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Academic literature on the topic 'EBSD'

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Published: 4 June 2021
Last updated: 8 June 2024

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Journal articles on the topic "EBSD"

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Osborn, William A., Mark J. McLean, and Brian Bush. "Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds." Microscopy and Microanalysis 25, no. 1 (February 2019): 77–79. http://dx.doi.org/10.1017/s1431927618016173.

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AbstractApplying high-resolution electron backscatter diffraction (HR-EBSD) to materials without regions that are amenable to the acquisition of backgrounds for static flat fielding (background subtraction) can cause analysis problems. To address this difficulty, the efficacy of electron beam induced deposition (EBID) of material as a source for an amorphous background signal is assessed and found to be practical. Using EBID material for EBSD backgrounds allows single crystal and large-grained samples to be analyzed using HR-EBSD for strain and small angle rotation measurement.
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Goehner, R. P., and J. R. Michael. "Microdiffraction phase identification in the scanning electron microscope (SEM)." Powder Diffraction 19, no. 2 (June 2004): 100–103. http://dx.doi.org/10.1154/1.1757450.

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The identification of crystallographic phases in the scanning electron microscope (SEM) has been limited by the lack of a simple way to obtain electron diffraction data of an unknown while observing the microstructure of the specimen. With the development of charge coupled device (CCD)-based detectors, backscattered electron Kikuchi patterns, alternately referred to as electron backscattered diffraction (EBSD) patterns, can be easily collected. Previously, EBSD has been limited to crystallographic orientation studies due to the poor pattern quality collected with video rate detector systems. With CCD detectors, a typical EBSD can now be acquired from a micron or submicron sized crystal using an exposure time of 1–10 s with an accelerating voltage of 10–40 kV and a beam current as low as 0.1 nA. Crystallographic phase analysis using EBSD is unique in that the properly equipped SEM permits high magnification images, EBSDs, and elemental information to be collected from bulk specimens. EBSD in the SEM has numerous advantages over other electron beam-based crystallographic techniques. The large angular view (∼70°) provided by EBSD and the ease of specimen preparation are distinct advantages of the technique. No sample preparation beyond what is commonly used for SEM specimens is required for EBSD.
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Li, Lili, Sheng Ouyang, Yanqing Yang, and Ming Han. "EBSDL: a computer program for determining an unknown Bravais lattice using a single electron backscatter diffraction pattern." Journal of Applied Crystallography 47, no. 4 (July 19, 2014): 1466–68. http://dx.doi.org/10.1107/s160057671401382x.

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Electron backscatter diffraction (EBSD) patterns provide a wealth of crystallographic information but disappointingly low accuracy. Adopting a strategy of compensating the poor accuracy by the large amount of information, a computer program, EBSDL, has been successfully developed to determine the unknown Bravais lattice of bulk crystalline materials using a single EBSD pattern. Unlike programs that perform phase identification, the new application is completely independent of chemical information.
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DAY, A. P. "Spherical EBSD." Journal of Microscopy 230, no. 3 (June 2008): 472–86. http://dx.doi.org/10.1111/j.1365-2818.2008.02011.x.

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Michael, J. R. "All You Need to Know About Electron Backscatter Diffraction: Orientation is Only the Tip of the Iceberg." Microscopy and Microanalysis 3, S2 (August 1997): 387–88. http://dx.doi.org/10.1017/s1431927600008825.

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This tutorial will describe the technique of electron backscattered diffraction (EBSD) in the scanning electron microscope (SEM). To properly exploit EBSD in the SEM it is important to understand how these patterns are formed. This discussion will be followed by a description of the hardware required for the collection of electron backscatter patterns (EBSP). We will then discuss the methods used to extract the appropriate crystallographic information from the patterns for orientation determination and phase identification and how these operations can be automated. Following this, a number of applications of the technique for both orientation studies and phase identification will be discussed.EBSD in the SEM is a phenomenon that has been known for many years. EBSD in the SEM is a technique that permits the crystallography of sub-micron sized regions to be studied from a bulk specimen. These patterns were first observed over 40 years ago, before the development of the SEM and were recorded using a special chamber and photographic film.
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Vystavěl, Tomáš, Pavel Stejskal, Marek Unčovský, and Chris Stephens. "Tilt-free EBSD." Microscopy and Microanalysis 24, S1 (August 2018): 1126–27. http://dx.doi.org/10.1017/s1431927618006116.

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McCabe, RJ, G. Proust, A. Misra, EK Cerreta, and BL Henrie. "EBSD and Coupled EBSD/TEM Analysis of Zirconium Deformation Mechanisms." Microscopy and Microanalysis 12, S02 (July 31, 2006): 1024–25. http://dx.doi.org/10.1017/s1431927606068899.

