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Journal articles on the topic 'Curtaining'

Author: Grafiati

Published: 28 June 2021

Last updated: 17 February 2022

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1

Schwartz, Jonathan, Yi Jiang, Yongjie Wang, Anthony Aiello, Pallab Bhattacharya, Hui Yuan, Zetian Mi, Nabil Bassim, and Robert Hovden. "Removing Stripes, Scratches, and Curtaining with Nonrecoverable Compressed Sensing." Microscopy and Microanalysis 25, no. 3 (March 14, 2019): 705–10. http://dx.doi.org/10.1017/s1431927619000254.

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AbstractHighly-directional image artifacts such as ion mill curtaining, mechanical scratches, or image striping from beam instability degrade the interpretability of micrographs. These unwanted, aperiodic features extend the image along a primary direction and occupy a small wedge of information in Fourier space. Deleting this wedge of data replaces stripes, scratches, or curtaining, with more complex streaking and blurring artifacts—known within the tomography community as “missing wedge” artifacts. Here, we overcome this problem by recovering the missing region using total variation minimization, which leverages image sparsity-based reconstruction techniques—colloquially referred to as compressed sensing (CS)—to reliably restore images corrupted by stripe-like features. Our approach removes beam instability, ion mill curtaining, mechanical scratches, or any stripe features and remains robust at low signal-to-noise. The success of this approach is achieved by exploiting CS's inability to recover directional structures that are highly localized and missing in Fourier Space.

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2

Denisyuk, Andrey, Tomáš Hrnčíř, Jozef Vincenc Oboňa, Sharang, Martin Petrenec, and Jan Michalička. "Mitigating Curtaining Artifacts During Ga FIB TEM Lamella Preparation of a 14 nm FinFET Device." Microscopy and Microanalysis 23, no. 3 (March 20, 2017): 484–90. http://dx.doi.org/10.1017/s1431927617000241.

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AbstractWe report on the mitigation of curtaining artifacts during transmission electron microscopy (TEM) lamella preparation by means of a modified ion beam milling approach, which involves altering the incident angle of the Ga ions by rocking of the sample on a special stage. We applied this technique to TEM sample preparation of a state-of-the-art integrated circuit based on a 14-nm technology node. Site-specific lamellae with a thickness <15 nm were prepared by top-down Ga focused ion beam polishing through upper metal contacts. The lamellae were analyzed by means of high-resolution TEM, which showed a clear transistor structure and confirmed minimal curtaining artifacts. The results are compared with a standard inverted thinning preparation technique.

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3

Schankula, Christopher W., Christopher K. Anand, and Nabil D. Bassim. "Multi-Angle Plasma Focused Ion Beam (FIB) Curtaining Artifact Correction Using a Fourier-Based Linear Optimization Model." Microscopy and Microanalysis 24, no. 6 (December 2018): 657–66. http://dx.doi.org/10.1017/s1431927618015234.

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AbstractWe present a flexible linear optimization model for correcting multi-angle curtaining effects in plasma focused ion beam scanning electron microscopy (PFIB-SEM) images produced by rocking-polishing schemes. When PFIB-SEM is employed in a serial sectioning tomography workow, it is capable of imaging large three-dimensional volumes quickly, providing rich information in the critical 10–100 nm feature length scale. During tomogram acquisition, a “rocking polish” is often used to reduce straight-line “curtaining” gradations in the milled sample surface. While this mitigation scheme is effective for deep curtains, it leaves shallower line artifacts at two discretized angles. Segmentation and other automated processing of the image set requires that these artifacts be corrected for accurate microstructural quantification. Our work details a new Fourier-based linear optimization model for correcting curtaining artifacts by targeting curtains at two discrete angles. We demonstrate its capabilities by processing images from a tomogram from a multiphase, heterogeneous concrete sample. We present methods for selecting the parameters which meet the user’s goals most appropriately. Compared to previous works, we show that our model provides effective multi-angle curtain correction without introducing artifacts into the image, modifying non-curtain structures or causing changes to the contrast of voids. Our algorithm can be easily parallelized to take advantage of multi-core hardware.

