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Relevant bibliographies by topics / Atom Probe Tomography Characterization

Academic literature on the topic 'Atom Probe Tomography Characterization'

Author: Grafiati

Published: 10 December 2022

Last updated: 28 January 2023

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Journal articles on the topic "Atom Probe Tomography Characterization"

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Miller, M. K. "Atom Probe Tomography Of Interfaces." Microscopy and Microanalysis 5, S2 (August 1999): 118–19. http://dx.doi.org/10.1017/s143192760001391x.

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The technique of atom probe tomography (APT) enables the x, y, and z coordinates and the elemental identities of the atoms in a small volume to be determined at the atomic level. Therefore, the APT technique may be used to characterize solute segregation to interfaces and precipitation in terms of concentration gradients and precipitate morphology. This type of information may be used to optimize the design of alloys.The material that was used to illustrate the capabilities of atom probe tomography is a complex polycrystalline nickel-based superalloy, Alloy 718. The composition of this commercial superalloy is Ni- 3.2 at. % Nb, 0.96% Al, 1.15% Ti, 20.3% Fe, 21.8% Cr, 0.26% Co, 1.8% Mo, 0.16% Mn, 0.21% Si and 0.26% C. The material was characterized after a heat treatment oM h at 1038°C + 8 h at 870°C + 500 h at 600°C. Previous atom probe field ion microscopy characterizations of this material has demonstrated that there is no intragranular precipitation after the anneal at 1038°C.

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Bagot, P. A., T. Li, E. Tsang, G. Smith, and M. P. Moody. "Atom Probe Tomography Characterization of Catalyst Nanoparticles." Microscopy and Microanalysis 19, S2 (August 2013): 1018–19. http://dx.doi.org/10.1017/s1431927613007083.

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Thompson, G. B., H. L. Fraser, and M. K. Miller. "Atom Probe Tomography Characterization of Multilayer Films." Microscopy and Microanalysis 9, S02 (July 21, 2003): 574–75. http://dx.doi.org/10.1017/s1431927603442876.

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Miller, M. K., and E. A. Kenik. "Atom Probe Tomography: A Technique for Nanoscale Characterization." Microscopy and Microanalysis 10, no. 3 (June 2004): 336–41. http://dx.doi.org/10.1017/s1431927604040577.

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Atom probe tomography is a technique for the nanoscale characterization of microstructural features. Analytical techniques have been developed to estimate the size, composition, and other parameters of features as small as 1 nm from the atom probe tomography data. These methods are outlined and illustrated with examples of yttrium-, titanium-, and oxygen-enriched particles in a mechanically alloyed, oxide-dispersion-strengthened steel.

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Xiong, Xiangyuan, and Matthew Weyland. "Microstructural Characterization of an Al-Li-Mg-Cu Alloy by Correlative Electron Tomography and Atom Probe Tomography." Microscopy and Microanalysis 20, no. 4 (May 12, 2014): 1022–28. http://dx.doi.org/10.1017/s1431927614000798.

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AbstractCorrelative electron tomography and atom probe tomography have been carried out successfully on the same region of a commercial 8090 aluminum alloy (Al-Li-Mg-Cu). The combination of the two techniques allows accurate geometric reconstruction of the atom probe tomography data verified by crystallographic information retrieved from the reconstruction. Quantitative analysis of the precipitate phase compositions and volume fractions of each phase have been obtained from the atom probe tomography and electron tomography at various scales, showing strong agreement between both techniques.

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Amouyal, Yaron, and Guido Schmitz. "Atom probe tomography—A cornerstone in materials characterization." MRS Bulletin 41, no. 1 (January 2016): 13–18. http://dx.doi.org/10.1557/mrs.2015.313.

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Miller, M. K., and E. A. Kenik. "Atom Probe Tomography: A Technique for Nanoscale Characterization." Microscopy and Microanalysis 8, S02 (August 2002): 1126–27. http://dx.doi.org/10.1017/s1431927602103709.

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Pfeiffer, Björn, Torben Erichsen, Eike Epler, Cynthia A. Volkert, Piet Trompenaars, and Carsten Nowak. "Characterization of Nanoporous Materials with Atom Probe Tomography." Microscopy and Microanalysis 21, no. 3 (May 20, 2015): 557–63. http://dx.doi.org/10.1017/s1431927615000501.

