Journal articles: 'EBSD'

1

Osborn, William A., Mark J. McLean, and Brian Bush. "Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds." Microscopy and Microanalysis 25, no. 1 (February 2019): 77–79. http://dx.doi.org/10.1017/s1431927618016173.

Full text

Abstract:

AbstractApplying high-resolution electron backscatter diffraction (HR-EBSD) to materials without regions that are amenable to the acquisition of backgrounds for static flat fielding (background subtraction) can cause analysis problems. To address this difficulty, the efficacy of electron beam induced deposition (EBID) of material as a source for an amorphous background signal is assessed and found to be practical. Using EBID material for EBSD backgrounds allows single crystal and large-grained samples to be analyzed using HR-EBSD for strain and small angle rotation measurement.

APA, Harvard, Vancouver, ISO, and other styles

2

Goehner, R. P., and J. R. Michael. "Microdiffraction phase identification in the scanning electron microscope (SEM)." Powder Diffraction 19, no. 2 (June 2004): 100–103. http://dx.doi.org/10.1154/1.1757450.

Full text

Abstract:

The identification of crystallographic phases in the scanning electron microscope (SEM) has been limited by the lack of a simple way to obtain electron diffraction data of an unknown while observing the microstructure of the specimen. With the development of charge coupled device (CCD)-based detectors, backscattered electron Kikuchi patterns, alternately referred to as electron backscattered diffraction (EBSD) patterns, can be easily collected. Previously, EBSD has been limited to crystallographic orientation studies due to the poor pattern quality collected with video rate detector systems. With CCD detectors, a typical EBSD can now be acquired from a micron or submicron sized crystal using an exposure time of 1–10 s with an accelerating voltage of 10–40 kV and a beam current as low as 0.1 nA. Crystallographic phase analysis using EBSD is unique in that the properly equipped SEM permits high magnification images, EBSDs, and elemental information to be collected from bulk specimens. EBSD in the SEM has numerous advantages over other electron beam-based crystallographic techniques. The large angular view (∼70°) provided by EBSD and the ease of specimen preparation are distinct advantages of the technique. No sample preparation beyond what is commonly used for SEM specimens is required for EBSD.

APA, Harvard, Vancouver, ISO, and other styles

3

Li, Lili, Sheng Ouyang, Yanqing Yang, and Ming Han. "EBSDL: a computer program for determining an unknown Bravais lattice using a single electron backscatter diffraction pattern." Journal of Applied Crystallography 47, no. 4 (July 19, 2014): 1466–68. http://dx.doi.org/10.1107/s160057671401382x.

Full text

Abstract:

Electron backscatter diffraction (EBSD) patterns provide a wealth of crystallographic information but disappointingly low accuracy. Adopting a strategy of compensating the poor accuracy by the large amount of information, a computer program, EBSDL, has been successfully developed to determine the unknown Bravais lattice of bulk crystalline materials using a single EBSD pattern. Unlike programs that perform phase identification, the new application is completely independent of chemical information.

APA, Harvard, Vancouver, ISO, and other styles

4

DAY, A. P. "Spherical EBSD." Journal of Microscopy 230, no. 3 (June 2008): 472–86. http://dx.doi.org/10.1111/j.1365-2818.2008.02011.x.

Full text

APA, Harvard, Vancouver, ISO, and other styles

5

Michael, J. R. "All You Need to Know About Electron Backscatter Diffraction: Orientation is Only the Tip of the Iceberg." Microscopy and Microanalysis 3, S2 (August 1997): 387–88. http://dx.doi.org/10.1017/s1431927600008825.

Full text

Abstract:

This tutorial will describe the technique of electron backscattered diffraction (EBSD) in the scanning electron microscope (SEM). To properly exploit EBSD in the SEM it is important to understand how these patterns are formed. This discussion will be followed by a description of the hardware required for the collection of electron backscatter patterns (EBSP). We will then discuss the methods used to extract the appropriate crystallographic information from the patterns for orientation determination and phase identification and how these operations can be automated. Following this, a number of applications of the technique for both orientation studies and phase identification will be discussed.EBSD in the SEM is a phenomenon that has been known for many years. EBSD in the SEM is a technique that permits the crystallography of sub-micron sized regions to be studied from a bulk specimen. These patterns were first observed over 40 years ago, before the development of the SEM and were recorded using a special chamber and photographic film.

APA, Harvard, Vancouver, ISO, and other styles

6

Vystavěl, Tomáš, Pavel Stejskal, Marek Unčovský, and Chris Stephens. "Tilt-free EBSD." Microscopy and Microanalysis 24, S1 (August 2018): 1126–27. http://dx.doi.org/10.1017/s1431927618006116.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

McCabe, RJ, G. Proust, A. Misra, EK Cerreta, and BL Henrie. "EBSD and Coupled EBSD/TEM Analysis of Zirconium Deformation Mechanisms." Microscopy and Microanalysis 12, S02 (July 31, 2006): 1024–25. http://dx.doi.org/10.1017/s1431927606068899.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Wright, Stuart I., Matthew M. Nowell, and David P. Field. "A Review of Strain Analysis Using Electron Backscatter Diffraction." Microscopy and Microanalysis 17, no. 3 (March 22, 2011): 316–29. http://dx.doi.org/10.1017/s1431927611000055.

Full text

Abstract:

AbstractSince the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique is primarily due to the capability of EBSD to aid the research scientist in understanding the crystallographic aspects of microstructure. There has been considerable interest in using EBSD to quantify strain at the submicron scale. To apply EBSD to the characterization of strain, it is important to understand what is practically possible and the underlying assumptions and limitations. This work reviews the current state of technology in terms of strain analysis using EBSD. First, the effects of both elastic and plastic strain on individual EBSD patterns will be considered. Second, the use of EBSD maps for characterizing plastic strain will be explored. Both the potential of the technique and its limitations will be discussed along with the sensitivity of various calculation and mapping parameters.

