Journal articles: 'Crystallographic Orientation Determination'

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Lan, Yucheng, Mobolaji Zondode, Hua Deng, Jia-An Yan, Marieme Ndaw, Abdellah Lisfi, Chundong Wang, and Yong-Le Pan. "Basic Concepts and Recent Advances of Crystallographic Orientation Determination of Graphene by Raman Spectroscopy." Crystals 8, no. 10 (September 21, 2018): 375. http://dx.doi.org/10.3390/cryst8100375.

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Graphene is a kind of typical two-dimensional material consisting of pure carbon element. The unique material shows many interesting properties which are dependent on crystallographic orientations. Therefore, it is critical to determine their crystallographic orientations when their orientation-dependent properties are investigated. Raman spectroscopy has been developed recently to determine crystallographic orientations of two-dimensional materials and has become one of the most powerful tools to characterize graphene nondestructively. This paper summarizes basic aspects of Raman spectroscopy in crystallographic orientation of graphene nanosheets, determination principles, the determination methods, and the latest achievements in the related studies.

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Wang, W. H., X. Sun, G. D. Köhlhoff, and K. Lücke. "Orientation Determination by Continuous Etching Patterns in Copper and Copper Alloys." Textures and Microstructures 24, no. 4 (January 1, 1995): 199–219. http://dx.doi.org/10.1155/tsm.24.199.

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A new method for determination of grain orientations using etch patterns was developed for copper and copper alloys. This method is based on the fact, that one gets etch patterns characteristic for the crystallographic orientation of the etched surface, if a specimen of copper or copper alloys is etched in conc. HNO3. In contrast to etch pits, the etch patterns are developed continuously over the whole grain. This allows a direct and continuous observation of the orientation changes within and between the grains, which is not possible for many other orientation determination methods. The determination accuracy of the new method depends on the crystallographic orientation of the etched surface and varies between 2° and 10°. For some special surface orientations the etch patterns allow even the determination of very small orientation changes (≤ 2°), occurring e.g. in a deformed grain.

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Cheredov, V. N., and A. E. Petrakov. "Determination of the orientation of internal linear defects in isotropic optical crystals." Industrial laboratory. Diagnostics of materials 85, no. 2 (March 1, 2019): 29–32. http://dx.doi.org/10.26896/1028-6861-2019-85-2-29-32.

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Study of the structure of optical crystals and defects in them is one of the most important problems in crystal physics, crystallography and material science. Nowadays, study of the nanostructures, including the linear defects in crystals is of particular importance. Defects, and first and foremost linear imperfections of the crystal structure, significantly reduce the operational physical properties of optical crystals. Analysis of the properties of those defects, their orientation in the crystal lattice, as well as developing of the methods for determination of the crystallographic orientation of linear defects are the most important in view of the possibility of improving the properties of optical crystals. A method for rapid determination of the crystallographic orientation of linear defects (dislocations, clusters, linearly extended bulk inclusions, etc.) in optical crystals is presented. The orientation of a linearly extended micropore in an isotropic optical transparent fluorite crystal was determined using an optical microscope. The readings of the scale of the eyepiece drum were recorded when rotating the crystal fixed in the crystal holder of the microscope. Corrections for the refraction of light in the bulk of the crystal were taken into account analytically. The crystallographic orientation of the microporous in a transparent fluorite crystal was studied in detail. Crystallographic indices of micropore orientation corresponded to [100]. We developed an efficient rapid procedure for determination of the orientation of internal linear defects (imperfections) in optically isotropic crystals using an optical microscope. The restrictions imposed on the angles of crystal rotation depending on the value of the refractive index are considered for the given method of determination.

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Olejnak, Juraj, Petr Sedlak, Hanus Seiner, Kristyna Zoubkova, Pavla Stoklasova, and Tomas Grabec. "Generalized inverse problems in resonant ultrasound spectroscopy." Journal of the Acoustical Society of America 152, no. 4 (October 2022): A88. http://dx.doi.org/10.1121/10.0015638.

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Determination of the elastic constants by RUS is an inverse problem because experimentally obtained resonant frequencies cannot be directly recalculated into the elastic constants. Instead, an approximate spectrum is calculated from the dimensions and crystallographic orientation of the sample, its mass, and a set of 'guessed' elastic constants, and the difference between this approximate spectrum and the experiment is iteratively minimized. RUS has been used for the determination of either the elastic constants, or crystallographic orientations of the material in the past, but the recent advancements in RUS methodology, in particular, the employment of the scanning laser vibrometry for identification of the vibrational modes, enable inverse determination of most of the input parameters simultaneously. We propose an extension of the classical RUS inversion procedure that allows us to precisely identify the crystallographic orientation and dimensions of the sample in addition to the elastic coefficients. The proposed algorithm was applied to generally oriented iron single crystals. After the shape and orientation optimization, we achieved an unprecedented match between calculated and measured spectrum, including a very high number of utilized resonant modes (>300). We show that the highest modes are extremely sensitive to the crystallographic orientation.

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Esaka, Hisao, and Kei Shinozuka. "Determination of Crystallographic Orientation near a Chill Zone Using Ghost Lines." Materials Science Forum 879 (November 2016): 514–17. http://dx.doi.org/10.4028/www.scientific.net/msf.879.514.

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Many crystals nucleate on the mold surface when the molten alloy is poured in a mold cavity. Because the crystallographic orientations of these crystals are random, the solidified structure near the mold surface is very complex. The ghost lines, which are sometimes thick and the angle between them is not 90 degrees, are often observed in this region. However, if the crystallographic structure of this alloy is cubic, such as bcc or fcc, the ghost lines are very regular. In order to understand the geometry of ghost lines, Al-20 mass%Cu alloys were unidirectionally solidified with constant growth velocity. The solidified structures on the obliquely crossed section were observed. The ghost lines were quite regular and parallel to each other in a solidification grain. The angles and the ratio of the width of ghost lines were measured and crystallographic orientations were estimated using these parameters, based on the solid analytical geometry. EBSD analysis were also performed on the area, where the ghost lines were characterized, and the precise crystallographic orientations were decided. The comparison between both analytical values indicated that the differences between them are within 10 degrees and it can be safely concluded that the estimation for crystallographic orientation using ghost lines agreed well with the EBSD analysis.

