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Relevant bibliographies by topics / Atomic Force Microscopy imaging

Academic literature on the topic 'Atomic Force Microscopy imaging'

Author: Grafiati

Published: 10 December 2022

Last updated: 28 January 2023

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Journal articles on the topic "Atomic Force Microscopy imaging"

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Patel, Anisha N., and Christine Kranz. "(Multi)functional Atomic Force Microscopy Imaging." Annual Review of Analytical Chemistry 11, no. 1 (June 12, 2018): 329–50. http://dx.doi.org/10.1146/annurev-anchem-061417-125716.

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Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial processes. While this review presents a brief introduction to advanced AFM imaging modes, such as multiparametric AFM and topography recognition imaging, the main focus herein is on electrochemical imaging via hybrid AFM-scanning electrochemical microscopy. Recent applications and the challenges associated with such nanoelectrochemical imaging strategies are presented.

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Schwartz, Gustavo Ariel, and Jaume Navarro. "Imaging by touching: Atomic force microscopy." Philosophy of Photography 9, no. 1 (April 1, 2018): 41–52. http://dx.doi.org/10.1386/pop.9.1.41_7.

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Curtin Carter, Margaret M. "Imaging fibers by atomic force microscopy." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 14, no. 3 (May 1996): 1867. http://dx.doi.org/10.1116/1.588569.

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Müller, Daniel J., and Kurt Anderson. "Biomolecular imaging using atomic force microscopy." Trends in Biotechnology 20, no. 8 (August 2002): S45—S49. http://dx.doi.org/10.1016/s0167-7799(02)02000-0.

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Ghosal, Sayan, and Murti Salapaka. "Fidelity imaging for atomic force microscopy." Applied Physics Letters 106, no. 1 (January 5, 2015): 013113. http://dx.doi.org/10.1063/1.4905633.

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Siperko, L. M., and W. J. Landis. "Atomic force microscopy imaging of hydroxyapatite." Journal of Materials Science Letters 12, no. 14 (1993): 1068–69. http://dx.doi.org/10.1007/bf00420523.

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Kirby, Andrew R., A. Patrick Gunning, and Victor J. Morris. "Imaging polysaccharides by atomic force microscopy." Biopolymers 38, no. 3 (December 6, 1998): 355–66. http://dx.doi.org/10.1002/(sici)1097-0282(199603)38:3<355::aid-bip8>3.0.co;2-t.

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Magonov, Sergei. "Phase Contrast Imaging in Atomic Force Microscopy." Microscopy and Microanalysis 3, S2 (August 1997): 1275–76. http://dx.doi.org/10.1017/s143192760001326x.

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Phase detection in TappingMode™ enhances capabilities of Atomic Force Microscopy (AFM) for soft samples (polymers and biological materials). Changes of amplitude and phase changes of a fast oscillating probe are caused by tip-sample force interactions. Height images reflect the amplitude changes, and in most cases they present a sample topography. Phase images show local differences between phases of free-oscillating probe and of probe interacting with a sample surface. These differences are related to the change of the resonance frequency of the probe either by attractive or repulsive tip-sample forces. Therefore phase detection helps to choose attractive or repulsive force regime for surface imaging and to minimize tip-sample force. For heterogeneous materials the phase imaging allows to distinguish individual components and to visualize their distribution due to differences in phase contrast. This is typically achieved in moderate tapping, when set-point amplitude, Asp, is about half of the amplitude of free-oscillating cantilever, Ao. In contrast, light tapping with Asp close to Ao is best suited for recording a true topography of the topmost surface layer of soft samples. Examples of phase imaging of polymers obtained with a scanning probe microscope Nanoscope® IIIa (Digital Instruments). Si probes (225 μk long, resonance frequencies 150-200 kHz) were used.

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Johnson, Lili L. "Atomic Force Microscopy (AFM) for Rubber." Rubber Chemistry and Technology 81, no. 3 (July 1, 2008): 359–83. http://dx.doi.org/10.5254/1.3548214.

