Relevant bibliographies by topics / AFM cantilever

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  2. Dissertations / Theses
  3. Book chapters
  4. Conference papers
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Academic literature on the topic 'AFM cantilever'

Author: Grafiati
Published: 4 May 2024

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Journal articles on the topic "AFM cantilever"

1

Dannberg, Oliver, and Thomas Fröhlich. "Steifigkeitsmessungen von AFM-Cantilevern." tm - Technisches Messen 88, s1 (August 24, 2021): s3—s7. http://dx.doi.org/10.1515/teme-2021-0046.

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Zusammenfassung Zur rückführbaren Kraftmessung mit AFM-Cantilevern ist aufgrund von Fertigungstoleranzen eine individuelle Kalibrierung jedes einzelnen Cantilevers notwendig. An der TU-Ilmenau wurde ein Prüfstand entwickelt, welcher die Steifigkeit nach einem statisch experimentellen Verfahren bestimmt. Dabei wird der Cantilever um einen definierten Weg ausgelenkt und die dazu notwendige Kraft gemessen. Die Wegmessung erfolgt durch ein kommerzielles Differenzinterferometer und die Kraftmessung mithilfe einer neu entwickelten Wägezelle. In diesem Artikel wird die Funktion des Prüfstandes am Beispiel einer Kalibrierung beschrieben und ein Messunsicherheitsbudget aufgestellt. Die relative Messunsicherheit beträgt ca. 1,5% bei einer maximalen Kalibrierkraft von <100 nN. Eine anschließende Untersuchung des Cantilevers ergab keine nachweisbaren Schäden an dessen Spitze.
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Slattery, Ashley D., Adam J. Blanch, Cameron J. Shearer, Andrew J. Stapleton, Renee V. Goreham, Sarah L. Harmer, Jamie S. Quinton, and Christopher T. Gibson. "Characterisation of the Material and Mechanical Properties of Atomic Force Microscope Cantilevers with a Plan-View Trapezoidal Geometry." Applied Sciences 9, no. 13 (June 27, 2019): 2604. http://dx.doi.org/10.3390/app9132604.

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Cantilever devices have found applications in numerous scientific fields and instruments, including the atomic force microscope (AFM), and as sensors to detect a wide range of chemical and biological species. The mechanical properties, in particular, the spring constant of these devices is crucial when quantifying adhesive forces, material properties of surfaces, and in determining deposited mass for sensing applications. A key component in the spring constant of a cantilever is the plan-view shape. In recent years, the trapezoidal plan-view shape has become available since it offers certain advantages to fast-scanning AFM and can improve sensor performance in fluid environments. Euler beam equations relating cantilever stiffness to the cantilever dimensions and Young’s modulus have been proven useful and are used extensively to model cantilever mechanical behaviour and calibrate the spring constant. In this work, we derive a simple correction factor to the Euler beam equation for a beam-shaped cantilever that is applicable to any cantilever with a trapezoidal plan-view shape. This correction factor is based upon previous analytical work and simplifies the application of the previous researchers formula. A correction factor to the spring constant of an AFM cantilever is also required to calculate the torque produced by the tip when it contacts the sample surface, which is also dependent on the plan-view shape. In this work, we also derive a simple expression for the torque for triangular plan-view shaped cantilevers and show that for the current generation of trapezoidal plan-view shaped AFM cantilevers, this will be a good approximation. We shall apply both these correction factors to determine Young’s modulus for a range of trapezoidal-shaped AFM cantilevers, which are specially designed for fast-scanning. These types of AFM probes are much smaller in size when compared to standard AFM probes. In the process of analysing the mechanical properties of these cantilevers, important insights are also gained into their spring constant calibration and dimensional factors that contribute to the variability in their spring constant.
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Zhao, Yu Wen, Yun Peng Song, Sen Wu, and Xing Fu. "Accurate and Traceable Calibration of the Stiffness of Various AFM Cantilevers." Key Engineering Materials 645-646 (May 2015): 817–23. http://dx.doi.org/10.4028/www.scientific.net/kem.645-646.817.

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Atomic force microscope (AFM) is widely used to measure nanoforce in the analysis of nanomechanical and biomechanical properties. As the critical factor in the nanoforce measurement, the stiffness of the AFM cantilever must be determined properly. In this paper, an accurate and SI-traceable calibration method is presented to obtain the stiffness of the AFM cantilever in the normal direction. The calibration system consists of a homemade AFM head and an ultra-precision electromagnetic balance. The calibration is based on the Hooke's law i.e. the stiffness is equal to the force divided by the deflection of the cantilever. With this system, three kinds of cantilevers were calibrated. The relative standard deviation is better than 1%. The results of these experiments showed good accuracy and repeatability.
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Cho, Ki Ho, Hak Joo Lee, Jae Hyun Kim, Jong Man Kim, Yong Kweon Kim, and Chang Wook Baek. "A Study of Nano-Indentation Test Using Rhombus-Shaped Cantilever in Atomic Force Microscope." Key Engineering Materials 326-328 (December 2006): 207–10. http://dx.doi.org/10.4028/www.scientific.net/kem.326-328.207.