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4

Sparkes, Peter. "The 1925 Property Legislation: Curtaining off the Antecedents." Statute Law Review 9, no. 3 (1988): 146–59. http://dx.doi.org/10.1093/slr/9.3.146.

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5

Schwarz, Stephen M., Brian W. Kempshall, Lucille A. Giannuzzi1, and Molly R. McCartney. "Avoiding the Curtaining Effect: Backside Milling by FIB INLO." Microscopy and Microanalysis 9, S02 (July 28, 2003): 116–17. http://dx.doi.org/10.1017/s1431927603441044.

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6

Schwartz, Jonathan, Yi Jiang, Yongjie Wang, Anthony Aiello, Pallab Bhattacharya, Hui Yuan, Zetian Mi, Nabil Bassim, and Robert Hovden. "Removing Stripes, Scratches, and Curtaining with Non-Recoverable Compressed Sensing." Microscopy and Microanalysis 25, S2 (August 2019): 174–75. http://dx.doi.org/10.1017/s1431927619001600.

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7

Santoro, Francesca, Elmar Neumann, Gregory Panaitov, and Andreas Offenhäusser. "FIB section of cell–electrode interface: An approach for reducing curtaining effects." Microelectronic Engineering 124 (July 2014): 17–21. http://dx.doi.org/10.1016/j.mee.2014.04.021.

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8

Fitschen, Jan Henrik, Jianwei Ma, and Sebastian Schuff. "Removal of curtaining effects by a variational model with directional forward differences." Computer Vision and Image Understanding 155 (February 2017): 24–32. http://dx.doi.org/10.1016/j.cviu.2016.12.008.

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9

Altan, Burçin Deda, Mehmet Atılgan, and Aydoğan Özdamar. "An experimental study on improvement of a Savonius rotor performance with curtaining." Experimental Thermal and Fluid Science 32, no. 8 (September 2008): 1673–78. http://dx.doi.org/10.1016/j.expthermflusci.2008.06.006.

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10

Denisyuk, Andrey, Tomáš Hrnčíř, Jozef Vincenc Oboňa, Martin Petrenec, and Jan Michalička. "Curtaining-Free Top-Down TEM Lamella Preparation from a Cutting Edge Integrated Circuit." Microscopy and Microanalysis 22, S3 (July 2016): 196–97. http://dx.doi.org/10.1017/s1431927616001835.

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11

Fernandez, Jose-Jesus, Teobaldo E. Torres, Eva Martin-Solana, Gerardo F. Goya, and Maria-Rosario Fernandez-Fernandez. "PolishEM: image enhancement in FIB–SEM." Bioinformatics 36, no. 12 (March 28, 2020): 3947–48. http://dx.doi.org/10.1093/bioinformatics/btaa218.

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Abstract Summary We have developed a software tool to improve the image quality in focused ion beam–scanning electron microscopy (FIB–SEM) stacks: PolishEM. Based on a Gaussian blur model, it automatically estimates and compensates for the blur affecting each individual image. It also includes correction for artifacts commonly arising in FIB–SEM (e.g. curtaining). PolishEM has been optimized for an efficient processing of huge FIB–SEM stacks on standard computers. Availability and implementation PolishEM has been developed in C. GPL source code and binaries for Linux, OSX and Windows are available at http://www.cnb.csic.es/%7ejjfernandez/polishem. Supplementary information Supplementary data are available at Bioinformatics online.

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12

Schankula, Christopher W., Christopher K. Anand, and Nabil D. Bassim. "Plasma Focused Ion Beam Curtaining Artifact Correction by Fourier-Based Linear Opti-mization Model." Microscopy and Microanalysis 24, S1 (August 2018): 588–89. http://dx.doi.org/10.1017/s1431927618003434.

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13

Ohtaki, Kenta K., Hope A. Ishii, and John P. Bradley. "Combined Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials." Microscopy and Microanalysis 26, no. 1 (December 20, 2019): 120–25. http://dx.doi.org/10.1017/s1431927619015186.

