Dissertations / Theses on the topic 'Crystal defect analysis'
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Eddleston, Mark David. "Crystal form and defect analysis of pharmaceutical materials." Thesis, University of Cambridge, 2012. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.610090.
Full textGiannattasio, Armando. "Interaction of oxygen and nitrogen impurities with dislocations in silicon single-crystals." Thesis, University of Oxford, 2004. http://ora.ox.ac.uk/objects/uuid:41cf8568-8411-4a85-8788-7d390307c7c3.
Full textPaturi, Naveen Kumar. "Analysis of photonic crystal defects for biosensing applications." Morgantown, W. Va. : [West Virginia University Libraries], 2006. https://eidr.wvu.edu/etd/documentdata.eTD?documentid=4861.
Full textTitle from document title page. Document formatted into pages; contains viii, 70 p. : ill. (some col.). Includes abstract. Includes bibliographical references (p. 55-57).
Druet, Pierre-Etienne. "Analysis of a coupled system of partial differential equations modeling the interaction between melt flow, global heat transfer and applied magnetic fields in crystal growth." Doctoral thesis, Humboldt-Universität zu Berlin, Mathematisch-Naturwissenschaftliche Fakultät II, 2009. http://dx.doi.org/10.18452/15893.
Full textThe present PhD thesis is devoted to the analysis of a coupled system of nonlinear partial differential equations (PDE), that arises in the modeling of crystal growth from the melt in magnetic fields. The phenomena described by the model are mainly the heat-transfer processes (by conduction, convection and radiation) taking place in a high-temperatures furnace heated electromagnetically, and the motion of a semiconducting melted material subject to buoyancy and applied electromagnetic forces. The model consists of the Navier-Stokes equations for a newtonian incompressible liquid, coupled to the heat equation and the low-frequency approximation of Maxwell''s equations. We propose a mathematical setting for this PDE system, we derive its weak formulation, and we formulate an (initial) boundary value problem that in the mean reflects the complexity of the real-life application. The well-posedness of this (initial) boundary value problem is the mainmatter of the investigation. We prove the existence of weak solutions allowing for general geometrical situations (discontinuous coefficients, nonsmooth material interfaces) and data, the most important requirement being only that the injected electrical power remains finite. For the time-dependent problem, a defect measure appears in the solution, which apart from the fluid remains concentrated in the boundary of the electrical conductors. In the absence of a global estimate on the radiation emitted in the cavity, a part of the defect measure is due to the nonlocal radiation effects. The uniqueness of the weak solution is obtained only under reinforced assumptions: smallness of the input power in the stationary case, and regularity of the solution in the time-dependent case. Regularity properties, such as the boundedness of temperature are also derived, but only in simplified settings: smooth interfaces and temperature-independent coefficients in the case of a stationary analysis, and, additionally for the transient problem, decoupled time-harmonic Maxwell.
GOMES, LAERCIO. "Estudo compreensivo da fotodissociacao do ion OHsub(-) nos haletos alcalinos e sua interacao com centros de cor." reponame:Repositório Institucional do IPEN, 1985. http://repositorio.ipen.br:8080/xmlui/handle/123456789/9850.
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Tese (Doutoramento)
IPEN/T
Instituto de Pesquisas Energeticas e Nucleares - IPEN/CNEN-SP
Olivier, Ezra Jacobus. "Analysis of the extended defects in 3C-SiC." Thesis, Nelson Mandela Metropolitan University, 2008. http://hdl.handle.net/10948/730.
Full textHolland, Anthony James. "Analysis of crystal defects by simulation of x-ray section topographs." Thesis, Durham University, 1993. http://etheses.dur.ac.uk/5589/.
Full textNakamura, Daisuke. "Bulk growth and extended-defect analysis of high-quality SiC single crystals." 京都大学 (Kyoto University), 2008. http://hdl.handle.net/2433/136293.
Full textGarces, Nelson Y. "Analysis of paramagnetic point defects in KH₂PO₄ and KTiOPO₄ crystals." Morgantown, W. Va. : [West Virginia University Libraries], 2000. http://etd.wvu.edu/templates/showETD.cfm?recnum=1778.
