Academic literature on the topic 'Differential phase contrast'

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Journal articles on the topic "Differential phase contrast"

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Jaeho Choi, Jaeho Choi, and Young-Sung Park Young-Sung Park. "Enhanced quantitative X-ray phase-contrast images using Foucault differential filters." Chinese Optics Letters 15, no. 8 (2017): 081103. http://dx.doi.org/10.3788/col201715.081103.

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Lazić, Ivan, Eric G. T. Bosch, and Sorin Lazar. "Phase contrast STEM for thin samples: Integrated differential phase contrast." Ultramicroscopy 160 (January 2016): 265–80. http://dx.doi.org/10.1016/j.ultramic.2015.10.011.

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McFadyen, Ian R. "Differential phase contrast Lorentz microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (August 1990): 758–59. http://dx.doi.org/10.1017/s0424820100176927.

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Transmission electron microscopy can provide high spatial resolution information on domain structures in thin magnetic films provided the interaction between the electron beam and the magnetic sample is correctly utilised: As an electron beam passes through a magnetic sample it suffers a phase shift due to the magnetic induction of the sample and the associated stray fields. The derivative of this phase shift is a direct measure of the in-plane magnetic induction integrated along the electron trajectory, Therefore measurement of this phase derivative would provide the integrated in-plane induction directly. The conventional phase contrast techniques of Fresnel and Foucault Lorentz microscopy provide image contrast which has a very non-linear relationship to the above mentioned phase derivative. Differential phase contrast Lorentz microscopy (DPC), on the other hand, does provide direct, high resolution information on the phase derivative of the electron wave as it leaves tile sample. In this technique a focused probe of electrons is scanned cross the sample and a position sensitive detector in the far field measures two orthogonal components of the probe deflection angle at each point in the scan. This corresponds to the derivative of the phase of the electron wave as it leaves the sample, and thus to the integral of the in-plane induction at each point.
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McCartney, M. R., P. Kruit, A. H. Buist, and M. R. Scheinfein. "Differential phase contrast in TEM." Ultramicroscopy 65, no. 3-4 (October 1996): 179–86. http://dx.doi.org/10.1016/s0304-3991(96)00068-x.

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Zhao, Ming, Wonryeon Cho, Fred Regnier, and David Nolte. "Differential phase-contrast BioCD biosensor." Applied Optics 46, no. 24 (August 20, 2007): 6196. http://dx.doi.org/10.1364/ao.46.006196.

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Cong, Wenxiang, Jiangsheng Yang, and Ge Wang. "Differential phase-contrast interior tomography." Physics in Medicine and Biology 57, no. 10 (April 20, 2012): 2905–14. http://dx.doi.org/10.1088/0031-9155/57/10/2905.

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Chen, Michael, Lei Tian, and Laura Waller. "3D differential phase contrast microscopy." Biomedical Optics Express 7, no. 10 (September 9, 2016): 3940. http://dx.doi.org/10.1364/boe.7.003940.

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Mehta, Shalin B., and Colin J. R. Sheppard. "Using the phase-space imager to analyze partially coherent imaging systems: bright-field, phase contrast, differential interference contrast, differential phase contrast, and spiral phase contrast." Journal of Modern Optics 57, no. 9 (May 20, 2010): 718–39. http://dx.doi.org/10.1080/09500340.2010.481729.

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Jonge, M. D. de, B. Hornberger, C. Holzner, B. Twining, D. Paterson, I. McNulty, C. Jacobsen, and S. Vogt. "Quantitative scanning differential phase contrast microscopy." Journal of Physics: Conference Series 186 (September 1, 2009): 012006. http://dx.doi.org/10.1088/1742-6596/186/1/012006.

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Lazic, Ivan, Eric G. T. Bosch, and Sorin Lazar. "Integrated differential phase contrast (iDPC) STEM." Acta Crystallographica Section A Foundations and Advances 73, a2 (December 1, 2017): C117—C118. http://dx.doi.org/10.1107/s2053273317094542.

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Dissertations / Theses on the topic "Differential phase contrast"

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King, Sharon Victoria. "Quantitative phase information from differential interference contrast microscopy." Connect to online resource, 2008. http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:3337213.