APA, Harvard, Vancouver, ISO, and other styles

9

MORALES, LUIZ FERNANDO GRAFULHA, RUTH HINRICHS, and LUÍS ALBERTO D’ÁVILA FERNANDES. "A Técnica de Difração de Elétrons Retro-Espalhados (EBSD) em Microscópio Eletrônico de Varredura (MEV) e sua Aplicação no Estudo de Rochas Deformadas." Pesquisas em Geociências 34, no. 1 (June 30, 2007): 19. http://dx.doi.org/10.22456/1807-9806.19459.

Full text

Abstract:

The electron backscattered diffraction technique in the scanning electron microscope (EBSD/SEM) is based on the diffraction of a high-energy electron beam by the crystalline structure of a given material, in all possible directions within the sample. Some of the diffracted electrons escape from the specimen with virtually the same initial energy, interact with a phosphorescent screen and the generated EBSP pattern can be picked up with a low-luminosity charge couple device (CCD) camera. These patterns can be indexed using pre-determined patterns for a large variety of minerals, which allows the determination of complete orientation of each single mineral within an aggregate. In this paper we briefly discuss the physical aspects related to the diffraction of an electron beam by crystalline matter and how the EBSP patterns are generated. We also present a short introduction of the necessary instruments to acquire EBSD data, as well as the calibration procedures, acquisition and indexing software of EBSPs. The pitfalls of the technique and possible error sources are also discussed with examples. Considering the scarce availability of literature on geological sample preparation, the polishing method of silicate-rich rocks for EBSP is described in detail in the last part of this paper.

APA, Harvard, Vancouver, ISO, and other styles

10

Engler, O. "Comparison of X-ray and electron backscatter diffraction textures for back-annealed Al–Mg alloys." Journal of Applied Crystallography 42, no. 6 (November 7, 2009): 1147–57. http://dx.doi.org/10.1107/s0021889809041685.

Full text

Abstract:

The potential of electron backscatter diffraction (EBSD) to determine integral macrotexture data is explored by comparing EBSD-derived textures with standard X-ray texture results. The comparison is performed for an Al–Mg alloy AA 5005 in the cold-rolled and various back-annealed states in order to analyse the impact of the microstructural state on the quality of EBSD-based macrotextures. The number of EBSD single orientation measurements necessary to represent a texture adequately is determined by way of exploring the convergence of the statistical parameter ρ, which represents the relative mean square deviation between the EBSD and X-ray-based textures. The effect of EBSD filtering tools and the impact of sampling step size on the statistical significance of EBSD data are investigated. Several means to reduce the number of data points without compromising the accuracy of the texture results as an input for subsequent texture simulation are addressed.

APA, Harvard, Vancouver, ISO, and other styles

11

Saraf, Laxmikant V. "Dependence of the Electron Beam Energy and Types of Surface to Determine EBSD Indexing Reliability in Yttria-Stabilized Zirconia." Microscopy and Microanalysis 18, no. 2 (February 16, 2012): 371–78. http://dx.doi.org/10.1017/s1431927611012815.

Full text

Abstract:

AbstractElectron backscatter diffraction (EBSD) is a powerful technique for surface microstructure analysis. EBSD analysis of cubic yttria-stabilized zirconia (YSZ) is demonstrated. The statistics related to EBSD indexing reliability shows that the probability of accurate grain orientation detection increased significantly when the electron beam energy was increased from 10 to 30 kV. As a result of better sampling with increased interaction volume, a disparity between local and average grain misorientation angle also exhibited the dependence of the electron beam energy to determine the accuracy of grain orientation. To study EBSD indexing reliability as a function of surface roughness and overlayer formation, rapid EBSD measurement tests were performed on (a) YSZ surfaces ion-polished at ion beam energies of 65 nA at 30 kV and 1 nA at 30 kV and (b) carbon-coated versus uncoated YSZ surfaces. The EBSD results at both 10 and 30 kV electron beam energies indicate that EBSD indexing reliability is negatively affected by higher ion beam milling current and amorphous overlayer formation.

APA, Harvard, Vancouver, ISO, and other styles

12

Michael, J. R. "Specimen Thickness Effects on EBSD Patterns in the Sem." Microscopy and Microanalysis 7, S2 (August 2001): 380–81. http://dx.doi.org/10.1017/s1431927600027975.

Full text

Abstract:

Electron backscatter diffraction (EBSD) in the SEM has become a widely used technique for both automated orientation mapping and the identification of unknown crystalline phases. Despite the rapidly growing use of this technique for the above applications, there has been relatively little fundamental research concerned with determining the thickness of the surface layer that generates the EBSD pattern. EBSD patterns are related through reciprocity to electron channeling patterns. Based on this assumption the thickness of the surface layer that an EBSD pattern is generated in is 2 or 3 extinction distances. Extinction distances at low SEM voltages (10-20 kV) are quite short. Thus, EBSD patterns are generated in very thin surface layers. This paper will discuss the results of a study of the information depth of EBSD in the SEM.Previous research has attempted to determine the information depth of EBSD by obtaining patterns from samples that have had layers of other crystalline or microcrystalline material deposited on the surface.

APA, Harvard, Vancouver, ISO, and other styles

13

Zaefferer, S., and P. Konijnenberg. "Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography." Microscopy and Microanalysis 18, S2 (July 2012): 520–21. http://dx.doi.org/10.1017/s143192761200445x.

