Academic literature on the topic 'Atom Probe Tomography Characterization'
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Journal articles on the topic "Atom Probe Tomography Characterization"
Miller, M. K. "Atom Probe Tomography Of Interfaces." Microscopy and Microanalysis 5, S2 (August 1999): 118–19. http://dx.doi.org/10.1017/s143192760001391x.
Full textBagot, P. A., T. Li, E. Tsang, G. Smith, and M. P. Moody. "Atom Probe Tomography Characterization of Catalyst Nanoparticles." Microscopy and Microanalysis 19, S2 (August 2013): 1018–19. http://dx.doi.org/10.1017/s1431927613007083.
Full textThompson, G. B., H. L. Fraser, and M. K. Miller. "Atom Probe Tomography Characterization of Multilayer Films." Microscopy and Microanalysis 9, S02 (July 21, 2003): 574–75. http://dx.doi.org/10.1017/s1431927603442876.
Full textMiller, M. K., and E. A. Kenik. "Atom Probe Tomography: A Technique for Nanoscale Characterization." Microscopy and Microanalysis 10, no. 3 (June 2004): 336–41. http://dx.doi.org/10.1017/s1431927604040577.
Full textXiong, Xiangyuan, and Matthew Weyland. "Microstructural Characterization of an Al-Li-Mg-Cu Alloy by Correlative Electron Tomography and Atom Probe Tomography." Microscopy and Microanalysis 20, no. 4 (May 12, 2014): 1022–28. http://dx.doi.org/10.1017/s1431927614000798.
Full textAmouyal, Yaron, and Guido Schmitz. "Atom probe tomography—A cornerstone in materials characterization." MRS Bulletin 41, no. 1 (January 2016): 13–18. http://dx.doi.org/10.1557/mrs.2015.313.
Full textMiller, M. K., and E. A. Kenik. "Atom Probe Tomography: A Technique for Nanoscale Characterization." Microscopy and Microanalysis 8, S02 (August 2002): 1126–27. http://dx.doi.org/10.1017/s1431927602103709.
Full textPfeiffer, Björn, Torben Erichsen, Eike Epler, Cynthia A. Volkert, Piet Trompenaars, and Carsten Nowak. "Characterization of Nanoporous Materials with Atom Probe Tomography." Microscopy and Microanalysis 21, no. 3 (May 20, 2015): 557–63. http://dx.doi.org/10.1017/s1431927615000501.
Full textMartin, Andrew J., Ajay Kumar Kambham, and Ahmad D. Katnani. "Advantages and Challenges of 3-D Atom Probe Tomography Characterization of FinFETs." EDFA Technical Articles 19, no. 2 (May 1, 2017): 22–30. http://dx.doi.org/10.31399/asm.edfa.2017-2.p022.
Full textKelly, Thomas F., Osamu Nishikawa, J. A. Panitz, and Ty J. Prosa. "Prospects for Nanobiology with Atom-Probe Tomography." MRS Bulletin 34, no. 10 (October 2009): 744–50. http://dx.doi.org/10.1557/mrs2009.249.
Full textDissertations / Theses on the topic "Atom Probe Tomography Characterization"
Chang, Yanhong [Verfasser], Dierk [Akademischer Betreuer] Raabe, and Sandra [Akademischer Betreuer] Korte-Kerzel. "Characterization of H/D in Ti and its alloys with atom probe tomography / Yanhong Chang ; Dierk Raabe, Sandra Korte-Kerzel." Aachen : Universitätsbibliothek der RWTH Aachen, 2019. http://d-nb.info/1195238029/34.
Full textMühlbacher, Marlene. "High-resolution characterization of TiN diffusion barrier layers." Licentiate thesis, Linköpings universitet, Tunnfilmsfysik, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-120394.
Full textHwang, Junyeon Kaufman M. J. "Characterization and mechanical properties of nanoscale precipitates in modified Al-Si-Cu alloys using transmission electron microscopy and 3D atom probe tomography." [Denton, Tex.] : University of North Texas, 2007. http://digital.library.unt.edu/permalink/meta-dc-3661.
Full textHwang, Junyeon. "Characterization and Mechanical Properties of Nanoscale Precipitates in Modified Al-Si-Cu Alloys Using Transmission Electron Microscopy and 3D Atom Probe Tomography." Thesis, University of North Texas, 2007. https://digital.library.unt.edu/ark:/67531/metadc3661/.
Full textYu, Xinghua. "Characterization and Modeling of Heat Affected Zone Microstucture in a Blast Resistant Steel." The Ohio State University, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=osu1262201157.
Full textWithrow, Travis P. "Computational Modeling of Atom Probe Tomography." The Ohio State University, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=osu1525763934302517.
Full textEngberg, David. "Atom Probe Tomography of TiSiN Thin Films." Licentiate thesis, Linköpings universitet, Tunnfilmsfysik, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-122724.
Full textYang, Qifeng. "Atom probe tomography research on catalytic alloys and nanoparticles." Thesis, University of Oxford, 2018. http://ora.ox.ac.uk/objects/uuid:f3acdf37-3d23-4893-a4de-12e81712157a.
