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Journal articles on the topic 'Dielectric surfaces'

Author: Grafiati

Published: 4 June 2021

Last updated: 1 February 2022

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1

Abdurazova, P. A., Sh T. Koshkarbayeva, M. S. Satayev, N. O. Dzhakipbekova, and Ye B. Raiymbekov. "Mechanism of the process of photochemical metallization of dielectric surfaces." Bulletin of the Karaganda University. "Chemistry" series 95, no. 3 (September 30, 2019): 45–51. http://dx.doi.org/10.31489/2019ch3/45-51.

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2

Ritchie, R. H., and A. Howie. "Inelastic scattering at surfaces and interfaces." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 392–93. http://dx.doi.org/10.1017/s0424820100143560.

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An important part of condensed matter physics in recent years has involved detailed study of inelastic interactions between swift electrons and condensed matter surfaces. Here we will review some aspects of such interactions.Surface excitations have long been recognized as dominant in determining the exchange-correlation energy of charged particles outside the surface. Properties of surface and bulk polaritons, plasmons and optical phonons in plane-bounded and spherical systems will be discussed from the viewpoint of semiclassical and quantal dielectric theory. Plasmons at interfaces between dissimilar dielectrics and in superlattice configurations will also be considered.

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3

Rozen, John, Masahiro Nagano, and Hidekazu Tsuchida. "Improved Deposited Oxide Interfaces from N₂Conditioning of Bare SiC Surfaces." Materials Science Forum 717-720 (May 2012): 729–32. http://dx.doi.org/10.4028/www.scientific.net/msf.717-720.729.

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The benefits of a new method used to incorporate nitrogen at the dielectric/semiconductor interface of 4H-SiC oxide-based devices are presented. High temperature exposure of the SiC surface to hydrogen and nitrogen, prior to oxide deposition, greatly reduces the amount of electrically active defects to a density at least as low as the one of thermally formed interfaces. These results demonstrate the potential of increasing minority carrier mobility with a low gate dielectric forming thermal budget, with deposited dielectrics, and with limited health hazards.

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4

Akyuz, M., P. P. Cortet, and V. Cooray. "Positive streamer discharges along liquid dielectric surfaces: effect of dielectric constant and surface properties." IEEE Transactions on Dielectrics and Electrical Insulation 12, no. 3 (June 2005): 579–85. http://dx.doi.org/10.1109/tdei.2005.1453463.

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5

Dubin, Val M., Andrei L. Gindilis, Barbara L. Walton, Sage R. Bauers, Kevin M. Norelli, Amila U. Liyanage, Amy Albrecht, and David C. Johnson. "Electroless Metallization of Dielectric Surfaces." ECS Transactions 75, no. 34 (January 5, 2017): 27–33. http://dx.doi.org/10.1149/07534.0027ecst.

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6

Decker, Manuel, Isabelle Staude, Matthias Falkner, Jason Dominguez, Dragomir N. Neshev, Igal Brener, Thomas Pertsch, and Yuri S. Kivshar. "High-Efficiency Dielectric Huygens’ Surfaces." Advanced Optical Materials 3, no. 6 (February 1, 2015): 813–20. http://dx.doi.org/10.1002/adom.201400584.

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7

Phillips, Jonathan. "Toward an Improved Understanding of the Role of Dielectrics in Capacitors." Materials 11, no. 9 (August 24, 2018): 1519. http://dx.doi.org/10.3390/ma11091519.

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A new fundamental principle of the theory of dielectrics in capacitors is demonstrated. That is, dielectric material in any geometry that reduces the field generated by charges on capacitor electrodes is effective in increasing capacitance. Specifically, it is shown that super dielectric material on the outer surfaces of the electrodes of a parallel plate capacitor increases dielectric constant, as well as energy and power densities, by orders of magnitude. The implicit assumption in all current capacitor theory, that the “capacitor” is only that region occupied by the electrodes and the space between them, is shown to be incorrect.

