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Kanasewich, Ernest R., and Suhas M. Phadke. "Imaging discontinuities on seismic sections." GEOPHYSICS 53, no. 3 (March 1988): 334–45. http://dx.doi.org/10.1190/1.1442467.
In routine seismic processing, normal moveout (NMO) corrections are performed to enhance the reflected signals on common‐depth‐point or common‐midpoint stacked sections. However, when faults are present, reflection interference from the two blocks and the diffractions from their edges hinder fault location determination. Destruction of diffraction patterns by poststack migration further inhibits proper imaging of diffracting centers. This paper presents a new technique which helps in the interpretation of diffracting edges by concentrating the signal amplitudes from discontinuous diffracting points on seismic sections. It involves application to the data of moveout and amplitude corrections appropriate to an assumed diffractor location. The maximum diffraction amplitude occurs at the location of the receiver for which the diffracting discontinuity is beneath the source‐receiver midpoint. Since the amplitudes of these diffracted signals drop very rapidly on either side of the midpoint, an appropriate amplitude correction must be applied. Also, because the diffracted signals are present on all traces, one can use all of them to obtain a stacked trace for one possible diffractor location. Repetition of this procedure for diffractors assumed to be located beneath each surface point results in the common‐fault‐ point (CFP) stacked section, which shows diffractor locations by high amplitudes. The method was tested for synthetic data with and without noise. It proves to be quite effective, but is sensitive to the velocity model used for moveout corrections. Therefore, the velocity model obtained from NMO stacking is generally used for enhancing diffractor locations by stacking. Finally, the technique was applied to a field reflection data set from an area south of Princess well in Alberta.
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Grasmueck, Mark, Tijmen Jan Moser, Michael A. Pelissier, Jan Pajchel, and Kenri Pomar. "Diffraction signatures of fracture intersections." Interpretation 3, no. 1 (February 1, 2015): SF55—SF68. http://dx.doi.org/10.1190/int-2014-0086.1.
Fractured rock causes diffractions, which are often discarded as noise in ground-penetrating radar (GPR) and seismic data. Most fractures are too thin, too steep, and their displacement is too small to be imaged by reflections, and diffractions are the only detectable signal. To decipher the information about fracture geometry and distribution contained in diffractions, we compare 3D synthetic ray-Born modeling with high-density 3D GPR data and outcrop observations from the Cassis Quarry in Southern France. Our results reveal how the intersection between two fractures is the basic geologic element producing a recordable diffraction. In this new model, two intersecting fractures are represented by one finite-length line diffractor. The intersection of three fractures is a 3D cross composed of three line diffractors. Fractures extending over several meters in the outcrop display linear clusters of diffraction circles in unmigrated GPR time slices. Such large-scale fracture intersections are composed of many aligned short subwavelength line diffractors due to fracture roughness and variations of fracture opening. The shape irregularities and amplitude variations of composite diffraction signatures are a consequence of the geometry and spacing of the intersecting fractures generating them. With three simple base-type intersecting fracture models (horizontal dip, gentle dip, and steep dip), the fracture network geometry can be directly deciphered from the composite diffraction signatures visible on unmigrated time slices. The nonrandom distribution of diffractions is caused by fracture trends and patterns providing information about fracture dip, spacing, and continuity of fractured domains. With the similarity law, the diffraction phenomena observed in GPR data are very similar in character to those seen on the seismic scale with the wavelength as the scaling link. GPR data serve as a proxy to decipher seismic diffractions.
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Khaidukov, V., E. Landa, and T. J. Moser. "Diffraction imaging by focusing‐defocusing: An outlook on seismic superresolution." GEOPHYSICS 69, no. 6 (November 2004): 1478–90. http://dx.doi.org/10.1190/1.1836821.
