Relevant bibliographies by topics / Crystallographic Orientation Determination

Academic literature on the topic 'Crystallographic Orientation Determination'

Author: Grafiati
Published: 10 December 2022
Last updated: 29 January 2023

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Journal articles on the topic "Crystallographic Orientation Determination"

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Lan, Yucheng, Mobolaji Zondode, Hua Deng, Jia-An Yan, Marieme Ndaw, Abdellah Lisfi, Chundong Wang, and Yong-Le Pan. "Basic Concepts and Recent Advances of Crystallographic Orientation Determination of Graphene by Raman Spectroscopy." Crystals 8, no. 10 (September 21, 2018): 375. http://dx.doi.org/10.3390/cryst8100375.

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Graphene is a kind of typical two-dimensional material consisting of pure carbon element. The unique material shows many interesting properties which are dependent on crystallographic orientations. Therefore, it is critical to determine their crystallographic orientations when their orientation-dependent properties are investigated. Raman spectroscopy has been developed recently to determine crystallographic orientations of two-dimensional materials and has become one of the most powerful tools to characterize graphene nondestructively. This paper summarizes basic aspects of Raman spectroscopy in crystallographic orientation of graphene nanosheets, determination principles, the determination methods, and the latest achievements in the related studies.
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Wang, W. H., X. Sun, G. D. Köhlhoff, and K. Lücke. "Orientation Determination by Continuous Etching Patterns in Copper and Copper Alloys." Textures and Microstructures 24, no. 4 (January 1, 1995): 199–219. http://dx.doi.org/10.1155/tsm.24.199.

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A new method for determination of grain orientations using etch patterns was developed for copper and copper alloys. This method is based on the fact, that one gets etch patterns characteristic for the crystallographic orientation of the etched surface, if a specimen of copper or copper alloys is etched in conc. HNO3. In contrast to etch pits, the etch patterns are developed continuously over the whole grain. This allows a direct and continuous observation of the orientation changes within and between the grains, which is not possible for many other orientation determination methods. The determination accuracy of the new method depends on the crystallographic orientation of the etched surface and varies between 2° and 10°. For some special surface orientations the etch patterns allow even the determination of very small orientation changes (≤ 2°), occurring e.g. in a deformed grain.
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Cheredov, V. N., and A. E. Petrakov. "Determination of the orientation of internal linear defects in isotropic optical crystals." Industrial laboratory. Diagnostics of materials 85, no. 2 (March 1, 2019): 29–32. http://dx.doi.org/10.26896/1028-6861-2019-85-2-29-32.

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Study of the structure of optical crystals and defects in them is one of the most important problems in crystal physics, crystallography and material science. Nowadays, study of the nanostructures, including the linear defects in crystals is of particular importance. Defects, and first and foremost linear imperfections of the crystal structure, significantly reduce the operational physical properties of optical crystals. Analysis of the properties of those defects, their orientation in the crystal lattice, as well as developing of the methods for determination of the crystallographic orientation of linear defects are the most important in view of the possibility of improving the properties of optical crystals. A method for rapid determination of the crystallographic orientation of linear defects (dislocations, clusters, linearly extended bulk inclusions, etc.) in optical crystals is presented. The orientation of a linearly extended micropore in an isotropic optical transparent fluorite crystal was determined using an optical microscope. The readings of the scale of the eyepiece drum were recorded when rotating the crystal fixed in the crystal holder of the microscope. Corrections for the refraction of light in the bulk of the crystal were taken into account analytically. The crystallographic orientation of the microporous in a transparent fluorite crystal was studied in detail. Crystallographic indices of micropore orientation corresponded to [100]. We developed an efficient rapid procedure for determination of the orientation of internal linear defects (imperfections) in optically isotropic crystals using an optical microscope. The restrictions imposed on the angles of crystal rotation depending on the value of the refractive index are considered for the given method of determination.
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Olejnak, Juraj, Petr Sedlak, Hanus Seiner, Kristyna Zoubkova, Pavla Stoklasova, and Tomas Grabec. "Generalized inverse problems in resonant ultrasound spectroscopy." Journal of the Acoustical Society of America 152, no. 4 (October 2022): A88. http://dx.doi.org/10.1121/10.0015638.