Full textBennett, Samantha. "Nitride semiconductors studied by atom probe tomography and correlative techniques." Thesis, University of Cambridge, 2011. https://www.repository.cam.ac.uk/handle/1810/236685.
Full textChen, Yi-Sheng. "Characterisation of hydrogen trapping in steel by atom probe tomography." Thesis, University of Oxford, 2017. http://ora.ox.ac.uk/objects/uuid:9d8ee66f-176d-4ac1-aad6-ccb33efc924d.
Full textBooks on the topic "Atom Probe Tomography Characterization"
Miller, M. K. Atom Probe Tomography. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4615-4281-0.
Full textMiller, Michael K., and Richard G. Forbes. Atom-Probe Tomography. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3.
Full textLarson, David J., Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, and Thomas F. Kelly. Local Electrode Atom Probe Tomography. New York, NY: Springer New York, 2013. http://dx.doi.org/10.1007/978-1-4614-8721-0.
Full textLarson, David J. Local electrode atom probe tomography: A user's guide. New York: Springer, 2013.
Find full textMiller, M. K. Atom probe tomography: Analysis at the atomic level. New York: Kluwer Academic / Plenum Publishers, 2000.
Find full textAtom Probe Tomography: Analysis at the Atomic Level. Boston, MA: Springer US, 2000.
Find full textP, Moody Michael, Cairney Julie M, Ringer Simon P, and SpringerLink (Online service), eds. Atom Probe Microscopy. New York, NY: Springer New York, 2012.
Find full textAtom probe tomography characterization of the solute distributions in a neutron-irradiated and annealed pressure vessel steel weld. Washington, DC: Division of Engineering Technology, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 2000.
Find full textK, Miller M., Oak Ridge National Laboratory, and U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering Technology., eds. Atom probe tomography characterization of the solute distributions in a neutron-irradiated and annealed pressure vessel steel weld. Washington, DC: U.S. Nuclear Regulatory Commission, 2000.
Find full textLefebvre, Williams, Francois Vurpillot, and Xavier Sauvage. Atom Probe Tomography. Elsevier Science & Technology Books, 2016.
Find full textBook chapters on the topic "Atom Probe Tomography Characterization"
Schreiber, Daniel, and Joseph V. Ryan. "Atom Probe Tomography of Glasses." In Modern Glass Characterization, 1–39. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2015. http://dx.doi.org/10.1002/9781119051862.ch10.
Full textBlavette, D., F. Vurpillot, B. Deconihout, and A. Menand. "Atom Probe Tomography: 3D Imaging at the Atomic Level." In Fabrication and Characterization in the Micro-Nano Range, 201–22. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-17782-8_9.
Full textZhang, Tianmu, Scott R. Broderick, and Krishna Rajan. "Topological Data Analysis for the Characterization of Atomic Scale Morphology from Atom Probe Tomography Images." In Nanoinformatics, 133–55. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-7617-6_7.
Full textLim, Yun Soo, Dong Jin Kim, and Seong Sik Hwang. "Microstructural Characterization of Proton-Irradiated 316 Stainless Steels by Transmission Electron Microscopy and Atom Probe Tomography." In The Minerals, Metals & Materials Series, 759–72. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-67244-1_49.
Full textLim, Yun Soo, Dong Jin Kim, and Seong Sik Hwang. "Microstructural Characterization of Proton-Irradiated 316 Stainless Steels by Transmission Electron Microscopy and Atom Probe Tomography." In The Minerals, Metals & Materials Series, 759–72. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-030-04639-2_49.
Full textKelly, Thomas F. "Atom-Probe Tomography." In Springer Handbook of Microscopy, 715–63. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-00069-1_15.
Full textOlszta, Matthew J., Daniel K. Schreiber, Larry E. Thomas, and Stephen M. Bruemmer. "Electron Microscopy Characterizations and Atom Probe Tomography of Intergranular Attack in Alloy 600 Exposed to PWR Primary Water." In Proceedings of the 15th International Conference on Environmental Degradation of Materials in Nuclear Power Systems — Water Reactors, 1503–17. Cham: Springer International Publishing, 2011. http://dx.doi.org/10.1007/978-3-319-48760-1_93.
Full textOlszta, Matthew J., Daniel K. Schreiber, Larry E. Thomas, and Stephen M. Bruemmer. "Electron Microscopy Characterizations and Atom Probe Tomography of Intergranular Attack in Alloy 600 Exposed to PWR Primary Water." In 15th International Conference on Environmental Degradation of Materials in Nuclear Power Systems-Water Reactors, 1503–16. Hoboken, New Jersey, Canada: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118456835.ch157.
Full textMiller, Michael K., and Richard G. Forbes. "Introduction to Atom-Probe Tomography." In Atom-Probe Tomography, 1–49. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_1.
Full textMiller, Michael K., and Richard G. Forbes. "Introduction to the Physics of Field Ion Emitters." In Atom-Probe Tomography, 51–109. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_2.
