Journal articles on the topic 'Circuit reliability simulation'
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Lei, Chi Un, K. L. Man, Eng Gee Lim, Nan Zhang, and Kai Yu Wan. "Development of a Reliability Course for Emerging Circuits and Systems." Advanced Materials Research 622-623 (December 2012): 1922–24. http://dx.doi.org/10.4028/www.scientific.net/amr.622-623.1922.
Full textKim, Je-Hyuk, Youngjin Seo, Jun Tae Jang, Shinyoung Park, Dongyeon Kang, Jaewon Park, Moonsup Han, Changwook Kim, Dong-Wook Park, and Dae Hwan Kim. "Reliability-Aware SPICE Compatible Compact Modeling of IGZO Inverters on a Flexible Substrate." Applied Sciences 11, no. 11 (May 25, 2021): 4838. http://dx.doi.org/10.3390/app11114838.
Full textCao, Yu, Jyothi Velamala, Ketul Sutaria, Mike Shuo-Wei Chen, Jonathan Ahlbin, Ivan Sanchez Esqueda, Michael Bajura, and Michael Fritze. "Cross-Layer Modeling and Simulation of Circuit Reliability." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 33, no. 1 (January 2014): 8–23. http://dx.doi.org/10.1109/tcad.2013.2289874.
Full textAlexeyev, Alexander A., and Michael M. Green. "Secure Communications Based on Variable Topology of Chaotic Circuits." International Journal of Bifurcation and Chaos 07, no. 12 (December 1997): 2861–69. http://dx.doi.org/10.1142/s0218127497001941.
Full textZhang, Yu, and Ji Dong Li. "Simulation Research of a Soft Power Bi-Directional DC-DC Converter." Advanced Materials Research 945-949 (June 2014): 2327–30. http://dx.doi.org/10.4028/www.scientific.net/amr.945-949.2327.
Full textLi, Minghan, Chenglong Fu, Jingyi Huang, and Jiaxin Liu. "Reliability Evaluation Model of Distribution Network Based on Circuit Structure." Journal of Physics: Conference Series 2310, no. 1 (October 1, 2022): 012070. http://dx.doi.org/10.1088/1742-6596/2310/1/012070.
Full textNASEH, SASAN, and M. JAMAL DEEN. "RF CMOS RELIABILITY." International Journal of High Speed Electronics and Systems 11, no. 04 (December 2001): 1249–95. http://dx.doi.org/10.1142/s0129156401001088.
Full textСуханова, Наталия, and Nataliya Sukhanova. "ELECTRONIC CIRCUIT FAILURE MODELING USING NEURAL NETWORKS." Bulletin of Bryansk state technical university 2018, no. 8 (October 25, 2018): 76–83. http://dx.doi.org/10.30987/article_5bb5e6f323cf39.47317213.
Full textChen, Jinjie. "A Simulation Research on the Grid-Connected Control Technology of Single-Phase Inverters Based on MATLAB." Journal of Electronic Research and Application 6, no. 4 (July 27, 2022): 7–12. http://dx.doi.org/10.26689/jera.v6i4.4154.
Full textZandevakili, Hamed, Ali Mahani, and Mohsen Saneei. "An accurate and fast reliability analysis method for combinational circuits." COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 34, no. 3 (May 5, 2015): 979–95. http://dx.doi.org/10.1108/compel-06-2014-0137.
Full textFernández, R., R. Rodríguez, M. Nafría, and X. Aymerich. "DC broken down MOSFET model for circuit reliability simulation." Electronics Letters 41, no. 6 (2005): 368. http://dx.doi.org/10.1049/el:20057422.
Full textLi, X., J. Qin, B. Huang, X. Zhang, and J. B. Bernstein. "SRAM Circuit-Failure Modeling and Reliability Simulation With SPICE." IEEE Transactions on Device and Materials Reliability 6, no. 2 (June 2006): 235–46. http://dx.doi.org/10.1109/tdmr.2006.876568.