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Determination of the elastic constants by RUS is an inverse problem because experimentally obtained resonant frequencies cannot be directly recalculated into the elastic constants. Instead, an approximate spectrum is calculated from the dimensions and crystallographic orientation of the sample, its mass, and a set of 'guessed' elastic constants, and the difference between this approximate spectrum and the experiment is iteratively minimized. RUS has been used for the determination of either the elastic constants, or crystallographic orientations of the material in the past, but the recent advancements in RUS methodology, in particular, the employment of the scanning laser vibrometry for identification of the vibrational modes, enable inverse determination of most of the input parameters simultaneously. We propose an extension of the classical RUS inversion procedure that allows us to precisely identify the crystallographic orientation and dimensions of the sample in addition to the elastic coefficients. The proposed algorithm was applied to generally oriented iron single crystals. After the shape and orientation optimization, we achieved an unprecedented match between calculated and measured spectrum, including a very high number of utilized resonant modes (>300). We show that the highest modes are extremely sensitive to the crystallographic orientation.
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Esaka, Hisao, and Kei Shinozuka. "Determination of Crystallographic Orientation near a Chill Zone Using Ghost Lines." Materials Science Forum 879 (November 2016): 514–17. http://dx.doi.org/10.4028/www.scientific.net/msf.879.514.

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Many crystals nucleate on the mold surface when the molten alloy is poured in a mold cavity. Because the crystallographic orientations of these crystals are random, the solidified structure near the mold surface is very complex. The ghost lines, which are sometimes thick and the angle between them is not 90 degrees, are often observed in this region. However, if the crystallographic structure of this alloy is cubic, such as bcc or fcc, the ghost lines are very regular. In order to understand the geometry of ghost lines, Al-20 mass%Cu alloys were unidirectionally solidified with constant growth velocity. The solidified structures on the obliquely crossed section were observed. The ghost lines were quite regular and parallel to each other in a solidification grain. The angles and the ratio of the width of ghost lines were measured and crystallographic orientations were estimated using these parameters, based on the solid analytical geometry. EBSD analysis were also performed on the area, where the ghost lines were characterized, and the precise crystallographic orientations were decided. The comparison between both analytical values indicated that the differences between them are within 10 degrees and it can be safely concluded that the estimation for crystallographic orientation using ghost lines agreed well with the EBSD analysis.
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Bachmann, Florian, Ralf Hielscher, Peter E. Jupp, Wolfgang Pantleon, Helmut Schaeben, and Elias Wegert. "Inferential statistics of electron backscatter diffraction data from within individual crystalline grains." Journal of Applied Crystallography 43, no. 6 (October 1, 2010): 1338–55. http://dx.doi.org/10.1107/s002188981003027x.

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Highly concentrated distributed crystallographic orientation measurements within individual crystalline grains are analysed by means of ordinary statistics neglecting their spatial reference. Since crystallographic orientations are modelled as left cosets of a given subgroup of SO(3), the non-spatial statistical analysis adapts ideas borrowed from the Bingham quaternion distribution on {\bb S}^3. Special emphasis is put on the mathematical definition and the numerical determination of a `mean orientation' characterizing the crystallographic grain as well as on distinguishing several types of symmetry of the orientation distribution with respect to the mean orientation, like spherical, prolate or oblate symmetry. Applications to simulated as well as to experimental data are presented. All computations have been done with the free and open-source texture toolboxMTEX.
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Calvert, G., S. Swider, F. Ruta, G. Rossman, and R. S. Feigelson. "Determination of the crystallographic orientation of SrI2 crystals." Journal of Crystal Growth 498 (September 2018): 263–68. http://dx.doi.org/10.1016/j.jcrysgro.2018.06.030.

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Lloyd, G. E., N. H. Schmidt, D. Mainprice, and D. J. Prior. "Crystallographic textures." Mineralogical Magazine 55, no. 380 (September 1991): 331–45. http://dx.doi.org/10.1180/minmag.1991.055.380.04.