Full textTitle from document title page. Document formatted into pages; contains xii, 116 p. : ill. Includes abstract. Includes bibliographical references (p. 106-109).
Hung, Wing Wa. "FTIR and XPS of congruent and stoichiometric LiNbO3." HKBU Institutional Repository, 2003. http://repository.hkbu.edu.hk/etd_ra/442.
Full textMa, Shun-kit Martin. "The two gallium vacancy-related defects in undoped gallium antimonide." Click to view the E-thesis via HKUTO, 2004. http://sunzi.lib.hku.hk/hkuto/record/B31319658.
Full textLi, Kaile. "Defects at surface and interface of crystals : theoretical and x-ray scattering analysis /." free to MU campus, to others for purchase, 2002. http://wwwlib.umi.com/cr/mo/fullcit?p3074422.
Full textMa, Shun-kit Martin, and 馬信傑. "The two gallium vacancy-related defects in undoped gallium antimonide." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2004. http://hub.hku.hk/bib/B31319658.
Full textRaddenzati, Aurélien. "Optimisation du transport électronique dans le silicium cristallin (c-Si) en présence de nanostructures." Electronic Thesis or Diss., Mulhouse, 2017. https://www.learning-center.uha.fr/.
Full textOne of the limitations to the widespread use of photonic energy is the limited efficiency of photovoltaic (PV) cells, which can only be improved industrially today by using expensive, rare and toxic materials or fragile devices. Silicon is the most abundant material, the least toxic to manufacture and recycle. It is also the cheapest and the best mastered industrially. However, the proportion of the light spectrum that can be converted into electricity remains incomplete, which limits its efficiency. The introduction of photonic nanotechnology has made it possible to increase photoconversion efficiency by broadening the photoconvertible spectrum of native silicon and by using a multistage photoconversion effect outside the band gap. The operational nano-unit of crystalline silicon in this case is the "Segton", which is avariant of the divacancy organized as a buried layer and located at the artificially created interface between amorphous and crystalline silicon. This work provides an update on the demonstrators of giânt photoconversion cells, and in particular on the latest pre-industrial technological resources used for this type of production. This was implemented incollaboration with various laboratories. This thesis proposes new characterization methods adapted to photoconversion using the low-temperature photoluminescence spectra in order to detect the good generation of divacancies due to the implementation steps during the fabrication. Finally, the simulation, the manufacturing and the characterization activities are reviewed in detail, ending with a prospective to future industrial production
Selim, Hossam. "Hybrid non-destructive technique for volumetric defect analysis and reconstruction by remote laser induced ultrasound." Doctoral thesis, Universitat Politècnica de Catalunya, 2020. http://hdl.handle.net/10803/669481.
Full textEsta tesis doctoral versa sobre el diseño, estudio e implementación de un método híbrido, sin contacto, de ensayos no destructivos (NDT, non-destructive testing) para el análisis de objetos metálicos que contienen defectos o fracturas internas. Proponemos una técnica híbrida opto-acústica que combina ultrasonidos generados por impacto láser como excitador y transductores de ultrasonidos como receptores. El trabajo plantea un estudio detallado de la detección y reconstrucción en 1D, 2D y 3D de defectos presentes en un objeto metálico, usando la técnica híbrida de NDT sin contacto y controlado remotamente. Nuestro dispositivo presenta varias ventajas de las técnicas fotónicas y de ultrasonidos, reduciendo al mismo tiempo algunos inconvenientes de dichos métodos tomados por separado. Nuestro método combina resultados experimentales con simulaciones numéricas basadas en el procesado de