Full textHsu, W. J., B. J. Sheu, S. M. Gowda, and C. G. Hwang. "Advanced integrated-circuit reliability simulation including dynamic stress effects." IEEE Journal of Solid-State Circuits 27, no. 3 (March 1992): 247–57. http://dx.doi.org/10.1109/4.121545.
Full textZhou, Zhi Wen, Cai Xia Wang, and An Ren Ma. "Research on Coating Devices with Applied Technology in Magnetron Sputtering Regulated Switching Power Supply Design." Applied Mechanics and Materials 540 (April 2014): 134–37. http://dx.doi.org/10.4028/www.scientific.net/amm.540.134.
Full textFAN, Yuyang, Zhi DENG, and Zihang LI. "Verification and reliability analysis of synchronizers in clock domain crossing." Xibei Gongye Daxue Xuebao/Journal of Northwestern Polytechnical University 40, no. 2 (April 2022): 369–76. http://dx.doi.org/10.1051/jnwpu/20224020369.
Full textChattopadhyay, Saranyu, Pranesh Santikellur, Rajat Subhra Chakraborty, Jimson Mathew, and Marco Ottavi. "A Conditionally Chaotic Physically Unclonable Function Design Framework with High Reliability." ACM Transactions on Design Automation of Electronic Systems 26, no. 6 (November 30, 2021): 1–24. http://dx.doi.org/10.1145/3460004.
Full textLiu, Xin Cheng, Min Zhu, and Zhi Hui Jing. "The Modeling of OTFT and the Measuring of Small Signal Detection Circuit." Advanced Materials Research 981 (July 2014): 62–65. http://dx.doi.org/10.4028/www.scientific.net/amr.981.62.
Full textMore, S., M. Fulde, F. Chouard, and D. Schmitt-Landsiedel. "Reliability analysis of buffer stage in mixed signal application." Advances in Radio Science 9 (August 1, 2011): 225–30. http://dx.doi.org/10.5194/ars-9-225-2011.
Full textKubiak, K., and W. K. Fuchs. "Rapid integrated-circuit reliability-simulation and its application to testing." IEEE Transactions on Reliability 41, no. 3 (1992): 458–65. http://dx.doi.org/10.1109/24.159821.
Full textLi, Xiaojun, Jin Qin, and Joseph B. Bernstein. "Compact Modeling of MOSFET Wearout Mechanisms for Circuit-Reliability Simulation." IEEE Transactions on Device and Materials Reliability 8, no. 1 (March 2008): 98–121. http://dx.doi.org/10.1109/tdmr.2008.915629.
Full textZANDEVAKILI, HAMED, ALI MAHANI, and MOHSEN SANEEI. "PROBABILISTIC TRANSFER MATRIX WITH MIXED BINARY-DECIMAL CODING FOR LOGIC CIRCUIT RELIABILITY ANALYSIS." Journal of Circuits, Systems and Computers 22, no. 08 (September 2013): 1350064. http://dx.doi.org/10.1142/s0218126613500643.
Full textSchlünder, C. "Device reliability challenges for modern semiconductor circuit design – a review." Advances in Radio Science 7 (May 19, 2009): 201–11. http://dx.doi.org/10.5194/ars-7-201-2009.
Full textYao, Zhao. "Analysis of Control Strategy of Three-phase Bridge Fully Controlled Rectifier Circuit Based on PID Control." Highlights in Science, Engineering and Technology 17 (November 10, 2022): 328–35. http://dx.doi.org/10.54097/hset.v17i.2623.
Full textWang, Yimin, Yun Li, Yanbin Yang, and Wenchao Chen. "Hot Carrier Injection Reliability in Nanoscale Field Effect Transistors: Modeling and Simulation Methods." Electronics 11, no. 21 (November 4, 2022): 3601. http://dx.doi.org/10.3390/electronics11213601.
Full textXu, Ji, Yaling Qin, Yongjiao Shi, Yutong Shi, Yang Yang, and Xiaobing Zhang. "Design and circuit simulation of nanoscale vacuum channel transistors." Nanoscale Advances 2, no. 8 (2020): 3582–87. http://dx.doi.org/10.1039/d0na00442a.
