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Relevant bibliographies by topics / Electronic secondary emission

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Academic literature on the topic 'Electronic secondary emission'

Author: Grafiati

Published: 14 September 2024

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Journal articles on the topic "Electronic secondary emission"

1

Yater, J. E. "Secondary electron emission and vacuum electronics." Journal of Applied Physics 133, no. 5 (February 7, 2023): 050901. http://dx.doi.org/10.1063/5.0130972.

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Secondary electron emission serves as the foundation for a broad range of vacuum electronic devices and instrumentation, from particle detectors and multipliers to high-power amplifiers. While secondary yields of at least 3–4 are required in practical applications, the emitter stability can be compromised by surface dynamics during operation. As a result, the range of practical emitter materials is limited. The development of new emitter materials with high yield and robust operation would advance the state-of-the-art and enable new device concepts and applications. In this Perspective article, I first present an analysis of the secondary emission process, with an emphasis on the influence of material properties. From this analysis, ultra-wide bandgap (UWBG) semiconductors and oxides emerge as superior emitter candidates owing to exceptional surface and transport properties that enable a very high yield of low-energy electrons with narrow energy spread. Importantly, exciting advances are being made in the development of promising UWBG semiconductors such as diamond, cubic boron nitride (c-BN), and aluminum nitride (AlN), as well as UWBG oxides with improved conductivity and crystallinity. These advances are enabled by epitaxial growth techniques that provide control over the electronic properties critical to secondary electron emission, while advanced theoretical tools provide guidance to optimize these properties. Presently, H-terminated diamond offers the greatest opportunity because of its thermally stable negative electron affinity (NEA). In fact, an electron amplifier under development exploits the high yield from this NEA surface, while more robust NEA diamond surfaces are demonstrated with potential for high yields in a range of device applications. Although c-BN and AlN are less mature, they provide opportunities to design novel heterostructures that can enhance the yield further.

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Neugebauer, R., R. Wuensch, T. Jalowy, K. O. Groeneveld, H. Rothard, A. Clouvas, and C. Potiriadis. "Secondary electron emission near the electronic stopping power maximum." Physical Review B 59, no. 17 (May 1, 1999): 11113–16. http://dx.doi.org/10.1103/physrevb.59.11113.

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Klochkov, V. P., and V. L. Bogdanov. "Secondary emission accompanying excitation of high electronic states (Review)." Journal of Applied Spectroscopy 43, no. 1 (July 1985): 699–714. http://dx.doi.org/10.1007/bf00660572.

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4

Fitting, H. J., and D. Hecht. "Secondary electron field emission." Physica Status Solidi (a) 108, no. 1 (July 16, 1988): 265–73. http://dx.doi.org/10.1002/pssa.2211080127.

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Howie, A. "Threshold Energy Effects in Secondary Electron Emission." Microscopy and Microanalysis 5, S2 (August 1999): 662–63. http://dx.doi.org/10.1017/s1431927600016639.

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The work function ϕ, the bandgap Eg, the threshold energy level Et, for the inelastic scattering of excited electrons and the threshold energy transfer Ed for the onset of structural ionisation damage are clearly of major significance in various actively developing forms of hot carrier imaging. Two exciting examples here are the ability to image small and dynamic local changes in work function by PEEM and as well as mapping the variations in electronic structure between p and n-type regions of a semiconductor by SE imaging in the SEM. More recently still there have been indications that the SE signal in the ESEM might be sensitive to local changes in bandgap and suggestions that it might be even possible to image spatial variations in pH. It is increasingly clear that if these attractive opportunities are to be efficiently explored and developed, systematic and preferably quantitative observations are needed. Such work requires specimens whose atomic and electronic structure is either fully known beforehand or can be deduced from other signals available in a situation where the physical processes in the microscope are well understood.

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Novikov, Yu A. "Modern Scanning Electron Microscopy. 1. Secondary Electron Emission." Поверхность. Рентгеновские, синхротронные и нейтронные исследования, no. 5 (May 1, 2023): 80–94. http://dx.doi.org/10.31857/s102809602305014x.