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Wright, Stuart I., Matthew M. Nowell, and David P. Field. "A Review of Strain Analysis Using Electron Backscatter Diffraction." Microscopy and Microanalysis 17, no. 3 (March 22, 2011): 316–29. http://dx.doi.org/10.1017/s1431927611000055.

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AbstractSince the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique is primarily due to the capability of EBSD to aid the research scientist in understanding the crystallographic aspects of microstructure. There has been considerable interest in using EBSD to quantify strain at the submicron scale. To apply EBSD to the characterization of strain, it is important to understand what is practically possible and the underlying assumptions and limitations. This work reviews the current state of technology in terms of strain analysis using EBSD. First, the effects of both elastic and plastic strain on individual EBSD patterns will be considered. Second, the use of EBSD maps for characterizing plastic strain will be explored. Both the potential of the technique and its limitations will be discussed along with the sensitivity of various calculation and mapping parameters.
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MORALES, LUIZ FERNANDO GRAFULHA, RUTH HINRICHS, and LUÍS ALBERTO D’ÁVILA FERNANDES. "A Técnica de Difração de Elétrons Retro-Espalhados (EBSD) em Microscópio Eletrônico de Varredura (MEV) e sua Aplicação no Estudo de Rochas Deformadas." Pesquisas em Geociências 34, no. 1 (June 30, 2007): 19. http://dx.doi.org/10.22456/1807-9806.19459.

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The electron backscattered diffraction technique in the scanning electron microscope (EBSD/SEM) is based on the diffraction of a high-energy electron beam by the crystalline structure of a given material, in all possible directions within the sample. Some of the diffracted electrons escape from the specimen with virtually the same initial energy, interact with a phosphorescent screen and the generated EBSP pattern can be picked up with a low-luminosity charge couple device (CCD) camera. These patterns can be indexed using pre-determined patterns for a large variety of minerals, which allows the determination of complete orientation of each single mineral within an aggregate. In this paper we briefly discuss the physical aspects related to the diffraction of an electron beam by crystalline matter and how the EBSP patterns are generated. We also present a short introduction of the necessary instruments to acquire EBSD data, as well as the calibration procedures, acquisition and indexing software of EBSPs. The pitfalls of the technique and possible error sources are also discussed with examples. Considering the scarce availability of literature on geological sample preparation, the polishing method of silicate-rich rocks for EBSP is described in detail in the last part of this paper.
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Engler, O. "Comparison of X-ray and electron backscatter diffraction textures for back-annealed Al–Mg alloys." Journal of Applied Crystallography 42, no. 6 (November 7, 2009): 1147–57. http://dx.doi.org/10.1107/s0021889809041685.

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The potential of electron backscatter diffraction (EBSD) to determine integral macrotexture data is explored by comparing EBSD-derived textures with standard X-ray texture results. The comparison is performed for an Al–Mg alloy AA 5005 in the cold-rolled and various back-annealed states in order to analyse the impact of the microstructural state on the quality of EBSD-based macrotextures. The number of EBSD single orientation measurements necessary to represent a texture adequately is determined by way of exploring the convergence of the statistical parameter ρ, which represents the relative mean square deviation between the EBSD and X-ray-based textures. The effect of EBSD filtering tools and the impact of sampling step size on the statistical significance of EBSD data are investigated. Several means to reduce the number of data points without compromising the accuracy of the texture results as an input for subsequent texture simulation are addressed.
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Dissertations / Theses on the topic "EBSD"

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Amalaraj, Akash Savio. "5D Grain Boundary Characterization from EBSD Microscopy." BYU ScholarsArchive, 2018. https://scholarsarchive.byu.edu/etd/8816.

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Knowledge of the full 5-degree Grain Boundary Character Distribution (GBCD) is vital to understanding properties, such as gas diffusivity, that are dominated by grain boundary character. Surface characterization techniques, such as Electron Backscattered diffraction (EBSD), can provide only 4 of the 5 GB characteristics (the rotation between the neighboring grains, and the trace of the GB on the surface). The inclination of the GB in the direction normal to the surface is not known. A previous study indicated that the GB inclination could be recovered by correlating the Electron Backscattered patterns (EBSPs) of sample points near the GB with EBSPs taken from the centers of the neighboring grains. The resultant transition curve could be compared with theoretical curves obtained from MonteCarlo simulations of electron yield from the two grains. However, a practical method based upon this study was never implemented. Here, a few microscopy and image filters have been applied to the EBSPs to improve the image quality. Also, several experiments have been conducted to verify and validate the interaction volume of the materials used to produce theoretical transition curves, in order to receive more accurate results. In this work, it is hypothesized that transition curves obtained from considering individual band intensities from the EBSPs will give more informative transition curves. The filtered EBSPs from the band intensities coupled with the accurate interaction volume values, should give us more reliable and repeatable transition curves, and that a more detailed comparison of the experimental and simulated transition curves will give higher fidelity results, in terms of GB inclination determination.
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Tong, Vivian Suetto. "EBSD characterisation of heterogeneous microstructures in zirconium alloys." Thesis, Imperial College London, 2016. http://hdl.handle.net/10044/1/55106.

