Journal articles on the topic 'Atom probe tomograpghy'
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Miller, M. K. "Atom Probe Tomography: A Tutorial." Microscopy and Microanalysis 6, S2 (August 2000): 1188–89. http://dx.doi.org/10.1017/s1431927600038435.
Full textChiaramonti, Ann N., Luis Miaja-Avila, Paul T. Blanchard, David R. Diercks, Brian P. Gorman, and Norman A. Sanford. "A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source." MRS Advances 4, no. 44-45 (2019): 2367–75. http://dx.doi.org/10.1557/adv.2019.296.
Full textTakahashi, Jun, Kazuto Kawakami, and Yukiko Kobayashi. "Study on Quantitative Analysis of Carbon and Nitrogen in Stoichiometric θ-Fe3C and γ′-Fe4N by Atom Probe Tomography." Microscopy and Microanalysis 26, no. 2 (March 5, 2020): 185–93. http://dx.doi.org/10.1017/s1431927620000045.
Full textMiller, M. K. "Atom Probe Tomography Of Interfaces." Microscopy and Microanalysis 5, S2 (August 1999): 118–19. http://dx.doi.org/10.1017/s143192760001391x.
Full textFelfer, P., L. T. Stephenson, and T. Li. "Atom Probe Tomography." Practical Metallography 55, no. 8 (August 16, 2018): 515–26. http://dx.doi.org/10.3139/147.110543.
Full textKelly, Thomas F., and Michael K. Miller. "Atom probe tomography." Review of Scientific Instruments 78, no. 3 (March 2007): 031101. http://dx.doi.org/10.1063/1.2709758.
Full textMiller, M. K., and R. G. Forbes. "Atom probe tomography." Materials Characterization 60, no. 6 (June 2009): 461–69. http://dx.doi.org/10.1016/j.matchar.2009.02.007.
Full textKim, Se-Ho, Ji Yeong Lee, Jae-Pyoung Ahn, and Pyuck-Pa Choi. "Fabrication of Atom Probe Tomography Specimens from Nanoparticles Using a Fusible Bi–In–Sn Alloy as an Embedding Medium." Microscopy and Microanalysis 25, no. 2 (February 4, 2019): 438–46. http://dx.doi.org/10.1017/s1431927618015556.
Full textKelly, Thomas F., and David J. Larson. "Atom Probe Tomography 2012." Annual Review of Materials Research 42, no. 1 (August 4, 2012): 1–31. http://dx.doi.org/10.1146/annurev-matsci-070511-155007.
Full textCerezo, Alfred, Peter H. Clifton, Mark J. Galtrey, Colin J. Humphreys, Thomas F. Kelly, David J. Larson, Sergio Lozano-Perez, et al. "Atom probe tomography today." Materials Today 10, no. 12 (December 2007): 36–42. http://dx.doi.org/10.1016/s1369-7021(07)70306-1.
Full textMiller, Michael K. "Atom Probe Tomography and the Local Electrode Atom Probe." Microscopy and Microanalysis 10, S02 (August 2004): 150–51. http://dx.doi.org/10.1017/s1431927604881157.
Full textSeidman, David N., and Krystyna Stiller. "An Atom-Probe Tomography Primer." MRS Bulletin 34, no. 10 (October 2009): 717–24. http://dx.doi.org/10.1557/mrs2009.194.
Full textGeiser, Brian P., Thomas F. Kelly, David J. Larson, Jason Schneir, and Jay P. Roberts. "Spatial Distribution Maps for Atom Probe Tomography." Microscopy and Microanalysis 13, no. 6 (November 14, 2007): 437–47. http://dx.doi.org/10.1017/s1431927607070948.
Full textKasian, Olga, Simon Geiger, Tong Li, Jan-Philipp Grote, Kevin Schweinar, Siyuan Zhang, Christina Scheu, et al. "Degradation of iridium oxides via oxygen evolution from the lattice: correlating atomic scale structure with reaction mechanisms." Energy & Environmental Science 12, no. 12 (2019): 3548–55. http://dx.doi.org/10.1039/c9ee01872g.
