Academic literature on the topic 'Dielectric Constant'
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Journal articles on the topic "Dielectric Constant"
Singh, Rajenda, and Richard K. Ulrich. "High and Low Dielectric Constant Materials." Electrochemical Society Interface 8, no. 2 (June 1, 1999): 26–30. http://dx.doi.org/10.1149/2.f06992if.
Full textBiju, Anjitha, Maria Joseph, V. N. Archana, Navya Joseph, and M. R. Anantharaman. "High Dielectric Constant Liquid Dielectrics Based on Magnetic Nanofluids." Journal of Nanofluids 12, no. 4 (May 1, 2023): 1141–50. http://dx.doi.org/10.1166/jon.2023.1973.
Full textKalyane, Sangshetty. "Dielectric Constant Study of Polyaniline – CeO2 Composites." Indian Journal of Applied Research 3, no. 6 (October 1, 2011): 1–2. http://dx.doi.org/10.15373/2249555x/june2013/181.
Full textLing, H. C., M. F. Yan, and W. W. Rhodes. "High dielectric constant and small temperature coefficient bismuth-based dielectric compositions." Journal of Materials Research 5, no. 8 (August 1990): 1752–62. http://dx.doi.org/10.1557/jmr.1990.1752.
Full textMital, Prem Bhushan. "An Experimental Study of Curved Rectangular Microstrip Antenna in Simulated Plasma Medium." Active and Passive Electronic Components 19, no. 2 (1996): 119–23. http://dx.doi.org/10.1155/1996/26187.
Full textEndo, Kazuhiko. "Fluorinated Amorphous Carbon as a Low-Dielectric-Constant Interlayer Dielectric." MRS Bulletin 22, no. 10 (October 1997): 55–58. http://dx.doi.org/10.1557/s0883769400034217.
Full textBaklanov, Mikhail R., and Karen Maex. "Porous low dielectric constant materials for microelectronics." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 364, no. 1838 (November 29, 2005): 201–15. http://dx.doi.org/10.1098/rsta.2005.1679.
Full textGhule, B., and M. Laad. "Polymer Composites with Improved Dielectric Properties: A Review." Ukrainian Journal of Physics 66, no. 2 (March 4, 2021): 166. http://dx.doi.org/10.15407/ujpe66.2.166.
Full textMandrić Radivojević, Vanja, Slavko Rupčić, Mario Srnović, and Goran Benšić. "Measuring the Dielectric Constant of Paper Using a Parallel Plate Capacitor." International journal of electrical and computer engineering systems 9, no. 1 (2018): 1–10. http://dx.doi.org/10.32985/ijeces.9.1.1.
Full textGuo, Dong, Zhi Yuan Ling, and Xing Hu. "Low Temperature Sintering Ba3Ti5Nb6O28 Ceramics with Tunable Temperature Coefficient of Dielectric Constant." Key Engineering Materials 368-372 (February 2008): 170–72. http://dx.doi.org/10.4028/www.scientific.net/kem.368-372.170.
Full textDissertations / Theses on the topic "Dielectric Constant"
Fromille, Samuel S. IV. "Novel Concept for High Dielectric Constant Composite Electrolyte Dielectrics." Thesis, Monterey, California. Naval Postgraduate School, 2013. http://hdl.handle.net/10945/53408.
Full textThis research was part of an ongoing program studying the concept of multi-material dielectrics (MMD) with dielectric constants much higher than homogenous materials. MMD described in this study have dielectric constants six orders of magnitude greater than the best single materials. This is achieved by mixing conductive particles with an insulating surface layer into a composite matrix phase composed of high surface area ceramic powder and aqueous electrolyte. Specifically examined in this study was micron-scale nickel powder treated in hydrogen peroxide (H2O2) loaded into high surface area alumina powder and aqueous boric acid solution. This new class of dielectric, composite electrolyte dielectrics (CED), is employed in an electrostatic capacitor configuration and demonstrated dielectric constant of order 10 [raised to the 10th power] at approximately 1 Volt. Additionally, it is demonstrated that treated nickel can be loaded in high volume fractions in the CED configuration. Prior studies of composite capacitors indicated a general limitation due to shorting. This results from the onset of percolation due to excess loading of conductive phases. Insulated particles described herein are successfully loaded up to 40% by volume, far above typical percolation thresholds. Simple models are presented to explain results.
