Relevant bibliographies by topics / Atomic Force Microscopy

Academic literature on the topic 'Atomic Force Microscopy'

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Published: 4 June 2021
Last updated: 1 August 2024

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Journal articles on the topic "Atomic Force Microscopy"

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Marti, O., B. Drake, S. Gould, and P. K. Hansma. "Atomic force microscopy and scanning tunneling microscopy with a combination atomic force microscope/scanning tunneling microscope." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 6, no. 3 (May 1988): 2089–92. http://dx.doi.org/10.1116/1.575191.

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Razumić, Andrej, Biserka Runje, Dragutin Lisjak, Davor Kolar, Amalija Horvatić Novak, Branko Štrbac, and Borislav Savković. "Atomic Force Microscopy." Tehnički glasnik 18, no. 2 (May 15, 2024): 209–14. http://dx.doi.org/10.31803/tg-20230829155921.

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The atomic force microscope (AFM) enables the measurement of sample surfaces at the nanoscale. Reference standards with calibration gratings are used for the adjustment and verification of AFM measurement devices. Thus far, there are no guidelines or guides available in the field of atomic force microscopy that analyze the influence of input parameters on the quality of measurement results, nor has the measurement uncertainty of the results been estimated. Given the complex functional relationship between input and output variables, which cannot always be explicitly expressed, one of the primary challenges is how to evaluate the measurement uncertainty of the results. The measurement uncertainty of the calibration grating step height on the AFM reference standard was evaluated using the Monte Carlo simulation method. The measurements within this study were conducted using a commercial, industrial atomic force microscope.
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NAKAJIMA, Ken, Kei SEKINE, Kaede MOGI, Makiko ITO, and Xiaobin LIANG. "Atomic Force Microscopy." Journal of the Japan Society of Colour Material 93, no. 10 (October 20, 2020): 321–28. http://dx.doi.org/10.4011/shikizai.93.321.

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Binnig, G. K. "Atomic-Force Microscopy." Physica Scripta T19A (January 1, 1987): 53–54. http://dx.doi.org/10.1088/0031-8949/1987/t19a/008.

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Slater, S. D., and K. P. Parsons. "Atomic Force Microscopy." Imaging Science Journal 45, no. 3-4 (January 1997): 269. http://dx.doi.org/10.1080/13682199.1997.11736428.

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Prater, C. B., H. J. Butt, and P. K. Hansma. "Atomic force microscopy." Nature 345, no. 6278 (June 1990): 839–40. http://dx.doi.org/10.1038/345839a0.

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Chatterjee, Snehajyoti, Shrikanth S. Gadad, and Tapas K. Kundu. "Atomic force microscopy." Resonance 15, no. 7 (July 2010): 622–42. http://dx.doi.org/10.1007/s12045-010-0047-z.

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Schwarz, Udo D. "Atomic Force Microscopy." Physics Today 64, no. 4 (April 2011): 60–61. http://dx.doi.org/10.1063/1.3580496.

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Rugar, Daniel, and Paul Hansma. "Atomic Force Microscopy." Physics Today 43, no. 10 (October 1990): 23–30. http://dx.doi.org/10.1063/1.881238.

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Meyer, E. "Atomic force microscopy." Progress in Surface Science 41, no. 1 (September 1992): 3–49. http://dx.doi.org/10.1016/0079-6816(92)90009-7.

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Dissertations / Theses on the topic "Atomic Force Microscopy"

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Payton, Oliver David. "High-speed atomic force microscopy under the microscope." Thesis, University of Bristol, 2012. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.574416.

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SINCE its invention in 1986, the atomic force microscope (AFM) has revolutionised the field of nanotechnology and nanoscience. It is a tool that has enabled research into areas of medicine, advanced materials, biology, chemistry and physics. However due to its low frame rate it is a tool that has been limited to imaging small areas using a time lapse technique. It has only been in recent years that the frame rate of the device has been increased in a tool known as high-speed AFM (HSAFM). This increased frame rate allows, for the first time, biological processes to be viewed in real time or macro sized areas to be imaged with nanoscale resolution. The research presented here concentrates on a specific type of high-speed AFM developed at the University of Bristol called contact mode HSAFM. This thesis explains how the microscope is able to function, and presents a leap in image quality due to an increased understanding of the dynamics of the system. The future of the device is also discussed. III
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Grimble, Ralph Ashley. "Atomic force microscopy : atomic resolution imaging and force-distance spectroscopy." Thesis, University of Oxford, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.312277.