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This thesis explores heterogeneous deformation and grain growth behaviour in zirconium alloys using electron backscatter diffraction techniques. Zirconium alloys are widely used for nuclear power applications and controlling microstructure during manufacture of reactor parts is critical for safe operation of the nuclear reactor. Mechanisms for the formation of abnormally large ‘blocky alpha’ grains in Zircaloy-4, which forms when annealing lightly deformed Zircaloy-4 within the alpha phase, have been explored using uniaxial compression and three point bending. The presence of blocky alpha is a known industrial problem, and adversely affects reactor safety, though there are limited studies addressing this problem. It was found that blocky alpha nucleates via strain induced grain boundary migration and grows via abnormal grain growth. In the presence of a strain gradient, blocky alpha grains nucleate in highly strained regions and grow towards lower strained regions. The final orientations of the blocky alpha grains depend on the pre-annealing strain state. High resolution electron backscatter diffraction (HR-EBSD) has been used to characterise microstructures before and after annealing to produce blocky alpha. To validate observations of increased dislocation density near grain boundaries, the effect of pattern overlap near grain boundaries on accuracy of HR-EBSD measurements is quantified. It was found that HR-EBSD measurements do not produce significant artefacts in this case. A simple calibration model and experiment is described to enable the extent of pattern overlap to be measured in other set-ups. Twinning behaviour in commercially pure zirconium was studied as a function of texture and strain rate. Twin types preferentially activated under high strain rate (10^3 s-1) and quasi-static strain rate (10^-3 s-1) were characterised using electron backscatter diffraction (EBSD) post-processing software. This software was written in-house and explanations of the algorithms used to identify twin boundaries and map intragranular misorientations have been included in this thesis.
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Friedbaum, Samuel Searle. "Studies of Dislocation Density Quantification Via Cross-Correlation EBSD." BYU ScholarsArchive, 2019. https://scholarsarchive.byu.edu/etd/8115.

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One conventional method for studying dislocations uses the Transmission Electron Microscope (TEM), a complex and expensive piece of equipment which requires extensive specimen preparation in order to thin the specimens to electron transparent thickness. Newer High Resolution Electron Backscatter Diffraction (HREBSD) methods of determining geometrically necessary dislocation content via cross-correlation promise to be able to produce estimates of the dislocation density of the sample over a larger area with considerably less preparation time and using a much more accessible instrument. However, the accuracy of the new EBSD technique needs more experimental verification, including consideration of possible changes in the specimen dislocation density due to the different preparation methods. By comparing EBSD and TEM dislocation measurements of Electron Transparent platinum specimens prepared using the Focused Ion Beam (FIB), along with EBSD dislocations measurements of specimens prepared by both FIB and mechanical polishing techniques, this paper seeks to verify the accuracy of the new method and identify any changes in the specimens’ apparent dislocation density caused by the different preparation processes.
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Villert, Sébastien. "Analyse des déformations élastiques locales par la technique EBSD." Saint-Etienne, EMSE, 2008. http://www.theses.fr/2008EMSE0030.