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Noorizadeh, Sahand. "SLM-based Fourier Differential Interference Contrast Microscopy." PDXScholar, 2014. https://pdxscholar.library.pdx.edu/open_access_etds/2011.

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Optical phase microscopy provides a view of objects that have minimal to no effect on the detected intensity of light that are unobservable by standard microscopy techniques. Since its inception just over 60 years ago that gave us a vision to an unseen world and earned Frits Zernike the Nobel prize in physics in 1953, phase microscopy has evolved to find various applications in biological cell imaging, crystallography, semiconductor failure analysis, and more. Two common and commercially available techniques are phase contrast and differential interference contrast (DIC). In phase contrast method, a large portion of the unscattered light that accounts for the majority of the light passing unaffected through a transparent medium is blocked to allow the scattered light due to the object to be observed with higher contrast. DIC is a self-referenced interferometer that transduces phase variation to intensity variation. While being established as fundamental tools in many scientific and engineering disciplines, the traditional implementation of these techniques lacks the ability to provide the means for quantitative and repeatable measurement without an extensive and cumbersome calibration. The rapidly growing fields in modern biology meteorology and nano-technology have emphasized the demand for a more robust and convenient quantitative phase microscopy. The recent emergence of modern optical devices such as high resolution programmable spatial light modulators (SLM) has enabled a multitude of research activities over the past decade to reinvent phase microscopy in unconventional ways. This work is concerned with an implementation of a DIC microscope containing a 4-f system at its core with a programmable SLM placed at the frequency plane of the imaging system that allows for employing Fourier pair transforms for wavefront manipulation. This configuration of microscope provides a convenient way to perform both wavefront shearing with quantifiable arbitrary shear amount and direction as well as phase stepping interferometry by programming the SLM with a series of numerically generated patterns and digitally capturing interferograms for each step which are then used to calculate the objects phase gradient map. Wavefront shearing is performed by generating a pattern for the SLM where two phase ramp patterns with opposite slopes are interleaved through a random selection process with uniform distribution in order to mimic the simultaneous presence of the ramps on the same plane. The theoretical treatment accompanied by simulations and experimental results and discussion are presented in this work.
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Loberg, Johannes. "Evaluation of differential phase-contrast mammography with refractive X-ray lenses." Thesis, KTH, Fysik, 2020. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-280024.

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Krajnak, Matus. "Advanced detection in Lorentz microscopy : pixelated detection in differential phase contrast scanning transmission electron microscopy." Thesis, University of Glasgow, 2017. http://theses.gla.ac.uk/7906/.

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Modern devices require fundamental length scales to be analysed in a maximum detail to enable research of new types of phenomena and design new materials. In this thesis, an advancement in Lorentz microscopy will be presented where the focus was placed not only onto resolution in spatial space but also onto resolution in reciprocal space. This allows greater sensitivity to measurements of the integrated magnetic induction within thin samples. This was achieved by a novel approach to the data acquisition, where instead of a segmented (annular) detector, a pixelated detector was used to measure the deflection of the scanning transmission microscopy (STEM) probe due to the in-plane integrated magnetic induction. Computer vision algorithms were researched to find an efficient, noise-robust way to register the deflection of the STEM probe. This enabled a novel approach to data analysis, where a scatter of the 2D integrated induction (a bivariate histogram) is used to show the distribution of the magnetic induction vector. The experimental results are supported by simulations, where a model of a thin polycrystalline sample causes a shift of the simulated beam due to phase modulations. The results of the detection in both the simulation and experiment showed that cross-correlation based processing can efficiently separate the low spatial frequencies (from the in-plane magnetic induction), and high spatial frequencies (from the structure of the polycrystalline sample). This work will enable quantitative analysis of a greater number of thin magnetic samples, for which the current methods are hampered by the diffraction contrast. This will be particularly helpful for the study low moment, out of plane, magnetised thin films. Currently such systems are of great interest due to the tunability of their magnetic properties and the novel magnetic structures present within them. This work also provides an important step for computational methods in transmission electron microscopy, as this is one of the first examples of 4D data acquisition of processing in STEM (where two dimensions represent the spatial scanning dimensions and other two the reciprocal space). Imaging methods developed in this thesis were applied to the topic of skyrmions in a thin layer of a FeGe cubic helimagnet, where the very fine detail of the structure of their in-plane integrated magnetic induction was shown to contain a distorted modulations of its profile. This was compared to a simple three harmonic frequency model, which was altered to fit some characteristics of the imaged magnetic skyrmions. In this work, for the first time, a direct comparison of differential phase contrast and electron holography will be shown for a simple experiment in which the integrated electric field between two needles was measured in free space in the same microscope. Although it was concluded that both methods are equivalent, some small discrepancies of measured values were present due to a long range electric field in electron holography and/or drift of the beam in between scans in STEM.
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Hajduček, Jan. "Zobrazování metamagnetických tenkých vrstev pomocí TEM." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2021. http://www.nusl.cz/ntk/nusl-443233.