señal de alta resolución. El montaje experimental consiste en un láser pulsado de ns a una longitud de onda de 532 nm, que impacta sobre la superficie del objeto. El pulso láser se absorbe, creando una expansión termoelástica localizada que induce un pulso de ultrasonidos de banda ancha que se propaga en el material. El láser, controlado remotamente, realiza un barrido sobre un área seleccionada de la superficie del objeto. Por cada punto de excitación, el ultrasonido se propaga a través del objeto y se refleja o dispersa en los defectos del material. Dichas ondas se detectan mediante transductores y se registran en un sistema de adquisición de datos para su ulterior procesado. En un primer paso, mediante el análisis del tiempo de vuelo, podemos localizar y determinar el tamaño del defecto en una vista 1D. Las capacidades de detección de defectos internos en una muestra metálica se estudian también mediante transformación wavelet debido a sus características de multi-resolución en tiempo y frecuencia. Se aplica un algoritmo novedoso de agrupamiento (clustering) espacial y se usan los mapas resultantes de tiempo y frecuencia para estimar la posición del defecto. Para la visualización 2D de los defectos ampliamos el análisis de la señal utilizando la técnica de focalización por apertura sintética (SAFT, synthetic aperture focusing technique). Implementamos un novedoso filtro de apodización 2D, juntamente con la técnica SAFT, y demostramos que elimina efectos no deseados, mejorando la resolución de la imagen reconstruida del defecto. El siguiente paso es un análisis y reconstrucción 3D. En este caso conseguimos una configuración experimental totalmente automatizada y sin contacto, permitiendo áreas de barrido sobre diferentes caras de un objeto. Los detalles de los defectos se registran desde diferentes ángulos, consiguiéndose una completa reconstrucción 3D. Finalmente, mostramos nuestros resultados en un tema complementario, relacionado con un caso particular de propagación de ultrasonidos en sólidos. Desde un primer momento, quisimos tener una comprensión física de la propagación y difracción de ondas de ultrasonidos en materiales sólidos. El control de los patrones de difracción en sólidos, mediante el uso de lentes ultrasónicas, ayudaría a la focalización/colimación del ultrasonido, reduciendo ecos y reflexiones en la superficie de contorno, mejorando del proceso de análisis NDT. Los cristales fonónicos se usan para regular la difracción y la respuesta en frecuencia de ondas de ultrasonido que se propagan en fluidos. No obstante, dichas estructuras se han estudiado mucho menos en materiales sólidos. Hemos realizado detalladas simulaciones numéricas de la propagación de ultrasonidos en un cristal fonónico sólido y hemos demostrado efectos de focalización y autocolimación. Finalmente hemos acoplado nuestra lente de cristal fonónico al sólido objeto de estudio, demostrando que el control de la difracción se conserva en el interior de dicho objeto a través del material de acoplamiento. Finalmente, proporcionamos una conclusión general sobre el trabajo declarado en esta tesis y un plan de trabajo futuro donde esta investigación puede extenderse y expandirse aún más a aplicaciones industriales en colaboración con el mercado de producción
Rahman, Shams ur. "Probing the effect of oxygen vacancies in strontium titanate single crystals." Thesis, University of Oxford, 2014. http://ora.ox.ac.uk/objects/uuid:0b153fd2-3aa8-4fe5-b811-8ac42b4457fa.
Full textIsik, Mehmet. "Thermally Stimulated Current Study Of Traps Distribution In Beta-tlins2 Layered Crystals." Master's thesis, METU, 2008. http://etd.lib.metu.edu.tr/upload/12609667/index.pdf.
Full textWang, Yanping. "Structural analyses by advanced X-ray scattering on GaP layers epitaxially grown on silicon for integrated photonic applications." Thesis, Rennes, INSA, 2016. http://www.theses.fr/2016ISAR0013/document.