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La quantification locale des contraintes est un axe de recherche majeur dans l'industrie microélectronique. Dans les lignes d'interconnexions de cuivre par exemple, les contraintes résiduelles participent à la formation et à la propagation de phénomènes liés à l'électro-migration, qui nuisent à la fiabilité des lignes. Étant donnée la faible largeur de ces lignes de l'ordre de quelques centaines voire dizaines de nanomètres, il est nécessaire de mettre au point des techniques de mesure des déformations avec une bonne résolution spatiale (inférieure à 50nm). Les contraintes sont alors calculées par application de la loi de comportement du matériau étudié. L'analyse bibliographique de différentes techniques de mesure de déformations élastiques locales montre que l'EBSD offre un des meilleurs compromis entre résolution spatiale et facilité de mise en oeuvre. D'ailleurs, cette technique est déjà utilisée pour caractériser la microstructure des lignes d'interconnexions de cuivre. La mesure de déformations élastiques par EBSD repose sur la comparaison de deux clichés de diffraction (un des clichés sert de référence) par la technique de corrélation d'images numériques. Dans nos travaux, nous reprenons cette méthode et nous en améliorons la précision de mesure. Nous proposons notamment une meilleure procédure de minimisation et optimisons la corrélation d'images. L'utilisation de diagrammes d'EBSD simulés permet dans un premier temps de mettre au point notre méthode et d'en estimer les performances théoriques. Nous étudions en particulier la précision de mesure et la sensibilité à divers paramètres expérimentaux. Ensuite, deux essais spécifiques sont réalisés pour valider notre méthode sur des diagrammes expérimentaux : la flexion quatre points d'un monocristal de silicium et l'étude de dépôts de SiGe sur substrat de silicium. Enfin, notre méthode est appliquée pour déterminer les déformations et rotations dans des lignes d'interconnexions de cuivre. Cette dernière étude révèle la nécessité d'une mesure absolue (c'est-à-dire sans diagramme de référence), pour laquelle nous proposons une perspective encourageante
The quantification of local stresses has become a major field of research for microelectronic industry. In copper interconnects for example, the residual stresses contribute to the formation and growth of voids and hillocks which lead to the interconnect failure. Since the width of interconnects has steadily decreased, strain measurement methods with a good spatial resolution (< 50 nm) are required for device characterization. Several techniques have been recently developed to this aim, such as Convergent Beam Electron Diffraction, KOSSEL micro-diffraction, high resolution X ray diffraction, micro-Raman, Electron BackScatter Diffraction , etc. . . The latter technique offers a good spatial resolution and ease of use. Indeed, it has been already used to study the microstructure of copper interconnects. The elastic strain measurement by EBSD is based on the comparison of two diffraction patterns (one is considered as reference) using digital image cross-correlation. In our work, we also use this approach to which we bring several modifications to improve the measurement accuracy. To this aim, we propose an improved minimisation procedure and we optimised the cross-correlation algorithm. In order to develop and optimise the method, a program which simulates EBSD patterns has been created. This software enables fast simulations of EBSD images for strained materials given that it considers the influence of the displacement gradient tensor (assuming small shape changes). The theoretical performances of the method are so firstly discussed. Then, we realised two specific experiments to validate the method : the four-point bending of a silicone single crystal and the tetragonal distortion of SiGe layers on silicone substrates. Finally, we apply the method to study elastic strains and rigid body rotations in copper interconnects
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Babinský, Tomáš. "Rekrystalizace automatové oceli studované technikou in-situ SEM/EBSD." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2018. http://www.nusl.cz/ntk/nusl-378404.

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Placing recrystallization annealing in a manufacturing proces is often necessary in order to restore plasticity of worked blanks right before working products to its final shape. For better understanding of processes which are taking place in a material during annealing the use of in-situ techniques is favorable. Such observations enable us to watch changes in the materiál in real time at the original spot. Observations at grain-level are ideally made with scanning electron microscope – SEM by electron back-scattered diffraction – EBSD. The technique makes watching nucleation, growth and potential coarsening of recrystallized grains possible. Special construction of a tensile stage allows us to watch changes of a sample during tensile tests which can be used in observing influence of MnS inclusions on plasticity of free-cutting steels. Materials studied in this work are commonly used free-cutting steel 11SMnPb30 and its lead-free alternative 11SMnBi30.
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Ondračka, Václav. "Užití elektronové difrakce k mapování elastického napětí." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2021. http://www.nusl.cz/ntk/nusl-449747.

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Electron backscatter diffraction is a method that is well described and commonly used for orientation image mapping, including grain size estimation. The use of this method for measuring elastic deformation and rotations caused by plastic deformations is not so well decribed. This diploma thesis first describes the typical EBSD system. The information regarding the standard coordinate systems, grain orientation notation and system calibration is then used to create an open-source software for mapping elastic deformations and rotations inside a single grain or a monocrystal. This software uses data acquired during standard EBSD mapping on a commercial system.
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Enstad, Anne-Jorunn. "EBSD-karakterisering av et HSLA-stål under in situ varmebehandling." Thesis, Norges teknisk-naturvitenskapelige universitet, Institutt for materialteknologi, 2011. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-16317.