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The development of modern technologies, including nanotechnology, is based on application of diagnostic methods of objects used in technologies processes. For this purpose most perspective are methods realized in a scanning electron microscope. Thus one of basic methods is the measurement of linear sizes of relief structures of micrometer and nanometer ranges used in micro- and nanoelectronic. In a basis of a scanning electron microscope job the secondary electronic issue of firm body lays. However, practically all researches were spent on surfaces, which relief was neglected. The review of theoretical and experimental materials to researches of a secondary electron emission is given. Practically all known laws are checked up in experiments and have received the physical explanation. However, the application of a secondary electronic emission in a scanning electron microscopy, used in micro- both nanoelectronic and nanotechnology, requires knowledge of laws, which are shown on relief surfaces. Is demonstrated, what laws can be applied in a scanning electron microscope to measurement of linear sizes of relief structures. Is judged necessity of an influence study of a surface relief on a secondary electron emission.

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Vaughan, J. R. M. "A new formula for secondary emission yield." IEEE Transactions on Electron Devices 36, no. 9 (September 1989): 1963–67. http://dx.doi.org/10.1109/16.34278.

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8

Huang, Ling, and Qian Wang. "Study on Secondary Electron Yield of Dielectric Materials." Journal of Physics: Conference Series 2433, no. 1 (February 1, 2023): 012002. http://dx.doi.org/10.1088/1742-6596/2433/1/012002.

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Abstract The secondary electron emission coefficient of dielectric materials will have an important impact on the performance of electronic devices and equipment. In order to understand the secondary electron emission coefficient of common dielectric materials, the collection electrode negative bias method is introduced in this study. First, the measurement method of secondary electron emission coefficient of dielectric materials is analyzed, and 20 common dielectric materials are introduced, the secondary electron emission coefficients of 20 kinds of common dielectric materials were measured and analyzed, which laid the foundation for the subsequent application of dielectric materials. The results show that among common dielectric materials, the secondary electron emission coefficients of alumina, silica and muscovite are relatively high, while those of polyimide, polycarbonate and polyester are relatively low; The surface roughness of the material will also have an important impact on the secondary electron emission coefficient. With the gradual increase of the surface roughness of the material, the undulation of the material surface will have a shielding effect and absorption effect on the secondary electrons, which will eventually lead to the gradual reduction of the secondary electron emission coefficient of the material. The research results can provide data support for the establishment of the database of secondary electron emission characteristics of common dielectric materials.

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Pintao, Carlos. "Mylar secondary emission-energy distribution and yields." IEEE Transactions on Dielectrics and Electrical Insulation 21, no. 1 (February 2014): 311–16. http://dx.doi.org/10.1109/tdei.2014.6740754.

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Michizono, Shinichiro. "Secondary electron emission from alumina RF windows." IEEE Transactions on Dielectrics and Electrical Insulation 14, no. 3 (June 2007): 583–92. http://dx.doi.org/10.1109/tdei.2007.369517.

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Dissertations / Theses on the topic "Electronic secondary emission"

1

Ludwick, Jonathan. "Physics of High-Power Vacuum Electronic Systems Based on Carbon Nanotube Fiber Field Emitters." University of Cincinnati / OhioLINK, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1613745398331048.

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Ransley, Chau Diem Nguyen. "Secondary electron emission from organic monolayers." Thesis, University of Cambridge, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.612907.

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Farhang, Mohammad Hossein. "Secondary electron emission yield from carbon samples." Thesis, University of Southampton, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.318220.

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Vempati, Pratyusha. "Analytical fits to Secondary Emission Yield Data." University of Cincinnati / OhioLINK, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1523635397854801.

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Cormier, Pierre Richard Sébastien. "Secondary electron emission properties of molybdenum disulfide thin films." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk3/ftp04/mq31189.pdf.

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Muellejans, Harald. "Secondary electron emission in coincidence with primary energy losses." Thesis, University of Cambridge, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.240071.

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Vaz, Raquel Maria Amaro. "Studies of the secondary electron emission from diamond films." Thesis, University of Bristol, 2013. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.616564.