Full textWahyudi, Bagus, and Hangga Wicaksono. "Validating the Reliability Simulation Using Bohlamp Circuit with Accelerated Life Test Method." Mathematical Modelling of Engineering Problems 9, no. 5 (December 13, 2022): 1327–34. http://dx.doi.org/10.18280/mmep.090522.
Full textGłyda, Krzysztof, Andrzej Szelmanowski, Jarosław Sulkowski, and Andrzej Pazur. "Actions of the aviation on-board fire protection system caused by short circuits in control blocks." Journal of KONBiN 52, no. 4 (December 1, 2022): 177–96. http://dx.doi.org/10.2478/jok-2022-0049.
Full textZhou, Jia, Xiao Long Tan, and Wen Bin Wang. "Research of Single Phase APFC." Applied Mechanics and Materials 556-562 (May 2014): 1541–44. http://dx.doi.org/10.4028/www.scientific.net/amm.556-562.1541.
Full textTahoori, Mehdi, and Mohammad Saber Golanbari. "Cross-Layer Reliability, Energy Efficiency, and Performance Optimization of Near-Threshold Data Paths." Journal of Low Power Electronics and Applications 10, no. 4 (December 3, 2020): 42. http://dx.doi.org/10.3390/jlpea10040042.
Full textLiu, Hai Ke, Hai Yang, Ying Zhang, Yi Tao Jiang, and Su Juan Zhang. "Transmission Network Planning Based on Genetic Algorithm in Market Environment." Applied Mechanics and Materials 737 (March 2015): 273–77. http://dx.doi.org/10.4028/www.scientific.net/amm.737.273.
Full textNajm, Farid N., and Michael G. Xakellis. "Statistical Estimation of the ,Switching Activity in VLSI Circuits." VLSI Design 7, no. 3 (January 1, 1998): 243–54. http://dx.doi.org/10.1155/1998/46819.
Full textZhang, Hong, Gui Xin Wang, Hao Yan, and Lu Zhou Zhang. "Research on the Half-Bridge Three-Level DC/DC Converter with High Frequency and High Voltage." Advanced Materials Research 732-733 (August 2013): 1175–78. http://dx.doi.org/10.4028/www.scientific.net/amr.732-733.1175.
Full textWu, Yue Feng. "The Simulation Study of New Boost-ZVT Circuit Based on Pspice." Applied Mechanics and Materials 644-650 (September 2014): 3821–24. http://dx.doi.org/10.4028/www.scientific.net/amm.644-650.3821.
Full textKreischer, Christian, Stefan Kulig, and Carsten Göbel. "Applicability of Park transformation for the analysis of transient performance during subsynchronous resonances." Archives of Electrical Engineering 62, no. 3 (September 1, 2013): 401–15. http://dx.doi.org/10.2478/aee-2013-0032.
Full textVerdingovas, Vadimas, Salil Joshy, Morten Stendahl Jellesen, and Rajan Ambat. "Analysis of surface insulation resistance related failures in electronics by circuit simulation." Circuit World 43, no. 2 (May 2, 2017): 45–55. http://dx.doi.org/10.1108/cw-09-2016-0040.
Full textLei, Chengwei, and Weisong Tian. "Probability-Based Customizable Modeling and Simulation of Protective Devices in Power Distribution Systems." Energies 15, no. 1 (December 29, 2021): 199. http://dx.doi.org/10.3390/en15010199.
Full textWang, Chun Ying, and Jun Zhang. "Based on FPGA Design and Simulation of Function Signal Generator." Applied Mechanics and Materials 380-384 (August 2013): 3292–95. http://dx.doi.org/10.4028/www.scientific.net/amm.380-384.3292.
Full textDanqing Chen, Erhong Li, E. Rosenbaum, and Sung-Mo Kang. "Interconnect thermal modeling for accurate simulation of circuit timing and reliability." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 19, no. 2 (2000): 197–205. http://dx.doi.org/10.1109/43.828548.