Full textThis thesis deals with the development of structural analysis methods of the GaP thin layers heterogeneously grown on the Si substrate by Molecular Beam Epixay (MBE), based on X-ray diffraction (XRD) analyses, combined with complementary techniques such as transmission electron microscopy (TEM), atomic force microscopy techniques (AFM) and scanning tunneling microscope (STM). The main work is centered on the quantitative characterization of crystalline defect such as micro-twins and the anti-phase domains, and the evaluation of the surface and interface quality. The ultimate goal is to achieve a perfectly crystallized GaP/Si platform without any defect, through the optimization of the growth conditions. We have applied two micro-twin quantification methods using a XRD lab setup. Pole figure method for fast visualization and evaluation of micro-twin density and rocking curves integration for a more precise absolute quantification of the micro-twin volume fraction. The GaP/Si platform structural properties have been significantly improved, after an optimization procedure involving growth temperature, MEE (Migration Enhanced Epitaxy) growth procedure and a twostep growth sequence. GaP layers quasi-free of MTs are obtained, with a r.m.s. roughness of only 0.3 nm. The APD evaluation by XRD has been performed on reciprocal space maps (RSM) centered on the (OOL) GaP reciprocal space lattice point either in lab setup or on synchrotron. Analysis of the transverse scans extracted from such RSM through the "Willamson-Hall like" method permits obtaining the "mosaicity" that is related to the micro-orientation of the small crystalline domains in the GaP layer, and the lateral correlation length which is considered to be related to the mean distance between two APBs, provided that this distance is approximately homogenous and corresponding to the mean APD size, and the density of other defects are very weak so that their influence can be neglected. Using this analytical method and the microscopic techniques, further optimization has been carried out on Ga amount at the initial growth stage, the use of AIGaP marker layers and the homoepitaxie of Si buffer layer. Finally, sample with none MT signal and very low density of APD has been achieved. Moreover, an abrupt GaP/Si interface displaying regular and double atomic steppes is observed on sample with a Si buffer layer prior to the GaP growth
Hénon, Sylvie. "Microscopie à l'angle de Brewster : transitions de phases et défauts d'orientation dans des films monomoléculairess." Phd thesis, Université Pierre et Marie Curie - Paris VI, 1993. http://tel.archives-ouvertes.fr/tel-00001113.
Full textLamy, Xavier. "Autour des singularités d’applications vectorielles en physique de la matière condensée." Thesis, Lyon 1, 2015. http://www.theses.fr/2015LYO10085/document.
Full textThe present thesis is devoted mainly to the mathematical analysis of models arising in the physics of liquid crystals and superconductivity. A common feature of these models is that one has to deal with elliptic systems whose solutions have singularities: optical defects in liquid crystals, vorticity defects in superconductivity. The rod-like molecules in a liquid crystals, while being (as in a liquid) “randomly” distributed, tend to align in a common direction: this “orientational order” enhances crystal-like optical properties, which are responsible for their many industrial applications. We demonstrate different results related to the local symmetry of this alignement near singularities. We also present some results related to the Ginzburg-Landau model for type II superconductivity, and to “vortices”: isolated points at which superconductivity is destroyed. The last part of this thesis addresses regularity characterization for a function f through the convergence rate of f ∗ ρε, for some kernel ρ. In a joint work with Petru Mironescu we study the minimal regularity of ρ that allows such characterization
Jhao, Hong-Jyun, and 趙竑鈞. "Analysis of Defect Modes of Two-Dimensional Photonic Crystal Nano-Cavities." Thesis, 2005. http://ndltd.ncl.edu.tw/handle/36361224210576618415.
Full text國立交通大學
光電工程系所
93
In this thesis, defect modes of two-dimensional photonic crystal nano-cavity are analyzed. The defect is formed by removing a single air hole from array of air holes of hexagonal lattice arrangement on a dielectric slab. First, the finite difference time domain method with various boundary conditions is introduced. Second, symmetry analysis of defect modes and design rules for high quality factor cavities are presented. Finally, techniques of the simulation and the results of the simulation, like photonic band structures, resonant frequencies, mode profiles, and quality factors are exhibited.
Hsu, Chia-Ming, and 許家銘. "Fabrication and Analysis of GaAs/AlxOy - Three Dimensional Photonic Crystal and its Defect Structures." Thesis, 2005. http://ndltd.ncl.edu.tw/handle/83876696175181035453.
Full text國立臺灣大學
電子工程學研究所
93
Photonic crystal is an unique structure. It is a kind of periodic variation of dielectric constant by various fabrication processes. Photonic crystal has a special characteristic—photonic bandgap—which the light with certain frequency will not propagate in . We use the “auto-cloning technique” to fabricate three dimensional photonic crystal. On the two dimensional checker-board pattern template, we alternate periodically the depositions of two materials which have different percentage of Al composition. Our material is GaAs system. Then the refractive index difference is changed by using wet oxidation. After wet oxidation the difference is increased to about 2 to fabricate 3D-FCC-photonic crystal. The subject of our research is the influence of the following variations on the photonic bandgap: (i) periods variation; (ii) defect region size variation; (iii) oblique transmission characteristics. Increasing the number of periods will make photonic bandgap more obvious. With increasing defect size, we observed the red shift of defect modes. With oblique incidence, photonic bandgap width will increase.
