Journal articles on the topic 'Characterization techniques for microelectroniq'
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Klymko, N. R., J. A. Casey, L. Tai, J. A. Fitzsimmons, and F. Adar. "Role of Raman Microprobe Spectroscopy in the Characterization of Microelectronic Materials." Microscopy and Microanalysis 7, S2 (August 2001): 150–51. http://dx.doi.org/10.1017/s1431927600026829.
Full textBusch, Brett W., Olivier Pluchery, Yves J. Chabal, David A. Muller, Robert L. Opila, J. Raynien Kwo, and Eric Garfunkel. "Materials Characterization of Alternative Gate Dielectrics." MRS Bulletin 27, no. 3 (March 2002): 206–11. http://dx.doi.org/10.1557/mrs2002.72.
Full textZhou, Shenglin, Zhaohui Yang, and Xiaohua Zhang. "Characterization tools of thin polymer films." International Journal of Modern Physics B 32, no. 18 (July 15, 2018): 1840007. http://dx.doi.org/10.1142/s0217979218400076.
Full textHuang, Zhiheng, Ziyan Liao, Kaiwen Zheng, Xin Zeng, Yuezhong Meng, Hui Yan, and Yang Liu. "Microstructural Hierarchy Descriptor Enabling Interpretative AI for Microelectronic Failure Analysis." EDFA Technical Articles 26, no. 2 (May 1, 2024): 10–18. http://dx.doi.org/10.31399/asm.edfa.2024-2.p010.
Full textMouro, João, Rui Pinto, Paolo Paoletti, and Bruno Tiribilli. "Microcantilever: Dynamical Response for Mass Sensing and Fluid Characterization." Sensors 21, no. 1 (December 27, 2020): 115. http://dx.doi.org/10.3390/s21010115.
Full textMurray, Conal E., A. J. Ying, S. M. Polvino, I. C. Noyan, and Z. Cai. "Nanoscale strain characterization in microelectronic materials using X-ray diffraction." Powder Diffraction 25, no. 2 (June 2010): 108–13. http://dx.doi.org/10.1154/1.3394205.
Full textJansen, K. M. B., V. Gonda, L. J. Ernst, H. J. L. Bressers, and G. Q. Zhang. "State-of-the-Art of Thermo-Mechanical Characterization of Thin Polymer Films." Journal of Electronic Packaging 127, no. 4 (December 22, 2004): 530–36. http://dx.doi.org/10.1115/1.2070092.
Full textGuégan, Hervé. "Use of a Nuclear Microprobe in Electronic Device Characterization." EDFA Technical Articles 9, no. 4 (November 1, 2007): 14–19. http://dx.doi.org/10.31399/asm.edfa.2007-4.p014.
Full textRuales, Mary, and Kinzy Jones. "Characterization of silicate sensors on Low Temperature Cofire Ceramic (LTCC) substrates using DSC and XRD techniques." International Symposium on Microelectronics 2012, no. 1 (January 1, 2012): 000598–603. http://dx.doi.org/10.4071/isom-2012-wa31.
Full textNguyen, T. K., L. M. Landsberger, V. Logiudice, and C. Jean. "Electrical characterization of fluorine-implanted gate oxide structures." Canadian Journal of Physics 74, S1 (December 1, 1996): 74–78. http://dx.doi.org/10.1139/p96-836.
Full textCoppola, Giuseppe, and Maria Antonietta Ferrara. "Polarization-Sensitive Digital Holographic Imaging for Characterization of Microscopic Samples: Recent Advances and Perspectives." Applied Sciences 10, no. 13 (June 29, 2020): 4520. http://dx.doi.org/10.3390/app10134520.
Full textDrouin, D., J. Beauvais, and R. Gauvin. "Characterization of Variations in Schottky Barrier Height in Semiconductor Devices using EBIC Technique." Microscopy and Microanalysis 3, S2 (August 1997): 501–2. http://dx.doi.org/10.1017/s1431927600009399.
Full textMalisz, Klaudia, Beata Świeczko-Żurek, and Alina Sionkowska. "Preparation and Characterization of Diamond-like Carbon Coatings for Biomedical Applications—A Review." Materials 16, no. 9 (April 27, 2023): 3420. http://dx.doi.org/10.3390/ma16093420.
