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Relevant bibliographies by topics / Electrons – Diffraction

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Academic literature on the topic 'Electrons – Diffraction'

Author: Grafiati

Published: 4 June 2021

Last updated: 31 July 2024

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Journal articles on the topic "Electrons – Diffraction"

1

Qin, L. C., A. J. Garratt-Reed, and L. W. Hobbs. "Theory and practice of energy-filtered electron diffraction using the HB5 STEM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 350–51. http://dx.doi.org/10.1017/s0424820100122150.

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Electron diffraction patterns obtained in TEM have long been an important part of microstructural characterizations. Certain materials, such as crystalline silicas, are amorphized in the fast electron beam of the TEM, and their aperiodic (metamict) structure is of interest. For amorphous materials, both elastically and inelastically scattered electrons contribute to the diffuse diffraction pattern. Analysis of aperiodic structure, however, requires intensity data from only elastically scattered electrons, and it is therefore it is necessary to obtain energy-filtered electron diffraction patterns. With the energy-filtered electron diffraction technique, the background intensity that is mainly due to inelastically scattered electrons is removed. This makes possible the derivation of radial distribution functions (RDFs) from collected electron diffraction intensity data for uniform aperiodic structures.

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Lyman, Charles. "Diffraction." Microscopy Today 20, no. 2 (February 28, 2012): 7. http://dx.doi.org/10.1017/s1551929512000107.

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This year marks the 100th anniversary of the discovery of X-ray diffraction and the 85th anniversary of electron diffraction (see Microscopy Pioneers). For most of the time since their introduction, microscopists have known these two techniques as the primary phase identification methods used in conjunction with various microscopies. However, these two diffraction methods also have played enormous roles in understanding the structure of matter, as well as the nature of both X rays and electrons.

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Schröder, Rasmus R., and Christoph Burmester. "Improvements in electron diffraction of frozen hydrated crystals by energy filtering and large-area single-electron detection." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 666–67. http://dx.doi.org/10.1017/s0424820100149167.

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Diffraction patterns of 3D protein crystals embedded in vitrious ice are critical to record. Inelastically scattered electrons almost completely superimpose the diffraction pattern of crystals if the thickness of the crystal is higher than the mean free path of electrons in the specimen. Figure 1 shows such an example of an unfiltered electron diffraction pattern from a frozen hydrated 3D catalase crystal. However, for thin 2D crystals electron diffraction has been the state of the art method to determine the Fourier amplitudes for reconstructions to atomic level, and in one case the possibility of obtaining Fourier phases from diffraction patterns has been studied. One of the main problems could be the background in the diffraction pattern due to inelastic scattering and the recording characteristics for electrons of conventional negative material.It was pointed out before, that the use of an energy filtered TEM (EFTEM) and of the Image Plate as a large area electron detector gives considerable improvement for detection of diffraction patterns.

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Bauer, R., W. Probst, and W.I. Miller. "Elemental imaging of thin specimens with an energy filtering electron microscope (EFEM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 524–25. http://dx.doi.org/10.1017/s0424820100104686.

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In conventional TEM (CTEM), image contrast is determined by scattering absorption contrast, diffraction contrast and phase contrast. Phase contrast is produced by the interference of unscattered electrons and elastically scattered electrons. Scattering absorption contrast and diffraction contrast are produced by angle selection of the scattered electrons using an objective aperture diaphragm for brightfield, darkfield and diffraction images.In an EFEM, with an integrated imaging electron energy-loss spectrometer, angle selection is used as in CTEM, but, additionally, it is possible to perform energy selection. This is done from the energy-loss spectrum obtained for the specimen area imaged. Energy selection permits the elimination of all inelastically scattered electrons to improve contrast for brightfield, darkfield and diffraction images. This technique also permits imaging of selected, e.g. e1ement-characteristic, ine1astica11y scattered electrons. Images obtained in this way display object- specific or e1ement-specific contrast and are termed electron or element-spectroscopic images (ESI).

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Barckhaus, R. H., I. Fromm, H. J. Höhling, and L. Reimer. "Advantage of Electron Spectroscopic Diffraction on Calcified Tissue Sections." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 362–63. http://dx.doi.org/10.1017/s0424820100135411.