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AbstractTo material scientists the term texture means the crystallographic orientation of grains in a polycrystal. In contrast, geologists use the term more generally to refer to the spatial arrangement or association of mineral grains in a rock. In this contribution we are concerned with the materials science definition. There are several established techniques available for the determination of crystallographic textures in rocks. It has also been realised that the scanning electron microscope (SEM) is applicable to the study of crystallographic textures via the electron channelling (EC) effect. This provides an image of mineral/rock microstructure (via orientation contrast), as well as a means of accurately indexing their crystal orientations (via electron channelling patterns, ECP). Both types of EC image result from the relationship between incident electron beam and crystal structure, and the subsequent modulation of the backscattered electron (BSE) emission signal according to Bragg's Law. It is a simple matter to switch between the two imaging modes. A related effect, electron backscattering, provides only the diffraction patterns, but has superior spatial resolution and pattern angles.Due to crystal symmetry restrictions, there is only a limited range of ECP configurations possible for any mineral. Individual patterns can therefore be identified by comparison with the complete ‘ECP-map’. The location of an individual pattern within the map area is determined by spherical angles, the exact definition of which depends on the type of fabric diagram (e.g. inverse pole figure, pole figure or orientation distribution function). Originally, these angles were measured manually. A computer program (CHANNEL) has been developed which uses a digitisation approach to pattern recognition, derives the required fabric diagrams and also constructs ECP-maps from standard crystal data (i.e. unit cell parameters etc.).The combination of SEM/EC and CHANNEL dramatically facilitates the study of crystal textures in minerals and rocks, making statistical crystallographic analysis from individual orientations a practicality. The following example applications are considered: (1) crystal structure representation of the Al2SiO5 polymorph system; (2) local crystal texture relationships (epitaxial nucleation) between andalusite and sillimanite grains; (3) bulk rock crystal textures of quartzites; and (4) physical properties (e.g. elastic constants and seismic velocities) determined from bulk rock texture.
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Zhang, Yu Dong, Shi Ying Wang, Claude Esling, Xiang Zhao, and Liang Zuo. "Determination of Crystallographic Elements (Dislocation and Surface Plane) from Automated TEM Orientation Determination." Materials Science Forum 702-703 (December 2011): 866–71. http://dx.doi.org/10.4028/www.scientific.net/msf.702-703.866.

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Abstract In the present work, we summarized two calculation methods to determine some specific crystallographic elements based on electron diffraction orientation measurements performed by TEM. The first one is to determine the type and the Burgers vector of dislocations for a known crystal structure. The method calculates the orientation of the projections of all the possible dislocation line vectors in the TEM screen coordinate system using the determined crystallographic orientation of the grain and then compares them with the observed ones to identify the observed dislocations. The second is to characterize the surface crystalline planes and directions of faceted nano-particles. With the determination of the edge trace vectors and then the plane normal vectors in the screen coordinate system of the TEM, their Miller indices in the crystal coordinate system can be calculated through coordinate transformation. These methods are expected to facilitate the related studies.
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Weiland, H., D. P. Field, and B. L. Adams. "In situ observation of orientation changes on metallic surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 246–47. http://dx.doi.org/10.1017/s0424820100137604.

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The characterization of crystalline aggregates by the crystallographic orientations of their grains and subgrains has become a subject of increasing interest. The information obtained is not only used for the characterization of materials, but also more importantly for the determination of properties. To mention only a few, applications have been found in the areas of fracture analysis, recrystallization, and plastic deformation.Most commonly, crystallographic orientations are determined from Backscattered Kikuchi Diffraction (BKD) in the SEM and from Kikuchi patterns obtained by microdiffraction in the TEM. Since the development of fully automatic pattern analysis routines for the BKD, the SEM based techniques currently finds the most applications. In conjunction with computer controlled stage or beam displacements, the technique is known as Orientation Imaging Microscopy (OIM). In this manner, thousands of diffraction patterns are analyzed automatically within a short time. This leads to a statistical description of the distribution of crystallographic orientations, which sufficiently represent the bulk material.
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Dissertations / Theses on the topic "Crystallographic Orientation Determination"

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Li, Wenqi. "Laser ultrasonic method for determination of crystallographic orientation of large grain metals by spatially resolved acoustic spectroscopy (SRAS)." Thesis, University of Nottingham, 2012. http://eprints.nottingham.ac.uk/12391/.

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This thesis presents a crystallographic orientation determination technique which is based on a laser ultrasonic method: spatially resolved acoustic spectroscopy (SRAS). Surface acoustic waves (SAW) propagate on a solid surface with a phase velocity that is frequency independent, but which varies with the crystallographic orientation. By comparing the SRAS results with the calculated SAW velocities, the orientation of crystal can be determined. The SRAS technique allow the SAW velocity to be recorded in two slightly different approaches. According to the formula v=λf, the velocity v can be obtained by varying the k-vector (λ) or frequency f of the wave while the another multiplier is fixed. K-SRAS is implemented by firing a laser beam with a fixed intensity modulation frequency through a spatial light modulator (SLM); the SAW velocity is determined by varying the fringe spacing of the SLM image. F-SRAS uses a broadband (sharp pulse) laser, the beam passes through a chrome photomask with fixed fringe spacing, and the peak frequency is used to determine the SAW velocity. Scans are performed on single or multiple-grain titanium alloy, aluminium and nickel samples by both methods. The contrast of the velocity maps give adequate information of grain size and location. A SAW velocity model is developed according to the elastic constants and mass density of the material. The orientation of crystals can be determined by comparing the SRAS results and the SAW velocity model. The SAW velocities in different propagation directions are measured on nickel, aluminium and titanium α samples with known orientations, and agree well with the predicted velocities from the model. An overlap function is introduced as a search algorithm to link the SRAS results to the SAW velocity model. The results are compared with measurements taken using the Laue back-reflection technique; they gave very close crystallographic orientation with acceptable error within the industrial limit. At the end of the thesis, consideration is given to further research in the acoustic modelling and data processing algorithms that would improve the technique in the future.
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Book chapters on the topic "Crystallographic Orientation Determination"