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We have designed and fabricated diamond-shaped AFM cantilevers capable of performing multi-functioning tasks by using single crystal silicon (SCS) micromachining techniques. Structural improvement of the cantilever has clearly solved the crucial problems resulted from using conventional simple beam-AFM cantilever for mechanical testing. After forcecalibration of the cantilever, indentation tests are performed to determine the mechanical behaviors in micro/nano-scale as well as topographic imaging. A diamond Berkovich tip of which radius at the apex is approximately 20 nm is attached on the cantilever for the indentation test and 3D topography measurement. The indentation load-depth curves of nano-scale polymeric pattern (PAK01-UV curable blended resin) are measured and surface topography right after indenting is also obtained. Development of this novel cantilever will extend the AFM functionality into the highly sensitive mechanical testing devices in nano/pico scale.
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Dat, Le Tri, Ho Thanh Huy, and Nguyen Duy Vy. "A Theoretical Study of Deflection of AFM Bimaterial Cantilevers Versus Irradiated Position." Communications in Physics 28, no. 3 (November 14, 2018): 255. http://dx.doi.org/10.15625/0868-3166/28/3/12673.

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The bimaterial cantilevers of atomic force microscopes have been widely used in chemical and bio-sensing. Due to the difference in the thermal expansion coefficients of the two layers, the cantilever is deflected and its deflections is dependent on the heat absorption from the ambient environment or the objects adsorbed on the cantilever surface. In this study, we theoretically examine the deflection of this cantilever considering different irradiated configurations of a laser beam and thicknesses of the coating layer. We show that the temperature difference between the end and the clamped position is maximized for an irradiation at the cantilever end and this difference reduces with increasing coating thickness. Especially, the maximal deflection is seen for an irradiation in the middle of the cantilever, around 0.6 of the cantilever length from the clamped position. The obtained results could help determining an irradiated configuration of laser and the coating thickness to optimize the sensitivity of the cantilevers in thermally sensing devices.
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Boubekri, Rachida, Edmond Cambril, L. Couraud, Lorenzo Bernardi, Ali Madouri, David Martrou, and Sébastien Gauthier. "High Frequency 3C-SiC AFM Cantilever Using Thermal Actuation and Metallic Piezoresistive Detection." Materials Science Forum 711 (January 2012): 80–83. http://dx.doi.org/10.4028/www.scientific.net/msf.711.80.

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One way to improve the force sensitivity of Atomic Force Microscopy (AFM) cantilevers is to increase their resonance frequency. SiC is an excellent material for that purpose due to its high Young’s modulus and low mass density. This size reduction makes conventional optical motion detection methods inappropriate. Here, we introduce self-sensing, self-excited high frequency AFM cantilevers. The motion detection is based on the measurement of a metallic piezoresistor incorporated in the cantilever. The motion excitation is performed by electrothermal actuation using another metallic circuit. Cantilevers with sizes as low as 4 μm in length, 1.2 μm in width and 0.5 μm in thickness were realized by using different steps of e-beam lithography, deposition of thin gold films to pattern the piezoresistor and the electrothermal actuation electrode. Dry etching SF6plasma was used for etching the SiC cantilever and TMAH solution heated to 80°C to release the cantilever. In this case, a thigh control of underetching, which reduces the cantilever resonance frequency was required.
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Mordue, Christopher W., Jonathan M. R. Weaver, and Phillip S. Dobson. "Thermal induced deflection in atomic force microscopy cantilevers: analysis & solution." Measurement Science and Technology 34, no. 12 (August 25, 2023): 125013. http://dx.doi.org/10.1088/1361-6501/acf061.

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Abstract Atomic force microscopy (AFM) cantilevers are commonly made from two material layers: a reflective coating and structural substrate. Although effective, this can result in thermally induced cantilever deflection due to ambient and local temperature changes. While this has been previously documented, key aspects of this common phenomenon have been overlooked. This work explores the impact of thermally induced cantilever deflection when in- and out-of-contact, including the topographic scan artefacts produced. Scanning thermal microscopy probes were employed to provide direct cantilever temperature measurement from Peltier and microheater sources, whilst permitting cantilever deflection to be simultaneously monitored. Optical lever-based measurements of thermal deflection in the AFM were found to vary by up to 250% depending on the reflected laser spot location on the cantilever. This highlights AFM’s inherent inability to correctly measure and account for thermal induced cantilever deflection in its feedback system. This is particularly problematic when scanning a tip in-contact with the surface, when probe behaviour is closer mechanically to that of a bridge than a cantilever regarding thermal bending. In this case, measurements of cantilever deflection and inferred surface topography contained significant artefacts and varied from negative to positive for different optical lever laser locations on the cantilevers. These topographic errors were measured to be up to 600 nm for a small temperature change of 2 K. However, all cantilevers measured showed a point of consistent, complete thermal deflection insensitivity 55% to 60% along their lengths. Positioning the reflected laser at this location, AFM scans exhibited improvements of up-to 97% in thermal topographic artefacts relative to other laser positions.
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Damircheli, Mehrnoosh, and Babak Eslami. "Design of V-shaped cantilevers for enhanced multifrequency AFM measurements." Beilstein Journal of Nanotechnology 11 (October 6, 2020): 1525–41. http://dx.doi.org/10.3762/bjnano.11.135.