Diffractions always need more advertising. It is true that conventional seismic processing and migration are usually successful in using specular reflections to estimate subsurface velocities and reconstruct the geometry and strength of continuous and pronounced reflectors. However, correct identification of geological discontinuities, such as faults, pinch‐outs, and small‐size scattering objects, is one of the main objectives of seismic interpretation. The seismic response from these structural elements is encoded in diffractions, and diffractions are essentially lost during the conventional processing/migration sequence. Hence, we advocate a diffraction‐based, data‐oriented approach to enhance image resolution—as opposed to the traditional image‐oriented techniques, which operate on the image after processing and migration. Even more: it can be shown that, at least in principle, processing of diffractions can lead to superresolution and the recovery of details smaller than the seismic wavelength. The so‐called reflection stack is capable of effectively separating diffracted and reflected energy on a prestack shot gather by focusing the reflection to a point while the diffraction remains unfocused over a large area. Muting the reflection focus and defocusing the residual wavefield result in a shot gather that contains mostly diffractions. Diffraction imaging applies the classical (isotropic) diffraction stack to these diffraction shot gathers. This focusing‐muting‐defocusing approach can successfully image faults, small‐size scattering objects, and diffracting edges. It can be implemented both in model‐independent and model‐dependent contexts. The resulting diffraction images can greatly assist the interpreter when used as a standard supplement to full‐wave images.
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Xingchen Pan, Xingchen Pan, Suhas P. Veetil Suhas P. Veetil, Cheng Liu Cheng Liu, Qiang Lin Qiang Lin, and Jianqiang Zhu Jianqiang Zhu. "High-contrast imaging for weakly diffracting specimens in coherent diffraction imaging." Chinese Optics Letters 11, no. 2 (2013): 021103–21105. http://dx.doi.org/10.3788/col201311.021103.
Dell, Sergius, Anna Pronevich, Boris Kashtan, and Dirk Gajewski. "Diffraction traveltime approximation for general anisotropic media." GEOPHYSICS 78, no. 5 (September 1, 2013): WC15—WC23. http://dx.doi.org/10.1190/geo2012-0346.1.
Diffractions play an important role in seismic processing because they can be used for high-resolution imaging and the analysis of subsurface properties like the velocity distribution. Until now, however, only isotropic media have been considered in diffraction imaging. We have developed a method wherein we derive an approximation for the diffraction response for a general 2D anisotropic medium. Our traveltime expression is formulated as a double-square-root equation that allows us to accurately and reliably describe diffraction traveltimes. The diffraction response depends on the ray velocity, which varies with angle and thus offset. To eliminate the angle dependency, we expand the ray velocity in a Taylor series around a reference ray. We choose the fastest ray of the diffraction response, i.e., the ray corresponding to the diffraction apex as the reference ray. Moreover, in an anisotropic medium, the location of the diffraction apex may be shifted with respect to the surface projection of the diffractor location. To properly approximate the diffraction response, we consider this shift. The proposed approximation depends on four independent parameters: the emergence angle of the fastest ray, the ray velocity along this ray, and the first- and second-order derivatives of the ray velocity with respect to the ray angle. These attributes can be determined from the data by a coherence analysis. For the special case of homogeneous media with polar anisotropy, we establish relations between anisotropy parameters and the parameters of the diffraction operator. Therefore, the stacking attributes of the new diffraction operator are suitable to determine anisotropy parameters from the data. Moreover, because diffractions provide a better illumination than reflections, they are particularly suited to analyze seismic anisotropy at the near offsets.
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Kim, Sooyoon, Soon Jee Seol, Joongmoo Byun, and Seokmin Oh. "Extraction of diffractions from seismic data using convolutional U-net and transfer learning." GEOPHYSICS 87, no. 2 (January 27, 2022): V117—V129. http://dx.doi.org/10.1190/geo2020-0847.1.
Diffraction images can be used for modeling reservoir heterogeneities at or below the seismic wavelength scale. However, the extraction of diffractions is challenging because their amplitude is weaker than that of overlapping reflections. Recently, deep-learning (DL) approaches have been used as a powerful tool for diffraction extraction. Most DL approaches use a classification algorithm that classifies pixels in the seismic data as diffraction, reflection, noise, or diffraction with reflection and takes whole values for the classified diffraction pixels. Thus, these DL methods cannot extract diffraction energy from pixels for which diffractions are masked by reflections. We have developed a DL-based diffraction extraction method that preserves the amplitude and phase characteristics of diffractions. Through the systematic generation of a training data set using synthetic modeling based on t-distributed stochastic neighbor embedding analysis, this technique extracts not only faint diffractions but also diffraction tails overlapped by strong reflection events. We also determine that the DL model pretrained with a basic synthetic data set can be applied to seismic field data through transfer learning. Because the diffractions extracted by our method preserve the amplitude and phase, they can be used for velocity model building and high-resolution diffraction imaging.
