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Books on the topic 'Digital electronics – Testing'

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Author: Grafiati

Published: 4 June 2021

Last updated: 4 February 2022

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1

Miczo, Alexander. Digital logic testing and simulation. New York: John Wiley & Sons, 1986.

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2

Digital logic testing and simulation. New York: Wiley, 1987.

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3

Miczo, Alexander. Digital logic testing and simulation. 2nd ed. Hoboken, NJ: Wiley-Interscience, 2002.

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4

Testing digital circuits: An introduction. Wokingham: Van Nostrand Reinhold (UK), 1986.

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5

Digital logic testing and simulation. 2nd ed. Hoboken, NJ: Wiley-Interscience, 2003.

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6

Digital logic testing and simulation. New York: Harper & Row, 1986.

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7

Cortner, J. Max. Digital test engineering. New York: Wiley, 1987.

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8

Yang, Zhao. Design and Testing of Digital Microfluidic Biochips. New York, NY: Springer New York, 2013.

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9

Litikov, I. P. Kolʹt͡s︡evoe testirovanie t͡s︡ifrovykh ustroĭstv. Moskva: Ėnergoatomizdat, 1990.

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10

Using MultiSIM: Digital electronics. Albany, N.Y: Delmar, 2002.

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11

Wang, Francis C. Digital circuit testing: A guide to DFT and other techniques. San Diego: Academic Press, 1991.

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12

1943-, Agrawal Vishwani D., and Bushnell Michael L. 1950-, eds. Neural models and algorithms for digital testing. Boston: Kluwer Academic Publishers, 1991.

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13

Molitor, Paul. Equivalence checking of digital circuits: Fundamentals, principles, methods. Boston: Kluwer Academic Publishers, 2004.

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14

Weyerer, Manfred. Testability of electronic circuits. Munich: C. Hanser, 1991.

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15

Weyerer, Manfred. Testability of electronic circuits. Munich: Carl Hanser Verlag, 1992.

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16

Marhöfer, Michael. Fehlerdiagnose für Schaltnetze aus Modulen mit partiell injektiven Pfadfunktionen. Berlin: Springer-Verlag, 1987.

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17

1943-, Agrawal Vishwani D., ed. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Boston: Kluwer Academic, 2000.

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18

Sousa, José T. de. Boundary-scan interconnect diagnosis. Boston: Kluwer Academic Publishers, 2001.

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19

PC hardware projects. Indianapolis, IN: Prompt Publications, 1997.

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20

Electronics technology handbook. New York: McGraw-Hill, 1999.

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21

1959-, Roberts Gordon W., ed. Analog test signal generation using periodic [sigma delta]-encoded data streams. Boston: Kluwer Academic, 2000.

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22

Digital hardware testing: Transistor-level fault modeling and testing. Boston: Artech House, 1992.

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23

IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec). 2000 IEEE International Workshop on Defect Based Testing: April 30, 2000, Montreal, Canada : proceedings. Los Alamitos, Calif: IEEE Computer Society, 2000.

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24

Reeder, John. Using MultiSIM: Troubleshooting DC/AC circuits. 4th ed. Clifton Park, NY: Thomson Delmar Learning, 2006.

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25

Using MultiSIM: Troubleshooting DC/AC circuits. 4th ed. Clifton Park, NY: Thomson Delmar Learning, 2006.

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26

Reeder, John. Using MultiSIM: Troubleshooting DC/AC circuits. 4th ed. Clifton Park, NY: Thomson Delmar Learning, 2006.

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27

IEEE International Workshop on IDDQ Testing (4th 1998 San Jose, California). 1998 IEEE International Workshop on IDDQ Testing: Proceedings : November 12-13, 1998, San Jose, California. Los Alamitos, California: IEEE Computer Society Press, 1998.

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28

Lavagno, Luciano. Algorithms for synthesis and testing of asynchronous circuits. Boston: Kluwer Academic, 1993.

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29

Lawday, Geoff. A signal integrity engineer's companion: Real-time test and measurement and design simulation. Upper Saddle River, NJ: Prentice Hall, 2008.

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30

1957-, Ireland David, ed. A signal integrity engineer's companion: Real-time test and measurement and design simulation. Upper Saddle River, NJ: Prentice Hall, 2008.

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31

Sintez diagnostiruemykh skhem vychislitelʹnykh ustroĭstv. Moskva: "Nauka," Glav. red. fiziko-matematicheskoĭ lit-ry, 1987.

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32

Stolov, E. L. Metody kompaktnogo testirovanii͡a︡ t͡s︡ifrovykh ustroĭstv. Kazan': Izd-vo Kazanskogo universiteta, 1993.

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33

Mazur, Glen. Digital multimeter principles. 4th ed. Orland Park, Ill: American Technical Publishers, 2010.

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34

Bushnell, Michael L., and Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Boston, MA: Springer US, 2002. http://dx.doi.org/10.1007/b117406.

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35

Perry, William E. A structured approach to systems testing. 2nd ed. Wellesley, Mass: QED Information Sciences, 1988.

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36

Matthes, Wolfgang. Fault-finding in computers and digital circuits: Measurement and testing. Dorchester: Elektor Electronics (Pub.), 1998.

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37

Davidson, Homer L. Pocket digital multimeter techniques. Blue Ridge Summit, PA: Tab Books, 1986.

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38

Parker, Kenneth P. The boundary-scan handbook: Analog and digital. 2nd ed. New York: Kluwer Academic, 2002.

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39

Parker, Kenneth P. The boundary-scan handbook: Analog and digital. 2nd ed. Boston: Kluwer Academic Publishers, 1998.

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40

Asian Test Symposium (1st 1992 Hiroshima, Japan). Proceedings: First Asian Test Symposium (ATS '92), November 26-27, 1992, Hiroshima, Japan. Los Alamitos, CA: IEEE Computer Society Press, 1992.

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41

Nazarov, S. V. Izmeritelʹnye sredstva i optimizat͡s︡ii͡a︡ vychislitelʹnykh sistem. Moskva: "Radio i svi͡a︡zʹ", 1990.

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42

Office, General Accounting. Battlefield automation: Better justification and testing needed for common computer acquisition : report to congressional requesters. Washington, D.C: The Office, 1987.

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43

Usability testing and system evaluation: A guide for designing useful computer systems. London: Chapman & Hall, 1994.

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44

López, Roberto Téllez-Girón. Testability analysis: A survey on methods and applications. Köln: Verlag TÜV Rheinland, 1987.

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45

Cosgrove, Steven John. Expert system technology applied to the testing of complex digital electronic architectures: TEXAS : a synergistic test strategy planning and functional test pattern generation methodology applicable to the design, development and testing of complex digital electronic circuits. Uxbridge: Brunel University, 1989.

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46

Asian Test Symposium (15th 2006 Fukuoka, Japan). Proceedings of the 15th Asian Test Symposium: 20-23 November 2006, Fukuoka, Japan. Los Alamitos, Calif: IEEE Computer Society, 2006.

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47

Computer hardware diagnostics for engineers. New York: McGraw-Hill, 1995.

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48

International, Test Conference (1997 Washington D. C. ). Proceedings. Washington, D.C: The Conference, 1997.

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49

C), International Test Conference (25th 1994 Washington D. Proceedings: International Test Conference, 1994. Altoona, PA: The Conference, 1994.

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50

C), International Test Conference (25th 1994 Washington D. Proceedings. Altoona, PA: The Conference, 1994.

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