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As the application of atomic force microscopy (AFM) in soft matter characterization has expanded, the use of different types of cantilevers for these studies have also increased. One of the most common types of cantilevers used in soft matter imaging is V-shaped cantilevers due to their low normal spring constant. These types of cantilevers are also suitable for nanomanipulation due to their high lateral spring constants. The combination of low normal spring constant and high lateral spring constants makes V-shaped cantilevers promising candidates for imaging soft matter. Although these cantilevers are widely used in the field, there are no studies on the static and dynamic behavior of V-shaped cantilevers in multifrequency AFM due to their complex geometry. In this work, the static and dynamic properties of V-shaped cantilevers are studied while investigating their performance in multifrequency AFM (specifically bimodal AFM). By modeling the cantilevers based on Timoshenko beam theory, the geometrical dimensions such as length, base width, leg width and thickness are studied. By finding the static properties (mass, spring constants) and dynamic properties (resonance frequencies and quality factors) for different geometrical dimensions, the optimum V-shaped cantilever that can provide the maximum phase contrast in bimodal AFM between gold (Au) and polystyrene (PS) is found. Based on this study, it is found that as the length of the cantilever increases the 2nd eigenmode phase contrast decreases. However, the base width exhibits the opposite relationship. It is also found that the leg width does not have a monotone relationship similar to length and base width. The phase contrast increases for the range of 14 to 32 µm but decreases afterwards. The thickness of a V-shaped cantilever does not play a major role in defining the dynamics of the cantilever compared to other parameters. This work shows that in order to maximize the phase contrast, the ratio of second to first eigenmode frequencies should be minimized and be close to a whole number. Additionally, since V-shaped cantilevers are mostly used for soft matter imaging, lower frequency ratios dictate lower spring constant ratios, which can be advantageous due to lower forces applied to the surface by the tip given a sufficiently high first eigenmode frequency. Finally, two commercially available V-shaped cantilevers are theoretically and experimentally benchmarked with an optimum rectangular cantilever. Two sets of bimodal AFM experiments are carried out on Au-PS and PS-LDPE (polystyrene and low-density polyethylene) samples to verify the simulation results.
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Liu, Hao, Zuned Ahmed, Sasa Vranjkovic, Manfred Parschau, Andrada-Oana Mandru, and Hans J. Hug. "A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy." Beilstein Journal of Nanotechnology 13 (October 11, 2022): 1120–40. http://dx.doi.org/10.3762/bjnano.13.95.

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Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices. Current instruments permit robust scanning over large areas, atomic-scale lateral resolution, and the characterization of various sample properties using multifrequency and multimodal AFM operation modes. Research of new quantum materials and devices, however, often requires low temperatures and ultrahigh vacuum (UHV) conditions and, more specifically, AFM instrumentation providing atomic resolution. For this, AFM instrumentation based on a tuning fork force sensor became increasingly popular. In comparison to microfabricated cantilevers, the more macroscopic tuning forks, however, lack sensitivity, which limits the measurement bandwidth. Moreover, multimodal and multifrequency techniques, such as those available in cantilever-based AFM carried out under ambient conditions, are challenging to implement. In this article, we describe a cantilever-based low-temperature UHV AFM setup that allows one to transfer the versatile AFM techniques developed for ambient conditions to UHV and low-temperature conditions. We demonstrate that such a cantilever-based AFM offers experimental flexibility by permitting multimodal or multifrequency operations with superior force derivative sensitivities and bandwidths. Our instrument has a sub-picometer gap stability and can simultaneously map not only vertical and lateral forces with atomic-scale resolution, but also perform rapid overview scans with the tip kept at larger tip–sample distances for robust imaging.
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Yeh, Meng Kao, Bo Yi Chen, Nyan Hwa Tai, and Chien Chao Chiu. "Force Measurement by AFM Cantilever with Different Coating Layers." Key Engineering Materials 326-328 (December 2006): 377–80. http://dx.doi.org/10.4028/www.scientific.net/kem.326-328.377.

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Atomic force microscopy (AFM) is widely used in many fields, because of its outstanding force measurement ability in nano scale. Some coating layers are used to enhance the signal intensity, but these coating layers affect the spring constant of AFM cantilever and the accuracy of force measurement. In this paper, the spring constants of rectangular cantilever with different coating thickness were quantitatively measured and discussed. The finite element method was used to analyze the nonlinear force-displacement behavior from which the cantilever’s normal and torsional spring constants could be determined. The experimental data and the numerical results were also compared with the results from other methods. By considering the influence of coating layers and real cantilever geometries, the more accurate force measurements by AFM cantilever can be obtained.
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Dissertations / Theses on the topic "AFM cantilever"

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Dharmasena, Sajith Mevan. "A Multi-Channel Micromechanical Cantilever for Advanced Multi-Modal Atomic Force Microscopy." The Ohio State University, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=osu1565883484835926.

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Parkin, John D. "Microcantilevers : calibration of their spring constants and use as ultrasensitive probes of adsorbed mass." Thesis, University of St Andrews, 2013. http://hdl.handle.net/10023/3608.