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AbstractA new transmission electron microscopy (TEM) specimen preparation method that utilizes a combination of focused ion beam (FIB) methods and ultramicrotomy is demonstrated. This combined method retains the benefit of site-specific sampling by FIB but eliminates ion beam-induced damage except at specimen edges and allows recovery of many consecutive sections. It is best applied to porous and/or fine-grained materials that are amenable to ultramicrotomy but are located in bulk samples that are not. The method is ideal for unique samples from which every specimen is precious, and we demonstrate its utility on fine-grained material from the one-of-a-kind Paris meteorite. Compared with a specimen prepared by conventional FIB methods, the final sections are uniformly thin and free from re-deposition and curtaining artifacts common in FIB specimens prepared from porous, heterogeneous samples.

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14

Loeber, Thomas Henning, Bert Laegel, Sandra Wolff, Sebastian Schuff, Frank Balle, Tilmann Beck, Dietmar Eifler, Jan Henrik Fitschen, and Gabriele Steidl. "Reducing curtaining effects in FIB/SEM applications by a goniometer stage and an image processing method." Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 35, no. 6 (November 2017): 06GK01. http://dx.doi.org/10.1116/1.4991638.

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15

Giannuzzi, Lucille A., Zhiyang Yu, Denise Yin, Martin P. Harmer, Qiang Xu, Noel S. Smith, Lisa Chan, Jon Hiller, Dustin Hess, and Trevor Clark. "Theory and New Applications ofEx SituLift Out." Microscopy and Microanalysis 21, no. 4 (July 16, 2015): 1034–48. http://dx.doi.org/10.1017/s1431927615013720.

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AbstractTheex situlift out (EXLO) adhesion forces are reviewed and new applications of EXLO for focused ion beam (FIB)-prepared specimens are described. EXLO is used to manipulate electron transparent specimens on microelectromechanical systems carrier devices designed forin situelectron microscope analysis. A new patented grid design without a support film is described for EXLO. This new slotted grid design provides a surface for holding the specimen in place and also allows for post lift out processing. Specimens may be easily manipulated into a backside orientation to reduce FIB curtaining artifacts with this slotted grid. Large EXLO specimens can be manipulated from Xe+plasma FIB prepared specimens. Finally, applications of EXLO and manipulation of FIB specimens using a vacuum probe lift out method are shown. The vacuum probe provides more control for placing specimens on the new slotted grids and also allows for easy manipulation into a backside configuration.

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16

Wang, Nathan, and George Perreault. "Fabrication of a Novel Rotating Sample Holder to Eliminate the “Curtaining Effect” in FIB-Prepared TEM Specimens." Microscopy Today 22, no. 6 (November 2014): 40–45. http://dx.doi.org/10.1017/s1551929514001151.

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17

Callahan, Patrick G., McLean P. Echlin, Tresa M. Pollock, and Marc De Graef. "Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction Patterns." Microscopy and Microanalysis 23, no. 4 (August 2017): 730–40. http://dx.doi.org/10.1017/s1431927617012326.

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AbstractWe demonstrate that the surface topography of a sample can be reconstructed from electron backscatter diffraction (EBSD) patterns collected with a commercial EBSD system. This technique combines the location of the maximum background intensity with a correction from Monte Carlo simulations to determine the local surface normals at each point in an EBSD scan. A surface height map is then reconstructed from the local surface normals. In this study, a Ni sample was machined with a femtosecond laser, which causes the formation of a laser-induced periodic surface structure (LIPSS). The topography of the LIPSS was analyzed using atomic force microscopy (AFM) and reconstructions from EBSD patterns collected at 5 and 20 kV. The LIPSS consisted of a combination of low frequency waviness due to curtaining and high frequency ridges. The morphology of the reconstructed low frequency waviness and high frequency ridges matched the AFM data. The reconstruction technique does not require any modification to existing EBSD systems and so can be particularly useful for measuring topography and its evolution during in situ experiments.

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18

Hajipour, Abbas, Ali Shams Nateri, and Alireza Sadr Momtaz. "Estimation of fabric opacity by scanner." Sensor Review 34, no. 4 (August 26, 2014): 404–9. http://dx.doi.org/10.1108/sr-01-2013-607.