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Bakhtiari Rad, Parsa, and Craig J. Hickey. "Seismic diffraction separation in the near surface: Detection of high-contrast voids in unconsolidated soils." GEOPHYSICS 86, no. 3 (March 11, 2021): WA13—WA23. http://dx.doi.org/10.1190/geo2020-0366.1.
Seismic diffractions carry the signature of near-surface high-contrast anomalies and need to be extracted from the data to complement the reflection processing and other geophysical techniques. Because diffractions are often masked by reflections, surface waves, and noise, careful diffraction separation is required as a first step for diffraction imaging. A multiparameter time-imaging method is used to separate near-surface diffractions. The implemented scheme makes use of the wavefront attributes that are reliable fully data-derived processing parameters. To mitigate the effect of strong noise and wavefield interference in near-surface data, our workflow incorporates two wavefront-based parameters, dip angle and coherence, as additional constraints. The output of the diffraction separation is a time trace-based stacked section that provides the basis for further analysis and applications such as time migration. To evaluate the performance of the proposed wavefront-based workflow, it is applied to two challenging field data sets that were collected over small culverts in very near-surface soft soil environments. The results of the proposed constrained workflow and the existing unconstrained approach are presented and compared. The proposed workflow demonstrates superiority over the existing method by attenuating more reflection and noise, leading to improved diffraction separation. The abundance of unmasked diffractions reveals that the very near surface is highly scattering. Time migration is carried out to enhance anomaly detection by focusing the isolated diffractions. Although strong diffractivity is observed at the approximate location of the targets, there are other diffracting zones observed in the final sections that might bring uncertainties for interpretation.
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Zhang, Jianfeng, and Jiangjie Zhang. "Diffraction imaging using shot and opening-angle gathers: A prestack time migration approach." GEOPHYSICS 79, no. 2 (March 1, 2014): S23—S33. http://dx.doi.org/10.1190/geo2013-0016.1.
We have developed a migration scheme that can image weak diffractions in time. This significantly contributes to conventional interpretation in detecting small-scale faults and heterogeneities. The proposed scheme images diffractions using the shot and opening-angle gathers generated by prestack time migration (PSTM). Here, the shot and opening-angle gather represents a 2D migrated gather in terms of shot locations and opening angles between the incident- and scattered-rays. We muted the Fresnel zones related to reflections, corrected phases of diffractions, and enhanced diffractions in the migrated gathers. As a result, the proposed diffraction PSTM can image diffractions with and without phase-reversal. Moreover, the weak diffractions tangent to reflections can be clearly imaged. Diffraction PSTM can update migration velocities according to behaviors of reflection and diffraction events in the migrated gathers by scanning, thus overcoming a crucial problem in diffraction imaging. The reflector dips used in diffraction PSTM are obtained by picking the angles related to reflections in the shot and opening-angle gathers for a partial migration. Synthetic and field data tests demonstrate the validity of diffraction PSTM.