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The dynamic properties of several rectangular and V-shaped microcantilevers were investigated. Particular attention was paid to the higher flexural eigenmodes of oscillation. The potential of the higher flexural modes was demonstrated through the use of cantilevers as standalone sensors for adsorbed mass. The mass adsorbed on the surface of a cantilever was in the form of a homogeneous water layer measured as a function of relative humidity. The minimum detectable water layer thicknesses were 13.7 Å, 3.2 Å, 1.1 Å, and 0.7 Å for the first four modes of a rectangular cantilever, clearly demonstrating enhanced accuracy for the higher eigenmodes of oscillation. These thicknesses correspond to minimum detectable masses of 33.5 pg, 7.8 pg, 2.7 pg and 1.7 pg for the first four modes. For quantitative applications the spring constants of each cantilever must be determined. Many methods exist but only a small number can calibrate the higher flexural eigenmodes. A method was developed to simultaneously calibrate all flexural modes of microcantilever sensors. The method was demonstrated for the first four eigenmodes of several rectangular and V-shaped cantilevers with nominal fundamental spring constants in the range of 0.03 to 1.75 N/m. The spring constants were determined with accuracies of 5-10 %. Spring constants of the fundamental mode were generally in agreement with those determined using the Sader method. The method is compatible with existing AFM systems. It relies on a flow of gas from a microchannel and as such poses no risk of damage to the cantilever beam, its tip, or any coating. A related method was developed for the torsional modes of oscillation. Preliminary results are shown for the fundamental mode of a rectangular cantilever. The method can be easily extended to the higher torsional modes, V-shaped cantilevers, and potentially, the flapping modes of the legs of V-shaped microcantilevers.
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Jarmusik, Keith Edward. "An Improved Model for Interpreting Molecular Scale Electrostatic Interactions." Case Western Reserve University School of Graduate Studies / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=case1275666964.

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Arecco, Daniel. "Analysis and preliminary characterization of a MEMS cantilever-type chemical sensor." Digital WPI, 2004. https://digitalcommons.wpi.edu/etd-theses/806.

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This Thesis relates to the continually advancing field of microelectromechanical systems (MEMS). With MEMS technology, there are many different areas of concentration available for research. This Thesis addresses analysis and preliminary characterization of a cantilever-type MEMS chemical sensor for detection of chemicals and organic components operating at room temperature (20˚C and sea level pressure of 1 atm). Such sensors can be useful in a wide variety of applications. There currently exist several different types of MEMS chemical sensors. Each is based on a different detection method, e.g., capacitive, thermal, resistive, etc., and is used for specific tasks. Out of all currently available detection methods, the most common is the gravimetric method. The gravimetric sensor works by absorbing the chemical in a special material, usually a polymer, which alters the overall mass of the sensing element that can then be measured, or detected, to identify the chemical absorbed. One of the more exciting developments in the field of gravimetric chemical MEMS has been with the advancement of cantilever-type sensors. These cantilevers are small and usually on the order of only about 300 m in length. In order to utilize the gravimetric method, a cantilever is coated with a polymer that allows an analyte to bond to it and change its mass, which in turn changes the resonant frequency of the cantilever. The change in frequency can then be measured and analyzed and from it, the amount of absorbed mass can be calculated. Current research in the cantilever-type resonating sensors for the detection of hydrogen is developing measurement capabilities of 1 ppm (part-per-million). In this Thesis number of sample cantilevers were qualitatively assessed and their dimensional geometry measured. Based on these measurements, frequency data were obtained. In addition, the overall uncertainty in the resonant frequency results was calculated and the contributing factors to this uncertainty were investigated. Experimental methods that include laser vibrometry, optoelectronic laser interferometric microscopy (OELIM), and atomic force microscopy (AFM), were utilized to measure the frequency responses of the samples. The analytically predicted natural frequencies were compared to the experimental data to determine correlation subject to the uncertainty analysis. Parametric analyses involving chemical absorption processes were also conducted. Such analyses considered different parameters, e.g., damping and stiffness as well as changes in their values, to determine contributions they make to the quality of the frequency data and the effect they have on sensitivity of the MEMS cantilever-type chemical sensors. Once these parametric analyses were completed, it was possible to estimate the sensitivity of the cantilever, or the ability for the cantilever to detect frequency shifts due to absorption of the target chemical. Results of the parametric analyses of the fundamental resonant frequency were then correlated with the sensitivity results based on the chemical absorption. This Thesis correlates many results and ideas and probes problems revolving around the analysis and characterization of a MEMS cantilever-type chemical sensor.
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Jiao, Sai. "Etude de la croisssance CVD des films minces de 3C-SiC et élaboration du cantilever AFM en 3C-SiC avec pointe Si intégrée." Thesis, Tours, 2012. http://www.theses.fr/2012TOUR4021/document.

