Journal articles on the topic 'Atom Probe Tomography Characterization'
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Miller, M. K. "Atom Probe Tomography Of Interfaces." Microscopy and Microanalysis 5, S2 (August 1999): 118–19. http://dx.doi.org/10.1017/s143192760001391x.
Full textBagot, P. A., T. Li, E. Tsang, G. Smith, and M. P. Moody. "Atom Probe Tomography Characterization of Catalyst Nanoparticles." Microscopy and Microanalysis 19, S2 (August 2013): 1018–19. http://dx.doi.org/10.1017/s1431927613007083.
Full textThompson, G. B., H. L. Fraser, and M. K. Miller. "Atom Probe Tomography Characterization of Multilayer Films." Microscopy and Microanalysis 9, S02 (July 21, 2003): 574–75. http://dx.doi.org/10.1017/s1431927603442876.
Full textMiller, M. K., and E. A. Kenik. "Atom Probe Tomography: A Technique for Nanoscale Characterization." Microscopy and Microanalysis 10, no. 3 (June 2004): 336–41. http://dx.doi.org/10.1017/s1431927604040577.
Full textXiong, Xiangyuan, and Matthew Weyland. "Microstructural Characterization of an Al-Li-Mg-Cu Alloy by Correlative Electron Tomography and Atom Probe Tomography." Microscopy and Microanalysis 20, no. 4 (May 12, 2014): 1022–28. http://dx.doi.org/10.1017/s1431927614000798.
Full textAmouyal, Yaron, and Guido Schmitz. "Atom probe tomography—A cornerstone in materials characterization." MRS Bulletin 41, no. 1 (January 2016): 13–18. http://dx.doi.org/10.1557/mrs.2015.313.
Full textMiller, M. K., and E. A. Kenik. "Atom Probe Tomography: A Technique for Nanoscale Characterization." Microscopy and Microanalysis 8, S02 (August 2002): 1126–27. http://dx.doi.org/10.1017/s1431927602103709.
Full textPfeiffer, Björn, Torben Erichsen, Eike Epler, Cynthia A. Volkert, Piet Trompenaars, and Carsten Nowak. "Characterization of Nanoporous Materials with Atom Probe Tomography." Microscopy and Microanalysis 21, no. 3 (May 20, 2015): 557–63. http://dx.doi.org/10.1017/s1431927615000501.
Full textMartin, Andrew J., Ajay Kumar Kambham, and Ahmad D. Katnani. "Advantages and Challenges of 3-D Atom Probe Tomography Characterization of FinFETs." EDFA Technical Articles 19, no. 2 (May 1, 2017): 22–30. http://dx.doi.org/10.31399/asm.edfa.2017-2.p022.
Full textKelly, Thomas F., Osamu Nishikawa, J. A. Panitz, and Ty J. Prosa. "Prospects for Nanobiology with Atom-Probe Tomography." MRS Bulletin 34, no. 10 (October 2009): 744–50. http://dx.doi.org/10.1557/mrs2009.249.
Full textPfeiffer, Björn, Johannes Maier, Jonas Arlt, and Carsten Nowak. "In Situ Atom Probe Deintercalation of Lithium-Manganese-Oxide." Microscopy and Microanalysis 23, no. 2 (January 30, 2017): 314–20. http://dx.doi.org/10.1017/s1431927616012691.
Full textLa Fontaine, Alexandre, Sandra Piazolo, Patrick Trimby, Limei Yang, and Julie M. Cairney. "Laser-Assisted Atom Probe Tomography of Deformed Minerals: A Zircon Case Study." Microscopy and Microanalysis 23, no. 2 (January 30, 2017): 404–13. http://dx.doi.org/10.1017/s1431927616012745.
Full textNandasiri, M. I., N. Madaan, A. Devaraj, J. Bao, Z. Xu, T. Varga, V. Shutthanandan, and S. Thevuthasan. "Atom Probe Tomography Characterization of Engineered Oxide Multilayered Structures." Microscopy and Microanalysis 21, S3 (August 2015): 845–46. http://dx.doi.org/10.1017/s1431927615005024.