Full text

APA, Harvard, Vancouver, ISO, and other styles

14

Williams, REA, A. Genc, D. Huber, and HL Fraser. "Sample Surface Preparation For Traditional EBSD Collection and 3D EBSD Collection." Microscopy and Microanalysis 16, S2 (July 2010): 706–7. http://dx.doi.org/10.1017/s1431927610062574.

Full text

APA, Harvard, Vancouver, ISO, and other styles

15

Koblischka-Veneva, A., M. R. Koblischka, J. Schmauch, and M. Murakami. "Transmission EBSD (t-EBSD) as Tool to Investigate Nanostructures in Superconductors." Journal of Superconductivity and Novel Magnetism 32, no. 10 (April 23, 2019): 3155–63. http://dx.doi.org/10.1007/s10948-019-5106-4.

Full text

APA, Harvard, Vancouver, ISO, and other styles

16

Deal, Andrew. "Introduction: Electron Backscatter Diffraction Special Section." Microscopy and Microanalysis 19, no. 4 (June 24, 2013): 920. http://dx.doi.org/10.1017/s1431927613001955.

Full text

Abstract:

Welcome to the second special section of Microscopy and Microanalysis focused on electron backscatter diffraction (EBSD), which follows the June 2011 issue. The content of the previous special section was provided by participants at EBSD 2010, the second Microanalysis Society (MAS) topical conference dedicated to EBSD in the United States. The present 2013 special section includes work from participants at both EBSD 2012, the third of such topical conferences (held June 19–21, 2012 at Carnegie Mellon University, Pittsburgh, PA), and EMAS 2012, the European Microanalysis Society's 10th Regional Workshop that included three EBSD sessions (held June 17–20 at the Institute for Geosciences and Earth Resources, Padua, Italy).

APA, Harvard, Vancouver, ISO, and other styles

17

Hauegen, Christien G., Fabiane R. Freitas da Silva, Fernanda A. Sampaio da Silva, Jefferson Fabricio Cardoso Lins, and Marcos Flavio de Campos. "EBSD Texture Analysis of NdFeB Magnets." Materials Science Forum 727-728 (August 2012): 135–39. http://dx.doi.org/10.4028/www.scientific.net/msf.727-728.135.

Full text

Abstract:

The crystallographical texture is relevant information for NdFeB magnets, since the maximum energy product is directly related to orientation of the crystals. EBSD (Electron Backscattered Diffraction) is a very suitable tool for preferred orientation measurement of NdFeB magnets. The advantages of EBSD against X-ray Diffraction (XRD) pole figures for texture determination are discussed. EBSD identifies misaligned grains, and this is not feasible with XRD pole figures. EBSD is also helpful on the identification of oxides.

APA, Harvard, Vancouver, ISO, and other styles

18

Romero, Sergio Antonio, Christien G. Hauegen, Fernando J. G. Landgraf, and Marcos Flavio de Campos. "EBSD Analysis of SmCoFeCuZr Alloys." Materials Science Forum 869 (August 2016): 608–13. http://dx.doi.org/10.4028/www.scientific.net/msf.869.608.

Full text

Abstract:

In the present study, EBSD was used for the characterization of alloys used for production of SmFeCoCuZr magnets. EBSD is adequate for texture analysis, but may give misleading results for phase identification. EBSD is not suitable for identifying phases with very similar crystalline structure, especially when the phases are crystallographically coherent, due to the superposition of Kikuchi lines. As consequence, for phase identification EBSD should be considered a complementary technique to other methods, as for example x-ray diffraction (XRD).

APA, Harvard, Vancouver, ISO, and other styles

19

Adams, Brent L., Calvin J. Gardner, and David T. Fullwood. "EBSD-Based Dislocation Microscopy." Solid State Phenomena 160 (February 2010): 3–10. http://dx.doi.org/10.4028/www.scientific.net/ssp.160.3.

Full text

Abstract:

Recent advances in high-resolution electron backscatter diffraction (EBSD)-based microscopy are applied to the characterization of incompatibility structures near the grain boundaries (GBs) in polycrystals. The principal interest described here is recovery of geometrically-necessary dislocation (density) tensors, of the 2- and 3-D type, described by Nye and Kröner. These developments are presented in the context of the continuum dislocation theory. High resolution data obtained near a single grain boundary in well-annealed, low content steel suggests that it may be possible to measure the intrinsic elastic properties of GBs.

APA, Harvard, Vancouver, ISO, and other styles

20

Necker, C., R. Forsyth, P. Papin, and E. Luther. "Weird Science: Challenging EBSD." Microscopy and Microanalysis 17, S2 (July 2011): 400–401. http://dx.doi.org/10.1017/s143192761100287x.

Full text

APA, Harvard, Vancouver, ISO, and other styles

21

Wright, Stuart I., and Matthew M. Nowell. "EBSD Image Quality Mapping." Microscopy and Microanalysis 12, no. 01 (December 9, 2005): 72–84. http://dx.doi.org/10.1017/s1431927606060090.

Full text

APA, Harvard, Vancouver, ISO, and other styles

22

Nowell, MM, and SI Wright. "EBSD Analysis of Strain." Microscopy and Microanalysis 15, S2 (July 2009): 178–79. http://dx.doi.org/10.1017/s1431927609093726.

Full text

APA, Harvard, Vancouver, ISO, and other styles

23

Petrov, Roumen H., Orlando León García, J. J. L. Mulders, Ana Carmen C. Reis, Jin Ho Bae, Leo Kestens, and Yvan Houbaert. "Three Dimensional Microstructure–Microtexture Characterization of Pipeline Steel." Materials Science Forum 550 (July 2007): 625–30. http://dx.doi.org/10.4028/www.scientific.net/msf.550.625.