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AbstractA method to characterize open-cell nanoporous materials with atom probe tomography (APT) has been developed. For this, open-cell nanoporous gold with pore diameters of around 50 nm was used as a model system, and filled by electron beam-induced deposition (EBID) to obtain a compact material. Two different EBID precursors were successfully tested—dicobalt octacarbonyl [Co2(CO)8] and diiron nonacarbonyl [Fe2(CO)9]. Penetration and filling depth are sufficient for focused ion beam-based APT sample preparation. With this approach, stable APT analysis of the nanoporous material can be performed. Reconstruction reveals the composition of the deposited precursor and the nanoporous material, as well as chemical information of the interfaces between them. Thus, it is shown that, using an appropriate EBID process, local chemical information in three dimensions with sub-nanometer resolution can be obtained from nanoporous materials using APT.

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Martin, Andrew J., Ajay Kumar Kambham, and Ahmad D. Katnani. "Advantages and Challenges of 3-D Atom Probe Tomography Characterization of FinFETs." EDFA Technical Articles 19, no. 2 (May 1, 2017): 22–30. http://dx.doi.org/10.31399/asm.edfa.2017-2.p022.

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Abstract This article provides an overview of atom probe tomography (APT) and its use in semiconductor FA and new product development. It discusses the basic components in an atom probe, the making of APT tips, and the general approach for data collection and reconstruction. It also includes a case study in which 3D atom probe techniques are used to map dopant profiles and identify defects in the source-drain region of SiGe FinFET transistors.

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Kelly, Thomas F., Osamu Nishikawa, J. A. Panitz, and Ty J. Prosa. "Prospects for Nanobiology with Atom-Probe Tomography." MRS Bulletin 34, no. 10 (October 2009): 744–50. http://dx.doi.org/10.1557/mrs2009.249.

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AbstractThe merits of atom-probe tomography (APT) of inorganic materials are well established, as described in this volume. However, one of the long-held aspirations of atom-probe scientists, structural and chemical characterization of organic and biological materials at near-atomic resolution, has yet to be fully realized. A few proof-of-concept type investigations have shown that APT of organic materials is feasible, but a number of challenges still exist with regard to specimen preparation and conversion of raw time-of-flight mass spectrometry data into a three-dimensional map of ions containing structural and chemical information at an acceptable resolution. Recent research aided by hardware improvements and specimen preparation advances has made some progress toward this goal. This article reviews the historical developments in this field, presents some recent results, and considers what life science researchers might expect from this technology.

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Dissertations / Theses on the topic "Atom Probe Tomography Characterization"

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Chang, Yanhong [Verfasser], Dierk [Akademischer Betreuer] Raabe, and Sandra [Akademischer Betreuer] Korte-Kerzel. "Characterization of H/D in Ti and its alloys with atom probe tomography / Yanhong Chang ; Dierk Raabe, Sandra Korte-Kerzel." Aachen : Universitätsbibliothek der RWTH Aachen, 2019. http://d-nb.info/1195238029/34.

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Mühlbacher, Marlene. "High-resolution characterization of TiN diffusion barrier layers." Licentiate thesis, Linköpings universitet, Tunnfilmsfysik, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-120394.

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Titanium nitride (TiN) films are widely applied as diffusion barrier layers in microelectronic devices. The continued miniaturization of such devices not only poses new challenges to material systems design, but also puts high demands on characterization techniques. To gain understanding of diffusion processes that can eventually lead to failure of the barrier layer and thus of the whole device, it is essential to develop routines to chemically and structurally investigate these layers down to the atomic scale. In the present study, model TiN diffusion barriers with a Cu overlayer acting as the diffusion source were grown by reactive magnetron sputtering on MgO(001) and thermally oxidized Si(001) substrates. Cross-sectional transmission electron microscopy (XTEM) of the pristine samples revealed epitaxial, single-crystalline growth of TiN on MgO(001), while the polycrystalline TiN grown on Si(001) exhibited a [001]-oriented columnar microstructure. Various annealing treatments were carried out to induce diffusion of Cu into the TiN layer. Subsequently, XTEM images were recorded with a high-angle annular dark field detector, which provides strong elemental contrast, to illuminate the correlation between the structure and the barrier efficiency of the single- and polycrystalline TiN layers. Particular regions of interest were investigated more closely by energy dispersive X-ray (EDX) mapping. These investigations are completed by atom probe tomography (APT) studies, which provide a three-dimensional insight into the elemental distribution at the near-interface region with atomic chemical resolution and high sensitivity. In case of the single-crystalline barrier, a uniform Cu-enriched diffusion layer of 12 nm could be detected at the interface after an annealing treatment at 1000 °C for 12 h. This excellent barrier performance can be attributed to the lack of fast diffusion paths such as grain boundaries. Moreover, density-functional theory calculations predict a stoichiometry-dependent atomic diffusion mechanism of Cu in bulk TiN, with Cu diffusing on the N-sublattice for the experimental N/Ti ratio. In comparison, the polycrystalline TiN layers exhibited grain boundaries reaching from the Cu-TiN interface to the substrate, thus providing direct diffusion paths for Cu. However, the microstructure of these columnar layers was still dense without open porosity or voids, so that the onset of grain boundary diffusion could only be found after annealing at 900 °C for 1 h. The present study shows how to combine two high resolution state-of-the-art methods, TEM and APT, to characterize model TiN diffusion barriers. It is shown how to correlate the microstructure with the performance of the barrier layer by two-dimensional EDX mapping and three-dimensional APT. Highly effective Cu-diffusion barrier function is thus demonstrated for single-crystal TiN(001) (up to 1000 °C) and dense polycrystalline TiN (900 °C).

