Relevant bibliographies by topics / Electronic device testing

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Electronic device testing'

Author: Grafiati
Published: 28 June 2021
Last updated: 18 February 2022

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Journal articles on the topic "Electronic device testing"

1

Deaves, M. "On test [electronic device testing]." Manufacturing Engineer 82, no. 5 (October 1, 2003): 40–41. http://dx.doi.org/10.1049/me:20030508.

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Pan, Feng, Ruimin Chen, Yong Xiao, and Weiming Sun. "Electronic Voltage and Current Transformers Testing Device." Sensors 12, no. 1 (January 18, 2012): 1042–51. http://dx.doi.org/10.3390/s120101042.

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Fiala, Thomas G. S., David M. Wrightson, and Michael J. Yaremchuk. "An Electronic Device for Surgical Glove Testing." Plastic and Reconstructive Surgery 92, no. 6 (November 1993): 1192–94. http://dx.doi.org/10.1097/00006534-199311000-00033.

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Tada, Tetsuo, and Keiichi Sawada. "4720671 Semiconductor device testing device." Microelectronics Reliability 28, no. 4 (January 1988): 669. http://dx.doi.org/10.1016/0026-2714(88)90273-9.

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Simakov, A. V., V. V. Kharlamov, and V. I. Skorokhodov. "The overcurrent protection characteristics testing digital substation intelligent electric devices." Omsk Scientific Bulletin, no. 176 (2021): 46–51. http://dx.doi.org/10.25206/1813-8225-2021-176-46-51.

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The electric power industry digital transformation features and the intelligent electronic devices (IEDs) introduction in the low-voltage circuits of power stations and substations are considered. The analysis of normative documents and standards is carried out. The features of scheduled maintenance of relay protection and automation devices are determined, the possibilities and prospects of organizing condition-based maintenance are considered. The mandatory steps required for any type of maintenance are defined. A method for checking the electrical and time characteristics of the overcurrent protection of an intelligent electronic device is proposed. The device is designed in accordance with the IEC-61850 standard and operates in the local area network of a digital substation of architecture III
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Paunovic, Nemanja, Jelena Kovacevic, and Ivan Resetar. "A methodology for testing complex professional electronic systems." Serbian Journal of Electrical Engineering 9, no. 1 (2012): 71–80. http://dx.doi.org/10.2298/sjee1201071p.

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This paper presents a testing methodology for complex professional electronic systems, based on automation and black box testing, divided into 4 testing phases. The goal is full automation of the testing process, making the process of testing as reliable as possible, and cutting testing time and human interference to a minimum. Testing is performed during production, with an emphasis on the functionality of the device. All verifications must be executed before the device is launched on the market.
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Gary, Sarah T., Antonio V. Otero, Kenneth G. Faulkner, and Nadeeka R. Dias. "Validation and equivalency of electronic clinical outcomes assessment systems." International Journal of Clinical Trials 7, no. 4 (October 20, 2020): 271. http://dx.doi.org/10.18203/2349-3259.ijct20204485.

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<p>The US food and drug administration (FDA) has long called for clinical outcomes assessments (COA), such as patient-reported outcomes (PRO), to be ‘fit-for-purpose’ meaning the COA has been validated to support the context of use. The FDA’s recent patient-focused drug development guidance series has renewed the importance of ensuring that COA is ‘fit-for-purpose’ and valid. In addition, the FDA has recommended that COA be collected electronically and that the electronic (eCOA) system and devices also be validated. Advancing technology requires eCOA systems and devices to evolve; eCOA devices may change over time. As bring your own device (BYOD) models gain popularity and acceptance, devices may also be mixed within trials. Changes in eCOA devices or mixing devices may require equivalence testing to prove validity across platforms. The aim of this article is to provide an overview of the different types of validation at both the assessment level and the eCOA system (device) level to help clinical trial sponsors determine the appropriate level of validation or equivalence testing required for COA used in their clinical trials. </p>
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Sherf, Z., A. Katz, P. Hopstone, A. Edelstein, I. Yogev, and D. Peleg. "Aspects of the Acoustic Testing of an Electronic System: Acoustic Versus Vibration Testing." Journal of the IEST 47, no. 1 (September 14, 2004): 57–66. http://dx.doi.org/10.17764/jiet.47.1.b81113pn56114774.

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In this paper, the vibratory responses excited in an electronic device during a vibration test and an acoustic test are compared. It was found that the responses differ significantly for items mounted on vibration isolators. Under certain circumstances (stiff mounting of the elements in the device and for a certain vibration axis), a higher similarity can be noted between the vibration and acoustic tests. Due to the lack of excitation above 2000 Hz during the vibration testing, failures caused by excitation in this range are not detected, which is significant for small components. The higher responses in the low frequency range during the vibration test can induce unrealistic failures. Application of the vibration test separately for individual axes as opposed to the distributed loading applied during the acoustic test can also result in undetected failures.
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Cheng, Ze, Zhao Long Xuan, Wei Wang, and Mao Sen Hao. "Test Method for Electronic Device on Condition of Small Sampling." Applied Mechanics and Materials 347-350 (August 2013): 525–28. http://dx.doi.org/10.4028/www.scientific.net/amm.347-350.525.