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Different stages in the mineralization of calcified tissues can be investigated by electron diffraction. A disadvantage is the strong background below the Debye—Scherrer rings caused by the large massthickness of calcified products and the high ratio (≃ 3) of the inelastic—to—elastic scattering cross—sections of the embedding material. Therefore, a large fraction of the background consists of inelastically scattered electrons with energy losses. The electron spectroscopic diffraction (ESD) mode of an energy—filtering microscope (ZEISS EM902) allows to record diffraction patterns using only the zero—loss electrons which consist of the primary beam, Bragg diffracted electrons and a smaller fraction of elastically scattered electrons between the Debye—Scherrer rings by thermal—diffuse scattering. Small—area diffraction patterns with different camera lengths are generated at the filter—entrance plane and the zero—loss electrons are selected by a slit in the energy—dispersive plane behind the Castaing—Henry filter lens.

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VALERI, SERGIO, and ALESSANDRO di BONA. "MODULATED ELECTRON EMISSION BY SCATTERING-INTERFERENCE OF PRIMARY ELECTRONS." Surface Review and Letters 04, no. 01 (February 1997): 141–60. http://dx.doi.org/10.1142/s0218625x9700016x.

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We review the effects of scattering-interference of the primary, exciting beam on the electron emission from ordered atomic arrays. The yield of elastically and inelastically backscattered electrons, Auger electrons and secondary electrons shows a marked dependence on the incidence angle of primary electrons. Both the similarity and the relative importance of processes experienced by incident and excident electrons are discussed. We also present recent studies of electron focusing and defocusing along atomic chains. The interplay between these two processes determines the in-depth profile of the primary electron intensity anisotropy. Finally, the potential for surface-structural studies and limits for quantitative analysis are discussed, in comparison with the Auger electron diffraction (AED) and photoelectron diffraction (PD) techniques.

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Lynch, D. F., and A. E. Smith. "Electron diffraction phenomena for very low energy electrons." Acta Crystallographica Section A Foundations of Crystallography 43, a1 (August 12, 1987): C246. http://dx.doi.org/10.1107/s0108767387078887.

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Yang, Jie, Markus Guehr, Theodore Vecchione, Matthew S. Robinson, Renkai Li, Nick Hartmann, Xiaozhe Shen, et al. "Femtosecond gas phase electron diffraction with MeV electrons." Faraday Discussions 194 (2016): 563–81. http://dx.doi.org/10.1039/c6fd00071a.

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We present results on ultrafast gas electron diffraction (UGED) experiments with femtosecond resolution using the MeV electron gun at SLAC National Accelerator Laboratory. UGED is a promising method to investigate molecular dynamics in the gas phase because electron pulses can probe the structure with a high spatial resolution. Until recently, however, it was not possible for UGED to reach the relevant timescale for the motion of the nuclei during a molecular reaction. Using MeV electron pulses has allowed us to overcome the main challenges in reaching femtosecond resolution, namely delivering short electron pulses on a gas target, overcoming the effect of velocity mismatch between pump laser pulses and the probe electron pulses, and maintaining a low timing jitter. At electron kinetic energies above 3 MeV, the velocity mismatch between laser and electron pulses becomes negligible. The relativistic electrons are also less susceptible to temporal broadening due to the Coulomb force. One of the challenges of diffraction with relativistic electrons is that the small de Broglie wavelength results in very small diffraction angles. In this paper we describe the new setup and its characterization, including capturing static diffraction patterns of molecules in the gas phase, finding time-zero with sub-picosecond accuracy and first time-resolved diffraction experiments. The new device can achieve a temporal resolution of 100 fs root-mean-square, and sub-angstrom spatial resolution. The collimation of the beam is sufficient to measure the diffraction pattern, and the transverse coherence is on the order of 2 nm. Currently, the temporal resolution is limited both by the pulse duration of the electron pulse on target and by the timing jitter, while the spatial resolution is limited by the average electron beam current and the signal-to-noise ratio of the detection system. We also discuss plans for improving both the temporal resolution and the spatial resolution.

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Vincent, R. "Quantitative energy-filtered electron diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 992–93. http://dx.doi.org/10.1017/s0424820100172693.

