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Relevant bibliographies by topics / Electronic noise

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Academic literature on the topic 'Electronic noise'

Author: Grafiati

Published: 4 June 2021

Last updated: 30 July 2024

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Journal articles on the topic "Electronic noise"

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Song, Younggul, and Takhee Lee. "Electronic noise analyses on organic electronic devices." Journal of Materials Chemistry C 5, no. 29 (2017): 7123–41. http://dx.doi.org/10.1039/c7tc01997a.

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Takahashi, Minoru. "Electronic noise attenuation system." Journal of the Acoustical Society of America 90, no. 6 (December 1991): 3388. http://dx.doi.org/10.1121/1.401390.

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Hamada, Hareo. "Electronic noise attenuation system." Journal of the Acoustical Society of America 86, no. 4 (October 1989): 1631–32. http://dx.doi.org/10.1121/1.398661.

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Miller, Harry B. "Electronic noise‐reducing system." Journal of the Acoustical Society of America 80, no. 6 (December 1986): 1870. http://dx.doi.org/10.1121/1.394218.

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Brandt, M. S., S. T. B. Goennenwein, and M. Stutzmann. "Spin-dependent electronic noise." Physica E: Low-dimensional Systems and Nanostructures 10, no. 1-3 (May 2001): 67–70. http://dx.doi.org/10.1016/s1386-9477(01)00055-8.

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Li, Yongsong, Zhengzhou Li, Kai Wei, Weiqi Xiong, Jiangpeng Yu, and Bo Qi. "Noise Estimation for Image Sensor Based on Local Entropy and Median Absolute Deviation." Sensors 19, no. 2 (January 16, 2019): 339. http://dx.doi.org/10.3390/s19020339.

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Noise estimation for image sensor is a key technique in many image pre-processing applications such as blind de-noising. The existing noise estimation methods for additive white Gaussian noise (AWGN) and Poisson-Gaussian noise (PGN) may underestimate or overestimate the noise level in the situation of a heavy textured scene image. To cope with this problem, a novel homogenous block-based noise estimation method is proposed to calculate these noises in this paper. Initially, the noisy image is transformed into the map of local gray statistic entropy (LGSE), and the weakly textured image blocks can be selected with several biggest LGSE values in a descending order. Then, the Haar wavelet-based local median absolute deviation (HLMAD) is presented to compute the local variance of these selected homogenous blocks. After that, the noise parameters can be estimated accurately by applying the maximum likelihood estimation (MLE) to analyze the local mean and variance of selected blocks. Extensive experiments on synthesized noised images are induced and the experimental results show that the proposed method could not only more accurately estimate the noise of various scene images with different noise levels than the compared state-of-the-art methods, but also promote the performance of the blind de-noising algorithm.

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Chernyak, Mykola, and Roman Chornomorets. "Experimental studies of electrical noise in the aircraft control system." MECHANICS OF GYROSCOPIC SYSTEMS, no. 39 (May 20, 2020): 31–46. http://dx.doi.org/10.20535/0203-3771392020229073.

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Currently, the problem of reducing noise in electrical equipment is important, because a noise in the system affects its components and can cause unpredictable behavior of the electrical system. This is especially important onboard of unmanned aerial vehicle (UAV), where all components are located close to each other and their noise has a significant cross-effect. Conductors passing through a noisy environment can pick up a noise and direct it to another circuits, where it creates interference. Some examples of such noise problems are: degraded accuracy characteristics of microcontroller modules (Analog-to-Digital Converters (ADC), Phase-Locked Loops (PLL) and other) due to noise on supply and reference voltages, wrong acquisition of the digital signals and interference with global navigation satellite system (GNSS) or remote control system of UAV. This article is dedicated to the research of the influence of electrical noise, which is formed by the components of the UAV control system (engines, electric motor controllers, microcontroller etc.), on the performance and noise protection of electronic components of the UAV control system. After the research it was concluded that the main sources of elecrtrical noise in the UAV control system are: high currents, consumed by electronic speed controllers (with motors), high-speed toggling of clock signal of SPI / I2C communication, regulation by step-down voltage regulator and internal processes inside the microcontroller due to work of flight control firmware. The waveforms of generated noises, caused by each source was measured with oscilloscope and depicted in the article.