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Hwang, Junyeon Kaufman M. J. "Characterization and mechanical properties of nanoscale precipitates in modified Al-Si-Cu alloys using transmission electron microscopy and 3D atom probe tomography." [Denton, Tex.] : University of North Texas, 2007. http://digital.library.unt.edu/permalink/meta-dc-3661.

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Hwang, Junyeon. "Characterization and Mechanical Properties of Nanoscale Precipitates in Modified Al-Si-Cu Alloys Using Transmission Electron Microscopy and 3D Atom Probe Tomography." Thesis, University of North Texas, 2007. https://digital.library.unt.edu/ark:/67531/metadc3661/.

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Among the commercial aluminum alloys, aluminum 319 (Al-7wt%Si-4wt%Cu) type alloys are popularly used in automobile engine parts. These alloys have good casting characteristics and excellent mechanical properties resulting from a suitable heat treatment. To get a high strength in the 319 type alloys, grain refining, reducing the porosity, solid solution hardening, and precipitation hardening are preferred. All experimental variables such as solidification condition, composition, and heat treatment are influence on the precipitation behavior; however, precipitation hardening is the most significant because excess alloying elements from supersaturated solid solution form fine particles which act as obstacles to dislocation movement. The challenges of the 319 type alloys arise due to small size of precipitate and complex aging response caused by multi components. It is important to determine the chemical composition, crystal structure, and orientation relationship as well as precipitate morphology in order to understand the precipitation behavior and strengthening mechanism. In this study, the mechanical properties and microstructure were investigated using transmission electron microscopy and three dimensional atom probe tomography. The Mn and Mg effects on the microstructure and mechanical properties are discussed with crystallographic study on the iron intermetallic phases. The microstructural evolution and nucleation study on the precipitates in the low-Si 319 type aluminum alloys are also presented with sample preparation and analysis condition of TEM and 3DAP tomography.

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Yu, Xinghua. "Characterization and Modeling of Heat Affected Zone Microstucture in a Blast Resistant Steel." The Ohio State University, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=osu1262201157.

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Withrow, Travis P. "Computational Modeling of Atom Probe Tomography." The Ohio State University, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=osu1525763934302517.

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Engberg, David. "Atom Probe Tomography of TiSiN Thin Films." Licentiate thesis, Linköpings universitet, Tunnfilmsfysik, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-122724.