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8

Silvennoinen, Raimo, Vladimír Vetterl, Stanislav Hasoň, Martti Silvennoinen, Kari Myller, Jiři Vanĕk, and Ladislav Cvrček. "Optical Sensing of Attached Fibrinogen on Carbon Doped Titanium Surfaces." Advances in Optical Technologies 2010 (May 5, 2010): 1–7. http://dx.doi.org/10.1155/2010/942349.

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The adsorption/desorption of Human Plasma fibrinogen (HPF) molecules on biosurfaces was measured in spectroscopic cuvette by a diffractive optical element- (DOE-) based sensor. To characterize the surfaces, the basic parameters as surface tension was obtained by sensing of a contact angle of water droplet and dielectric constant was measured by ellipsometry in the absence of HPF molecules. It was observed a significant correlation between the adsorption ability of HPF molecules (sensed by DOE on the basis of the changes in optical roughness (Ropt) of studied surface in the absence and presence of HPF molecules), and dielectric constant (measured by ellipsometry) of differently treated titanium surfaces, where the permittivity and dielectric loss have the known linear relation. These findings with carbon-treated biomaterial surfaces can help us to understand mechanisms behind attachment of HPF molecules on biomaterial surfaces to realize and extend variety of implants for hard tissue replacement.

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9

Закревский, В. А., В. А. Пахотин, and Н. Т. Сударь. "Старение и разрушение (пробой) полимерных пленок в переменном электрическом поле." Физика твердого тела 61, no. 10 (2019): 1953. http://dx.doi.org/10.21883/ftt.2019.10.48276.445.

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An explanation is proposed for the difference in the electrical strength properties of polymers in DC and AC fields. Energy release during recombination of electrons and holes injected into a polymer dielectric is considered as a factor accelerating the process of electrical aging of these dielectrics in AC field. It is shown that the nonradiative relaxation of electronic excited states, which causes bond breaks in macromolecules and the formation of free radicals, leads to the formation of deep electron traps in a polymer dielectric, as a result of which the ionization of macromolecules in the electric field is accelerated due to electron transitions into these traps. In solid-state plasma, a shielding effect occurs, leading to a decrease in the ionization potential of molecules. As a result, the ionization rate of macromolecules increases, i.e. the rate of formation of charge carriers, which leads to a decrease in the electrical life time of the polymer dielectric in AC field compared with the life time of polymers in DC field.

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10

Costa, F., and A. Monorchio. "Electromagnetic Absorbers based on High-Impedance Surfaces: From ultra-narrowband to ultra-wideband absorption." Advanced Electromagnetics 1, no. 3 (October 14, 2012): 7. http://dx.doi.org/10.7716/aem.v1i3.22.

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Different electrically-thin absorbing designs based on High-Impedance Surfaces (HIS) are presented and classified on the basis of the nature of loss. HIS structures allow achieving absorption by exploiting either dielectric or ohmic (resistive) losses. The former ultra-narrowband absorption phenomenon can be obtained by employing dielectric losses of commercial substrates. The resonant structure, often referred to as Perfect Metamaterial Absorber, usually comprises a metallic frequency selective surfaces located above a ultra-thin grounded dielectric substrate. The metamaterial absorber is also angularly stable because of its reduced thickness. Alternatively, if a loss component is introduced in the frequency selective surface located in front of the grounded dielectric substrate both narrowband and wideband absorbing structures can be designed.

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11

Walls, Dennis J., and Paul W. Bohn. "Enhanced Raman spectroscopy at dielectric surfaces." Journal of Physical Chemistry 93, no. 8 (April 1989): 2976–82. http://dx.doi.org/10.1021/j100345a025.

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12

Torchigin, V. P., and A. V. Torchigin. "Radiation pressure on plane dielectric surfaces." Optik - International Journal for Light and Electron Optics 126, no. 19 (October 2015): 1767–72. http://dx.doi.org/10.1016/j.ijleo.2015.04.067.