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Parmi les polytypes les plus connus du carbure de silicium (SiC), le polytype cubique (3C-SiC), est le seul qui peut croitre sur des substrats silicium. L’hétérostructure 3C-SiC/Si est intéressante non seulement pour son faible coût de production mais aussi pour la conception de Systèmes Micro-Electro-Mécaniques (« MEMS »). La valeur élevée du module de Young du 3C-SiC, comparé à celui du silicium, permettrait à des cantilevers submicroniques, fabriqués à partir de films minces de 3C-SiC, de vibrer à ultra-hautes fréquences (>100MHz). Cette haute fréquence de résonance est la clé pour obtenir un système AFM non-contact ultra-sensible et rapide. Cependant, il n’existe pas de cantilever en SiC disponible sur le marché en raison de la difficulté à élaborer des films minces de 3C-SiC de bonne qualité, la technique de synthèse la plus utilisée étant le Dépôt Chimique en phase Vapeur (CVD). La raison première de cette difficulté à obtenir un matériau de bonne qualité réside essentiellement dans l’important désaccord de maille et la différence de dilatation thermique entre le 3C-SiC et Si qui génèrent des défauts cristallins à l’interface et jusqu’à la surface du film de 3C-SiC, la zone la plus défectueuse se localisant auprès de l’interface……
Among aIl the well known polytypes ofihe silicon carbide (SiC), the cubic polytype (3C-SiC) is the only one that min be grown on silicon substrates. This heterostructure 3C SiC/Si ta interesting not only for its low production cost but also for the design of tise Micro-Electro-Mechanical Systems (MEMS). The high value ofthe Young’s modulis the 3C-SiC, compared to the silicon, allows submicronic cantilevers, fabrmcated from tIse 3C-SiC thin filins, to resonate at ultra-high frequency (>100MHz). The high resonant frequency is the key to obtain s fast, ultra-sensitive non-contact AFM systein.However, there isn’t any SiC cantilevers available on the market because of the difficulty to elaborate gond quality 3C-SiC thin films, with tIse Chemical Vapor Deposition (CVD) technique being tIse most frequently used synthesis technology. Tise first reason of tIse difficulty with the CVD technology to obtain gond quality thin film rests essentially in the important lattice mismatch and the difference in thermal expansion coefficient existing between 3C SiC and Si which generate crystalline defects at the interface and propagating tilI the 3C-SiC filin surface, with the inost defective zone localizing near the interface……
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Cate, Evan Derek. "Design, Implementation, and Test of a Micro Force Displacement System." DigitalCommons@CalPoly, 2014. https://digitalcommons.calpoly.edu/theses/1192.

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The design and implementation of a micro-force displacement system was completed to test the force-displacement characteristics of square silicon diaphragms with side lengths of 4mm, 5mm, and 7mm with a thickness of 10um. The system utilizes a World Precision Instruments Fort 10g force transducer attached to a World Precession Instruments TBM4M amplifier. A Keithley 2400 source meter provided data acquisition of the force component of the system. A micro prober tip was utilized as the testing probe attached to the force transducer with a tip radius of 5um. The displacement of samples was measured using a Newport M433 linear stage driven by a Newport ESP300 motion controller (force readings at constant displacement intervals). An additional 3 linear stages were used to provide X and Y-axis positioning of samples beneath the probe tip. The system components were mounted to an optical bench to provide stability during testing. C# was used to deliver the code to the individual components of the system. In addition the software provides a graphic user interface for future users that includes a calibration utility (both X/Y and force calibration), live force-displacement graph, motion control, and a live video feed for sample alignment. Calibration of the force transducer was accomplished using an Adam Equipment PGW153e precision balance to assign force values to the voltage data produced from the transducer. Displacement calibration involved the use of a microscope calibration micrometer. The system was characterized with an equipment variability of ±1.02mg at 1.75um, and ±1.86mg at 3.5um with the ability to characterize samples with stiffness less than 279 mg/um. The displacement resolution of the system was determined to be 35 nm per step of the linear stages. The diaphragms created to test the machine were fabricated from 10um thick device layer SOI wafers. An etch consisting of 38g/l silicic acid, 7g/l ammonium persulfate, and 5% TMAH was used to reduce the formation of hillocks, and provide a consistent etch rate. A Gage R&R study was performed on the fabricated diaphragms, indicating that the deflection produced by the 4mm, 5mm, and 7mm diaphragms was resolvable by the machine. A model was developed to correlate theoretical results to the observed measured values.
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Lee, Sunyoung S. M. Massachusetts Institute of Technology. "Chemical functionalization of AFM cantilevers." Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/34205.