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This thesis concerns the wear resistant coating TiSiN and the development of the analysis technique atom probe tomography (APT) applied to this materials system. The technique delivers compositional information through time-of-flight mass spectrometry, with sub-nanometer precision in 3D for a small volume of the sample. It is thus a powerful technique for imaging the local distribution of elements in micro and nanostructures. To gain the full benefits of the technique for the materials system in question, I have developed a method that combines APT with isotopic substitution, here demonstrated by substitution of natN with 15N. This alters the time-of-flight of ions with of one or more N and will thereby enable the differentiation of the otherwise inseparable isotopes 14N and 28Si. Signs of small-scale fluctuations in the data led the development of an algorithm needed to properly visualize these fluctuations. A method to identify the best sampling parameter for visualization of small-scale compositional fluctuations was added to an algorithm originally designed to find the best sampling parameters for measuring and visualizing strong compositional variations. With the identified sampling parameters, the nano-scale compositional fluctuations of Si in the metal/metalloid sub-lattice could be visualized. The existence and size of these fluctuations were corroborated by radial distribution functions, a technique independent of the previously determined sampling parameter. The radial distribution function algorithm was also developed further to ease in the interpretation. The number of curves could thereby be reduced by showing elements, rather than single and molecular ions (of which there were several different kinds). The improvement of the algorithm also allowed interpretation of signs regarding the stoichiometry of SiNy. With a combination of analytical transmission electron microscopy and APT we show Si segregation on the nanometer scale in arc-deposited Ti0.92Si0.0815N and Ti0.81Si0.1915N thin films. APT composition maps and proximity histograms generated from Ti-rich domains show that the TiN contain at least ~2 at. % Si for Ti0.92Si0.08N and ~5 at. % Si for Ti0.81Si0.19N, thus confirming the formation of solid solutions. The formation of relatively pure SiNy domains in the Ti0.81Si0.19N films is tied to pockets between microstructured, columnar features in the film. Finer SiNy enrichments seen in APT possibly correspond to tissue layers around TiN crystallites, thus effectively hindering growth of TiN crystallites, causing TiN renucleation and thus explaining the featherlike nanostructure within the columns of these films.

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Yang, Qifeng. "Atom probe tomography research on catalytic alloys and nanoparticles." Thesis, University of Oxford, 2018. http://ora.ox.ac.uk/objects/uuid:f3acdf37-3d23-4893-a4de-12e81712157a.

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Catalyst is a key component in the chemical industry, with more than 90% of total chemical products reliant on their use. However, the working mechanisms are in many cases still not fully understood. For heterogeneous catalysts, in which the reactions normally occur on solid phase materials, a better understanding of the catalytic surfaces, and how they evolve under reactive environments is recognised as the next step forward in the field. This work presents a study utilising atom probe tomography (APT), combined with an in-situ reaction cell, to understand the initial oxidation processes of catalytic NiFe and NiCo model alloy systems. In order to improve reliability of results, a protocol was developed to clean the sample surfaces by field ion evaporation, eliminate sample surface contamination before in-situ oxidation was then performed. APT was successfully applied to these alloys to characterise oxide development as a function of exposure time and temperature. APT also demonstrated surface enrichment induced by oxide formation remained after reduction of the alloy. The successful application of APT on the model alloys led to the next goal which was to associate the data to real catalytic particles. To achieve this, work was extended into the field of nanoparticle catalysts. Nanoparticles with similar compositions to the model alloys were fabricated by chemical synthesis and were examined initially by transmission electron microscopy (TEM). The main goal of this phase was to investigate the surface segregation behaviour of the particles, identifying common behaviours with the model alloys. However, the presence of residual complex chemical environments around the particles following synthesis made APT analysis difficult. Therefore, an alternative method of particle fabrication was explored to better control the resulting materials for easier application of atom probe for nanoparticle analyses. Metallic nanoparticles of Ag, AuCu, AuNi, and AuNiMo were made by an inert gas condensation method, deposited on suitable support materials and were subsequently analysed by APT, facilitated by an improved sample preparation method. Surface segregation on individual nanoparticles was detected. Together with other complementary surface-probing techniques, a complete understanding of these particles from micrometre down to the level of individual particles was achieved. The potential for APT is highlighted to play a key role in this approach to realise a complete understanding of the chemical order, microstructure in multimetallic nanoparticles designed for catalysis.

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Bennett, Samantha. "Nitride semiconductors studied by atom probe tomography and correlative techniques." Thesis, University of Cambridge, 2011. https://www.repository.cam.ac.uk/handle/1810/236685.