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Carnally, Stewart Antoni Michael. "Carbon nanotube atomic force microscopy." Thesis, University of Nottingham, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.491631.

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This thesis concerns the manufacture of carbon nanotube atomic force microscope (NTAFM) probes and their employment in the high-resolution imaging of biological macromolecules. Attention was focused initially on synthesis of carbon nanotubes and the refinement of the growth processes to obtain nanotubes of controlled dimensions. These growth processes were subsequently used to grow nanotubes directly onto AFM tips, followed by attempts at controlling the dimensions of these directly-grown nanotubes. Individually fabricated NTAFM probes are also described, along with attempts to optimise the strength of the AFM probe-nanotube interaction through the use of various hydrophobic coatings. NTAFM probes produced by both techniques, but predominantly through individually assembled probes using hydrophobic coatings, were used to image a range of natural and synthetic nucleic acid molecules and investigate the influence of the use of a nanotube probe on the dimensions observed.
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Jeong, Younkoo. "HIGH SPEED ATOMIC FORCE MICROSCOPY." The Ohio State University, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=osu1236701109.

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Vithayaveroj, Viriya. "Atomic force microscopy for sorption studies." Diss., Available online, Georgia Institute of Technology, 2004:, 2004. http://etd.gatech.edu/theses/available/etd-09282004-121825/unrestricted/vithayaveroj%5Fviriya%5F200412%5Fphd.pdf.

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Thesis (Ph. D.)--Civil and Environmental Engineering, Georgia Institute of Technology, 2005.
Dr. Rina Tannenbaum, Committee Member ; Dr. Michael Sacks, Committee Member ; Dr. Sotira Yiacoumi, Committee Chair ; Dr. Costas Tsouris, Committee Co-Chair ; Dr. Ching-Hua Huang, Committee Member. Vita. Includes bibliographical references.
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Muys, James Johan. "Cellular Analysis by Atomic Force Microscopy." Thesis, University of Canterbury. Electrical and Computer Engineering, 2006. http://hdl.handle.net/10092/1158.

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Exocytosis is a fundamental cellular process where membrane-bound secretory granules from within the cell fuse with the plasma membrane to form fusion pore openings through which they expel their contents. This mechanism occurs constitutively in all eukaryotic cells and is responsible for the regulation of numerous bodily functions. Despite intensive study on exocytosis the fusion pore is poorly understood. In this research micro-fabrication techniques were integrated with biology to facilitate the study of fusion pores from cells in the anterior pituitary using the atomic force microscope (AFM). In one method cells were chemically fixed to reveal a diverse range of pore morphologies, which were characterised according to generic descriptions and compared to those in literature. The various pore topographies potentially illustrates different fusion mechanisms or artifacts caused from the impact of chemicals and solvents in distorting dynamic cellular events. Studies were performed to investigate changes in fusion pores in response to stimuli along with techniques designed to image membrane topography with nanometre resolution. To circumvent some deficiencies in traditional chemical fixation methodologies, a Bioimprint replication process was designed to create molecular imprints of cells using imprinting and soft moulding techniques with photo and thermal activated elastomers. Motivation for the transfer of cellular ultrastructure was to enable the non-destructive analysis of cells using the AFM while avoiding the need for chemical fixation. Cell replicas produced accurate images of membrane topology and contained certain fusion pore types similar to those in chemically fixed cells. However, replicas were often dehydrated and overall experiments testing stimuli responses were inconclusive. In a preliminary investigation, a soft replication moulding technique using a PDMS-elastomer was tested on human endometrial cancer cells with the aim of highlighting malignant mutations. Finally, a Biochip comprised of a series of interdigitated microelectrodes was used to position single-cells within an array of cavities using positive and negative dielectrophoresis (DEP). Selective sites either between or on the electrode were exposed as cavities designed to trap and incubate pituitary and cancer cells for analysis by atomic force microscopy (AFMy). Results achieved trapping of pituitary and cancer cells within cavities and demonstrated that positive DEP could be used as a force to effectively position living cells. AFM images of replicas created from cells trapped within cavities illustrated the advantage of integrating the Biochip with Bioimprint for cellular analysis.
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Konopinski, D. I. "Forensic applications of atomic force microscopy." Thesis, University College London (University of London), 2013. http://discovery.ucl.ac.uk/1402411/.