Lieutenant, United States Navy
Eusner, Thor. "Determining the Preston constants of low-dielectric-constant polymers." Thesis, Massachusetts Institute of Technology, 2006. http://hdl.handle.net/1721.1/36308.
Full textIncludes bibliographical references (leaf 30).
An important step in the manufacture of integrated circuits (ICs) is the Chemical Mechanical Polishing (CMP) process. In order to effectively use CMP, the removal rates of the materials used in ICs must be known. The removal rate of a given material by CMP can be determined once its Preston constant is known. The objectives of this work were to develop a method to determine the Preston constants and to measure the Preston constants of four low-dielectric-constant (low-k) polymers, labeled A, B, C, and D, and Cu. A weight-loss method, which measures the weight difference between the initial wafer and the polished wafer, provided repeatable results. The Preston constants ranged from 1.01 to 5.96 x10-'3 m2/N. The variation in measurements of the Preston constant ranged from 16% to 31%. The Preston constant of Cu was found to be 1.60 + 0.50 x10-13 m2/N. Of the four polymers, Polymer A had the smallest Preston constant, 1.01 i- 0.30 x10-13 m2/N. It was also determined that there is an approximate inverse linear relationship between the Preston constant of the four low-k polymers and their Young's moduli of elasticity. An approximate inverse linear relationship between the Preston constant of the four low-k polymers and the hardness was also observed.
by Thor Eusner.
S.B.
Long, Ernest Edward. "Electrochemistry in low dielectric constant media." Thesis, University of Liverpool, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.316974.
Full textCho, Taiheui. "Anisotropy of low dielectric constant materials and reliability of Cu/low-k interconnects /." Digital version accessible at:, 2000. http://wwwlib.umi.com/cr/utexas/main.
Full textBERNAL, JOSÉ IGNACIO MARULANDA. "MICROWAVE DEVICES USING HIGH DIELECTRIC CONSTANT FILMS." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2010. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=17115@1.
Full textA crescente demanda por dispositivos portáveis de tamanho e peso cada vez mais reduzidos vem estimulando a busca por materiais de alta constante dielétrica e baixas perdas na faixa de freqüência de microondas capazes de permitir a integração e miniaturização de circuitos. No presente trabalho foi realizado um estudo teórico e experimental sobre a utilização de filmes de alta constante dielétrica na fabricação de dispositivos passivos de microondas de tamanhos reduzidos. Foi feita uma análise no domínio da freqüência sobre a influência desses filmes nas características de diferentes configurações de linhas de transmissão planares com múltiplas camadas dielétricas. A partir dessa análise, foi escolhida a configuração, denominada aqui de QCPW (Quase-Coplanar Waveguide), que permite a realização prática de estruturas com diversos valores de impedância utilizando dimensões transversais confortáveis. Filmes espessos de compostos de titanato de cálcio e de titanato de magnésio depositados pelo método de screen-printing e filmes finos de titanato de estrôncio por RF Magnetron Sputtering foram fabricados e caracterizados. O método do ressoador linear CPW e da linha de transmissão CPW foram empregados para determinar o valor da constante dielétrica e da tangente de perdas desses filmes na faixa de freqüência de microondas e à temperatura ambiente. O método do ressoador linear CPW foi adaptado e aperfeiçoado para fornecer resultados satisfatórios para o caso dos filmes finos. Finalmente, foram projetados, analisados e fabricados, pela primeira vez, transformadores de impedância em linhas de transmissão (TLT) de tamanho reduzido e com resposta banda larga baseados na configuração QCPW utilizando filmes de alta constante dielétrica.