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The traditional quality testing method does not apply for the new electronic device which have characters that high-value and small-count, take advantage of the small sampling theory, we can reduce the number of test sample significantly by using the Bayes method. In the processing of the experimental data, we can improve the accuracy of the quality assessment of electronic devices by using of the Bayes method and make full use the prior information.
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Burnell, P. K. P., A. Malton, K. Reavill, and M. H. E. Ball. "Design, validation and initial testing of the Electronic LungTM device." Journal of Aerosol Science 29, no. 8 (September 1998): 1011–25. http://dx.doi.org/10.1016/s0021-8502(97)10039-8.

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Dissertations / Theses on the topic "Electronic device testing"

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Lindström, Hannes, and Gustav Marstorp. "Security Testing of an OBD-II Connected IoT Device." Thesis, KTH, Skolan för elektroteknik och datavetenskap (EECS), 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-239367.

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The Internet of Things (IoT) is a rapidly growing network. As society begins to trust the devices in the IoT with increasingly complex tasks, issues regarding the security of these devices are of high priority. An example of an IoT-device in which failure of security could be fatal, is the Telia Sense. Telia Sense is an OBD-II dongle which together with a mobile application connects a car to a smartphone.In this paper, the discoveries that was made during security testing of Telia Sense will be discussed. The system was investigated through a black box perspective. Primarily, a model of the system was produced. Threats were then identified, ranked and tested accordingly.No major vulnerabilities were found. The results all indicated that Telia Sense is a well secured system. The main reasons to this is the fact that the device has very limited functionality and its communications are bounded. Even though no major vulnerabilities were found, this paper can still be used as a guide for future testing of security in IoT devices.
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Powley, Nicholas R. (Nicholas Ransom) 1982. "A device for testing the electronic and mechanical properties of conducting polymers with electron paramagnetic resonance spectroscopy." Thesis, Massachusetts Institute of Technology, 2004. http://hdl.handle.net/1721.1/32776.

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Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2004.
Includes bibliographical references (leaf 35).
Conducting polymers have the potential to serve the technical and commercial communities with novel actuators, sensors, and biomimetic devices. The conjugated structures of these polymers and the addition of dopants enable conduction. [1] One current goal in the conducting polymer field is to observe and understand the events by which these polymers carryout their active mechanical functions (contraction and expansion) upon the application of a potential. This thesis presents the design and a prototype of a new device for investigating the relationship between the mechanical and electronic properties of conducting polymers with EPR Spectroscopy. The performance of the testing device was explored with a controlled experiment. The results of this experiment suggest that the response of conducting polymer actuators to mechanical inputs can be examined with EPR Spectroscopy.
by Nicholas R. Powley.
S.B.
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Domènech, Gil Guillem. "Advances in semiconducting nanowires for gas sensing: synthesis, device testing, integration and electronic nose fabrication." Doctoral thesis, Universitat de Barcelona, 2019. http://hdl.handle.net/10803/668365.