Parmi les facteurs les plus remarquables qui ont suscite l'interet pour les elements optiques diffractifs, on enumere deux facteurs. La technologie actuelle a vecu recemment un progres important qui a touche notamment la mise en uvre d'elements optiques ayant des hautes resolutions et des structures complexes. En outre apres l'apparition du laser, l'holographie synthetique a connu un essor remarquable qui s'est traduit notamment par des techniques de synthese des hologrammes generes par ordinateur operant en regime paraxial. Nous avons choisi de nous situer dans la continuite de ces trois dernieres decennies de progres et nous nous sommes limites a la diffraction scalaire dont l'exploitation est la plus abordable. Pour ce faire, il a fallu se pencher sur le phenomene de diffraction et analyser les mecanismes associes. Dans une premiere partie de ce travail, on a avance une nouvelle formulation surmontant la difficulte operatoire, associee a la these de huygens-fresnel, pour de nombreuses positions le long de l'axe de propagation. Deux parties supplementaires, ou l'on a considere le cadre theorique ainsi que la verification experimentale, ont ete essentiellement consacrees aux applications. On a aborde la synthese d'elements diffractifs mettant a profit le couplage latero-longitudinal qui fait la matiere de la transformee de fresnel fractionnaire. Dans le but de la synthese d'elements diffractifs a haute efficacite, on a considere, dans un premier temps, la combinaison de deux elements diffractifs lies par l'operateur de propagation en espace libre. Une extension de cette configuration holographique nous a menes a definir un nouveau type d'elements diffractifs que l'on a appele element diffractif multi-couches. Ce dernier permet d'injecter l'information dans plusieurs plans holographiques repartis parallelement dans l'espace libre et couples par l'operateur de propagation. Dans le cadre de cette technique, on s'est interesse particulierement a une fonction d'usage frequent a savoir la generation de tableaux et on a propose et experimente le principe d'un illuminateur de tableaux multi-couches. En outre, on s'est interesse a la synthese d'elements diffractifs pour laquelle on dispose d'un ensemble d'informations implicites concernant les signaux optiques desires dans le plan de sortie ou dans un plan intermediaire. Ce probleme, depassant le cadre standard de l'holographie synthetique, se ramene a l'optimisation sous contraintes d'elements diffractifs. A titre d'application, on a propose l'implantation d'un regenerateur optique dans un reseau d'interconnexions multi-couches
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White, Thomas Ashley. "Structure solution using precession electron diffraction and diffraction tomography." Thesis, University of Cambridge, 2009. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611748.
DeSandre, Lewis Francis. "Extinction theorem analysis of diffraction anomalies in overcoated-gratings." Diss., The University of Arizona, 1989. http://hdl.handle.net/10150/184853.
A rigorous analysis based upon the extinction theorem is presented to study anomalous resonance effects from single- and multilayer-overcoated, low-efficiency diffraction gratings. Anomalously high diffraction efficiency at resonance results from the coupling of the incident beam into guided waves that can be propagated within the composite structure. Both the traditional characteristic matrix technique and a recursive or R-matrix propagation technique are presented. The R-matrix propagation algorithm was found to be stable numerically, and computational results agree favorably with both experimental and other theoretical work. Numerical results are presented in order to investigate the influence of certain parameters (i.e., groove depth and shape and the number of high- and low-index overlayers) on the diffraction efficiency at resonance. In this analysis, a wavelength of 0.6328 μm and grating period of 0.7 μm were chosen so that only a -1 diffracted order other than the specular is reflected from the gratings. Perfect transfer of the grating relief to the film boundaries does not occur in all instances; it depends on the grating and film characteristics together with the conditions during deposition. Investigated in this work is the effect of nonreplication of the grating profile at film interfaces on anomalous diffraction; a transition from trapezoidal profile at the grating substrate to a rounded relief at the top surface of the multilayer structure is assumed. For the cases studied, it was found that nonreplication has the effect of reducing the strength of the resonance outcoupling. Finally, experimental results on anomalous resonance effects for multilayer-coated gratings are presented. Good agreement with computational results was attained.
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Persson, Roger. "Breaking the diffraction limit using conical diffraction in super resolution fluorescence microscopy : Breaking the diffraction limit using conical diffraction in super resolution fluorescence microscopy." Thesis, KTH, Tillämpad fysik, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-140725.
Grant, Stephen D. "Conical diffraction photonics." Thesis, University of Dundee, 2016. https://discovery.dundee.ac.uk/en/studentTheses/c4c0c9b8-f54a-406b-b73f-a84bc07f456e.