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Abstract In this review, first, the development of atomic force microscopy as an imaging technique, as a surface force apparatus, and as a nanoindenter was illustrated using experimental studies. The experimental analysis of atomic force microscopy emphasizes the empirical methods of achieving high resolution imaging through controlled forces between tip and sample interactions. Second, mapping mechanical properties on nanometer scale by atomic force microscopy is presented with both experimental investigations and selection of elastic models. Elastomer crosslink density was mapped using atomic force microscopy combined with elastic theories. The force — penetration depth investigation of crosslink density for elastomer by AFM shows linear correction with both experimental studies using Dynamic Mechanical Thermal Analysis (DMTA) and classic swelling method and calculation using statistical rubber elasticity theory. Last, the focus is on the understanding of atomic force microscopy for practical applications. Filler dispersion and blends structure are demonstrated for automotive applications. Micro phase separation was intensely studied for film industries. Morphology of composites is investigated for the applications of tire, automotive and foaming industries.

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Magonov, Sergei. "High-Resolution Imaging with Atomic Force Microscopy." Microscopy Today 12, no. 5 (September 2004): 12–15. http://dx.doi.org/10.1017/s1551929500056248.

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The invention of scanning tunneling microscopy (STM) in 1982 revolutionized surface analysis by providing atomic-scale surface imaging of conducting and semiconducting materials. Shortly after that, atomic force microscopy (AFM) was introduced as an accessory of STM for high-resolution imaging of surfaces independent of their conductivity. Mechanical force interactions between a sharp tip placed at one end of a micro fabricated cantilever and a sample surface were employed for imaging in this method. In the past decade, AFM has developed into a leading scanning probe technique applied in many fields of fundamental and industrial research. The progress of AFM has been made possible by implementation of an optical level detection scheme, which allows precise measuring of the cantilever deflection caused by the tip-sample forces, by mass microfabrication of probes consisting of cantilevers, and by developments of oscillatory imaging modes, particularly, Tapping ModeTM.

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Dissertations / Theses on the topic "Atomic Force Microscopy imaging"

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Grimble, Ralph Ashley. "Atomic force microscopy : atomic resolution imaging and force-distance spectroscopy." Thesis, University of Oxford, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.312277.

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LAU, JOAN M. "IMAGING MEMBRANE PROTEINS USING ATOMIC FORCE MICROSCOPY TECHNIQUES." University of Cincinnati / OhioLINK, 2002. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1022192720.

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Muys, James Johan. "Cellular Analysis by Atomic Force Microscopy." Thesis, University of Canterbury. Electrical and Computer Engineering, 2006. http://hdl.handle.net/10092/1158.

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Exocytosis is a fundamental cellular process where membrane-bound secretory granules from within the cell fuse with the plasma membrane to form fusion pore openings through which they expel their contents. This mechanism occurs constitutively in all eukaryotic cells and is responsible for the regulation of numerous bodily functions. Despite intensive study on exocytosis the fusion pore is poorly understood. In this research micro-fabrication techniques were integrated with biology to facilitate the study of fusion pores from cells in the anterior pituitary using the atomic force microscope (AFM). In one method cells were chemically fixed to reveal a diverse range of pore morphologies, which were characterised according to generic descriptions and compared to those in literature. The various pore topographies potentially illustrates different fusion mechanisms or artifacts caused from the impact of chemicals and solvents in distorting dynamic cellular events. Studies were performed to investigate changes in fusion pores in response to stimuli along with techniques designed to image membrane topography with nanometre resolution. To circumvent some deficiencies in traditional chemical fixation methodologies, a Bioimprint replication process was designed to create molecular imprints of cells using imprinting and soft moulding techniques with photo and thermal activated elastomers. Motivation for the transfer of cellular ultrastructure was to enable the non-destructive analysis of cells using the AFM while avoiding the need for chemical fixation. Cell replicas produced accurate images of membrane topology and contained certain fusion pore types similar to those in chemically fixed cells. However, replicas were often dehydrated and overall experiments testing stimuli responses were inconclusive. In a preliminary investigation, a soft replication moulding technique using a PDMS-elastomer was tested on human endometrial cancer cells with the aim of highlighting malignant mutations. Finally, a Biochip comprised of a series of interdigitated microelectrodes was used to position single-cells within an array of cavities using positive and negative dielectrophoresis (DEP). Selective sites either between or on the electrode were exposed as cavities designed to trap and incubate pituitary and cancer cells for analysis by atomic force microscopy (AFMy). Results achieved trapping of pituitary and cancer cells within cavities and demonstrated that positive DEP could be used as a force to effectively position living cells. AFM images of replicas created from cells trapped within cavities illustrated the advantage of integrating the Biochip with Bioimprint for cellular analysis.