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The first project undertaken was to develop a currently non-existent forensic technique -- data recovery from damaged SIM cards. SIM cards hold data valuable to a forensic investigator within non-volatile EEPROM/flash memory arrays. This data has been proven to be able to withstand temperatures up to 500°C, surviving such scenarios as house fires or criminal evidence disposal. A successful forensically-sound sample extraction, mounting and backside processing methodology was developed to expose the underside of a microcontroller circuit's floating gate transistor tunnel oxide, allowing probing via AFM-based electrical scanning probe techniques. Scanning Kelvin probe microscopy has thus far proved capable of detecting the presence of stored charge within the floating gates beneath the thin tunnel oxide layer, to the point of generating statistical distributions reflecting the threshold voltage states of the transistors. The second project covered the novel forensic application of AFM as a complimentary technique to SEM examination of quartz grain surface textures. The analysis and interpretation of soil/sediment samples can provide indications of their provenance, and enable exclusionary comparisons to be made between samples pertinent to a forensic investigation. Multiple grains from four distinct sample sets were examined with the AFM, and various statistical figures of merit were derived. Canonical discriminant analysis was used to assess the discriminatory abilities of these statistical variables to better characterise the use of AFM results for grain classification. The final functions correctly classified 65.3% of original grouped cases, with the first 3 discriminant functions used in the analysis (Wilks' Lambda=0.336, p=0.000<0.01). This degree of discrimination shows a great deal of promise for the AFM as a quantitative corroborative technique to traditional SEM grain surface examination.
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Acosta, Mejia Juan Camilo. "Atomic force microscopy based micro/nanomanipulation." Paris 6, 2011. http://www.theses.fr/2011PA066691.

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A l’échelle nanoscopique, un problème scientifique fondamental réside dans la difficulté de manipuler de façon interactive et répétable un nano-objet. Cette difficulté est un frein majeur pour des applications comme les nanotransistors, les nanosystèmes ou les futurs NEMS (Nano Electro Mechanical System). Ces dispositifs émergents sont ainsi ralentis dans leur cadre expérimental. Cette thèse s’inscrit dans la continuité des recherches développées au sein de l’équipe de microrobotique de l'ISIR. Elle se focalise sur l'exploitation de capteurs d'effort pour la manipulation contrôlée à plusieurs doigts actifs. Le microscope à force atomique est utilisé pour ses propriétés de capteur d'effort. Dans un premier temps, un préhenseur composé de deux doigts indépendants avec mesures des forces d'interaction a été conçue. Avec ce système original, des micromanipulations en trois dimensions de microsphères ont été réalisée avec succès dans l'air, en mesurant de façon continue les efforts d'interaction. Ce système a aussi été utilisé pour saisir et déposer des nanofils afin de former des nanocroix, ces dernières étant des nanostructures émergentes pour la fabrication, par jonctions, de nanotransistors. Par la suite, des oscillateurs en quartz ont été utilisés pour la caractérisation de nanostructures, avec retour d'effort dynamique. Le comportement non-linéaire en raideur de nanohélices lors de l'élongation a été caractérisé pour la première fois sur la totalité de la plage. Enfin, des sondes en quartz de haute fréquence ont été exploitées pour augmenter la vitesse d'acquisition d'images de l'AFM. De cette manière, la tâche de manipulation et d'imagerie en parallèle sous AFM a été optimisée et de nombreuses applications sont maintenant envisagées
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Sykulska-Lawrence, Hanna Maria. "Atomic force microscopy for Martian investigations." Thesis, Imperial College London, 2008. http://hdl.handle.net/10044/1/4396.

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The Phoenix Mars Lander includes a Microscopy, Electrochemistry and Conductivity Analyser (MECA) instrument for the study of dust and regolith at the Martian arctic. The microscopy payload comprises an AFM and Optical Microscope (OM) to which samples are delivered by a robot arm. The setup allows imaging of individual dust and soil particles at a higher spatial resolution than any other in-situ instrument. A fully functioning test-bed of the flight microscopy setup within an environmental chamber to simulate Mars conditions was assembled at Imperial College, enabling characterization of the microscopes. Samples are collected on small disks rotated to the vertical position for imaging, with each substrate surface promoting different adhesion mechanisms. The vertical mounting necessitates good adhesion of particles to substrates. Moreover, to achieve safe operation and good AFM scans, a sparse field of particles is required. This work investigates models and experimental setups which consider the adhesion mechanisms of particles, including under Mars conditions. These models incorporate the forces from the AFM cantilever during scanning, particle-substrate adhesion and particle-tip adhesion. The solution offered to the problem of unstable particles is substrates with engineered features, micromachined in silicon, to trap and stabilise particles for AFM and reduce the loading of the sample to a suitable level. Various designs were investigated in a series of tests, and a final design was created for a substrate for AFM during the mission. The substrates were fabricated and incorporated on the sample wheel on Phoenix, now on Mars. The MECA results are discussed, focusing in particular on the characterization, calibration and cataloguing of samples using the Imperial College testbed. The best ways of obtaining data from the setup were investigated. These strategies were used during the Phoenix mission. Finally, the extant microscopy data acquired during surface operations are presented and the overall operations procedures discussed.
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Anderson, Evan V. "Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis." Digital WPI, 2012. https://digitalcommons.wpi.edu/etd-theses/337.