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Komplexní magnetické materiály v nanoměřítku mají své nezastupitelné místo v moderních zařízeních, jako jsou digitální paměti nebo senzory. Moderní technologické procesy vyžadují porozumění a možnost kontroly moderních magnetických materiálů až na atomární úrovni. Jednou z možných cest je magnetická analýza za použití transmisní elektronové mikroskopie (TEM), která je unikátní díky možnosti zobrazování až v subatomárním měřítku. Tato práce popisuje možnosti zobrazování metamagnetických materiálů metodou TEM. Tyto materiály se vyznačují možností stabilizace více magnetických uspořádání najednou za daných vnějších podmínek. Modelovým systémem pro popis zobrazovacích možností metody TEM byly zvoleny tenké vrstvy metamagnetické slitiny FeRh. Tento materiál prochází při zahřívání fázovou přeměnou z antiferomagnetické do feromagnetické fáze. Podrobně jsou rozebrány procesy výroby vzorků, což je zásadní pro úspěšnou TEM analýzu. Pro magnetické zobrazování vzorků v TEMu je využita technika diferenciálního fázového kontrastu (DPC), umožňující přímé mapování rozložení magnetické indukce ve vzorku. Důsledně je diskutován vznik signálu v DPC, což je nezbytné pro porozumění a analýzu výsledných dat. FeRh vrstvy jsou podrobeny analýze struktury, chemického složení a především magnetických vlastností obou magnetických fází. Závěrem je představen proces přímého ohřevu metamagnetických vrstev v TEMu.
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Esser, Bryan David. "High Resolution Characterization of Magnetic Materials for Spintronic Applications." The Ohio State University, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=osu1524154928191728.

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Grah, Joana Sarah. "Mathematical imaging tools in cancer research : from mitosis analysis to sparse regularisation." Thesis, University of Cambridge, 2018. https://www.repository.cam.ac.uk/handle/1810/273243.

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This dissertation deals with customised image analysis tools in cancer research. In the field of biomedical sciences, mathematical imaging has become crucial in order to account for advancements in technical equipment and data storage by sound mathematical methods that can process and analyse imaging data in an automated way. This thesis contributes to the development of such mathematically sound imaging models in four ways: (i) automated cell segmentation and tracking. In cancer drug development, time-lapse light microscopy experiments are conducted for performance validation. The aim is to monitor behaviour of cells in cultures that have previously been treated with chemotherapy drugs, since atypical duration and outcome of mitosis, the process of cell division, can be an indicator of successfully working drugs. As an imaging modality we focus on phase contrast microscopy, hence avoiding phototoxicity and influence on cell behaviour. As a drawback, the common halo- and shade-off effect impede image analysis. We present a novel workflow uniting both automated mitotic cell detection with the Hough transform and subsequent cell tracking by a tailor-made level-set method in order to obtain statistics on length of mitosis and cell fates. The proposed image analysis pipeline is deployed in a MATLAB software package called MitosisAnalyser. For the detection of mitotic cells we use the circular Hough transform. This concept is investigated further in the framework of image regularisation in the general context of imaging inverse problems, in which circular objects should be enhanced, (ii) exploiting sparsity of first-order derivatives in combination with the linear circular Hough transform operation. Furthermore, (iii) we present a new unified higher-order derivative-type regularisation functional enforcing sparsity of a vector field related to an image to be reconstructed using curl, divergence and shear operators. The model is able to interpolate between well-known regularisers such as total generalised variation and infimal convolution total variation. Finally, (iv) we demonstrate how we can learn sparsity promoting parametrised regularisers via quotient minimisation, which can be motivated by generalised Eigenproblems. Learning approaches have recently become very popular in the field of inverse problems. However, the majority aims at fitting models to favourable training data, whereas we incorporate knowledge about both fit and misfit data. We present results resembling behaviour of well-established derivative-based sparse regularisers, introduce novel families of non-derivative-based regularisers and extend this framework to classification problems.
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"Quantitative phase information from differential interference contrast microscopy." UNIVERSITY OF COLORADO AT BOULDER, 2009. http://pqdtopen.proquest.com/#viewpdf?dispub=3337213.