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MYKHALEVSKIY, DMYTRO. "RELIABILITY OF THE CONTROL OF ELECTRONIC DEVICES BY LOW-FREQUENCY NOISE." Herald of Khmelnytskyi National University. Technical sciences 319, no. 2 (April 27, 2023): 220–23. http://dx.doi.org/10.31891/2307-5732-2023-319-1-220-223.

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The article examines the stages of input and output control of electronic equipment products according to the level of their own low-frequency noise, namely, the measurement of an informative parameter and its comparison with predetermined limits. It was established that for each type of control there is a need to have a methodology for assessing the compliance of control results with valid characteristics and its effectiveness. One of the main parameters of the effectiveness of all stages of control is the probability, which requires separate studies and the definition of a universal mechanism for its assessment. Therefore, the task was set to obtain a complete method of probability assessment for the input and output control of electronic equipment products by the level of their own noise. To determine the probabilistic characteristics of the control, the main informative parameters were investigated: the measuring noise voltage, which is random in nature, and the random error. It is established that the measured value has a confidence interval that takes into account measurement errors and determination of control limits. Control limits were obtained, on the basis of which analytical expressions were obtained for the distribution of the informative parameter within the specified limits for reliable and unreliable electronic products. Taking into account the limit of separation of products into suitable and unsuitable, control limits were proposed, which contain the coefficient of possible error cut-off. A generalized analytical expression for evaluating the probability of control is obtained, which takes into account the minimization of the effect of systematic and random factors influencing the result to increase the efficiency of input and output control on the level of low-frequency noise.

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S.U., PIATRUSHA, GINZBURG L.V., TIKHONOV E.S., SHOVKUN D.V., KOBLMÜLLER G., BUBIS A.V., GREBENKO A.K., NASIBULIN A.G., and KHRAPAI V.S. "NOISE INSIGHTS INTO ELECTRONIC TRANSPORT." ПИСЬМА В ЖУРНАЛ ЭКСПЕРИМЕНТАЛЬНОЙ И ТЕОРЕТИЧЕСКОЙ ФИЗИКИ 108, no. 1-2 (2018): 71–72. http://dx.doi.org/10.1134/s0370274x18130131.

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Broja, Manfred, and Olof Bryngdahl. "Quantization noise in electronic halftoning." Journal of the Optical Society of America A 10, no. 4 (April 1, 1993): 554. http://dx.doi.org/10.1364/josaa.10.000554.

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Dissertations / Theses on the topic "Electronic noise"

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Zhu, Zhineng. "Low Noise Offset Operational Amplifier for Nanopore-based Gene Sequencer." Fogler Library, University of Maine, 2007. http://www.library.umaine.edu/theses/pdf/ZhuZ2007.pdf.

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Banerjee, Gaurab. "Desensitized CMOS low noise amplifiers /." Thesis, Connect to this title online; UW restricted, 2006. http://hdl.handle.net/1773/6014.

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Taylor, Katherine P. "Noise models of A/D and D/A converters for determination of fundamental noise limitations." Diss., Georgia Institute of Technology, 1991. http://hdl.handle.net/1853/16910.

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Grobbelaar, Johannes Jacobus. "Phase noise measurement." Thesis, Stellenbosch : University of Stellenbosch, 2011. http://hdl.handle.net/10019.1/6806.

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Thesis (MScEng (Electrical and Electronic Engineering))--University of Stellenbosch, 2011.
ENGLISH ABSTRACT: The objective of the thesis is the development of a phase noise measuring system that makes use of crosscorrelation and averaging to measure below the system hardware noise floor. Various phase noise measurement techniques are considered after which the phase demodulation method is chosen to be implemented. The full development cycle of the hardware is discussed, as well as the post processing that is performed on the measured phase noise.
AFRIKAANSE OPSOMMING: Die doel van hierdie tesis is die ontwikkeling van ’n faseruis meetstelsel wat gebruik maak van kruiskorrelasie en vergemiddeling om onder die ruisvloer van die meetstelsel se hardeware te meet. Verskeie faseruis meettegnieke word ondersoek en die fase demodulasie metode word gekies om geïmplementeer te word. Die volle ontwikkelingsiklus van die hardeware word bespreek, sowel as die naverwerking wat toegepas is op die gemete faseruis.