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Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2005.
Includes bibliographical references (p. 47-52).
Atomic force microscopy (AFM) has been a powerful instrument that provides nanoscale imaging of surface features, mainly of rigid metal or ceramic surfaces that can be insulators as well as conductors. Since it has been demonstrated that AFM could be used in aqueous environment such as in water or various buffers from which physiological condition can be maintained, the scope of the application of this imaging technique has been expanded to soft biological materials. In addition, the main usage of AFM has been to image the material and provide the shape of surface, which has also been diversified to molecular-recognition imaging - functional force imaging through force spectroscopy and modification of AFM cantilevers. By immobilizing of certain molecules at the end of AFM cantilever, specific molecules or functionalities can be detected by the combination of intrinsic feature of AFM and chemical modification technique of AFM cantilever. The surface molecule that is complementary to the molecule at the end of AFM probe can be investigated via specificity of molecule-molecule interaction.
(cont.) Thus, this AFM cantilever chemistry, or chemical functionalization of AFM cantilever for the purpose of chemomechanical surface characterization, can be considered as an infinite source of applications important to understanding biological materials and material interactions. This thesis is mainly focused on three parts: (1) AFM cantilever chemistry that introduces specific protocols in details such as adsorption method, gold chemistry, and silicon nitride cantilever modification; (2) validation of cantilever chemistry such as X-ray photoelectron spectroscopy (XPS), AFM blocking experiment, and fluorescence microscopy, through which various AFM cantilever chemistry is verified; and (3) application of cantilever chemistry, especially toward the potential of force spectroscopy and the imaging of biological material surfaces.
by Sunyoung Lee.
S.M.
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Liu, Zhen. "Reconstruction and Control of Tip Position and Dynamic Sensing of Interaction Force for Micro-Cantilever to Enable High Speed and High Resolution Dynamic Atomic Force Microscopy." The Ohio State University, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=osu1483629656167247.

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PUKHOVA, VALENTINA. "DYNAMIC ATOMIC FORCE MICROSCOPY RESOLVED BY WAVELET TRANSFORM." Doctoral thesis, Università degli Studi di Milano, 2015. http://hdl.handle.net/2434/259234.

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Atomic Force Microscopy (AFM) is perhaps the most significant member of the scanning probe microscopes family and, because of its capability of working in air and liquid environments with virtually no limitations on imaging conditions and types of samples, it is definitely one of the most widely used. It has become an indispensable tool to measure mechanical properties at the nanoscale in various research contexts. Scanning probes used in AFM are micromechanical oscillators (typically cantilevers) and the theory of AFM dynamics is based on the analysis of the oscillating modes of beam resonators or the simpler spring-mass model. Cantilevers can be driven by the thermal excitation and/or an external driver. Usually cantilevers are driven near resonances corresponding to flexural eigenmodes that can be described as damped harmonic oscillators. Advanced techniques consider multifrequency excitation or band excitation to broaden the measurable events in tip-sample interactions, thus expanding the variety of sample properties that can be accessed. Multifrequency methods imply excitation and/or detection of several frequencies of the cantilever oscillations and concern the associated nonlinear cantilever dynamics. Such excitation/detection schemes provide higher resolution and sensitivity to materials properties such as the elastic constants and the sample chemical environment with lateral resolution in the nanometer range. In order to measure these parameters, information on peak force of interaction, energy dissipation and contact dynamics is required. Techniques to measure the parameters of the cantilever in the stationary regime are well established. In dynamics methods the external driver (thermal noise, piezoelectric driver, etc.) excites the cantilever and a number of techniques have been implemented to gain information from the tip-sample interactions, but usually the interaction of the tip with the surface is revealed by the modification of the average value of the amplitude, frequency or phase shift over many oscillation cycles. Reconstruction of the complete evolution of the interaction force between the tip and the sample surface during a single interaction event is not even considered. As an alternative to these well established techniques and to push further the AFM possibilities, it is important to examine the possibility of analyzing single-event or impulsive interactions. This opens the possibility to capture the information conveyed by the sensing tip in a single interaction, in contrast to the cycle average used in many dynamic techniques. The single-event interactions are basically of the impact kind, with the simultaneous excitation of many cantilever eigenmodes and/or harmonics. The averaging techniques provide superior sensibility, allowing to probe the details of force interactions down to the molecular level, but to study single-event interactions it is mandatory to provide analysis techniques that are able to characterize all excited cantilever oscillation modes at once without averaging. The temporal evolution of the amplitude, phase and frequency during few oscillation cycles of the cantilever provides information that cannot be obtained with standard methods. In the present thesis a data analysis method allowing to retrieve these quantities during an impulsive cantilever excitation is proposed. This thesis concentrates on the dynamics of the flexural modes of the thermally driven cantilever in air when its tip is excited by a single impact on the sample surface. The signal analysis is based on the combination of wavelet and Fourier transforms that can be applied to a broad class of AFM impulsive measurements. To exemplify the method, a short time interval around the jump-to-contact (JTC) transition in ambient conditions is investigated, with the aim to characterize the transient excitation of the cantilever eigenmodes before and after the impact. The experimental evidences that high-order flexural modes are excited in air upon a single impact tip–sample interaction induced by the JTC transition are presented. The way to retrieve information about the instantaneous total force act ing on the cantilever tip, contact dynamics and energy dissipation at all frequencies simultaneously, without averaging or interruption, is developed. The exploration of these transient conditions of the cantilever is not possible with dynamic techniques based on the resonant driving or using Fourier transform analysis alone. The analysis presented in this work is useful to deal with nonrepeatable experiments and to determine the exact single interaction dynamics in terms of the full cantilever spectral excitations, features that are not normally considered in dynamical AFM techniques.
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Brook, Alexander J. "Micromachined III-V cantilevers for AFM-guided scanning Hall probe microscopy." Thesis, University of Bath, 2003. https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.425887.