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13

Bano, N., and A. K. Jonscher. "Dielectric properties of humid mica surfaces." Journal of Materials Science 27, no. 6 (March 1992): 1672–82. http://dx.doi.org/10.1007/bf00542932.

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14

Hilger, A., M. Tenfelde, and U. Kreibig. "Silver nanoparticles deposited on dielectric surfaces." Applied Physics B: Lasers and Optics 73, no. 4 (September 1, 2001): 361–72. http://dx.doi.org/10.1007/s003400100712.

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15

Pantsialeyeu, Kanstantsin, Anatoly Zharin, Oleg Gusev, Roman Vorobey, Andrey Tyavlovsky, Konstantin Tyavlovsky, and Aliaksandr Svistun. "DIGITAL CONTACT POTENTIAL PROBE IN STUDYING THE DEFORMATION OF DIELECTRIC MATERIALS." Informatyka, Automatyka, Pomiary w Gospodarce i Ochronie Środowiska 10, no. 4 (December 20, 2020): 57–60. http://dx.doi.org/10.35784/iapgos.2374.

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The paper reviews the results of a study on the surface electrostatic charges of dielectrics obtained using the contact potential difference (CPD) technique. Initially, the CPD technique was only applied to the study of metal and semiconductor surfaces. The conventional CPD measurement technique requires full compensation of the measured potential that, in the case of dielectrics, could reach very high values. Such high potentials are hard to compensate. Therefore, the conventional CPD method is rarely applied in the study of dielectric materials. Some important improvements recently made to the CPD measurement technique removed the need for compensation. The new method, which does not require compensation, has been implemented in the form of a digital Kelvin probe. The paper describes the principles of the non-compensation CPD measurement technique which was developed for mapping the electrostatic surface charge space distribution across a wide range of potential values. The study was performed on polymers such as low-density polyethylene (LDPE) and polytetrafluoroethylene (PTFE).

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16

Walker, Jean Paul, Venkataraman Swaminathan, Aisha S. Haynes, and Haim Grebel. "Periodic Metallo-Dielectric Structures: Electromagnetic Absorption and its Related Developed Temperatures." Materials 12, no. 13 (June 30, 2019): 2108. http://dx.doi.org/10.3390/ma12132108.

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Multi-layer, metallo-dielectric structures (screens) have long been employed as electromagnetic band filters, either in transmission or in reflection modes. Here we study the radiation energy not transmitted or reflected by these structures (trapped radiation, which is denoted—absorption). The trapped radiation leads to hot surfaces. In these bi-layer screens, the top (front) screen is made of metallic hole-array and the bottom (back) screen is made of metallic disk-array. The gap between them is filled with an array of dielectric spheres. The spheres are embedded in a dielectric host material, which is made of either a heat-insulating (air, polyimide) or heat-conducting (MgO) layer. Electromagnetic intensity trapping of 97% is obtained when a 0.15 micron gap is filled with MgO and Si spheres, which are treated as pure dielectrics (namely, with no added absorption loss). Envisioned applications are anti-fogging surfaces, electromagnetic shields, and energy harvesting structures.

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17

Kozaczek, Kris J., C. E. Murray, and K. P. Rodbell. "Effects of Dielectric Roughness on Texture of Both PVD Seed Layers and EP Copper." Solid State Phenomena 105 (July 2005): 391–96. http://dx.doi.org/10.4028/www.scientific.net/ssp.105.391.