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Jeong, Younkoo. "HIGH SPEED ATOMIC FORCE MICROSCOPY." The Ohio State University, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=osu1236701109.

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Alkassem, Hasan. "Imaging antimicrobial peptides in action by atomic force microscopy." Thesis, University College London (University of London), 2018. http://discovery.ucl.ac.uk/10043141/.

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Antimicrobial resistance is a challenge facing the world in the twenty-first century with an estimated 10 million deaths by 2050 if no actions are taken. Microbial resistance to drugs is a natural consequence when bacteria develop and adapt genetically to face new challenges including antibiotics. Currently, this development occurs at a higher rate than drug discovery. Hence there is a need for a new generation of antibiotics that kill pathogenic bacteria. Nature itself provides inspiration for such new antibiotics. For example, our immune system secretes antimicrobial peptides (AMPs), which have been successful agents in killing pathogens with no reported bacterial resistance. Compared with conventional antibiotics, these peptides are larger and more sophisticated biological molecules, which disturb the bacterial membrane, leading to cell lysis. It is currently costly to extract AMPs from natural resources to be used for fighting infections. Alternatively, synthetic AMPs that mimic natural ones could provide a sustainable cheap weapon against such thread. This also provides a unique opportunity to understand the structure–function relationships of such molecules to optimise these effective, non-toxic antimicrobial properties. Our collaborators at National Physical Laboratory have designed and synthesised new AMPs from their essential building blocks (amino acids). This thesis describes the use of atomic force microscopy (AFM) as a nanoscale imaging technique for characterising and imaging membrane poration mechanisms of four new AMP systems. Two of these systems are helical peptides, explained in chapter 3. The third system, explained chapter 4, is a triskelion with three arms of antimicrobial β-sheet peptide that co-assemble to form a hollow antimicrobial capsules. The latter has two possible functions: gene delivery and bactericidal effects. The fourth system, explained in chapter 5, contains two peptide monomers that are designed to co-assemble and form antimicrobial hollow capsids, inspired by the natural viral capsids. Finally, chapter 6 is a plan for taking these AMPs a step closer to commercialisation, including a business plan for one potential application.

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Hernandez, Sergio Santos. "Dynamic atomic force microscopy and applications in biomolecular imaging." Thesis, University of Leeds, 2011. http://etheses.whiterose.ac.uk/1910/.

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The Atomic Force Microscope (AFM) is a key member of the Scanning Probe Microscope (SPM) family. Its versatility allows it to image and manipulate nanoscale features with high precision, making it one of the main instruments in nanotechnology for surface characterization. The aim of this thesis is to improve robustness, reproducibility, resolution and data interpretation in ambient conditions for dynamic AFM of heterogeneous samples. The AFM is particularly notorious for lack of reproducibility with apparent height and width being the two main measured parameters where accuracy is sought. Here i) the origins of reproducibility, or lack thereof, have been investigated experimentally via a systematic approach to imaging for the whole range of parameter space and relative humidity, ii) smooth and step-like transitions have been investigated both experimentally and with simulations, iii) a method to mechanically stabilise the tip radius and calculate the effective area of interaction in the dynamic mode has been developed and used to predict the number of eV dissipated per atom per cycle, iv) a method to predict the tip radius in situ has been developed, v) three types of dynamic behaviour have been categorised and distinguished (Type I, II and III) allowing to both predict the tip radius and noise patterns, vi) a general interpretation of a mechanism behind height reconstruction and vii) a novel high resolution and low wear imaging technique (SASS) have been developed, modelled, implemented and interpreted with the help of simulations. The most general outcome of this work is that the tip radius has to be well characterised since it plays a major role in any AFM experiment. The investigation is general for nano-mechanical forced oscillators in ambient conditions and the calculations will lead to mapping of local chemistry and mechanics at higher resolution.

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Forchheimer, Daniel. "Imaging materials with intermodulation : Studies in multifrequency atomic force microscopy." Doctoral thesis, KTH, Nanostrukturfysik, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-159689.