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Bachmann, Florian, Ralf Hielscher, Peter E. Jupp, Wolfgang Pantleon, Helmut Schaeben, and Elias Wegert. "Inferential statistics of electron backscatter diffraction data from within individual crystalline grains." Journal of Applied Crystallography 43, no. 6 (October 1, 2010): 1338–55. http://dx.doi.org/10.1107/s002188981003027x.

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Highly concentrated distributed crystallographic orientation measurements within individual crystalline grains are analysed by means of ordinary statistics neglecting their spatial reference. Since crystallographic orientations are modelled as left cosets of a given subgroup of SO(3), the non-spatial statistical analysis adapts ideas borrowed from the Bingham quaternion distribution on {\bb S}^3. Special emphasis is put on the mathematical definition and the numerical determination of a `mean orientation' characterizing the crystallographic grain as well as on distinguishing several types of symmetry of the orientation distribution with respect to the mean orientation, like spherical, prolate or oblate symmetry. Applications to simulated as well as to experimental data are presented. All computations have been done with the free and open-source texture toolboxMTEX.

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Calvert, G., S. Swider, F. Ruta, G. Rossman, and R. S. Feigelson. "Determination of the crystallographic orientation of SrI2 crystals." Journal of Crystal Growth 498 (September 2018): 263–68. http://dx.doi.org/10.1016/j.jcrysgro.2018.06.030.

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Lloyd, G. E., N. H. Schmidt, D. Mainprice, and D. J. Prior. "Crystallographic textures." Mineralogical Magazine 55, no. 380 (September 1991): 331–45. http://dx.doi.org/10.1180/minmag.1991.055.380.04.

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AbstractTo material scientists the term texture means the crystallographic orientation of grains in a polycrystal. In contrast, geologists use the term more generally to refer to the spatial arrangement or association of mineral grains in a rock. In this contribution we are concerned with the materials science definition. There are several established techniques available for the determination of crystallographic textures in rocks. It has also been realised that the scanning electron microscope (SEM) is applicable to the study of crystallographic textures via the electron channelling (EC) effect. This provides an image of mineral/rock microstructure (via orientation contrast), as well as a means of accurately indexing their crystal orientations (via electron channelling patterns, ECP). Both types of EC image result from the relationship between incident electron beam and crystal structure, and the subsequent modulation of the backscattered electron (BSE) emission signal according to Bragg's Law. It is a simple matter to switch between the two imaging modes. A related effect, electron backscattering, provides only the diffraction patterns, but has superior spatial resolution and pattern angles.Due to crystal symmetry restrictions, there is only a limited range of ECP configurations possible for any mineral. Individual patterns can therefore be identified by comparison with the complete ‘ECP-map’. The location of an individual pattern within the map area is determined by spherical angles, the exact definition of which depends on the type of fabric diagram (e.g. inverse pole figure, pole figure or orientation distribution function). Originally, these angles were measured manually. A computer program (CHANNEL) has been developed which uses a digitisation approach to pattern recognition, derives the required fabric diagrams and also constructs ECP-maps from standard crystal data (i.e. unit cell parameters etc.).The combination of SEM/EC and CHANNEL dramatically facilitates the study of crystal textures in minerals and rocks, making statistical crystallographic analysis from individual orientations a practicality. The following example applications are considered: (1) crystal structure representation of the Al2SiO5 polymorph system; (2) local crystal texture relationships (epitaxial nucleation) between andalusite and sillimanite grains; (3) bulk rock crystal textures of quartzites; and (4) physical properties (e.g. elastic constants and seismic velocities) determined from bulk rock texture.

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Zhang, Yu Dong, Shi Ying Wang, Claude Esling, Xiang Zhao, and Liang Zuo. "Determination of Crystallographic Elements (Dislocation and Surface Plane) from Automated TEM Orientation Determination." Materials Science Forum 702-703 (December 2011): 866–71. http://dx.doi.org/10.4028/www.scientific.net/msf.702-703.866.

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Abstract In the present work, we summarized two calculation methods to determine some specific crystallographic elements based on electron diffraction orientation measurements performed by TEM. The first one is to determine the type and the Burgers vector of dislocations for a known crystal structure. The method calculates the orientation of the projections of all the possible dislocation line vectors in the TEM screen coordinate system using the determined crystallographic orientation of the grain and then compares them with the observed ones to identify the observed dislocations. The second is to characterize the surface crystalline planes and directions of faceted nano-particles. With the determination of the edge trace vectors and then the plane normal vectors in the screen coordinate system of the TEM, their Miller indices in the crystal coordinate system can be calculated through coordinate transformation. These methods are expected to facilitate the related studies.

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Weiland, H., D. P. Field, and B. L. Adams. "In situ observation of orientation changes on metallic surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 246–47. http://dx.doi.org/10.1017/s0424820100137604.

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The characterization of crystalline aggregates by the crystallographic orientations of their grains and subgrains has become a subject of increasing interest. The information obtained is not only used for the characterization of materials, but also more importantly for the determination of properties. To mention only a few, applications have been found in the areas of fracture analysis, recrystallization, and plastic deformation.Most commonly, crystallographic orientations are determined from Backscattered Kikuchi Diffraction (BKD) in the SEM and from Kikuchi patterns obtained by microdiffraction in the TEM. Since the development of fully automatic pattern analysis routines for the BKD, the SEM based techniques currently finds the most applications. In conjunction with computer controlled stage or beam displacements, the technique is known as Orientation Imaging Microscopy (OIM). In this manner, thousands of diffraction patterns are analyzed automatically within a short time. This leads to a statistical description of the distribution of crystallographic orientations, which sufficiently represent the bulk material.

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Filman, D. J., M. W. Wien, J. A. Cunningham, J. M. Bergelson, and J. M. Hogle. "Structure Determination of Echovirus 1." Acta Crystallographica Section D Biological Crystallography 54, no. 6 (November 1, 1998): 1261–72. http://dx.doi.org/10.1107/s0907444998002790.