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Microanalysis and diffraction on a sub-nanometre scale have become practical in modern TEMs due to the high brightness of field emission sources combined with the short mean free paths associated with both elastic and inelastic scattering of incident electrons by the specimen. However, development of electron diffraction as a quantitative discipline has been limited by the absence of any generalised theory for dynamical inelastic scattering. These problems have been simplified by recent innovations, principally the introduction of spectrometers such as the Gatan imaging filter (GIF) and the Zeiss omega filter, which remove the inelastic electrons, combined with annual improvements in the speed of computer workstations and the availability of solid-state detectors with high resolution, sensitivity and dynamic range.Comparison of experimental data with dynamical calculations imposes stringent requirements on the specimen and the electron optics, even when the inelastic component has been removed. For example, no experimental CBED pattern ever has perfect symmetry, departures from the ideal being attributable to residual strain, thickness averaging, inclined surfaces, incomplete cells and amorphous surface layers.

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Wang, Z. L. "Coupled thermal diffuse-atomic inner shell scattering in electron diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 994–95. http://dx.doi.org/10.1017/s042482010017270x.

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In electron diffraction patterns, diffuse scattering at high angles is primarily generated by phonon, or thermal diffuse, scattering (TDS). Techniques were introduced to acquire the electron energy-loss spectra (EELS) of high-angle thermal-diffuse-scattered electrons (TDS-EELS) in a transmission electron microscope (TEM). With regards to the scattering mechanism, the TDS-EELS core ionization edge intensity was believed to be generated primarily by TDS - single electron, double-inelastic electron scattering processes. It was concluded from experimental data that the signal from coupled phonon - atomic inner shell excitations is stronger than that from atomic inner shell excitation alone. A formal dynamical theory is presented in this paper to illustrate the theoretical basis of the experimental observations. The theory can be applied to calculate the diffraction patterns of inelastically double-scattered electrons and the signal intensity observed in TDS-EELS.TDS is actually a statistically averaged, quasi-elastic scattering of the electrons by the crystal lattice of different thermal vibration configurations.

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Dissertations / Theses on the topic "Electrons – Diffraction"

1

Krecinic, Faruk [Verfasser]. "Ultrafast electron diffraction and imaging using ionized electrons / Faruk Krecinic." Berlin : Freie Universität Berlin, 2017. http://d-nb.info/1142155447/34.

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Chen, Yixin. "Electron diffraction analysis of amorphous Ge2Sb2Te5." Thesis, University of Oxford, 2010. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.669987.

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Dogbe, John Kofi. "Comparing cluster and slab model geometries from density functional theory calculations of si(100)-2x1 surfaces using low-energy electron diffraction." abstract and full text PDF (free order & download UNR users only), 2007. http://0-gateway.proquest.com.innopac.library.unr.edu/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:3258835.

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Menzel, Andreas. "Step dynamics measurements with time-resolved low energy electron diffraction." Diss., Georgia Institute of Technology, 2002. http://hdl.handle.net/1853/27870.

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Chatelain, Robert P. 1982. "RF compression of electron bunches applied to ultrafast electron diffraction." Thesis, McGill University, 2008. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=111943.

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The dynamics of atomic scale structures during structural change can be studied by Ultrafast Electron Diffraction (UED). The time resolution needed to reveal the fastest dynamics is 100 fs. Sub-angstrom structural resolution becomes possible with 1-1000 pC of charge necessary for diffraction pattern analysis during subtle structural changes. This combination of requirements cannot currently be realized due to the space-charge temporal broadening inherent to bunches of electrons of high fluence and short temporal duration. Simulations show that the incorporation of a specially designed Radio-Frequncy (RF) cavity into the UED apparatus removes this technical limitation. The RF cavity reverses the near linear position-momentum distribution of the temporally broadened electron bunch, causing the bunch to recompress itself as it propagates. It is found that our proposed method allows for sub-100 fs bunches with maximum charge of 0.6 pC, almost 3 orders of magnitude improvement over today's state of the art.

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Erasmus, Nicolas. "The development of an electron gun for performing ultrafast electron diffraction experiments." Thesis, Stellenbosch : Stellenbosch University, 2009. http://hdl.handle.net/10019.1/2560.

