Academic literature on the topic 'Dimensional Nanometrology'
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Journal articles on the topic "Dimensional Nanometrology"
MISUMI, Ichiko. "Standard Sample in Dimensional Nanometrology." Journal of the Japan Society for Precision Engineering 74, no. 3 (2008): 222–25. http://dx.doi.org/10.2493/jjspe.74.222.
Full textYacoot, Andrew, and Ludger Koenders. "Recent developments in dimensional nanometrology using AFMs." Measurement Science and Technology 22, no. 12 (October 25, 2011): 122001. http://dx.doi.org/10.1088/0957-0233/22/12/122001.
Full textTöpfer, Susanne C. N., Uwe Nehse, and Gerhard Linß. "Automated inspections for dimensional micro- and nanometrology." Measurement 40, no. 2 (February 2007): 243–54. http://dx.doi.org/10.1016/j.measurement.2006.06.010.
Full textSimão, C., D. Tuchapsky, W. Khunsin, A. Amann, M. A. Morris, and C. M. Sotomayor Torres. "Dimensional and defectivity nanometrology of directed self-assembly patterns." physica status solidi (c) 12, no. 3 (February 25, 2015): 267–70. http://dx.doi.org/10.1002/pssc.201400211.
Full textMalinovski, I., R. S. França, M. S. Lima, M. S. Bessa, C. R. Silva, and I. B. Couceiro. "High-resolution interferometic microscope for traceable dimensional nanometrology in Brazil." Journal of Physics: Conference Series 733 (July 2016): 012060. http://dx.doi.org/10.1088/1742-6596/733/1/012060.
Full textTondare, Vipin N., John S. Villarrubia, and András E. Vladár. "Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) Stereophotogrammetry." Microscopy and Microanalysis 23, no. 5 (September 18, 2017): 967–77. http://dx.doi.org/10.1017/s1431927617012521.
Full textJäger, Gerd, T. Hausotte, Eberhard Manske, H. J. Büchner, R. Mastylo, N. Dorozhovets, R. Füßl, and R. Grünwald. "Nanometrology – Nanopositioning- and Nanomeasuring Machine with Integrated Nanopobes." Materials Science Forum 505-507 (January 2006): 7–12. http://dx.doi.org/10.4028/www.scientific.net/msf.505-507.7.
Full textJorio, Ado. "Raman Spectroscopy in Graphene-Based Systems: Prototypes for Nanoscience and Nanometrology." ISRN Nanotechnology 2012 (December 6, 2012): 1–16. http://dx.doi.org/10.5402/2012/234216.
Full textKrumrey, Michael, Gudrun Gleber, Frank Scholze, and Jan Wernecke. "Synchrotron radiation-based x-ray reflection and scattering techniques for dimensional nanometrology." Measurement Science and Technology 22, no. 9 (August 8, 2011): 094032. http://dx.doi.org/10.1088/0957-0233/22/9/094032.
Full textEndres, J., A. Diener, M. Wurm, and B. Bodermann. "Investigations of the influence of common approximations in scatterometry for dimensional nanometrology." Measurement Science and Technology 25, no. 4 (March 5, 2014): 044004. http://dx.doi.org/10.1088/0957-0233/25/4/044004.
Full textDissertations / Theses on the topic "Dimensional Nanometrology"
Mrinalini, R. Sri Muthu. "A Probing System with Replaceable Tips for Three Dimensional Nano-Metrology." Thesis, 2017. http://etd.iisc.ernet.in/2005/3711.
Full textBook chapters on the topic "Dimensional Nanometrology"
Villarrubia, John S. "Tip Characterization for Dimensional Nanometrology." In Applied Scanning Probe Methods, 147–68. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-642-35792-3_5.
Full textDanzebrink, Hans-Ulrich, Frank Pohlenz, Gaoliang Dai, and Claudio Dal Savio. "Metrological Scanning Probe Microscopes - Instruments for Dimensional Nanometrology." In Nanoscale Calibration Standards and Methods, 1–21. Weinheim, FRG: Wiley-VCH Verlag GmbH & Co. KGaA, 2006. http://dx.doi.org/10.1002/3527606661.ch1.
Full textKoenders, L., T. Dziomba, P. Thomsen-Schmidt, and G. Wilkening. "Standards for the Calibration of Instruments for Dimensional Nanometrology." In Nanoscale Calibration Standards and Methods, 243–58. Weinheim, FRG: Wiley-VCH Verlag GmbH & Co. KGaA, 2006. http://dx.doi.org/10.1002/3527606661.ch18.
Full textBarsic, Gorana, Vedran Simunovic, and Marko Katic. "Ensuring Measurement Unity in the Field of Dimensional Nanometrology." In DAAAM Proceedings, 0841–42. DAAAM International Vienna, 2011. http://dx.doi.org/10.2507/22nd.daaam.proceedings.412.
Full textConference papers on the topic "Dimensional Nanometrology"
Danzebrink, H. U., G. Dai, F. Pohlenz, T. Dziomba, S. Butefisch, J. Flugge, and H. Bosse. "Dimensional nanometrology at PTB." In 2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC). IEEE, 2012. http://dx.doi.org/10.1109/i2mtc.2012.6229183.
Full textMartinez, Pol, Aitor Matilla, Cristina Cadevall, Carlos Bermudez, André Felgner, and Roger Artigas. "Residual flatness error correction in three-dimensional imaging confocal microscopes." In Optical Micro- and Nanometrology, edited by Christophe Gorecki, Anand K. Asundi, and Wolfgang Osten. SPIE, 2018. http://dx.doi.org/10.1117/12.2306903.
Full textIsoda, Kazutaka, Mizue Ebisawa, Yukitoshi Otani, and Kohki Nagata. "Numerical analysis of angle-selective one-dimensional periodic structure for building energy management." In Optical Micro- and Nanometrology, edited by Christophe Gorecki, Anand K. Asundi, and Wolfgang Osten. SPIE, 2018. http://dx.doi.org/10.1117/12.2307306.
Full textYacoot, Andrew, Richard Leach, Ben Hughes, Claudiu Giusca, Christopher Jones, and Alan Wilson. "Dimensional nanometrology at the National Physical Laboratory." In International Symposium on Instrumentation Science and Technology, edited by Jiubin Tan and Xianfang Wen. SPIE, 2008. http://dx.doi.org/10.1117/12.807994.
Full textHuang, Jiebin, Peng Han, Chaoxiong Chen, and Guanling Yang. "Multiple channeled filtering in one-dimensional photonic quantum-well and super-lattice structures." In Nanophotonics, Nanostructure, and Nanometrology II. SPIE, 2007. http://dx.doi.org/10.1117/12.757120.
Full textLazar, Josef, Miroslava Hola, Jan Hrabina, Jindřich Oulehla, Ondřej Číp, Miloslav Vychodil, Petra Sedlář, and Milan Provazník. "Advanced interferometry systems for dimensional measurement in nanometrology." In Optics and Measurement Conference 2014, edited by Jana Kovačičinová and Tomáš Vít. SPIE, 2015. http://dx.doi.org/10.1117/12.2086613.
Full textDziomba, Thorsten, Ludger Koenders, and Günter Wilkening. "Standardization in dimensional nanometrology: development of a calibration guideline for Scanning Probe Microscopy." In Optical Systems Design 2005. SPIE, 2005. http://dx.doi.org/10.1117/12.626018.
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