, undergraduates of the corresponding physical-technical and natural-scientific specialties.
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3

Danilov, Vladimir, Roman Gaydukov, and Vadim Kretov. Mathematical Modeling of Emission in Small-Size Cathode. Singapore: Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-0195-1.

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4

S, MacRae Gregory, and United States. National Aeronautics and Space Administration., eds. Requirements for long-life operation of inert gas hollow cathodes--preliminary report. [Washington, DC: National Aeronautics and Space Administration, 1990.

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5

S, MacRae Gregory, and United States. National Aeronautics and Space Administration., eds. Requirements for long-life operation of inert gas hollow cathodes--preliminary report. [Washington, DC: National Aeronautics and Space Administration, 1990.

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6

S, MacRae Gregory, and United States. National Aeronautics and Space Administration., eds. Requirements for long-life operation of inert gas hollow cathodes--preliminary report. [Washington, DC: National Aeronautics and Space Administration, 1990.

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7

Gordeev, V. F. Termoėmissionnye dugovye katody. Moskva: Ėnergoatomizdat, 1988.

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8

Mesi︠a︡t︠s︡, G. A. Explosive electron emission. Ekaterinburg: URO-Press, 1998.

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9

Center, NASA Glenn Research, ed. Ferroelectric emission cathodes for low-power electric propulsion. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 2002.

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10

Bajic, Stevan. "Non-metallic" cold-cathode electron emission from composite metal-insulator microstructures. Birmingham: AstonUniversity. Department of Electrical and Electronic Engineering and Applied Physics., 1989.

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11

Workshop on Short Pulse High Current Cathodes (1990 Bendor, France). Proceedings of the Workshop on Short Pulse High Current Cathodes, Bendor, France, 18-22 June 1990. Gif-sur-Yvette, France: Editions Frontieres, 1990.

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12

International Vacuum Microelectronics Conference (8th 1995 Portland, Or.). IVMC '95, Eighth International Vacuum Microelectronics Conference, Portland, Oregon, July 30-August 3, 1995: Technical digest. [New York]: Institute of Electrical and Electronics Engineers, 1995.

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13

United States. National Aeronautics and Space Administration., ed. Numerical study of cathode emission constraints on cylindrical self-field MPD thruster performance. [Washington, DC]: National Aeronautics and Space Administration, 1992.

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14

International, Vacuum Microelectronics Conference (10th 1997 Kyongju Korea). IVMC'97: 1997 10th International Vacuum Microelectronics Conference : technical digest : August 17-21, 1997, Kyongju, Korea. Seoul, Korea: Electronic Display Industrial Research Association of Korea, 1997.

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15

International Vacuum Microelectronics Conference (9th 1996 St. Petersburg, Russia). IVMC'96: 9th International Vacuum Microelectronics Conference, July 7-12, 1996, Saint-Petersburg, Russia. [New York, N.Y.]: Institute of Electrical and Electronics Engineers, 1996.

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16

International Vacuum Microelectronics Conference (14th 2001 Davis, Calif.). IVMC 2001: Proceedings of the 14th International Vacuum Microelectronics Conference : August 12-16, 2001, University of California, Davis, California, USA. Edited by Hunt Charles E, Institute of Electrical and Electronics Engineers., University of California Davis, and IEEE Electron Devices Society. Piscataway, New Jersey: IEEE, 2001.

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17

Foster, John E. Plasma emission characteristics from a high current hollow cathode in an ion thruster discharge chamber. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 2002.

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18

Freeman, Jon C. Preliminary study of electron emission for use in the PIC portion of MAFIA. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 2001.

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19

Williams, John D. Plasma contactor research, 1989: Annual report. [Cleveland, Ohio]: Lewis Research Center, National Aeronautics and Space Administration, 1990.

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20

International Vacuum Microelectronics Conference (11th 1998 Asheville, North Carolina). IVMC'98: Eleventh International Vacuum Microelectronics Conference : July 19-24, 1998, the Grove Park Inn, Asheville, NC, USA. Piscataway, New Jersey: IEEE, 1998.