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The atomic structure of echovirus 1 (a member of the enterovirus genus of the picornavirus family) has been determined using cryo-crystallography and refined to 3.55 Å resolution. Echovirus 1 crystallizes in space group P22121 with a = 352.45, b = 472.15 and c = 483.20 Å. The crystals contain one full virus particle in the asymmetric unit allowing for 60-fold noncrystallographic symmetry averaging. The diffraction pattern shows strong pseudo-B-centering with reflections with h + l = 2n + 1 being systematically weak or absent below about 6 Å resolution. The size of the unit cell and presence of pseudo-B-centering placed strong constraints on the allowed packing of the icosahedral particle in the crystal lattice. These constraints greatly facilitated the determination of the orientation and position of the virus by reducing the dimensionality of the search, but interactions between the crystallographic and noncrystallographic symmetries rendered the choice of space group ambiguous until very late in the structure determination. This structure determination provides a striking example of the power of packing analysis in molecular replacement and illustrates how subtle interactions between crystallographic and noncrystallographic symmetries can be resolved.

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Angel, Ross, Sula Milani, Matteo Alvaro, and Fabrizio Nestola. "OrientXplot: a program to analyse and display relative crystal orientations." Journal of Applied Crystallography 48, no. 4 (July 18, 2015): 1330–34. http://dx.doi.org/10.1107/s160057671501167x.

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Orientations of single crystals are usually determined by diffraction experiments. Indexing of a diffraction pattern from one crystal leads to the determination of its `orientation matrix', which defines the orientation of its crystallographic axes relative to a set of reference axes associated with the diffractometer. Crystal orientations can also be described in terms of Euler angles, especially from electron backscattered diffraction measurements.OrientXplotis a Windows program that reads all common types of orientation matrices, as well as orientation data such as Euler angles. The program calculates and displays the relative orientations of pairs of crystals, such as twins or inclusion crystals trapped inside host crystals.OrientXplotcan manipulate (under user control) the orientation matrices to allow for ambiguities in indexing that arise from crystal symmetries. Orientation data can be displayed on a stereogram or output in numerical form for plotting in external programs.

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Ayyer, Kartik, Hugh T. Philipp, Mark W. Tate, Jennifer L. Wierman, Veit Elser, and Sol M. Gruner. "Determination of crystallographic intensities from sparse data." IUCrJ 2, no. 1 (January 1, 2015): 29–34. http://dx.doi.org/10.1107/s2052252514022313.

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X-ray serial microcrystallography involves the collection and merging of frames of diffraction data from randomly oriented protein microcrystals. The number of diffracted X-rays in each frame is limited by radiation damage, and this number decreases with crystal size. The data in the frame are said to be sparse if too few X-rays are collected to determine the orientation of the microcrystal. It is commonly assumed that sparse crystal diffraction frames cannot be merged, thereby setting a lower limit to the size of microcrystals that may be merged with a given source fluence. TheEMCalgorithm [Loh & Elser (2009),Phys. Rev. E,80, 026705] has previously been applied to reconstruct structures from sparse noncrystalline data of objects with unknown orientations [Philippet al.(2012),Opt. Express,20, 13129–13137; Ayyeret al.(2014),Opt. Express,22, 2403–2413]. Here, it is shown that sparse data which cannot be oriented on a per-frame basis can be used effectively as crystallographic data. As a proof-of-principle, reconstruction of the three-dimensional diffraction intensity using sparse data frames from a 1.35 kDa molecule crystal is demonstrated. The results suggest that serial microcrystallography is, in principle, not limited by the fluence of the X-ray source, and collection of complete data sets should be feasible at, for instance, storage-ring X-ray sources.

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Krakow, Robert, Robbie J. Bennett, Duncan N. Johnstone, Zoja Vukmanovic, Wilberth Solano-Alvarez, Steven J. Lainé, Joshua F. Einsle, Paul A. Midgley, Catherine M. F. Rae, and Ralf Hielscher. "On three-dimensional misorientation spaces." Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 473, no. 2206 (October 2017): 20170274. http://dx.doi.org/10.1098/rspa.2017.0274.

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Determining the local orientation of crystals in engineering and geological materials has become routine with the advent of modern crystallographic mapping techniques. These techniques enable many thousands of orientation measurements to be made, directing attention towards how such orientation data are best studied. Here, we provide a guide to the visualization of misorientation data in three-dimensional vector spaces, reduced by crystal symmetry, to reveal crystallographic orientation relationships. Domains for all point group symmetries are presented and an analysis methodology is developed and applied to identify crystallographic relationships, indicated by clusters in the misorientation space, in examples from materials science and geology. This analysis aids the determination of active deformation mechanisms and evaluation of cluster centres and spread enables more accurate description of transformation processes supporting arguments regarding provenance.

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Zaefferer, Stefan. "New developments of computer-aided crystallographic analysis in transmission electron microscopy." Journal of Applied Crystallography 33, no. 1 (February 1, 2000): 10–25. http://dx.doi.org/10.1107/s0021889899010894.

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A new computer program for on-line crystallographic analysis in transmission electron microscopy (TEM) is presented. The program is based on the fast on-line determination of single-crystal orientations from Kikuchi and spot patterns. Spot patterns, which are particularly useful in the case of highly deformed metals, are analyzed by a new digital image processing procedure. This procedure improves the precision and ease of the orientation measurement. The program permits the on-line measurement of glide systems characterized by the Burgers vector and the crystallographic line direction of dislocations and their glide planes. The determination of twin systems, based on the misorientation calculation for any crystal structure, is included as well. The possibility of determining the foil thickness permits the complete crystallographic characterization of interfaces. Finally, the program facilitates the discrimination of phases and includes the fit of the lattice parametersa,bandcfrom diffraction patterns. The new procedures are described in detail. Application examples are given for all functions.

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Zeng, Lingxiao, Wei Ding, and Quan Hao. "Using cryo-electron microscopy maps for X-ray structure determination." IUCrJ 5, no. 4 (May 11, 2018): 382–89. http://dx.doi.org/10.1107/s2052252518005857.