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Optoelectronic devices fabricated from nitride semiconductors include blue and green light emitting diodes (LEDs) and laser diodes (LDs). To design efficient devices, the structure and composition of the constituent materials must be well-characterised. Traditional microscopy techniques used to examine nitride semiconductors include transmission electron microscopy (TEM), and atomic force microscopy (AFM). This thesis describes the study of nitride semiconductor materials using these traditional methods, as well as atom probe tomography (APT), a technique more usually applied to metals that provides three-dimensional (3D) compositional information at the atomic scale. By using both APT and correlative microscopy techniques, a more complete understanding of the material can be gained, which can potentially lead to higher-efficiency, longer-lasting devices. Defects, such as threading dislocations (TDs), can harm device performance. An AFM-based technique was used to show that TDs affect the local electrical properties of nitride materials. To investigate any compositional changes around the TD, APT studies of TDs were attempted, and evidence for oxygen enrichment near the TD was observed. The dopant level in nitride devices also affects their optoelectronic properties, and the combination of APT and TEM was used to show that Mg dopants were preferentially incorporated into pyramidal inversion domains, with a Mg content two orders of magnitude above the background level. Much debate has been focused on the microstructural origin of charge carrier localisation in InGaN. Alloy inhomogeneities have often been suggested to provide this localisation, yet APT has revealed InGaN quantum wells to be a statistically random alloy. Electron beam irradiation in the TEM caused damage to the InGaN, however, and a statistically significant deviation from a random alloy distribution was then observed by APT. The alloy homogeneity of InAlN was also studied, and this alloy system provided a unique opportunity to study gallium implantation damage to the APT sample caused during sample preparation by the focused ion beam (FIB). The combination of APT with traditional microscopy techniques made it possible to achieve a thorough understanding of a wide variety of nitride semiconductor materials.

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Chen, Yi-Sheng. "Characterisation of hydrogen trapping in steel by atom probe tomography." Thesis, University of Oxford, 2017. http://ora.ox.ac.uk/objects/uuid:9d8ee66f-176d-4ac1-aad6-ccb33efc924d.

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Hydrogen embrittlement (HE), which results in an unpredictable failure of metals, has been a major limitation in the design of critical components for a wide range of engineering applications, given the near-ubiquitous presence of hydrogen in their service environments. However, the exact mechanisms that underpin HE failure remain poorly understood. It is known that hydrogen, when free to diffuse in these materials, can tend to concentrate at a crack tip front. In turn, this facilitates crack propagation. Hence one of the proposed strategies for mitigating HE is to limit the content of freely diffusing hydrogen within the metal atomic lattice via the introduction of microstructural hydrogen traps. Further, it is empirically known that the introduction of finely-dispersed distribution of nano-sized carbide hydrogen traps in ferritic steel matrix can improve resilience to HE. This resilience has been attributed to the effective hydrogen trapping of the carbides. However, conclusive atomic-scale experimental evidence is still lacking as to the manner by which these features can impede the movement of the hydrogen. This lack of insight limits the further progress for the optimisation of the microstructural design of this type of HE-resistant steel. In order to further understand the hydrogen trapping phenomenon of the nano-sized carbide in steel, an appropriate characterisation method is required. Atom probe tomography (APT) has been known for its powerful combination of high 3D spatial and chemical resolution for the analysis of very fine precipitates. Furthermore, previous studies have shown that the application of isotopic hydrogen (²H) loading techniques, combined with APT, facilitates the hydrogen signal associated to fine carbides to be unambiguously identified. However, the considerable experimental requirements as utilised by these previous studies, particularly the instrumental capability necessary for retention of the trapped hydrogen in the needle-shaped APT specimen, limits the study being reproduced or extended. In this APT study, a model ferritic steel with finely dispersed V-Mo-Nb carbides of 10-20 nm is investigated. Initially, existing specialised instrumentation formed the basis of a cryogenic specimen chain under vacuum, so as to retain loaded hydrogen after an electrolytic charging treatment for APT analysis. This work confirms the importance of cryogenic treatment for the retention of trapped hydrogen in APT specimen. The quality of the obtained experimental data allows a quantitative analysis on the hydrogen trapping mechanism. Thus, it is conclusively determined that interior of the carbides studied in this steel acts as the hydrogen trapping site as opposed to the carbide/matrix interface as commonly expected. This result supports the theoretical investigations proposing that the hydrogen trapping within the carbide interior is enabled by a network of carbon vacancies. Based on the established importance of the specimen cold chain in these APT experiments, this work then successfully develops a simplified approach to cryo-transfer which requires no instrumental modification. In this approach there is no requirement for the charged specimen to be transferred under vacuum conditions. The issue of environmental-induced ice contamination on the cryogenic sample surface in air transfer is resolved by its sublimation in APT vacuum chamber. Furthermore, the temperature of the transferred sample is able to be determined independently by both monitoring changes to vacuum pressure in the buffer chamber and also the thermal response of the APT sample stage in the analysis chamber. This simplified approach has the potential to open up a range of hydrogen trapping studies to any commercial atom probe instrument. Finally, as an example of the use of this simplified cryo-transfer technique, targeted studies for determining the source of hydrogen adsorption during electropolishing and electrolytic loading process are demonstrated. This research provides a critical verification of hydrogen trapping mechanism of fine carbides as well as an achievable experimental protocol for the observation of the trapping of individual hydrogen atoms in alloy microstructures. The methods developed here have the potential to underpin a wide range of possible experiments which address the HE problem, particularly for the design of new mitigation strategies to prevent this critical issue.