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Ved sveising av HSLA-stål (High Strength Low Alloy) designet for lavtemperatur applikasjoner kan det dannes lokale sprø soner som martensitt/austenitt-faser (MA-faser). Det er derfor ønskelig å karakterisere austenitten som dannes ved tosykel sveising for å gi økt kunnskap om endringene som oppstår i mikrostrukturen.Denne masteroppgaven tar for seg karakterisering av et 420 MPa HSLA-stål ved in situ varmebehandling opp til tofaseområdet for austenitt og ferritt i kombinasjon med diffraksjon av tilbakespredte elektroner (Electron Backscatter Diffraction - EBSD). Målet med oppgaven var da å karakterisere endringer som oppstår i mikrostrukturen til stålet under in situ oppvarming i mikroskopet. Oppvarmingen ble utført ved å videreutvikle et tidligere varmebord. Stålprøvene ble ènsykel sveisesimulert til 1350 °C og avkjølt med &#916;t8/5. Den in situ varmebehandlingen tilsvarte da den andre sveisesykelen i en tosykel sveisesimulering. Ved prøvepreparering ble prøvene elektropolert med to ulike elektrolytter; Struers A2 og AC2. I oppgaven ble det benyttet offline-EBSD da det var nødvendig med høy skannehastighet slik at tiden for hvert EBSD-skann ble så liten som mulig.For å nå tofaseområdet til HSLA-stålet var det nødvendig å varme opp til en prøvetemperatur på over 740 °C. Da ovnen har en maksimaltemperatur på 800 °C ble det benyttet en vakuumkompatibel platinamaling mellom prøven og ovnen i varmebordet for å øke varmeledningen. Temperaturforskjellen mellom prøven og ovnen ble da reduseres helt ned til 10 °C. Det ble varmet opp til prøvetemperaturer på 750 °C, 760 °C, 770 °C, 780 °C og 790 °C. Det var nødvendig å vente i 10 minutter etter å ha nådd ønsket prøvetemperatur før det ble kjørt EBSD på grunn av termisk ekspansjon av prøven.Austenitten som ble dannet under oppvarming vokste frem langs korngrenser og hadde en orienteringssammenheng med BCC-matriksen rundt som oppfyller Kurdjomov-Sachs. Det ble observert at austenitten som dannes gradvis forsvant igjen ved økende holdetid ved høy temperatur som følge av avdamping av karbon fra prøveoverflaten. Ved oppvarming viste det seg at det ble dannet en mye større andel austenitt i prøver elektropolert med Struers AC2 enn den med Struers A2. Det ble da konstruert fasediagram for tofaseområdet til stålet på bakgrunn av andel dannet austenitt ved oppvarming. Disse viste at prøver elektropolert med Struers A2 gav mest korrekt andel austenitt.
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Rølvåg, Line Kathinka Fjellstad. "EBSD undersøkelser og in situ strekktesting av stål i SEM." Thesis, Norges teknisk-naturvitenskapelige universitet, Institutt for materialteknologi, 2012. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-19246.

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Denne masteroppgaven har tatt for seg undersøkelser av stål designet for lavtemperaurappliksjoner ved bruk av elektronmikroskop i kombinasjon med diffraksjon av tilbakespredte elektroner (Electron Backscatter Diffraction - EBSD). Målet med oppgaven var å bruke EBSD-teknikken i kombinasjon med in situ deformasjon og en spesiallaget kaldfinger for å kunne studere materialene ved lave temperaturer. To ulike stål ble undersøkt; et smidd finkornet strukturelt stål (F70) og et varmvalset supermartensittisk rustfritt stål (Supermartensitic Stainless Steel - SMSS).F70-stålet ble sveisesimulert for å oppnå en mikrostruktur tilsvarende interkritisk grovkornet HAZ (Heat Affected Zone). Dette ble gjort ved en tosykel sveisesimulering. Prøvestaver av materialet ble varmet opp med en ønsket makstempertur på Tp1= 1350°C og Tp2= 780°C. For å undersøke effekten av ulike avkjølingshastigheter ble halvparten av prøvestavene avkjølt med Dt8/5 = 5 sekund, og den andre halvparten med Dt8/5 = 15 sekund. Ved sveising av stål kan det dannes lokale sprø soner som martensitt/austenitt-faser (MA-faser). Bilder tatt i lysmikroskop viser at strukturen til sveisesimulert F70-stål består av martensitt og noe bainitt. MA-faser er lokalisert langs korngrensene.EBSD-teknikken krever at materialet på forhånd gjennomgår en tilfredsstillende prøvepreparering for å gi gode resultater. Det var tidligere etablert en tilfredsstillende prepareringsteknikk for SMSS. I denne oppgaven ble to ulike prepareringsmetoder testet på sveisesimulerte prøver av F70-stål, som er et forholdsvis nytt materiale. Metodene som ble testet var ionesputtering og elektropolering. Preparerte prøver ble undersøkt med EBSD for å analysere kvaliteten på prepareringen. Det viste seg at MA-fasene reagerte annerledes på prepareringen enn resten av strukturen, og det var derfor vanskelig å få disse fram på EBSD-skann. De to prepareringsmetodene ga også forskjellige utfall for andel austenitt (g-fase) i stålet. Da det i hovedsak er MA-fasene som er interessante ved in situ undersøkelser ble det besluttet å ikke gjennomføre disse på F70-stålet, da en tilfredsstillende preparering må etableres først. Ved bruk av EBSD-teknikken kan orienteringsdataene som lagres behandles i programvaren TSL OIM Analysis 5.32, som tilbyr ulike renseoperasjoner. Grain CI Standarization gir alle punktene i et korn, innenfor en gitt vinkeltoleranse, samme CI-verdi som den maksimale CI-verdien funnet blant punktene i dette kornet. Det er også mulig å legge på et CI-filter som fjerner alle punkter med en CI &#8804; 0,05, og erstatter disse med svarte eller grå piksler. Effekten av disse to operasjonene ble undersøkt på et EBSD-skann av SMSS tatt ved romtemperatur, uten noe form for deformasjon. Renseoperasjonene førte til at 8,1 % av alle punkter ble fjernet. 3,8 % av disse var av g-fasen, som utgjør kun 17,3 % av skannet før renseoperasjonene ble benyttet. Punkter som fjernes ligger i hovedsak i forbindelse med korngrenser eller øyer av restaustenitt. For SMSS som inneholder rundt 20 vol.% restaustenitt i opprinnelig (dvs. interkristisk glødet) tilstand, ble det gjennomført undersøkelser av deformasjonsindusert fasetransformasjon ved bruk av in situ strekktesting med påfølgende EBSD karakterisering. Undersøkelsene ble utført ved romtemperatur og -80°C. Et spesiallaget strekkbord ble montert på SEM (Scanning Electron Microscope) stagen med prøven fastmontert, og en kaldfinger ble brukt for å kjøle ned prøven. EBSD karakteriseringen ble foretatt uten deformasjon og ved 1, 2, 3 og 4 % forlengelse. En sammenligning av resultatene ved romtemperatur og -80°C ble deretter utført. Det ble konkludert med at øyer av restaustenitt transformeres til martensitt som følge av plastisk deformasjon i større grad ved -80°C, som følge av høyere termodynamiske drivkrefter for reaksjonen. Ved romtemperatur var det mulig å verifisere at martensitten som ble dannet oppfyller Kurdjomov-Sachs kriteriet som beviser at den er korrekt indisert. Dette var vanskelig å verifisere for lavtemperatursforsøkene, da skannene har en mye lavere kvalitet.
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Ng, Christopher 1983. "Determination of special boundary coordination at quadruple nodes using EBSD." Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/32845.