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The work presented in this dissertation is focused on the fabrication, integration and test of chemoresistive gas sensor devices and systems based on semiconducting nanowires (NWs). The first objective of this dissertation was to grow monocrystalline In2O3 and Ga2O3 NWs via the vapor-liquid-solid mechanism using a chemical vapor deposition furnace and solid precursors. Subsequently devices based on individual NWs were fabricated, contacted on top of microhotplates using Focused Electron Beam Induced Deposition (FEBID), and their gas sensing properties were characterized. The gas sensors based on individual In2O3 NWs present considerable response towards ethanol at 300 ºC, with a response time of about 4 minutes. On the other hand, the gas sensors based on individual Ga2O3 NWs showed high selectivity towards relative humidity at room temperature, with resistance variations up to 90% in times as short as 2 minutes, and with minimal response to other gases (NO2, CO, ethanol and H2). This behavior is completely different from that reported on this material and is a direct consequence of the NW growth method, which gives rise to a carbon shell around the NWs. Furthermore, the sensing behavior ressembles that of carbon-containing materials.. A second objective was to deepen into methodologies to integrate the sensing material in the substrates where the gas sensing devices are fabricated, with the aim of simplifying the integration procedures and increasing the throughput. With this in mind, dielectrophoretic alignment of NWs was the first methodology proposed to fabricate chemoresistors based on arrays of individual WO3 NWs. The maximum gas response of the fabricated arrays of individual NWs was towards 5 ppm of NO2 for the pristine and towards 100 ppm of EtOH for the Pt-functionalized WO3 NWs, respectively. This higher response of the Pt-functionalized WO3 NWs-based gas sensors is related to the surface decoration of these NWs, which increases the amount of oxygen adsorbed species at their surface, allowing EtOH molecules to be more easily adsorbed than on pristine NWs. The second approach proposed for contacting individual SnO2 NWs on top of suspended microhotplates was Electron Beam Lithography (EBL) in combination with lift-off. The method allows fabricating several devices sequentially but without breaking the vacuum of the EBL system and required optimization of the holder for spinning and of the electron dose used to modify the photoresist properties. The gas characterization of these devices showed higher resistance variations than that obtained for the reference fabrication technique, FEBID. This superior behavior can be the result of the better electrical characteristics of the Ti/Pt contacts in front of the FEBID Pt-deposition. This demonstrates the potentiality of this techniques for contacting individual NWs on top of micromembranes. The third objective was, to a certain point, a natural extension of the device integration activity when considering one of the major drawbacks of chemoresistors: their lack of selectivity. For this, SnO2, WO3 and Ge NWs, have been grown on well-defined and pre-specified regions of one single chip, allowing their simultaneous operation. Here, NO2, CO and relative humidity (RH), diluted in dry synthetic air, have been tested. The calibration of each individual sensor has been carried out exposing the whole chip to the individual gases but with only this particular sensor heated and biased, while the others were unheated and unbiased. This has allowed determining the optimal operation conditions for each sensor. Next, at these optimal temperatures, all the sensors have been tested, simultaneously, towards each gas specie alone. Finally, tests of the three sensors, operating simultaneously, towards mixtures of the three gases were performed. The data from all the mentioned measurements have been treated according to the Principal Component Analysis (PCA) methodology and the results demonstrate that the fabricated sensor system can discriminate and quantify the concentration of the three different studied analytes. The three sensors, made of three different materials and operating simultaneously, constitute an electronic nose, which we here call nano electronic nose.
Aquesta tesi doctoral està enfocada al desenvolupament de dispositius i sistemes sensors de gas basats en nanofils semiconductors monocristal·lins. El primer objectiu aconseguit és el creixement de nanofils d’In2O3 i de Ga2O3 utilitzant un forn pel dipòsit químic en fase vapor. Els nanofils fabricats s’han transferit a xips amb micromembranes suspeses amb calefactor i nanofils individuals s’han contactat amb els seus elèctrodes, emprant el dipòsit assistit per feixos d’electrons. Els nanofils d’In2O3 mostren una resposta considerablement selectiva enfront d’etanol a partir dels 200 ºC i els de Ga2O3 són molt selectius a la humitat relativa a temperatura ambient, fruit del mètode de creixement. Un segon objectiu d’aquesta tesi ha estat explorar dos mètodes d’integració de nanofils individuals: la dielectroforesi, per alinear nanofils de WO3, que han mostrat respostes enfront d’etanol i NO2, a 250 ºC, i la litografia per feixos d’electrons, per contactar nanofils de SnO2 sobre microplataformes calefactores suspeses, que han mostrat respostes satisfactòries enfront d’amoníac a 200 ºC. En ambdós casos s’ha demostrat la viabilitat d’aquestes tècniques. L’últim objectiu ha estat la fabricació i caracterització d’un nas electrònic basat en xarxes de nanofils de SnO2, WO3 i Ge integrades en cadascuna en una micromembrana d’un mateix xip. Aquests nanofils s’han fet créixer directament en regions localitzades i predefinides del xip, les micromembranes, integrats directament en ell, evitant la necessitat de transferir-los després de fer-los créixer. Primer s’ha realitzat el calibratge de cada sensor individual enfront de tres gasos individualment, després enfront de tres gasos simultàniament i, finalment, els tres sensors s’han fet funcionar alhora enfront dels tres gasos. Les dades de totes les mesures s’han tractat segons la metodologia d’anàlisi de components principals i els resultats demostren que aquest sistema és capaç de discriminar entre diverses mescles de NO2 i CO diluïts en aire sintètic sota diferents nivells d’humitat relativa. Els tres sensors, formats per els tres materials diferents i funcionant simultàniament, constitueixen un nano nas electrònic.
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Gomes, Ashen. "Testing and analysis of an intelligent electronic device (IED) prototype for MTDC overhead line application." Thesis, KTH, Skolan för elektroteknik och datavetenskap (EECS), 2020. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-286780.