Full textHan, Bin, Jie Wei, Feng He, Da Chen, Zhi Wang, Alice Hu, Wenzhong Zhou, and Ji Kai. "Elemental Phase Partitioning in the γ-γ″ Ni2CoFeCrNb0.15 High Entropy Alloy." Entropy 20, no. 12 (November 28, 2018): 910. http://dx.doi.org/10.3390/e20120910.
Full textvan Vreeswijk, S. H., M. Monai, R. Oord, J. E. Schmidt, E. T. C. Vogt, J. D. Poplawsky, and B. M. Weckhuysen. "Nano-scale insights regarding coke formation in zeolite SSZ-13 subject to the methanol-to-hydrocarbons reaction." Catalysis Science & Technology 12, no. 4 (2022): 1220–28. http://dx.doi.org/10.1039/d1cy01938d.
Full textLarson, David, Dan Lenz, Isabelle Martin, Ty Prosa, David Reinhard, Peter Clifton, Brian Geiser, Robert Ulfig, and Joe Bunton. "Directions in Atom Probe Tomography." Microscopy and Microanalysis 27, S1 (July 30, 2021): 2464–66. http://dx.doi.org/10.1017/s1431927621008801.
Full textBlavette, Didier, and Sébastien Duguay. "Atom probe tomography in nanoelectronics." European Physical Journal Applied Physics 68, no. 1 (September 26, 2014): 10101. http://dx.doi.org/10.1051/epjap/2014140060.
Full textReinhard, D. A., T. R. Payne, E. M. Strennen, E. Oltman, B. P. Geiser, G. S. Sobering, D. R. Lenz, et al. "Atom Probe Tomography Productivity Enhancements." Microscopy and Microanalysis 25, S2 (August 2019): 522–23. http://dx.doi.org/10.1017/s1431927619003349.
Full textGault, Baptiste, and David J. Larson. "Atom probe tomography: Looking forward." Scripta Materialia 148 (April 2018): 73–74. http://dx.doi.org/10.1016/j.scriptamat.2017.11.009.
Full textParman, S. W., D. R. Diercks, B. P. Gorman, and R. F. Cooper. "Atom probe tomography of isoferroplatinum." American Mineralogist 100, no. 4 (April 1, 2015): 852–60. http://dx.doi.org/10.2138/am-2015-4998.
Full textGnaser, Hubert. "Atom probe tomography of nanostructures." Surface and Interface Analysis 46, S1 (April 15, 2014): 383–88. http://dx.doi.org/10.1002/sia.5507.
Full textGault, Baptiste, Michael P. Moody, Frederic De Geuser, Alex La Fontaine, Leigh T. Stephenson, Daniel Haley, and Simon P. Ringer. "Spatial Resolution in Atom Probe Tomography." Microscopy and Microanalysis 16, no. 1 (January 18, 2010): 99–110. http://dx.doi.org/10.1017/s1431927609991267.
Full textArslan, I., EA Marquis, M. Homer, MA Hekmaty, and NC Bartelt. "Correlating Electron Tomography and Atom Probe Tomography." Microscopy and Microanalysis 14, S2 (August 2008): 1044–45. http://dx.doi.org/10.1017/s1431927608087746.
Full textMoody, Michael P., Baptiste Gault, Leigh T. Stephenson, Ross K. W. Marceau, Rebecca C. Powles, Anna V. Ceguerra, Andrew J. Breen, and Simon P. Ringer. "Lattice Rectification in Atom Probe Tomography: Toward True Three-Dimensional Atomic Microscopy." Microscopy and Microanalysis 17, no. 2 (March 8, 2011): 226–39. http://dx.doi.org/10.1017/s1431927610094535.
Full textRolland, Nicolas, François Vurpillot, Sébastien Duguay, and Didier Blavette. "A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography." Microscopy and Microanalysis 21, no. 6 (November 9, 2015): 1649–56. http://dx.doi.org/10.1017/s1431927615015184.