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Lin, Yu-Zi, and 林鈺梓. "Design and Development of Modular Microscopy for Acquiring Isotropic Quantitative Differential Phase Contrast Images." Thesis, 2018. http://ndltd.ncl.edu.tw/handle/6q82ud.

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碩士
國立臺灣大學
機械工程學研究所
106
Because cells are thin and transparent objects, they usually have to be dyed to be observable at a bright field microscope. But fluorescently labeled methodology will lead to a phototoxicity and photo-bleaching problem. After observing dyed cells, they will stop growing and gradually die. In order to observe a transparent cell without poisoning them, it is important to develop label-free microscopic techniques. Label-free microscopic techniques include qualitative and quantitative types. Since a quantitative label-free microscope can provide quantitative optical thickness which is helpful to analyze the process of cells changes. The purpose of this thesis is to develop quantitative label-free microscopy. Due to the advantages of wide-field based measurement, quantitative differential phase contrast microscopy (QDPC), compared to other label-free quantification phase microscopic techniques, it is more efficient to capture images without point-by-point plane scanning or depth scanning. In this study, a thin-film transistor (TFT) shield is placed on the Fourier plane to generate structured light by variable pupil control. After light passes through the TFT shield, the intensity of the light is modulated by the proposed gradient light intensity modulation pattern. After two sets of 4 complementary images are acquired, the phase contrast value of a specimen is obtained by using lab developed Matlab software. Compared with the method proposed by other research groups, which utilized contrast structured light for multiple image acquisition to achieve an isotropic phase transfer function. The color gradient light intensity modulation pattern further makes the system achieve isotropic phase transfer functions at high acquisition speed. The proposed method improves the efficiency and accuracy of phase reconstruction. For experimental verification, micro-plastic spheres have been used standard targets to verify the quantitative measurement capability and accuracy of proposed QDPC system. With the measured phase contrast value and the refractive index of the microspheres, the geometric thickness of the microspheres can be calculated. Furthermore, the developed automatic microscopic image-acquisition is used for acquiring time-lapse QDPC photography of mouse label-free 3T3 fibroblasts cells and human lung cancer cells CYL2 . QDPC reconstructed images provide high contrast and the reconstruction result is independent of viewing angles. The detailed structures and apoptosis process of cells can be clearly observed. While the 3T3 fibroblasts cells shrinks, their phase difference value gradually increases from ~1.5 to ~2.5 rad. While the lung cancer cells CYL2, their phase difference value gradually decrease from ~4.5 to ~2.5 rad. The optical thickness of the cells can be further calculate, and quantitative thickness change data is helpful for the analysis of the cells’ long-time monitoring. Keyword:Optical microscopy, Structured illumination, Variable pupil control, Phase retrieval, Differential phase contrast imaging
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Lin, Wen Chuan, and 林文泉. "High-Speed Three-dimensional topography measurement with two-step phase shifting differential interference contrast technique." Thesis, 2012. http://ndltd.ncl.edu.tw/handle/86668134045647878713.

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Books on the topic "Differential phase contrast"

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Maksymilian, Pluta, Szyjer Mariusz, Society of Photo-optical Instrumentation Engineers., Komitet Badań Naukowych (Poland), and International Conference on Phase Contrast and Differential Interference Contrast (1992 : Warsaw, Poland), eds. Phase contrast and differential interference contrast imaging techniques and applications: 19-21 October 1992, Warsaw, Poland. Bellingham, Wash., USA: SPIE, 1994.