Full text

Abstract:

The microstructural anisotropy together with the crystallographic texture of an industrial grade of X70 pipeline steel is studied by means of the 3D-EBSD technique known also as EBS3 which was recently developed by FEI. Samples of size 8x10x3mm³ were cut from the middle thickness of an industrial rolled plate and after special sample preparation have been studied in a Nova 600 dual beam scanning electron microscope equipped with a field emission gun and HKL Channel 6 EBSD data collection software for crystallographic orientation, which allows multiple sectioning of the sample in automatic mode and, afterwards reconstruction of both the 3D microstructure and texture of the examined volume. Three scanned zones of different volumes that varied between 15x10x27 4m³ and 16x14x6 4m³ have been examined and the results for the crystallographic orientation, grain shape and grain shape orientation are discussed together with the data for the anisotropy of the Charpy impact toughness of the material.

APA, Harvard, Vancouver, ISO, and other styles

24

Pérez-Huerta, Alberto, and Maggie Cusack. "Optimizing Electron Backscatter Diffraction of Carbonate Biominerals—Resin Type and Carbon Coating." Microscopy and Microanalysis 15, no. 3 (May 22, 2009): 197–203. http://dx.doi.org/10.1017/s1431927609090370.

Full text

Abstract:

AbstractElectron backscatter diffraction (EBSD) is becoming a widely used technique to determine crystallographic orientation in biogenic carbonates. Despite this use, there is little information available on preparation for the analysis of biogenic carbonates. EBSD data are compared for biogenic aragonite and calcite in the common blue mussel, Mytilus edulis, using different types of resin and thicknesses of carbon coating. Results indicate that carbonate biomineral samples provide better EBSD results if they are embedded in resin, particularly epoxy resin. A uniform layer of carbon of 2.5 nm thickness provides sufficient conductivity for EBSD analyses of such insulators to avoid charging without masking the diffracted signal. Diffraction intensity decreases with carbon coating thickness of 5 nm or more. This study demonstrates the importance of optimizing sample preparation for EBSD analyses of insulators such as carbonate biominerals.

APA, Harvard, Vancouver, ISO, and other styles

25

Callahan, Patrick G., and Marc De Graef. "Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations." Microscopy and Microanalysis 19, no. 5 (June 26, 2013): 1255–65. http://dx.doi.org/10.1017/s1431927613001840.

Full text

Abstract:

AbstractA new approach for the simulation of dynamic electron backscatter diffraction (EBSD) patterns is introduced. The computational approach merges deterministic dynamic electron-scattering computations based on Bloch waves with a stochastic Monte Carlo (MC) simulation of the energy, depth, and directional distributions of the backscattered electrons (BSEs). An efficient numerical scheme is introduced, based on a modified Lambert projection, for the computation of the scintillator electron count as a function of the position and orientation of the EBSD detector; the approach allows for the rapid computation of an individual EBSD pattern by bi-linear interpolation of a master EBSD pattern. The master pattern stores the BSE yield as a function of the electron exit direction and exit energy and is used along with weight factors extracted from the MC simulation to obtain energy-weighted simulated EBSD patterns. Example simulations for nickel yield realistic patterns and energy-dependent trends in pattern blurring versus filter window energies are in agreement with experimental energy-filtered EBSD observations reported in the literature.

APA, Harvard, Vancouver, ISO, and other styles

26

Michael, J. R., and R. P. Goehner. "Reduced Unit Cell Determination From Unindexed EBSD Patterns." Microscopy and Microanalysis 6, S2 (August 2000): 946–47. http://dx.doi.org/10.1017/s1431927600037223.

Full text

Abstract:

Electron backscatter diffraction (EBSD) is a technique that can provide identification of unknown crystalline phases while exploiting the excellent imaging capabilities of the scanning electron microscope (SEM). Phase identification using EBSD has now progressed to the point that it is commercially available. Phase identification in the SEM requires high quality EBSD patterns that can only be collected using either film or charge coupled device (CCD)-based cameras. High quality EBSD patterns obtained in this manner show many diffraction features that are useful in the determination of the unit cell of the sample.’ This paper will discuss the features in the EBSD patterns and the procedure used to determine the reduced unit cell of the sample.One of the major advantages of EBSD over electron diffraction in the transmission electron microscope is the remarkable field of view that is routinely attained. The large angular view of the diffraction pattern permits many zone axes and their associated symmetries to be viewed in a single pattern or at most a few patterns.

APA, Harvard, Vancouver, ISO, and other styles

27

Khorashadizadeh, Anahita, Myrjam Winning, and Dierk Raabe. "3D Tomographic EBSD Measurements of Heavily Deformed Ultra Fine Grained Cu-0.17wt%Zr Obtained from ECAP." Materials Science Forum 584-586 (June 2008): 434–39. http://dx.doi.org/10.4028/www.scientific.net/msf.584-586.434.

Full text

Abstract:

Obtaining knowledge on the grain boundary topology in three dimensions is of great importance as it controls the mechanical properties of polycrystalline materials. In this study, the three dimensional texture and grain topology of as-deformed ultra fine grained Cu-0.17wt%Zr have been investigated using three-dimensional orientation microscopy (3D electron backscattering diffraction, EBSD) measurements in ultra fine grained Cu-0.17wt%Zr. Equal channel angular pressing was used to produce the ultra fine grained structure. The experiments were conducted using a dual-beam system for 3D-EBSD. The approach is realized by a combination of a focused ion beam (FIB) unit for serial sectioning with high-resolution field emission scanning electron microscopy equipped with EBSD. The work demonstrates that the new 3D EBSD-FIB technique provides a new level of microstructure information that cannot be achieved by conventional 2D-EBSD analysis.