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A key problem faced with the implementation of a multi-terminal direct current (MTDC) grid is fault mitigation. One method extensively researched in mitigating a fault in MTDC is to use protection intelligent electronic devices (IEDs) and fast direct current circuit breakers (DCCBs). The IEDs are able to detect and identify faults with fault algorithms. In this study overhead line MTDC systems are investigated to identify the best algorithm for overhead line (OHL) MTDC fault mitigation and the resulting algorithm is tested on a protection IED. Three models: short line, long line and combined line models are developed with varying DC line lengths on the software PSCAD and are analysed under line to line (L-L) and line to ground (L-G) faults with multiple fault impedance at a variety of fault locations. The voltage derivative algorithm has performed the best in detecting and identifying faults under OHL conditions. However, its performance declines with the increase of length of DC lines of the MTDC. Therefore, transient based algorithms were also tested. They are a better _t for remote faults compared to voltage derivative algorithms. However, they perform poorly for close faults. The critical threshold for fault detection is obtained through the algorithms and are implemented to the IED. A waveform generator will simulate faults and the IED is tested with the critical threshold obtained. The IED performed as expected and produced results similar to the software analysis. The critical threshold obtained through the algorithm was applicable to all DC lines of MTDC grid. Wide adaptation of MTDC is expected and this will increase complexity in the grid network and modelling of it. Therefore, new lines implemented to MTDC grids may have to identify their critical protection threshold with simplified MTDC grid models. Evidence towards the possibility of modelling a point-to-point high voltage direct current (HVDC) system to identify threshold values can be obtained from this study as the results suggest that the maximum derivative values are highest for internal faults rather than external faults.
Ett centralt problem inför implementeringen av ett multiterminalt DCnät (MTDC-nät) är feldetektering och bortkoppling av fel. En metod som har  undersökts mycket för att detektera och bortkoppla ett fel i MTDC-nät är att  använda en skydds-IED (intelligent electronic device) och likströmsbrytare (eng: direct current circuit breakers, DCCBs). En IED kan upptäcka och identifiera fel med hjälp av skyddsalgoritmer. Denna studie syftar till att identifiera den bästa algoritmen för feldetektering i luftledningar i MTDC-nät och den resulterande algoritmen testas på en skydds-IED. Tre linjemodeller: korta, långa och kombinerade implementeras i programvaran PSCAD och simuleras under pol-pol-fel och pol-jord-fel med era felimpedanser på en mängd olika felplatser. Spänningsderivataalgoritmen har fungerat bäst för att upptäcka och identifiera fel i luftledningar. Men dess prestanda minskar med längden hos DC-linjernas för MTDC. Därför testades också transientalgoritmer. De passar bättre för fjärrfel jämfört med algoritmer baserade på spänningsderivata. De fungerar dock dåligt för närliggande fel. Den kritiska tröskeln för feldetektering erhölls genom algoritmerna och implementerades i IEDn. En vågformgenerator simulerade fel och IEDn testades med den kritiska tröskel som erhölls. IEDn fungerade som förväntat och producerade resultat som liknar programvarans analys. Den kritiska tröskeln som erhölls genom algoritmen var giltig för alla DC-linjer i nätet. Bred anpassning av MTDC förväntas och detta kommer att öka komplexiteten i nätverket och dess modellering. Därför kan nya linjer implementerade för MTDC-nät behöva identifiera dess kritiska skyddströskel utan att modellera hela nätet. Denna studie indikerar att det är möjligt att modellera ett punkt-till-punkt HVDC-system för att identifiera tröskelvärden för ett MTDC-nät eftersom resultaten antyder att de maximala derivatavärdena är högst för interna fel snarare än för externa fel.
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Cintura, Manuel. "An Embedded Data Logger for In-Vehicle Testing." Master's thesis, Alma Mater Studiorum - Università di Bologna, 2021. http://amslaurea.unibo.it/23841/.

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This thesis describes an embedded data logger project, composed of software part (in C++ language) and hardware part (Raspberry Pi). It is illustrated the whole procedure from the start of the project with requirements to the end with the experimental results and validation phase. The device is able to acquire, in a synchronous way, videos, CAN and Serial logs from the vehicle under test.
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Kuřímský, Lukáš. "Zařízení pro automatizovaná testování řídicích jednotek plynových kotlů." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2021. http://www.nusl.cz/ntk/nusl-442519.

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This diploma thesis deals with the design and implementation of a computer-controlled device for testing gas boiler control units, especially in the development phase. The reason for creating a test facility is the inadequacy of older test systems and the automation of existing testing. The test device in development consists of individual different cards. Each of the cards inserted into the motherboard performs its function in the system. Each of the cards has a special functionality which simulates the real conditions of the developed product. The basis of most cards is a microcontroller with a Cortex-M core, which communicates with the connected computer using the MODBUS protocol on the RS-485 communication interface. All cards on the bus are connected in parallel and behaves as a SLAVE, while the computer behaves as a MASTER and requests data or sends commands to the cards. The cards represent status switches (switching sensors), resistance and analog temperature sensors, PWM inputs and outputs (for simulation of feedback pumps or flow meters with pulse output). The cards also include a flame simulator, which reliably simulates the electrical properties of the flame and at the same time acts as a fan simulator. The input of the control unit is taken care of by the input card, which is intended for digital detection of the voltage presence in the range of 5 to 230 V DC and AC. Simultaneously, a card for connecting the power supply at zero voltage and disconnecting at zero current is created to supply the tested device with alternating voltage. A schematic diagram was designed or simulated for each card, then the function was verified and on this basis the whole card was created, including the microcontroller firmware. The most suitable solution and function of each card is carefully described and evaluated. All the requirements of the assignment within the work were met and the whole test equipment was manufactured and verified in four versions. In the future, the device is ready for the implementation of an automatic flame simulator and other improvements of individual module cards.
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Ceylan, Batuhan. "Evaluating APS Ecosystem Security : Novel IoT Enabled Medical Platform for Diabetes Patients." Thesis, KTH, Skolan för elektroteknik och datavetenskap (EECS), 2020. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-292735.