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Purpose – This study aimed to use a scanner as a low-cost method for measuring the opacity of textile fabric. Textile fabrics must have specific ranges of opacity according to their uses for shirting, curtaining, etc. In this way, opacity is an important property in the textile industry. Conventionally, textile opacity is estimated using a spectrophotometer, which is an expensive method. Design/methodology/approach – In this study a scanner was used as a low-cost method for measuring the opacity of textile fabric. The opacity was estimated by using red, green and blue (RGB) parameters of images of fabric against white and black background. Findings – The accuracy of opacity estimation was improved by converting RGB into several color spaces. The best opacity estimation was obtained by using the XYZ color space. In addition, using a regression method, the best estimation was obtained by using a fourth-order polynomial regression with the LSLM color space. Originality/value – The opacity of fabric has been measured by spectrophotometer, but in this study, the opacity of fabric was measured by scanner as a low cost device and also with novel and simple method. This method achieved acceptable accuracy for opacity estimation. The obtained result is comparable with spectrophotometer results.

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19

Ozkan, Mehmet, Ahmet Cagri Aykan, Ozan Gursoy, Mehmet Altug Tuncer, Beytullah Cakal, Mustafa Yildiz, and Gokhan Kahveci. "An Alternative Approach for Mitral Paravalvular Leak with Dacron Patch Curtaining under the Guidance of Real-Time 3-Dimensional Transesophageal Echocardiography." Cardiology 119, no. 1 (2011): 34–37. http://dx.doi.org/10.1159/000329843.

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20

Zhong, Xiang Li, Sarah J. Haigh, Xiaorong Zhou, and Philip J. Withers. "An in-situ method for protecting internal cracks/pores from ion beam damage and reducing curtaining for TEM sample preparation using FIB." Ultramicroscopy 219 (December 2020): 113135. http://dx.doi.org/10.1016/j.ultramic.2020.113135.

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21

Hutchison, John L. "The Contribution of Intermediate-Voltage, High-Resolution Electron Microscopy In Materials Science: An Appraisal." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 478–79. http://dx.doi.org/10.1017/s0424820100181142.

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Over the past five years or so the development of a new generation of high resolution electron microscopes operating routinely in the 300-400 kilovolt range has produced a dramatic increase in resolution, to around 1.6 Å for “structure resolution” and approaching 1.2 Å for information limits. With a large number of such instruments now in operation it is timely to assess their impact in the various areas of materials science where they are now being used. Are they falling short of the early expectations? Generally, the manufacturers’ claims regarding resolution are being met, but one unexpected factor which has emerged is the extreme sensitivity of these instruments to both floor-borne and acoustic vibrations. Successful measures to counteract these disturbances may require the use of special anti-vibration blocks, or even simple oil-filled dampers together with springs, with heavy curtaining around the microscope room to reduce noise levels. In assessing performance levels, optical diffraction analysis is becoming the accepted method, with rotational averaging useful for obtaining a good measure of information limits. It is worth noting here that microscope alignment becomes very critical for the highest resolution.In attempting an appraisal of the contributions of intermediate voltage HREMs to materials science we will outline a few of the areas where they are most widely used. These include semiconductors, oxides, and small metal particles, in addition to metals and minerals.

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22

Zhang, Yuan, Olivier Boucher, Philippe Ciais, Laurent Li, and Nicolas Bellouin. "How to reconstruct aerosol-induced diffuse radiation scenario for simulating GPP in land surface models? An evaluation of reconstruction methods with ORCHIDEE_DFv1.0_DFforc." Geoscientific Model Development 14, no. 4 (April 20, 2021): 2029–39. http://dx.doi.org/10.5194/gmd-14-2029-2021.