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Thesis (MSc (Physics))--Stellenbosch University, 2009.
ENGLISH ABSTRACT: This thesis aims to comprehensively discuss ultrafast electron di raction and its role in temporally resolving ultrafast dynamics on the molecular level. Theory on electron pulses and electron pulse propagation will be covered, but the main focus will be on the method, equipment and experimental setup required to generate sub-picosecond electron pulses, which are needed to perform time resolved experiments. The design and construction of an electron gun needed to produce the electron pulses will be shown in detail, while preliminary pulse characterization experiments will also be illustrated. An introduction into the theory of electron diffraction patterns and how to interpret these diffraction patterns will conclude the thesis.
AFRIKAANSE OPSOMMING: Hierdie tesis het ten doel om ultravinnige elektrondi raksie deeglik te bespreek asook die rol wat dit speel om ultravinnige tyd-dinamika op 'n molekulêre vlak op te los. Die teorie van elektonpulse en die voortplanting van elektronpulse sal gedek word, maar die fokus sal op die metode, gereedskap en eksperimentele opstelling wees wat benodig is om sub-pikosekonde elektronpulse te genereer. Die ontwerp en konstruksie van 'n elektrongeweer, wat benodig word om elektronpulse te produseer, sal in detail bespreek word, terwyl aanvanklike pulskarakterisasie eksperimente ook illustreer sal word. 'n Inleiding tot die teorie van elektrondi raksie patrone en hoe om hulle te interpreteer sal die tesis afsluit.

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Ho, Wing-kin. "The (3x3) reconstruction of SIC(0001) : a low energy electron diffraction study /." Hong Kong : University of Hong Kong, 1998. http://sunzi.lib.hku.hk/hkuto/record.jsp?B19737105.

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Kaufmann, Martin. "Electron Diffraction Studies of Unsupported Antimony Clusters." Thesis, University of Canterbury. Physics and Astronomy, 2006. http://hdl.handle.net/10092/1269.

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This thesis contains two main parts: the first part focusses on an electron diffraction study on unsupported antimony (Sb) clusters, while in the second part the design and development of a time-of-flight mass spectrometer (TOFMS) is discussed. Electron diffraction is an ideal tool to study the structure of clusters entrained in a beam. The main advantage of this technique is the ability to study the clusters in situ and in an interaction-free environment. It is therefore not necessary to remove the particles from the vacuum system which would lead to oxidation. Since the particles do not have to be deposited on a sample for further investigation, there is also no substrate which could influence the cluster structure. An additional advantage is the short exposure to the electron beam, thereby minimising the likelihood of damaging the particles. Sb clusters were produced using an inert-gas aggregation source. To control the cluster properties the source temperature, pressure and type of cooling gas can be adjusted. In the range of source parameters tested, Sb clusters with three different structures were observed: a crystalline structure corresponding to the rhombohedral structure of bulk Sb, an amorphous structure equivalent to the structure of amorphous Sb thin films, and a structure with the same diffraction signature as Sb4 (Sb evaporates mainly as Sb4). This last structure was found to belong to large particles consisting of randomly oriented Sb4 units. In order to study the size distributions and morphologies of the Sb clusters, the clusters were deposited onto substrates and studied under an electron microscope. The crystalline particles showed a wide variety of strongly faceted shapes. Depending on source conditions, the average cluster diameters ranged from 15 to 130 nm. There was a considerable disagreement between these values and the size estimates from the diffraction results with the latter being smaller by an order of magnitude. This might be due to the existence of domains inside the clusters. The amorphous particles were all found to be spherical with mean sizes between 27 and 45 nm. The Sb4 particles showed a liquid-like morphology and tended to coalesce easily. Their sizes ranged from 18 to 35 nm. To obtain an independent method for determining the cluster size, a TOFMS was designed and developed in collaboration with Dr Bernhard Kaiser. However, the TOFMS failed to detect a cluster signal in the original set-up which is most likely due to a defective ioniser and underestimated cluster energies. Further tests were performed in a new vacuum system and mass spectra for palladium clusters were successfully recorded.

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何永健 and Wing-kin Ho. "The (3x3) reconstruction of SIC(0001): a low energy electron diffraction study." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 1998. http://hub.hku.hk/bib/B31215300.