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Computing technology has been getting more reliable and cheaper every year for the past several decades. Consequently, IoT devices have now become a part of medical technology. One example of this is a new open-source technology that has emerged for type-1 diabetes patients, which regulates the patients’ blood glucose levels. One component of this open-source system is AndroidAPS, a mobile application that manages and controls the system by communicating with the two other components: a blood glucose sensor and an insulin pump. Another component is Nightscout, a web application for monitoring T1D patients. Together they form the APS ecosystem that automatically i) reads blood glucose values, ii) syncs the data with Nightscout, iii) stores patient information into Nightscout database, iv) calculates optimal treatment plan, and v) regulates pump for the ideal insulin intake. The whole system bears several critical assets to guarantee patient health. In this thesis, the security of a representative APS ecosystem is studied. We found 5 critical vulnerabilities in the ecosystem: 1) an XSS vulnerability in the web application due to ineffective input sanitization which lead to stealing administrator password from browser cache, 2) highly sensitive patient data is open to public by default, 3) the web application login mechanism, where all system data is managed, is weak against password guessing attacks together with 4) insecure GET requests used for authentication, and lastly 5) any type of database hijack does not trigger any alarms for Nightscout. Successful attacks result in malicious values synchronized from Nightscout to tamper correct insulin delivery calculations. Possible attack scenarios, devised from existing vulnerabilities in this work, show how an attacker can physically harm their victims through their internet-connected insulin pump.
Datorteknik har blivit mer pålitlig och billigare varje år under de senaste decennierna. Följaktligen har IoT-enheter nu blivit en del av medicinsk teknik. Ett exempel på detta är en ny öppen källkodsteknik som har utvecklats för typ 1- diabetespatienter, som reglerar patienternas blodsockernivåer. En komponent i detta öppen källkodssystem är AndroidAPS, en mobilapplikation som hanterar och kontrollerar systemet genom att kommunicera med de två andra komponenterna: en blodsockersensor och en insulinpump. En annan komponent är Nightscout, en webbapplikation för övervakning av T1D-patienter. Tillsammans bildar de APSekosystemet som automatiskt i) läser blodsockervärden, ii) synkroniserar data med Nightscout, iii) lagrar patientinformation i Nightscout-databasen, iv) beräknar optimal behandlingsplan och v) reglerar pumpen för perfekt insulinintag. Hela systemet har flera kritiska tillgångar för att garantera patientens hälsa. I denna avhandling studeras säkerheten för ett representativt APS-ekosystem. Vi hittade 5 kritiska sårbarheter i ekosystemet: 1) en XSS-sårbarhet i webbapplikationen på grund av ineffektiv sanering av ingångar som leder till att stjäla administratörslösenord från webbläsarens cache, 2) mycket känsliga patientdata är öppna för allmänheten som standard, 3) webben applikationsinloggningsmekanism, där all systemdata hanteras, är svag mot gissningar av lösenord tillsammans med 4) osäkra GET-förfrågningar som används för autentisering, och slutligen 5) någon typ av databaskapning utlöser inga larm för Nightscout. Framgångsrika attacker resulterar i skadliga värden som synkroniseras från Nightscout för att manipulera korrekta insulinleveransberäkningar. Möjliga attackscenarier, utformade utifrån befintliga sårbarheter i detta arbete, visar hur en angripare fysiskt kan skada sina offer genom sin internetanslutna insulinpump.
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Thong, John Thiam Leong. "Electron beam testing technology for high-speed device characterisation." Thesis, University of Cambridge, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.316815.

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Gosavi, Mridula. "Reliability testing and modeling of linear image sensor devices." Diss., Online access via UMI:, 2006.

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Yang, Jin. "Quality inspection and reliability study of solder bumps in packaged electronic devices [electronic resource] : using laser ultrasound and finite element methods." Diss., Georgia Institute of Technology, 2008. http://hdl.handle.net/1853/26593.

