Journal articles on the topic 'Digital electronics – Testing'
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Newton, C. Mike, Paul I. Deffenbaugh, Kenneth H. Church, Nathan B. Crane, and Clayton Neff. "Digital Manufacturing and Performance Testing for Military Grade Application Specific Electronic Packaging (ASEP)." International Symposium on Microelectronics 2016, no. 1 (October 1, 2016): 000250–66. http://dx.doi.org/10.4071/isom-2016-wp13.
Full textShalumov, Alexander Slavovich, Natalya Alexandrovna Shalumova, and Maxim Alexandrovich Shalumov. "ALGORITHM FOR MODELING MECHANICAL PROCESSES IN AVIATION ELECTRONICS, TAKING INTO ACCOUNT THE NONLINEARITY OF THE DAMPING PROPERTIES OF MATERIALS." Globus: technical sciences 7, no. 3(39) (August 19, 2021): 29–36. http://dx.doi.org/10.52013/2713-3079-39-3-4.
Full textFang, Kun, Rui Zhang, Tami Isaacs-Smith, R. Wayne Johnson, Emad Andarawis, and Alexey Vert. "Thin Film Multichip Packaging for High Temperature Digital Electronics." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2011, HITEN (January 1, 2011): 000039–45. http://dx.doi.org/10.4071/hiten-paper1-rwjohnson.
Full textSyryamkin, V. I. "Digital X-ray 3D-microtomograph for testing materials and components used in electronics." Russian Journal of Nondestructive Testing 52, no. 9 (September 2016): 504–11. http://dx.doi.org/10.1134/s1061830916090060.
Full textRea, Richard. "Configurable Digital Logic for Extreme Environments." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2018, HiTEC (May 1, 2018): 000098–102. http://dx.doi.org/10.4071/2380-4491-2018-hiten-000098.
Full textGavrilenkov, Sergey I., Elizaveta O. Petrenko, and Evgeny V. Arbuzov. "A Digital Device for Automatic Checking of Homework Assignments in the Digital Circuits Course." ITM Web of Conferences 35 (2020): 04009. http://dx.doi.org/10.1051/itmconf/20203504009.
Full textLiu, Wei, Zhuo Lin Miao, Huan Xin Cheng, and Li Cheng. "The Hardware Design of Ultrasonic Flaw Detector Based on Single-Chip Microcomputer AT89C52." Applied Mechanics and Materials 423-426 (September 2013): 2427–30. http://dx.doi.org/10.4028/www.scientific.net/amm.423-426.2427.
Full textLeng, Feng, Chengxiong Mao, Dan Wang, Ranran An, Yuan Zhang, Yanjun Zhao, Linglong Cai, and Jie Tian. "Applications of Digital-Physical Hybrid Real-Time Simulation Platform in Power Systems." Energies 11, no. 10 (October 9, 2018): 2682. http://dx.doi.org/10.3390/en11102682.
Full textWileman, Andrew, Suresh Perinpanayagam, and Sohaib Aslam. "Physics of Failure (PoF) Based Lifetime Prediction of Power Electronics at the Printed Circuit Board Level." Applied Sciences 11, no. 6 (March 17, 2021): 2679. http://dx.doi.org/10.3390/app11062679.
Full textTao, Quang Bang, Lahouari Benabou, Thien An Nguyen Van, and Ngoc Anh Nguyen Thi. "Using Digital Image Correlation Method to Evaluate Fracture Parameters of Lead-Free Solder." Applied Mechanics and Materials 902 (September 2020): 86–90. http://dx.doi.org/10.4028/www.scientific.net/amm.902.86.
Full textMacGugan, Douglas C., Eric C. Abbott, and J. Chris Milne. "230°C Accelerometer with Digitized Output for Directional Drilling." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2014, HITEC (January 1, 2014): 000298–304. http://dx.doi.org/10.4071/hitec-tha14.
Full textValliant, H. D., J. Halpenny, and R. V. Cooper. "A microprocessor‐based controller and data acquisition system for LaCoste and Romberg air‐sea gravity meters." GEOPHYSICS 50, no. 5 (May 1985): 840–45. http://dx.doi.org/10.1190/1.1441959.