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Smith, Corne J. "Feedforward active noise reduction for aircraft headsets." Thesis, Stellenbosch : Stellenbosch University, 2003. http://hdl.handle.net/10019.1/49761.

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Thesis (MScEng)--University of Stellenbosch, 2003.
ENGLISH ABSTRACT: Active noise reduction (ANR) is a method of cancelling acoustic noise in a defined enclosure. Two methods exist to implement ANR, they are the analog feedback method and the digital feedforward method. Commercial ANR systems employing feedback methods have been around since the 1980's. Feedforward methods have however only become practically implemental with the age of fast real time digital signal processing. In current systems, feedback ANR is used to attenuate broadband noise whilst feedforward methods are used to attenuate narrow band or tonal noise [2]. This thesis investigates feedforward ANR to cancel broadband acoustic noise in aircraft headsets. Different adaptive filters, optimal configuration of adaptive filters and practical limitations to broadband attenuation for headsets are addressed. Results from this thesis show that at least 10dS noise energy attenuation is attainable over a bandwidth of 2.5kHz. A number of areas for further research are also identified.
AFRIKAANSE OPSOMMING: Aktiewe geraas beheer (AGS) is 'n metode om akoestiese geraas te kanselleer in 'n gedefinieerde omgewing. Twee metodes bestaan om AGS te implementeer. Hulle is die analoog terugvoer en digitale vorentoevoer metode. Kommersiële AGS wat die terugvoer metode gebruik is al in gebruik van die 1980's. Vorentoevoer metodes is egter eers sedert vinnige intydse digitale sein prosessering moontlik. In huidige stelsels word terugvoer AGS gebruik vir die attenuasie van wyeband geraas terwyl vorentoevoer metodes gebruik word om nouband of enkel toon geraas te kanselleer [2]. Die tesis ondersoek vorentoevoer AGS om wyeband akoestiese geraas te kanselleer in vliegtuig kopstukke. Verskillende aanpasbare filters, optimale opstelling van aanpasbare filters en praktiese beperkings tot wyeband attenuasie vir kopstukke word ondersoek. Resultate van die tesis wys dat ten minste 10dS geraas energie attenuasie behaal kan word oor 'n bandwydte van 2.5kHz. 'n Aantal areas vir verder navorsing is ook geïdentifiseer.

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Kim, Jong Un. "Electronic noise in nanostructures: limitations and sensing applications." Texas A&M University, 2006. http://hdl.handle.net/1969.1/4942.

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Nanostructures are nanometer scale structures (characteristic length less than 100 nm) such as nanowires, ultra-small junctions, etc. Since nanostructures are less stable, their characteristic volume is much smaller compared to defect sizes and their characteristic length is close to acoustical phonon wavelength. Moreover, because nanostructures include significantly fewer charge carriers than microscale structures, electronic noise in nanostructures is enhanced compared to microscale structures. Additionally, in microprocessors, due to the small gate capacitance and reduced noise margin (due to reduced supply voltage to keep the electrical field at a reasonable level), the electronic noise results in bit errors. On the other hand, the enhanced noise is useful for advanced sensing applications which are called fluctuation-enhanced sensing. In this dissertation, we first survey our earlier results about the limitation of noise posed on specific nano processors. Here, single electron logic is considered for voltage controlled logic with thermal excitations and generic shot noise is considered for current-controlled logic. Secondly, we discuss our recent results on the electronic noise in nanoscale sensors for SEnsing of Phage-Triggered Ion Cascade (SEPTIC, for instant bacterial detection) and for silicon nanowires for viral sensing. In the sensing of the phage-triggered ion cascade sensor, bacteriophage-infected bacteria release potassium ions and move randomly at the same time; therefore, electronic noise (i.e., stochastic signals) are generated. As an advanced model, the electrophoretic effect in the SEPTIC sensor is discussed. In the viral sensor, since the combination of the analyte and a specific receptor located at the surface of the silicon nanowire occurs randomly in space and time, a stochastic signal is obtained. A mathematical model for a pH silicon nanowire nanosensor is developed and the size quantization effect in the nanosensor is also discussed. The calculation results are in excellent agreement with the experimental results in the literature.

