Academic literature on the topic 'Device of testing'
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Journal articles on the topic "Device of testing"
Baubek, A. A., M. G. Zhumagulov, and N. R. Kartjanov. "Testing of the vortex burner device." BULLETIN of L.N. Gumilyov Eurasian National University. Technical Science and Technology Series 129, no. 4 (2019): 23–27. http://dx.doi.org/10.32523/2616-7263-2019-129-4-23-27.
Full textTada, Tetsuo, and Keiichi Sawada. "4720671 Semiconductor device testing device." Microelectronics Reliability 28, no. 4 (January 1988): 669. http://dx.doi.org/10.1016/0026-2714(88)90273-9.
Full textBurresi, Matteo. "Device-level photonic testing." Nature Photonics 9, no. 1 (December 23, 2014): 8–9. http://dx.doi.org/10.1038/nphoton.2014.313.
Full textUretsky, Yan S. "Random vibrations testing device." Journal of the Acoustical Society of America 79, no. 5 (May 1986): 1643. http://dx.doi.org/10.1121/1.393748.
Full textFan, Jin Wei, Yi Jia Liu, Ling Chen, Shi Ji, and Shuai Yuan. "A Kind of Multi-Functional Wall Surface Nondestructive Testing Device." Applied Mechanics and Materials 716-717 (December 2014): 958–60. http://dx.doi.org/10.4028/www.scientific.net/amm.716-717.958.
Full textMajcher, Andrzej, Bohdan Węglowski, and Paweł Ocłoń. "Multi-Function Device for Creep Testing at Elevated Temperature." Advanced Materials Research 875-877 (February 2014): 462–66. http://dx.doi.org/10.4028/www.scientific.net/amr.875-877.462.
Full textBoonen, Maurice. "Hearing device set for testing a hearing device." Journal of the Acoustical Society of America 120, no. 2 (2006): 576. http://dx.doi.org/10.1121/1.2336669.
Full textLenehan, Kurt A., and Dara M. Twomey. "Abrasion testing on synthetic turf: A modified device." Proceedings of the Institution of Mechanical Engineers, Part P: Journal of Sports Engineering and Technology 230, no. 4 (August 3, 2016): 280–84. http://dx.doi.org/10.1177/1754337115612657.
Full textXiao, Yao Zong, Wen Jun Zhang, Bin Wang, and Chun Cheng Tai. "Floatation Column Test Research into Ore Way." Advanced Materials Research 347-353 (October 2011): 1718–21. http://dx.doi.org/10.4028/www.scientific.net/amr.347-353.1718.
Full textGötschi, Tobias, George Rosenberg, Xiang Li, Chen Zhang, Elias Bachmann, Jess G. Snedeker, and Sandro F. Fucentese. "Biomechanical Evaluation of a Novel Loop Retention Mechanism for Cortical Graft Fixation in ACL Reconstruction." Orthopaedic Journal of Sports Medicine 8, no. 2 (February 1, 2020): 232596712090432. http://dx.doi.org/10.1177/2325967120904322.
Full textDissertations / Theses on the topic "Device of testing"
Muto, Andrew (Andrew Jerome). "Device testing and characterization of thermoelectric nanocomposites." Thesis, Massachusetts Institute of Technology, 2008. http://hdl.handle.net/1721.1/44915.
Full textThis electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
Includes bibliographical references (p. 67-68).
It has become evident in recent years that developing clean, sustainable energy technologies will be one of the world's greatest challenges in the 21st century. Thermoelectric materials can potentially make a contribution by increasing energy efficiency of some systems. Thermoelectric materials may play a role in the large scale energy industry, specifically in the applications of refrigeration and waste heat recovery. In this work a novel thermoelectric material will be tested for conversion efficiency. A Bi₂Te₃ nanocomposite has been developed by the joint effort of Prof. Gang Chen's group at MIT and Prof. Zhifeng Ren's group at Boston College. The material exhibits enhanced thermoelectric properties from optimized nanoscale structures and can be easily manufactured in large quantities. In order to better characterize its performance a novel power conversion measurement system has been developed that can measure the conversion efficiency directly. The measurement system design will be described in detail; important design considerations will be addressed such as measuring heat flux, optimizing the load matching condition and reducing electrical contact resistance. Finally the measured efficiency will be compared to the calculated efficiency from a temperature-dependent properties model. It will be shown that a Ni layer must be attached to the nanocomposite to allow soldering and power conversion testing. Results of this work will show that the nanocomposite efficiency is higher than the commercial standard. Electrical contact remains a challenge in realizing the potential efficiency.
by Andrew Muto.