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Books on the topic "Atom Probe Tomography Characterization"

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Miller, M. K. Atom Probe Tomography. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4615-4281-0.

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Miller, Michael K., and Richard G. Forbes. Atom-Probe Tomography. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3.

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Larson, David J., Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, and Thomas F. Kelly. Local Electrode Atom Probe Tomography. New York, NY: Springer New York, 2013. http://dx.doi.org/10.1007/978-1-4614-8721-0.

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Larson, David J. Local electrode atom probe tomography: A user's guide. New York: Springer, 2013.

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Miller, M. K. Atom probe tomography: Analysis at the atomic level. New York: Kluwer Academic / Plenum Publishers, 2000.

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Atom Probe Tomography: Analysis at the Atomic Level. Boston, MA: Springer US, 2000.

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P, Moody Michael, Cairney Julie M, Ringer Simon P, and SpringerLink (Online service), eds. Atom Probe Microscopy. New York, NY: Springer New York, 2012.

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Atom probe tomography characterization of the solute distributions in a neutron-irradiated and annealed pressure vessel steel weld. Washington, DC: Division of Engineering Technology, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 2000.

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K, Miller M., Oak Ridge National Laboratory, and U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering Technology., eds. Atom probe tomography characterization of the solute distributions in a neutron-irradiated and annealed pressure vessel steel weld. Washington, DC: U.S. Nuclear Regulatory Commission, 2000.

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Lefebvre, Williams, Francois Vurpillot, and Xavier Sauvage. Atom Probe Tomography. Elsevier Science & Technology Books, 2016.

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Book chapters on the topic "Atom Probe Tomography Characterization"

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Schreiber, Daniel, and Joseph V. Ryan. "Atom Probe Tomography of Glasses." In Modern Glass Characterization, 1–39. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2015. http://dx.doi.org/10.1002/9781119051862.ch10.

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Blavette, D., F. Vurpillot, B. Deconihout, and A. Menand. "Atom Probe Tomography: 3D Imaging at the Atomic Level." In Fabrication and Characterization in the Micro-Nano Range, 201–22. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-17782-8_9.

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Zhang, Tianmu, Scott R. Broderick, and Krishna Rajan. "Topological Data Analysis for the Characterization of Atomic Scale Morphology from Atom Probe Tomography Images." In Nanoinformatics, 133–55. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-7617-6_7.

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Lim, Yun Soo, Dong Jin Kim, and Seong Sik Hwang. "Microstructural Characterization of Proton-Irradiated 316 Stainless Steels by Transmission Electron Microscopy and Atom Probe Tomography." In The Minerals, Metals & Materials Series, 759–72. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-67244-1_49.

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Lim, Yun Soo, Dong Jin Kim, and Seong Sik Hwang. "Microstructural Characterization of Proton-Irradiated 316 Stainless Steels by Transmission Electron Microscopy and Atom Probe Tomography." In The Minerals, Metals & Materials Series, 759–72. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-030-04639-2_49.

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Kelly, Thomas F. "Atom-Probe Tomography." In Springer Handbook of Microscopy, 715–63. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-00069-1_15.

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Olszta, Matthew J., Daniel K. Schreiber, Larry E. Thomas, and Stephen M. Bruemmer. "Electron Microscopy Characterizations and Atom Probe Tomography of Intergranular Attack in Alloy 600 Exposed to PWR Primary Water." In Proceedings of the 15th International Conference on Environmental Degradation of Materials in Nuclear Power Systems — Water Reactors, 1503–17. Cham: Springer International Publishing, 2011. http://dx.doi.org/10.1007/978-3-319-48760-1_93.