Full textLarson, D. J., P. F. Ladwig, Y. A. Chang, R. L. Martens, R. M. Ulfig, and T. F. Kelly. "Nanoscale Characterization of Magnetic Multilayers with Atom Probe Tomography." Microscopy and Microanalysis 10, S02 (August 2004): 518–19. http://dx.doi.org/10.1017/s1431927604884629.
Full textLarde, R., J. Bran, M. Jean, and J. M. Le Breton. "Nanoscale characterization of powder materials by atom probe tomography." Powder Technology 208, no. 2 (March 2011): 260–65. http://dx.doi.org/10.1016/j.powtec.2010.08.014.
Full textMiller, Michael K. "Atom probe tomography characterization of solute segregation to dislocations." Microscopy Research and Technique 69, no. 5 (2006): 359–65. http://dx.doi.org/10.1002/jemt.20291.
Full textLauhon, Lincoln J., Praneet Adusumilli, Paul Ronsheim, Philip L. Flaitz, and Dan Lawrence. "Atom-Probe Tomography of Semiconductor Materials and Device Structures." MRS Bulletin 34, no. 10 (October 2009): 738–43. http://dx.doi.org/10.1557/mrs2009.248.
Full textInoue, Koji, Ajay Kumar Kambham, Dominique Mangelinck, Dan Lawrence, and David J. Larson. "Atom-Probe-Tomographic Studies on Silicon-Based Semiconductor Devices." Microscopy Today 20, no. 5 (September 2012): 38–44. http://dx.doi.org/10.1017/s1551929512000740.
Full textOhkubo, Tadakatsu, Yimeng Chen, Masaya Kodzuka, and Kazuhiro Hono. "Nanoscale Characterization of Ceramics by Laser Assisted Atom Probe Tomography." Materia Japan 50, no. 9 (2011): 397–403. http://dx.doi.org/10.2320/materia.50.397.
Full textMazumder, Baishakhi, Michele Esposto, Ting H. Hung, Tom Mates, Siddharth Rajan, and James S. Speck. "Characterization of a dielectric/GaN system using atom probe tomography." Applied Physics Letters 103, no. 15 (October 7, 2013): 151601. http://dx.doi.org/10.1063/1.4824211.
Full textLozano-Perez, Sergio, David W. Saxey, Takuyo Yamada, and Takumi Terachi. "Atom-probe tomography characterization of the oxidation of stainless steel." Scripta Materialia 62, no. 11 (June 2010): 855–58. http://dx.doi.org/10.1016/j.scriptamat.2010.02.021.
Full textWang, Jing, Mychailo B. Toloczko, Victor N. Voyevodin, Viktor V. Bryk, Oleg V. Borodin, Valentyn V. Mel'nychenko, Alexandr S. Kalchenko, Frank A. Garner, and Lin Shao. "Atom probe tomography characterization of high-dose ion irradiated MA957." Journal of Nuclear Materials 545 (March 2021): 152528. http://dx.doi.org/10.1016/j.jnucmat.2020.152528.
Full textMiller, M. K., K. F. Russell, M. A. Sokolov, and R. K. Nanstad. "Atom probe tomography characterization of radiation-sensitive KS-01 weld." Journal of Nuclear Materials 320, no. 3 (August 2003): 177–83. http://dx.doi.org/10.1016/s0022-3115(03)00108-9.
Full textMoody, Michael P., Baptiste Gault, Leigh T. Stephenson, Ross K. W. Marceau, Rebecca C. Powles, Anna V. Ceguerra, Andrew J. Breen, and Simon P. Ringer. "Lattice Rectification in Atom Probe Tomography: Toward True Three-Dimensional Atomic Microscopy." Microscopy and Microanalysis 17, no. 2 (March 8, 2011): 226–39. http://dx.doi.org/10.1017/s1431927610094535.
Full textSchreiber, D. K., M. J. Olszta, D. W. Saxey, K. Kruska, K. L. Moore, S. Lozano-Perez, and S. M. Bruemmer. "Examinations of Oxidation and Sulfidation of Grain Boundaries in Alloy 600 Exposed to Simulated Pressurized Water Reactor Primary Water." Microscopy and Microanalysis 19, no. 3 (April 17, 2013): 676–87. http://dx.doi.org/10.1017/s1431927613000421.