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This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.
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Books on the topic "Atomic Force Microscopy"

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Braga, Pier Carlo, and Davide Ricci. Atomic Force Microscopy. New Jersey: Humana Press, 2003. http://dx.doi.org/10.1385/1592596479.

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Ahmed, Touhami. Atomic Force Microscopy. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-031-02385-9.

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Santos, Nuno C., and Filomena A. Carvalho, eds. Atomic Force Microscopy. New York, NY: Springer New York, 2019. http://dx.doi.org/10.1007/978-1-4939-8894-5.

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Haugstad, Greg. Atomic Force Microscopy. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118360668.

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Voigtländer, Bert. Atomic Force Microscopy. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-13654-3.

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Paul, West, ed. Atomic force microscopy. Oxford: Oxford University Press, 2010.

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J, Drelich, and Mittal K. L. 1945-, eds. Atomic force microscopy in adhesion studies. Utrecht: VSP, 2005.

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García, Ricardo Castro. Amplitude modulation atomic force microscopy. Weinheim: Wiley-VCH, 2010.

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Lanza, Mario, ed. Conductive Atomic Force Microscopy. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2017. http://dx.doi.org/10.1002/9783527699773.

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Morita, S., R. Wiesendanger, and E. Meyer, eds. Noncontact Atomic Force Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-642-56019-4.

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Book chapters on the topic "Atomic Force Microscopy"

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Marinello, Francesco. "Atomic Force Microscopy." In CIRP Encyclopedia of Production Engineering, 1–5. Berlin, Heidelberg: Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-642-35950-7_6577-3.

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Marinello, Francesco. "Atomic Force Microscopy." In CIRP Encyclopedia of Production Engineering, 93–96. Berlin, Heidelberg: Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-662-53120-4_6577.

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Sugawara, Yasuhiro. "Atomic Force Microscopy." In Roadmap of Scanning Probe Microscopy, 15–21. Berlin, Heidelberg: Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-34315-8_3.

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Marinello, Francesco. "Atomic Force Microscopy." In CIRP Encyclopedia of Production Engineering, 62–66. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-20617-7_6577.

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Aliano, Antonio, Giancarlo Cicero, Hossein Nili, Nicolas G. Green, Pablo García-Sánchez, Antonio Ramos, Andreas Lenshof, et al. "Atomic Force Microscopy." In Encyclopedia of Nanotechnology, 146–60. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_31.

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Cubillas, Pablo, and Michael W. Anderson. "Atomic Force Microscopy." In Multi Length-Scale Characterisation, 121–93. Chichester, UK: John Wiley & Sons, Ltd, 2013. http://dx.doi.org/10.1002/9781118683972.ch3.

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Alguel, Yilmaz, and Thomas G. M. Schalkhammer. "Atomic Force Microscopy." In Analytical Biotechnology, 279–99. Basel: Birkhäuser Basel, 2002. http://dx.doi.org/10.1007/978-3-0348-8101-2_8.

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Nordlund, Thomas M., and Peter M. Hoffmann. "Atomic Force Microscopy." In Quantitative Understanding of Biosystems, 579–602. Second edition. | Boca Raton : CRC Press, Taylor & Francis: CRC Press, 2019. http://dx.doi.org/10.1201/b22104-19.

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Lopes, Catarina S., Filomena A. Carvalho, and Nuno C. Santos. "Atomic force microscopy." In Fluorescence Imaging and Biological Quantification, 49–64. Boca Raton : Taylor & Francis, 2017.: CRC Press, 2017. http://dx.doi.org/10.1201/9781315121017-4.