S.M.
Reid, Richard A. "Triaxial permeability device." Thesis, Georgia Institute of Technology, 1987. http://hdl.handle.net/1853/20036.
Full textOttosson, Jan Benjamin. "Development and Evaluation of a Small Punch Testing Device." Thesis, Linköping University, Engineering Materials, 2010. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-59285.
Full textThong, John Thiam Leong. "Electron beam testing technology for high-speed device characterisation." Thesis, University of Cambridge, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.316815.
Full textHopkins, Rachel. "Design and investigation into a novel aerosol testing device." Thesis, University of Bath, 2002. https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.760821.
Full textEnnefors, William. "Netconf Device Simulator : Developing a NETCONF based testing platform." Thesis, Luleå tekniska universitet, Institutionen för system- och rymdteknik, 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-69999.
Full textLindström, Hannes, and Gustav Marstorp. "Security Testing of an OBD-II Connected IoT Device." Thesis, KTH, Skolan för elektroteknik och datavetenskap (EECS), 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-239367.
Full textPaiva, Godinho Raquel. "Open Device Labs - a global community movement to democratise testing and evaluation on real devices." Doctoral thesis, Universitat de Vic - Universitat Central de Catalunya, 2020. http://hdl.handle.net/10803/668637.
Full textOpen labs networks characterised by local activity and global connectivity have emerged to address different demands. Open Device Labs (ODLs) is a grass-roots community movement, which aims to democratise testing and evaluation on real devices, thus far unexplored academically. An ODL is a space typically equipped with mobile devices (e.g. smartphones and tablets) connected to the Internet for Web and app testing purposes. This PhD thesis investigates the ODL ecosystem to identify its main characteristics, practices, benefits, and challenges. We conducted a qualitative inductive case study through four main units. Section I explores the ODL ecosystem, both local and global, through the community core from the hosts’ perspective and focuses on professional ODLs. Section II discusses the investigation of the ODL’s guest users’ perspective of the service. Section III explores the potential of the community to benefit the gaming industry. Section IV examines a single case of an academic ODL. Lastly, the final section presents a framework for establishing academic ODLs.
Fält, Gustav. "Shear strenght test device : Design of a device for testing shear strenght on winter roads." Thesis, Luleå tekniska universitet, Institutionen för teknikvetenskap och matematik, 2020. http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-78394.
Full textRigby, Douglas Bertrand 1956. "Cyclic shear device for interfaces and joints with pore water pressure." Thesis, The University of Arizona, 1988. http://hdl.handle.net/10150/276922.
Full textBooks on the topic "Device of testing"
Schroder, Dieter K. Semiconductor material and device characterization. Hoboken, N.J: John Wiley, 2005.
Find full textSemiconductor material and device characterization. 2nd ed. New York: Wiley, 1998.
Find full textSemiconductor material and device characterization. New York: Wiley, 1990.
Find full textSemiconductor material and device characterization. 3rd ed. [Piscataway, NJ]: IEEE Press, 2006.
Find full textSchroder, Dieter K. Semiconductor Material and Device Characterization. New York: John Wiley & Sons, Ltd., 2006.
Find full textHebner, R. E. Report of tests on Joseph Newman's device. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1986.
Find full textJywe, W. A computer-aided accuracy testing device for machine tools. Manchester: UMIST, 1992.
Find full textC, Church James. Device for in situ measurement of coal cutting forces. Avondale, Md: U.S. Dept. of the Interior, Bureau of Mines, 1985.
Find full textPappas, Deno M. Evaluation of a punch shear test device. Phg [Pittsburgh], PA: U.S. Dept. of the Interior, Bureau of Mines, 1990.
Find full textMulroy, William J. Evaluation of a standard device for calibrating calorimeter test rooms. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1986.
Find full textBook chapters on the topic "Device of testing"
Nolan, Godfrey, Onur Cinar, and David Truxall. "Device Testing." In Android Best Practices, 147–64. Berkeley, CA: Apress, 2013. http://dx.doi.org/10.1007/978-1-4302-5858-2_7.