Full textRice, Katherine P., Yimeng Chen, Ty J. Prosa, and David J. Larson. "Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography." Microscopy and Microanalysis 22, no. 3 (June 2016): 583–88. http://dx.doi.org/10.1017/s1431927616011296.
Full textBennett, Roland, Andrew Proudian, and Jeramy Zimmerman. "A Machine Learning Approach to Cluster Characterization for Atom Probe Tomography." Microscopy and Microanalysis 27, S1 (July 30, 2021): 408–11. http://dx.doi.org/10.1017/s1431927621001987.
Full textLadutkin, D., C. Bruch, C. Günther, H. Aboulfadl, and F. Mücklich. "Characterization of an Albite Inclusion Containing MgO by Atom Probe Tomography." Practical Metallography 50, no. 9 (September 9, 2013): 607–15. http://dx.doi.org/10.3139/147.110262.
Full textLi, Y. J., P. Choi, C. Borchers, Y. Z. Chen, S. Goto, D. Raabe, and R. Kirchheim. "Atom probe tomography characterization of heavily cold drawn pearlitic steel wire." Ultramicroscopy 111, no. 6 (May 2011): 628–32. http://dx.doi.org/10.1016/j.ultramic.2010.11.010.
Full textLiu, Tian, Elaina R. Reese, Iman Ghamarian, and Emmanuelle A. Marquis. "Atom probe tomography characterization of ion and neutron irradiated Alloy 800H." Journal of Nuclear Materials 543 (January 2021): 152598. http://dx.doi.org/10.1016/j.jnucmat.2020.152598.
Full textMüller, M., D. W. Saxey, A. Cerezo, and G. D. W. Smith. "Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography." Journal of Physics: Conference Series 209 (February 1, 2010): 012026. http://dx.doi.org/10.1088/1742-6596/209/1/012026.
Full textMiller, M. K. "Atom probe tomography characterization of solute segregation to dislocations and interfaces." Journal of Materials Science 41, no. 23 (December 2006): 7808–13. http://dx.doi.org/10.1007/s10853-006-0518-5.
Full textShimizu, Y., H. Takamizawa, Y. Kawamura, M. Uematsu, T. Toyama, K. Inoue, E. E. Haller, K. M. Itoh, and Y. Nagai. "Atomic-scale characterization of germanium isotopic multilayers by atom probe tomography." Journal of Applied Physics 113, no. 2 (January 14, 2013): 026101. http://dx.doi.org/10.1063/1.4773675.
Full textPareige, Philippe, Bertrand Radiguet, and Cristelle Pareige. "Nuclear Materials Characterization by Tomographic Atom Probe." EPJ Web of Conferences 51 (2013): 03004. http://dx.doi.org/10.1051/epjconf/20135103004.
Full textGorman, Brian P., Andrew G. Norman, and Yanfa Yan. "Atom Probe Analysis of III–V and Si-Based Semiconductor Photovoltaic Structures." Microscopy and Microanalysis 13, no. 6 (November 14, 2007): 493–502. http://dx.doi.org/10.1017/s1431927607070894.
Full textGorman, Brian P., David Diercks, Norman Salmon, Eric Stach, Gonzalo Amador, and Cheryl Hartfield. "Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis." Microscopy Today 16, no. 4 (July 2008): 42–47. http://dx.doi.org/10.1017/s1551929500059782.
Full textLicata, Olivia G., and Baishakhi Mazumder. "Application of Atom Probe Tomography for Advancing GaN Based Technology." International Journal of High Speed Electronics and Systems 28, no. 01n02 (March 2019): 1940005. http://dx.doi.org/10.1142/s0129156419400056.
Full textTakamizawa, Hisashi, Katsuya Hoshi, Yasuo Shimizu, Fumiko Yano, Koji Inoue, Shinji Nagata, Tatsuo Shikama, and Yasuyoshi Nagai. "Three-Dimensional Characterization of Deuterium Implanted in Silicon Using Atom Probe Tomography." Applied Physics Express 6, no. 6 (June 1, 2013): 066602. http://dx.doi.org/10.7567/apex.6.066602.