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The Atomic Force Microscope (AFM) is a tool for imaging surfaces at the microand nano meter scale. The microscope senses the force acting between a surfaceand a tip positioned at the end of a micro-cantilever, forming an image of the surface topography. Image contrast however, arises not only from surface topography, but also from variation in material composition. Improved material contrast, and improved interpretation of that contrast are two issues central to the further development of AFM. This thesis studies dynamic AFM where the cantilever is driven at multiple frequencies simultaneously. Due to the nonlinear dependence of the tip-surface force on the tip’s position, the cantilever will oscillate not only at the driven frequencies, but also at harmonics and at mixing frequencies of the drives, so-called intermodulation products. A mode of AFM called Intermodulation AFM (ImAFM) is primarily studied, which aims to make use of intermodulation products centered around the resonance frequency of the cantilever. With proper excitation many intermodulation products are generated near resonance where they can be measured with large signal-to-noise ratio. ImAFM is performed on samples containing two distinct domains of different material composition and a contrast metric is introduced to quantitatively evaluate images obtained at each response frequency. Although force sensitivity is highest on resonance, we found that weak intermodulation response off resonance can show larger material contrast. This result shows that the intermodulation images can be used to improve discrimination of materials. We develop a method to obtain material parameters from multifrequency AFM spectra by fitting a tip-surface force model. Together with ImAFM, this method allows high resolution imaging of material parameters. The method is very generalas it is not limited to a specific force model or particular mode of multifrequency AFM. Several models are discussed and applied to different samples. The parameter images have a direct physical interpretation and, if the model is appropriate, they can be used to relate the measurement to material properties such as the Young’s modulus. Force reconstruction is tested with simulations and on measured data. We use the reconstructed force to define the location of the surface so that we can address the issue of separating topographic contrast and material contrast.
Svepkraftmikroskop (eller atomkraftmikroskop från engelskans atomic forcemicroscope, AFM) är ett instrument för att avbilda ytor på mikro- och nanometer skalan. Mikroskopet känner av kraften som verkar mellan en yta och en spetsplacerad längst ut på ett mikrometerstort fjäderblad och kan därigenom skapa en topografisk bild av ytans form. Bildkontrast uppstår dock inte bara från ytans form utan även från variation i material. Förbättrad materialkontrast och förbättrad tolkning av denna kontrast är två centrala mål i vidareutvecklingen av AFM. Denna avhandling berör dynamisk AFM där fjädern drivs med flera frekvensersamtidigt. På grund av det ickelinjära förhållandet i yt-spets-kraften som funktion av spetsens position så kommer fjädern inte bara att svänga på de drivna frekvenserna utan också på övertoner och blandfrekvenser, så kallade intermodulationsprodukter. Vi undersöker primärt Intermodulation AFM (ImAFM) som ämnar att utnyttja intermodulationsprodukter nära fjäderns resonansfrekvens. Med en lämplig drivsignal genereras många intermodulationsprodukter nära resonansen, där de kan mätas med bra signal till brus förhållande. ImAFM utförs på ytor bestående av två distinkta domäner av olika material ochen kontrastmetrik introduceras för att kvantitativt utvärdera bilderna som skapas vid varje frekvens. Trots att känsligheten för kraftmätningen är högst på resonans-frekvensen, så fann vi att svaga intermodulationsprodukter bortanför resonansen kan visa hög materialkontrast. Detta resultat visar att intermodulationsbilderna kan användas för att bättre särskilja olika material. Vi har utvecklat en metod för att rekonstruera yt-spets-kraften från multifrekventa AFM spektra genom modellanpassning i frekvensrymden. Tillsammans med ImAFM leder detta till högupplösta bilder av materialparametrar. Metoden är generell och är applicerbar för olika kraftmodeller och AFM-varianter. Parametrarna har en direkt fysikalisk tolkning och, om lämpliga modeller används, kan egenskaper så som materialets elasticitetsmodul mätas. Metoden har testats på simulerat såvälsom experimentellt data, och den har också används för att särskilja topografisk kontrast från materialkontrast.

QC 20150209

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Burns, Jonathan. "High resolution atomic force microscopy imaging of living bacterial surfaces." Thesis, University of Sheffield, 2017. http://etheses.whiterose.ac.uk/19929/.