Full textConference papers on the topic "Atom Probe Tomography Characterization"
Cojocaru-Miredin, Oana, Pyuck-Pa Choi, Daniel Abou-Ras, and Dierk Raabe. "Characterization of CIGS grain boundaries using Atom Probe Tomography." In 2011 37th IEEE Photovoltaic Specialists Conference (PVSC). IEEE, 2011. http://dx.doi.org/10.1109/pvsc.2011.6186338.
Full textGorman, Brian P., Andrew G. Norman, Dan Lawrence, Ty Prosa, Harvey Guthrey, and Mowafak Al-Jassim. "Atomic scale characterization of compound semiconductors using atom probe tomography." In 2011 37th IEEE Photovoltaic Specialists Conference (PVSC). IEEE, 2011. http://dx.doi.org/10.1109/pvsc.2011.6186667.
Full textMiller, M. K., S. Venkataraman, J. Eckert, L. Schultz, and D. Sordelet. "Atom Probe Tomography Characterization of a Gas Atomized Metallic Glass." In 2006 19th International Vacuum Nanoelectronics Conference. IEEE, 2006. http://dx.doi.org/10.1109/ivnc.2006.335295.
Full textVurpillot, F., M. Gruber, S. Duguay, E. Cadel, B. Deconihout, Erik M. Secula, David G. Seiler, et al. "Modeling artifacts in the analysis of test semiconductor structures in atom probe tomography." In FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009. AIP, 2009. http://dx.doi.org/10.1063/1.3251216.
Full textWedderhoff, K., M. Ogiewa, A. Shariq, S. Teichert, David G. Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, and Erik M. Secula. "Investigation of Boron Redistribution during Silicidation in TiSi[sub 2] using Atom Probe Tomography." In FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011. AIP, 2011. http://dx.doi.org/10.1063/1.3657868.
Full textDiercks, David R., Jiaojiao Li, Joseph D. Beach, Colin A. Wolden, and Brian P. Gorman. "Atom probe tomography for nanoscale characterization of CdTe device absorber layers and interfaces." In 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC). IEEE, 2014. http://dx.doi.org/10.1109/pvsc.2014.6925241.
Full textGorman, B. P. "Atomic scale chemical and structural characterization of internal interfaces with atom probe tomography." In 2008 17th IEEE International Symposium on the Applications of Ferroelectrics (ISAF). IEEE, 2008. http://dx.doi.org/10.1109/isaf.2008.4693792.
Full textStoffers, Andreas, Oana Cojocaru-Miredin, Otwin Breitenstein, Winfried Seifert, Stefan Zaefferer, and Dierk Raabe. "Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography." In 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC). IEEE, 2014. http://dx.doi.org/10.1109/pvsc.2014.6925089.
Full textSoneda, Naoki, Kenji Nishida, Kenji Dohi, Akiyoshi Nomoto, William L. Server, Milan Brumovsky, Milos Kytka, and Jack Spanner. "Microstructural Changes Related to Through-Wall Attenuation of Neutron Irradiation Embrittlement." In ASME 2010 Pressure Vessels and Piping Division/K-PVP Conference. ASMEDC, 2010. http://dx.doi.org/10.1115/pvp2010-25636.
Full textRosseel, Thomas M., Mikhail A. Sokolov, Xiang Chen, and Randy K. Nanstad. "Current Status of the Characterization of RPV Materials Harvested From the Decommissioned Zion Unit 1 Nuclear Power Plant." In ASME 2017 Pressure Vessels and Piping Conference. American Society of Mechanical Engineers, 2017. http://dx.doi.org/10.1115/pvp2017-65090.
Full textReports on the topic "Atom Probe Tomography Characterization"
Miller, M. K. Atom Probe Tomography Characterization of the Solute Distributions in a Neutron-Irradiated and Annealed Pressure Vessel Steel Weld. Office of Scientific and Technical Information (OSTI), January 2001. http://dx.doi.org/10.2172/777685.
Full textEdmondson, Philip D. An On-Axis Tomography Holder for Correlative Electron and Atom Probe Microscopy. Office of Scientific and Technical Information (OSTI), October 2018. http://dx.doi.org/10.2172/1479802.
Full textSanford, Norman A. Laser-assisted atom probe tomography of c-plane and m-plane InGaN test structures. National Institute of Standards and Technology, April 2022. http://dx.doi.org/10.6028/nist.tn.2201.
Full textWells, Peter, and G. Robert Odette. Status Summary of FY16 Atom Probe Tomography Studies on UCSB ATR-2 Irradiated RPV Steels. Office of Scientific and Technical Information (OSTI), May 2016. http://dx.doi.org/10.2172/1364468.
Full textKnipling, Keith, Fred Meisenkothen, and Eric B. Steel. Proceedings of the International Conference on Atom-Probe Tomography and Microscopy (APT&M 2018). National Institute of Standards and Technology, December 2019. http://dx.doi.org/10.6028/nist.sp.2100-03.
Full textTiley, J., O. Senkov, G. Viswanathan, S. Nag, R. Banerjee, and J. Hwang. Determination of Gamma-Prime Site Occupancies in Nickel Superalloys Using Atom Probe Tomography and X-Ray Diffraction (Preprint). Fort Belvoir, VA: Defense Technical Information Center, August 2012. http://dx.doi.org/10.21236/ada563340.
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