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Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2005.
Includes bibliographical references (leaf 21).
Grain boundaries are known to play an important role in materials properties including corrosion and cracking resistance. Some grain boundaries are resistant to corrosion and cracking and are known as "special" boundaries. While the structure of individual grain boundaries is important, the connectivity of the grain boundaries largely determines the properties of a bulk material. The coordination and connectivity of special grain boundaries have previously been studied in two dimensional grain boundary networks and are quantified by the triple junction distribution (TJD), which has been found to be non-random. The study of connectivity has been extended to three dimensions and simulations have previously been done to obtain a quadruple node distribution (QND) which was also non-random. Using Electron Back-Scattered Diffraction to characterize grain boundaries in copper and aluminum, this project obtains an experimental quadruple node distribution and verifies that it too is non-random.
by Christopher Ng.
S.B.
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Kacher, Josh. "Cross-correlation-based texture analysis using kinematically simulated EBSD patterns /." Diss., CLICK HERE for online access, 2009. http://contentdm.lib.byu.edu/ETD/image/etd2994.pdf.

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Books on the topic "EBSD"

1

Ebéd a kastélyban. Budapest: Szépirodalmi Könyvkiadó, 1985.

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Han'guk Kyoyuk Pangsong Kongsa. Mirae Hakkyo Chejakchin. Mirae hakkyo: EBS tak'yup'ŭraim. [Seoul]: Green House (Kŭrin Hausŭ), 2019.

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Han'guk Kyoyuk Pangsong Kongsa. "Tong kwa Sŏ" Chejakt'im, ed. Tong kwa Sŏ: EBS tak'yument'ŏri. Sŏul-si: Yedam, 2008.

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EBS dak'yument'ori ch'oego ŭi kyosu. Sŏul-si: Yedam, 2008.

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United States. Bureau of Labor Statistics, ed. ECI/EBS integration collection workbook. [Washington, D.C.?: Bureau of Labor Statistics, 1989.

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Yakup, Kara, Kutluer İlhan 1957-, and ʻĀmirī, Abū al-Ḥasan Muḥammad ibn Yūsuf, eds. Kitâbu'l-emed ale'l-ebed: Sonsuzluk peşinde (metin-çeviri). İstanbul: Türkiye Yazma Eserler Kurumu Başkanlığı, 2013.

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EBS (Saebpangsong 60-pun pumo) Chejakt'im. EBS 60-pun pumo: Sŏngjang paltalp'yŏn. Sŏul T'ŭkpyŏlsi: Chisik Ch'aenŏl, 2010.

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United States. Bureau of Labor Statistics. Office of Survey Processing. Division of Directly Collected Periodic Surveys. EBS ECI integration benefits reference guide. Washington, DC: U.S. Department of Labor, Bureau of Labor Statistics, Division of Directly Collected Periodic Surveys, Office of Survey Processing, 1989.