Full textGemma, Ryota, Yanshan Lu, Sascha Seils, Torben Boll, and Kohta Asano. "Chemical characterization of Mg0.25Mn0.75-H(D) nanocomposites by Atom Probe Tomography (APT)." Journal of Alloys and Compounds 896 (March 2022): 163015. http://dx.doi.org/10.1016/j.jallcom.2021.163015.
Full textBarroo, Cédric, Andrew P. Magyar, Austin J. Akey, and David C. Bell. "Preparation and Characterization of Eu-Doped Diamond Samples by Atom Probe Tomography." Microscopy and Microanalysis 22, S3 (July 2016): 694–95. http://dx.doi.org/10.1017/s1431927616004323.
Full textRaznitsyn, O. A., A. A. Lukyanchuk, A. S. Shutov, S. V. Rogozhkin, and A. A. Aleev. "Optimization of Material Analysis Conditions for Laser-Assisted Atom Probe Tomography Characterization." Journal of Analytical Chemistry 72, no. 14 (December 2017): 1404–10. http://dx.doi.org/10.1134/s1061934817140118.
Full textMaier, Johannes, Björn Pfeiffer, Cynthia A. Volkert, and Carsten Nowak. "Three-Dimensional Microstructural Characterization of Lithium Manganese Oxide with Atom Probe Tomography." Energy Technology 4, no. 12 (September 15, 2016): 1565–74. http://dx.doi.org/10.1002/ente.201600210.
Full textJenkins, Benjamin M., Frédéric Danoix, Mohamed Gouné, Paul A. J. Bagot, Zirong Peng, Michael P. Moody, and Baptiste Gault. "Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography." Microscopy and Microanalysis 26, no. 2 (March 18, 2020): 247–57. http://dx.doi.org/10.1017/s1431927620000197.
Full textKim, Yoon-Jun, and David N. Seidman. "Atom-Probe Tomographic Analyses of Hydrogen Interstitial Atoms in Ultrahigh Purity Niobium." Microscopy and Microanalysis 21, no. 3 (April 21, 2015): 535–43. http://dx.doi.org/10.1017/s143192761500032x.
Full textHu, Rong, Jing Xue, Xingping Wu, Yanbo Zhang, Huilong Zhu, and Gang Sha. "Atom Probe Tomography Characterization of Dopant Distributions in Si FinFET: Challenges and Solutions." Microscopy and Microanalysis 26, no. 1 (November 22, 2019): 36–45. http://dx.doi.org/10.1017/s1431927619015137.
Full textNgamo, M., S. Duguay, P. Pichler, K. Daoud, and P. Pareige. "Characterization of Arsenic segregation at Si/SiO2 interface by 3D atom probe tomography." Thin Solid Films 518, no. 9 (February 2010): 2402–5. http://dx.doi.org/10.1016/j.tsf.2009.08.020.
Full textKang, J., C. Williams, B. Hosseinkhani, P. E. Rivera Diaz del Castillo, P. A. Bagot, and M. P. Moody. "Atom Probe Tomography Characterization of a White Etching Area in a Bearing Steel." Microscopy and Microanalysis 19, S2 (August 2013): 1016–17. http://dx.doi.org/10.1017/s1431927613007071.
Full textMazumder, B., X. Liu, U. K. Mishra, and J. S. Speck. "3D Characterization Study of High-k Dielectric on GaN Using Atom Probe Tomography." Microscopy and Microanalysis 19, S2 (August 2013): 1026–27. http://dx.doi.org/10.1017/s1431927613007125.
Full textLee, J. H., Y. T. Kim, J. J. Kim, S. Y. Lee, and C. G. Park. "3D compositional characterization of Si/SiO2 vertical interface structure by atom probe tomography." Electronic Materials Letters 9, no. 6 (November 2013): 747–50. http://dx.doi.org/10.1007/s13391-013-6002-x.
Full textSamudrala, S., O. Wodo, S. K. Suram, S. Broderick, K. Rajan, and B. Ganapathysubramanian. "A graph-theoretic approach for characterization of precipitates from atom probe tomography data." Computational Materials Science 77 (September 2013): 335–42. http://dx.doi.org/10.1016/j.commatsci.2013.04.038.
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