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Olszta, Matthew J., Daniel K. Schreiber, Larry E. Thomas, and Stephen M. Bruemmer. "Electron Microscopy Characterizations and Atom Probe Tomography of Intergranular Attack in Alloy 600 Exposed to PWR Primary Water." In 15th International Conference on Environmental Degradation of Materials in Nuclear Power Systems-Water Reactors, 1503–16. Hoboken, New Jersey, Canada: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118456835.ch157.

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Miller, Michael K., and Richard G. Forbes. "Introduction to Atom-Probe Tomography." In Atom-Probe Tomography, 1–49. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_1.

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Miller, Michael K., and Richard G. Forbes. "Introduction to the Physics of Field Ion Emitters." In Atom-Probe Tomography, 51–109. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_2.

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Conference papers on the topic "Atom Probe Tomography Characterization"

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Cojocaru-Miredin, Oana, Pyuck-Pa Choi, Daniel Abou-Ras, and Dierk Raabe. "Characterization of CIGS grain boundaries using Atom Probe Tomography." In 2011 37th IEEE Photovoltaic Specialists Conference (PVSC). IEEE, 2011. http://dx.doi.org/10.1109/pvsc.2011.6186338.

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Gorman, Brian P., Andrew G. Norman, Dan Lawrence, Ty Prosa, Harvey Guthrey, and Mowafak Al-Jassim. "Atomic scale characterization of compound semiconductors using atom probe tomography." In 2011 37th IEEE Photovoltaic Specialists Conference (PVSC). IEEE, 2011. http://dx.doi.org/10.1109/pvsc.2011.6186667.

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Miller, M. K., S. Venkataraman, J. Eckert, L. Schultz, and D. Sordelet. "Atom Probe Tomography Characterization of a Gas Atomized Metallic Glass." In 2006 19th International Vacuum Nanoelectronics Conference. IEEE, 2006. http://dx.doi.org/10.1109/ivnc.2006.335295.

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Vurpillot, F., M. Gruber, S. Duguay, E. Cadel, B. Deconihout, Erik M. Secula, David G. Seiler, et al. "Modeling artifacts in the analysis of test semiconductor structures in atom probe tomography." In FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009. AIP, 2009. http://dx.doi.org/10.1063/1.3251216.

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Wedderhoff, K., M. Ogiewa, A. Shariq, S. Teichert, David G. Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, and Erik M. Secula. "Investigation of Boron Redistribution during Silicidation in TiSi[sub 2] using Atom Probe Tomography." In FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011. AIP, 2011. http://dx.doi.org/10.1063/1.3657868.

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Diercks, David R., Jiaojiao Li, Joseph D. Beach, Colin A. Wolden, and Brian P. Gorman. "Atom probe tomography for nanoscale characterization of CdTe device absorber layers and interfaces." In 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC). IEEE, 2014. http://dx.doi.org/10.1109/pvsc.2014.6925241.

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Gorman, B. P. "Atomic scale chemical and structural characterization of internal interfaces with atom probe tomography." In 2008 17th IEEE International Symposium on the Applications of Ferroelectrics (ISAF). IEEE, 2008. http://dx.doi.org/10.1109/isaf.2008.4693792.

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Stoffers, Andreas, Oana Cojocaru-Miredin, Otwin Breitenstein, Winfried Seifert, Stefan Zaefferer, and Dierk Raabe. "Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography." In 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC). IEEE, 2014. http://dx.doi.org/10.1109/pvsc.2014.6925089.

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Soneda, Naoki, Kenji Nishida, Kenji Dohi, Akiyoshi Nomoto, William L. Server, Milan Brumovsky, Milos Kytka, and Jack Spanner. "Microstructural Changes Related to Through-Wall Attenuation of Neutron Irradiation Embrittlement." In ASME 2010 Pressure Vessels and Piping Division/K-PVP Conference. ASMEDC, 2010. http://dx.doi.org/10.1115/pvp2010-25636.

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The through-wall attenuation of neutron fluence of reactor pressure vessel (RPV) steels is often expressed using an exponential decay function based on some estimate of displacements per atom (dpa). In order to verify this function, an irradiation project was performed in which 18 layers of Charpy specimens and one central temperatue control layer were stacked in a block to simulate a 190 mm thick RPV wall. Three western-type RPV steels (medium and low copper plates and a high copper Linde 80 flux weld) were irradiated in this project. Mechanical property tests of these materials have been performed under a consortium of EPRI, CRIEPI, NRI-Rez and ATI Consulting to fully characterize the mechanical properties in terms of Charpy transition temperature and upper-shelf energy, as well as reference fracture toughness using the Master Curve. Some results have been reported at previous PVP conferences. In this paper, we report the results of microstructural characterization using three-dimensional atom probe tomography (APT) of the medium copper plate and the high copper weld metal. The microstructures obtained by APT reasonably explain the changes in mechanical properties of these materials, and the difference in the response of these materials to irradiation was also identified. The mixed effect of fluence/flux/spectrum is discussed from the microstructural point of view.