Recent interest in conical diffraction (CD) has led to a large increase in experimental and theoretical investigations over the last two decades, a marked change from the previous 160 quiet years in the field. Once dismissed as an optical curiosity, the phenomenon has emerged as a fascinating area with potential for a large number of practical applications many of which have been realised while others are still being discovered. In this thesis a number of aspects of the theory as recently described are experimentally investigated with a view to strengthening the current theoretical understanding of the phenomenon. Developing from single crystal CD (the simplest case), through cascade CD, nonlinear CD, and with a particular emphasis on the polarisation effects of the phenomenon, a number of areas are investigated. Single crystal CD with circularly (CPL), linearly (LPL), azimuthally and radially polarised light (APL and RPL) is examined. The effect of LPL in removing a section of the ring orthogonally polarised to the incident beam is shown, along with the first investigation into the effects of RPL and APL polarisation effects in CD. The effect of the incident beam spot size on the pattern developed is also investigated and shown to conform to the theory. All findings show good agreement with the current theory. Cascade CD with various numbers of crystals and incident beam polarisations is investigated. Included in these experiments are a variable two crystal cascade and the first demonstration of the different patterns produced for a three crystal cascade when left and right circularly polarised light (LCPL and RCPL, respectively) are used, as recently predicted. As with the single crystal case, results are in agreement with theory. In both the single and cascade cases a cross section of the beam is captured to demonstrated the free space evolution of a CD beam. Simultaneous second harmonic generation (SHG) and CD from a single crystal is described in an update of Bloembergen et al.'s pioneering 1970's investigations with added emphasis on polarisation. SHG in non-phase matched conditions, as well as the influence of incident polarisation on the pattern and type of SHG, are observed. And finally a sensor based on CD demonstrating a simple, practical application of the phenomenon is outlined and a prototype device made and trialled. Using the effect of LPL described earlier to determine the polarisation angle of an incident beam, the device's use as a polarimeter is also tested to determine the specific rotation introduced by optically active liquids with the initial prototype showing results comparable to current methods. This work contains 7 chapters. The first is an introduction to the history of the phenomenon along with a thesis statement. Chapter 2 deals with single crystal CD, chapter 3 contains the expansion from single to cascade CD. The complexities introduced by various types of polarisation are described in chapter 4 for both single and cascade setups. Chapter 5 deals with SHG using a CD crystal and chapter 6 outlines the design and operation of the novel sensor based on the phenomenon. The final chapter is a summary of the work and outlook on the future of the field.
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Nishantha, Hewamarappulige Indunil. "Powder Diffraction Methods." The Ohio State University, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=osu1222116031.
Ihee, Hyotcherl Zewail Ahmed H. Zewail Ahmed H. "Ultrafast electron diffraction /." Diss., Pasadena, Calif. : California Institute of Technology, 2001. http://resolver.caltech.edu/CaltechETD:etd-04072008-112244.
Thesis (Ph. D.)--University of Oregon, 2005. Typescript. Includes vita and abstract. Includes bibliographical references (leaves 81-83). Also available for download via the World Wide Web; free to University of Oregon users.
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Edwards, Philip John. "Diffraction theory and radiometry." Thesis, Imperial College London, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.408858.
Walsh, Sheridan John T. P. "Diffraction by volume gratings." Thesis, University of Oxford, 1991. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.303660.
Dinnebier, R. E., and S. J. L. Billinge, eds. Powder Diffraction. Cambridge: Royal Society of Chemistry, 2008. http://dx.doi.org/10.1039/9781847558237.
Schwartz, Lyle H., and Jerome B. Cohen. Diffraction from Materials. Berlin, Heidelberg: Springer Berlin Heidelberg, 1987. http://dx.doi.org/10.1007/978-3-642-82927-7.
Michette, Alan G. "Diffractive Optics I Diffraction Gratings." In Optical Systems for Soft X Rays, 127–45. Boston, MA: Springer US, 1986. http://dx.doi.org/10.1007/978-1-4613-2223-8_6.
Stöhr, Joachim. "Classical Diffraction and Diffractive Imaging." In Springer Tracts in Modern Physics, 385–464. Cham: Springer International Publishing, 2023. http://dx.doi.org/10.1007/978-3-031-20744-0_8.
Gooch, Jan W. "Diffraction." In Encyclopedic Dictionary of Polymers, 219–20. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_3650.
Möller, Karl D., and Claude Bélorgoet. "Diffraction." In Cours d’optique, 113–62. Paris: Springer Paris, 2007. http://dx.doi.org/10.1007/978-2-287-48620-3_3.
Lüders, Klaus, and Robert Otto Pohl. "Diffraction." In Pohl's Introduction to Physics, 413–42. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-50269-4_21.
Rouan, Daniel. "Diffraction." In Encyclopedia of Astrobiology, 644–45. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-44185-5_431.
Rouan, Daniel. "Diffraction." In Encyclopedia of Astrobiology, 431. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-11274-4_431.