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Aletaha, Daniel, and Helga Radner. Rheumatoid arthritis—diagnosis. Oxford University Press, 2013. http://dx.doi.org/10.1093/med/9780199642489.003.0110.

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Rheumatoid arthritis (RA) is among the most disabling form of chronic inflammatory joint disease. Not all forms of arthritis develop into RA; on the contrary, it may be very challenging to differentiate RA from cases of arthritis that are self-limiting or caused by another disease. Evaluation of early arthritis includes some basic steps, such as excluding trauma, crystal, or infectious-related disease, as well as considering additional features that may guide towards a specific diagnosis. If no specific diagnosis can then be made, the presentation can be labelled as undifferentiated arthritis. Typical differential diagnoses of RA include viral polyarthritis, seronegative spondylarthropathies, polymyalgia rheumatic, and other systemic rheumatic diseases. In 2010, new classification criteria were published that led to a change in the approach to RA. Compared to the previous criteria, the American College of Rheumatology (ACR) 1987 criteria, a scoring system was devised, appreciating the type and number of affected joints (up to 5 points), as well as serology (up to 3 points), elevated acute-phase reactants (1 point), and a symptom persistence of 6 weeks or longer (1 point). If 6 or more points are reached, then classifiable RA is present. Importantly, classification status, which is used for study purposes, is not always identical to the diagnostic status, which often leads to clinical treatment.
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Book chapters on the topic "Differential phase contrast"

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Komatsu, Hiroshi, and Gen Sazaki. "Differential Interference Contrast Microscopy/Phase-Contrast Microscopy." In Compendium of Surface and Interface Analysis, 55–60. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_10.

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Morrison, G. R., and B. Niemann. "Differential Phase Contrast X-Ray Microscopy." In X-Ray Microscopy and Spectromicroscopy, 85–94. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-642-72106-9_10.

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Palmer, J. R., and G. R. Morrison. "Differential Phase Contrast in X-Ray Microscopy." In X-Ray Microscopy III, 278–80. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-540-46887-5_63.

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Wang, Jingzheng, and Jian Fu. "A New Method for Differential Phase-Contrast Imaging Without Phase Stepping." In Lecture Notes in Electrical Engineering, 395–401. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-91659-0_32.

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Nikoonahad, M. "New Techniques in Differential Phase Contrast Scanning Acoustic Microscopy." In Acoustical Imaging, 501–10. Boston, MA: Springer US, 1988. http://dx.doi.org/10.1007/978-1-4613-0725-9_46.

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Li, J., J. Huang, X. Liu, J. Guo, and Y. Lei. "X-ray absorption gratings fabricated via nanoparticles for differential phase-contrast imaging." In Frontier Research and Innovation in Optoelectronics Technology and Industry, 419–24. London, UK : CRC Press/Balkema, an imprint of the Taylor & Francis Group, [2019]: CRC Press, 2018. http://dx.doi.org/10.1201/9780429447082-61.

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Wickramasinghe, H. K. "Scanning Differential Phase Contrast Optical Microscope Application to Surface Studies and Micro Metrology." In Optical Metrology, 86–87. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6_8.

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Shribak, Michael. "Differential Interference Contrast Microscopy (DIC)." In Biomedical Optical Phase Microscopy and Nanoscopy, 19–42. Elsevier, 2013. http://dx.doi.org/10.1016/b978-0-12-415871-9.00002-8.

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"Phase Imaging Microscopy: Beyond Dark-Field, Phase Contrast, and Differential Interference Contrast Microscopy." In Handbook of Biomedical Optics, 503–36. CRC Press, 2016. http://dx.doi.org/10.1201/b10951-28.

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Krishnan, Kannan M. "Transmission and Analytical Electron Microscopy." In Principles of Materials Characterization and Metrology, 552–692. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0009.