Full textLuppa, Peter B. "Device classes." In Point-of-Care Testing, 19–25. Berlin, Heidelberg: Springer Berlin Heidelberg, 2018. http://dx.doi.org/10.1007/978-3-662-54497-6_3.
Full textCollin, J. P., and B. Courtois. "Device Testing and Sem Testing Tools." In Testing and Diagnosis of VLSI and ULSI, 469–506. Dordrecht: Springer Netherlands, 1988. http://dx.doi.org/10.1007/978-94-009-1417-9_18.
Full textSpitzenberger, Folker, Claus Langer, and Ulrich M. Gassner. "Medical device legislation and POCT." In Point-of-Care Testing, 251–60. Berlin, Heidelberg: Springer Berlin Heidelberg, 2018. http://dx.doi.org/10.1007/978-3-662-54497-6_25.
Full textKobayashi, Masahiro, and Takao Kaneda. "Reliability Testing of Planar InGaAs Avalanche Photodiodes." In Semiconductor Device Reliability, 413–21. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-009-2482-6_23.
Full textEdge, Charles, and Rich Trouton. "A Culture of Automation and Continual Testing." In Apple Device Management, 471–544. Berkeley, CA: Apress, 2019. http://dx.doi.org/10.1007/978-1-4842-5388-5_9.
Full textSteinbauer, P., and M. Valášek. "Mechatronic Lighting Pole Testing Device." In Recent Advances in Mechatronics, 127–32. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-05022-0_22.
Full textGlaros, N. A., and E. A. Kayafas. "Experimental Device For IC Testing." In System Fault Diagnostics, Reliability and Related Knowledge-Based Approaches, 417–22. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3931-8_32.
Full textHalt, Gerald B., John C. Donch, Amber R. Stiles, Lisa Jenkins VanLuvanee, Brandon R. Theiss, and Dana L. Blue. "FDA Meetings and Device Testing." In FDA and Intellectual Property Strategies for Medical Device Technologies, 27–59. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-04462-6_3.
Full textDandekar, Antara, Samiksha Save, Siddhi Bhandarkar, Milparnika Desai, Jinang Shah, Priyank Lapsia, Malay Bhagat, et al. "Pre-transfusion Blood Testing Device." In Lecture Notes in Bioengineering, 247–53. Singapore: Springer Singapore, 2021. http://dx.doi.org/10.1007/978-981-33-6915-3_26.
Full textConference papers on the topic "Device of testing"
Tsai, Hsiu-Ming, Hsin-Jung Yang, and Yu-Faye Chao. "Specific Polarization-Coding Device with Photoelastic Modulator." In Optical Fabrication and Testing. Washington, D.C.: OSA, 2008. http://dx.doi.org/10.1364/oft.2008.jwd10.
Full textHusmann, Maria, Michael Spiegel, Alfonso Murolo, and Moira C. Norrie. "UI Testing Cross-Device Applications." In ISS '16: 2016 ACM International Conference on Interactive Surfaces and Spaces. New York, NY, USA: ACM, 2016. http://dx.doi.org/10.1145/2992154.2992177.
Full textFazzini, Mattia, and Alessandro Orso. "Managing app testing device clouds." In ASE '20: 35th IEEE/ACM International Conference on Automated Software Engineering. New York, NY, USA: ACM, 2020. http://dx.doi.org/10.1145/3324884.3418909.
Full textSimicic, Marko, Wei-Min Wu, Dieter Claes, Shinichi Tamura, Yohei Shimada, Masanori Sawada, and Shih-Hung Chen. "Wafer-Level LICCDM Device Testing." In 2021 43rd Annual EOS/ESD Symposium (EOS/ESD). IEEE, 2021. http://dx.doi.org/10.23919/eos/esd52038.2021.9574789.
Full textJohnson, Eric G. "Photonic Device Programs at the National Science Foundation." In Optical Fabrication and Testing. Washington, D.C.: OSA, 2008. http://dx.doi.org/10.1364/oft.2008.owd1.