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United States. Bureau of Labor Statistics. Office of Survey Processing. Division of Directly Collected Periodic Surveys, ed. EBS ECI integration benefits reference guide. Washington, DC: U.S. Dept. of Labor, Bureau of Labor Statistics, Division of Directly Collected Periodic Surveys, Office of Survey Processing, 1989.

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Han'guk Kyoyuk Pangsong Kongsa. "Hakkyo ŭi Kobaek" Chejakt'im. Hakkyo ŭi kobaek: EBS kyoyuk taegihoek. Sŏul-si: Pukhausŭ, 2013.

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Book chapters on the topic "EBSD"

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Bauch, Jürgen, and Rüdiger Rosenkranz. "EBSD - KIKUCHI-Beugung." In Physikalische Werkstoffdiagnostik, 56–57. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-662-53952-1_28.

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Macherauch, Eckard, and Hans-Werner Zoch. "V91 Rückstreuelektronenbeugung (EBSD)." In Praktikum in Werkstoffkunde, 719–24. Wiesbaden: Springer Fachmedien Wiesbaden, 2019. http://dx.doi.org/10.1007/978-3-658-25374-5_91.

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Macherauch, Eckard, and Hans-Werner Zoch. "V92 Rückstreuelektronenbeugung (EBSD)." In Praktikum in Werkstoffkunde, 723–28. Wiesbaden: Springer Fachmedien Wiesbaden, 2014. http://dx.doi.org/10.1007/978-3-658-05038-2_92.

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Eades, Alwyn. "EBSD: Buying a System." In Electron Backscatter Diffraction in Materials Science, 123–26. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_10.

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Farrer, Jeffrey K., Joseph R. Michael, and C. Barry Carter. "EBSD of Ceramic Materials." In Electron Backscatter Diffraction in Materials Science, 299–318. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_24.

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Wright, Stuart I. "Fundamentals of Automated EBSD." In Electron Backscatter Diffraction in Materials Science, 51–64. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_5.

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Eades, Alwyn, Andrew Deal, Abhishek Bhattacharyya, and Tejpal Hooghan. "Energy Filtering in EBSD." In Electron Backscatter Diffraction in Materials Science, 53–63. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-88136-2_4.

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King, Wayne E., James S. Stölken, Mukul Kumar, and Adam J. Schwartz. "Strategies for Analyzing EBSD Datasets." In Electron Backscatter Diffraction in Materials Science, 153–70. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_14.

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Randle, V. "Preparation for an EBSD Investigation." In Microtexture Determination and Its Applications, 41–58. London: CRC Press, 2023. http://dx.doi.org/10.1201/9781003423980-4.

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Wright, Stuart I., David P. Field, and David J. Dingley. "Advanced Software Capabilities for Automated EBSD." In Electron Backscatter Diffraction in Materials Science, 141–52. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3205-4_13.

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Conference papers on the topic "EBSD"

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Noell, Philip, Jeffrey Rodelas, Davis Wilson, Jay Carroll, Brad Boyce, and Joseph Michael. "Characterizing Plasticity and Failure using In-situ EBSD." In Proposed for presentation at the EBSD 2022 in ,. US DOE, 2022. http://dx.doi.org/10.2172/2003321.

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de Kloe, Rene. "EBSD pattern analysis beyond band detection." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.1211.

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"Focused Beams for use in EBSD." In Microscience Microscopy Congress 2023 incorporating EMAG 2023. Royal Microscopical Society, 2023. http://dx.doi.org/10.22443/rms.mmc2023.12.

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Geiss, Roy H., David T. Read, Glenn B. Alers, Rebekah L. Graham, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, et al. "EBSD Analysis of Narrow Damascene Copper Lines." In FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009. AIP, 2009. http://dx.doi.org/10.1063/1.3251212.

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Currier, Ryan, Paulo J. Hidalgo, and Kaitlyn Hulsey. "FABRIC CUT EFFECT: AN EBSD CAUTIONARY TALE." In Joint 56th Annual North-Central/ 71st Annual Southeastern Section Meeting - 2022. Geological Society of America, 2022. http://dx.doi.org/10.1130/abs/2022nc-375701.

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Sørensen, Bjørn Eske, Ralf Hielscher, and David Mainprice. "EBSD AND OPTICAL MICROSCOPE LINKED THROUGH OPTICAL MODELLING OF CRYSTALLOGRAPHICAL DATA FROM EBSD AND 3D VISUALIZATION OF OPTICAL PROPERTIES." In GSA Annual Meeting in Indianapolis, Indiana, USA - 2018. Geological Society of America, 2018. http://dx.doi.org/10.1130/abs/2018am-319633.

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Bjørge, Ruben. "EBSD of granitic quartz exposed to electric field." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.307.