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Dufrêne, Yves F. "Atomic Force Microscopy." In Methods for General and Molecular Microbiology, 96–107. Washington, DC, USA: ASM Press, 2014. http://dx.doi.org/10.1128/9781555817497.ch6.

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Conference papers on the topic "Atomic Force Microscopy"

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Dongdong Zhang and Xiaoping Qian. "Scanning in atomic force microscopy." In 2009 IEEE International Conference on Robotics and Automation (ICRA). IEEE, 2009. http://dx.doi.org/10.1109/robot.2009.5152555.

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Mahmoodi, S. Nima, Amin Salehi-Khojin, and Mehdi Ahmadian. "Nonlinear Force Analysis of Atomic Force Microscopy." In ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2011. http://dx.doi.org/10.1115/detc2011-48482.

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The objective of this work is to highlight and discuss some critical conditions in which the imprecision of atomic force microscopy (AFM) system will be intensified. To precisely address these issues, we developed a complete close form solution for a non-linear motion of AFM system subjected to non-linear contact and van der Waals forces. Galerkin method and multiple time scale approach are used to solve the governing non-linear differential equation of the AFM system. A nonlinear frequency-response equation is then obtained as a function of displacement excitation, resonance frequency and associated response amplitude. By simulation of the AFM response under different tip-sample interaction force and distance, it is shown that jump phenomenon takes place due to the non-linear motion of microcantilever at certain operating frequencies. This case can be avoided via operating the AFM in a right frequency region; however the error associated with it must be compensated by a post-processing of collected data.
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Stark, R. W. "Force Feedback in Dynamic Atomic Force Microscopy." In ASME 2005 International Mechanical Engineering Congress and Exposition. ASMEDC, 2005. http://dx.doi.org/10.1115/imece2005-81264.

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The feedback perspective of dynamic AFM provides a powerful tool to investigate the non-linear system dynamics from a system theoretic point of view. Including the higher order dynamics of the extended cantilever beam in the model the contact resonances can be reproduced faithfully without the need to solve the partial differential equation of motion directly. The investigation of the non-linear dynamics provides valuable insight into the generation of higher harmonics in dynamic AFM. However, the light lever detection scheme is widely used in dynamic AFM. This means that — strictly speaking — the tip-deflection is not a measurable quantity: the local deflection angle is measured but not the deflection itself. Additionally, time-delays may be introduced into the system influencing the dynamic behavior. Apart from system inherent time delays, a delayed force feedback is often used in order manipulate the system’s resonance characteristics (quality factor). Such an active control of the oscillatory behavior of the cantilever used in atomic force microscopy (AFM) allows one to tune the quality factor to purpose. For experiments requiring a high force sensitivity an enhancement of the quality factor is desirable whereas in time critical experiments additional damping may be needed. In order to control the quality factor a feedback signal is used that approximates the time derivative of the system state within the bandwidth of interest.
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Sawatzki, Juergen, Carsten Wehlack, Wulff Possart, Andrea Thoene, Matthias Hannss, Ralph Schlipper, Tim Rider, P. M. Champion, and L. D. Ziegler. "Combining Atomic Force Microscopy with Polarized Raman Microscopy." In XXII INTERNATIONAL CONFERENCE ON RAMAN SPECTROSCOPY. AIP, 2010. http://dx.doi.org/10.1063/1.3482820.

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Hansma, Helen G., Robert L. Sinsheimer, Scot A. C. Gould, Albrecht L. Weisenhorn, Hermann E. Gaub, Paul K. Hansma, Robert L. Sinsheimer, and Hermann E. Gaub. "Toward Sequencing DNA With an Atomic Force Microscope." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41431.

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Pishkenari, Hossein Nejat, and Ali Meghdari. "The Atomic-Scale Hysteresis in Non Contact Atomic Force Microscopy." In ASME 2010 10th Biennial Conference on Engineering Systems Design and Analysis. ASMEDC, 2010. http://dx.doi.org/10.1115/esda2010-24683.