Full textBrambilla, A., A. Premoli, and G. Storti-Gajani. "Recasting modified nodal analysis to improve reliability in numerical circuit Simulation." IEEE Transactions on Circuits and Systems I: Regular Papers 52, no. 3 (March 2005): 522–34. http://dx.doi.org/10.1109/tcsi.2004.842869.
Full textAFACAN, Engin. "An efficient reliability simulation tool for lifetime-aware analog circuit synthesis." TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES 28, no. 4 (July 29, 2020): 2046–59. http://dx.doi.org/10.3906/elk-1910-22.
Full textMeng, Fangang, Shijing Wu, Fan Zhang, Zenglei Zhang, Jicai Hu, and Xiaoyong Li. "Modeling and Simulation of Flexible Transmission Mechanism with Multiclearance Joints for Ultrahigh Voltage Circuit Breakers." Shock and Vibration 2015 (2015): 1–17. http://dx.doi.org/10.1155/2015/392328.
Full textZheng, Han, and Xiao Bo Gao. "Research on the Application of Chaotic Iteration Function of Heterogeneous Populations Mining Algorithm in Computer Based on Co-Evolution." Applied Mechanics and Materials 539 (July 2014): 194–98. http://dx.doi.org/10.4028/www.scientific.net/amm.539.194.
Full textZhang, Han, Qing Luo, Guo-Hua Zhou, and Yong Huang. "Research on isolation method of spacecraft reaction wheels using electromagnetic shunt damping." Journal of Physics: Conference Series 2368, no. 1 (November 1, 2022): 012028. http://dx.doi.org/10.1088/1742-6596/2368/1/012028.
Full textŁyskawinski, Wiesław, Cezary Jędryczka, Dorota Stachowiak, Piotr Łukaszewicz, and Michał Czarnecki. "Finite element analysis and experimental verification of high reliability synchronous reluctance machine." Eksploatacja i Niezawodnosc - Maintenance and Reliability 24, no. 2 (April 22, 2022): 386–93. http://dx.doi.org/10.17531/ein.2022.2.20.
Full textSedlář, Tomáš, and Tibor Bachorec. "Multiphysical Simulations Help to Ensure Assembled Printed Circuit Board and Power Components Reliability." TRANSACTIONS ON ELECTRICAL ENGINEERING 8, no. 1 (March 30, 2020): 1–3. http://dx.doi.org/10.14311/tee.2019.1.001.
Full textLeblebici, Y., and S. M. Kang. "Simulation of hot-carrier induced MOS circuit degradation for VLSI reliability analysis." IEEE Transactions on Reliability 43, no. 2 (June 1994): 197–206. http://dx.doi.org/10.1109/24.294990.
Full textWenping Wang, V. Reddy, A. T. Krishnan, R. Vattikonda, S. Krishnan, and Yu Cao. "Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology." IEEE Transactions on Device and Materials Reliability 7, no. 4 (December 2007): 509–17. http://dx.doi.org/10.1109/tdmr.2007.910130.
Full textBaoguang Yan, Qingguo Fan, J. B. Bernstein, Jin Qin, and Jun Dai. "Reliability Simulation and Circuit-Failure Analysis in Analog and Mixed-Signal Applications." IEEE Transactions on Device and Materials Reliability 9, no. 3 (September 2009): 339–47. http://dx.doi.org/10.1109/tdmr.2009.2020740.
Full textBhanja, Mousumi, Surya Prakash Tamang, Ritika Das, and Baidyanath Ray. "Design Methodology of High Frequency M-ary ASK, FSK and QAM." Journal of Circuits, Systems and Computers 24, no. 10 (October 25, 2015): 1550152. http://dx.doi.org/10.1142/s0218126615501522.
Full textTsou, Ming-Chang, and Ming-Tse Kuo. "Optimal Combination Design of a Light Emitting Diode Matrix Applicable to a Single-Stage Flyback Driver." Energies 13, no. 19 (October 6, 2020): 5209. http://dx.doi.org/10.3390/en13195209.
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