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Book chapters on the topic "AFM cantilever"

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Xia, Fangzhou, Ivo W. Rangelow, and Kamal Youcef-Toumi. "Nanofabrication of AFM Cantilever Probes." In Active Probe Atomic Force Microscopy, 109–50. Cham: Springer International Publishing, 2024. http://dx.doi.org/10.1007/978-3-031-44233-9_5.

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Kiracofe, Daniel, John Melcher, and Arvind Raman. "Fundamentals of AFM Cantilever Dynamics in Liquid Environments." In Atomic Force Microscopy in Liquid, 121–55. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527649808.ch5.

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Yeh, Meng Kao, Bo Yi Chen, Nyan Hwa Tai, and Chien Chao Chiu. "Force Measurement by AFM Cantilever with Different Coating Layers." In Experimental Mechanics in Nano and Biotechnology, 377–80. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-415-4.377.

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Lange, D., M. Zimmermann, C. Hagleitner, O. Brand, and H. Baltes. "CMOS 10-Cantilever Array for Constant-Force Parallel Scanning AFM." In Transducers ’01 Eurosensors XV, 1046–49. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-642-59497-7_247.

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Shie, N. C., T. L. Chen, and Kai Yuan Cheng. "Use of Fiber Interferometer for AFM Cantilever Probe Displacement Control." In Key Engineering Materials, 77–82. Stafa: Trans Tech Publications Ltd., 2005. http://dx.doi.org/10.4028/0-87849-977-6.77.

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Park, Jeong Woo, Deug Woo Lee, Noboru Takano, and Noboru Morita. "Diamond Tip Cantilever for Micro/Nano Machining Based on AFM." In Materials Science Forum, 79–84. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-990-3.79.

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Yabuno, Hiorshi, Masaharu Kuroda, and Takashi Someya. "Contact to Sample Surface by Self-excited Micro-cantilever Probe in AFM." In IUTAM Symposium on Dynamics Modeling and Interaction Control in Virtual and Real Environments, 27–33. Dordrecht: Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-94-007-1643-8_4.

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Chui, B. W., T. W. Kenny, H. J. Mamin, B. D. Terris, and D. Rugar. "Dual-Axis Piezoresistive AFM Cantilever for Independent Detection of Vertical and Lateral Forces." In Tribology Issues and Opportunities in MEMS, 301–12. Dordrecht: Springer Netherlands, 1998. http://dx.doi.org/10.1007/978-94-011-5050-7_22.

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Kranz, Christine, Boris Mizaikoff, Alois Lugstein, and Emmerich Bertagnolli. "Integrating an Ultramicroelectrode in an AFM Cantilever: Toward the Development of Combined Microsensing Imaging Tools." In Environmental Electrochemistry, 320–33. Washington, DC: American Chemical Society, 2002. http://dx.doi.org/10.1021/bk-2002-0811.ch017.

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Arinero, Richard, and Gérard Lévêque. "One-Dimensional Finite Element Modeling of AFM Cantilevers." In Acoustic Scanning Probe Microscopy, 101–22. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-27494-7_4.

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Conference papers on the topic "AFM cantilever"

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Chigullapalli, Aarti, and Jason V. Clark. "Modeling the Thermomechanical Interaction Between an Atomic Force Microscope Cantilever and Laser Light." In ASME 2012 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2012. http://dx.doi.org/10.1115/imece2012-89215.

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In this paper, we present the first computational model of the thermomechanical interaction between an atomic force microscope (AFM) cantilever and laser light. We validate simulation with experiment. Design parameters of our model include AFM laser power, laser spot position, and geometric and material properties of the cantilever. In the area of nanotechnology, the laser beam deflection method has been widely used in AFMs for detecting the cantilever’s deflection and resonance frequency. The laser deflection method consists of reflecting a laser beam off of an AFM cantilever onto a photo diode, which is converted to a voltage signal. Deflection of the cantilever results in a change in the laser reflection angle and a change in voltage signal. The mechanical properties of the cantilever affect the amount of deflection. Although much work has been done on increasing the sensitivity of the AFM, little work has been done on investigating the thermal effect of the laser-cantilever interaction. We observe that laser-induced thermal expansions in the AFM cantilever are measureable. Our simulated results suggest that both the laser power and spot positions significantly change the resonant response of the cantilevers. The resonance response is critical for the AFM tapping mode. In considering various laser powers, we observe that as we increase the power, the average temperature of the beam increases, which causes a decrease in resonance frequency. In considering various laser reflection spot positions, we find that as the laser spot moves away from the clamped end of the cantilever, the dissipation to the sample which is 6 m below the cantilever tip decreases, causing an increase in temperature but decrease in material softening. The results of our models are close to the experimental results with a relative error of 0.1%.
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Moeini, S. A., M. H. Kahrobaiyan, M. Rahaeifard, and M. T. Ahmadian. "Optimization of First Mode Sensitivity of V-Shaped AFM Cantilever Using Genetic Algorithm Method." In ASME 2009 International Mechanical Engineering Congress and Exposition. ASMEDC, 2009. http://dx.doi.org/10.1115/imece2009-12554.