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"Disorder and Twinning." In Pharmaceutical Crystallography: A Guide to Structure and Analysis, 236–59. The Royal Society of Chemistry, 2019. http://dx.doi.org/10.1039/bk9781782629665-00236.

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Often, crystals deviate to some extent from the idealised description. Disorder breaks the symmetry of the space group at a local level so the structure must be described as an average of local alternatives. In severe cases of disorder, such as solvent molecules occupying several positions and orientations, it may be difficult to produce any sensible atomic model. An alternative approach in that case is solvent-masking, which optimises electron density values on a grid within a defined solvent-accessible volume. Twinning refers to the circumstance where a measured crystal comprises misaligned domains of the same structure. The measured diffraction pattern is an overlay of the diffraction patterns for each domain. Two cases can be identified which impose different practical problems on measurement and processing of X-ray data. Merohedral twinning refers to the circumstance where the diffraction patterns overlap exactly, while non-merohedral twinning refers to non-overlapping diffraction patterns. Inversion twinning is a special case of merohedral twinning which impacts on determination of absolute structure.
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Conference papers on the topic "Crystallographic Orientation Determination"

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Lograsso, Barbara K., Thomas A. Lograsso, and Ryan J. Glamm. "Application of a Crystal Orientation Method for Matching Surfaces Along a Fracture Line." In ASME 2008 International Mechanical Engineering Congress and Exposition. ASMEDC, 2008. http://dx.doi.org/10.1115/imece2008-67663.

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The overall objective of this study was to evaluate whether surface crystal orientation can be used to associate metal fracture fragments. This study examined the orientations of the fractured crystals across the fracture plane for two surfaces determined to be a matching fracture by conventional methods. This study used Electron Back-Scattered Diffraction (EBSD), sometimes known as Orientation Imaging Microscopy (OIM), to determine the crystallographic orientation of individual metal crystals along the length of the fracture on a surface perpendicular to the actual fracture surface. This investigation examined the uniqueness of crystal orientations within a metal and examined the requirements necessary for determination of crystallography using EBSD. This study also examined the crystallographic information as to whether it is sufficiently reliable characteristic from which a quantitative determination could be made that two separate pieces of metal are, in fact, from a single piece.
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Ledinský, Martin, Aliaksei Vetushka, Jiří Stuchlík, Antonín Fejfar, Jan Kočka, P. M. Champion, and L. D. Ziegler. "Determination of Single Microcrystalline Silicon Grains Preferential Crystallographic Orientation by Polarized Raman spectroscopy." In XXII INTERNATIONAL CONFERENCE ON RAMAN SPECTROSCOPY. AIP, 2010. http://dx.doi.org/10.1063/1.3482324.

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Chirikjian, Gregory S. "Kinematics Meets Crystallography: The Concept of a Motion Space." In ASME 2014 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. American Society of Mechanical Engineers, 2014. http://dx.doi.org/10.1115/detc2014-34243.

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In this paper, it is shown how rigid-body kinematics can be used to assist in determining the atomic structure of proteins and nucleic acids when using x-ray crystallography, which is a powerful method for structure determination. The importance of determining molecular structures for understanding biological processes and for the design of new drugs is well known. Phasing is a necessary step in determining the three-dimensional structure of molecules from x-ray diffraction patterns. A computational approach called molecular replacement (MR) is a well-established method for phasing of x-ray diffraction patterns for crystals composed of biological macromolecules. In MR, a search is performed over positions and orientations of a known biomolecular structure within a model of the crystallographic asymmetric unit, or, equivalently, multiple symmetry-related molecules in the crystallographic unit cell. Unlike the discrete space groups known to crystallographers and the continuous rigid-body motions known to kinematicians, the set of motions over which molecular replacement searches are performed does not form a group. Rather, it is a coset space of the group of continuous rigid-body motions, SE(3), with respect to the crystallographic space group of the crystal, which is a discrete sub-group of SE(3). Properties of these ‘motion spaces’ (which are compact manifolds) are investigated here.
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