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Journal articles on the topic 'Atomic Force Microscopy'

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Published: 4 June 2021

Last updated: 1 August 2024

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1

Marti, O., B. Drake, S. Gould, and P. K. Hansma. "Atomic force microscopy and scanning tunneling microscopy with a combination atomic force microscope/scanning tunneling microscope." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 6, no. 3 (May 1988): 2089–92. http://dx.doi.org/10.1116/1.575191.

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2

Razumić, Andrej, Biserka Runje, Dragutin Lisjak, Davor Kolar, Amalija Horvatić Novak, Branko Štrbac, and Borislav Savković. "Atomic Force Microscopy." Tehnički glasnik 18, no. 2 (May 15, 2024): 209–14. http://dx.doi.org/10.31803/tg-20230829155921.

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The atomic force microscope (AFM) enables the measurement of sample surfaces at the nanoscale. Reference standards with calibration gratings are used for the adjustment and verification of AFM measurement devices. Thus far, there are no guidelines or guides available in the field of atomic force microscopy that analyze the influence of input parameters on the quality of measurement results, nor has the measurement uncertainty of the results been estimated. Given the complex functional relationship between input and output variables, which cannot always be explicitly expressed, one of the primary challenges is how to evaluate the measurement uncertainty of the results. The measurement uncertainty of the calibration grating step height on the AFM reference standard was evaluated using the Monte Carlo simulation method. The measurements within this study were conducted using a commercial, industrial atomic force microscope.

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3

NAKAJIMA, Ken, Kei SEKINE, Kaede MOGI, Makiko ITO, and Xiaobin LIANG. "Atomic Force Microscopy." Journal of the Japan Society of Colour Material 93, no. 10 (October 20, 2020): 321–28. http://dx.doi.org/10.4011/shikizai.93.321.

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4

Binnig, G. K. "Atomic-Force Microscopy." Physica Scripta T19A (January 1, 1987): 53–54. http://dx.doi.org/10.1088/0031-8949/1987/t19a/008.

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5

Slater, S. D., and K. P. Parsons. "Atomic Force Microscopy." Imaging Science Journal 45, no. 3-4 (January 1997): 269. http://dx.doi.org/10.1080/13682199.1997.11736428.

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6

Prater, C. B., H. J. Butt, and P. K. Hansma. "Atomic force microscopy." Nature 345, no. 6278 (June 1990): 839–40. http://dx.doi.org/10.1038/345839a0.

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7

Chatterjee, Snehajyoti, Shrikanth S. Gadad, and Tapas K. Kundu. "Atomic force microscopy." Resonance 15, no. 7 (July 2010): 622–42. http://dx.doi.org/10.1007/s12045-010-0047-z.

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8

Schwarz, Udo D. "Atomic Force Microscopy." Physics Today 64, no. 4 (April 2011): 60–61. http://dx.doi.org/10.1063/1.3580496.

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9

Rugar, Daniel, and Paul Hansma. "Atomic Force Microscopy." Physics Today 43, no. 10 (October 1990): 23–30. http://dx.doi.org/10.1063/1.881238.

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10

Meyer, E. "Atomic force microscopy." Progress in Surface Science 41, no. 1 (September 1992): 3–49. http://dx.doi.org/10.1016/0079-6816(92)90009-7.

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11

BLANCHARD, CHERYL R. "Atomic Force Microscopy." CHEMICAL EDUCATOR 1, no. 5 (December 1996): 1–8. http://dx.doi.org/10.1007/s00897960059a.

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12

Hellemans, Louis. "Can atomic force microscopy tips be inspected by atomic force microscopy?" Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 2 (March 1991): 1309. http://dx.doi.org/10.1116/1.585185.

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13

Kempe, A., J. W. Schopf, W. Altermann, A. B. Kudryavtsev, and W. M. Heckl. "Atomic force microscopy of Precambrian microscopic fossils." Proceedings of the National Academy of Sciences 99, no. 14 (June 27, 2002): 9117–20. http://dx.doi.org/10.1073/pnas.142310299.

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14

Rabe, U., and W. Arnold. "Acoustic microscopy by atomic force microscopy." Applied Physics Letters 64, no. 12 (March 21, 1994): 1493–95. http://dx.doi.org/10.1063/1.111869.

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15

Schwarz, Udo D. "Noncontact atomic force microscopy." Beilstein Journal of Nanotechnology 3 (February 29, 2012): 172–73. http://dx.doi.org/10.3762/bjnano.3.17.