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Consumer demands are driving the current trend in the microelectronics industry to make electronic products that are miniature, fast, compact, high-density, reliable and low-cost. The use of surface mount devices (SMDs) has helped to decrease the size of electronic packages through the use of solder bump interconnections between the devices and the substrates/printed wiring boards (PWBs). Solder bumps act as not only mechanical, but also electrical interconnections between the device and the substrate/PWB. Common manufacturing defects ¨C such as open, cracked, missing, and misaligned solder bumps ¨C are difficult to detect because solder bumps are hidden between the device and the substrate/PWB after assembly. The reliability of packaged electronic devices in storage and usage is a major concern in the microelectronics industry. Therefore, quality inspection of solder bumps has become a critical process in the microelectronics industry to help ensure product quality and reliability. In this thesis, a methodology for quality evaluation and reliability study of solder bumps in electronic packages has been developed using the non-destructive and non-contact laser ultrasound-interferometric technique, finite element and statistical methods in this research work. This methodology includes the following aspects: 1) inspection pattern ¨C specific inspection patterns are created according to inspection purpose and package formats, 2) laser pulse energy density calibration ¨C specific laser pulse power and excitation laser spot size are selected in terms of package formats, 3) processing and analysis methods, including integrated analytical, finite element and experimental modal analyses approach, advanced signal processing methods and statistical analysis method, 4) approach combining modal analysis and advanced signal processing to improve measurement sensitivity of laser ultrasound-interferometric inspection technique, and 5) calibration curve using energy based simulation method and laser ultrasound inspection technique to predict thermomechanical reliability of solder bumps in electronic packages. Because of the successful completion of the research objectives, the system has been used to evaluate a broad range of solder bump defects in a variety of packaged electronic devices. The development of this system will help tremendously to improve the quality and reliability of electronic packages.
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Books on the topic "Electronic device testing"

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Skinner, A. J. Long-term results of accelerated life-tests on optocoupler devices. Leatherhead, Surrey, England: ERA Technology, 1992.

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1943-, Agrawal Vishwani D., ed. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Boston: Kluwer Academic, 2000.

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International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics (1997 Kiev, Ukraine). International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics: 13-15 May 1997, Kiev, Ukraine. Edited by Svechnikov Sergeĭ Vasilʹevich, Valakh M. I͡A︡, SPIE Ukraine Chapter, Ukrainian Physical Society, and Society of Photo-optical Instrumentation Engineers. Bellingham, Wash., USA: SPIE, 1998.

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Vasilʹevich, Svechnikov Sergeĭ, Valakh M. I͡A︡, SPIE Ukraine Chapter, International Association of the Academies of Sciences., and Society of Photo-optical Instrumentation Engineers., eds. International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: [proceedings] 11-13 May, 1995, Kiev, Ukraine. Bellingham, Wash: SPIE, 1995.

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Guide to test methods, performance requirements, and installation practices for electronic sirens used on law enforcement vehicles. Washington, DC: U.S. Dept. of Justice, Office of Justice Programs, National Institute of Justice, 2000.

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Wagner, Randall. Guide to test methods, performance requirements, and installation practices for electronic sirens used on law enforcement vehicles. Washington, DC: U.S. Dept. of Justice, Office of Justice Programs, National Institute of Justice, 2000.

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Commission, United States International Trade. In the matter of certain hardware logic emulation systems and components thereof. Washington, DC: U.S. International Trade Commission, 1996.

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Commission, United States International Trade. In the matter of certain hardware logic emulation systems and components thereof. Washington, DC: U.S. International Trade Commission, 1998.

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ESD: Circuits and devices. Hoboken, NJ: John Wiley, 2006.

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Bryant, Richard W. Fiber-optic test equipment: A worldwide analysis. Norwalk, CT: Business Communications Co., 1993.

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Book chapters on the topic "Electronic device testing"

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Takishita, Y., H. Kino, S. Yamaguchi, A. Iwasaki, and N. Yamamoto. "Development of High-Speed Ultrasonic Testing Device Using Electronic Scanning." In Acoustical Imaging, 799–804. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4419-8772-3_129.

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Hao, Xianpeng, Ranfeng Zhang, Xine Li, and Mengmeng Wang. "Design of Controlling System in Multi-function Durability Testing Device for Vehicle Vacuum Booster with Brake Master Cylinder." In Advances in Mechanical and Electronic Engineering, 563–68. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-31507-7_89.

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Banerjee, P., S. Pandey, A. K. Srivastava, and D. Lee. "Testing and Validation of Synchrophasor Devices and Applications." In Power Electronics and Power Systems, 41–75. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-89378-5_3.

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Fukuda, Mitsuo. "Reliability Testing of Semiconductor Optical Devices." In Materials and Reliability Handbook for Semiconductor Optical and Electron Devices, 3–17. New York, NY: Springer New York, 2012. http://dx.doi.org/10.1007/978-1-4614-4337-7_1.

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Penhaker, Marek, and Jan Kijonka. "Invasive Blood Pressure Simulator Electronics Device Bed Side Monitor Testing." In Lecture Notes in Electrical Engineering, 823–30. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-21747-0_106.

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Zhuravlev, Yu E., A. A. Bakharev, A. N. Matlashov, V. Yu Slobodchikov, I. D. Velt, S. L. Nikulin, and R. V. Kalashnikov. "Application of DC-SQUID Magnetometers for Nondestructive Testing of Multilayer Electronic Cards." In Superconducting Devices and Their Applications, 581–83. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-77457-7_102.

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Tripathi, Suman Lata. "Design for Testability of High-Speed Advance Multipliers." In AI Techniques for Reliability Prediction for Electronic Components, 175–90. IGI Global, 2020. http://dx.doi.org/10.4018/978-1-7998-1464-1.ch010.