APA, Harvard, Vancouver, ISO, and other styles

28

Stojakovic, Dejan. "Electron backscatter diffraction in materials characterization." Processing and Application of Ceramics 6, no. 1 (2012): 1–13. http://dx.doi.org/10.2298/pac1201001s.

Full text

Abstract:

Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of materials. Key milestones related to technological developments of EBSD technique have been outlined along with possible applications using modern EBSD system. Principles of crystal diffraction with description of crystallographic orientation, orientation determination and phase identification have been described. Image quality, resolution and speed, and system calibration have also been discussed. Sample preparation methods were reviewed and EBSD application in conjunction with other characterization techniques on a variety of materials has been presented for several case studies. In summary, an outlook for EBSD technique was provided.

APA, Harvard, Vancouver, ISO, and other styles

29

Geiss, Roy H., Katherine P. Rice, and Robert R. Keller. "Transmission EBSD in the Scanning Electron Microscope." Microscopy Today 21, no. 3 (May 2013): 16–20. http://dx.doi.org/10.1017/s1551929513000503.

Full text

Abstract:

We demonstrate in this article an exciting new method for obtaining electron Kikuchi diffraction patterns in transmission from thin specimens in a scanning electron microscope (SEM) fitted with a conventional electron backscattered diffraction (EBSD) detector. We have labeled the method transmission EBSD (t-EBSD) because it uses off-the-shelf commercial EBSD equipment to capture the diffraction patterns and also to differentiate it from transmission Kikuchi diffraction available in the transmission electron microscope (TEM). Lateral spatial resolution of less than 10 nm has been demonstrated for particles and better than 5 nm for orientation mapping of thin films. The only new requirement is a specimen holder that allows the transmitted electrons diffracted from an electron transparent sample to intersect the EBSD detector. We briefly outline our development of the technique, followed by descriptions of sample preparation techniques and operating conditions. We then present examples of t-EBSD patterns from a variety of specimens, including particles of diameter <10 nm, wires of diameter <80 nm, and films with thicknesses from ~5 nm to 300 nm. Finally, we discuss the phenomenon in the context of Monte Carlo electron scattering simulations.

APA, Harvard, Vancouver, ISO, and other styles

30

Yudintsev, Sergey V., Maximilian S. Nickolsky, Michael I. Ojovan, Olga I. Stefanovsky, Boris S. Nikonov, and Amina S. Ulanova. "Zirconolite Polytypes and Murataite Polysomes in Matrices for the REE—Actinide Fraction of HLW." Materials 15, no. 17 (September 2, 2022): 6091. http://dx.doi.org/10.3390/ma15176091.

Full text

Abstract:

Electron backscatter diffraction (EBSD) has been used for more than 30 years for analyzing the structure of minerals and artificial substances. In recent times, EBSD has been widely applied for investigation of irradiated nuclear fuel and matrices for the immobilization of radioactive waste. The combination of EBSD and scanning electron microscopy (SEM/EDS) methods allows researchers to obtain simultaneously data on a specimen’s local composition and structure. The article discusses the abilities of SEM/EDS and EBSD techniques to identify zirconolite polytype modifications and members of the polysomatic murataite–pyrochlore series in polyphase ceramic matrices, with simulations of Pu (Th) and the REE-actinide fraction (Nd) of high-level radioactive waste.

APA, Harvard, Vancouver, ISO, and other styles

31

Kunze, Karsten. "Crystal orientation measurements using SEM–EBSD under unconventional conditions." Powder Diffraction 30, no. 2 (May 12, 2015): 104–8. http://dx.doi.org/10.1017/s0885715615000263.

Full text

Abstract:

Electron backscatter diffraction (EBSD) is a micro-analytical technique typically attached to a scanning electron microscope (SEM). The vast majority of EBSD measurements is applied to planar and polished surfaces of polycrystalline bulk specimen. In this paper, we present examples of using EBSD and energy-dispersive X-ray spectroscopy (EDX) to analyze specimens that are not flat, not planar, or not bulk – but pillars, needles, and rods. The benefits of low vacuum SEM operation to reduced drift problems are displayed. It is further demonstrated that small and thin specimens enhance the attainable spatial resolution for orientation mapping (by EBSD or transmission Kikuchi diffraction) as well as for element mapping (by EDX).

APA, Harvard, Vancouver, ISO, and other styles

32

Pierron, Xavier, Charles Daghlian, and Ian Baker. "A Low Cost EBSD System: Implementation and Application." Microscopy and Microanalysis 5, S2 (August 1999): 244–45. http://dx.doi.org/10.1017/s1431927600014549.

Full text

Abstract:

Electron Back-Scatter Diffraction (EBSD) is a technique used for obtaining microtextural information from bulk samples in the scanning electron microscope (SEM). number of good commercial systems provide hardware and software to acquire and analyze the electron back scatter patterns (EBSP). The systems come with tools to visualize crystal orientation, and map grain and grain boundaries. However money is always in short supply, and for studies which do not require mapping, we have found it more economical to build our own EBSP system using readily available off-the-shelf components.An EBSP's are formed by the intersection of the diffracted back scattered electrons with a phosphor screen placed in their path. We acquire this pattern by viewing the phosphor.screen through a view port with a CCD video camera which is configured for on-chip integration. On-chip integration allows the signal to be amplified without extensive electronic noise. We made a port cover for the right-hand port of the DSM-962 SEM on which a 2” diameter view window is fitted.