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The aim of the present research was the development of an optimised secondary electron emission (SEE) diamond film to use as a dynode material. The project was a partnership between the School of Chemistry in the University of Bristol, the Space Research Centre (SRC) at the University of Leicester and Photek, a company specialized in the manufacture of systems for photon detection. The role of Bristol in this project consisted in the preparation of CVD diamond films and their characterization, before supply to the other collaborators. SEE characterisation of the samples was performed at SRC and Photek would proceed to further testing in actual tubes. Besides its participation in the project, Bristol went further and developed the means to do its own SEE measurements. This thesis describes the work undertaken at Bristol using the facilities at the Diamond CVD group. Diamond films were prepared by hot-filament (HF) CVD covering a range of crystallinities, thicknesses and levels of boron (B) doping, on different substrate materials. A new home-built apparatus has been developed for the acquisition of SEE data from diamond films, both in reflection and transmission configurations. The setup consists of a system of phosphor screens acting as detectors and associated to PMTs for the acquisition of signal measured from the diamond samples. A comprehensive study evaluating the effects of B-doping, crystallinity, surface termination, thickness and substrate material of diamond films on yield and yield degradation in the SEE reflection yields has been performed. In addition, SEE yields from commercial CVD diamond samples were analysed, after surface functionalization by hydrogenation, caesiation and lithiation. Moreover, the present study allowed for an improvement in the growth of thin NCD films, essentially through the optimization of the seeding processes. Finally, the development of techniques to manufacture free standing diamond films on silicon substrates were investigated, and preliminary SEE measurements in transmission were undertaken.

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Thomson, Clint D. "Measurements of the Secondary Electron Emission Properties of Insulators." DigitalCommons@USU, 2005. https://digitalcommons.usu.edu/etd/2093.

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Measurements of the electron-induced electron emission properties of insulators are important to many applications including spacecraft charging, scanning electron microscopy, electron sources, and particle detection technology. However, these measurements are difficult to make since insulators can charge either negatively or positively under charge particle bombardment that in turn alters insulator emissions. In addition, incident electron bombardment can modify the conductivity, internal charge distribution, surface potential, and material structure in ways that are not well understood. A primary goal of this dissertation work has been to make consistent and accurate measurements of the uncharged electron yields for insulator materials using innovative instrumentation and techniques. Furthermore, this dissertation reports on the experimental work undertaken by our group to explore insulator charging rates as a function of incident electron energy and fluence. Specifically, these charging studies include: (i) the study of the effectiveness of charge-neutralization techniques such as low-energy electron flooding and UV light irradiation to dissipate both positive and negative surface potentials induced by incident electron irradiation, (ii) the exploration of several noncontacting methods used to determine insulator surface potentials and the insulator first and second crossover energies that are important in determining both the polarity and magnitude of spacecraft material potentials, (iii) the dynamical evolution of electron emissions and sample displacement current as a function of incident charge fluence and energy with ties to evolving surface potentials as an insulator reaches its current steady state condition, and (iv) the slow evolution of electron yields with continuous incident electron bombardment. These charging data are explained in the context of available insulator charging models. Specific insulator materials tested included chromic acid anodized aluminum, RTVsilicone solar array adhesives, and KaptonTM on aluminum.

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Haidara, Modibo. "Impulsions de Trichel dans le cyclohexane liquide et les gaz comprimés." Grenoble 1, 1988. http://www.theses.fr/1988GRE10160.

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Resultats d'etude de la conduction electrique de liquides non polaires tres purs (cyclohexane, n-propane) en geometrie pointe-plan, en fonction du rayon de courbure de la pointe et de la pression hydrostatique (p<->10**(7)pa)

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Davies, Robert. "Measurement of Angle-Resolved Secondary Electron Spectra." DigitalCommons@USU, 1999. https://digitalcommons.usu.edu/etd/1698.

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Theoretical formulations of secondary electron emission over the past 20 years have exceeded the confirming ability of available measurements. An instrument has been developed and tested for the purpose of obtaining simultaneous angle- and energy-resolved (AER) secondary and backscattered electron measurements for energetic electrons incident on conducting surfaces. The instrument is found to be in good working order and the data quality found to be excellent for nearly all angles and energies investigated. A representative set of AER measurements has been acquired for 1500 e V electrons normally incident on polycrystalline gold. The data have been used to construct angle-resolved (AR) spectra and energy-resolved (ER) angular distributions, which have been examined both as surface plots and cross sections. Analysis of the measurements strongly suggests that secondary electrons comprise the bulk of emitted electrons at energies much greater than the traditionally accepted maximum secondary electron energy of 50 eV. Additional evidence suggests the ability to investigate dominant secondary and backscattered electron production mechanisms in several energy domains.