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The ability to control the crystallographic orientation of both the seed layer and the electroplated copper grains is important in obtaining highly reliable Cu interconnects for ultra-large scale integration (ULSI) circuitry. One of the factors controlling film texture is the roughness of the deposition surface. In this paper the effects of dielectric roughness on the crystallographic texture of physical vapor deposited (PVD) copper seed layers and, subsequently, on the texture of electroplated (EP) copper have been investigated. Six relevant interlevel dielectric materials were examined: tetraethyloorthosilicate (TEOS), borophosphosilicate glass (BPSG), silane oxide, silicon nitride, SiLKTM (from the Dow Chemical Corporation), and polysilicon were deposited on 200 mm (001) Si wafers. The RMS surface roughness of these dielectric layers, measured by AFM, ranged from 0.32 nm to 20.51 nm. Texture was analyzed on a dedicated x-ray diffractometer equipped with a two dimensional detector collecting incomplete pole figures with a 1.0 degree resolution in pole figure space. The orientation distribution functions (ODF) were calculated using the arbitrary defined cells method and the volume fractions of major fiber texture components were derived from the ODF. The predominant texture components of the PVD and EP copper were (111) and (511) fiber. It was found that the volume fraction of (111) fiber decreased as the dielectric surface roughness increased. One exception was with the SiLKTM dielectric, which produced significantly weaker texture than other dielectrics with similar surface roughness. The copper films deposited on polysilicon, which possessed the roughest deposition surface of all the dielectric films had a random texture. Finally, a mixture of strong (111) and (511) fiber textures of EP copper was achieved on dielectric underlayers with smoother surfaces. The results demonstrate that the deposition surface roughness plays an important role in establishing the texture in overlying PVD and EP Cu films. The texture of PVD and EP copper may serve as a useful indicator of the underlayer roughness.

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18

Marashi, Houriyeh, Ahmed A. D. Sarhan, Ibrahem Maher, and Mohd Hamdi. "Performance of Electrical Discharge Milling and Sinking in Micro Graphite Powder Mixed Dielectric." Materials Science Forum 900 (July 2017): 127–30. http://dx.doi.org/10.4028/www.scientific.net/msf.900.127.

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Electrical discharge machining (EDM) is a non-conventional machining technique that is well-known for use in fabricating dies and molds owing to machinability of high hardness materials. Although the electro-thermal mechanism of EDM offers many advantages over other available machining methods, its sluggish nature limits the wide application of such machines for mass production. In this research, adding graphite powder to dielectric is proposed to improve EDM performance factors. Material removal rate (MRR) and average surface roughness (Ra) have been monitored and evaluated after addition of graphite powder to dielectric in electrical discharge milling and sinking. It is found that the presence of powder particles in dielectric fluid enhances the MRR steadily up to ~11 and ~17% for milling and sinking process, respectively. Moreover, the highest enhancement if Ra is ~31% at 1g/l graphite powder concentration for electrical discharge milling and up to ~11% for sinking process. Field emission scanning electron microscopy (FESEM) is used to inspect the machined surfaces. The surfaces machined with graphite powder mixed appear significantly unlike the surfaces machined in pure dielectric. Adding powder to dielectric is found to increase the machined surface hardness by ~26%, from 240 to 302 HV.

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19

D’Acunto, Mario, Francesco Fuso, Ruggero Micheletto, Makoto Naruse, Francesco Tantussi, and Maria Allegrini. "Near-field surface plasmon field enhancement induced by rippled surfaces." Beilstein Journal of Nanotechnology 8 (April 28, 2017): 956–67. http://dx.doi.org/10.3762/bjnano.8.97.

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The occurrence of plasmon resonances on metallic nanometer-scale structures is an intrinsically nanoscale phenomenon, given that the two resonance conditions (i.e., negative dielectric permittivity and large free-space wavelength in comparison with system dimensions) are realized at the same time on the nanoscale. Resonances on surface metallic nanostructures are often experimentally found by probing the structures under investigation with radiation of various frequencies following a trial-and-error method. A general technique for the tuning of these resonances is highly desirable. In this paper we address the issue of the role of local surface patterns in the tuning of these resonances as a function of wavelength and electric field polarization. The effect of nanoscale roughness on the surface plasmon polaritons of randomly patterned gold films is numerically investigated. The field enhancement and relation to specific roughness patterns is analyzed, producing many different realizations of rippled surfaces. We demonstrate that irregular patterns act as metal–dielectric–metal local nanogaps (cavities) for the resonant plasmonic field. In turn, the numerical results are compared to experimental data obtained via aperture scanning near-field optical microscopy.