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Mok, Cheuk-wai. "Comparing electron and positron scattering factors for applications in diffraction and holography /." Hong Kong : University of Hong Kong, 1997. http://sunzi.lib.hku.hk/hkuto/record.jsp?B18716337.

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Books on the topic "Electrons – Diffraction"

1

Beeston, B. E. P. Electron diffraction and optical diffraction techniques. Amsterdam: North-Holland, 1986.

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NATO Advanced Study Institute on Electron Crystallography (1997 Erice, Italy). Electron crystallography. Dordrecht: Kluwer Academic Publishers, 1997.

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Kästner, Gerhard. Many-beam electron diffraction related to electron microscope diffraction contrast. Berlin: Akademie Verlag, 1993.

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4

B, Hirsch P., ed. Topics in electron diffraction and microscopy of materials. Bristol: Institute of Physics Publishing, 1999.

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Zou, Xiaodong. Electron crystallography: Electron microscopy and electron diffraction. Oxford: Oxford University Press, 2011.

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Misell, D. L. Electron diffraction: An introduction for biologists. Amsterdam: Elsevier, 1987.

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R, Helliwell John, and Rentzepis Peter M. 1934-, eds. Time-resolved diffraction. Oxford: Clarendon Press, 1997.

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Tanaka, Michiyoshi. Convergent-beam electron diffraction II. Tokyo: JEOL, 1988.

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Dyson, D. J. X-ray and electron diffraction studies in materials science. London: Maney for the Institute of Materials, Minerals, and Mining, 2004.

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Ertl, G. Low energy electrons and surface chemistry. 2nd ed. Weinheim, Federal Republic of Germany: VCH, 1985.

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Book chapters on the topic "Electrons – Diffraction"

1

Morawiec, Adam. "Diffraction of High Energy Electrons." In Indexing of Crystal Diffraction Patterns, 123–47. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-11077-1_3.

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Alloul, Henri. "Crystalline Solids: Diffraction." In Introduction to the Physics of Electrons in Solids, 23–50. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-13565-1_2.

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Rochow, Theodore George, and Paul Arthur Tucker. "Transmission Electron Microscopy and Electron Diffraction." In Introduction to Microscopy by Means of Light, Electrons, X Rays, or Acoustics, 265–96. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4899-1513-9_14.

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Drits, Victor A. "Dynamical n-Beam Scattering of Electrons." In Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures, 85–101. Berlin, Heidelberg: Springer Berlin Heidelberg, 1987. http://dx.doi.org/10.1007/978-3-642-71729-1_7.

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Potylitsyn, Alexander Petrovich, Mikhail Ivanovich Ryazanov, Mikhail Nikolaevich Strikhanov, and Alexey Alexandrovich Tishchenko. "Experimental Investigations of Diffraction Radiation Generated by Relativistic Electrons." In Springer Tracts in Modern Physics, 251–77. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-12513-3_9.

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Drits, Victor A. "The Kinematical Theory of Scattering of Electrons by Crystals. Intensity of Diffraction Reflections." In Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures, 14–42. Berlin, Heidelberg: Springer Berlin Heidelberg, 1987. http://dx.doi.org/10.1007/978-3-642-71729-1_3.

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Wang, Zhong Lin. "Diffraction and Imaging of Reflected High-Energy Electrons from Bulk Crystal Surfaces." In Elastic and Inelastic Scattering in Electron Diffraction and Imaging, 97–126. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4899-1579-5_5.

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Moritz, W. "5.1 Introduction to elastic scattering and diffraction of electrons and positrons." In Physics of Solid Surfaces, 134. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-47736-6_48.

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ZhiLi, Dong. "Atomic Scattering Factors for Electrons and X-rays." In Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists, 155–64. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9780429351662-13.

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Peter Toennies, J. "Otto Stern and Wave-Particle Duality." In Molecular Beams in Physics and Chemistry, 519–45. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-63963-1_23.