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X-ray crystallography and cryo-electron microscopy (cryo-EM) are complementary techniques for structure determination. Crystallography usually reveals more detailed information, while cryo-EM is an extremely useful technique for studying large-sized macromolecules. As the gap between the resolution of crystallography and cryo-EM data narrows, the cryo-EM map of a macromolecule could serve as an initial model to solve the phase problem of crystal diffraction for high-resolution structure determination. FSEARCH is a procedure to utilize the low-resolution molecular shape for crystallographic phasing. The IPCAS (Iterative Protein Crystal structure Automatic Solution) pipeline is an automatic direct-methods-aided dual-space iterative phasing and model-building procedure. When only an electron-density map is available as the starting point, IPCAS is capable of generating a completed model from the phases of the input map automatically, without the requirement of an initial model. In this study, a hybrid method integrating X-ray crystallography with cryo-EM to help with structure determination is presented. With a cryo-EM map as the starting point, the workflow of the method involves three steps. (1) Cryo-EM map replacement: FSEARCH is utilized to find the correct translation and orientation of the cryo-EM map in the crystallographic unit cell and generates the initial low-resolution map. (2) Phase extension: the phases calculated from the correctly placed cryo-EM map are extended to high-resolution X-ray data by non-crystallographic symmetry averaging with phenix.resolve. (3) Model building: IPCAS is used to generate an initial model using the phase-extended map and perform model completion by iteration. Four cases (the lowest cryo-EM map resolution being 6.9 Å) have been tested for the general applicability of the hybrid method, and almost complete models have been generated for all test cases with reasonable R work/R free. The hybrid method therefore provides an automated tool for X-ray structure determination using a cryo-EM map as the starting point.

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Li, Zongbin, Yudong Zhang, Claude Esling, Xiang Zhao, and Liang Zuo. "Determination of the orientation relationship between austenite and 5M modulated martensite in Ni–Mn–Ga alloys." Journal of Applied Crystallography 44, no. 6 (November 12, 2011): 1222–26. http://dx.doi.org/10.1107/s0021889811043366.

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The microstructural and crystallographic characteristics of 5M martensite in an Ni50Mn28Ga22alloy were investigated by electron backscatter diffraction (EBSD) analysis. The microstructure of 5M martensite observed at room temperature can be characterized by broad plates with alternately distributed fine lamellae (variants). With the accurate EBSD orientation measurements and by application of monoclinic superstructure information, four twin-related variants in one broad plate were identified. On the basis of the correct orientation data of martensite variants acquired from the EBSD measurements, the more favourable orientation relationship between austenite and 5M martensite was revealed to be the Pitsch relation with (101)A//(1 {\overline 2} \hskip1{\overline 5})5Mand [10 {\overline 1}]A//[{\overline 5} \hskip1 {\overline 5} 1]5Mby detailed crystallographic calculation without residual austenite.

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Li, W., J. Coulson, P. Marrow, R. J. Smith, S. J. Lainé, M. Clark, and S. D. Sharples. "Crystallographic Orientation Determination of Hexagonal Structure Crystals by Laser Ultrasonic Technique." Journal of Physics: Conference Series 684 (January 2016): 012001. http://dx.doi.org/10.1088/1742-6596/684/1/012001.

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Huang, X., and Q. Liu. "Determination of crystallographic and macroscopic orientation of planar structures in TEM." Ultramicroscopy 74, no. 3 (August 1998): 123–30. http://dx.doi.org/10.1016/s0304-3991(98)00033-3.

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Verhoeven, J. D., and E. D. Gibson. "Determination of crystallographic orientation of YBa2Cu3Oxgrains from their optical twin patterns." Applied Physics Letters 52, no. 14 (April 4, 1988): 1190–92. http://dx.doi.org/10.1063/1.99672.

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Glowka, Marek, Malgorzata Szczesio, and Andrzej Olczak. "Crystallographic approach to determination of active conformations of LCAPs." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C1697. http://dx.doi.org/10.1107/s2053273314083028.

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Long-Chain Aryl-Piperazines (LCAPs) are well known serotonin receptor ligands used in several marketed antidepressant drugs. LCAPs consist of three structural units: a terminal group, an arylpiperazine at one N atom and an aliphatic chain (spacer) at the other N atom joining the two former units. Both the arylpiperazine and the terminal groups have rather rigid structures and thus their conformational freedom is limited. The opposite is true for the aliphatic spacer, which allows practically any orientation of the terminal group. The resulting diversity of conformations observed in the crystals of LCAPs is significant, which explains their affinity to many serotonin receptors. There is a vast literature on the subject and some qualitative observations were developed. However, due to the flexible spacer and diversity of the terminal groups, their usefulness is limited. Our X-ray (16 crystal structures) and affinity studies on almost sixty new LCAPs [1], together with the data from CSD, enable us to determine the common conformations of LCAPs and the relationships between structure, affinity and conformation. In the analysis, the following features were considered: (i) - axial/equatorial orientations of the substituents of the piperazine ring; (ii) –N1 protonation possible in the physiological environment; (iii) - a twist of the aryl ring; (iv) –the parity and the number of atoms in the spacer; (v) – the presence of heteroatoms or groups in the spacer; (vi) – the spatial position of the terminal group in relation to the piperazine ring.

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Zhang, Xinming, Jorgen F. Rufner, Thomas LaGrange, Ricardo H. R. Castro, Julie M. Schoenung, Geoffrey H. Campell, and Klaus van Benthem. "Determination of Reliable Grain Boundary Orientation using Automated Crystallographic Orientation Mapping in the Transmission Electron Microscope." Microscopy and Microanalysis 21, S3 (August 2015): 1663–64. http://dx.doi.org/10.1017/s1431927615009095.

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Choi, Yun, Keunui Kim, Soo Yeon Lim, Jungcheol Kim, Je Myoung Park, Jung Hwa Kim, Zonghoon Lee, and Hyeonsik Cheong. "Complete determination of the crystallographic orientation of ReX2 (X = S, Se) by polarized Raman spectroscopy." Nanoscale Horizons 5, no. 2 (2020): 308–15. http://dx.doi.org/10.1039/c9nh00487d.

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Li, Wenqi, Steve D. Sharples, Richard J. Smith, Matt Clark, and Michael G. Somekh. "Determination of crystallographic orientation of large grain metals with surface acoustic waves." Journal of the Acoustical Society of America 132, no. 2 (August 2012): 738–45. http://dx.doi.org/10.1121/1.4731226.

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Stojakovic, Dejan. "Electron backscatter diffraction in materials characterization." Processing and Application of Ceramics 6, no. 1 (2012): 1–13. http://dx.doi.org/10.2298/pac1201001s.

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Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of materials. Key milestones related to technological developments of EBSD technique have been outlined along with possible applications using modern EBSD system. Principles of crystal diffraction with description of crystallographic orientation, orientation determination and phase identification have been described. Image quality, resolution and speed, and system calibration have also been discussed. Sample preparation methods were reviewed and EBSD application in conjunction with other characterization techniques on a variety of materials has been presented for several case studies. In summary, an outlook for EBSD technique was provided.