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20

Grigoriev, Sergei. "Milling of Dielectric Ceramics by Fast Argon Atoms." Key Engineering Materials 723 (December 2016): 329–34. http://dx.doi.org/10.4028/www.scientific.net/kem.723.329.

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A new method for dielectric materials milling has been developed. Instead of well-known ion milling used for metals the dielectrics were processed by broad beams of fast argon atoms. The fast atoms were produced due to charge exchange collisions of accelerated ions. Plasma emitter of the ions was generated in hollow cathode glow discharge. Emissive grid of a circular cross-section beam source consisted of six segments. Energy of the fast atoms ranged from 1 to 3 keV. The beam source was used for production of contoured grooves on flat surfaces of hard ceramic materials. On the surface of movable seal ring made of α-corundum were produced grooves with depth of 20±0.5 μm and roughness of Ra ≈ 0.4 µm. The rate of α-corundum etching amounted to 3 μm/h.

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21

Yan, Zhi. "Exact solutions for the electromechanical responses of a dielectric nano-ring." Journal of Intelligent Material Systems and Structures 28, no. 9 (September 1, 2016): 1140–49. http://dx.doi.org/10.1177/1045389x16666183.

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Based on an extended linear theory for dielectrics, this work presents exact solutions for the electromechanical responses of a dielectric nano-ring subjected to mechanical and electrical loads. By incorporating terms involving the strain gradient and the electric field gradient into the electric Gibbs free energy, both the direct and converse flexoelectric effects can be captured. The general solution to the differential governing equation is a linear combination of modified Bessel functions and the electromechanical fields are obtained by solving boundary value problems. The influences of the material surfaces and the electric circuit conditions on the electromechanical coupling behavior of the dielectric nano-ring have also been considered. It is found that the flexoelectricity and the surface effect on the electromechanical fields are substantial, and they are affected by the size of the ring structure. Moreover, the flexoelectric effect is sensitive to the material length scales introduced by the new theory and the electric circuit conditions. From simulation results, it is also suggested that nano-scaled electromechanical coupling devices could be built based on dielectric materials through flexoelectricity, which thereby opens up new perspectives for nano-technology.

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22

Becker, Michael F., Alan F. Stewart, John A. Kardach, and Arthur H. Guenther. "Surface charging in laser damage to dielectric surfaces and thin films." Applied Optics 26, no. 5 (March 1, 1987): 805. http://dx.doi.org/10.1364/ao.26.000805.

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23

Sun, Hong, and Shi-Wei Gu. "Effective image potential and surface electronic states outside stepped dielectric surfaces." Physical Review B 41, no. 5 (February 15, 1990): 3145–52. http://dx.doi.org/10.1103/physrevb.41.3145.

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24

Nha, H., and W. Jhe. "Cavity quantum electrodynamics between parallel dielectric surfaces." Physical Review A 54, no. 4 (October 1, 1996): 3505–13. http://dx.doi.org/10.1103/physreva.54.3505.

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25

Saillard, M., and D. Maystre. "Scattering from metallic and dielectric rough surfaces." Journal of the Optical Society of America A 7, no. 6 (June 1, 1990): 982. http://dx.doi.org/10.1364/josaa.7.000982.

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26

Sánchez-Gil, J. A., and M. Nieto-Vesperinas. "Light scattering from random rough dielectric surfaces." Journal of the Optical Society of America A 8, no. 8 (August 1, 1991): 1270. http://dx.doi.org/10.1364/josaa.8.001270.

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27

Kenney, J. A., Eunsu Paek, and G. S. Hwang. "Stochastic Plasma Charging of Nanopatterned Dielectric Surfaces." IEEE Transactions on Plasma Science 36, no. 4 (August 2008): 878–79. http://dx.doi.org/10.1109/tps.2008.927030.

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28

Deinega, Alexei, Ilya Valuev, Boris Potapkin, and Yurii Lozovik. "Minimizing light reflection from dielectric textured surfaces." Journal of the Optical Society of America A 28, no. 5 (April 12, 2011): 770. http://dx.doi.org/10.1364/josaa.28.000770.

