Academic literature on the topic 'DPT test'

The object of the thesis is soils that occur within the territory of Lithuania and may be used as basis for building foundations. The thesis studies the interpretation of the results of Dynamic Penetration Test (DPT) and Cone Penetration Test (CPT) of soils, reliability of direct (number of blows (Nx)) and de-rivative (dynamic point resistance (qd)) DPT parameters, analyses the result influencing factors and interrelation between DPT and CPT parameters. The data analysis has been performed by means of mathematical methods of statistics, also using analytical and empirical solutions. Having examined calculation data it was determined that the indirect parameter of Dy-namic Penetration Test – dynamic point resistance (qd) should not be used due to calculation de-faults and replaced with the direct parameter – number of blows (Nx). The analysis of DPT re-sults influencing factors shows that the lateral overburden pressure together with friction of rods are those with the greatest impact on penetration data. Within the scope of the work, it has re-vealed that the number of blows (Nx) and static cone resistance (qc) are closely correlated and it depends on the grain size distribution of soil, geotechnical properties and depth of occurrence.<br>Disertacijos objektas yra Lietuvos teritorijoje slūgsantys gruntai, kurie gali būti statinių pamatų pagrindu. Disertacijoje nagrinėjama grunto tyrimo dinaminiu (DPT) ir statiniu (CPT) zondavimu rezultatų interpretacija, tiesioginio (smūgių skaičiaus (Nx)) ir išvestinio (dinaminės kūgio smigos (qd)) DPT rodiklių patikimumas, analizuojami rezultatus įtakojantys veiksniai ir sąsajos tarp DPT bei CPT zondavimo rodiklių. Duomenų analizė atlikta matematiniais statistiniais metodais, taip pat panaudojant analitinius ir empirinius sprendinius. Išnagrinėjus skaičiavimo duomenis buvo nustatyta, kad netiesioginis dinaminio zonda-vimo rodiklis – dinaminė kūgio smiga (qd) dėl skaičiavimo trukumų yra nenaudotinas ir keisti-nas į tiesioginį rodiklį – smūgių skaičių (Nx). DPT rezultatus įtakojančių veiksnių analizė paro-dė, kad zondavimo duomenims didžiausią įtaką turi gruntų šoninis geostatinis slėgis ir kartu zondavimo štangų trintis į gruntą. Darbo metu buvo gauta, kad egzistuoja tamprus koreliacinis ryšys tarp smūgių skaičiaus (Nx) ir statinės kūgio spraudos (qc), kuris priklauso nuo grunto gra-nuliometrinės sudėties, mechaninių savybių ir slūgsojimo gylio.

The development of a reliable, and cost-effective in-situ method for characterizing the liquefaction potential of gravelly soils is a considerable challenge for engineers and researchers. The ability to accurately characterize the liquefaction potential of gravelly soils is an important consideration at port facilities and dams for example. The Dynamic Penetration Test (DPT) provides a reliable and cost-effective method for evaluating the liquefaction resistance of gravelly soils. Probabilistic liquefaction triggering curves based on DPT field data have been developed from data collected at 47 sites in China. However, using the DPT-based liquefaction curves for locations outside of the Chengdu plain in China where the data for the triggering curves were gathered may yield unreliable results. To improve the reliability of the DPT-based liquefaction triggering curves additional DPT field data form outside of the Chengdu plain is required. In total seven new non-liquefaction DPT case histories are presented in this report. Two of the case histories are based on DPT field data from Valdez, Alaska. The remaining five case histories were developed from DPT field data from L'Aquila, Italy. When plotted on the liquefaction triggering curves based only on the DPT data obtained in the Chengdu plain three of the seven data points plot in a position that indicates a considerable possibility of liquefaction despite these case histories being from locations where liquefaction did not occur. Roy (2021) developed new DPT-based liquefaction triggering curves with these seven new non-liquefaction case histories, DPT filed data from other sites around the world, and the DPT field data from the Chengdu plain. The three data points from the new case histories presented in this report that had a considerable probability of liquefaction when plotted on the curve developed only with the data from the Chengdu plain had a significantly lower probability of liquefaction when plotted on the new DPT-based liquefaction triggering curves. One of the data points from Valdez, Alaska decreased from a probability of liquefaction of around 50% to a probability of liquefaction of less than 30% when plotted on the new DPT-based liquefaction triggering curves. The reliability of DPT-based liquefaction triggering curves will continue to increase as the amount of available DPT data increases.