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Cosandey, F., P. Markondeya Raj, and W. R. Cannon. "Texture Determination of Ceramic Materials by EBSD." Microscopy and Microanalysis 5, S2 (August 1999): 224–25. http://dx.doi.org/10.1017/s1431927600014446.

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Texture determination of ceramic materials is important in ceramic processing since it will ultimately govern the resulting material properties. For instance, recent results have indicated that preferred particle orientation leads to anisotropic shrinkage of tape cast ceramics. In this work, we report results on the effect of pressing as well as shearing during tape casting followed by sintering on particle orientation and texture development in ceramic materials. Oxides with different particle shape anisotropy and crystal structures have been investigated including tetragonal rutile titania (TiO2) and hexagonal alumina (A12O3).Ceramic samples were processed by either pressing or by tape casting of a high ceramic particle loading aqueous suspensions. The samples were then pyrolized at 425°C followed by sintering for one hour at 1200 and 1500°C for TiO2 and A12O3 respectively. High spatial resolution Electron Backscatter Diffraction (EBSD) (OPAL-Oxford) in a field emission SEM (LEO-982) has been used for texture analysis and for crystallographic orientation determination of particles. Between, 3000 to 5000 measurements per sample were recorded automatically to develop an orientation map.

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Zuo, Liang, Zong Bin Li, Yu Dong Zhang, Claude Esling, and Xiang Zhao. "Extensions of Electron Diffraction Based Techniques in Crystallographic Characterization." Materials Science Forum 753 (March 2013): 11–16. http://dx.doi.org/10.4028/www.scientific.net/msf.753.11.

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Abstract. With the advance of electron diffraction techniques in individual orientation analysis, traditional crystallographic characterization methods could be simplified, thus offering chances to develop some new approaches. In recent years, our group has devoted to working on possible extensions of the SEM and TEM based techniques for crystallographic analyses on a microstructure- and orientation-specific level. Several methods are illustrated in this paper, including the determination of dislocation type and Burgers vector without recourse to the traditional g.b invisibility condition, the identification of twinning mode and complete twinning elements for any crystal symmetry that requires minimum initial data input, and the characterization of specific interface plane or slip plane using only one sample observation plane instead of two perpendicular sample planes. These new extensions of characterization methods have proven to facilitate the related microstructural examinations.

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Langelaan, G., S. Deprez, Ignaas Verpoest, and Paul van Houtte. "Determination of Morphological Textures of the Fibres in Composite Materials Made from Textiles of Carbon Fibres." Materials Science Forum 495-497 (September 2005): 1675–80. http://dx.doi.org/10.4028/www.scientific.net/msf.495-497.1675.

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The orientation distribution of fibres (morphological texture) in a composite is very important in determining the properties of the material. Therefore, methods which can provide quantitative descriptions of the morphological texture are essential. One approach to determining the morphological texture function (MTF) is to measure the orientation distribution of the crystals in the fibres. Since many types of reinforcing fibres are crystalline and textured (i.e. carbon fibres, whiskers, etc.) this approach may be interesting for commercial/industrial applications. For this technique to be applied, the crystallographic texture intrinsic to the fibres must be determined and subsequently measurements of the crystallographic texture should be made in the composite. The morphological texture can then be calculated by a deconvolution of the composite texture with the fibre’s intrinsic texture. In this paper, morphological textures are determined in woven fabrics made from carbon fibres embedded in a polymer matrix. Straight fibres removed from the fabric serve as the reference material for the deconvolution. It is demonstrated that this technique is applicable and can resolve the orientation distribution to an accuracy greater than is needed for determining the elastic properties.

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Gevorkov, Yaroslav, Anton Barty, Wolfgang Brehm, Thomas A. White, Aleksandra Tolstikova, Max O. Wiedorn, Alke Meents, Rolf-Rainer Grigat, Henry N. Chapman, and Oleksandr Yefanov. "pinkIndexer – a universal indexer for pink-beam X-ray and electron diffraction snapshots." Acta Crystallographica Section A Foundations and Advances 76, no. 2 (January 10, 2020): 121–31. http://dx.doi.org/10.1107/s2053273319015559.

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A crystallographic indexing algorithm, pinkIndexer, is presented for the analysis of snapshot diffraction patterns. It can be used in a variety of contexts including measurements made with a monochromatic radiation source, a polychromatic source or with radiation of very short wavelength. As such, the algorithm is particularly suited to automated data processing for two emerging measurement techniques for macromolecular structure determination: serial pink-beam X-ray crystallography and serial electron crystallography, which until now lacked reliable programs for analyzing many individual diffraction patterns from crystals of uncorrelated orientation. The algorithm requires approximate knowledge of the unit-cell parameters of the crystal, but not the wavelengths associated with each Bragg spot. The use of pinkIndexer is demonstrated by obtaining 1005 lattices from a published pink-beam serial crystallography data set that had previously yielded 140 indexed lattices. Additionally, in tests on experimental serial crystallography diffraction data recorded with quasi-monochromatic X-rays and with electrons the algorithm indexed more patterns than other programs tested.

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30

BERTOLOTTO, S., S. SZENKNECT, S. LALLEMAN, R. PODOR, L. CLAPAREDE, A. MAGNALDO, P. RAISON, A. MESBAH, B. ARAB-CHAPELET, and N. DACHEUX. "First determination of dissolution rates of oriented UO2 single crystals." MRS Advances 5, no. 1-2 (2020): 19–26. http://dx.doi.org/10.1557/adv.2020.41.

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Abstract:Millimetre UO2 single crystals were cut and oriented at JRC Karlsruhe. The orientation of each face of the parallelepiped single crystals was determined with Laue diffraction and the corresponding surface area by geometric measurements. Then, the (111), (100), (110) faces of each single crystal were polished to optical grade and characterized by XRD in order to confirm the surface orientation. The dissolution of the three single crystals was achieved in nitric acid media under dynamic conditions, at room temperature. Two dissolution regimes were observed for all samples. The normalized dissolution rate measured in the first step was not influenced by the crystallographic orientation of the faces. However, during the second step, (110) oriented faces were found to dissolve 4 times faster than the (100) faces. One explanation could involve the atomic composition of each oriented surface in the fluorite-type structure

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31

Isaenkova, Margarita, and Yuriy Perlovich. "Distribution of Dislocation Density in Tubes from Zr-Based Alloys by X-Ray Data." Solid State Phenomena 105 (July 2005): 89–94. http://dx.doi.org/10.4028/www.scientific.net/ssp.105.89.