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Essex, S. D., M. D. G. Potter, R. Vann, S. Dixon, Donald O. Thompson, and Dale E. Chimenti. "UTILIZING EBSD TO VALIDATE AND UNDERSTAND NDE TECHNIQUES." In REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION: Proceedings of the 35th Annual Review of Progress in Quantitative Nondestructive Evaluation. AIP, 2009. http://dx.doi.org/10.1063/1.3114095.

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Michael, Joseph. "Introduction to EBSD: Current Issues in Data Presentation." In Proposed for presentation at the Canadian Center for Electron Microscopy Summer School on Electron and Ion Microscopy (virtual) held June 7-11, 2021 in Hamilton, Ontario, Canada. US DOE, 2021. http://dx.doi.org/10.2172/1870763.

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Рыбин, В. В., С. Н. Петров, Н. Ю. Золоторевский, Э. А. Ушанова, and А. В. Цеменко. "Применение метода EBSD-анализа для аттестации структур в материаловедении." In XXVIII Российская конференция по электронной микроскопии и VI школа молодых учёных "Современные методы электронной, зондовой микроскопии и комплементарные методы в исследованиях наноструктур и наноматериалов". Crossref, 2020. http://dx.doi.org/10.37795/rcem.2020.12.16.067.

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Reports on the topic "EBSD"

1

Isabella J Van Rooyen. EBSD characterization of tubular cladding plastici. Office of Scientific and Technical Information (OSTI), March 2013. http://dx.doi.org/10.2172/1084654.

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Vuong, Mai Phuong, Helmut Schaeben, and Florian Bachmann. Topological grain boundary reconstruction from 3D EBSD data. Cogeo@oeaw-giscience, September 2011. http://dx.doi.org/10.5242/iamg.2011.0239.

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Mingard, K. P. The use of EBSD for analysis of additively manufactured materials. National Physical Laboratory, February 2023. http://dx.doi.org/10.47120/npl.mgpg152.

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Messing, Gary L. DURIP 00 Electron Backscatter Diffraction (EBSD) System for Crystallographic Imaging in a SEM. Fort Belvoir, VA: Defense Technical Information Center, August 2001. http://dx.doi.org/10.21236/ada388575.

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Tong, V., and K. P. Kingard. Uncertainties in scanning electron microscopy - dimensional measurement calibration and angular measurement with EBSD. National Physical Laboratory, April 2024. http://dx.doi.org/10.47120/npl.mat125.

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Di Lemma, Fidelma. NSUF Report EBSD analyses on metallic fuel samples: tips and improvements in sample preparation. Office of Scientific and Technical Information (OSTI), June 2022. http://dx.doi.org/10.2172/2314983.

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Raman, Aishwarya, Susannah Burrows, Ethan King, and Lisa Bramer. EBSD seed LDRD project: Does Corona Virus – 2019 (COVID-19) and Seasonal Flu have similar meteorology and air quality controls driving their spread? Office of Scientific and Technical Information (OSTI), December 2020. http://dx.doi.org/10.2172/2336792.

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McClelland, Zackery, Haley Peterson, and Kyle Dunsford. Dynamic tensile behavior of laser-directed energy deposition and additive friction stir-deposited AerMet 100. Engineer Research and Development Center (U.S.), February 2024. http://dx.doi.org/10.21079/11681/48177.

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Abstract:
Quasi-static and high-rate tensile experiments were used to examine the strain rate sensitivity of laser-directed energy deposition (L-DED)- and additive friction stir deposition (AFSD)-formed AerMet 100 ultrahigh-strength steel-additive manufactured builds. Electron backscattered diffraction (EBSD) revealed similar as-deposited grain sizes between the two AM processes at approximately 24 μm and 17 μm for the L-DED and AFSD samples, respectively. The strain hardening rate, θ, revealed little change in the overall hardening observed in the L-DED and AFSD materials, with a consistent hardening in the quasi-static samples and three identifiable regions in that of the high-rate tested materials. The LDED deposited materials displayed average ultimate tensile strength values of 1835 and 2902 MPa for the 0.001 s−1 and 2500 s−1 strain rates, respectively and the AFSD deposited materials displayed ultimate tensile strength values of 1928 and 3080 MPa for the 0.001 s−1 and 2500 s−1 strain rates, respectively. Overall, the strength for both processes displayed a positive strain rate sensitivity, with increases in strength of ~1000 MPa for both processes. Fractography revealed significant solidification voids in the laser DED material and poor layer adhesion in the AFSD material.
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Vogt, B. M. ,. Sorensen, J. H. Preparing EBS messages. [Emergency Broadcast System (EBS)]. Office of Scientific and Technical Information (OSTI), September 1992. http://dx.doi.org/10.2172/7226687.

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Vogt, B. M. ,. Sorensen, J. H. Preparing EBS messages. Office of Scientific and Technical Information (OSTI), September 1992. http://dx.doi.org/10.2172/10185023.

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