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Khan, Z. "Imaging biomolecules using frequency modulation atomic force microscopy in liquids." Thesis, University College London (University of London), 2013. http://discovery.ucl.ac.uk/1399519/.

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Atomic force microscopy is an advanced imaging technique for viewing biological structures and dynamic biological mechanisms at the nanometre scale. This thesis describes a high-resolution atomic force microscope designed for imaging biological samples in physiological solution. This microscope includes a highly sensitive interferometric cantilever detector, along with a home-built frequency/phase and amplitude detector. The initial chapters of this thesis begin with a description of the experimental set-up, as well as various tests carried out to characterise the fast frequency detector. Following this is a description of the interferometric cantilever detector, which possess a noise floor at a mere 5 fm/√Hz, making it particularly suited for detecting cantilevers in liquids. Results chapters then go on to demonstrate the capability of this instrument to image at nanometre and atomic-scale resolution. Images of the atomic structure of muscovite mica in buffer solution are presented. Images of chaperonin protein GroEL were also acquired, which contain features of the protein's apical domain. Most importantly, for the first time AFM was used to track the pore-formation of pore forming protein pneumolysin in buffer solution. Supported lipid bilayers were prepared and images were captured of the proteins oligomerising on their surface. The initial stage of pore-formation was investigated by comparing the height of pneumolysin before and after pores were formed. Details of the monomers making up the structure of the protein were also imaged, as well as pores created within the supported lipid bilayers.

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Tien, Szu-Chi. "High-speed nano-precision positioning : theory and application to AFM imaging of soft samples /." Thesis, Connect to this title online; UW restricted, 2007. http://hdl.handle.net/1773/7089.

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Books on the topic "Atomic Force Microscopy imaging"

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Braga, Pier Carlo, and Davide Ricci. Atomic Force Microscopy. New Jersey: Humana Press, 2003. http://dx.doi.org/10.1385/1592596479.

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Paul, West, ed. Atomic force microscopy. Oxford: Oxford University Press, 2010.

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Ahmed, Touhami. Atomic Force Microscopy. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-031-02385-9.

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Santos, Nuno C., and Filomena A. Carvalho, eds. Atomic Force Microscopy. New York, NY: Springer New York, 2019. http://dx.doi.org/10.1007/978-1-4939-8894-5.

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Haugstad, Greg. Atomic Force Microscopy. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118360668.

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Voigtländer, Bert. Atomic Force Microscopy. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-13654-3.

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Lanza, Mario, ed. Conductive Atomic Force Microscopy. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2017. http://dx.doi.org/10.1002/9783527699773.

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Morita, S., R. Wiesendanger, and E. Meyer, eds. Noncontact Atomic Force Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-642-56019-4.

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Morita, Seizo, Franz J. Giessibl, Ernst Meyer, and Roland Wiesendanger, eds. Noncontact Atomic Force Microscopy. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3.

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Morita, Seizo, Franz J. Giessibl, and Roland Wiesendanger, eds. Noncontact Atomic Force Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-01495-6.

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Book chapters on the topic "Atomic Force Microscopy imaging"

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Lopes, Catarina S., Filomena A. Carvalho, and Nuno C. Santos. "Atomic force microscopy." In Fluorescence Imaging and Biological Quantification, 49–64. Boca Raton : Taylor & Francis, 2017.: CRC Press, 2017. http://dx.doi.org/10.1201/9781315121017-4.

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Rabe, U., and W. Arnold. "Acoustic Microscopy by Atomic Force Microscopy." In Acoustical Imaging, 585–92. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-1943-0_64.

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Gewirth, Andrew A., and John R. LaGraff. "Atomic Force Microscopy." In The Handbook of Surface Imaging and Visualization, 23–31. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9780367811815-2.

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Reichling, Michael, and Clemens Barth. "Atomic Resolution Imaging on Fluorides." In Noncontact Atomic Force Microscopy, 109–23. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-642-56019-4_6.

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Sugawara, Yasuhiro. "NC-AFM Imaging of Adsorbed Molecules." In Noncontact Atomic Force Microscopy, 183–92. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-642-56019-4_11.