Full textLi, Xiaofeng, Nicholas P. Hylton, Vincenzo Giannini, Kan-Hua Lee, Ned J. Ekins-Daukes, and Stefan A. Maier. "3D device simulation of plasmonic solar cells." In Information Optoelectronics, Nanofabrication and Testing. Washington, D.C.: OSA, 2012. http://dx.doi.org/10.1364/iont.2012.ith5a.4.
Full textSeedhouse, Erik. "Flight Simulation Training Device Qualification for Suborbital Spaceflight Simulator." In AIAA Flight Testing Conference. Reston, Virginia: American Institute of Aeronautics and Astronautics, 2016. http://dx.doi.org/10.2514/6.2016-3976.
Full textHuey, Sidney. "Introduction of Chemical Mechanical Planarization for Semiconductor Device Manufacturing." In Optical Fabrication and Testing. Washington, D.C.: OSA, 2019. http://dx.doi.org/10.1364/oft.2019.om4a.1.
Full textEwbank, Dale E. "Single Arm Interferometer System for Reflective Micro-Device Phase Measurement." In Optical Fabrication and Testing. Washington, D.C.: OSA, 2010. http://dx.doi.org/10.1364/oft.2010.owc2.
Full textRoja, G. P., and S. M. Sarala. "Automated testing of the medical device." In 2017 2nd IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT). IEEE, 2017. http://dx.doi.org/10.1109/rteict.2017.8256589.
Full textReports on the topic "Device of testing"
Ye, Z., D. Finney, R. Zhou, M. Dame, B. Premerlani, B. Kroposki, and S. Englebretson. Testing of GE Universal Interconnection Device. Office of Scientific and Technical Information (OSTI), August 2003. http://dx.doi.org/10.2172/15004477.
Full textStanton, Brian C., Mary Frances Theofanos, Susanne M. Furman, John M. Libert, Shahram Orandi, and John D. Grantham. Usability testing of a contactless fingerprint device: part 1. Gaithersburg, MD: National Institute of Standards and Technology, December 2016. http://dx.doi.org/10.6028/nist.ir.8158.
Full textStanton, Brian C., Mary Frances Theofanos, Susanne M. Furman, and Patrick J. Grother. Usability testing of a contactless fingerprint device: part 2. Gaithersburg, MD: National Institute of Standards and Technology, December 2016. http://dx.doi.org/10.6028/nist.ir.8159.
Full textRetsky, Michael. Testing a Display Device Invention for Digital Mammography Workstations. Fort Belvoir, VA: Defense Technical Information Center, July 2002. http://dx.doi.org/10.21236/ada415994.
Full textMitkova, Maria, Darryl Butt, Michael Kozicki, and Hugo Barnaby. Chalcogenide Glass Radiation Sensor; Materials Development, Design and Device Testing. Office of Scientific and Technical Information (OSTI), April 2013. http://dx.doi.org/10.2172/1082961.
Full textKavianpour Isfahani, Zahra. Statistical Analysis of Stormwater Device Testing Protocols in Portland, Oregon. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.676.
Full textTemple, Brian Allen, and David A. Pimentel. LANL12-RS-108J Report on Device Modeler Testing of the Device Modeler Tool Kit. DMTK in FY14. Office of Scientific and Technical Information (OSTI), September 2014. http://dx.doi.org/10.2172/1158829.
Full textVan Stryland, Eric W., and David Hagan. Optical Source for Organic and Polymeric Nonlinear Device and Material Testing. Fort Belvoir, VA: Defense Technical Information Center, February 1999. http://dx.doi.org/10.21236/ada379874.
Full textJohnson, Terry A., Staats, Wayne Lawrence,, Michael Thomas Leick, Mark D. Zimmerman, Reinhard Radermacher, Cara Martin, Dennis Nasuta, Paul Kalinowski, and William Hoffman. Development and Testing of an Integrated Sandia Cooler Thermoelectric Device (SCTD). Office of Scientific and Technical Information (OSTI), December 2014. http://dx.doi.org/10.2172/1165230.
Full textHorst, John, Thomas Kramer, Keith Stouffer, Joseph Falco, Hui-Min Huang, Frederick Proctor, and Albert Wavering. Distributed testing of a device-level interface specification for a metrology system. Gaithersburg, MD: National Institute of Standards and Technology, 2002. http://dx.doi.org/10.6028/nist.ir.6851.
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