APA, Harvard, Vancouver, ISO, and other styles

33

Zhang, Yucheng, Ping Lai, Huiping Jia, Xinhua Ju, and Guibin Cui. "Investigation of Test Parameters on EBSD Analysis of Retained Austenite in TRIP and Pipeline Steels." Metals 9, no. 1 (January 16, 2019): 94. http://dx.doi.org/10.3390/met9010094.

Full text

Abstract:

In this article we discuss the effect of different test parameters on the analysis of retained austenite in TRIP590, TRIP780 and X90 steels, by means of Electron Backscattered Diffraction (EBSD) and X-ray Diffraction (XRD), respectively. By analyzing the measuring retained austenite content under different conditions, the optimal test parameters were obtained. The retained austenite content measured both by the EBSD and XRD methods were also compared. The results showed that the test parameters had a great influence on the measured results of retained austenite content in steel by the EBSD method. The higher the indexing rate, the better the precision of the measured results. The step size used for EBSD analysis should not exceed 1/5 of the average grain size of retained austenite. The scanning area for EBSD retained austenite analysis in TRIP and pipeline steels should be no less than 0.068 mm2, which is recommended to be performed by multiple small fields.

APA, Harvard, Vancouver, ISO, and other styles

34

Tao, Xiaodong, and Alwyn Eades. "A Routine to Determine the Shift of Kikuchi Bands in EBSD to Sub-pixel Resolution." Microscopy and Microanalysis 7, S2 (August 2001): 366–67. http://dx.doi.org/10.1017/s1431927600027902.

Full text

Abstract:

The long-term aim of our research is to detect and image dislocations in the SEM with EBSD. We will apply it first to the characterization of threading dislocations in Si/Si-Ge structures. As an initial step, we set out to detect the shift of the Kikuchi bands in EBSD patterns to sub-pixel precision.In the standard analysis of EBSD patterns, to find the positions of Kikuchi bands, it is usual to use the Hough transform. This transform displays the intensity along all lines in the EBSD pattern, as a function of the position and the angle of the line. Thus linear features in the pattern (Figure 1) appears as peaks in the transform (Figure 2a). in normal EBSD analysis, the aim is to determine the orientation of the grain to a precision of perhaps a degree or two. Therefore, many simplifications are made in the software with the aim of gaining speed.

APA, Harvard, Vancouver, ISO, and other styles

35

Jha, Dipendra, Saransh Singh, Reda Al-Bahrani, Wei-keng Liao, Alok Choudhary, Marc De Graef, and Ankit Agrawal. "Extracting Grain Orientations from EBSD Patterns of Polycrystalline Materials Using Convolutional Neural Networks." Microscopy and Microanalysis 24, no. 5 (October 2018): 497–502. http://dx.doi.org/10.1017/s1431927618015131.

Full text

Abstract:

AbstractWe present a deep learning approach to the indexing of electron backscatter diffraction (EBSD) patterns. We design and implement a deep convolutional neural network architecture to predict crystal orientation from the EBSD patterns. We design a differentiable approximation to the disorientation function between the predicted crystal orientation and the ground truth; the deep learning model optimizes for the mean disorientation error between the predicted crystal orientation and the ground truth using stochastic gradient descent. The deep learning model is trained using 374,852 EBSD patterns of polycrystalline nickel from simulation and evaluated using 1,000 experimental EBSD patterns of polycrystalline nickel. The deep learning model results in a mean disorientation error of 0.548° compared to 0.652° using dictionary based indexing.

APA, Harvard, Vancouver, ISO, and other styles

36

Nowell, Matthew M., Ronald A. Witt, and Brian W. True. "EBSD Sample Preparation: Techniques, Tips, and Tricks." Microscopy Today 13, no. 4 (July 2005): 44–49. http://dx.doi.org/10.1017/s1551929500053669.

Full text

Abstract:

Automated analysis of Electron Backscatter Diffraction (EBSD) patterns for orientation imaging and phase identification in materials and earth sciences has become a widely accepted microstructural analysis tool. To briefly review, EBSD is a scanning electron microscope (SEM) based technique where the sample is tilted approximately 70 degrees and the electron beam is positioned in an analytical spot-mode within a selected grain. An EBSD pattern is formed due to the diffraction of the electron beam by select crystallographic planes within the material. The EBSD pattern is representative of both the phase and crystallographic orientation of the selected area. The pattern is imaged by a phosphor screen and recorded with a digital CCD camera and then analyzed.

APA, Harvard, Vancouver, ISO, and other styles

37

Suker, D. K. "Deep Learning CNN for the Prediction of Grain Orientations on EBSD Patterns of AA5083 Alloy." Engineering, Technology & Applied Science Research 12, no. 2 (April 9, 2022): 8393–401. http://dx.doi.org/10.48084/etasr.4807.

Full text

Abstract:

Indexing of Electron Backscatter Diffraction (EBSD) is a well-established method of crystalline material characterization that provides phase and orientation information about the crystals on the material surface. A deep learning Convolutional Neural Network was trained to predict crystal orientation from the EBSD patterns based on the mean disorientation error between the predicted crystal orientation and the ground truth. The CNN is trained using EBSD images for different deformation conditions of AA5083.

APA, Harvard, Vancouver, ISO, and other styles

38

Bunkholt, Sindre, Knut Marthinsen, and Erik Nes. "Subgrain Structures Characterized by Electron Backscatter Diffraction (EBSD)." Materials Science Forum 794-796 (June 2014): 3–8. http://dx.doi.org/10.4028/www.scientific.net/msf.794-796.3.