Full textSciuto, Emanuele Luigi, Corrado Bongiorno, Antonino Scandurra, Salvatore Petralia, Tiziana Cosentino, Sabrina Conoci, Fulvia Sinatra, and Sebania Libertino. "Functionalization of Bulk SiO2 Surface with Biomolecules for Sensing Applications: Structural and Functional Characterizations." Chemosensors 6, no. 4 (November 30, 2018): 59. http://dx.doi.org/10.3390/chemosensors6040059.
Full textBeers, Kimberly, Andrew E. Hollowell, and G. Bahar Basim. "Thin Film Characterization on Cu/SnAg Solder Interface for 3D Packaging Technologies." MRS Advances 5, no. 37-38 (2020): 1929–35. http://dx.doi.org/10.1557/adv.2020.309.
Full textHoummada, Khalid, Dominique Mangelinck, and Alain Portavoce. "Kinetic of Formation of Ni and Pd Silicides: Determination of Interfacial Mobility and Interdiffusion Coefficient by In Situ Techniques." Solid State Phenomena 172-174 (June 2011): 640–45. http://dx.doi.org/10.4028/www.scientific.net/ssp.172-174.640.
Full textCara, Eleonora, Irdi Murataj, Gianluca Milano, Natascia De Leo, Luca Boarino, and Federico Ferrarese Lupi. "Recent Advances in Sequential Infiltration Synthesis (SIS) of Block Copolymers (BCPs)." Nanomaterials 11, no. 4 (April 13, 2021): 994. http://dx.doi.org/10.3390/nano11040994.
Full textKumar, Ashok. "Functional Nanomaterials: From Basic Science to Emerging Applications." Solid State Phenomena 201 (May 2013): 1–19. http://dx.doi.org/10.4028/www.scientific.net/ssp.201.1.
Full textGauvin, Raynald, Mario Caron, Vincent Fortin, and John F. Currie. "Characterization of Multilayered Structures Using a FEGSEM and X-Ray Microanalysis." Microscopy and Microanalysis 3, S2 (August 1997): 463–64. http://dx.doi.org/10.1017/s143192760000920x.
Full textTrulli, Susan, Craig Armiento, Christopher Laighton, Elicia Harper, Mahdi Haghzadeh, and Alkim Akyurtlu. "Additive Packaging for Microwave Applications." International Symposium on Microelectronics 2017, no. 1 (October 1, 2017): 000768–72. http://dx.doi.org/10.4071/isom-2017-thp53_148.
Full textPagan, Darren C., Md A. J. Rasel, Rachel E. Lim, Dina Sheyfer, Wenjun Liu, and Aman Haque. "Non-destructive depth-resolved characterization of residual strain fields in high electron mobility transistors using differential aperture x-ray microscopy." Journal of Applied Physics 132, no. 14 (October 14, 2022): 144503. http://dx.doi.org/10.1063/5.0109606.
Full textPortavoce, Alain, Khalid Hoummada, and Lee Chow. "Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements." Microscopy and Microanalysis 25, no. 2 (January 30, 2019): 517–23. http://dx.doi.org/10.1017/s1431927618015623.
Full textMustafa, M. K., U. Majeed, and Y. Iqbal. "Effect on Silicon Nitride thin Films Properties at Various Powers of RF Magnetron Sputtering." International Journal of Engineering & Technology 7, no. 4.30 (November 30, 2018): 39. http://dx.doi.org/10.14419/ijet.v7i4.30.22000.
Full textBooth, James C., Nathan Orloff, Christian Long, Aaron Hagerstrom, Angela Stelson, Nicholas Jungwirth, and Luckshitha Suriyasena Liyanage. "(Invited, Digital Presentation) Nonlinear and Electro-Thermo-Mechanical Effects in Heterogeneous Electronics at Microwave Frequencies." ECS Meeting Abstracts MA2022-02, no. 17 (October 9, 2022): 862. http://dx.doi.org/10.1149/ma2022-0217862mtgabs.