MAŁECKI, A. R., and M. PALLOTTA. "DIFFRACTION WITHOUT MULTIPLE DIFFRACTIVE DIPS." In Proceedings of the XXXII International Symposium. WORLD SCIENTIFIC, 2003. http://dx.doi.org/10.1142/9789812704962_0039.
Buralli, Dale A., and G. Michael Morris. "Performance of diffractive lenses with nonunity diffraction efficiency." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1990. http://dx.doi.org/10.1364/oam.1990.tuj2.
The unique optical properties of diffractive optical elements make them attractive candidates for a wide variety of applications. Unlike conventional optical elements, however, diffractive optics can simultaneously produce more than one image, resulting from the various diffracted orders. Rigorous electromagnetic grating diffraction theory shows that, in general, the diffraction efficiency can be a function of pupil position and field angle. If the diffractive lens is not 100% efficient in diffracting the incident light into the desired diffracted order, the resulting image can be degraded by the increased background illumination. We consider the effects of the unwanted diffracted orders on the point-spread function and modulation transfer function (MTF) of systems that contain diffractive lenses. With a nonunity diffraction efficiency, the diffraction-limit MTF at low spatial frequencies is reduced by an amount equal to the fraction of energy in the diffraction order of interest. Fourier theory shows that this amount of degradation is given by the pupil-averaged efficiency. This average efficiency thus makes a convenient merit function for estimating image quality. For scanned imaging systems, the average efficiency acts as the equivalent of system transmittance in reducing the flux incident on the detector.
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Bräuer, Ralf, and Olof Bryngdahl. "Diffractive elements with large diffraction angles." In The European Conference on Lasers and Electro-Optics. Washington, D.C.: Optica Publishing Group, 1994. http://dx.doi.org/10.1364/cleo_europe.1994.cmn3.
Diffractive elements such as digital holograms1 and Dammann gratings2 can be used to generate an array of diffraction orders with specified intensity. The part of the diffraction pattern that contains these orders is called the signal window. The elements are designed using scalar diffraction theory; i.e., geometrical optics is used to predict the transmitted or reflected wave-front, and the wave propagation outside the element is calculated by paraxial approximations. For scalar diffraction theory to be valid the features of the element must be large compared to the wavelength. Correspondingly, the grating periods are large and the diffraction angles are small; the elements operate in the paraxial domain. The maximum diffraction angle within the signal window can be estimated via the knowledge of the number of features necessary to realize a specified optical function and the minimum feature size; 5° results as an upper limit. A more flexible choice of the diffraction angles may broaden the scope of possible applications of diffractive elements. Fortunately, the limit is not a general one within the frame of diffractive optics.
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Moharam, M. G., and S. Dunn. "Grating diffraction analysis: Maxwell’s or Kirchhoff diffraction integrals." In Diffractive Optics and Micro-Optics. Washington, D.C.: Optica Publishing Group, 1998. http://dx.doi.org/10.1364/domo.1998.dma.1.
Scalar diffraction theory is widely used to design and analyze diffractive optical elements. This approach has been the approach of choice for it is easy to use, lacks computation strain, and more importantly, offer some direct approach for the design of diffractive elements. The validity and, therefore, the usability of the scalar diffraction approaches are based on the assumption that the smallest feature in the diffractive element is much greater than the wavelength of incident light. However, recent advances in the fabrication techniques have resulted in producing diffractive optical elements with small feature sizes of wavelength and subwavelength dimensions and scalar diffraction approaches may not be applicable. Rigorous diffraction analysis techniques have been developed and/or refined to analyze these wavelength size structures. These methods include rigorous coupled-wave theory, modal approach, method of moments, and other differential and integral methods. These electromagnetic theory based approaches provide powerful, accurate, and relatively efficient analysis methods. However, they do not provide satisfactory tools for the systematic design of diffraction elements.
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BONATO, A. "DIFFRACTION AND DIFFRACTIVE FINAL STATES AT HERA." In Proceedings of the 22nd Lake Louise Winter Institute. WORLD SCIENTIFIC, 2007. http://dx.doi.org/10.1142/9789812776105_0012.
Shan, Mao. "Tolerance analysis on diffraction efficiency and polychromatic integral diffraction efficiency for harmonic diffractive optics." In International Symposium on Optoelectronic Technology and Application 2016, edited by Sen Han and JiuBin Tan. SPIE, 2016. http://dx.doi.org/10.1117/12.2245583.