Full text

Abstract:

Subgrain structures are frequently characterized by the electron backscatter diffraction (EBSD) method, which is both accurate and provides good statistics. This is essential to better understand the subgrain growth mechanisms and e.g. establish the driving forces and motilities for comparison with physically based models. However, there is no commercially available software which can provide adequate subgrain boundary maps necessary for e.g. size and misorientation analysis. Here, a method that produces such maps utilizing only commercially available software is presented. The clue is to provide the EBSD-software with a parameter that can be used to identify all subgrains. By combining various maps exported from the EBSD-software into photo editing software, a new map is made in which all subgrain boundaries are identified. Missing and incomplete boundaries are traced manually before a reconstructed subgrain map is generated and imported back into the EBSD-software. With this method, the built-in algorithms in the EBSD-software can be readily used to e.g. characterize subgrain growth in aluminium with respect to orientation, size and misorientation.

APA, Harvard, Vancouver, ISO, and other styles

39

Callahan, Patrick G., McLean P. Echlin, Tresa M. Pollock, and Marc De Graef. "Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction Patterns." Microscopy and Microanalysis 23, no. 4 (August 2017): 730–40. http://dx.doi.org/10.1017/s1431927617012326.

Full text

Abstract:

AbstractWe demonstrate that the surface topography of a sample can be reconstructed from electron backscatter diffraction (EBSD) patterns collected with a commercial EBSD system. This technique combines the location of the maximum background intensity with a correction from Monte Carlo simulations to determine the local surface normals at each point in an EBSD scan. A surface height map is then reconstructed from the local surface normals. In this study, a Ni sample was machined with a femtosecond laser, which causes the formation of a laser-induced periodic surface structure (LIPSS). The topography of the LIPSS was analyzed using atomic force microscopy (AFM) and reconstructions from EBSD patterns collected at 5 and 20 kV. The LIPSS consisted of a combination of low frequency waviness due to curtaining and high frequency ridges. The morphology of the reconstructed low frequency waviness and high frequency ridges matched the AFM data. The reconstruction technique does not require any modification to existing EBSD systems and so can be particularly useful for measuring topography and its evolution during in situ experiments.

APA, Harvard, Vancouver, ISO, and other styles

40

Pinard, Philippe T., Marin Lagacé, Pierre Hovington, Denis Thibault, and Raynald Gauvin. "An Open-Source Engine for the Processing of Electron Backscatter Patterns: EBSD-Image." Microscopy and Microanalysis 17, no. 3 (May 6, 2011): 374–85. http://dx.doi.org/10.1017/s1431927611000456.

Full text

Abstract:

AbstractAn open source software package dedicated to processing stored electron backscatter patterns is presented. The package gives users full control over the type and order of operations that are performed on electron backscatter diffraction (EBSD) patterns as well as the results obtained. The current version of EBSD-Image (www.ebsd-image.org) offers a flexible and structured interface to calculate various quality metrics over large datasets. It includes unique features such as practical file formats for storing diffraction patterns and analysis results, stitching of mappings with automatic reorganization of their diffraction patterns, and routines for processing data on a distributed computer grid. Implementations of the algorithms used in the software are described and benchmarked using simulated diffraction patterns. Using those simulated EBSD patterns, the detection of Kikuchi bands in EBSD-Image was found to be comparable to commercially available EBSD systems. In addition, 24 quality metrics were evaluated based on the ability to assess the level of deformation in two samples (copper and iron) deformed using 220 grit SiC grinding paper. Fourteen metrics were able to properly measure the deformation gradient of the samples.

APA, Harvard, Vancouver, ISO, and other styles

41

Procter, Frances A., Sandra Piazolo, Eleanor H. John, Richard Walshaw, Paul N. Pearson, Caroline H. Lear, and Tracy Aze. "Electron backscatter diffraction analysis unveils foraminiferal calcite microstructure and processes of diagenetic alteration." Biogeosciences 21, no. 5 (March 13, 2024): 1213–33. http://dx.doi.org/10.5194/bg-21-1213-2024.

Full text

Abstract:

Abstract. Electron backscatter diffraction (EBSD) analysis enables a unique perspective of the internal microstructure of foraminiferal calcite. Specifically, EBSD provides crystallographic data from within the test, highlighting the highly organised “mesocrystal” structure of crystallographically aligned domains throughout the test, formed by sequential deposits of microgranular calcite. We compared EBSD maps across the test walls of both poorly preserved and well-preserved specimens of the planktonic foraminifera species Globigerinoides ruber and Morozovella crater. The EBSD maps, paired with information about intra-test distributions of Mg/Ca ratios, allowed us to examine the effects of different diagenetic processes on the foraminifera test. In poorly preserved specimens EBSD data show extensive reorganisation of the biogenic crystal microstructure, indicating differing phases of dissolution, re-precipitation and overgrowth. The specimens with the greatest degree of microstructural reorganisation also show an absence of higher concentration magnesium bands, which are typical features of well-preserved specimens. These findings provide important insights into the extent of post-depositional changes, in both microstructure and geochemical signals that must be considered when utilising foraminifera to generate proxy archive data.

APA, Harvard, Vancouver, ISO, and other styles

42

Morawiec, Adam. "A remark on ab initio indexing of electron backscatter diffraction patterns." Journal of Applied Crystallography 54, no. 6 (October 27, 2021): 1844–46. http://dx.doi.org/10.1107/s1600576721009304.