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As applied to tubes from Zr-based alloys, the X-ray method was developed to determine the dislocation density distribution in a-Zr depending on the orientation of Burgers vector. The method consists in registration of X-ray line profiles by each successive position of the sample in the course of diffractometric texture measurement using reflections of two orders, the following determination of coherent domain size and lattice distortion by means of the Warren-Averbach method for each orientation of reflecting planes, separate calculation of the density of c- and a-dislocations with all possible orientations of Burgers vector and presentation of results in generalized pole figures. Obtained data testify that the dislocation density varies within very wide intervals of several orders of magnitude depending on the grain orientation both in as-rolled and annealed tubes. Features of the constructed dislocation distributions are closely related to the crystallographic texture of studied tubes.

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32

Sarrao, J. L., S. R. Chen, W. M. Visscher, Ming Lei, U. F. Kocks, and A. Migliori. "Determination of the crystallographic orientation of a single crystal using resonant ultrasound spectroscopy." Review of Scientific Instruments 65, no. 6 (June 1994): 2139–40. http://dx.doi.org/10.1063/1.1144712.

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33

Sinha, V., M. J. Mills, and J. C. Williams. "Determination of crystallographic orientation of dwell-fatigue fracture facets in Ti-6242 alloy." Journal of Materials Science 42, no. 19 (October 2007): 8334–41. http://dx.doi.org/10.1007/s10853-006-0252-z.

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34

Neubeck, S., Y. M. You, Z. H. Ni, P. Blake, Z. X. Shen, A. K. Geim, and K. S. Novoselov. "Direct determination of the crystallographic orientation of graphene edges by atomic resolution imaging." Applied Physics Letters 97, no. 5 (August 2, 2010): 053110. http://dx.doi.org/10.1063/1.3467468.

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35

Wang, S. C., and M. J. Starink. "A simple approach to the determination of the crystallographic orientation: applications and accuracy." Journal of Microscopy 211, no. 2 (August 2003): 130–36. http://dx.doi.org/10.1046/j.1365-2818.2003.01206.x.

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36

Michael, J. R. "All You Need to Know About Electron Backscatter Diffraction: Orientation is Only the Tip of the Iceberg." Microscopy and Microanalysis 3, S2 (August 1997): 387–88. http://dx.doi.org/10.1017/s1431927600008825.

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This tutorial will describe the technique of electron backscattered diffraction (EBSD) in the scanning electron microscope (SEM). To properly exploit EBSD in the SEM it is important to understand how these patterns are formed. This discussion will be followed by a description of the hardware required for the collection of electron backscatter patterns (EBSP). We will then discuss the methods used to extract the appropriate crystallographic information from the patterns for orientation determination and phase identification and how these operations can be automated. Following this, a number of applications of the technique for both orientation studies and phase identification will be discussed.EBSD in the SEM is a phenomenon that has been known for many years. EBSD in the SEM is a technique that permits the crystallography of sub-micron sized regions to be studied from a bulk specimen. These patterns were first observed over 40 years ago, before the development of the SEM and were recorded using a special chamber and photographic film.

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37

Zolotoyabko, Emil. "Determination of the degree of preferred orientation within the March–Dollase approach." Journal of Applied Crystallography 42, no. 3 (May 15, 2009): 513–18. http://dx.doi.org/10.1107/s0021889809013727.

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An analytic expression has been derived connecting the degree of preferred orientation in a polycrystalline material to the March parameter. The latter defines the spread of angular distribution of crystallite inclinations in the March–Dollase approach [March (1932).Z. Kristallogr.81, 285–297; Dollase (1986).J. Appl. Cryst.19, 267–272]. In turn, the March parameter can be extracted from experimental data using either the Rietveld refinement of the entire diffraction pattern or the measurement of two diffraction intensities originating in the selected crystallographic planes. Working examples taken with two different types of samples are presented.

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38

Sharma, Hemant, Richard M. Huizenga, and S. Erik Offerman. "A fast methodology to determine the characteristics of thousands of grains using three-dimensional X-ray diffraction. II. Volume, centre-of-mass position, crystallographic orientation and strain state of grains." Journal of Applied Crystallography 45, no. 4 (July 14, 2012): 705–18. http://dx.doi.org/10.1107/s0021889812025599.

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This second part of the paper on an analysis strategy for data acquired using three-dimensional X-ray diffraction (3DXRD) describes the procedure for the determination of the grain characteristics for thousands of grains. The approach developed here is orders of magnitude faster than those presently available for indexing thousands of grains. Using information obtained from the steps described in Part I [Sharma, Huizenga & Offerman (2012).J. Appl. Cryst.45, 693–704], the volume, crystallographic orientation, centre-of-mass position and strain state of grains in the sample can be determined. The algorithms dealing with the determination of the orientation, centre-of-mass position and strain state of the grains are divided into two parts. The first deals with indexing,i.e.it assigns diffraction spots to individual grains assuming an unstrained lattice, and the second deals with the refinement of the crystallographic orientation, centre-of-mass position and strain state of the grains using the diffraction spots assigned during indexing. The different approaches to indexing that exist in the literature are presented and compared with the novel approach developed here. Indexing can be run in two modes depending on the number of grains. For large numbers of grains, the approach employs a novel sample `surface' scanning technique, in combination with a reduced number of search orientations, to achieve high robustness and computation efficiency. For small numbers of grains, the approach neglects the position of the diffracting grains in the sample in order to improve the computation efficiency. For unstrained samples, both modes of indexing and the subsequent process of refinement are validated using simulated data for 60 and 3000 grains. In both cases, the centre-of-mass position of the grains was determined with a mean error of 0.7 µm and the orientation was determined with a mean error of 0.0003°. Furthermore, an experiment was `mimicked' by introducing experimental errors into the simulation for 3000 grains. The resulting mean errors in the centre-of-mass position (2.1 µm) and orientation (0.008°) of the grains are higher than those for the ideal simulations, and the errors in an experiment will depend on the `true' experimental errors. The algorithms dealing with strained samples are validated using a simulation for 3000 grains with mimicked experimental errors. The centre-of-mass position, crystallographic orientation, normal strain tensor components and shear strain tensor components of the grains were determined with mean errors of 8 µm, 0.006°, 5.2 × 10−5and 2.8 × 10−5, respectively. The possibility of obtaining grain-level information for thousands of grains with a high speed of acquisition makes the technique very attractive forin situstudies of thermomechanical processes in polycrystalline materials.