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An efficient design for testability (DFT) has been a major thrust of area for today's VLSI engineers. A poorly designed DFT would result in losses for manufacturers with a considerable rework for the designers. BIST (built-in self-test), one of the promising DFT techniques, is rapidly modifying with the advances in technology as the device shrinks. The increasing complexities of the hardware have shifted the trend to include BISTs in high performance circuitry for offline as well as online testing. Work done here involves testing a circuit under test (CUT) with built in response analyser and vector generator with a monitor to control all the activities.
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Ross, John, Igor Schreiber, and Marcel O. Vlad. "Computations by Means of Macroscopic Chemical Kinetics." In Determination of Complex Reaction Mechanisms. Oxford University Press, 2006. http://dx.doi.org/10.1093/oso/9780195178685.003.0006.

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The topic of this chapter may seem like a digression from methods and approaches to reaction mechanisms, but it is not; it is an introduction to it. We worked on both topics for some time and there is a basic connection. Think of an electronic device and ask: how are the logic functions of this device determined? Electronic inputs (voltages and currents) are applied and outputs are measured. A truth table is constructed and from this table the logic functions of the device, and at times some of its components, may be inferred. The device is not subjected to the approach toward a chemical mechanism described in the previous chapter, of taking the device apart and testing its simplest components. (That may have to be done sometimes but is to be avoided if possible.) Can such an approach be applicable to chemical systems? We show this to be the case by discussing the implementation of logic and computational devices, both sequential machines such as a universal Turing machine (hand computers, laptops) and parallel machines, by means of macroscopic kinetics; by giving a brief comparison with neural networks; by showing the presence of such devices in chemical and biochemical reaction systems; and by presenting some confirming experiments. The next step is clear: if macroscopic chemical kinetics can carry out these electronic functions, then there are likely to be new approaches possible for the determination of complex reaction mechanisms, analogs of such determinations for electronic components. The discussion in the remainder of this chapter is devoted to illustrations of these topics; it can be skipped, except the last paragraph, without loss of continuity with chapter 5 and beyond. A neuron is either on or off depending on the signals it has received. A chemical neuron is a similar device.
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"Molecular Self-Assembly, Device Construction, and Testing." In Molecular Electronics, 229–50. WORLD SCIENTIFIC, 2003. http://dx.doi.org/10.1142/9789812385321_0004.

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"Robustness testing method for intelligent electronic devices." In Electronics and Electrical Engineering, 87–94. CRC Press, 2015. http://dx.doi.org/10.1201/b18443-17.

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Conference papers on the topic "Electronic device testing"

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Goodfriend, Leon. "Automatic processing of ultrasound images for nondestructive testing." In Electronic Imaging Device Engineering, edited by Donald W. Braggins. SPIE, 1993. http://dx.doi.org/10.1117/12.164859.

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Butin, V., A. Butina, and F. Chubrukov. "Unique features of electronic device testing using NI-technologies." In 2015 International Siberian Conference on Control and Communications (SIBCON). IEEE, 2015. http://dx.doi.org/10.1109/sibcon.2015.7147314.

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Zhang, T. Y., and Y. L. Zhu. "Finite state machine technology in intelligent electronic device interoperability testing applications." In International Conference on Computer Science and Systems Engineering. Southampton, UK: WIT Press, 2015. http://dx.doi.org/10.2495/csse140761.

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Klein, Steven A., Aleksandar Aleksov, Vijay Subramanian, Rajendra Dias, Pramod Malatkar, and Ravi Mahajan. "Mechanical Testing for Stretchable Electronics." In ASME 2016 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/imece2016-68215.

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Stretchable electronics have been a subject of increased research over the past decade [1–3]. Although stretchable electronic devices are a relatively new area for the semiconductor/electronics industries, recent market research indicates the market could be worth more than 900 million dollars by 2023 [4]. At CES (Consumer Electronics Show) in January 2016, two commercial patches were announced which attach to the skin to measure information about the user’s vitals and environmental conditions [5]. One of these measures the sun exposure of the user with a UV sensitive dye — which can communicate with the user’s cell phone to track the user’s sun exposure. Another device is a re-usable flexible patch which measures cardiac activity, muscle activity, galvanic skin response, and user’s motion. These are just two examples of the many devices that will be developed in the coming years for consumer and medical use. This paper investigates mechanical testing methods designed to test the stretching capabilities of potential products across the electronics industry to help quantify and understand the mechanical integrity, response, and the reliability of these devices. Typically, the devices consist of stiff modules connected by stretchable traces [6]. They require electrical and mechanical connectivity between the modules to function. In some cases, these devices will be subject to bi-axial and/or cyclic mechanical strain, especially for wearable applications. The ability to replicate these mechanical strains and understand their effect on the function of the devices is critical to meet performance, process and reliability requirements. There has been a test method proposed recently for harsh / high-rate testing (shock) of stretchable electronics [7]. The focus of the approach presented in the paper aims to simulate expected user conditions in the consumer and medical fields, whereas earlier research was focused on shock testing. In this paper, methods for simulating bi-axial and out-of-plane strains similar to what may occur in a wearable device on the human body are proposed. Electrical and / or optical monitoring (among other methods) can be used to determine cycles to failure depending on expected failure modes. Failure modes can include trace damage in stretchable regions, trace damage in functional component regions, or bulk stretchable material damage, among others. Three different methods of applying mechanical strain are described, including a stretchable air bladder method, membrane test method, and lateral expansion method. This work will describe a prototype of the air bladder method with initial results of the testing for example devices. The system utilizes an expandable bladder to roughly simulate the expansion of muscles in the human body. Besides strain and # of cycles, other variables such as humidity, temperature, ultraviolet exposure, and others can be utilized to determine their effect on the mechanical and electrical reliability of the devices.
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An, Yuan, Chun-peng Song, Rong-jun Kuang, and Guang Jin. "Research on the the device of non-angular vibration for opto-electronic platform." In 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, edited by Xiangang Luo and Georg von Freymann. SPIE, 2010. http://dx.doi.org/10.1117/12.866834.