The growing demand for portable devices with more reduced size and weight has stimulated the search for materials with high dielectric constant and low losses in the microwave frequency range allowing circuit integration and miniaturization. In this work, a theoretical and experimental study of the use of high dielectric constant films in the fabrication of microwave passive devices with reduced sizes has been made. A frequency domain analysis of the influence of these films on the characteristics of different configurations of multilayer transmission lines has been done. From this analysis, a configuration, called here as QCPW (Quasi-Coplanar Waveguide), that allows a practical implementation of structures with several values of impedance using comfortable transversal dimensions was chosen. Composite thick films of calcium titanate and magnesium titanate deposited by screen-printing and thin films of strontium titanate deposited by RF Magnetron Sputtering have been elaborated and characterized. CPW linear resonator method and CPW transmission line have been used to determinate the value of the dielectric constant and loss tangent of these films in the microwave frequency range at room temperature. The CPW linear resonator method was adapted and improved in order to provide satisfactory results for the case of thin films. Finally, for the first time, impedance transmission line transformers (TLT) with reduced size and wide-band response, based on the QCPW configuration using high dielectric constant films have been designed, analyzed, and fabricated.
Braganza, Clinton Ignatuis. "High Dielectric Constant Materials Containing Liquid Crystals." Kent State University / OhioLINK, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=kent1248065159.
Full textMercer, Sean R. "Online microwave measurement of complex dielectric constant." Doctoral thesis, University of Cape Town, 1990. http://hdl.handle.net/11427/8342.
Full textThis dissertation examines the problem of on-line measurement of complex dielectric constant for the purpose of dielectric discrimination or product evaluation using microwave techniques. Various methods of signal/sample interaction were studied and consideration was given to the problem of sorting irregularly shaped discrete samples. The use of microwave transmission and reflection measurements was evaluated. The signal reflection methods were deemed to be best suited to applications with constant geometry feed presentation ( ie. a continuous, homogeneous product stream with little variation in surface geometry).
Dhanapala, Hembathanthirige Yasas. "Dielectric Constant Measurements Using Atomic Force Microscopy System." Wright State University / OhioLINK, 2012. http://rave.ohiolink.edu/etdc/view?acc_num=wright1347907325.
Full textTanner, Carey Marie. "Engineering high dielectric constant materials on silicon carbide." Diss., Restricted to subscribing institutions, 2007. http://proquest.umi.com/pqdweb?did=1459913391&sid=1&Fmt=2&clientId=1564&RQT=309&VName=PQD.
Full textShan, Xiaobing Cheng Zhongyang. "High dielectric constant 0-3 ceramic-polymer composites." Auburn, Ala, 2009. http://hdl.handle.net/10415/1820.
Full textBooks on the topic "Dielectric Constant"
Fröhlich, H. Theory of dielectrics: Dielectric constant and dielectric loss. 2nd ed. Oxford: Clarendon, 1986.
Find full textFröhlich, H. Theory of dielectrics: Dielectrics constant and dielectric loss. 2nd ed. Oxford: Clarendon Press, 1986.
Find full textHuff, H. R., and D. C. Gilmer, eds. High Dielectric Constant Materials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2005. http://dx.doi.org/10.1007/b137574.
Full textHo, Paul S., Jihperng Jim Leu, and Wei William Lee, eds. Low Dielectric Constant Materials for IC Applications. Berlin, Heidelberg: Springer Berlin Heidelberg, 2003. http://dx.doi.org/10.1007/978-3-642-55908-2.
Full textHo, Paul S. Low Dielectric Constant Materials for IC Applications. Berlin, Heidelberg: Springer Berlin Heidelberg, 2003.
Find full textS, Rathore Hazara, and Electrochemical Society. Dielectric Science and Technology Division., eds. Proceedings of the Second International Symposium on Low and High Dielectric Constant Materials: Materials Science, Processing, and Reliability Issues. Pennington, NJ: Electrochemical Society, 1997.
Find full textJ, Lododa Mark, Electrochemical Society. Dielectric Science and Technology Division., Electrochemical Society Electronics Division, and International Symposium on Low and High Dielectric Constant Materials: Materials Science, Processing, and Reliability Issues (5th : 2000 : Toronto, Ont.), eds. Low and high dielectric constant materials: Materials science, processing, and reliability issues : proceedings of the fifth international symposium. Pennington , NJ: Electrochemical Society, Inc., 2000.