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Smith, D. T. "Studies in low frequency noise in electronic components." Thesis, University of Oxford, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379976.

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Kaverzin, Alexey. "Electronic transport and flicker noise in graphene structures." Thesis, University of Exeter, 2011. http://hdl.handle.net/10036/3373.

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In this thesis the properties of graphene are studied via the various aspects of the quantum transport: doping of the graphene surface with organic molecules, flicker noise and transport in the quantum Hall regime. First, it was shown that certain molecules (toluene, aniline and water), which possess such common properties as non zero dipole moment and ability to undergo the electrochemical reaction, have a peculiar doping effect on graphene. The effect of toluene doping was studied in detail and is explained by the electrochemical reaction, which takes place in the vicinity of the graphene and results in a gate voltage dependent doping. Second, the flicker noise in graphene and its relation to the scattering mechanisms were studied. The flicker noise as a function of the carrier concentration was demonstrated to be sensitive to the scattering potential determining the resistance of the graphene. Therefore, as it was suggested, the flicker noise can be used as a tool for determining the dominant scattering mechanism in graphene, although it was found that the resistance and noise can originate from different scattering potentials. Also, the flicker noise spectrum was shown to decompose into individual lorentzians at low temperatures (below ∼ 25 K), where the fluctuations of the resistance is supposedly coming from the random jumps of electrons between the conductive channel in the graphene flake and the nearby impurity states. Third, the transport properties of the bilayer/trilayer graphene structure were studied at different temperatures and different magnetic fields including the quantum Hall regime. Bilayer and trilayer parts of the sample revealed the signatures of the quantum Hall effect predicted theoretically. The transport through the interface between bilayer and trilayer parts was also investigated. Signatures of the interface resistance were seen, although the observed behaviour is not explained. Under high magnetic fields the properties of the interface longitudinal resistance were described qualitatively by the classic transport equations.

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Chamon, Cláudio de Carvalho. "Electronic conduction and noise in strongly correlated systems." Thesis, Massachusetts Institute of Technology, 1996. http://hdl.handle.net/1721.1/38772.

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Strait, Thomas J. "Comparison of noise performance of capacitive sensing amplifiers." Diss., Online access via UMI:, 2006.

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Books on the topic "Electronic noise"

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Fish, Peter J. Electronic Noise and Low Noise Design. London: Macmillan Education UK, 1993. http://dx.doi.org/10.1007/978-1-349-23060-0.

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Fish, Peter J. Electronic noise and low noise design. New York: McGraw Hill, 1994.

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Bruccoleri, Federico. Wideband low noise amplifiers exploiting thermal noise cancellation. Dordrecht: Springer, 2005.

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Motchenbacher, C. D. Low-noise electronic system design. New York: Wiley, 1993.

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Kogan, Sh. Electronic noise and fluctuations in solids. Cambridge, U.K: Cambridge University Press, 2008.

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Vergers, Charles A. Handbook of electrical noise: Measurement and technology. 2nd ed. Blue Ridge Summit, PA: Tab Professional and Reference Books, 1987.

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Van der Ziel Symposium on Quantum 1/f oise and other Low Frequency Fluctuations in Electronic Devices (8th 1998 St. Louis, Mo.). Quantum 1/f noise and other low frequency fluctuations in electronic devices: Seventh symposium : St. Louis, Missouri August 1998. Edited by Handel Peter H, Chung Alma L, and American Institute of Physics. Woodbury, N.Y: AIP Press, 1999.

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A, Balandin Alexander, ed. Noise and fluctuations control in electronic devices. Stevenson Ranch, Calif: American Scientific Publishers, 2002.