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16

Heath, George R., Ekaterina Kots, Janice L. Robertson, Shifra Lansky, George Khelashvili, Harel Weinstein, and Simon Scheuring. "Localization atomic force microscopy." Nature 594, no. 7863 (June 16, 2021): 385–90. http://dx.doi.org/10.1038/s41586-021-03551-x.

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17

Barnard, H., B. Drake, C. Randall, and P. K. Hansma. "Deep atomic force microscopy." Review of Scientific Instruments 84, no. 12 (December 2013): 123701. http://dx.doi.org/10.1063/1.4821145.

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18

Söngen, Hagen, Ralf Bechstein, and Angelika Kühnle. "Quantitative atomic force microscopy." Journal of Physics: Condensed Matter 29, no. 27 (June 6, 2017): 274001. http://dx.doi.org/10.1088/1361-648x/aa6f8b.

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19

Platz, Daniel, Erik A. Tholén, Devrim Pesen, and David B. Haviland. "Intermodulation atomic force microscopy." Applied Physics Letters 92, no. 15 (April 14, 2008): 153106. http://dx.doi.org/10.1063/1.2909569.

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20

Fisher, K. A., M. G. L. Gustafsson, M. B. Shattuck, and J. Clarke. "Cryogenic atomic force microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 54–55. http://dx.doi.org/10.1017/s0424820100084570.

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The atomic force microscope (AFM) is capable of imaging electrically conductive and non-conductive surfaces at atomic resolution. When used to image biological samples, however, lateral resolution is often limited to nanometer levels, due primarily to AFM tip/sample interactions. Several approaches to immobilize and stabilize soft or flexible molecules for AFM have been examined, notably, tethering coating, and freezing. Although each approach has its advantages and disadvantages, rapid freezing techniques have the special advantage of avoiding chemical perturbation, and minimizing physical disruption of the sample. Scanning with an AFM at cryogenic temperatures has the potential to image frozen biomolecules at high resolution. We have constructed a force microscope capable of operating immersed in liquid n-pentane and have tested its performance at room temperature with carbon and metal-coated samples, and at 143° K with uncoated ferritin and purple membrane (PM).

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21

Eifert, Alexander, and Christine Kranz. "Hyphenating Atomic Force Microscopy." Analytical Chemistry 86, no. 11 (April 22, 2014): 5190–200. http://dx.doi.org/10.1021/ac5008128.

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22

Jang, Joonkyung, George C. Schatz, and Mark A. Ratner. "Capillary force in atomic force microscopy." Journal of Chemical Physics 120, no. 3 (January 15, 2004): 1157–60. http://dx.doi.org/10.1063/1.1640332.

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23

FUJII, Masatoshi. "Surface Forces Measurement by Atomic Force Microscopy." Journal of the Japan Society of Colour Material 72, no. 1 (1999): 34–42. http://dx.doi.org/10.4011/shikizai1937.72.34.

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24

O'Shea, Sean J. "Oscillatory Forces in Liquid Atomic Force Microscopy." Japanese Journal of Applied Physics 40, Part 1, No. 6B (June 30, 2001): 4309–13. http://dx.doi.org/10.1143/jjap.40.4309.

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25

Ippolito, Stephen, Sean Zumwalt, and Andy Erickson. "Emerging Techniques in Atomic Force Microscopy: Diamond Milling and Electrostatic Force Microscopy." EDFA Technical Articles 17, no. 3 (August 1, 2015): 4–10. http://dx.doi.org/10.31399/asm.edfa.2015-3.p004.

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Abstract Atomic force microscopy has been a consistent factor in the advancements of the past decade in IC nanoprobing and failure analysis. Over that time, many new atomic force measurement techniques have been adopted by the IC analysis community, including scanning conductance, scanning capacitance, pulsed current-voltage, and capacitance-voltage spectroscopy. More recently, two new techniques have emerged: diamond probe milling and electrostatic force microscopy (EFM). As the authors of the article explain, diamond probe milling using an atomic force microscope is a promising new method for in situ, localized, precision delayering of ICs, while active EFM is a nondestructive alternative to EBAC microscopy for localization of opens in IC analysis.

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26

SASAHARA, Akira, Hiroshi UETSUKA, Taka-aki ISHIBASHI, and Hiroshi ONISHI. "Noncontact Atomic Force Microscopy. Noncontact Atomic Force Microscope Topography of Adsorbed Organic Molecules." Hyomen Kagaku 23, no. 3 (2002): 186–93. http://dx.doi.org/10.1380/jsssj.23.186.

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27

Humphris, A. D. L., M. J. Miles, and J. K. Hobbs. "A mechanical microscope: High-speed atomic force microscopy." Applied Physics Letters 86, no. 3 (January 17, 2005): 034106. http://dx.doi.org/10.1063/1.1855407.

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28

Johnson, Lili L. "Atomic Force Microscopy (AFM) for Rubber." Rubber Chemistry and Technology 81, no. 3 (July 1, 2008): 359–83. http://dx.doi.org/10.5254/1.3548214.

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Abstract In this review, first, the development of atomic force microscopy as an imaging technique, as a surface force apparatus, and as a nanoindenter was illustrated using experimental studies. The experimental analysis of atomic force microscopy emphasizes the empirical methods of achieving high resolution imaging through controlled forces between tip and sample interactions. Second, mapping mechanical properties on nanometer scale by atomic force microscopy is presented with both experimental investigations and selection of elastic models. Elastomer crosslink density was mapped using atomic force microscopy combined with elastic theories. The force — penetration depth investigation of crosslink density for elastomer by AFM shows linear correction with both experimental studies using Dynamic Mechanical Thermal Analysis (DMTA) and classic swelling method and calculation using statistical rubber elasticity theory. Last, the focus is on the understanding of atomic force microscopy for practical applications. Filler dispersion and blends structure are demonstrated for automotive applications. Micro phase separation was intensely studied for film industries. Morphology of composites is investigated for the applications of tire, automotive and foaming industries.

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29

Hues, Steven M., Richard J. Colton, Ernst Meyer, and Hans-Joachim Güntherodt. "Scanning Probe Microscopy of Thin Films." MRS Bulletin 18, no. 1 (January 1993): 41–49. http://dx.doi.org/10.1557/s088376940004344x.

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Atomic force microscopy (AFM) was invented in 1986 by Binnig, Quate, and Gerber as “a new type of microscope capable of investigating surfaces of insulators on an atomic scale.” Stemming from developments in scanning tunneling microscopy (STM), it became possible to image insulators, organic and biological molecules, salts, glasses, and metal oxides — some under a variety of conditions, e.g., ambient pressure, in aqueous or cryogenic liquids, etc. In 1987, Mate and co-workers introduced a new application for AFM where atomic-scale frictional forces could be measured. Likewise, in 1989, Burnham and Colton used the AFM to measure the surface forces and nano-mechanical properties of materials. Today, there are many examples of using AFM as a high-resolution profilometer, surface force probe, and nanoindentor. Several new imaging techniques have been introduced; each depending on the type of force measured, e.g., magnetic, electrostatic, and capacitative. Because of the diverse nature of the field and instrumentation, the names “scanned probe microscopy” and “XFM” (where X stands for the force being measured, e.g., MFM is magnetic force microscopy) have been adopted.

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30

Ţîrcă, Simona Maria, Ion Ţîrcă, Marius Sorin Ciontea, and Florin Dumitru Mihălţan. "Atomic Force Microscopy Applied to Atopic Dermatitis Study." Internal Medicine 18, no. 4 (August 1, 2021): 21–28. http://dx.doi.org/10.2478/inmed-2021-0171.

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Abstract Atopic dermatitis (AD)-the commonest inflammatory skin disease affects up to 25% of children and 2% to 5% of adults. Methods of the diagnostic provide expanded recommendations founded on available evidence. Morphological evaluation remains a principal feature of clinical investigation and the main criteria of diagnosis. Methods. We collected normal and affected skin from a 6-month child patient who was diagnosed through dermatologic examination. Clinical characteristics and the diagnosis of atopic dermatitis were in accordance with Hanifin and Rajka criteria. Morphology and structural integrity were investigated by Atomic Force Microscopy. Results. Optical and topography images indicate that in the case of AD skin lesions the cuticle structure was severely damaged and distorted with the flattening and grading of the plates, which have an irregular appearance. From the surface morphologies of the samples, we demonstrate that the shape of the corneocytes, with granular and elongated appearance, specific to normal skin is transformed by AD into broken and collapsed plates with discontinuous appearance. Conclusions. In the initial diagnosis of AD changes of the skin properties can be an indicator. Hanifin and Rajka criteria together with Atomic Force Microscopy can be a useful and necessary technique diagnosing cases of atopic dermatitis.

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31

NAKAGAWA, YOSHITSUGU. "Scanning Tunneling Microscopy and Atomic Force Microscopy." Sen'i Gakkaishi 49, no. 4 (1993): P144—P148. http://dx.doi.org/10.2115/fiber.49.4_p144.

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32

Linnemann, R. "Atomic force microscopy and lateral force microscopy using piezoresistive cantilevers." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 14, no. 2 (March 1, 1996): 856. http://dx.doi.org/10.1116/1.589161.

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33

Dufrêne, Yves F. "Atomic force microscopy and chemical force microscopy of microbial cells." Nature Protocols 3, no. 7 (June 12, 2008): 1132–38. http://dx.doi.org/10.1038/nprot.2008.101.

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34

Xu, Rong-Guang, and Yongsheng Leng. "Solvation force simulations in atomic force microscopy." Journal of Chemical Physics 140, no. 21 (June 7, 2014): 214702. http://dx.doi.org/10.1063/1.4879657.

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35

Cappella, B., and G. Dietler. "Force-distance curves by atomic force microscopy." Surface Science Reports 34, no. 1-3 (January 1999): 1–104. http://dx.doi.org/10.1016/s0167-5729(99)00003-5.

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36

LeGrange, Jane D. "Microscopic manipulation of materials by atomic force microscopy." Biophysical Journal 64, no. 3 (March 1993): 903–4. http://dx.doi.org/10.1016/s0006-3495(93)81451-6.

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37

Yamanaka, Kazushi. "Ultrasonic Force Microscopy." MRS Bulletin 21, no. 10 (October 1996): 36–41. http://dx.doi.org/10.1557/s0883769400031626.

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As an imaging method of elastic properties and subsurface features on the microscopic scale, the scanning acoustic microscope (SAM) provides spatial resolution comparable or superior to that of optical microscopes. Nondestructive evaluation methods of defects and elastic properties on the microscopic scale were developed by using the SAM, and they have been widely applied to various fields in science and technology. One major problem in acoustic microscopy is resolution. The best resolution of SAM with water as the coupling fluid has been 240 nm at a frequency of 4.4 GHz. At a more conventional frequency of 1 GHz, the resolution is about 1 μm. Therefore the resolution of SAM is not always sufficient for examining nanoscale defects and advanced micro/nanodevices.For materials characterization on the nanometer scale, atomic force microscopy (AFM) was developed and extended in order to observe elastic properties in force-modulation mode. In the force-modulation mode, the sample is vibrated, and the resultant cantilever-deflection vibration is measured and used to produce elasticity images of objects. The lateral force-modulation AFM can evaluate the friction force or the shear elasticity in real time. However in the force-modulation mode, it is difficult to analyze stiff objects such as metals and ceramics.When the sample is vertically vibrated at ultrasonic frequencies much higher than the cantilever resonance frequency, the tip cannot vibrate due to the inertia of the cantilever. However by modulating the amplitude of the ultrasonic vibration, deflection vibration of the cantilever at the modulation frequency is excited due to the rectifier effect of the nonlinear force curves. Based on the tip-sample indentation during ultrasonic vibration, we developed ultrasonic force microscopy (UFM) for contact elasticity and subsurface imaging of rigid objects using a soft cantilever with a stiffness of the order of 0.1 N/m.

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38

Mitiurev, Nikolai, Michael Verrall, Svetlana Shilobreeva, Alireza Keshavarz, and Stefan Iglauer. "Shale adhesion force measurements via atomic force microscopy." Oil & Gas Science and Technology – Revue d’IFP Energies nouvelles 76 (2021): 73. http://dx.doi.org/10.2516/ogst/2021057.

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Wettability of sedimentary rock surface is an essential parameter that defines oil recovery and production rates of a reservoir. The discovery of wettability alteration in reservoirs, as well as complications that occur in analysis of heterogeneous sample, such as shale, for instance, have prompted scientists to look for the methods of wettability assessment at nanoscale. At the same time, bulk techniques, which are commonly applied, such as USBM (United States Bureau of Mines) or Amott tests, are not sensitive enough in cases with mixed wettability of rocks as they provide average wettability values of a core plug. Atomic Force Microscopy (AFM) has been identified as one of the methods that allow for measurement of adhesion forces between cantilever and sample surface in an exact location at nanoscale. These adhesion forces can be used to estimate wettability locally. Current research, however, shows that the correlation is not trivial. Moreover, adhesion force measurement via AFM has not been used extensively in studies with geological samples yet. In this study, the adhesion force values of the cantilever tip interaction with quartz inclusion on the shale sample surface, have been measured using the AFM technique. The adhesion force measured in this particular case was equal to the capillary force of water meniscus, formed between the sample surface and the cantilever tip. Experiments were conducted with a SiconG cantilever with (tip radius of 5 nm). The adhesion forces between quartz grain and cantilever tip were equal to 56.5 ± 5 nN. Assuming the surface of interaction to be half spherical, the adhesion force per area was 0.36 ± 0.03 nN/nm2. These measurements and results acquired at nano-scale will thus create a path towards much higher accuracy-wettability measurements and consequently better reservoir-scale predictions and improved underground operations.

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39

Bracker, CE, and P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.

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A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

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40

Choi, D. H., and W. Hwang. "Measurement of Frictional Forces in Atomic Force Microscopy." Solid State Phenomena 121-123 (March 2007): 851–54. http://dx.doi.org/10.4028/www.scientific.net/ssp.121-123.851.

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A new calibration method of frictional forces in atomic force microscopy (AFM) is suggested. An angle conversion factor is defined using the relationship between torsional angle and frictional signal. When the factor is measured, the slopes of the torsional angle and the frictional signal as a function of the normal force are used to eliminate the effect of the adhesive force. Moment balance equations on the flat surface and the top edge of a commercial step grating are used to obtain the angle conversion factor. After the factor is obtained from an AFM system, it can be applied to all cantilevers without additional experiments.

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41

Müller, F., A.-D. Müller, M. Hietschold, and S. Kämmer. "Detecting electrical forces in noncontact atomic force microscopy." Measurement Science and Technology 9, no. 5 (May 1, 1998): 734–38. http://dx.doi.org/10.1088/0957-0233/9/5/002.

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42

Malotky, David L., and Manoj K. Chaudhury. "Investigation of Capillary Forces Using Atomic Force Microscopy." Langmuir 17, no. 25 (December 2001): 7823–29. http://dx.doi.org/10.1021/la0107796.

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43

Lim, Roderick, Sam F. Y. Li, and Sean J. O'Shea. "Solvation Forces Using Sample-Modulation Atomic Force Microscopy." Langmuir 18, no. 16 (August 2002): 6116–24. http://dx.doi.org/10.1021/la011789+.

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44

Tivanski, Alexei V., Jason E. Bemis, Boris B. Akhremitchev, Haiying Liu, and Gilbert C. Walker. "Adhesion Forces in Conducting Probe Atomic Force Microscopy." Langmuir 19, no. 6 (March 2003): 1929–34. http://dx.doi.org/10.1021/la026555k.

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45

Ogletree, D. F., R. W. Carpick, and M. Salmeron. "Calibration of frictional forces in atomic force microscopy." Review of Scientific Instruments 67, no. 9 (September 1996): 3298–306. http://dx.doi.org/10.1063/1.1147411.

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46

Lin, F., and D. J. Meier. "Atomic-Scale Resolution in Atomic Force Microscopy." Langmuir 10, no. 6 (June 1994): 1660–62. http://dx.doi.org/10.1021/la00018a008.

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47

Glatzel, Thilo, Hendrik Hölscher, Thomas Schimmel, Mehmet Z. Baykara, Udo D. Schwarz, and Ricardo Garcia. "Advanced atomic force microscopy techniques." Beilstein Journal of Nanotechnology 3 (December 21, 2012): 893–94. http://dx.doi.org/10.3762/bjnano.3.99.

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48

Baykara, Mehmet Z., and Udo D. Schwarz. "Noncontact atomic force microscopy II." Beilstein Journal of Nanotechnology 5 (March 12, 2014): 289–90. http://dx.doi.org/10.3762/bjnano.5.31.

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49

Baykara, Mehmet Z., and Udo D. Schwarz. "Noncontact atomic force microscopy III." Beilstein Journal of Nanotechnology 7 (June 30, 2016): 946–47. http://dx.doi.org/10.3762/bjnano.7.86.

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50

Oinonen, Niko, Chen Xu, Benjamin Alldritt, Filippo Federici Canova, Fedor Urtev, Shuning Cai, Ondřej Krejčí, Juho Kannala, Peter Liljeroth, and Adam S. Foster. "Electrostatic Discovery Atomic Force Microscopy." ACS Nano 16, no. 1 (November 22, 2021): 89–97. http://dx.doi.org/10.1021/acsnano.1c06840.

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