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Rosseel, Thomas M., Mikhail A. Sokolov, Xiang Chen, and Randy K. Nanstad. "Current Status of the Characterization of RPV Materials Harvested From the Decommissioned Zion Unit 1 Nuclear Power Plant." In ASME 2017 Pressure Vessels and Piping Conference. American Society of Mechanical Engineers, 2017. http://dx.doi.org/10.1115/pvp2017-65090.

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The decommissioning of Units 1 and 2 of the Zion Nuclear Power Station in Zion, Illinois, after ∼ 15 effective full-power years of service presents a unique opportunity to characterize the degradation of in-service reactor pressure vessel (RPV) materials and to assess currently available models for predicting radiation embrittlement of RPV steels [1–3]. Moreover, through-wall thickness attenuation and property distributions are being obtained and the results to be compared with surveillance specimen test data. It is anticipated that these efforts will provide a better understanding of materials degradation associated with extending the lifetime of existing nuclear power plants (NPPs) beyond 60 years of service and subsequent license renewal. In support of extended service and current operations of the US nuclear reactor fleet, the Oak Ridge National Laboratory (ORNL), through the U.S. Department of Energy, Light Water Reactor Sustainability (LWRS) Program, coordinated procurement of materials, components, and other items of interest from the decommissioned Zion NPPs. In this report, harvesting, cutting sample blocks, machining test specimens, test plans, and the current status of materials characterization of the RPV from the decommissioned Zion NPP Unit 1 will be discussed. The primary foci are the circumferential, Linde 80 flux, wire heat 72105 (WF-70) beltline weld and the A533B base metal from the intermediate shell harvested from a region of peak fluence (0.7 × 1019 n/cm2, E > 1.0 MeV) on the internal surface of the Zion Unit 1 vessel. Following the determination of the through-thickness chemical composition, Charpy impact, fracture toughness, tensile, and hardness testing are being performed to characterize the through-thickness mechanical properties of base metal and beltline-weld materials. In addition to mechanical properties, microstructural characterizations are being performed using various microstructural techniques, including Atom Probe Tomography, Small Angle Neutron Scattering, and Positron Annihilation Spectroscopy.

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Reports on the topic "Atom Probe Tomography Characterization"

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Miller, M. K. Atom Probe Tomography Characterization of the Solute Distributions in a Neutron-Irradiated and Annealed Pressure Vessel Steel Weld. Office of Scientific and Technical Information (OSTI), January 2001. http://dx.doi.org/10.2172/777685.

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Edmondson, Philip D. An On-Axis Tomography Holder for Correlative Electron and Atom Probe Microscopy. Office of Scientific and Technical Information (OSTI), October 2018. http://dx.doi.org/10.2172/1479802.

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Sanford, Norman A. Laser-assisted atom probe tomography of c-plane and m-plane InGaN test structures. National Institute of Standards and Technology, April 2022. http://dx.doi.org/10.6028/nist.tn.2201.

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Wells, Peter, and G. Robert Odette. Status Summary of FY16 Atom Probe Tomography Studies on UCSB ATR-2 Irradiated RPV Steels. Office of Scientific and Technical Information (OSTI), May 2016. http://dx.doi.org/10.2172/1364468.

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Knipling, Keith, Fred Meisenkothen, and Eric B. Steel. Proceedings of the International Conference on Atom-Probe Tomography and Microscopy (APT&M 2018). National Institute of Standards and Technology, December 2019. http://dx.doi.org/10.6028/nist.sp.2100-03.

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Tiley, J., O. Senkov, G. Viswanathan, S. Nag, R. Banerjee, and J. Hwang. Determination of Gamma-Prime Site Occupancies in Nickel Superalloys Using Atom Probe Tomography and X-Ray Diffraction (Preprint). Fort Belvoir, VA: Defense Technical Information Center, August 2012. http://dx.doi.org/10.21236/ada563340.

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