Disertacijos objektas yra Lietuvos teritorijoje slūgsantys gruntai, kurie gali būti statinių pamatų pagrindu. Disertacijoje nagrinėjama grunto tyrimo dinaminiu (DPT) ir statiniu (CPT) zondavimu rezultatų interpretacija, tiesioginio (smūgių skaičiaus (Nx)) ir išvestinio (dinaminės kūgio smigos (qd)) DPT rodiklių patikimumas, analizuojami rezultatus įtakojantys veiksniai ir sąsajos tarp DPT bei CPT zondavimo rodiklių. Duomenų analizė atlikta matematiniais statistiniais metodais, taip pat panaudojant analitinius ir empirinius sprendinius. Išnagrinėjus skaičiavimo duomenis buvo nustatyta, kad netiesioginis dinaminio zonda-vimo rodiklis – dinaminė kūgio smiga (qd) dėl skaičiavimo trukumų yra nenaudotinas ir keisti-nas į tiesioginį rodiklį – smūgių skaičių (Nx). DPT rezultatus įtakojančių veiksnių analizė paro-dė, kad zondavimo duomenims didžiausią įtaką turi gruntų šoninis geostatinis slėgis ir kartu zondavimo štangų trintis į gruntą. Darbo metu buvo gauta, kad egzistuoja tamprus koreliacinis ryšys tarp smūgių skaičiaus (Nx) ir statinės kūgio spraudos (qc), kuris priklauso nuo grunto gra-nuliometrinės sudėties, mechaninių savybių ir slūgsojimo gylio.<br>The object of the thesis is soils that occur within the territory of Lithuania and may be used as basis for building foundations. The thesis studies the interpretation of the results of Dynamic Penetration Test (DPT) and Cone Penetration Test (CPT) of soils, reliability of direct (number of blows (Nx)) and de-rivative (dynamic point resistance (qd)) DPT parameters, analyses the result influencing factors and interrelation between DPT and CPT parameters. The data analysis has been performed by means of mathematical methods of statistics, also using analytical and empirical solutions. Having examined calculation data it was determined that the indirect parameter of Dy-namic Penetration Test – dynamic point resistance (qd) should not be used due to calculation de-faults and replaced with the direct parameter – number of blows (Nx). The analysis of DPT re-sults influencing factors shows that the lateral overburden pressure together with friction of rods are those with the greatest impact on penetration data. Within the scope of the work, it has re-vealed that the number of blows (Nx) and static cone resistance (qc) are closely correlated and it depends on the grain size distribution of soil, geotechnical properties and depth of occurrence.

Compte tenu de la complexité des circuits intégrés de nos jours et des nœuds technologiques qui ne cessent pas de diminuer, être au rendez-vous avec les demandes de design, test et fabrication des dispositifs de haute qualité est devenu un des plus grands défis. Avoir des circuits intégrés de plus en plus performants devrait être atteint tout en respectant les contraintes de basse consommation, de niveaux de fiabilité demandés, de taux de défauts acceptables ainsi que du bas coût. Avec ce fascinant progrès de l’industrie des semi-conducteurs, les processus de fabrication sont devenus de plus en plus difficile à contrôler, ce qui rend les puces électroniques de nos jours plus disposés aux défauts physiques. Le test était et restera l’unique solution pour lutter contre l’occurrence des défauts de fabrication ; même il est devenu un facteur prédominant dans le coût totale de fabrication des circuits intégrés. Même si des solutions de test, qui existent déjà, étaient capables de satisfaire ce fameux compromis coût-qualité ces dernières années, il arrive d’observer encore des mécanismes de défauts malheureusement incontrôlables. Certains sont intrinsèquement reliés au processus de fabrication en lui-même. D’autres reviennent sans doute aux pratiques de test et surtout quand on analyse le taux de défauts détectés et le niveau de fiabilité atteint.L’objectif principal de cette thèse est d’implémenter des stratégies de test robustes et efficaces qui répondent aux lacunes des techniques de tests classiques et qui proposent des modèles de fautes plus réalistes et répondent au mieux aux attentes des fournisseurs. Dans l’objectif d’améliorer l’efficacité de test en termes de coût, capacité de couverture de faute, nous présentons divers contributions significatives qui touchent différents domaines entre-autres le test sur le terrain, les tests à hautes fréquences sous contraintes de puissance et finalement le test des chaines de scan.La partie majeure de cette thèse était consacrée pour le développement de nouvelles techniques de tests fonctionnels ciblant les systèmes à processeurs.Les méthodologies appliquées couvrent les problèmes de test sur terrain aussi bien que les problèmes de test de fabrication. Dans le premier cas, la techniques adoptée consiste à fusionner et compacter un ensemble initial de programmes fonctionnels afin d’atteindre une couverture de faute satisfaisante tout en respectant les contraintes du test sur terrain (temps de test réduit et ressource mémoire limitée). Cependant dans le deuxième cas, comme nous avons assez d’informations sur la structure du design, nous proposons un nouveau protocole de test qui va exploiter l’architecture de test existante. Dans ce contexte, nous avons validé et confirmé la relation complémentaire qui joint le test fonctionnel avec le test structurel. D’autres part, cette prometteuse approche assure un test qui respecte les limites de la consommation fonctionnelle et donc une fiabilité meilleure.La dernière contribution de cette thèse accorde toute l’attention à l’amélioration de test de la structure DFT « Design For Test » la plus utilisée qui est la chaîne de scan. Nous présentons dans cette contribution une approche de test qui cible les défauts physiques au sein de la cellule en elle-même.Cette approche représente une couverture de défauts meilleure et une longueur de test plus réduit si nous la comparons avec l’ATPG classique ciblant les mêmes défauts « Intra-cell defect ATPG ».Comme résultat majeur de cette efficace solution de test, nous avons observé une amélioration de 7.22% de couverture de défaut accompagné d’une réduction de 33.5% du temps de test en comparaison avec la couverture et le temps du test atteints par le « Cell-awer ATPG »<br>In light of the aggressive scaling and increasing complexity of digital circuits, meeting the demands for designing, testing and fabricating high quality devices is extremely challenging.Higher performance of integrated circuits needs to be achieved while respecting the constraints of low power consumption, required reliability levels, acceptable defect rates and low cost. With these advances in the SC industry, the manufacturing process are becoming more and more difficult to control, making chips more prone to defects.Test was and still is the unique solution to cover manufacturing defects; it is becoming a dominant factor in overall manufacturing cost.Even if existing test solutions were able to satisfy the cost-reliability trade-off in the last decade, there are still uncontrolled failure mechanisms. Some of them are intrinsically related to the manufacturing process and some others belong to the test practices especially when we consider the amount of detected defects and achieved reliability.The main goal of this thesis is to implement robust and effective test strategies to complement the existing test techniques and cope with the issues of test practices and fault models. With the objective to further improve the test efficiency in terms of cost and fault coverage capability, we present significant contributions in the diverse areas of in-field test, power-aware at-speed test and finally scan-chain testing.A big part of this thesis was devoted to develop new functional test techniques for processor-based systems. The applied methodologies cover both in-field and end-of manufacturing test issues. In the farmer, the implemented test technique is based on merging and compacting an initial functional program set in order to achieve higher fault coverage while reducing the test time and the memory occupation. However in the latter, since we already have the structure information of the design, we propose to develop a new test scheme by exploiting the existing scan chain. In this case we validate the complementary relationship between functional and structural testing while avoiding over as well under-testing issues.The last contribution of this thesis deals with the test improvement of the most used DFT structure that is the scan chain. We present in this contribution an intra-cell aware testing approach showing higher intra-cell defect coverage and lower test length when compared to conventional cell-aware ATPG. As major results of this effective test solution, we show that an intra-cell defect coverage increase of up to 7.22% and test time decrease of up to 33.5 % can be achieved in comparison with cell-aware ATPG