Full textYoungman, R. A. "The Critical Role of Microscopy and Spectroscopy in the Development of New Materials for Microelectronics Packaging." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 634–35. http://dx.doi.org/10.1017/s042482010016563x.
Full textArikpo, John U., and Michael U. Onuu. "Graphene Growth and Characterization: Advances, Present Challenges and Prospects." Journal of Materials Science Research 8, no. 4 (September 30, 2019): 37. http://dx.doi.org/10.5539/jmsr.v8n4p37.
Full textHu, Xiao-Yu, Jun Ouyang, Guo-Chang Liu, Meng-Juan Gao, Lai-Bo Song, Jianfeng Zang, and Wei Chen. "Synthesis and Characterization of the Conducting Polymer Micro-Helix Based on the Spirulina Template." Polymers 10, no. 8 (August 7, 2018): 882. http://dx.doi.org/10.3390/polym10080882.
Full textSzocinski, Michal. "AFM-assisted investigation of conformal coatings in electronics." Anti-Corrosion Methods and Materials 63, no. 4 (June 6, 2016): 289–94. http://dx.doi.org/10.1108/acmm-09-2014-1426.
Full textPantel, R., G. Mascarin, and G. Auvert. "Defect Analysis and Process Development of Microelectronics Devices Using Focused Ion Beam and Energy Filtering Transmission Electron Microscopy." Microscopy and Microanalysis 5, S2 (August 1999): 900–901. http://dx.doi.org/10.1017/s1431927600017827.
Full textFritz, Mathias, Christian Elieser Hoess, Finn-Merlin Deckert, and Andreas Bund. "Light-Induced Platinum Deposition on Silicon-Based Semiconductor Devices." ECS Meeting Abstracts MA2023-02, no. 20 (December 22, 2023): 1217. http://dx.doi.org/10.1149/ma2023-02201217mtgabs.
Full textLamia, Zarral, Djahli Farid, and Ndagijimana Fabien. "Technique of Coaxial Frame in Reflection for the Characterization of Single and Multilayer Materials with Correction of Air Gap." International Journal of Antennas and Propagation 2014 (2014): 1–9. http://dx.doi.org/10.1155/2014/324727.
Full textBaczyński, Szymon, Piotr Sobotka, Kasper Marchlewicz, Artur Dybko, and Katarzyna Rutkowska. "Low-cost, widespread and reproducible mold fabrication technique for PDMS-based microfluidic photonic systems." Photonics Letters of Poland 12, no. 1 (March 31, 2020): 22. http://dx.doi.org/10.4302/plp.v12i1.981.
Full textWarczak, Magdalena, Marianna Gniadek, Kamil Hermanowski, and Magdalena Osial. "Well-defined polyindole–Au NPs nanobrush as a platform for electrochemical oxidation of ethanol." Pure and Applied Chemistry 93, no. 4 (April 1, 2021): 497–507. http://dx.doi.org/10.1515/pac-2020-1101.
Full textBasit, M., M. Aslam, M. Ahmad, and Z. A. Raza. "Structural, thermal and optoelectrical study of PVA/iron oxide nanocomposite films." Materialwissenschaft und Werkstofftechnik 55, no. 4 (April 2024): 455–65. http://dx.doi.org/10.1002/mawe.202300075.
Full textStefani, G. G., N. S. Goel, and D. B. Jenks. "An Efficient Numerical Technique for Thermal Characterization of Printed Wiring Boards." Journal of Electronic Packaging 115, no. 4 (December 1, 1993): 366–72. http://dx.doi.org/10.1115/1.2909345.
Full textDas, Rabindra, Steven Rosser, and Frank Egitto. "Advanced Microelectronics Packaging Solutions for Miniaturized Medical Devices." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2013, DPC (January 1, 2013): 001963–76. http://dx.doi.org/10.4071/2013dpc-tha24.
Full textCruz-Quesada, Guillermo, Maialen Espinal-Viguri, María Victoria López-Ramón, and Julián J. Garrido. "Novel Silica Hybrid Xerogels Prepared by Co-Condensation of TEOS and ClPhTEOS: A Chemical and Morphological Study." Gels 8, no. 10 (October 20, 2022): 677. http://dx.doi.org/10.3390/gels8100677.