Lee, Ming-Jiu, and 李銘周. "Analysis and Classification of In-line Defect Inspection for Thin Film Transistor Liquid Crystal Display." Thesis, 2008. http://ndltd.ncl.edu.tw/handle/45817767495209791135.
Full text中原大學
機械工程研究所
96
Over the last decade, thin-film-transistor liquid-crystal-display (TFT-LCD), as display, has grown rapidly, and has almost replaced the market of cathode ray tube (CRT) monitor. The total value of photoelectric industry has exceeded the one of semiconductor. It has been a glaring industry that the government promotes actively. The manufacturing process of TFT-LCD, including array process, cell process and module assembly process, will be introduced in this technical report. Through the introduction, the importance of inline defect inspection in array process will be pointed out and detailed. In current practice, there are several equipments used for in-line inspection: automatic optical inspection (AOI) machine, micro-review machine, macro/micro machine, and critical-dimension overlap machine. These machines are used for inspecting various kinds of defects in different processes of the manufacturing. The defects are classified and analyzed according to the corresponding engineering. Therefore, the task of in-line inspection is able to enhance the yield rate and increase the business benefit. To achieve the goals of inspection efficiency, yield enhancement, and the production-cost reduction, the future works for inline inspection will be focused on automation and knowledge management. As for the inspection equipment, the key issues will be focused on several points, including how to enlarge the size of equipment, how to improve the accuracy of the measurement, and how to lift the efficiency. These are adapt to the large-size LCD panels, and are the future trends for the design of inspection equipment. In the final we will discuss the future works including the knowledge management and the automatic defect classification. In TFT-LCD manufacturing, there are some unknown defects actually. Due to unknown defects, a high and satisfactory defect classification rate can not be obtained. For solving this problem, it is necessary to develop a knowledge management system to improve the defect classification accuracy. In addition, several techniques, such as image processing, statistical texture extraction, data mining and neural network-based classification, can be used and integrated to achieve the goal of real-time defect recognition. The above-mentioned refers to the automatic defect-classification system.
Lu, Chia-Ming, and 呂嘉銘. "1.Defect analysis of GaN /AlN thin films on Si and LiAlO2 substrates2.Growth of Sapphire single crystal." Thesis, 2006. http://ndltd.ncl.edu.tw/handle/08014785377088152258.
Full text國立中山大學
材料科學研究所
94
The main purpose of this study is focused on the defects within the layers of GaN over AlN thin films which were grown on the substrates of silicon (111) and LiAlO2 (100), respectively. The growth of three sapphire crystals is also addressed. During the epitaxial growth period, the Al pre-deposition time is very important for the defect on AlN/Si, and due to the high stacking fault energy, the partial dislocations in the AlN layers can not be observed. Cracks were found in the GaN films because of the great thermal mismatch between GaN itself and AlN which is up to 25%. Although the lattice mismatch between GaN and LiAlO2 is low, the thermal stress effect still could not be avoided. Cracks also occurred in the GaN films which were grown on LiAlO2 substrates. For the sapphire pulled along [100] direction, the crystal has fewer amounts of bubbles at the lower rotation rate. For the sapphire pulled along [001] direction, the crystal with 4.5 mm/hr pulling rate has cracks along [001] direction, but the crystal with 4.0 mm/hr pulling rate has no cracks inside.
Li, Yu-Cheng, and 李郁逞. "Design and analysis of the flat filter of one dimensional photonic crystal with defect mode of Gaussian type." Thesis, 2006. http://ndltd.ncl.edu.tw/handle/50678582616152019319.
Full text元智大學
光電工程研究所
94
In this study, we designed and analyzed one-dimensional photonic crystals as a narrow-band and a flat filter by using the transfer matrix method. Based on the transfer matrix method, we discussed the thin whole layer structure and the distribution of the thickness of each layer to get a very good narrow-band filter with a nice gain of the electric field of the light wave. Furthermore, we also used the transfer matrix method to calculate their transmissive spectra for three types of Gaussian photonic crystals, such as Gaussian refractive type, and the Gaussian thickness type, and the twin Gaussian type photonic crystal, and we focused and discussed transmissive spectra affected by the material parameters of thickness and refractive index and the defect states appeared in the layer structure. Consequenctly, we analyzed the relation between the Fourier spectra of Gaussian refractive type and Gaussian thickness type photonic crystals and their transmissive spectra.