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29

Wolff, Lawrence B. "Diffuse-reflectance model for smooth dielectric surfaces." Journal of the Optical Society of America A 11, no. 11 (November 1, 1994): 2956. http://dx.doi.org/10.1364/josaa.11.002956.

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30

De Roo, R. D., and F. T. Ulaby. "Bistatic specular scattering from rough dielectric surfaces." IEEE Transactions on Antennas and Propagation 42, no. 2 (1994): 220–31. http://dx.doi.org/10.1109/8.277216.

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31

Cazaux, J. "The electric image effects at dielectric surfaces." IEEE Transactions on Dielectrics and Electrical Insulation 3, no. 1 (1996): 75–79. http://dx.doi.org/10.1109/94.485517.

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32

Przhibel’skii, S. G. "Fluctuating coulomb field near ionic dielectric surfaces." Technical Physics 56, no. 4 (April 2011): 496–99. http://dx.doi.org/10.1134/s1063784211040256.

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33

Lozano, Paulo, Manuel Martı́nez-Sánchez, and Jose M. Lopez-Urdiales. "Electrospray emission from nonwetting flat dielectric surfaces." Journal of Colloid and Interface Science 276, no. 2 (August 2004): 392–99. http://dx.doi.org/10.1016/j.jcis.2004.04.017.

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34

Forrer, J. B., and J. W. Funck. "Dielectric properties of defects on wood surfaces." Holz als Roh- und Werkstoff 56, no. 1 (January 1998): 25–29. http://dx.doi.org/10.1007/s001070050259.

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35

Hartrumpf, Matthias, Chia-Wei Chen, Thomas Längle, and Jürgen Beyerer. "Ellipsometric inline inspection of dielectric substrates with nonplanar surfaces." tm - Technisches Messen 87, no. 6 (June 25, 2020): 383–91. http://dx.doi.org/10.1515/teme-2019-0097.

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AbstractAn analytical solution for the determination of either angle of incidence (AOI) and the refractive index from combined ellipsometric and reflectometric measurements at dielectric substrates is presented. The solution is of special importance for retroreflex ellipsometry (but not limited to this application). Overcoming the geometric restrictions of conventional ellipsometers, the patented retroreflex ellipsometry can detect changes of intensity and the state of polarization in or at test objects even with curved surfaces. In contrast to conventional ellipsometers where the AOI is set by the adjustment procedure, the AOI is usually unknown in retroreflex ellipsometry. For quantitative analysis, the knowledge of the AOI is nevertheless essential. The proposed combination of retroreflex-reflectometry and retroreflex-ellipsometry opens the path to precise measurements of either surface geometry and index of refraction of nonplanar dielectric substrates (e. g. surfaces of freeform optics).

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36

Han, Guang Cai, Ya Wei Wang, Xiao Bin Deng, Li Feng Wang, Hai Na Lei, and Ming Li Liu. "Extraordinary Transmission through Periodic Arrays of Subwavelength Metal by Coating." Key Engineering Materials 428-429 (January 2010): 479–82. http://dx.doi.org/10.4028/www.scientific.net/kem.428-429.479.

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In this paper, some virtuallab experiments have been done, in which the we get extraordinary transmission phenomenon by adding dielectric coating in the subwavelength periodic metallic slits. It is proved that dielectric coatings on the metal films can excite a surface wave which is transmitted in the metal slits by dielectric waveguides, and the symmetric wrapped dielectric cladding around the metal gains almost 10 times as great transmission as two surfaces cladding does. The paper explores a preliminary physics mechanism of this extraordinary transmission, which gets some valuable results in the application fields.

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37

Xu, Haiyang, Xingwei Ding, Jie Qi, Xuyong Yang, and Jianhua Zhang. "A Study on Solution-Processed Y2O3 Films Modified by Atomic Layer Deposition Al2O3 as Dielectrics in ZnO Thin Film Transistor." Coatings 11, no. 8 (August 15, 2021): 969. http://dx.doi.org/10.3390/coatings11080969.

