Academic literature on the topic 'Electrostatic Discharge Realiability of Electron Devices'
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Journal articles on the topic "Electrostatic Discharge Realiability of Electron Devices"
Melnikov, Andrey, and Vladimir Obukhov. "Deceleration of ion and plasma flows in Hall-effect electrostatic systems." Physics of Plasmas 30, no. 3 (March 2023): 033505. http://dx.doi.org/10.1063/5.0127223.
Full textChen, Shen Li, and Wen Ming Lee. "Power MOSFET Devices and ESD Reliability Evaluations." Applied Mechanics and Materials 268-270 (December 2012): 1361–64. http://dx.doi.org/10.4028/www.scientific.net/amm.268-270.1361.
Full textRegodón, Guillermo Fernando, Juan Manuel Díaz-Cabrera, José Ignacio Fernández Palop, and Jerónimo Ballesteros. "Low Electron Temperature Plasma Diagnosis: Revisiting Langmuir Electrostatic Probes." Coatings 11, no. 10 (September 26, 2021): 1158. http://dx.doi.org/10.3390/coatings11101158.
Full textHenriques, Alexandra, Amin Rabiei Baboukani, Borzooye Jafarizadeh, Azmal Huda Chowdhury, and Chunlei Wang. "Nano-Confined Tin Oxide in Carbon Nanotube Electrodes via Electrostatic Spray Deposition for Lithium-Ion Batteries." Materials 15, no. 24 (December 19, 2022): 9086. http://dx.doi.org/10.3390/ma15249086.
Full textKurilenkov, Yurii, Vladimir Tarakanov, Alexander Oginov, Sergei Gus’kov, and Igor Samoylov. "On the plasma quasineutrality under oscillatory confinement based on a nanosecond vacuum discharge." Applied Physics, no. 6 (December 24, 2021): 14–23. http://dx.doi.org/10.51368/1996-0948-2021-6-14-23.
Full textYadav, Nitish, Kuldeep Mishra, and SA Hashmi. "Nanofiller-incorporated porous polymer electrolyte for electrochemical energy storage devices." High Performance Polymers 30, no. 8 (May 6, 2018): 957–70. http://dx.doi.org/10.1177/0954008318774392.
Full textZirkle, Thomas A., Matthew J. Filmer, Jonathan Chisum, Alexei O. Orlov, Eva Dupont-Ferrier, Joffrey Rivard, Matthew Huebner, Marc Sanquer, Xavier Jehl, and Gregory L. Snider. "Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications." Applied Sciences 10, no. 24 (December 9, 2020): 8797. http://dx.doi.org/10.3390/app10248797.
Full textSheha, E., and E. M. Kamar. "Structural characteristic of vanadium(V) oxide/sulfur composite cathode for magnesium battery applications." Materials Science-Poland 37, no. 4 (December 1, 2019): 570–76. http://dx.doi.org/10.2478/msp-2019-0079.
Full textMainka, Julia, Wei Gao, Nanfei He, Jérôme Dillet, and Olivier Lottin. "A General Equivalent Electrical Circuit Model for the Characterization of MXene/Graphene Oxide Hybrid-Fiber Supercapacitors By Electrochemical Impedance Spectroscopy." ECS Meeting Abstracts MA2022-01, no. 1 (July 7, 2022): 152. http://dx.doi.org/10.1149/ma2022-011152mtgabs.
Full textJin, Jae Sik, and Joon Sik Lee. "Electron-Phonon Interaction Model and Its Application to Thermal Transport Simulation During Electrostatic Discharge Event in NMOS Transistor." Journal of Heat Transfer 131, no. 9 (June 22, 2009). http://dx.doi.org/10.1115/1.3133882.
Full textDissertations / Theses on the topic "Electrostatic Discharge Realiability of Electron Devices"
Kranthi, Nagothu Karmel. "ESD Reliability Physics and Reliability Aware Design of Advanced High Voltage CMOS & Beyond CMOS Devices." Thesis, 2021. https://etd.iisc.ac.in/handle/2005/5474.
Full textConference papers on the topic "Electrostatic Discharge Realiability of Electron Devices"
Kueing-Long Chen, G. Giles, and D. B. Scott. "Electrostatic discharge protection for one micron CMOS devices and circuits." In 1986 International Electron Devices Meeting. IRE, 1986. http://dx.doi.org/10.1109/iedm.1986.191226.
Full textLi, Cheng, Mengfu Di, Zijin Pan, and Albert Wang. "A Study of Materials Impacts on Graphene Electrostatic Discharge Switches." In 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). IEEE, 2021. http://dx.doi.org/10.1109/edtm50988.2021.9420816.
Full textWang, Yuan. "A SPICE-Based Simulation Method for System Efficient Electrostatic Discharge Design." In 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). IEEE, 2022. http://dx.doi.org/10.1109/edtm53872.2022.9798202.
Full textLiou, Juin J. "Electrostatic discharge (ESD): A spoiler to development of next-generation technologies?" In 2010 IEEE International Conference of Electron Devices and Solid- State Circuits (EDSSC). IEEE, 2010. http://dx.doi.org/10.1109/edssc.2010.5713681.
Full textZhiwei Liu, Aihua Dong, Zhuoyu Ji, Long Wang, Linfeng He, Wei Liang, Jiabin Miao, and Juin J. Liou. "Evaluation of electrostatic discharge (ESD) characteristics for bottom contact organic thin film transistor." In 2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC). IEEE, 2013. http://dx.doi.org/10.1109/edssc.2013.6628187.
Full textZhou, Yuanzhong, and Jean-Jacques Hajjar. "A circuit model of electrostatic discharge generators for ESD and EMC SPICE simulation." In 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC). IEEE, 2014. http://dx.doi.org/10.1109/edssc.2014.7061083.
Full textKonstantinov, U. A., E. D. Pozhidaev, and S. R. Tumkovskiy. "Investigation of Electrostatic Discharge Effect on High-power Mosfet-Transistors Considering the Influence of PCB." In 2019 International Seminar on Electron Devices Design and Production (SED). IEEE, 2019. http://dx.doi.org/10.1109/sed.2019.8798468.
Full textJizhi, Liu, Liao Changjun, Liu Zhiwei, and Hou Fei. "A diode-triggered silicon-controlled rectifier with small diode width for electrostatic discharge applications." In 2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC). IEEE, 2017. http://dx.doi.org/10.1109/edssc.2017.8126435.
Full textGazizov, Rustam R. "Evaluation of the Electrostatic Discharge Impact on the Printed Circuit Board: a Case Study." In 2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials (EDM). IEEE, 2022. http://dx.doi.org/10.1109/edm55285.2022.9855087.
Full textKirillov, V. Yu, and M. M. Tomilin. "Calculation of strength of electrical and magnetic fields at a distances commesurate with a length chanel of electrostatic discharge." In 2016 International Conference on Actual Problems of Electron Devices Engineering (APEDE). IEEE, 2016. http://dx.doi.org/10.1109/apede.2016.7878903.
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