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AbstractThe contributions of Otto Stern to the discovery of wave-particle duality of matter particles predicted by de Broglie are reviewed. After a short introduction to the early matter-vs-wave ideas about light, the events are highlighted which lead to de Broglie’s idea that all particles, also massive particles, should exhibit wave behavior with a wavelength inversely proportional to their mass. The first confirming experimental evidence came for electrons from the diffraction experiments of Davisson and Germer and those of Thomson. The first demonstration for atoms, with three orders of magnitude smaller wave lengths, came from Otto Stern’s laboratory shortly afterwards in 1929 in a remarkable tour de force experiment. After Stern’s forced departure from Hamburg in 1933 it took more than 40 years to reach a similar level of experimental perfection as achieved then in Stern’s laboratory. Today He atom diffraction is a powerful tool for studying the atomic and electronic structure and dynamics of surfaces. With the advent of nanotechnology nanoscopic transmission gratings have led to many new applications of matter waves in chemistry and physics, which are illustrated with a few examples and described in more detail in the following chapters.

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Conference papers on the topic "Electrons – Diffraction"

1

Fill, Ernst E. "Electron Diffraction Experiments using Laser Plasma Electrons." In SUPERSTRONG FIELDS IN PLASMAS: Third International Conference on Superstrong Fields in Plasmas. AIP, 2006. http://dx.doi.org/10.1063/1.2195222.

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Ascolani, H., M. A. Vicente Alvarez, and G. Zampieri. "Inelastic diffraction of electrons." In The 8th Latin American congress on surface science: Surfaces , vacuum, and their applications. AIP, 1996. http://dx.doi.org/10.1063/1.51187.

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Rose-Petruck, C., T. Guo, F. Raksi, J. Squier, B. Walker, P. M. Weber, K. R. Wilson, and C. P. J. Barty. "Measurements of Ultrafast Dynamics in GaAs Crystals using Time-resolved X-Ray Diffraction." In Applications of High Field and Short Wavelength Sources. Washington, D.C.: Optica Publishing Group, 1997. http://dx.doi.org/10.1364/hfsw.1997.pdp2.

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We present initial results of picosecond time resolved diffraction from GaAs(111) crystals using plasma generated, ultrafast x-ray pulses. Laser excitation of the GaAs transfers electron population from the valence into the conduction band. Such an excitation typically produces a hot electron gas in the conduction band that thermalizes with the lattice via phonon emission with a time constant of about 2 ps.[1, 2] However, upon transfer of a few percent of all valence electrons, the cohesive energy binding the atoms in the crystal lattice changes, which can lead to a rapid modification of the crystal structure.[3-8] This process, which does not require the thermalization of electrons and phonons, can proceed on femtosecond timescales. Both effects, which substantially disturb the equilibrium crystal structure, are in principle detectable by ultrafast x-ray diffraction, as are other effects such as melting and shock wave propagation.

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Kitanaka, Michihiro, Motoki Ishikawa, Reika Kanya, and Kaoru Yamanouchi. "Observation of terahertz-wave assisted electron scattering by Ar." In International Conference on Ultrafast Phenomena. Washington, D.C.: Optica Publishing Group, 2022. http://dx.doi.org/10.1364/up.2022.tu4a.32.

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THz-wave assisted electron scattering by Ar, in which the scattered electrons exchange their energy with as many as 800 photons, was observed unambiguously as a first step for ultrafast electron diffraction by the THz-wave streaking.

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Sakabe, S., S. Tokita, M. Hashida, K. Otani, S. Inoue, and T. Nishoji. "Single-shot ultrafast electron diffraction using electrons accelerated by an intense femtosecond laser pulse." In 12th European Quantum Electronics Conference CLEO EUROPE/EQEC. IEEE, 2011. http://dx.doi.org/10.1109/cleoe.2011.5943027.

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Walsh, John E., Kenneth Woods, Richard Fernow, and Harold Kirk. "Radiation produced by relativistic electrons moving over a diffraction grating." In SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, edited by Eric Munro and Henry P. Freund. SPIE, 1995. http://dx.doi.org/10.1117/12.221603.

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Ascolani, H., and G. Zampieri. "Diffraction of electrons at intermediate energies: The role of phonons." In The 8th Latin American congress on surface science: Surfaces , vacuum, and their applications. AIP, 1996. http://dx.doi.org/10.1063/1.51179.

