Academic literature on the topic 'Durcissement au rayonnement'
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Journal articles on the topic "Durcissement au rayonnement":
Estre, Nicolas, Daniel Eck, Frédéric Moutet, Emmanuel Payan, Alix Sardet, Roberto Gaggiano, and Maarten van Geet. "Identification de matériaux par tomodensitométrie haute-énergie dans des objets bétonnés." e-journal of nondestructive testing 28, no. 9 (September 2023). http://dx.doi.org/10.58286/28488.
Dissertations / Theses on the topic "Durcissement au rayonnement":
Santos, Filipe Vinci dos. "Techniques de conception pour le durcissement des circuits intégrés face aux rayonnements." Grenoble 1, 1998. http://www.theses.fr/1998GRE10208.
Vaillé, Jean-Roch. "Développement, caractérisation et durcissement d'un dosimètre base sur la luminescence stimulée optiquement destiné aux applications spatiales." Montpellier 2, 2003. http://www.theses.fr/2003MON20161.
Durand, Renaud. "Modélisation des effets de dose dans les circuits intégrés en environnement spatial." Toulouse, ISAE, 2007. http://www.theses.fr/2007ESAE0016.
Roume, Chantal. "Synthèse de monomères multiépoxydes et de leurs dérivés acryliques à propriétés thermiques améliorées." Montpellier 2, 1991. http://www.theses.fr/1991MON20039.
Zerarka, Moustafa. "Étude des régimes extrêmes de fonctionnement en environnement radiatif des composants de puissance en vue de leur durcissement pour les applications aéronautiques et spatiales." Phd thesis, Université Paul Sabatier - Toulouse III, 2013. http://tel.archives-ouvertes.fr/tel-00874051.
Almeida, Dos Santos Douglas. "Développement d'un processeur durci sur architecture RISC-V pour applications en environnement sévère." Electronic Thesis or Diss., Université de Montpellier (2022-....), 2023. http://www.theses.fr/2023UMONS089.
This thesis explores the development and characterization of the HARV processor and its HARV-SoC version, specifically designed for operation in harsh environments. It begins by highlighting the challenges posed by harsh environments, particularly the impact of radiation on electronic devices and systems. The thesis categorizes harsh environments into space, atmospheric, and artificial radiation environments, each with its unique characteristics.In the artificial radiation environments, various experimental facilities are described, which provide different particle spectra, including neutrons, protons, and mixed fields. The thesis delves into the radiation effects on electronic devices, covering cumulative effects like total ionizing dose (TID) and displacement damage (DD), as well as single events leading to errors and system failures.The research introduces the RISC-V Instruction Set Architecture (ISA) as a widely adopted processor architecture known for its regular instruction formatting, cost-effective instruction decoding, and modular flexibility. The thesis emphasizes the importance of reliability in using processors in harsh environments and discusses techniques for error detection and correction, including spatial, temporal, and information redundancy.Acknowledging the increasing use of RISC-V processors in critical applications, the thesis summarizes related work, positioning HARV-SoC in the context of the latest developments. It then delves into the implementation of HARV, the initial version of the processor, emphasizing microarchitecture-level fault tolerance. Register protection using error-correcting codes and triple modular redundancy is highlighted.The work extends to developing an SoC with a multi-cycle architecture, allowing for more complex applications while maintaining essential peripherals. Fault injection simulations are conducted to analyze fault models comprehensively. Observability mechanisms are introduced to prepare HARV-SoC for experiments in particle accelerators, enabling a detailed analysis of errors within the processor, particularly with neutron radiation.Recognizing the limitations of error counters, an error handler is implemented to temporarily store information about detected errors. This information is reported to applications through exceptions, facilitating detailed error analysis and responses. The design is thoroughly characterized and evaluated in experiments involving various radiation environments.The analysis expands to testing operating systems and using software recovery techniques. In conclusion, the thesis comprehensively explores radiation-tolerant processors for harsh environments, providing valuable insights and techniques to enhance system reliability and performance in challenging scenarios
Zerarka, Moustafa. "Étude des régimes extrêmes de fonctionnement en environnement radiatif des composants de puissance en vue de leur durcissement pour les applications aéronautiques et spatiales." Phd thesis, Toulouse 3, 2013. http://thesesups.ups-tlse.fr/2149/.
This work deals with the reliability of electronic components such as power MOSFETs and IGBTs affected by Radiative Natural Environment. Nowadays, this problem is considered to be part of the component reliability. While it concerned initially with components which work in severe radiation environment for aerospace, the evolution and complexity of embedded electronics that can interact with this environment which have potentially damaging effects lead us to take these radiative constraints into account as the case of heavy ion. From this scope this work was conducted. Simulations were carried out with Synopsys TCAD simulator in order to give a better understanding of the failure mechanisms such as the Single Event Burnout (SEB) or Single Event Latchup and to define the criteria of triggering, the behavior and the sensitivity of different structure (VDMOS, SJ-MOSFET, IGBT planar and IGBT trench). This study allows us to propose and evaluate hardening solutions in design against the triggering phenomena related to the parasites structures
Delacour, Pascal. "Etude en microscopie analytique par transmission d'alliages renforcés par oxydation interne et de martensites du système Cu-Al. Importance du coherent bremsstrahlung dans la microanalyse X de ces alliages." Rouen, 1994. http://www.theses.fr/1994ROUES073.
Monnier, Thierry. "Durcissement de circuits convertisseurs A/N rapides fonctionnant en environnement spatial." Montpellier 2, 1999. http://www.theses.fr/1999MON20112.
Pepitone, Kévin. "Etude de la production, de la propagation et de la focalisation d'un faisceau d'électrons impulsionnel intense." Thesis, Bordeaux, 2014. http://www.theses.fr/2014BORD0158/document.
The electron beam (500 keV, 30 kA, 100 ns) of the RKA (Relativistic Klystron Amplifier) generator is used to study materials under shocks at low fluences (< 10 cal/cm²). Their response depends on the beam characteristics at the impact location, mainly in terms of spatial homogeneity. We have used electrical diagnostics as well as an optical diagnostics where the visible photons produced by Cerenkov emission in a silica target are collected by fast cameras. Beam homogeneity has been studied in the vacuum diode as a function of the materials used for the cathode and the anode. Beam propagation and focusing in a chamber filled with a low-pressure gas has also been investigated.Each part of the installation has been optimized during this work. We found that, among the tested materials, a velvet cathode with well-aligned fibers is the best emitter. An anode of thickness about ten micrometers improves the beam homogeneity by scattering of electrons. Next, we focused on beam propagation and focusing in the chamber. For example, a 400 keV, 4.2 kA electron beam can be propagated at constant radius in argon at 0.7 mbar. We performed simulations with the Monte Carlo code Geant4 in order to compute the beam interaction with the Cerenkov target as well as with the anode. Beam emission and propagation were simulated with the PIC code Magic. The good agreement with the experimental results allows us to estimate the electron distributions at any position along the beam path in order to initialize correctly the computation of the beam-material interaction