Find full textUnited States. National Aeronautics and Space Administration., ed. Theoretical study of the transverse dielectric constant of superlattices and their alloys. [Urbana, Ill.]: University of Illinois at Urbana-Champaign, Coordinated Science Laboratory, College of Engineering, 1986.
Find full textBorst, Christopher L., William N. Gill, and Ronald J. Gutmann. Chemical-Mechanical Polishing of Low Dielectric Constant Polymers and Organosilicate Glasses. Boston, MA: Springer US, 2002. http://dx.doi.org/10.1007/978-1-4615-1165-6.
Full textJack, Gow Anthony, Morey Rexford M, Cold Regions Research and Engineering Laboratory (U.S.), and National Science Foundation (U.S.). Division of Polar Programs., eds. A reassessment of the in-situ dielectric constant of polar firn. [Hanover, N.H.]: US Army Corps of Engineers, Cold Regions Research & Engineering Laboratory, 1993.
Find full textBook chapters on the topic "Dielectric Constant"
Gooch, Jan W. "Dielectric Constant." In Encyclopedic Dictionary of Polymers, 213. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_3582.
Full textGooch, Jan W. "Dielectric Constant." In Encyclopedic Dictionary of Polymers, 887. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_13555.
Full textWeik, Martin H. "dielectric constant." In Computer Science and Communications Dictionary, 402. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/1-4020-0613-6_4960.
Full textda Silva, E. C. F. "AlSb: dielectric constant." In New Data and Updates for IV-IV, III-V, II-VI and I-VII Compounds, their Mixed Crystals and Diluted Magnetic Semiconductors, 133. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-14148-5_77.
Full textGooch, Jan W. "Complex Dielectric Constant." In Encyclopedic Dictionary of Polymers, 160. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_2733.
Full textStrauch, D. "CaSe: dielectric constant." In New Data and Updates for several IIa-VI Compounds (Structural Properties, Thermal and Thermodynamic Properties, and Lattice Properties), 241. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-41461-9_102.
Full textStrauch, D. "CaTe: dielectric constant." In New Data and Updates for several IIa-VI Compounds (Structural Properties, Thermal and Thermodynamic Properties, and Lattice Properties), 250. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-41461-9_107.
Full textStrauch, D. "CaS: dielectric constant." In New Data and Updates for several IIa-VI Compounds (Structural Properties, Thermal and Thermodynamic Properties, and Lattice Properties), 231. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-41461-9_97.
Full textStrauch, Dieter. "SrS: Dielectric Constant." In Semiconductors, 123–24. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-662-53620-9_33.
Full textStrauch, Dieter. "SrSe: Dielectric Constant." In Semiconductors, 135–36. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-662-53620-9_38.
Full textConference papers on the topic "Dielectric Constant"
Zhang, Tian, Yash Thakur, and Q. M. Zhang. "Doped dielectric polymers with low dielectric constant nanofillers." In 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP). IEEE, 2017. http://dx.doi.org/10.1109/ceidp.2017.8257447.
Full textAttiya, Ahmed M., and W. M. Hassan. "Interdigital capacitor dielectric constant probe." In 2017 IEEE Asia Pacific Microwave Conference (APMC). IEEE, 2017. http://dx.doi.org/10.1109/apmc.2017.8251499.
Full textSiwang Kou, Shuhui Yu, Rong Sun, and Ching Ping Wong. "High-dielectric-constant graphite oxide-polyimide composites as embedded dielectrics." In 2012 7th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT). IEEE, 2012. http://dx.doi.org/10.1109/impact.2012.6420222.
Full textZhang, Zhen, Liwu Liu, Jiumin Fan, Kai Yu, Yanju Liu, Liang Shi, and Jinsong Leng. "New silicone dielectric elastomers with a high dielectric constant." In The 15th International Symposium on: Smart Structures and Materials & Nondestructive Evaluation and Health Monitoring, edited by Douglas K. Lindner. SPIE, 2008. http://dx.doi.org/10.1117/12.775989.
Full textDharmadhikari, D. M., and S. N. Helambe. "Analyzing dielectric constant using homocentric resonator." In 2017 IEEE Applied Electromagnetics Conference (AEMC). IEEE, 2017. http://dx.doi.org/10.1109/aemc.2017.8325675.