Full textTaylor, David, Victor Orphan, Eric Ackermann, Rhett Barnes, Ryan Shyffer, George Mansfield, James Winso, et al. "Recent developments in high-resolution-gamma-ray cargo-inspection technology." International Journal of Modern Physics: Conference Series 48 (January 2018): 1860109. http://dx.doi.org/10.1142/s2010194518601096.
Full textLiu, Huifang, and Jin-Sup Jung. "The Effect of CSR Attributes on CSR Authenticity: Focusing on Mediating Effects of Digital Transformation." Sustainability 13, no. 13 (June 28, 2021): 7206. http://dx.doi.org/10.3390/su13137206.
Full textAlamgir, Arbab, Abu Khari A’ain, Norlina Paraman, and Usman Ullah Sheikh. "Adaptive random testing with total cartesian distance for black box circuit under test." Indonesian Journal of Electrical Engineering and Computer Science 20, no. 2 (November 1, 2020): 720. http://dx.doi.org/10.11591/ijeecs.v20.i2.pp720-726.
Full textAhmad, A., and D. Al-Abri. "Design of a Realistic Test Simulator For a Built-In Self Test Environment." Journal of Engineering Research [TJER] 7, no. 2 (December 1, 2010): 69. http://dx.doi.org/10.24200/tjer.vol7iss2pp69-79.
Full textYudachev, S. S., P. A. Monakhov, and N. A. Gordienko. "Industry 4.0 Digital Technologies for data collection and control." Glavnyj mekhanik (Chief Mechanic), no. 6 (May 25, 2021): 43–58. http://dx.doi.org/10.33920/pro-2-2106-04.
Full textPan, Cheng-Tang, Mark D. Francisco, Chung-Kun Yen, Shao-Yu Wang, and Yow-Ling Shiue. "Vein Pattern Locating Technology for Cannulation: A Review of the Low-Cost Vein Finder Prototypes Utilizing near Infrared (NIR) Light to Improve Peripheral Subcutaneous Vein Selection for Phlebotomy." Sensors 19, no. 16 (August 16, 2019): 3573. http://dx.doi.org/10.3390/s19163573.
Full textSharma, Mohit, Avery Gardner, Hunter Strathman, David Warren, Jason Silver, and Ross Walker. "Acquisition of Neural Action Potentials Using Rapid Multiplexing Directly at the Electrodes." Micromachines 9, no. 10 (September 20, 2018): 477. http://dx.doi.org/10.3390/mi9100477.
Full textOhme, Bruce W., Mark R. Larson, Bhal Tulpule, and Alireza Behbahani. "Characterization of Circuit Blocks for Configurable Analog-Front-End." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2014, HITEC (January 1, 2014): 000146–53. http://dx.doi.org/10.4071/hitec-wa13.
Full textWibawa, Handreas Okta, and Agus Harjoko. "Purwarupa Pengoperasian TV Dengan Mendeteksi Isyarat Jari Berbasis Pengolahan Citra Digital." IJEIS (Indonesian Journal of Electronics and Instrumentation Systems) 5, no. 1 (May 1, 2015): 31. http://dx.doi.org/10.22146/ijeis.7151.
Full textKlaus, L. "Static and dynamic bridge amplifier calibration according to ISO 4965-2." ACTA IMEKO 9, no. 5 (December 31, 2020): 200. http://dx.doi.org/10.21014/acta_imeko.v9i5.969.
Full textIrmansyah, Muhammad. "PENGIMPLEMENTASIAN TEKNOLOGI PROGRAMMABLE LOGIC DEVICE (PLD) SEBAGAI BINER CODE DECIMAL (BCD) UNTUK SCANNING KEYPAD." Elektron : Jurnal Ilmiah 5, no. 1 (August 22, 2018): 9–18. http://dx.doi.org/10.30630/eji.5.1.38.
Full textÁlvarez, José Luis, Juan Daniel Mozo, and Eladio Durán. "Analysis of Single Board Architectures Integrating Sensors Technologies." Sensors 21, no. 18 (September 21, 2021): 6303. http://dx.doi.org/10.3390/s21186303.
Full textD'Errico, Fabrizio, Marco Boniardi, Guido Perricone, and Dragutin Vujanovic. "Influence of Microstructure on Mechanical Properties of an AZ91D Thixomolded® Magnesium Alloy." Key Engineering Materials 348-349 (September 2007): 873–76. http://dx.doi.org/10.4028/www.scientific.net/kem.348-349.873.