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Gunasekar, Naresh Kumar. "Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.915.

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Sambasivan, R. "Anomaly in electron shadow scattering off atoms." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1987. http://dx.doi.org/10.1364/oam.1987.wr10.

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Hans Bethe in 1966 theoretically predicted the shadowlike diffraction effects in the forward (θ ≈ D – 1°) elastic scattering cross sections of low-energy electrons off atoms such as He, Ne, and Ar and explained them as being due to the coupling of inelastic scattering channels. By scattering 10-25-eV electrons off Ne in the forward direction (θ up to 20 mrad), Geiger and Moran1 found the diffraction effects (superimposed on the Born approximation). This shadow diffraction occurs not at the atom edge (radius γ0) but at the sheath surrounding (radius R) the atom due to agglomeration of the inelastic scattered electrons.

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10

Garmire, E., F. Karpushko, A. Kost, and C. M. Yang. "Band-edge surface transient diffraction." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1990. http://dx.doi.org/10.1364/oam.1990.fi2.

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As much as 25% self-diffraction has been observed at the surface of n-GaAs:Te when two pumps (and a weak probe) intersect with an internal angle of 0.15 rad in the Raman–Nath regime. The photoinduced gratings decayed in less than 100 ps. The diffraction efficiency was nearly independent of sample thickness (40 μm and 350 μm), and careful investigation has shown that the diffraction arose primarily at the surface and was resonant just below the band edge. It is proposed that band-bending at the surface states causes increased absorption and results in a sheet of optically induced charge. The faster diffusion of electrons relative to holes allows a transient charge separation to a distance of one diffusion length (1 μm). As a result, a space-charge field is formed (Dember field) that can cause an index change through the Franz–Keldysh effect. The resulting transient grating can cause the large observed diffraction. This new BEST effect has potential for optical-switching applications.

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Reports on the topic "Electrons – Diffraction"

1

Kotula, Paul G. Advanced electron diffraction diagnostics. Office of Scientific and Technical Information (OSTI), October 2016. http://dx.doi.org/10.2172/1563075.

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Centurion, Martin. Ultrafast electron diffraction from aligned molecules. Office of Scientific and Technical Information (OSTI), August 2015. http://dx.doi.org/10.2172/1210043.

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Hall, Ernest, Susanne Stemmer, Haimei Zheng, Yimei Zhu, and George Maracas. Future of Electron Scattering and Diffraction. Office of Scientific and Technical Information (OSTI), February 2014. http://dx.doi.org/10.2172/1287380.

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Parks, Joel H. Electron Diffraction Determination of Nanoscale Structures. Office of Scientific and Technical Information (OSTI), March 2013. http://dx.doi.org/10.2172/1064614.

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Chen, Jianmin, Philip J. Bos, Hemasiri Vithana, and David L. Joseph. An Electro-Optically Controlled Liquid Crystals Diffraction Grating,. Fort Belvoir, VA: Defense Technical Information Center, January 1995. http://dx.doi.org/10.21236/ada296613.

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Bazarov, Ivan, and Luca Cultrera. Ultra-low Emittance Photocathodes for Accelerators and Femtosecond Electron Diffraction. Office of Scientific and Technical Information (OSTI), November 2018. http://dx.doi.org/10.2172/1483870.

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Hau-Riege, S., R. London, and H. Chapman. Pulse requirements for electron diffraction imaging of single biological molecules. Office of Scientific and Technical Information (OSTI), October 2004. http://dx.doi.org/10.2172/15014820.

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John Kay and Kurt Eylands. Advanced Characterization of Slags and Refractory Bricks Using Electron Backscatter Diffraction. Office of Scientific and Technical Information (OSTI), September 2007. http://dx.doi.org/10.2172/984654.

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Weber, Peter M. The Generation and Characterization of Ultrashort Electron Pulses and their Application to Time-Resolved Electron Diffraction. Fort Belvoir, VA: Defense Technical Information Center, January 1996. http://dx.doi.org/10.21236/ada308231.

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Prather, Dennis. Mesoscopic Diffractive Optics for Electronic Warfare applications. Fort Belvoir, VA: Defense Technical Information Center, May 2002. http://dx.doi.org/10.21236/ada414831.

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