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Proudler, Graeme. Neidenoff's noise equivalent. Palo Alto, CA: Hewlett-Packard Laboratories, Technical Publications Department, 1996.

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Wilmshurst, T. H. Signal recovery from noise in electronic instrumentation. 2nd ed. Bristol [England]: A. Hilger, 1990.

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Book chapters on the topic "Electronic noise"

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Hamedi-Hagh, Sotoudeh. "Noise Analysis." In Computational Electronic Circuits, 337–90. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-75568-3_5.

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Barnes, John R. "Noise Sources, Noise Coupling Paths, and Noise Victims." In Robust Electronic Design Reference Book, 29–50. New York, NY: Springer US, 2004. http://dx.doi.org/10.1007/1-4020-7830-7_4.

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Fish, Peter J. "Intrinsic Noise." In Electronic Noise and Low Noise Design, 72–90. London: Macmillan Education UK, 1993. http://dx.doi.org/10.1007/978-1-349-23060-0_4.

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Fish, Peter J. "Noise Models." In Electronic Noise and Low Noise Design, 122–44. London: Macmillan Education UK, 1993. http://dx.doi.org/10.1007/978-1-349-23060-0_6.

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Băjenescu, Titu I., and Marius I. Bâzu. "Noise and reliability." In Reliability of Electronic Components, 329–38. Berlin, Heidelberg: Springer Berlin Heidelberg, 1999. http://dx.doi.org/10.1007/978-3-642-58505-0_11.

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Fish, Peter J. "Introduction." In Electronic Noise and Low Noise Design, 1–5. London: Macmillan Education UK, 1993. http://dx.doi.org/10.1007/978-1-349-23060-0_1.

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Fish, Peter J. "Random Signals." In Electronic Noise and Low Noise Design, 6–30. London: Macmillan Education UK, 1993. http://dx.doi.org/10.1007/978-1-349-23060-0_2.

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Fish, Peter J. "Noise Connected with Layout or Construction." In Electronic Noise and Low Noise Design, 31–71. London: Macmillan Education UK, 1993. http://dx.doi.org/10.1007/978-1-349-23060-0_3.

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Fish, Peter J. "Noise Circuit Analysis." In Electronic Noise and Low Noise Design, 91–121. London: Macmillan Education UK, 1993. http://dx.doi.org/10.1007/978-1-349-23060-0_5.

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Fish, Peter J. "Noise Performance Measurement." In Electronic Noise and Low Noise Design, 145–91. London: Macmillan Education UK, 1993. http://dx.doi.org/10.1007/978-1-349-23060-0_7.

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Conference papers on the topic "Electronic noise"

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Marinchio, H., G. Sabatini, L. Varani, C. Palermo, P. Shiktorov, E. Starikov, V. Gružinskis, et al. "Electronic noise in high electron-mobility transistors under photo-excitation conditions." In NOISE AND FLUCTUATIONS: 20th International Conference on Noice and Fluctuations (ICNF-2009). AIP, 2009. http://dx.doi.org/10.1063/1.3140463.

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Fumagalli, Laura. "Nanoscale electronic noise measurements." In NOISE AND FLUCTUATIONS: 18th International Conference on Noise and Fluctuations - ICNF 2005. AIP, 2005. http://dx.doi.org/10.1063/1.2036818.

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Klarin, Borislav, Peter Olbrich, Markus Resch, Thomas Resch, Stephan Brandl, and Hartwig Reindl. "Power Electronic Noise-Simulation Measurement Comparison." In Noise and Vibration Conference & Exhibition. 400 Commonwealth Drive, Warrendale, PA, United States: SAE International, 2019. http://dx.doi.org/10.4271/2019-01-1451.

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Deen, M. Jamal. "Noise in Advanced Electronic Devices and Circuits." In NOISE AND FLUCTUATIONS: 18th International Conference on Noise and Fluctuations - ICNF 2005. AIP, 2005. http://dx.doi.org/10.1063/1.2036687.