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Hosoi, Hirotaka, Kazuhisa Sueoka, Kazunobu Hayakawa, and Koichi Mukasa. "Atomically Resolved Imaging of a NiO(001) Surface." In Noncontact Atomic Force Microscopy, 125–34. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-642-56019-4_7.

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Gao, David Z., Alexander Schwarz, and Alexander L. Shluger. "Imaging Molecules on Bulk Insulators Using Metallic Tips." In Noncontact Atomic Force Microscopy, 355–78. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3_17.

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Raina, G., R. W. Gauldie, S. K. Sharma, and C. E. Helsley. "Atomic Scale Imaging of Minerals with the Atomic Force Microscope." In Atomic Force Microscopy/Scanning Tunneling Microscopy, 195–201. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-9322-2_20.

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Yamanaka, Kazushi, and Toshihiro Tsuji. "Ultrasonic Atomic Force Microscopy." In Advances in Acoustic Microscopy and High Resolution Imaging, 307–37. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2013. http://dx.doi.org/10.1002/9783527655304.ch12.

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Kopycinska-Müller, M., M. Reinstädtler, U. Rabe, A. Caron, S. Hirsekorn, and W. Arnold. "Ultrasonic Modes in Atomic Force Microscopy." In Acoustical Imaging, 699–706. Dordrecht: Springer Netherlands, 2004. http://dx.doi.org/10.1007/978-1-4020-2402-3_89.

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Conference papers on the topic "Atomic Force Microscopy imaging"

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Cheng, Hung-Ming, and George T. C. Chiu. "Adaptive sampling for atomic force microscopy." In Electronic Imaging 2006, edited by Charles A. Bouman, Eric L. Miller, and Ilya Pollak. SPIE, 2006. http://dx.doi.org/10.1117/12.660280.

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Stoimenov, Peter K., Savka I. Stoeva, B. L. V. Prasad, Christopher M. Sorensen, and Kenneth J. Klabunde. "Nanocrystal superlattice imaging by atomic force microscopy." In Optical Science and Technology, the SPIE 49th Annual Meeting, edited by Gregory V. Hartland and Xiao-Yang Zhu. SPIE, 2004. http://dx.doi.org/10.1117/12.558429.

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Neubauer, G., M. L. A. Dass, and T. J. Johnson. "Imaging VLSI cross sections by atomic force microscopy." In 30th Annual Proceedings Reliability Physics 1992. IEEE, 1992. http://dx.doi.org/10.1109/relphy.1992.187660.

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Sun, Baishun, Chenchen Xie, Kaige Qu, Liang Cao, Jin Yan, Ying Wang, Liguo Tian, Wenxiao Zhang, and Zuobin Wang. "Tapping atomic force microscopy imaging at phase resonance." In 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO). IEEE, 2021. http://dx.doi.org/10.1109/3m-nano49087.2021.9599767.

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Soussen, Charles, David Brie, Fabien Gaboriaud, and Cyril Kessler. "Modeling of force-volume images in atomic force microscopy." In 2008 IEEE International Symposium on Biomedical Imaging: From Macro to Nano (ISBI '08). IEEE, 2008. http://dx.doi.org/10.1109/isbi.2008.4541319.

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Pishkenari, Hossein Nejat, and Ali Meghdari. "The Atomic-Scale Hysteresis in Non Contact Atomic Force Microscopy." In ASME 2010 10th Biennial Conference on Engineering Systems Design and Analysis. ASMEDC, 2010. http://dx.doi.org/10.1115/esda2010-24683.

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In this research, the hysteresis in the tip-sample interaction force in noncontact force microscopy (NC-AFM) is measured with the aid of atomistic dynamics simulations. The observed hystersis in the interaction force and displacement of the system atoms leads to the loss of energy during imaging of the sample surface. Using molecular dynamics simulations it is shown that the mechanism of the energy dissipation occurs due to bistabilities caused by atomic jumps of the surface and tip atoms in the contact region. The conducted simulations demonstrate that when a gold coated nano probe is brought close to the Au (001) surface, the tip apex atom jumps to the surface; and instantaneously, four surface atoms jump away from the surface toward the tip apex atom. Along this line, particular attention is dedicated to the dependency of the energy loss to different parameters such as the environment temperature, the tip orientation, the surface plane direction, the system size, the distance of the closest approach and the tip oscillation frequency.