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Transmission electron microscopy provides information on all aspects of the microstructure — structural, atomic, chemical, electronic, magnetic, etc. — at the highest spatial resolution in physical and biological materials, with applications ranging from fundamental studies to process metrology in the semiconductor industry. Developments in correcting electron-optical aberrations have improved TEM resolution to sub-Å levels. Coherent Bragg scattering (diffraction), incoherent Rutherford scattering (atomic mass), and interference (phase) are some contrast mechanisms in TEM. For phase contrast, optimum imaging is observed at the Scherzer defocus. Magnetic domains are imaged in Fresnel, Foucault, or differential phase contrast (DPC) modes. Off-axis electron holography measures phase shifts of the electron wave, and is affected by magnetic and electrostatic fields of the specimen. In scanning-transmission (STEM) mode, a focused electron beam is scanned across the specimen to sequentially form an image; a high-angle annular dark field detector gives Z-contrast images with elemental specificity and atomic resolution. Series of (S)TEM images, recorded every one or two degrees about a tilt axis, over as large a tilt-range as possible, are back-projected to reconstruct a 3D tomographic image. Inelastically scattered electrons, collected in the forward direction, form the energy-loss spectrum (EELS), and reveal the unoccupied local density of states, partitioned by site symmetry, nature of the chemical species, and the angular momentum of the final state. Energy-lost electrons are imaged by recording them, pixel-by-pixel, as a sequence of spectra (spectrum imaging), or by choosing electrons that have lost a specific energy (energy-filtered TEM). De-excitation processes (characteristic X-ray emission) are detected by energy dispersive methods, providing compositional microanalysis, including chemical maps. Overall, specimen preparation methods, even with many recent developments, including focused ion beam milling, truly limit applications of TEM.
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Conference papers on the topic "Differential phase contrast"

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Brody, Philip S., Charles G. Garvin, Arthur W. Gillman, and Lian Shentu. "Phase-imaging holographic microscope." In Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, edited by Maksymilian Pluta and Mariusz Szyjer. SPIE, 1994. http://dx.doi.org/10.1117/12.171863.

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Gniadek, Kazimierz, and Barbara Smolinska. "Phase-object positioning based on optical correlation." In Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, edited by Maksymilian Pluta and Mariusz Szyjer. SPIE, 1994. http://dx.doi.org/10.1117/12.171882.

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Sypek, Maciej. "Reverse phase-contrast problem in optical technology." In Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, edited by Maksymilian Pluta and Mariusz Szyjer. SPIE, 1994. http://dx.doi.org/10.1117/12.171883.

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Jozwicki, Romulad. "Imaging problems in phase-object visualization techniques." In Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, edited by Maksymilian Pluta and Mariusz Szyjer. SPIE, 1994. http://dx.doi.org/10.1117/12.171884.

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Litwin, Dariusz. "Specific properties of slit phase-contrast imaging." In Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, edited by Maksymilian Pluta and Mariusz Szyjer. SPIE, 1994. http://dx.doi.org/10.1117/12.171885.

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Zeilikovich, Iosif S. "Holographic interferometry of phase objects with increasing sensitivity." In Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, edited by Maksymilian Pluta and Mariusz Szyjer. SPIE, 1994. http://dx.doi.org/10.1117/12.171865.

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Sochacka, Malgorzata. "Optical fiber profiling by phase-stepping transverse interferometry." In Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, edited by Maksymilian Pluta and Mariusz Szyjer. SPIE, 1994. http://dx.doi.org/10.1117/12.171871.

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Sochacka, Malgorzata, and Leszek R. Staronski. "Phase-stepping DIC technique for reflecting surface evaluation." In Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, edited by Maksymilian Pluta and Mariusz Szyjer. SPIE, 1994. http://dx.doi.org/10.1117/12.171879.

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Besaha, R. N., Igor I. Mokhun, and V. V. Yatsenko. "Visualization and reconstruction of images of phase objects." In Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, edited by Maksymilian Pluta and Mariusz Szyjer. SPIE, 1994. http://dx.doi.org/10.1117/12.171887.

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Bozyk, Miroslawa. "Application of phase-contrast microscopy to quantitative characterization of optical fibers." In Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, edited by Maksymilian Pluta and Mariusz Szyjer. SPIE, 1994. http://dx.doi.org/10.1117/12.171874.

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