Ho, Chun-Yu, and 何雋禹. "Ultra-high Resolution TEM Analysis of Defect in Si Ion-irradiated Single Crystal 3C-SiC and SA-Tyrannohex SiC Fiber-bonded Composite at High Temperatures." Thesis, 2013. http://ndltd.ncl.edu.tw/handle/87520553331323002166.
Full text國立清華大學
核子工程與科學研究所
101
Silicon carbides (SiC) are considered as one of the promising candidates for structural and core materials used in fusion reactor and high temperature gas-cooled reactor (HTGR) due to its high thermal stability, and good resistance to irradiation and chemical attack. Single crystal 3C-SiC with less intrinsic defects was used to precisely characterize the radiation-induced defects in 3C-SiC. In addition, there are limited discussions related to radiation effect of SA-Tyrannohex fiber-bonded composite at high temperatures. Therefore, in this study, single crystal 3C-SiC thin film and SA-Tyrannohex SiC fiber-bonded composite were irradiated at 1000℃ to 1350℃ with 7MeV Si3+ ion to simulate the neutron irradiation in reactors. The microstructure of the irradiated SiC was examined by using high resolution transmission electron microscope (HRTEM) and spherical aberration corrected scanning TEM (Cs-corrected STEM). In irradiated single crystal 3C-SiC, high resolution images showed that the planar defects were extrinsic stacking faulted loop with changing atomic sequences and intrinsic stacking faulted loop, i.e. vacancy loop. The atomic configurations were confirmed by STEM annular bright field image. However, no void has been found in single crystal 3C-SiC due to formation of vacancy loops, vacancies releasing from surface, or too small to be visible (<1 nm). In addition, dislocation loops, voids, and edge dislocations in SA-Tyrannohex SiC fiber-bonded composite after irradiation were investigated. This SiC composite are able to suppress void growth and lower the void density after high-temperature irradiation due to its small grain size (~300 nm). Besides, larger voids (with diameter 10-40 nm) formed in alumina with preferred orientation after irradiation perhaps resulting in degradation of strength of the SA-Tyrannohex SiC fiber-bonded composite.
Chen, Jiun-Yeu, and 陳俊宇. "Analyses and Applications of Defect Modes in Chiral Photonic Crystals." Thesis, 2005. http://ndltd.ncl.edu.tw/handle/65089073480344545646.
Full text國立成功大學
機械工程學系碩博士班
93
The properties of photonic band gaps in chiral photonic crystals are discussed in the thesis. The research is devoted to the photonic defect modes in the chiral photonic structures with gradient pitch length and the introduction of the different kinds of defects. In addition, various optical applications with respect to the defect modes are also demonstrated. Self-organized cholesteric liquid crystals (ChLCs) with spatially varying pitch are the examples. The finite element method and the 4×4 transfer matrix method are carried out for the study of the optical propagation simulations in the ChLC films. First, the optics of the cholesteric medium with constant pitch is talked over, including dispersion relations, the group velocity, the group delays, the electromagnetic density of modes, transmission and reflection spectra, the properties of the defect modes, etc. Then, the optics of the cholesterics with spatially varying pitch is focused on the photonic defect modes created by the following defects: twist defect (phase jump), gradient jump, and pitch jump. The defect mode due to the introduction of a twist defect is considered in the chiral structures with spatially varying pitch. An unusual crossover behavior in reflection at the defect resonance wavelength of a single circularly polarized mode appears when the structure thickness increases over a specific value. Two different resonance wavelengths can be created by a twist defect in the identical ChLC composite film with linearly varying pitch. The behavior constitutes the operational mechanism for a passive optical diode. The introduction of photonic defect modes in a ChLC can be achieved by a global deformation of the helix with a chiral anti-symmetry relative to the middle of the ChLC configuration. The defect modes can be excited only when the circularly polarized incident wave has the same handedness as the ChLC. The transmittance of the defect modes is greatly reduced when the structure thickness is large far away from a critical value, and even some defect modes will be completely suppressed. A wider forbidden band for polarization-selective reflection can be obtained. Such a ChLC film can be useful for the production of the ultra-wide-band reflective polarizer. For normal and near-normal incidence of circularly polarized light with the same handedness as structure, the defect caused by a pitch jump in the cholesteric helix results in discrete peaks within a forbidden band in the transmission. The particular spectrum is similar to the feature of a Fabry-Perot interferometer. By introducing an additional phase jump, linear blue shifts of the defect modes in transmission spectra are correlated with an increase in the twist angle. Polarization-dependent or polarization-independent optical filters based on the special transmission properties of multiple photonic defect modes are described.