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21

Danilov, Vladimir, Roman Gaydukov, and Vadim Kretov. Mathematical Modeling of Emission in Small-Size Cathode. Springer Singapore Pte. Limited, 2020.

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22

Shen, Xiangqian. Novel processing routes for oxide cathode emission materials. 2000.

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23

Danilov, Vladimir, Roman Gaydukov, and Vadim Kretov. Mathematical Modeling of Emission in Small-Size Cathode. Springer, 2019.

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24

Binh, Vu Thien. Electron cold sources: Nanotechnology contribution to field emitters. Edited by A. V. Narlikar and Y. Y. Fu. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199533060.013.21.

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This article reviews recent advances in field emission cathodes and their applications, focusing on a number of possibilities emerging from the field of nanotechnology. It begins with an overview of the driving forces for the evolution of cold cathodes, laying emphasis on their fundamental characteristics and industrial applications as well as the bottlenecks of metallic field emitters. It then considers single-atom emitters, followed by different examples where the advent of nanotechnology has contributed towards improving new cold cathodes. It also discusses the Fresnel projection microscope and the microgun, a route to the microcolumn approach which is associated with the nanotip; a host of material issues for field emitters, taking into account carbon nanocompounds; carbon-nanotube field emitters; and carbon-nanopearl field emitters. The article concludes with an evaluation of the applications and uses of carbon nanocompounds, carbon nanotubes and carbon nanopearls as cold cathodes.
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25

Wright, A. G. Timing with PMTs. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780199565092.003.0008.

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The timing capability of photomultipliers (PMTs) can be inferred from the basic laws of electron motion. The relationships between time dispersion and field strength, initial electron energy, angle of emission, and electrode spacing follow from these laws. For conventional PMTs, the major contribution to dispersion arises from the cathode-to-first-dynode region. The field gradient at the cathode primarily determines the timing. This is verified by examining the electron motion in non-uniform electric fields. The contribution from interdynode transitions is small for linear focussed PMTs. Monte Carlo simulations of output waveforms from scintillators agree with measurements. The performance of threshold, zero crossing, and constant fraction (CF) discriminators is examined, revealing the superiority of the CF types. Two organizations have made detailed timing measurements, some of which show sub-nanosecond jitter. Proximity focussed PMTs from Hamamatsu confirm time dispersion measured in picoseconds.
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26

Fielding, Richard J. Special emission from a hollow cathode discharge and from the grimm lamp. c1989, 1989.

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27

IVMC '95, Eighth International Vacuum Microelectronics Conference, Portland, Oregon, July 30-August 3, 1995: Technical digest. Institute of Electrical and Electronics Engineers, 1995.

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28

Field Emission Electronics. Springer, 2017.

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29

1997 International Vacuum Microelectronics Conference. Institute of Electrical & Electronics Enginee, 1997.

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30

Vacuum Microelectronics Conference. I.E.E.E.Press, 2001.

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31

Extended test of a xenon hollow cathode for a space plasma contactor. [Washington, DC]: National Aeronautics and Space Administration, 1994.

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32

Morgan, Cheryl. Design and development of a microcavity hollow cathode glow discharge emission system for simultaneous multielement analysis of discrete nanosamples of solution residues. 1993.

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33

Holland, Christopher, Wei Zhu, Lawrence S. Pan, and Thomas E. Felter. Materials Issues in Vacuum Microelectronics: Volume 509. University of Cambridge ESOL Examinations, 2014.

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34

(Editor), Wei Zhu, Lawrence S. Pan (Editor), Thomas E. Felter (Editor), and Christopher Holland (Editor), eds. Materials Issues in Vacuum Microelectronics: Symposium Held April 13-16, 1998, San Francisco, California, U.S.A (Materials Research Society Symposium Proceedings). Materials Research Society, 1998.

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35

(Editor), Heide Schatten, and James B. Pawley (Editor), eds. Biological Low-Voltage Scanning Electron Microscopy. Springer, 2007.

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36

Institute Of Electrical and Electronics Engineers and IEEE Electron Devices Society. International Vacuum Microelectronics Conference : July 19-24, 1998. Institute of Electrical & Electronics Enginee, 1998.

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