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In this research, the hysteresis in the tip-sample interaction force in noncontact force microscopy (NC-AFM) is measured with the aid of atomistic dynamics simulations. The observed hystersis in the interaction force and displacement of the system atoms leads to the loss of energy during imaging of the sample surface. Using molecular dynamics simulations it is shown that the mechanism of the energy dissipation occurs due to bistabilities caused by atomic jumps of the surface and tip atoms in the contact region. The conducted simulations demonstrate that when a gold coated nano probe is brought close to the Au (001) surface, the tip apex atom jumps to the surface; and instantaneously, four surface atoms jump away from the surface toward the tip apex atom. Along this line, particular attention is dedicated to the dependency of the energy loss to different parameters such as the environment temperature, the tip orientation, the surface plane direction, the system size, the distance of the closest approach and the tip oscillation frequency.
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de Pablo, Pedro. "Physical Virology with Atomic Force Microscopy." In Microscience Microscopy Congress 2021 incorporating EMAG 2021. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.mmc2021.265.

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Gupta, Surendra Kumar, and Patricia Iglesias Victoria. "Atomic Force Microscopy of Annealed Plain Carbon Steels." In ASME 2015 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2015. http://dx.doi.org/10.1115/imece2015-50972.

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Microstructure of annealed plain carbon steels is examined using optical microscopy. When the inter-lamellar spacing in pearlite is small, optical microscope at 1000X is unable to resolve the ferrite and cementite lamellae. In hyper-eutectoid steels, cementite in pearlite appears as darker phase whereas the pro-eutectoid cementite appears as a lighter phase. Atomic force microscopy (AFM) of etched steels is able to resolve ferrite and cementite lamellae in pearlite at similar magnifications. Both cementite in pearlite as well as pro-eutectoid cementite appear as raised areas (hills) in AFM images. Interlamellar spacing in pearlite increases with increasing hardenability of steel.
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Kudelka, Josef, Tomas Martinek, Milan Navratil, and Vojtech Kresalek. "Nano-steganography using atomic force microscopy." In 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO). IEEE, 2016. http://dx.doi.org/10.1109/nano.2016.7751451.

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Rabe and Arnold. "Atomic force microscopy at ultrasonic frequencies." In Proceedings of IEEE Ultrasonics Symposium ULTSYM-94. IEEE, 1994. http://dx.doi.org/10.1109/ultsym.1994.401611.

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Reports on the topic "Atomic Force Microscopy"

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Turner, Joseph A. Materials Characterization by Atomic Force Microscopy. Fort Belvoir, VA: Defense Technical Information Center, April 2003. http://dx.doi.org/10.21236/ada414116.

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Snyder, Shelly R., and Henry S. White. Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. Fort Belvoir, VA: Defense Technical Information Center, February 1992. http://dx.doi.org/10.21236/ada246852.

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Houston, J. E., and J. G. Fleming. Non-contact atomic-level interfacial force microscopy. Office of Scientific and Technical Information (OSTI), February 1997. http://dx.doi.org/10.2172/453500.

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Crone, Joshua C., Santiago Solares, and Peter W. Chung. Simulated Frequency and Force Modulation Atomic Force Microscopy on Soft Samples. Fort Belvoir, VA: Defense Technical Information Center, June 2007. http://dx.doi.org/10.21236/ada469876.

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Salapaka, Srinivasa M., and Petros G. Voulgaris. Fast Scanning and Fast Image Reconstruction in Atomic Force Microscopy. Fort Belvoir, VA: Defense Technical Information Center, March 2009. http://dx.doi.org/10.21236/ada495364.

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Noy, A., J. J. De Yoreo, and A. J. Malkin. Carbon Nanotube Atomic Force Microscopy for Proteomics and Biological Forensics. Office of Scientific and Technical Information (OSTI), January 2002. http://dx.doi.org/10.2172/15004647.

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Haydell, Jr, and Michael W. Direct Writing of Graphene-based Nanoelectronics via Atomic Force Microscopy. Fort Belvoir, VA: Defense Technical Information Center, May 2012. http://dx.doi.org/10.21236/ada571834.

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Hough, P., and V. Elings. Methods for Study of Biological Structure by Atomic Force Microscopy. Office of Scientific and Technical Information (OSTI), May 1998. http://dx.doi.org/10.2172/770449.

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Klabunde, Kenneth J., and Dong Park. Scanning Tunneling Microscopy/Atomic Force Microscopy for Study of Nanoscale Metal Oxide Particles (Destructive Adsorbents). Fort Belvoir, VA: Defense Technical Information Center, June 1994. http://dx.doi.org/10.21236/ada281417.

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Hatch, Andrew G., Ralph C. Smith, and Tathagata De. Model Development and Control Design for High Speed Atomic Force Microscopy. Fort Belvoir, VA: Defense Technical Information Center, January 2004. http://dx.doi.org/10.21236/ada444057.

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