Lin, Hui-Chun, and 林慧純. "Analysis of the Optical Characteristics of Photonic-Crystal-Slab-Waveguide Cavities with Liquid Crystal Defects." Thesis, 2014. http://ndltd.ncl.edu.tw/handle/7brrg3.
Full text國立虎尾科技大學
光電與材料科技研究所在職專班
102
In this thesis, an optical filter based on photonic crystal structure with liquid crystal is proposed. The software for photonic crystal design, Crystal wave Version 3.2, is used for numerical simulation in the thesis. Plane Wave Expansion method is adopted to calculate the photonic band gap. Then the propagation behaviors of light under different structures are simulated by FDTD, Finite-difference time-domain method. In this thesis, the photonic crystal waveguide cavity filters with liquid crystal defects are designed and analyze. Because of the birefringence property of the anisotropic liquid crystal, we could analyze the filtering characteristic via changing the externally electric field to control director of liquid crystal under different structure. The electro-optic effect of liquid crystals could be used for the design of tunable photonic crystal filters. The criterions to obtain best performance of filtering could be found via adjusting parameters and they are shown useful for the application on the optical communications.
Hunag, Yu-Sheng, and 黃育森. "Analysis of Color Filter Defects for Thin Film Transistor Liquid Crystal Display." Thesis, 2010. http://ndltd.ncl.edu.tw/handle/ru33ks.
Full text中原大學
電子工程研究所
98
The technical report is to explore “key components of TFT-LCD color filter’s defect analysis and classification in various manufacturing process”. In this report, we will introduce the panel that in recent years has been a lot of use, makes its demand increased, so panel manufacturing plant to increase production and research and development of large size panels. However, the panel defects generated due to manufacturing environment and machine’s stability, resulting in panel yield fell, the cost increased .In order to improve this problem, In-line MQC mechanisms are established that glass substrates are inspected by a randomly sampling ratio in manufacturing process to prevent the occurrence of a large number of unqualified panels. But the current in-line MQC mechanisms are operated under a sampling ratio and are handled manually. To reduce human power, increase processing speed, inspect entire glass substrates and pass relative information to the online engineers immediately. Therefore, it is necessary to introduce automatic inspection machine system. for this technological report will introduce color filter process Then the equipment of the process and the defect cause will be analyzed. In the end, the test result of the “auto defect classification system automation will be the database
Chia-ChinTsai and 蔡佳晉. "Design and Analysis of Tunable Photonic Crystal Devices Using Magneto-optical Defects." Thesis, 2014. http://ndltd.ncl.edu.tw/handle/89261953202306304120.
Full text國立成功大學
機械工程學系
102
In this research a series of tunable photonic crystal (PhC) devices are proposed. The magneto-optical (MO) materials are infiltrated into the PhC structure to become point or line defects. With out-of-plane magnetization, the degenerate resonant modes splits into two counter-rotating modes at different frequencies. Furthermore, the quality factor of two splitting modes significantly increases to about 4000, which is suitable for applications of dense wavelength-division-multiplexing (DWDM) systems and refractive index sensors. When the out-of-plane magnetization is applied to the MO line defects in the PhCs, the fundamental waveguide mode vanishes in specific frequency region. This phenomenon causes the fundamental mode waves blocked by the PhC structure. Based on the effect, the power can be switched by applying external magnetic fields. When two MO line defects are put side by side in the PhC structure with opposite direction of magnetization, the time-reversal and space inversion symmetries breaks, which causes the difference of the dispersion curves for opposite propagating directions. Using this effect a PhC diode can be achieved. Computations are performed using plane wave expansion (PWE) and finite difference time domain (FDTD) method.