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Books on the topic "Electronic secondary emission"

1

International Commission on Radiation Units and Measurements., ed. Secondary electron spectra from charged particle interactions. Bethesda, Md: International Commission on Radiation Units and Measurements, 1996.

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2

M, Asnin Vladimir, Petukhov Andre G, and NASA Glenn Research Center, eds. Secondary electron emission spectroscopy of diamond surfaces. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 1999.

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3

A, Jensen Kenneth, Roman Robert F, and United States. National Aeronautics and Space Administration. Scientific and Technical Information Division., eds. Secondary electron emission characteristics of molybdenum-masked, ion-textured OFHC copper. [Washington, D.C.]: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, 1990.

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United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch., ed. Calculation of secondary electron trajectories in multistage depressed collectors for microwave amplifiers. [Washington, DC]: National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1986.

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United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch., ed. Calculation of secondary electron trajectories in multistage depressed collectors for microwave amplifiers. [Washington, DC]: National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1986.

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6

T, Mearini G., and United States. National Aeronautics and Space Administration., eds. Effects of surface treatments on secondary electron emission from CVD diamond films. [Washington, D.C: National Aeronautics and Space Administration, 1995.

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7

Nauchnyĭ sovet po probleme "Fizicheskai͡a ėlektronika" (Akademii͡a nauk SSSR) and Tashkentskiĭ politekhnicheskiĭ institut im. Abu Raĭkhana Beruni, eds. VII Simpozium po vtorichnoĭ ėlektronnoĭ, fotoėlektronnoĭ ėmissii͡am i spektroskopii poverkhnosti tverdogo tela, Tashkent, 7-9 ii͡uni͡a 1990 goda: Tezisy dokladov. Tashkent: Tashkentskiĭ politekhnicheskiĭ in-t im. Beruni, 1990.

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A, Jensen Kenneth, and United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch., eds. Textured carbon on copper: A novel surface with extremely low secondary electron emission characteristics. [Washington, D.C.]: National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1985.

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Novikov, I︠U︡ A. Mekhanizmy vtorichnoĭ ėlektronnoĭ ėmissii relʹefnoĭ poverkhnosti tverdogo tela. Moskva: Nauka, Fizmatlit, 1998.

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Kovalev, V. P. Vtorichnye ėlektrony. Moskva: Ėnergoatomizdat, 1987.

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Book chapters on the topic "Electronic secondary emission"

1

Maguire, H. G. "Auger and Secondary Emission Electronic Structural Characteristics in Metals and Insulators." In Springer Series in Surface Sciences, 159–65. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-75066-3_19.

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2

Schou, Jørgen. "Secondary Electron Emission from Insulators." In NATO ASI Series, 351–58. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-2840-1_24.

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Reimer, Ludwig. "Emission of Backscattered and Secondary Electrons." In Springer Series in Optical Sciences, 135–69. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-540-38967-5_4.

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Akkerman, A., A. Breskin, R. Chechik, and A. Gibrekhterman. "Secondary Electron Emission from Alkali Halides Induced by X-Rays and Electrons." In NATO ASI Series, 359–80. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-2840-1_25.

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Fujii, Haruhisa, and Yuhki Ishihara. "Electron Beam Induced Charging and Secondary Electron Emission of Surface Materials." In Protection of Materials and Structures From the Space Environment, 437–45. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-30229-9_40.

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Wen, Kaile, Shulin Liu, Baojun Yan, Yang Yu, and Yuzhen Yang. "Spherical Measuring Device of Secondary Electron Emission Coefficient Based on Pulsed Electron Beam." In Springer Proceedings in Physics, 113–16. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-13-1313-4_23.

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Cui, Wanzhao, Yun Li, Hongtai Zhang, and Jing Yang. "Basic Theory and Measurement Method of Secondary Electron Emission in Multipactor." In Simulation Method of Multipactor and Its Application in Satellite Microwave Components, 23–78. Boca Raton: CRC Press, 2021. http://dx.doi.org/10.1201/9781003189794-2.

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Devooght, J., J. C. Dehaes, A. Dubus, M. Cailler, and J. P. Ganachaud. "Theoretical description of secondary electron emission induced by electron or ion beams impinging on solids." In Springer Tracts in Modern Physics, 67–128. Berlin, Heidelberg: Springer Berlin Heidelberg, 1991. http://dx.doi.org/10.1007/bfb0041378.