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In this work, Y2O3–Al2O3 dielectrics were prepared and used in ZnO thin film transistor as gate insulators. The Y2O3 film prepared by the sol–gel method has many surface defects, resulting in a high density of interface states with the active layer in TFT, which then leads to poor stability of the devices. We modified it by atomic layer deposition (ALD) technology that deposited a thin Al2O3 film on the surface of a Y2O3 dielectric layer, and finally fabricated a TFT device with ZnO as the active layer by ALD. The electrical performance and bias stability of the ZnO TFT with a Y2O3–Al2O3 laminated dielectric layer were greatly improved, the subthreshold swing was reduced from 147 to 88 mV/decade, the on/off-state current ratio was increased from 4.24 × 106 to 4.16 × 108, and the threshold voltage shift was reduced from 1.4 to 0.7 V after a 5-V gate was is applied for 800 s.

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38

Garcia, Léo, Léa Jacquot, Elisabeth Charlaix, and Benjamin Cross. "Nano-mechanics of ionic liquids at dielectric and metallic interfaces." Faraday Discussions 206 (2018): 443–57. http://dx.doi.org/10.1039/c7fd00149e.

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39

SUTO, SHOZO, ATSUO KASUYA, CHANG-WU HU, ANDRZEJ WAWRO, TAKENARI GOTO, and YUICHIRO NISHINA. "VIBRATIONAL PROPERTIES AND STRUCTURE OF C60 THIN FILMS ON Si(111)-(7×7) AND GRAPHITE SURFACES." Surface Review and Letters 03, no. 01 (February 1996): 927–31. http://dx.doi.org/10.1142/s0218625x96001662.

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We have investigated the vibrational modes of C 60 thin films adsorbed on the Si (111)-(7×7) and graphite surfaces using high-resolution electron energy-loss spectroscopy in combination with scanning tunneling microscopy (STM). The energy-loss spectra are different in energies and in oscillator strengths for the two surfaces. The differences are attributed to the surface morphology observed with STM. The relation between macroscopic dielectric theory manifested by electron energy loss and microscopic structure measured with STM is discussed in terms of dielectric function theory.

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40

Mehler, C., F. Thielmann, and W. Peukert. "Combination of a Dielectric Continuum Model with Inverse Gas Chromatography for the Characterization of Solid Surfaces." Adsorption Science & Technology 20, no. 9 (November 2002): 835–48. http://dx.doi.org/10.1260/02636170260555769.

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The use of a dielectric continuum model for the characterization of solid surfaces was combined for the first time with inverse gas chromatography. Extension of dielectric continuum models to adsorption from the gaseous phase allowed the distributed surface properties of solid surfaces to be determined. An inverse gas chromatograph was used for the measurement of adsorption equilibria as a quick alternative to time-consuming measurements by gravimetric or volumetric set-ups. Combination of the two techniques allowed the rapid determination of the distributed properties of solid surfaces to be effected and the results were interpreted in a fundamental physical sense. This led to a novel and promising way for the rapid and exact characterization of solid surfaces.

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41

Uwai, Kunihiko, and Naoki Kobayashi. "Dielectric response of As‐stabilized GaAs surfaces observed by surface photo‐absorption." Applied Physics Letters 65, no. 2 (July 11, 1994): 150–52. http://dx.doi.org/10.1063/1.112655.

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42

Шамына, А. А., and В. Н. Капшай. "Генерация второй гармоники от тонкого цилиндрического слоя. I. Аналитическое решение." Журнал технической физики 126, no. 6 (2019): 724. http://dx.doi.org/10.21883/os.2019.06.47765.374-18.