Shih, Pi-Kuei, and 石璧魁. "Measurement and Analysis of Defect Modes in 2D and 3D GaAs Photonic Crystals." Thesis, 2007. http://ndltd.ncl.edu.tw/handle/36596458046110734904.
Full text臺灣大學
光電工程學研究所
95
Photonic crystals are materials with periodical dielectric constants. The band gap occurs according to the destructive interference, where certain wavelengths are not allowed to pass through. The light at those frequencies can not find a real propagation constant and thus will be scattered. Besides perfect photonic crystals, we are more interested in those photonic crystals with defects because those modes resulted from the defects are spatially confined in comparison with those non-defect modes. In other words, we can control the behavior of the defect modes by adjusting the fine structures in the photonic crystal. This is a very interesting phenomenon. An example of this is the photonic crystal waveguide, where lights will propagate along the direction we design. By developing automatic measurement techniques, we can acquire correct and stable information efficiently. For two-dimensional slab structures, we focus on the resonant cavities formed by the photonic crystals and expect to observe the resonant modes and the field distribution. With the assistance of the motorized stage, we could stably scan the spatial light intensity distribution and then observe the spectrum and the field intensity distribution of the defect modes. With the spectrum and the field distribution of the defect modes, we could understand more about the effects of the resonator. In the structure we designed in this work, we successfully find two resonant modes around 952nm and 960nm on the spectrum by observing the transmitted and the scattered spectrum. On the other hand, owing to the difficulty in constructing the point-defect by the auto-cloning method in three-dimensional checkerboard structures, we designed line-defects instead and then observed the effect from them. We observed the spectra and the spatial distribution of the defect modes. But we can’t find the obvious difference in spatial field distribution between two defect structures which have different sizes. It’s probably limited by the detection resolution and stability.
Kirichenko, Taras Alexandrovich. "Dynamics of defects and dopants in complex systems: si and oxide surfaces and interfaces." Thesis, 2005. http://hdl.handle.net/2152/1785.
Full textSzelengowicz, Ivan Michel Nicolas. "Analysis and Optimization of Stress Wave Propagation in Two-Dimensional Granular Crystals with Defects." Thesis, 2013. https://thesis.library.caltech.edu/7685/1/Szelengowicz_Ivan_Thesis_v6.pdf.
Full textTsai, Hsin-Yang, and 蔡欣洋. "Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion image analysis." Thesis, 2008. http://ndltd.ncl.edu.tw/handle/48630981830036969373.
Full text元智大學
工業工程與管理學系
96
This research proposes a machine vision scheme for mura defect detection in TFT-LCD manufacturing. Mura is a Japanese word for blemish, which typically shows brightness imperfections from its surroundings in the surface. Since mura appears as a low-contrast region without clear edges in the surface, human inspectors need to continuously observe the hardly visible defect from different viewing angles. The traditional automatic visual inspection algorithms detect mura defects from individual still images. They neglect that a mura defect may not be visibly sensed in the image from a still system. In this study, the TFT-LCD panel is assumed to move along a track, where different light sources illuminate from different angles to the inspection panel. While the TFT-LCD panel passes through a fixed camera, the light reflection from different angles can effectively enhance the mura defect in the low-contrast motion images. This research therefore proposes a motion detection scheme based on optical flow techniques to identify mura defects in motion images. Since the TFT-LCD moves along a single direction, both two-dimensional (2D) and one-dimensional (1D) optical flow motion detection methods are developed. Three discriminative features based on the flow magnitude, mean flow magnitude and flow density in the optical flow field are presented to extract the defective regions in each image of the motion sequence. Both real glass substrates and synthetic panels are used to evaluate the efficacy of the proposed inspection schemes. Experimental results have shown that the proposed 1D optical flow method works as well as the 2D optical flow method to detect very low-contrast mura defects of small size, and achieves a high processing rate of 20 frames per seconds for images of size 200 200.