Full textLin, Han-Nien, Ya-Ying Chen, Hung-Yun Tsai, and Min-Shan Lin. "Characteristic Analysis and Applications of Electromagnetic Shielding Materials for Wireless Communications Device." Open Materials Science Journal 10, no. 1 (July 15, 2016): 44–53. http://dx.doi.org/10.2174/1874088x01610010044.
Full textBradshaw, GeorgeM, PeterL L. Desyllas, and Keit McLaren. "4566104 Testing digital electronic circuits." Microelectronics Reliability 26, no. 5 (January 1986): 998. http://dx.doi.org/10.1016/0026-2714(86)90248-9.
Full textLi, Jacob, Richard L. Patterson, and Ahmad Hammoud. "Characterization of the Vectron PX-570 Crystal Oscillator for Use in Harsh Environments." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2012, HITEC (January 1, 2012): 000072–81. http://dx.doi.org/10.4071/hitec-2012-tp12.
Full textIzadnegahdar, Alain, Stephanie L. Booth, David J. Spry, and Philip G. Neudeck. "Alternative Setup for Long-Duration Low-Duty-Cycle 600°C Ambient Testing of SiC Integrated Circuits." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2021, HiTEC (April 1, 2021): 000076–82. http://dx.doi.org/10.4071/2380-4491.2021.hitec.000076.
Full textCashion, Avery, and Grzegorz Cieslewki. "High Temperature Quadrature Amplitude Modulation over Orthogonal Frequency Division Multiplexing." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2017, HiTEN (July 1, 2017): 000020–30. http://dx.doi.org/10.4071/2380-4491.2017.hiten.20.
Full textSkwarek, Agata, Jan Kulawik, Andrzej Czerwinski, Mariusz Pluska, and Krzysztof Witek. "A method for the tin pest presence testing in SnCu solder alloys." Soldering & Surface Mount Technology 26, no. 3 (May 27, 2014): 110–16. http://dx.doi.org/10.1108/ssmt-10-2013-0027.
Full textAmri, Hikmatul, and Stephan Stephan. "Pelatihan Reparasi Peralatan Elektronik Rumah Tangga (Lampu Penerangan LED)." Kumawula: Jurnal Pengabdian Kepada Masyarakat 2, no. 3 (January 2, 2020): 192. http://dx.doi.org/10.24198/kumawula.v2i3.24514.
Full textLince Markis, Vera Veronica, and Uzma Septima. "Implementasi Sistem Pengukuran Redaman Serat Optik Pada Lekukan." Jurnal Ilmiah Poli Rekayasa 14, no. 2 (April 15, 2019): 31. http://dx.doi.org/10.30630/jipr.14.2.126.
Full textQingfen Tong, Qingfen Tong, Haisong Xu Haisong Xu, and Rui Gong Rui Gong. "Testing color dif ference evaluation methods for color digital images." Chinese Optics Letters 11, no. 7 (2013): 073301–73304. http://dx.doi.org/10.3788/col201311.073301.
Full textWang, Zhan Sheng, Xin Zhao, Jian Jun Gao, Pan Yang, Wei Xu, and Hong Xin Pan. "Study on Testing System for Real-Time of Communication of the Digital Substation's Secondary Equipments." Applied Mechanics and Materials 420 (September 2013): 401–6. http://dx.doi.org/10.4028/www.scientific.net/amm.420.401.
Full textJaskova, Jana. "Digital Testing During the Pandemic Crisis." International Journal for Innovation Education and Research 9, no. 1 (January 11, 2021): 36–53. http://dx.doi.org/10.31686/ijier.vol9.iss1.2833.
Full textBorja Borja, Mario. "PLATAFORMA DE BRAZOS ROBÓTICOS DE TECNOLOGÍA ABIERTA PARA REALIZAR EXPERIENCIAS DE LABORATORIO DE CONTROL DE POSICIÓN, PLANIFICACIÓN DE TRAYECTORIA Y CONTROL DE VISIÓN ARTIFICIAL." Revista Cientifica TECNIA 26, no. 1 (November 28, 2016): 101. http://dx.doi.org/10.21754/tecnia-26012016.10.