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Nitta, Kumi, Eiji Miyazaki, Shinichiro Michizono, and Yoshio Saito. "Effects of Secondary Electron Emission Yield of Polyimide Films on Atomic Oxygen Irradiation." In Protection of Materials and Structures From the Space Environment, 143–50. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-30229-9_12.

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Marten, H. "Inelastic Scattering and Secondary Electron Emission under Resonance Conditions in RHEED from Pt(111)." In NATO ASI Series, 109–15. Boston, MA: Springer US, 1988. http://dx.doi.org/10.1007/978-1-4684-5580-9_8.

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Conference papers on the topic "Electronic secondary emission"

1

Wang, L. "Research on Pulsed High-Current Secondary Electron Emission Cathode." In 2024 IEEE International Conference on Plasma Science (ICOPS), 1. IEEE, 2024. http://dx.doi.org/10.1109/icops58192.2024.10627566.

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Damamme, G., N. Ghorbel, A. Si Ahmed, K. Said, and G. Moya. "Modeling of secondary electron emission and charge trapping in an insulator under an electronic beam." In 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP). IEEE, 2016. http://dx.doi.org/10.1109/ceidp.2016.7785520.

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Kopot, M. A., V. D. Yeryomka, and V. D. Naumenko. "Electronic Shell Generation in the MM-Wave Secondary Emission Magnetron with Cold Cathode." In 2007 17th International Crimean Conference "Microwave and Telecommunication Technology" (CriMiCo '2007). IEEE, 2007. http://dx.doi.org/10.1109/crmico.2007.4368680.

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Shibahara, Masahiko, Shin-Ichi Satake, and Jun Taniguchi. "Quantum Molecular Dynamics Study on Energy Transfer to the Secondary Electron in Surface Collision Process of an Ion." In ASME/JSME 2007 Thermal Engineering Heat Transfer Summer Conference collocated with the ASME 2007 InterPACK Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/ht2007-32144.

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It is well known that an emission of secondary electrons is observed in an ion collision process to a surface, such as the focused ion beam (FIB) process. However, the physical effect of secondary electron emission to energy and mass transfer is seldom considered and there are few examples of analysis of the secondary electron emission. It is one of interesting problems as an extreme small scale energy transfer problem how energy is transferred to the electron emitted from the surface by ionic collisions. In the present study the quantum molecular dynamics method was applied to an energy transfer problem to an electron during ionic surface collision process in order to elucidate how energy of ionic collision transfers to the emitted electrons. The energy transfer paths to the electron was discussed during the collision process of an ion with changing the interaction between the electron and ions and that between the electron and surface molecules by the quantum molecular dynamics method. Effects of various physical parameters, such as the collision velocity and interaction strength between the observed electron and the classical particles to the energy transfer to the electron were investigated by the quantum molecular dynamics method when the potassium ion was collided with the surface so as to elucidate the energy path to the electron and the predominant factor of energy transfer to the electron. Effects of potential energy between the ion and the electron and that between the surface molecule and the electron to the electronic energy transfer were shown in the present paper. The energy transfer to the observed secondary electron through the potential energy term between the ion and the electron was much dependent on the ion collision energy although the energy increase to the observed secondary electron was not monotonous through the potential energy between the ion and surface molecules with the change of the ion collision energy.

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Martens, V. Ya. "COMPENSATION BY IONS OF THE SPATIAL CHARGE OF THE ELECTRON BEAM, PAIRED AND SECONDARY ELECTRONS." In Plasma emission electronics. Buryat Scientific Center of SB RAS Press, 2023. http://dx.doi.org/10.31554/978-5-7925-0655-8-2023-64-70.

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TROMAYER, Jürgen, Roland KIRCHBERGER, Gerd NEUMANN, and Helmut EICHLSEDER. "Are low-cost, low-tech solutions adequate for small capacity EU III motorcycles?" In Small Engine Technology Conference & Exposition. 10-2 Gobancho, Chiyoda-ku, Tokyo, Japan: Society of Automotive Engineers of Japan, 2007. http://dx.doi.org/10.4271/2007-32-0014.