Full textXiong, Xiangyuan, and Matthew Weyland. "Microstructural Characterization of an Al-Li-Mg-Cu Alloy by Correlative Electron Tomography and Atom Probe Tomography." Microscopy and Microanalysis 20, no. 4 (May 12, 2014): 1022–28. http://dx.doi.org/10.1017/s1431927614000798.
Full textSeidman, David N. "Perspective: From field-ion microscopy of single atoms to atom-probe tomography: A journey: “Atom-probe tomography” [Rev. Sci. Instrum. 78, 031101 (2007)]." Review of Scientific Instruments 78, no. 3 (March 2007): 030901. http://dx.doi.org/10.1063/1.2716503.
Full textLa Fontaine, Alexandre, Sandra Piazolo, Patrick Trimby, Limei Yang, and Julie M. Cairney. "Laser-Assisted Atom Probe Tomography of Deformed Minerals: A Zircon Case Study." Microscopy and Microanalysis 23, no. 2 (January 30, 2017): 404–13. http://dx.doi.org/10.1017/s1431927616012745.
Full textVorlaufer, Nora, Jan Josten, Chandra Macauley, Nemanja Martić, Andreas Hutzler, Nicola Taccardi, Karl Mayrhofer, and Peter Felfer. "Atom Probe Tomography of Catalyst Nanoparticles." Microscopy and Microanalysis 28, S1 (July 22, 2022): 742–43. http://dx.doi.org/10.1017/s1431927622003427.
Full textHono, Kazuhiro, Dierk Raabe, Simon P. Ringer, and David N. Seidman. "Atom probe tomography of metallic nanostructures." MRS Bulletin 41, no. 1 (January 2016): 23–29. http://dx.doi.org/10.1557/mrs.2015.314.
Full textKelly, Thomas F., David J. Larson, Keith Thompson, Roger L. Alvis, Joseph H. Bunton, Jesse D. Olson, and Brian P. Gorman. "Atom Probe Tomography of Electronic Materials." Annual Review of Materials Research 37, no. 1 (August 2007): 681–727. http://dx.doi.org/10.1146/annurev.matsci.37.052506.084239.
Full textGault, Baptiste, Shyeh Tjing Loi, Vicente J. Araullo-Peters, Leigh T. Stephenson, Michael P. Moody, Sachin L. Shrestha, Ross K. W. Marceau, Lan Yao, Julie M. Cairney, and Simon P. Ringer. "Dynamic reconstruction for atom probe tomography." Ultramicroscopy 111, no. 11 (November 2011): 1619–24. http://dx.doi.org/10.1016/j.ultramic.2011.08.005.
Full textVurpillot, F., and C. Oberdorfer. "Modeling Atom Probe Tomography: A review." Ultramicroscopy 159 (December 2015): 202–16. http://dx.doi.org/10.1016/j.ultramic.2014.12.013.
Full textGeiser, BP, DA Reinhard, JH Bunton, TR Payne, KP Rice, Y. Chen, and DJ Larson. "Reconstruction Metrics in Atom Probe Tomography." Microscopy and Microanalysis 25, S2 (August 2019): 336–37. http://dx.doi.org/10.1017/s1431927619002411.
Full textMiller, Michael K., Thomas F. Kelly, Krishna Rajan, and Simon P. Ringer. "The future of atom probe tomography." Materials Today 15, no. 4 (April 2012): 158–65. http://dx.doi.org/10.1016/s1369-7021(12)70069-x.
Full textLarson, D. J., D. A. Reinhard, T. J. Prosa, D. Olson, D. Lawrence, P. H. Clifton, R. M. Ulfig, et al. "New Applications in Atom Probe Tomography." Microscopy and Microanalysis 18, S2 (July 2012): 926–27. http://dx.doi.org/10.1017/s1431927612006484.
Full textLarson, D. J., J. W. Valley, T. Ushikubo, M. K. Miller, H. Takamizawa, Y. Shimizu, L. M. Gordon, et al. "New Applications in Atom Probe Tomography." Microscopy and Microanalysis 19, S2 (August 2013): 1022–23. http://dx.doi.org/10.1017/s1431927613007101.