Full textBorja Borja, Mario, Javier Rojas Tintaya, Rodney Rodas Regalado, Carlos Díaz Ramirez, and Cesar Paz Chavez Cesar Paz Chavez. "PLATAFORMA DE BRAZOS ROBÓTICOS DE TECNOLOGÍA ABIERTA PARA REALIZAR EXPERIENCIAS DE LABORATORIO DE CONTROL DE POSICIÓN, PLANIFICACIÓN DE TRAYECTORIA Y CONTROL DE VISIÓN ARTIFICIAL." Revista Cientifica TECNIA 26, no. 1 (November 28, 2016): 101. http://dx.doi.org/10.21754/tecnia.v26i1.11.
Full textAzis, Huzain, and Farniawati Fattah. "ANALISIS LAYANAN KEAMANAN SISTEM KARTU TRANSAKSI ELEKTRONIK MENGGUNAKAN METODE PENETRATION TESTING." ILKOM Jurnal Ilmiah 11, no. 2 (August 31, 2019): 167–74. http://dx.doi.org/10.33096/ilkom.v11i2.447.167-174.
Full textDavies, W. J., and R. W. Vizzini. "Engine Control Reliability and Durability Improvement Through Accelerated Mission Environmental Testing." Journal of Engineering for Gas Turbines and Power 109, no. 2 (April 1, 1987): 142–45. http://dx.doi.org/10.1115/1.3240016.
Full textKlestov, S. A., D. N. Kuznetsov, and S. B. Suntsov. "Digital 3d x-ray microtomographic scanners for electronic equipment testing." IOP Conference Series: Materials Science and Engineering 516 (April 26, 2019): 012026. http://dx.doi.org/10.1088/1757-899x/516/1/012026.
Full textKlestov, S. A., V. I. Syryamkin, and S. B. Suntsov. "Digital 3d x-ray microtomographic scanners for electronic equipment testing." Journal of Physics: Conference Series 1499 (March 2020): 012045. http://dx.doi.org/10.1088/1742-6596/1499/1/012045.
Full textStensrud, Linda, Bendik Ohrn, Rannveig S. J. Loken, Nargis Hurzuk, and Alex Apostolov. "Testing of Intelligent Electronic Device (IED) in a digital substation." Journal of Engineering 2018, no. 15 (October 1, 2018): 900–903. http://dx.doi.org/10.1049/joe.2018.0172.
Full textSimakov, A. V., V. V. Kharlamov, and V. I. Skorokhodov. "The overcurrent protection characteristics testing digital substation intelligent electric devices." Omsk Scientific Bulletin, no. 176 (2021): 46–51. http://dx.doi.org/10.25206/1813-8225-2021-176-46-51.
Full textHorstman, R. E., and F. J. A. Lier. "Digital E-beam testing." Microelectronic Engineering 7, no. 2-4 (January 1987): 209–13. http://dx.doi.org/10.1016/s0167-9317(87)80013-8.
Full textShumenkov, D. G., I. N. Razumov, and V. L. Zdeh. "USE OF SCRIPTING LANGUAGES TO SOLVE PROBLEMS OF AUTOMATED TESTING FOR TESTING ELECTRONIC DIGITAL DEVICES." Issues of radio electronics, no. 2 (March 24, 2020): 12–15. http://dx.doi.org/10.21778/2218-5453-2020-2-12-15.
Full textLitikov, I. P. "Ring-like testing of digital circuits." Journal of Electronic Testing 1, no. 4 (January 1991): 301–4. http://dx.doi.org/10.1007/bf00136318.
Full textDi Cataldo, G. "Testing of Digital Systems [Book Review]." IEEE Circuits and Devices Magazine 21, no. 3 (May 2005): 52–53. http://dx.doi.org/10.1109/mcd.2005.1438814.
Full textYe, Dun Fan, Xin Liu, Ya Min Li, and Meng Yan Zhang. "Design and Implementation of Intelligent Tester for LED Backlight LCD Display Driving Power." Advanced Materials Research 898 (February 2014): 863–66. http://dx.doi.org/10.4028/www.scientific.net/amr.898.863.
Full textKarim, Nozad, Rong Zhou, and Jun Fan. "An Innovative Package EMC Solution Using a Highly Cost-Effective Sputtered Conformal Shield." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2016, DPC (January 1, 2016): 002152–81. http://dx.doi.org/10.4071/2016dpc-tha42.
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