Full text

Abstract:

There is a growing interest in ab initio indexing of electron backscatter diffraction (EBSD) patterns. The methods of solving the problem are presented as innovative. The purpose of this note is to point out that ab initio EBSD indexing belongs to the field of indexing single-crystal diffraction data, and it is solved on the same principles as indexing of patterns of other types. It is shown that reasonably accurate EBSD-based data can be indexed by programs designed for X-ray data.

APA, Harvard, Vancouver, ISO, and other styles

43

Skippon, T., L. Balogh, and M. R. Daymond. "Comparison of electron backscatter and X-ray diffraction techniques for measuring dislocation density in Zircaloy-2." Journal of Applied Crystallography 52, no. 2 (April 1, 2019): 415–27. http://dx.doi.org/10.1107/s1600576719003054.

Full text

Abstract:

Two methods for measuring dislocation density were applied to a series of plastically deformed tensile samples of Zircaloy-2. Samples subjected to plastic strains ranging from 4 to 17% along a variety of loading paths were characterized using both electron backscatter diffraction (EBSD) and synchrotron X-ray line profile analysis (LPA). It was found that the EBSD-based method gave results which were similar in magnitude to those obtained by LPA and followed a similar trend with increasing plastic strain. The effects of microscope parameters and post-processing of the EBSD data on dislocation density measurements are also discussed. The typical method for estimating uncertainty in dislocation density measured via EBSD was shown to be overly conservative, and a more realistic method of determining uncertainty is presented as an alternative.

APA, Harvard, Vancouver, ISO, and other styles

44

MIRONOV, Sergey, Yutaka SATO, and Hiroyuki KOKAWA. "Sample Preparation for EBSD Analysis." JOURNAL OF THE JAPAN WELDING SOCIETY 77, no. 8 (2008): 761–63. http://dx.doi.org/10.2207/jjws.77.761.

Full text

APA, Harvard, Vancouver, ISO, and other styles

45

Fullwood, David T., Brent L. Adams, Travis Rampton, Ali Khosravani, Michael Miles, Jon Scott, and Raj Mishra. "Intelligent Microscopy for EBSD Applications." Materials Science Forum 702-703 (December 2011): 554–57. http://dx.doi.org/10.4028/www.scientific.net/msf.702-703.554.

Full text

Abstract:

As EBSD techniques improve, researchers are rapidly gaining access to quantities of high-caliber information previously unavailable. However, these benefits bring their own drawbacks. Engineers must either learn to cope with large amounts of data, or they must be more selective about which data is captured. In either case, machine learning techniques may play an important role. Data mining techniques can be used to extract knowledge from large databases, while other machine learning methods enable the identification of critical features, and the efficient search for such features at the data acquisition phase. One particular application of these techniques involves the investigation of fracture and fatigue mechanisms. Methods are required for finding and recording critical event inception. The development of in-situ test equipment, and high-resolution microscopy techniques (such as high-resolution EBSD: HREBSD) have placed invaluable tools into the hands of researchers. Nevertheless, practical considerations limit the volume of material that can be carefully monitored during a given testing regime. Machine learning techniques offer a promising framework for enhancing efficiency in the search for critical events. This paper presents initial efforts to develop an intelligent microscopy environment for EBSD users based upon machine learning methods. The test bed for the study will include ductility studies in magnesium, exploiting recent advances by the authors in the area of HREBSD.

APA, Harvard, Vancouver, ISO, and other styles

46

Drozdenko, Daria, Peter Minarik, Mykhaylo Paukov, Volodymyr Buturlim, Ilya Tkach, and Ladislav Havela. "EBSD Study of Uranium Alloys." MRS Advances 1, no. 44 (2016): 3013–18. http://dx.doi.org/10.1557/adv.2016.453.

Full text

Abstract:

ABSTRACT Metallographical examination of Uranium alloys can benefit from electron back scatter diffraction (EBSD) technique. Various methods of surface preparation for microstructural characterization are described and compared. The aim of the study was to optimize the preparation technique for surfaces of U alloy splats for EBSD mapping, particularly in the context of U1-x Mo x alloys, as properties of γ-U surfaces (e.g. with more Mo) are very different than for mostly α-U type (low-alloyed U).

APA, Harvard, Vancouver, ISO, and other styles

47

Düber, Olaf, Boris Künkler, Ulrich Krupp, Hans-Jürgen Christ, and Claus-Peter Fritzen. "Gefügecharakterisierung mehrphasiger Werkstoffe mittels EBSD." Practical Metallography 43, no. 2 (February 2006): 88–102. http://dx.doi.org/10.3139/147.100290.

Full text

APA, Harvard, Vancouver, ISO, and other styles

48

Heimann, Sebastian, Marina Knyazeva, and Michael Pohl. "EBSD-Gefügeuntersuchungen an Aluminiummatrix-Verbundwerkstoffen." Practical Metallography 47, no. 11 (November 2010): 640–53. http://dx.doi.org/10.3139/147.110103.

Full text

APA, Harvard, Vancouver, ISO, and other styles

49

Schwarzer, R. A., and J. Hjelen. "Orientation microscopy with fast EBSD." Materials Science and Technology 26, no. 6 (June 2010): 646–49. http://dx.doi.org/10.1179/026708309x12512842324515.

Full text

APA, Harvard, Vancouver, ISO, and other styles

50

Koblischka-Veneva, A., M. R. Koblischka, J. Schmauch, K. Inoue, M. Muralidhar, K. Berger, and J. Noudem. "EBSD analysis of MgB2bulk superconductors." Superconductor Science and Technology 29, no. 4 (March 11, 2016): 044007. http://dx.doi.org/10.1088/0953-2048/29/4/044007.

Full text

APA, Harvard, Vancouver, ISO, and other styles

Journal articles on the topic 'EBSD'

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles