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Books on the topic 'Atomic Force Microscopy imaging'

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Author: Grafiati
Published: 10 December 2022
Last updated: 28 January 2023

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1

Braga, Pier Carlo, and Davide Ricci. Atomic Force Microscopy. New Jersey: Humana Press, 2003. http://dx.doi.org/10.1385/1592596479.

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2

Paul, West, ed. Atomic force microscopy. Oxford: Oxford University Press, 2010.

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3

Ahmed, Touhami. Atomic Force Microscopy. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-031-02385-9.

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4

Santos, Nuno C., and Filomena A. Carvalho, eds. Atomic Force Microscopy. New York, NY: Springer New York, 2019. http://dx.doi.org/10.1007/978-1-4939-8894-5.

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5

Haugstad, Greg. Atomic Force Microscopy. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118360668.

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6

Voigtländer, Bert. Atomic Force Microscopy. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-13654-3.

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7

Lanza, Mario, ed. Conductive Atomic Force Microscopy. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2017. http://dx.doi.org/10.1002/9783527699773.

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8

Morita, S., R. Wiesendanger, and E. Meyer, eds. Noncontact Atomic Force Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-642-56019-4.

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9

Morita, Seizo, Franz J. Giessibl, Ernst Meyer, and Roland Wiesendanger, eds. Noncontact Atomic Force Microscopy. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3.

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10

Morita, Seizo, Franz J. Giessibl, and Roland Wiesendanger, eds. Noncontact Atomic Force Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-01495-6.

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11

Morita, S. Noncontact Atomic Force Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002.

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12

Cohen, Samuel H., Mona T. Bray, and Marcia L. Lightbody, eds. Atomic Force Microscopy/Scanning Tunneling Microscopy. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-9322-2.

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13

H, Cohen Samuel, Bray Mona T, Lightbody Marcia L, and U.S. Army Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium (1st : 1993 : Natick, Mass.), eds. Atomic force microscopy/scanning tunneling microscopy. New York: Plenum Press, 1994.

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14

H, Cohen Samuel, Lightbody Marcia L, and U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium (2nd : 1994 : Natick, Mass.), eds. Atomic force microscopy/scanning tunneling microscopy 2. New York: Plenum Press, 1997.

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15

Cohen, Samuel H., and Marcia L. Lightbody, eds. Atomic Force Microscopy/Scanning Tunneling Microscopy 2. Boston, MA: Springer US, 1997. http://dx.doi.org/10.1007/978-1-4757-9325-3.

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16

Cohen, Samuel H., and Marcia L. Lightbody, eds. Atomic Force Microscopy/Scanning Tunneling Microscopy 3. Boston, MA: Springer US, 2002. http://dx.doi.org/10.1007/b118422.

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17

H, Cohen Samuel, Lightbody Marcia L, Foundation for Advances in Medicine and Science., and Symposium on Atomic Force/Scanning Tunneling Microscopy (3rd : 1998 : Baltimore, Md.), eds. Atomic force microscopy/scanning tunneling microscopy 3. New York: Kluwer Academic/Plenum Publishers, 1999.

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18

García, Ricardo. Amplitude Modulation Atomic Force Microscopy. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2010. http://dx.doi.org/10.1002/9783527632183.

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19

Xie, Hui, Cagdas Onal, Stéphane Régnier, and Metin Sitti. Atomic Force Microscopy Based Nanorobotics. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-20329-9.

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20

Baró, Arturo M., and Ronald G. Reifenberger, eds. Atomic Force Microscopy in Liquid. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527649808.

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21

R, Kirby A., and Gunning A. P, eds. Atomic force microscopy for biologists. 2nd ed. London: Imperial College Press, 2010.

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22

García, Ricardo Castro. Amplitude modulation atomic force microscopy. Weinheim: Wiley-VCH, 2010.

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23

Molecular manipulation with atomic force microscopy. Boca Raton: CRC Press, 2011.

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24

Shen, Cai. Atomic Force Microscopy for Energy Research. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003174042.

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25

Celano, Umberto, ed. Electrical Atomic Force Microscopy for Nanoelectronics. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-15612-1.

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26

Braga, Pier Carlo, and Davide Ricci, eds. Atomic Force Microscopy in Biomedical Research. Totowa, NJ: Humana Press, 2011. http://dx.doi.org/10.1007/978-1-61779-105-5.

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27

Veis, Martin. Atomic Force Microscopy in Optical Imaging and Characterization. INTECH Open Access Publisher, 2012.

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28

Bellitto, Victor, ed. Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale. InTech, 2012. http://dx.doi.org/10.5772/2673.

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29

Ikai, Atsushi. World of Nano-Biomechanics: Mechanical Imaging and Measurement by Atomic Force Microscopy. Elsevier Science & Technology Books, 2007.

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30

Ikai, Atsushi. The World of Nano-Biomechanics: Mechanical Imaging and Measurement by Atomic Force Microscopy. Elsevier Science, 2007.

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31

Magonov, Sergei, Natalya Yerina, and Sergey Belikov. Atomic Force Microscopy of Polymers: From High-Resolution Imaging to Probing Local Mechanical Properties. Wiley & Sons, Incorporated, John, 2016.

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32

Dror, Sarid. Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces. Oxford Series in Optical and Imaging Sciences. Oxford University Press, 1994.

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33

Chen, C. Julian. Introduction to Scanning Tunneling Microscopy. 3rd ed. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198856559.001.0001.

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Abstract:
The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it enables non-destructive observing and mapping atoms and molecules on solid surfaces down to a picometer resolution. A recent development is the non-destructive observation of wavefunctions in individual atoms and molecules, including nodal structures inside the wavefunctions. STM and AFM have become indespensible instruments for scientists of various disciplines, including physicists, chemists, engineers, and biologists to visualize and utilize the microscopic world around us. Since the publication of the first edition in 1993, this book has been recognized as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field. After an Overview chapter accessible for newcomers at an entry level presenting the basic design, scientific background, and illustrative applications, the book has three Parts. Part I, Principles, provides the most systematic and detailed theory of its scientific bases from basic quantum mechancis and condensed-metter physics in all available literature. Quantitative analysis of its imaging mechanism for atoms, molecules, and wavefunctions is detailed. Part II, Instrumentation, provides down to earth descriptions of its building components, including piezoelectric scanners, vibration isolation, electronics, software, probe tip preparation, etc. Part III, Related methods, presenting two of its most important siblings, scanning tunnelling specgroscopy and atomic force miscsoscopy. The book has five appendices for background topics, and 405 references for further readings.
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34

Sanders, Wesley C. Atomic Force Microscopy. CRC Press, 2019. http://dx.doi.org/10.1201/9780429266553.

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35

Atomic Force Microscopy. Taylor & Francis Group, 2019.

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36

Paul, West. Atomic Force Microscopy. Oxford University Press, 2018.

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37

Haugstad, Greg. Atomic Force Microscopy. Wiley & Sons, Incorporated, John, 2012.

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38

Paul, West. Atomic Force Microscopy. Oxford University Press, 2010.

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39

Voigtländer, Bert. Atomic Force Microscopy. Springer International Publishing AG, 2020.

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40

Sanders, Wesley C. Atomic Force Microscopy. Taylor & Francis Group, 2019.

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41

Vance, Armand. Atomic Force Microscopy. Scitus Academics LLC, 2016.

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42

Voigtländer, Bert. Atomic Force Microscopy. Springer, 2019.

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43

Noncontact Atomic Force Microscopy. Springer, 2002.

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44

Noncontact Atomic Force Microscopy. Springer, 2009.

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45

Noncontact Atomic Force Microscopy. Springer, 2012.

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46

Wiesendanger, Roland, E. Meyer, and S. Morita. Noncontact Atomic Force Microscopy. Springer, 2012.

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47

(Editor), M. T. Bray, Samuel H. Cohen (Editor), and Marcia L. Lightbody (Editor), eds. Atomic Force Microscopy/Scanning Tunneling Microscopy. Springer, 1995.

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48

Cohen, Samuel H., Marcia L. Lightbody, and M. T. Bray. Atomic Force Microscopy/Scanning Tunneling Microscopy. Springer, 2013.

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49

Cohen, Samuel H., Marcia L. Lightbody, and M. T. Bray. Atomic Force Microscopy/Scanning Tunneling Microscopy. Springer, 2013.

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50

Cohen, Samuel H., and Marcia L. Lightbody. Atomic Force Microscopy/Scanning Tunneling Microscopy 3. Springer, 2013.

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