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Li, Zongbin, Yudong Zhang, Claude Esling, Xiang Zhao, Yandong Wang, and Liang Zuo. "New approach to twin interfaces of modulated martensite." Journal of Applied Crystallography 43, no. 3 (April 30, 2010): 617–22. http://dx.doi.org/10.1107/s002188981000868x.

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In Ni–Mn–Ga ferromagnetic shape memory alloys, the crystallographic nature of martensitic variant interfaces is one of the key factors governing the variant reorientation through field-induced interface motion and hence the shape memory performance. So far, the crystal structure studies of these materials – conducted by means of transmission electron microscopy – have suffered from uncertainties in determining the number of unit cells of modulated superstructure, and consequently improper interpretations of orientation correlations of martensitic variants. In this paper a new approach is presented for comprehensive analysis of crystallographic and morphological information of modulated martensite, using automated electron backscatter diffraction. As a first attempt, it has been applied for the unambiguous determination of the orientation relationships of adjacent martensitic variants and their twin interface characters in an incommensurate 7M modulated Ni–Mn–Ga alloy, from which a clear and full-featured image of the crystallographic nature of constituent twin interfaces is built up. Certainly, this new approach will make it feasible not only to generalize the statistical analysis of martensitic variant distributions for various materials with modulated superstructure, but also to give insight into the crystallographic characteristics of martensitic variant interfaces and the variant reorientation mechanism of new advanced materials for interface engineering.

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40

Sitepu, Husin, Brian H. O'Connor, and Deyu Li. "Comparative evaluation of the March and generalized spherical harmonic preferred orientation models using X-ray diffraction data for molybdite and calcite powders." Journal of Applied Crystallography 38, no. 1 (January 19, 2005): 158–67. http://dx.doi.org/10.1107/s0021889804031231.

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Preferred crystallographic orientation,i.e.texture in crystalline materials powder diffraction data, can cause serious systematic errors in phase composition analysis and also in crystal structure determination. The March model [Dollase (1986).J. Appl. Cryst.19, 267–272] has been used widely in Rietveld refinement for correcting powder diffraction intensities with respect to the effects of preferred orientation. In the present study, a comparative evaluation of the March model and the generalized spherical harmonic [Von Dreele (1997).J. Appl. Cryst.30, 517–525] description for preferred orientation was performed with X-ray powder diffraction data for molybdite (MoO3) and calcite (CaCO3) powders uniaxially pressed at five different pressures. Additional molybdite and calcite powders, to which 50% by weight silica gel had been added, were prepared to extend the range of preferred orientations considered. The patterns were analyzed initially assuming random orientation of the crystallites and subsequently the March model was used to correct the preferred orientation. The refinement results were compared with parallel refinements conducted with the generalized spherical harmonic [Sitepu (2002).J. Appl. Cryst.35,274–277]. The results obtained show that the generalized spherical harmonic description generally provided superior figures-of-merit compared with the March model results.

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41

Fundenberger, J. J., M. J. Philippe, C. Esling, P. Lequeu, and B. Chenal. "Calculation of Yield Surfaces and Determination of Forming Limit Diagrams of Aluminium Alloys." Textures and Microstructures 21, no. 2-3 (January 1, 1993): 93–108. http://dx.doi.org/10.1155/tsm.21.93.

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In order to point out the influence of the crystallographic texture on the formability of 2 aluminium alloys, the orientation distribution function (ODF) will be carried out using the series expansion method. Combining the ODF with a Taylor plastic deformation model we are able to calculate the yield loci and to predict the plastic strain ratio which is of high interest in the formability.

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42

Li, Zongbin, Zhenzhuang Li, Bo Yang, Yudong Zhang, Claude Esling, Xiang Zhao, and Liang Zuo. "Crystallographic correlation between 5M and 7M martensite in an Ni–Mn–Ga alloy." Journal of Applied Crystallography 49, no. 2 (March 1, 2016): 507–12. http://dx.doi.org/10.1107/s1600576716002223.

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In Ni–Mn–Ga ferromagnetic shape memory alloys, a structural transformation from one type of martensite to another is frequently observed upon cooling or heating. In this work, the microstructural features associated with the transformation from 5M to 7M martensite in an Ni50Mn26Ga22Cu2 alloy were studied. On the basis of the crystallographic orientation determination and an examination of the microstructure by means of the electron backscatter diffraction technique, the 5M to 7M transformation was found to be accompanied by the thickening of martensite plates. The two kinds of martensite (5M and 7M) possess a specific orientation relationship with (001)5M//(001)7M and [100]5M//[100]7M. Through further lattice distortion, four types of 5M variant can evolve into four 7M martensite variants in one variant colony. The present study is expected to provide a deep insight into the crystallographic correlation between 5M and 7M martensite in Ni–Mn–Ga alloys.

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43

Scherf, A., A. Kauffmann, S. Kauffmann-Weiss, T. Scherer, X. Li, F. Stein, and M. Heilmaier. "Orientation relationship of eutectoid FeAl and FeAl2." Journal of Applied Crystallography 49, no. 2 (February 24, 2016): 442–49. http://dx.doi.org/10.1107/s1600576716000911.

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Fe–Al alloys in the aluminium range of 55–65 at.% exhibit a lamellar microstructure of B2-ordered FeAl and triclinic FeAl2, which is caused by a eutectoid decomposition of the high-temperature Fe5Al8 phase, the so-called ∊ phase. The orientation relationship of FeAl and FeAl2 has previously been studied by Bastin et al. [J. Cryst. Growth (1978), 43, 745] and Hirata et al. [Philos. Mag. Lett. (2008), 88, 491]. Since both results are based on different crystallographic data regarding FeAl2, the data are re-evaluated with respect to a recent re-determination of the FeAl2 phase provided by Chumak et al. [Acta Cryst. (2010), C66, i87]. It is found that both orientation relationships match subsequent to a rotation operation of 180° about a 〈112〉 crystallographic axis of FeAl or by applying the inversion symmetry of the FeAl2 crystal structure as suggested by the Chumak data set. Experimental evidence for the validity of the previously determined orientation relationships was found in as-cast fully lamellar material (random texture) as well as directionally solidified material (∼〈110〉FeAl || solidification direction) by means of orientation imaging microscopy and global texture measurements. In addition, a preferential interface between FeAl and FeAl2 was identified by means of trace analyses using cross sectioning with a focused ion beam. On the basis of these habit planes the orientation relationship between the two phases can be described by ({\overline 1}01)FeAl || (114)_{{\rm FeAl}_2}^{\rm Chumak} and [111]FeAl || [1\overline{1}0]_{{\rm Fe Al}_2}^{\rm Chumak}. There is no evidence for twinning within FeAl lamellae or alternating orientations of FeAl lamellae. Based on the determined orientation and interface data, an atomistic model of the structure relationship of Fe5Al8, FeAl and FeAl2 in the vicinity of the eutectoid decomposition is derived. This model is analysed with respect to the strain which has to be accommodated at the interface of FeAl and FeAl2.