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In the Rayleigh–Gans–Debye approximation an analytical solution is obtained for the problem of second harmonic generation by a plane electromagnetic wave with elliptical polarization from a thin optically nonlinear layer on the surface of a cylindrical dielectric particle of finite size placed in a dielectric. The result is presented in tensor and vector forms in general case, in which the nonlinear dielectric susceptibility tensor has four independent components (one chiral and three non-chiral). For the first time it is shown that at generation from the end plane surfaces of a cylindrical particle the contribution of chiral components differs in phase from that of non-chiral components. It is also found that for small linear dimensions of the cylindrical particle (height and radius of the base), the radiation due to the chiral component of the second-order nonlinear dielectric susceptibility tensor makes a dominant contribution to the second harmonic generation from a non-linear cylindrical layer (end and side surfaces).

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43

Coves, Ángela, and Ángel A. San-Blas. "On the Accurate Numerical Analysis of the Propagation Through Dielectric Frequency-Selective Surfaces Using a Vectorial Modal Method." Electronics 10, no. 7 (March 24, 2021): 766. http://dx.doi.org/10.3390/electronics10070766.

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In this work, we focus on the numerical analysis of the propagation of plane-waves in one-dimensional periodic lossy dielectric media, which constitute the building block of dielectric frequency-selective surfaces (DFSSs). To this end, a full-vectorial modal method was used, in which discontinuities of some components of the electromagnetic fields have to be evaluated, and we propose a numerical improvement in the evaluation of some integrals appearing in the developed formulation. Some confusion may exist in the evaluation of the cited integrals due to the discontinuous nature of the dielectric function and its transverse gradient. Therefore, some considerations are given in order to solve these integrals accurately for the general case of a relative dielectric permittivity function defined as a sum of lossy dielectric slabs. We particularize our study to a dielectric frequency-selective surface (DFSS), for which the periodic dielectric medium can be defined as constant functions inside an homogeneous region, whose contours define the discontinuities. Thus, the relative dielectric permittivity can be expressed in terms of the Heaviside or step function. In this way, the above-mentioned integrals can be correctly evaluated in the discontinuity, obtaining good results with the employed vectorial modal method for both the propagation constant and the electromagnetic fields obtained in the periodic dielectric medium constituting the DFSS. These results are compared with those obtained with a less accurate evaluation of the cited integrals, when an approximation made by other authors is used.

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44

Yıldız, Dilber Esra, Mert Yıldırım, and Muharrem Gökçen. "Investigation on dielectric properties of atomic layer deposited Al2O3 dielectric films." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 32, no. 3 (May 2014): 031509. http://dx.doi.org/10.1116/1.4870593.

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45

Greffet, J. J. "Scattering of electromagnetic waves by rough dielectric surfaces." Physical Review B 37, no. 11 (April 15, 1988): 6436–41. http://dx.doi.org/10.1103/physrevb.37.6436.

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46

Chaikina, E. I., R. Hernández-Walls, and E. R. Méndez. "Light scattering by randomly rough isotropic dielectric surfaces." Journal of Modern Optics 47, no. 6 (May 2000): 1013–24. http://dx.doi.org/10.1080/09500340008233402.

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47

I. Chaikina, R. Hernandez-Walls, E., E. "Light scattering by randomly rough isotropic dielectric surfaces." Journal of Modern Optics 47, no. 6 (May 15, 2000): 1013–24. http://dx.doi.org/10.1080/095003400147638.

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48

LOUDON, RODNEY. "Theory of the radiation pressure on dielectric surfaces." Journal of Modern Optics 49, no. 5-6 (April 2002): 821–38. http://dx.doi.org/10.1080/09500340110111752.

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49

Mavroyannis, Constantine. "Optical excitation spectra of adsorbates on dielectric surfaces." Journal of Chemical Physics 91, no. 2 (July 15, 1989): 1294–302. http://dx.doi.org/10.1063/1.457205.

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50

Kaneda, N., B. Houshmand, and T. Itoh. "FDTD analysis of dielectric resonators with curved surfaces." IEEE Transactions on Microwave Theory and Techniques 45, no. 9 (1997): 1645–49. http://dx.doi.org/10.1109/22.622937.

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