Full textValavade, A. V., D. C. Kothari, and C. Löbbe. "Dielectric constant microscopy for biological materials." In SOLID STATE PHYSICS: PROCEEDINGS OF THE 57TH DAE SOLID STATE PHYSICS SYMPOSIUM 2012. AIP, 2013. http://dx.doi.org/10.1063/1.4791140.
Full textRichert, Ranko, and Hermann Wagner. "Dielectric relaxation under constant-charge conditions." In Dielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications, edited by Andrzej Wlochowicz. SPIE, 1997. http://dx.doi.org/10.1117/12.276276.
Full textGarcia-Garcia, J., J. Ocampo, C. Martinez, and J. Alonso. "Thick film high dielectric constant resonators." In 2011 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS). IEEE, 2011. http://dx.doi.org/10.1109/comcas.2011.6105872.
Full textUmenyiora, C. A., R. L. Druce, R. D. Curry, P. Norgard, T. McKee, J. J. Bowders, and D. A. Bryan. "Measurement of sand effective dielectric constant." In 2011 IEEE Pulsed Power Conference (PPC). IEEE, 2011. http://dx.doi.org/10.1109/ppc.2011.6191454.
Full textKother, Dietmar, and Uwe Gollor. "Characterization of low dielectric constant materials." In 2007 69th ARFTG Microwave Measurements Conference. IEEE, 2007. http://dx.doi.org/10.1109/arftg.2007.5456337.
Full textReports on the topic "Dielectric Constant"
Brisco, B., T. J. Pultz, R. J. Brown, G. C. Topp, and W D Zebchuk. Dielectric Constant Measurements of Soil With Portable Dielectric Probes and TDR Techniques. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1991. http://dx.doi.org/10.4095/218269.
Full textNahman, N. S. Dielectric constant measurements on n-heptane and 2-heptanone. Office of Scientific and Technical Information (OSTI), January 1994. http://dx.doi.org/10.2172/527432.
Full textBrody, Philip S. Dielectric Constant Decrease upon Illumination in a Barium Titanate Crystal. Fort Belvoir, VA: Defense Technical Information Center, April 1997. http://dx.doi.org/10.21236/ada324231.
Full textMazzaro, Gregory J., Gregory D. Smith, Getachew Kirose, and Kelly D. Sherbondy. Effect of Cold Temperature on the Dielectric Constant of Soil. Fort Belvoir, VA: Defense Technical Information Center, April 2012. http://dx.doi.org/10.21236/ada561950.
Full textWu, Shun Jackson. Development of low dielectric constant alumina-based ceramics for microelectronic substrates. Office of Scientific and Technical Information (OSTI), May 1993. http://dx.doi.org/10.2172/10150031.
Full textKohl, Paul, and Sue A. Bidstrup. Low Dielectric Constant Insulators and Gold Metallization for GHz Multi-Chip Modules. Fort Belvoir, VA: Defense Technical Information Center, June 1992. http://dx.doi.org/10.21236/ada252881.
Full textMopsik, Frederick I., and Brian Dickens. The measurement of the dielectric constant of polymeric films at high fields. Gaithersburg, MD: National Institute of Standards and Technology, 1992. http://dx.doi.org/10.6028/nist.ir.4910.
Full textKohl, Paul, Sue A. Bidstrup, and David Hertling. Low Dielectric Constant Insulators and Gold Metallization for GHz Multi-Chip Modules. Part 2. Fort Belvoir, VA: Defense Technical Information Center, January 1995. http://dx.doi.org/10.21236/ada306976.
Full textToney, Michael F. Supercritical carbon dioxide extraction of porogens for the preparation of ultralow-dielectric-constant films. Office of Scientific and Technical Information (OSTI), June 2003. http://dx.doi.org/10.2172/813355.
Full textHe, Rui, Na (Luna) Lu, and Jan Olek. Development of In-Situ Sensing Method for the Monitoring of Water-Cement (w/c) Values and the Effectiveness of Curing Concrete. Purdue University, 2022. http://dx.doi.org/10.5703/1288284317377.
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