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Kelly, Gerard A., Jeff M. Punch, and Suresh Goyal. "The Dynamics of a Small-Scale Portable Electronics Device Under Impact Stimuli." In ASME 2006 International Mechanical Engineering Congress and Exposition. ASMEDC, 2006. http://dx.doi.org/10.1115/imece2006-14371.

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The reliability of portable electronic devices is of critical importance due to the consumer boom in mobile telephony in recent years. Impact is a key driver of failure in portable electronics and, in current design practice, extensive testing is used in conjunction with finite element simulations to ensure product reliability under impact stimuli. Testing is time-consuming and expensive – both free-drop and constrained drop tests are usually applied – and simulation techniques are very computationally intensive. The response of portable electronic devices to impact is currently not well understood, and there is clear need for investigation into the range of acceleration levels experienced by a representative model of a portable electronic device on impact. In this paper, free-drop testing was carried out on test vehicles representative of a typical mobile phone in order to acquire acceleration data from impact events. Drop test vehicles from Nylon and aluminium were used to provide a means of comparison for diverse material properties. The primary conclusion was that the dynamics of each drop event were highly sensitive to the initial conditions of the drop test, which was evident from wide variances in the acceleration data.
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Maharry, Aaron, Luis A. Valenzuela, James F. Buckwalter, and Clint L. Schow. "A PCB Packaging Platform Enabling 100+ Gbaud Optoelectronic Device Testing." In 2021 IEEE 71st Electronic Components and Technology Conference (ECTC). IEEE, 2021. http://dx.doi.org/10.1109/ectc32696.2021.00214.

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Sack, Martin, and Georg Mueller. "Testing of a modular over-voltage trigger device for marx generators." In 2014 International Conference on Optimization of Electrical and Electronic Equipment (OPTIM). IEEE, 2014. http://dx.doi.org/10.1109/optim.2014.6850892.

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Kim, Eung-Sang, and Dae-Won Kim. "Performance testing of Grid-connected photovoltaic inverter based on an integrated electronic protection device." In 2009 Transmission & Distribution Conference & Exposition: Asia and Pacific. IEEE, 2009. http://dx.doi.org/10.1109/td-asia.2009.5356868.

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Tupikina, Nadezhda Y., Eugene V. Sypin, Sergey A. Lisakov, Andrey N. Pavlov, and Gennady V. Leonov. "Development of testing technique of main parameters for two spectral ratios optical-electronic device." In 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM). IEEE, 2015. http://dx.doi.org/10.1109/edm.2015.7184555.

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Reports on the topic "Electronic device testing"

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Nordman, James E., and James B. Beyer. Equipment for Building and Testing Superconductive Flux Flow Electronic Devices. Fort Belvoir, VA: Defense Technical Information Center, November 1987. http://dx.doi.org/10.21236/ada192959.

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Kaplar, Robert James, Reinhard C. Brock, Matthew Marinella, Michael Patrick King, Mark A. Smith, and Stanley Atcitty. Stress testing on silicon carbide electronic devices for prognostics and health management. Office of Scientific and Technical Information (OSTI), January 2011. http://dx.doi.org/10.2172/1005076.

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Villaran, M., K. Hillman, J. Taylor, J. Lara, and W. Wilhelm. Selected fault testing of electronic isolation devices used in nuclear power plant operation. Office of Scientific and Technical Information (OSTI), May 1994. http://dx.doi.org/10.2172/10152083.

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Sofronova, Daniela, and Radostina A. Angelova. A Method for Testing of the Conductivity Decay of Threads for Embedded Wearable Electronic Devices in Smart Textiles. "Prof. Marin Drinov" Publishing House of Bulgarian Academy of Sciences, February 2020. http://dx.doi.org/10.7546/crabs.2020.02.15.

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