Full textHeck, Philipp R., Dieter Isheim, Michael J. Pellin, Andrew M. Davis, Anirudha V. Sumant, Orlando Auciello, Jeffrey W. Elam, et al. "Atom-Probe Tomography of Meteoritic Nanodiamonds." Microscopy and Microanalysis 20, S3 (August 2014): 1676–77. http://dx.doi.org/10.1017/s1431927614010113.
Full textMiller, M. K. "An Introduction to Atom Probe Tomography." Microscopy and Microanalysis 9, S02 (August 2003): 1558–59. http://dx.doi.org/10.1017/s143192760344779x.
Full textStiller, K., L. Viskari, G. Sundell, F. Liu, M. Thuvander, H. O. Andrén, D. J. Larson, T. Prosa, and D. Reinhard. "Atom Probe Tomography of Oxide Scales." Oxidation of Metals 79, no. 3-4 (December 21, 2012): 227–38. http://dx.doi.org/10.1007/s11085-012-9330-6.
Full textRigutti, L., B. Bonef, J. Speck, F. Tang, and R. A. Oliver. "Atom probe tomography of nitride semiconductors." Scripta Materialia 148 (April 2018): 75–81. http://dx.doi.org/10.1016/j.scriptamat.2016.12.034.
Full textRice, Katherine, Yimeng Chen, Robert Ulfig, and Tsuyoshi Onishi. "Fixturing Options for Atom Probe Tomography." Microscopy and Microanalysis 26, S2 (July 30, 2020): 2710–11. http://dx.doi.org/10.1017/s1431927620022515.
Full textMangelinck, D., F. Panciera, K. Hoummada, M. El Kousseifi, C. Perrin, M. Descoins, and A. Portavoce. "Atom probe tomography for advanced metallization." Microelectronic Engineering 120 (May 2014): 19–33. http://dx.doi.org/10.1016/j.mee.2013.12.018.
Full textKhan, Mansoor Ali, Simon P. Ringer, and Rongkun Zheng. "Atom Probe Tomography on Semiconductor Devices." Advanced Materials Interfaces 3, no. 12 (April 6, 2016): 1500713. http://dx.doi.org/10.1002/admi.201500713.
Full textFelfer, Peter J., Baptiste Gault, Gang Sha, Leigh Stephenson, Simon P. Ringer, and Julie M. Cairney. "A New Approach to the Determination of Concentration Profiles in Atom Probe Tomography." Microscopy and Microanalysis 18, no. 2 (February 3, 2012): 359–64. http://dx.doi.org/10.1017/s1431927611012530.
Full textVurpillot, Francois, Constantinos Hatzoglou, Bertrand Radiguet, Gerald Da Costa, Fabien Delaroche, and Frederic Danoix. "Enhancing Element Identification by Expectation–Maximization Method in Atom Probe Tomography." Microscopy and Microanalysis 25, no. 2 (February 28, 2019): 367–77. http://dx.doi.org/10.1017/s1431927619000138.
Full textKelly, Thomas F., Keith Thompson, Emmanuelle A. Marquis, and David J. Larson. "Atom Probe Tomography Defines Mainstream Microscopy at the Atomic Scale." Microscopy Today 14, no. 4 (July 2006): 34–41. http://dx.doi.org/10.1017/s1551929500050264.
Full textSchmitz, Guido, Constantin Ene, Ch Lang, and Vitaliy Vovk. "Atom Probe Tomography: Studying Reactions on Top of the Tip." Advances in Science and Technology 46 (October 2006): 126–35. http://dx.doi.org/10.4028/www.scientific.net/ast.46.126.
Full textOberdorfer, C., T. Withrow, L. J. Yu, K. Fisher, E. A. Marquis, and W. Windl. "Influence of surface relaxation on solute atoms positioning within atom probe tomography reconstructions." Materials Characterization 146 (December 2018): 324–35. http://dx.doi.org/10.1016/j.matchar.2018.05.014.
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