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Deen, M. J., O. Marinov, Massimo Macucci, and Giovanni Basso. "Low-Frequency Noise in Electronic Devices—Past, Present and Future." In NOISE AND FLUCTUATIONS: 20th International Conference on Noice and Fluctuations (ICNF-2009). AIP, 2009. http://dx.doi.org/10.1063/1.3140429.

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Rao, Sohan, Hari Reddy, and Chandan Ravi. "Identification of BSR Issues in Electronic Boards." In Noise and Vibration Conference & Exhibition. 400 Commonwealth Drive, Warrendale, PA, United States: SAE International, 2023. http://dx.doi.org/10.4271/2023-01-1092.

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<div class="section abstract"><div class="htmlview paragraph">Currently the world’s transportation sector is experiencing a paradigm shift towards electric mobility where electric and electronic components form an integral part of the vehicle. The heavy usage of electronic systems needs large size printed circuit (PCB) boards with multiple subcomponents connected to it. Such a complex electronic system when excited by dynamic loads, would lead to generation of uncomfortable transient rattle events between the parts. As a result, there is an increasing requirement to analyze these subsystems to eliminate any unpleasant noise generation mechanisms. In this study, a PCB has been considered for such an analysis. A linear transient analysis was carried out for a sine-sweep excitation. Risk and root cause analysis was performed, and critical locations were identified. Variation in parameters like material properties, connection stiffness, were considered and analyzed for the same. Finally, design modification iterations were performed in which the system behavior improved substantially. This study would provide a means to quantify the rattle events occurring due to the operating conditions and provide an insight about the performance of the component in the real-world operating conditions.</div></div>

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Afiatouni, Firooz, Behrooz Abiri, Angad Rekhi, Hooman Abediasl, Hossein Hashemi, and Ali Hajimiri. "Electronic laser phase noise reduction." In 2013 IEEE Radio Frequency Integrated Circuits Symposium (RFIC). IEEE, 2013. http://dx.doi.org/10.1109/rfic.2013.6569578.

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Lopez-Alonso, Jose M., Ruben Gonzalez-Moreno, and Javier Alda. "Noise in imaging systems: fixed pattern noise, electronic, and interference noise." In Second International Symposium on Fluctuations and Noise, edited by Peter Heszler. SPIE, 2004. http://dx.doi.org/10.1117/12.547092.

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Ferrari, Giorgio. "Novel Transimpedance amplifier for Noise Measurements on Bio-Electronic devices." In NOISE AND FLUCTUATIONS: 18th International Conference on Noise and Fluctuations - ICNF 2005. AIP, 2005. http://dx.doi.org/10.1063/1.2036836.

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Kuzmin, Leonid S., Igor A. Devyatov, and D. Golubev. "Cold-electron bolometer with electronic microrefrigeration and general noise analysis." In SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, edited by Mohammed N. Afsar. SPIE, 1998. http://dx.doi.org/10.1117/12.331165.

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Reports on the topic "Electronic noise"

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Leong, S. K., and Krishna Shenai. Low Energy/Low Noise Electronic Components for Mobile Platform Applications. Fort Belvoir, VA: Defense Technical Information Center, June 1997. http://dx.doi.org/10.21236/ada328360.

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van der Heijden, Joost. Optimizing electron temperature in quantum dot devices. QDevil ApS, March 2021. http://dx.doi.org/10.53109/ypdh3824.

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The performance and accuracy of quantum electronics is substantially degraded when the temperature of the electrons in the devices is too high. The electron temperature can be reduced with appropriate thermal anchoring and by filtering both the low frequency and radio frequency noise. Ultimately, for high performance filters the electron temperature can approach the phonon temperature (as measured by resistive thermometers) in a dilution refrigerator. In this application note, the method for measuring the electron temperature in a typical quantum electronics device using Coulomb blockade thermometry is described. This technique is applied to find the readily achievable electron temperature in the device when using the QFilter provided by QDevil. With our thermometry measurements, using a single GaAs/AlGaAs quantum dot in an optimized experimental setup, we determined an electron temperature of 28 ± 2 milli-Kelvin for a dilution refrigerator base temperature of 18 milli-Kelvin.