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Abstract. The impact of diffuse radiation on photosynthesis has been widely documented in field measurements. This impact may have evolved over time during the last century due to changes in cloudiness, increased anthropogenic aerosol loads over polluted regions, and to sporadic volcanic eruptions curtaining the stratosphere with sulfate aerosols. The effects of those changes in diffuse light on large-scale photosynthesis (GPP) are difficult to quantify, and land surface models have been designed to simulate them. Investigating how anthropogenic aerosols have impacted GPP through diffuse light in those models requires carefully designed factorial simulations and a reconstruction of background diffuse light levels during the preindustrial period. Currently, it remains poorly understood how diffuse radiation reconstruction methods can affect GPP estimation and what fraction of GPP changes can be attributed to aerosols. In this study, we investigate different methods to reconstruct spatiotemporal distribution of the fraction of diffuse radiation (Fdf) under preindustrial aerosol emission conditions using a land surface model with a two-stream canopy light transmission scheme that resolves diffuse light effects on photosynthesis in a multi-layered canopy, ORCHIDEE_DF. We show that using a climatologically averaged monthly Fdf, as has been done by earlier studies, can bias the global GPP by up to 13 PgC yr−1 because this reconstruction method dampens the variability of Fdf and produces Fdf that is inconsistent with shortwave incoming surface radiation. In order to correctly simulate preindustrial GPP modulated by diffuse light, we thus recommend that the Fdf forcing field should be calculated consistently with synoptic, monthly, and inter-annual aerosol and cloud variability for preindustrial years. In the absence of aerosol and cloud data, alternative reconstructions need to retain the full variability in Fdf. Our results highlight the importance of keeping consistent Fdf and radiation for land surface models in future experimental designs that seek to investigate the impacts of diffuse radiation on GPP and other carbon fluxes.

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23

Gendzel, Glen. "The Tortilla Curtainand California's Nativist Heritage." Text and Performance Quarterly 33, no. 2 (April 2013): 175–83. http://dx.doi.org/10.1080/10462937.2013.773366.

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24

Kızılçelik, Sezgin. "Modernity as colonialism, racism, and holocaustSömürgecilik, ırkçılık ve soykırım olarak modernlik." Journal of Human Sciences 15, no. 4 (October 31, 2018): 2012. http://dx.doi.org/10.14687/jhs.v15i4.5547.

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Modernity is a history changing phenomena that has left an irreplaceable mark particularly in the Western world in the last five hundred years. This is the reason why modernity has been at the centre of the works of philosophers and sociologists. Modernity has denoted various meanings and been defined on different levels. Modernity, therefore, has two faces: one wears make-up while the other does not. The face of modernity in make-up is its fake side with the emphasis it puts on freedom, equality, human rights, democracy, justice, peace, brotherhood, welfare, wealth, and good spirits. The other face of modernity, however, is its real face free of its misleading veil. Despite all the polish applied on the surface of modernity, time has removed its superficial mask and revealed its defects, crises, and problems. In other words, the actual face of modernity entails war, violence, savageness, genocide, xenophobia, colonialism, racism, inequality, slavery, injustice, exploitation and poverty. When one studies modernity under spotlight, it can clearly be seen that the major faults within are barbarism, despotism, totalitarianism, terrorism, colonialism, racism, ethnic cleansing, and holocaust. This paper focuses on colonialism, racism, and holocaust, three of the serious make-up components curtaining the face of modernity. Modernity and these three concepts are closely related. Modernity is based on colonialism and it was colonialism that has triggered tendencies towards racism. It was modernity itself that had led to a world order that casts away, marginalises, and humiliates the other. Colonialism and racism, the two good-old friends of modernity, have prepared the ground for the holocaust. In this article, holocaust is analysed with reference to Zygmunt Bauman’s Holocaust (the massacre of the Jews) with the aim of studying modernity in relation to colonialism and racism.Extended English summary is in the end of Full Text PDF (TURKISH) file. ÖzetModernlik, dünya tarihinin akışını değiştiren, bilhassa Batı dünyasının son beş yüzyılına damgasını vuran bir olgudur. İşte, bu yüzden, gerek geçmişte gerekse de günümüzde filozofların ve sosyologların ilgisini çeken konuların başında modernlik gelmektedir. Modernlik, kendisine farklı anlam yüklemeleri yapılan ve değişik boyutlarıyla tanımlanan bir olgudur. Modernliğin biri makyajlı, diğeri makyajsız olan iki yüzü vardır. Modernliğin makyajlı yüzü, özgürlüğe, eşitliğe, insan haklarına, demokrasiye, adalete, barışa, kardeşliğe, refaha, zenginliğe ve mutluluğa vurgu yapan sahte yüzüdür. Modernliğin diğer yüzü olan makyajsız yüzü ise, aslında onun gerçek yüzüdür. Modernliğin yüzüne yapılan bütün cilalara rağmen zamanla onun defoları, krizleri ve sıkıntıları daha görünür hale gelmiştir. Daha açık bir deyişle, modernliğin savaşı, şiddeti, vahşeti, soykırımı, yabancı düşmanlığını, sömürgeciliği, ırkçılığı, eşitsizliği, köleliği, adaletsizliği, sömürüyü ve yoksulluğu içeren gerçek yüzü vardır. Modernliği yüzeysel değil, derinlemesine analiz ettiğimizde karşımıza modernliğin ana pürüzleri olarak barbarlık, despotizm, totalitarizm, terörizm, sömürgecilik, ırkçılık, etnik temizlik ve soykırım gibi büyük problemler çıkmaktadır. Bu makalede, modernliğin gerçek yüzünü kaplayan ciddi arızalarından olan sömürgecilik, ırkçılık ve soykırım üzerinde durulmuştur. Modernlik ile sömürgecilik, ırkçılık ve soykırım arasında yakın bir ilişki vardır. Modernlik, sömürgeciliğe dayanan bir sistemdir. Sömürgeciliğin yayılmasıyla ırkçılık eğilimleri çoğalmıştır. Modernlik, farklı olanı dışlayan, ötekileştiren ve aşağılayan bir toplum düzeni inşa etmiştir. Modernliğin sadık dostu sömürgecilik ve ırkçılık, aynı zamanda, soykırımlara zemin hazırlamıştır. Makalede, soykırım, Zygmunt Bauman’ın Holocaust, yani “Yahudilerin topluca katledilmesi” örneği üzerinden irdelenmiştir. Bu makalenin ana amacı, modernliği, birbirleriyle bağlantılı olan sömürgecilik, ırkçılık ve soykırım boyutları bağlamında tahlil etmektir.