Full textAlves, L. C., V. Corregidor, T. Pinheiro, and L. Ferreira. "Ion Beam Microscopy: a Tool for Materials." Microscopy and Microanalysis 19, S4 (August 2013): 95–96. http://dx.doi.org/10.1017/s1431927613001098.
Full textBennett, N. S., and N. E. B. Cowern. "Doping characterization for germanium-based microelectronics and photovoltaics using the differential Hall technique." Applied Physics Letters 100, no. 17 (April 23, 2012): 172106. http://dx.doi.org/10.1063/1.4705293.
Full textMaraj, Mudassar, Ghulam Nabi, Khurram Usman, Engui Wang, Wenwang Wei, Yukun Wang, and Wenhong Sun. "High Quality Growth of Cobalt Doped GaN Nanowires with Enhanced Ferromagnetic and Optical Response." Materials 13, no. 16 (August 11, 2020): 3537. http://dx.doi.org/10.3390/ma13163537.
Full textPulici, Andrea, Stefano Kuschlan, Gabriele Seguini, Fabiana Taglietti, Marco Fanciulli, Riccardo Chiarcos, Michele Laus, and Michele Perego. "Electrical Characterization of Ultra-Thin Silicon-on-Insulator Films Doped By Means of Phosphorus End-Terminated Polymers." ECS Meeting Abstracts MA2023-02, no. 30 (December 22, 2023): 1552. http://dx.doi.org/10.1149/ma2023-02301552mtgabs.
Full textDittman, Timothy, David Ebner, and Alex Bailey. "Design of Experiments Approach to Evaluating the Reliability of System-in-Package Assemblies." International Symposium on Microelectronics 2017, no. 1 (October 1, 2017): 000619–23. http://dx.doi.org/10.4071/isom-2017-tha52_063.
Full textTuttle, Bruce A. "Electronic Ceramic Thin Films: Trends in Research and Development." MRS Bulletin 12, no. 7 (November 1987): 40–46. http://dx.doi.org/10.1557/s0883769400066938.
Full textLeofanti, G., G. Tozzola, M. Padovan, G. Petrini, S. Bordiga, and A. Zecchina. "Catalyst characterization: characterization techniques." Catalysis Today 34, no. 3-4 (February 1997): 307–27. http://dx.doi.org/10.1016/s0920-5861(96)00056-9.
Full textEckert, Hellmut, and Manfred Rühle. "Characterization techniques." Current Opinion in Solid State and Materials Science 5, no. 2-3 (April 2001): 193–94. http://dx.doi.org/10.1016/s1359-0286(01)00018-3.
Full textFischer, John E., and Hellmut Eckert. "Characterization techniques." Current Opinion in Solid State and Materials Science 1, no. 4 (August 1996): 463–64. http://dx.doi.org/10.1016/s1359-0286(96)80059-3.
Full textEckert, Hellmut, and Manfred Rühle. "Characterization techniques." Current Opinion in Solid State and Materials Science 2, no. 4 (August 1997): 463–64. http://dx.doi.org/10.1016/s1359-0286(97)80090-3.
Full textStern, Edward A., and Richard W. Siegel. "Characterization techniques." Current Opinion in Solid State and Materials Science 4, no. 4 (August 1999): 321–23. http://dx.doi.org/10.1016/s1359-0286(99)00042-x.
Full textFournel, Frank, Loic Sanchez, Brigitte Montmayeul, Gaëlle Mauguen, Laurent Bally, Vincent Larrey, Christophe Morales, et al. "(Invited) Optoelectronic and 3D Applications with Die to Wafer Direct Bonding: From Mechanisms to Applications." ECS Meeting Abstracts MA2022-02, no. 17 (October 9, 2022): 853. http://dx.doi.org/10.1149/ma2022-0217853mtgabs.
Full textRogers, John A., Martin Fuchs, Matthew J. Banet, John B. Hanselman, Randy Logan, and Keith A. Nelson. "Optical system for rapid materials characterization with the transient grating technique: Application to nondestructive evaluation of thin films used in microelectronics." Applied Physics Letters 71, no. 2 (July 14, 1997): 225–27. http://dx.doi.org/10.1063/1.119506.
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