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Witte, James. PR-015-17608-R01 Assess and Identify Methods to Reduce Ultrasonic Noise Effects on Ultrasonic Meters. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), July 2019. http://dx.doi.org/10.55274/r0011603.

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Ultrasonic noise generated by aerodynamic noise attenuating control valves has been known to have an impact on ultrasonic flow meter performance when the noise characteristic is within the frequency range of the ultrasonic transducers and of great enough amplitude to interfere with ultrasonic signal detection by the flow meter electronics. The intent of this project was to demonstrate the effects of control-valve-generated ultrasonic noise on an ultrasonic flow meter. Flow meter performance characteristics observed when exposed to ultrasonic noise were to be identified, and different methods for potential mitigation of the problem were to be experimentally evaluated. Control valve noise characteristics have been previously evaluated by ultrasonic meter manufacturers and control valve manufacturers. However, the specific ultrasonic frequency spectrum characteristics, which are unique to each control valve noise attenuating trim, are proprietary information held by the manufacturers.

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Haddad, G. I. Low Power/Low Noise Electronics. Fort Belvoir, VA: Defense Technical Information Center, November 2001. http://dx.doi.org/10.21236/ada398416.

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Liu, Robert C. Quantum Noise in Mesoscopic Electron Transport. Fort Belvoir, VA: Defense Technical Information Center, October 1999. http://dx.doi.org/10.21236/ada370166.

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Itoh, Tatsuo. Low Power/Low Noise Electronics Technologies for Wireless Communications. Fort Belvoir, VA: Defense Technical Information Center, August 2001. http://dx.doi.org/10.21236/ada395598.

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Itoh, Tatsuo. Low Power/Low Noise Electronics Technologies for Wireless Communications. Fort Belvoir, VA: Defense Technical Information Center, January 2002. http://dx.doi.org/10.21236/ada406885.

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Panek, Jeffrey, Adrian Huth, and Benjamin Shwaiko. PR-312-22200-Z01 Isolation Valve - Improved GHG Leak Detection Summary of Initial Testing Results. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), July 2024. http://dx.doi.org/10.55274/r0000077.

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Abstract:

This project investigated and evaluated commercially available optical IR and acoustic technologies. The IR cameras were used to detect a temperature differential across the valve indicating a Joule-Thompson (JT) pressure drop and leak through the valve. Direct acoustically coupled instruments were used to detect "noise" generated from turbulence associated with through-valve leakage. In addition, other instruments were explored that had the potential to detect turbulence-induced vibrations. During the instrumentation evaluation, fugitive leak screening and detection methods for assessing through-valve leakage were also explored. IES completed a one-week laboratory and yard testing exercise on a single two- and eight-inch valve at the SoCal Gas Situation City facility in Pico Rivera, CA in November 2022. Noteworthy findings included the inability to detect a leak from valves that were previously in-service and known leakers. The reason for this has been hypothesized as improper valve stop position and/or debris in the valve that was removed to protect flow-rate measurement instrumentation in the test apparatus. Several instances of newly commissioned leaking valves have been shown to suffer from incorrect valve positioning and/or electronic transducer signal set points. Additional testing and data collection are needed to complete the initial test campaign. Outdoor testing could not be completed during the week due to resource limitations that precluded testing more than one eight-inch valve. The initial laboratory testing included one 2-inch test valve that had no discernable usage. An additional 2-inch valve was screened prior to lab testing, however neither valve produced a leak under the conditions in the lab (both valves failed prior to commissioning).

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Lewis, Nathan S., Rodney M. Goodman, and Robert H. Grubbs. A Conducting Polymer-Based Electronic Nose for Landmine Detection. Fort Belvoir, VA: Defense Technical Information Center, October 2001. http://dx.doi.org/10.21236/ada396394.

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Munger, C. Magnetic Johnson Noise Constraints on Electron Electric Dipole Moment Experiments. Office of Scientific and Technical Information (OSTI), November 2004. http://dx.doi.org/10.2172/839794.

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