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25

Spangler, Matthew. "Artist's Statement: Adapting T. C. Boyle's novelThe Tortilla Curtainand Subsequent Production by the San Diego Repertory Theatre." Text and Performance Quarterly 33, no. 2 (April 2013): 151–67. http://dx.doi.org/10.1080/10462937.2013.769061.

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26

"Capricious fancy: draping and curtaining the historic interior, 1800-1930." Choice Reviews Online 50, no. 12 (July 23, 2013): 50–6564. http://dx.doi.org/10.5860/choice.50-6564.

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27

Wexler, Mark N., and Judy Oberlander. "COVID-19 as a super crisis: implications for place management." Journal of Place Management and Development ahead-of-print, ahead-of-print (March 1, 2021). http://dx.doi.org/10.1108/jpmd-09-2020-0093.

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Purpose The purpose of this paper is to investigate COVID-19 as a super crisis in the design and management of places. Design/methodology/approach This theory-driven work outlines why and how, by treating COVID-19 as a super crisis, the immunological view rises in priority and swiftly ushers in short- and long-term implications for space design and place management. Findings First, this paper looks at the short-term impact of COVID-19 upon space and place management in addressing how porous bubbling, stippling and flexible curtaining respond to immediate retrofitting needs during the pandemic. Using the concept of COVID-19-induced collective trauma, this paper draws attention to health-care facilities, schools, workplaces, commercial buildings and public outdoor spaces. These sites require short-term improvisation in place and space design and will, where the collective trauma of COVID-19 leaves strong traces, require long-term redesign and rethinking. Social implications As a super crisis, COVID-19 generates contradictions in the existing trend in space and place studies from the notion of space and place as a container to one focusing on “flow.” A focus on flow highlights a focus on space and place as adaptable to changes in flow, especially as augmented and mediated by technology. Originality/value This treatment of COVID-19 as a super crisis is intended to stimulate the design and management of spaces and places in the post-COVID-19 period.

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