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44

Vorlı́ček, V., V. Železný, A. N. Tiwari, M. Krejci, and H. Zogg. "Determination of the crystallographic orientation of CuInSe2 thin films by Raman and infrared spectroscopy." Journal of Applied Physics 82, no. 11 (December 1997): 5484–87. http://dx.doi.org/10.1063/1.365576.

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45

Young, K. H., T. W. James, McD Robinson, A. H. Cardona, H. Suzuki, H. Kurosawa, T. Yamashita, and T. Hirai. "Electron channeling pattern determination of crystallinity and crystallographic orientation in YBa2Cu3O7−δ thin films." Thin Solid Films 206, no. 1-2 (December 1991): 369–73. http://dx.doi.org/10.1016/0040-6090(91)90453-5.

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46

Morales, M. P., N. O. Nuñez, R. Pozas, M. Ocaña, and C. J. Serna. "Determination of the Orientation of the Crystallographic Axes in Anisometric Particles by Infrared Spectroscopy." Applied Spectroscopy 56, no. 2 (February 2002): 200–204. http://dx.doi.org/10.1366/0003702021954674.

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47

Gallego, Samuel V., Emre S. Tasci, Gemma de la Flor, J. Manuel Perez-Mato, and Mois I. Aroyo. "Magnetic symmetry in the Bilbao Crystallographic Server: a computer program to provide systematic absences of magnetic neutron diffraction." Journal of Applied Crystallography 45, no. 6 (November 15, 2012): 1236–47. http://dx.doi.org/10.1107/s0021889812042185.

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MAGNEXTis a new computer program available from the Bilbao Crystallographic Server (http://www.cryst.ehu.es) that provides symmetry-forced systematic absences or extinction rules of magnetic nonpolarized neutron diffraction. For any chosen Shubnikov magnetic space group, the program lists all systematic absences, and it can also be used to obtain the list of the magnetic space groups compatible with a particular set of observed systematic absences. Absences corresponding to specific ordering modes can be derived by introducing effective symmetry operations associated with them. Although systematic extinctions in neutron diffraction do not possess the strong symmetry-resolving power of those in nonmagnetic crystallography, they can be important for the determination of some magnetic structures. In addition,MAGNEXTprovides the symmetry-adapted form of the magnetic structure factor for different types of diffraction vectors, which can then be used to predict additional extinctions caused by some prevailing orientation of the atomic magnetic moments. This program, together with a database containing comprehensive general information on the symmetry operations and the Wyckoff positions of the 1651 magnetic space groups, is the starting point of a new section in the Bilbao Crystallographic Server devoted to magnetic symmetry and its applications.

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48

Meng, Yifei, and Jian-Min Zuo. "Three-dimensional nanostructure determination from a large diffraction data set recorded using scanning electron nanodiffraction." IUCrJ 3, no. 5 (July 4, 2016): 300–308. http://dx.doi.org/10.1107/s205225251600943x.

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A diffraction-based technique is developed for the determination of three-dimensional nanostructures. The technique employs high-resolution and low-dose scanning electron nanodiffraction (SEND) to acquire three-dimensional diffraction patterns, with the help of a special sample holder for large-angle rotation. Grains are identified in three-dimensional space based on crystal orientation and on reconstructed dark-field images from the recorded diffraction patterns. Application to a nanocrystalline TiN thin film shows that the three-dimensional morphology of columnar TiN grains of tens of nanometres in diameter can be reconstructed using an algebraic iterative algorithm under specified prior conditions, together with their crystallographic orientations. The principles can be extended to multiphase nanocrystalline materials as well. Thus, the tomographic SEND technique provides an effective and adaptive way of determining three-dimensional nanostructures.

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49

Grigull, S. "Tensile Deformation Induced Texture Transformation in Austenitic Stainless Steel." Textures and Microstructures 35, no. 3-4 (January 1, 2003): 153–62. http://dx.doi.org/10.1080/07303300310001628616.

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Texture patterns of the starting ώ and transformed α structural phases were obtained from AISI 304 stainless steel sheets subjected to varying levels of tensile deformation using high energy X-ray diffraction in combination with the texture enhanced Rietveld method. The use of this method allows the simultaneous determination of the orientation distribution functions (ODF) of both phases, even for small α-martensite fractions of the order of 5%. The texture patterns are analyzed in terms of the crystallographic orientation relation between the starting and transformed phases and the preferential formation of certain variants of this relation.

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Baggethun, P., and H. Weiland. "Orientation Imaging Microscopy in the TEM." Microscopy and Microanalysis 5, S2 (August 1999): 204–5. http://dx.doi.org/10.1017/s1431927600014343.

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There is a range of techniques now available for the study of crystallographic orientation in materials. Among these, Orientation Imaging Microscopy (OIM) for the SEM is being increasingly applied. This technique is, however, limited by the spatial resolution of the SEM (∼0.5 μm). TEM orientation measurements and imaging provides the necessary alternative to SEM measurements due to the much higher spatial resolution of the TEM (∼10 μm). In TEM crystal orientation measurements Kikuchi patterns are preferred over selected area spot patterns due to higher accuracy and spatial resolution. The earliest means of automation of TEM orientation measurements involved the use of digital scanners and beam deflection measurment for computerized semi-automatic indexing of the patterns. In recent years fully automatic on-line orientation determination has been developed. This has come about as a result of the advances in image processing for automatic indexing of backscatter Kikuchi patterns in the SEM, and the emergence of slow-scan CCD cameras with a large dynamic range.

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Journal articles on the topic 'Crystallographic Orientation Determination'

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