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Schmidt, Patrick, Benjamin Reichert, John Lajoie, and Sanjeevi Sivasankar. "Adaptive atomic force microscope." In Single Molecule Spectroscopy and Superresolution Imaging XIII, edited by Ingo Gregor, Rainer Erdmann, and Felix Koberling. SPIE, 2020. http://dx.doi.org/10.1117/12.2545261.

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Soussen, Charles. "Confocal fluorescence microscopy and force-volume imaging in atomic force microscopy: A signal processing perspective." In 2014 International Conference Laser Optics. IEEE, 2014. http://dx.doi.org/10.1109/lo.2014.6886463.

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Salapaka, Srinivasa M., Tathagata De, and Abu Sebastian. "New Approaches for Sample-Profile Estimation for Fast Atomic Force Microscopy." In ASME 2005 International Mechanical Engineering Congress and Exposition. ASMEDC, 2005. http://dx.doi.org/10.1115/imece2005-80511.

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Abstract:

The Atomic Force Microscope (AFM) is a powerful tool for imaging and manipulating matter at the nanoscale. The sample-profile estimation problem in Atomic Force Microscopy is addressed using H∞ control. A new estimate signal for the sample profile is proposed and it is proved that this signal tracks perfectly the profile signal. i.e., the transfer function between the profile signal and the estimate signal is one. Experimental results are presented to corroborate these results.

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Huang, Lin. "Torsional Resonance Mode Imaging for High-Speed Atomic Force Microscopy." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639718.

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Reports on the topic "Atomic Force Microscopy imaging"

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Ukhanov, Alexander, Gennady Smolyakov, Fei-Hung Chu, Dmitri Tenne, Jeffrey Rack, and Kevin Malloy. DOE SBIR Phase II/IIA Final Report: Atomic Force Microscope Active Optical Probe for Single-Molecule Imaging and Time-Resolved Optical Spectroscopy. Office of Scientific and Technical Information (OSTI), August 2022. http://dx.doi.org/10.2172/1887584.

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Turner, Joseph A. Materials Characterization by Atomic Force Microscopy. Fort Belvoir, VA: Defense Technical Information Center, April 2003. http://dx.doi.org/10.21236/ada414116.

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Snyder, Shelly R., and Henry S. White. Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. Fort Belvoir, VA: Defense Technical Information Center, February 1992. http://dx.doi.org/10.21236/ada246852.

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Houston, J. E., and J. G. Fleming. Non-contact atomic-level interfacial force microscopy. Office of Scientific and Technical Information (OSTI), February 1997. http://dx.doi.org/10.2172/453500.

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Crone, Joshua C., Santiago Solares, and Peter W. Chung. Simulated Frequency and Force Modulation Atomic Force Microscopy on Soft Samples. Fort Belvoir, VA: Defense Technical Information Center, June 2007. http://dx.doi.org/10.21236/ada469876.

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Salapaka, Srinivasa M., and Petros G. Voulgaris. Fast Scanning and Fast Image Reconstruction in Atomic Force Microscopy. Fort Belvoir, VA: Defense Technical Information Center, March 2009. http://dx.doi.org/10.21236/ada495364.

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Noy, A., J. J. De Yoreo, and A. J. Malkin. Carbon Nanotube Atomic Force Microscopy for Proteomics and Biological Forensics. Office of Scientific and Technical Information (OSTI), January 2002. http://dx.doi.org/10.2172/15004647.

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Haydell, Jr, and Michael W. Direct Writing of Graphene-based Nanoelectronics via Atomic Force Microscopy. Fort Belvoir, VA: Defense Technical Information Center, May 2012. http://dx.doi.org/10.21236/ada571834.

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Hough, P., and V. Elings. Methods for Study of Biological Structure by Atomic Force Microscopy. Office of Scientific and Technical Information (OSTI), May 1998. http://dx.doi.org/10.2172/770449.

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Klabunde, Kenneth J., and Dong Park. Scanning Tunneling Microscopy/Atomic Force Microscopy for Study of Nanoscale Metal Oxide Particles (Destructive Adsorbents). Fort Belvoir, VA: Defense Technical Information Center, June 1994. http://dx.doi.org/10.21236/ada281417.

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