<p> The purpose of this study was to determine the reliability and validity of the Dot Counting Test as a measure of feigned cognitive performance. Archival neuropsychological test data from a &ldquo;real world&rdquo; sample of 147 credible and 328 non-credible patients were compared. The Dot Counting Test E-score cutoff of &ge; 17 continued to show excellent specificity (93%). However, sensitivity dropped from approximately 74% documented in 2002 to 51% in the current sample. When the cutoff was lowered to &ge; 15, adequate specificity was maintained (90%) and sensitivity rose to (61%). However, a third of credible patients with borderline IQ failed the test using the Dot Counting Test E-cutoff score, indicating cautious use of the test with individuals who likely have borderline intelligence.</p><p>

The objective of manufacturing test is to separate the faulty circuits from the good circuits after they have been manufactured. Three problems encompassed by this task will be mentioned here. First, the reduction of the power consumed during test. The behavior of the circuit during test is modified due to scan insertion and other testing techniques. Due to this, the power consumed during test can be abnormally large, up to several times the power consumed during functional mode. This can result in a good circuit to fail the test or to be damaged due to heating. Second, how to modify the design so that it is easily testable. Since not every possible digital circuit can be tested properly it is necessary to modify the design to alter its behavior during test. This modification should not alter the functional behavior of the circuit. An example of this is test point insertion, a technique aimed at reducing test time and decreasing the number of faulty circuits that pass the test. Third, the creation of a test set for a given design that will both properly accomplish the task and require the least amount of time possible to be applied. The precision in separation of faulty circuits from good circuits depends on the application for which the circuit is intended and, if possible, must be maximized. The test application time is should be as low as possible to reduce test cost. This dissertation contributes to the discipline of manufacturing test and will encompass advances in the afore mentioned areas. First, a method to reduce the power consumed during test is proposed. Second, in the design modification area, a new algorithm to compute test points is proposed. Third, in the test set creation area, a new algorithm to reduce test set application time is introduced. The three algorithms are scalable to current industrial design sizes. Experimental results for the three methods show their effectiveness.

\par The thesis deals with the statistical evaluation of data gained by the sensory analysis of the foodstuff. It brings a selection of the suitable statistical tests, a detailed analysis of these tests and their comparision based on the particular power functions for given parameters. As an important part of the thesis, there is a creating of custom software for the evaluating of sensorial data.

This thesis deals with questions which are related to the creation of case studies for statistical data analysis using applied computer technology. The main aim is focused on showing the solution of statistical case studies in the field of electrical engineering. Solved case studies include task, exemplary solution and conclusion. Clarity of explained theory and the results understanding and interpretation is accentuated. This thesis can be used for practical education of applied statistical methods, it’s also supplemented with commented outputs from Minitab. Trial version of Minitab has been used for solution of case studies.