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<div class="section abstract"><div class="htmlview paragraph">More and more stringent emission legislation is implemented in the world wide market of motorcycles leading to higher product costs. But not every market is ready for high technological levels. Therefore the main topic of interest is: “Will a small one cylinder motorbike engine need an electronic device for fuel metering or is it possible to use standard carburetors in combination with some smart but simple ideas, to fulfil EU III cold start emission regulations?” The described ideas deal with a novel secondary air supply, an improved cooling system and simple NOx reduction methods, always paying attention to the performance and driveability of the vehicle. After describing the prototype design of the engine modifications, the achievable results with their pros and cons are discussed. Online recorder measurements give interesting emission plots of HC, CO and NOx. The homologation measurement results point out the obtainable values of the limited emissions. Finally, solutions for a marketable mass production can be derived from each tested implementation.</div></div>

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Sergeev, N. S., and I. A. Sorokin. "MEASUREMENT OF THE TOTAL SECONDARY ELECTRON EMISSION COEFFICIENT IN A LINEAR PLASMA SIMULATOR BPD-PSI." In Plasma emission electronics. Buryat Scientific Center of SB RAS Press, 2023. http://dx.doi.org/10.31554/978-5-7925-0655-8-2023-233-237.

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George, Anoop, Robert A. Schill, Richard Kant, and Stan Goldfarb. "Secondary Electron Emission from Niobium." In IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science. IEEE, 2005. http://dx.doi.org/10.1109/plasma.2005.359503.

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Hopman, H. J., and J. Verhoeven. "Secondary electron emission from insulators." In Eighth international symposium on the production and neutralization of negative ions and beams and the seventh european workshop on the production and application of light negative ions. AIP, 1998. http://dx.doi.org/10.1063/1.56369.

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Wang, Joseph, Pu Wang, Mohamed Belhai, and Jean-Charles Mateo-Velez. "Modeling Secondary Electron Emission Experiment." In 49th AIAA Aerospace Sciences Meeting including the New Horizons Forum and Aerospace Exposition. Reston, Virigina: American Institute of Aeronautics and Astronautics, 2011. http://dx.doi.org/10.2514/6.2011-1060.

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Reports on the topic "Electronic secondary emission"

1

Kirby, R. E. Secondary electron emission from accelerator materials. Office of Scientific and Technical Information (OSTI), February 2000. http://dx.doi.org/10.2172/753300.

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Kirby, R. Artifacts in Secondary Electron Emission Yield Measurements. Office of Scientific and Technical Information (OSTI), July 2004. http://dx.doi.org/10.2172/827328.

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Wilson, Warren G. Secondary and Backscatter Electron Emission from Conductors. Fort Belvoir, VA: Defense Technical Information Center, July 1998. http://dx.doi.org/10.21236/ada359512.

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Kirby, Robert E. Secondary Electron Emission Yields from PEP-II Accelerator Materials. Office of Scientific and Technical Information (OSTI), October 2000. http://dx.doi.org/10.2172/784708.

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Furman, M. Probabilistic Model for the Simulation of Secondary Electron Emission. Office of Scientific and Technical Information (OSTI), May 2004. http://dx.doi.org/10.2172/826907.

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Zhang S. Y. Secondary Electron Emission at the SNS Storage Ring Collimator. Office of Scientific and Technical Information (OSTI), October 1998. http://dx.doi.org/10.2172/1157228.

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M.D. Campanell, A. Khrabrov and I. D. Kaganovich. Absence of Debye Sheaths Due to Secondary Electron Emission. Office of Scientific and Technical Information (OSTI), May 2012. http://dx.doi.org/10.2172/1062662.

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Basovic, Milos. Secondary Electron Emission from Plasma Processed Accelerating Cavity Grade Niobium. Office of Scientific and Technical Information (OSTI), May 2016. http://dx.doi.org/10.2172/1351260.

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George, Anoop. Study of Secondary Electron Emission from Niobium at Cryogenic Temperatures. Office of Scientific and Technical Information (OSTI), August 2005. http://dx.doi.org/10.2172/1552175.

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Furman, M. A., and M. T. F. Pivi. Simulation of secondary electron emission based on a phenomenological probabilistic model. Office of Scientific and Technical Information (OSTI), June 2003. http://dx.doi.org/10.2172/835149.

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