Kazemeini, S. Hesam. "Diffraction amplitude analysis for detecting diffractor width." In SEG Technical Program Expanded Abstracts 2010. Society of Exploration Geophysicists, 2010. http://dx.doi.org/10.1190/1.3513113.
Orava, Risto, Marcella Capua, Roberto Fiore, Igor Ivanov, Alessandro Papa, Jacques Soffer, and Enrico Tassi. "Diffractive Measurements at the LHC: Elastic and Inelastic Soft Diffraction." In DIFFRACTION 2010: INTERNATIONAL WORKSHOP ON DIFFRACTION IN HIGH ENERGY PHYSICS. AIP, 2011. http://dx.doi.org/10.1063/1.3601397.
Moharam, M. G., and D. A. Pommet. "Diffraction of Gaussian beams by binary diffractive elements." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1992. http://dx.doi.org/10.1364/oam.1992.mcc3.
Multi-level binary diffractive optical elements are of increasing importance in an expanding variety of engineering applications. Virtually all previous work on the analysis and design of binary diffractive elements has been for diffraction of infinite plane waves rather than the practical case of finite bounded-profile beams. Only diffraction of Gaussian beams by thick holographic gratings has been previously investigated. In this work the diffraction of finite beams by multi-level binary gratings is analyzed in detail by using the rigorous coupled-wave approach. The analysis applies to any finite beam that is spatially slowly varying on the scale of the wavelength of light. Detailed diffraction characteristics for the important case of Gaussian beams are presented. The diffraction efficiency of these gratings and the profiles of the transmitted and diffracted beams are calculated as a function of the grating depth, grating spacing, light wavelength, and Gaussian beam waist. It is shown that if the beam waist is more than 10 times the grating period, the diffraction efficiency follows very closely to the plane-wave diffraction efficiency with no significant distortion of the profiles of the diffracted beams. The conditions for plane-wave-like diffraction behavior (with finite profile) are determined.
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"Preface: Diffraction 2014." In DIFFRACTION 2014: International Workshop on Diffraction in High-Energy Physics. AIP Publishing LLC, 2015. http://dx.doi.org/10.1063/1.4915957.
Choi, Junoh, Alvaro Cruz-Cabrera, and Anthony Tanbakuchi. Spectral diffraction efficiency characterization of broadband diffractive optical elements. Office of Scientific and Technical Information (OSTI), March 2013. http://dx.doi.org/10.2172/1095948.
Erteza, I. A. Diffraction efficiency analysis for multi-level diffractive optical elements. Office of Scientific and Technical Information (OSTI), November 1995. http://dx.doi.org/10.2172/164461.
Copley, John R. D. Neutron powder diffraction. Gaithersburg, MD: National Institute of Standards and Technology, 1998. http://dx.doi.org/10.6028/nist.ir.6204.
Lehman, S., and S. Norton. Radial Reflection Diffraction Tomography. Office of Scientific and Technical Information (OSTI), October 2003. http://dx.doi.org/10.2172/15009729.
Schabel, Matthias C., Dilip G. Roy, and Altaf Khan. Transurethral Ultrasound Diffraction Tomography. Fort Belvoir, VA: Defense Technical Information Center, March 2005. http://dx.doi.org/10.21236/ada446902.
Schabel, Matthias C., Dilip G. Roy, and Altaf Khan. Transurethral Ultrasound Diffraction Tomography. Fort Belvoir, VA: Defense Technical Information Center, March 2006. http://dx.doi.org/10.21236/ada453339.
Kotula, Paul G. Advanced electron diffraction diagnostics. Office of Scientific and Technical Information (OSTI), October 2016. http://dx.doi.org/10.2172/1563075.
Batcheller, Thomas Aquinas, Gary Michael Huestis, and Steven Michael Bolton. Remote Laser Diffraction PSD Analyzer. Office of Scientific and Technical Information (OSTI), June 2000. http://dx.doi.org/10.2172/911470.
Lehman, S. K., and S. J. Norton. Radial Reflection Diffraction Tomography Notes. Office of Scientific and Technical Information (OSTI), June 2002. http://dx.doi.org/10.2172/15013570.