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Atomic force microscopes (AFM) are widely used for feature detection and scanning surface topography of different materials. Contrast of topography images is significantly influenced by the sensitivity of AFM micro cantilever which means enhancement of sensitivity leads to increase of topography images resolution So, in the last years numerous scientists interested in studying the effects of different parameters such as geometric one on the sensitivity of AFM micro cantilevers. V-shape micro cantilever types of AFMs probe are widely used to scan various types of surfaces. In V-shape micro cantilevers, there are many geometric and design parameters which influence the flexural sensitivity of the micro beam, noticeably. In this paper evaluation of optimum geometric parameters and optimum cantilever slope is considered as a significant purpose in order to obtain maximum flexural sensitivity by using genetic algorithm optimization method. In the calculations, the normal and lateral interaction forces between AFM tip and sample surface is considered and modeled by linear springs which represent the contact stiffness of the sample surface. Also, a relation for flexural sensitivity of AFM cantilever as a function of geometric parameters and cantilever slope is derived which is used in optimization step by employing a genetic algorithm program. Using genetic algorithm method, the optimum geometric parameters and cantilever slope are calculated which maximize the flexural sensitivity of the first mode of a V-shape cantilever for various values of normal contact stiffness. These optimum parameters versus normal contact stiffness are presented in some result figures. The results show that for any contact stiffness, there are a cantilever slope and a set of geometrical parameters which provide the maximum sensitivity for AFM probe. Adopting these parameters for the design of V-shape micro cantilever according to the sample contact stiffness, maximum flexural sensitivity can be obtained, so that high contrast images are reachable.
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Lee, Jungchul, Tanya L. Wright, Mark Abel, Erik Sunden, Alexei Marchenkov, Samuel Graham, and William P. King. "Characterization of Heated Atomic Force Microscope Cantilevers in Air and Vacuum." In ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/ipack2005-73456.

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This paper presents characterization of heated atomic force microscope (AFM) cantilevers in air and helium, both at atmospheric pressure and in a partially evacuated environment. The cantilevers are made of doped single-crystal silicon using a standard silicon-on-insulator cantilever fabrication process. The electrical measurements show the link between the cantilever temperature-dependant electrical characteristics, electrical resistive heating, and thermal properties of the heated AFM cantilever and its surroundings. Laser Raman thermometry measures temperature along the cantilever with resolution near 1 μm and 4°C. By modulating the gaseous environment surrounding the cantilever, it is possible to estimate the microscale thermal coupling between the cantilever and its environment. This work seeks to improve the calibration and design of heated AFM cantilevers.
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Shen, Sheng, Avind Narayanaswamy, Shireen Goh, and Gang Chen. "Thermal Conductance of Bi-Material AFM Cantilevers." In ASME 2008 International Mechanical Engineering Congress and Exposition. ASMEDC, 2008. http://dx.doi.org/10.1115/imece2008-68078.

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In this letter, based on the beam theory and the thermal analysis of a bi-material cantilever, we demonstrate that the effective thermal conductance of the cantilever and the temperature at the tip of the cantilever can be determined by measuring the bending of the cantilever in response to two different thermal inputs: power absorbed at the tip and ambient temperature. The bi-material cantilevers were first introduced as a calorimeter to measure the heat generated in chemical reactions. [1] The same device was demonstrated to be sensitive enough to measure power as small as 100 pW or energy of 150 fJ in photothermal measurements. [2] They were also used as IR detectors [3, 4, 5] or as scanning thermal imaging probes. [6] Although the bi-material cantilevers are often used as temperature or heat flux sensors based on the beam bending due to the unequal thermal expansion of the two materials, the exact temperature at the tip of the cantilever is usually unknown. Directly measuring the temperature is difficult due to the small geometry of the cantilever structure. To find out the temperature of the cantilever, one should obtain the thermal conductance of the cantilever. However, since the thermal properties of two layers of the cantilever are dependent on their thickness, one cannot rely on theoretical calculation. In this letter, we develop a technique to determine the thermal conductance of the cantilever by measuring the bending of the cantilever in response to the variations of the absorbed power at the tip and the ambient temperature. A triangular silicon nitride cantilever coated with 70 nm gold film is used in the current experiment. As shown in Fig.1 (a), a semiconductor laser beam is focused on the tip of the cantilever and reflected onto a position sensing detector (PSD). The deflection of the reflected laser beam spot on the PSD is used as a measure of the deflection of the cantilever. A part of the laser power is absorbed by the cantilever and thus creates a temperature rise at the end of the cantilever. The output of the PSD is converted into an X or Y signal corresponding to the position of the laser spot on the PSD and a sum signal proportional to the incident laser power.
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Rubio-Sierra, F. J., R. Vazquez, and R. W. Stark. "Transfer Function Analysis of Atomic Force Microscope Cantilevers." In ASME 2005 International Mechanical Engineering Congress and Exposition. ASMEDC, 2005. http://dx.doi.org/10.1115/imece2005-81156.

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Current methods to study atomic force microscope (AFM) cantilever dynamics use model simplification or are based on the non-trivial solution of the equation of motion. As an alternative method, transfer function analysis gives a more complete description of system dynamics. In this work a transfer function study of two different AFM configurations, the point force and base driven cantilever, is presented. Exact analytical expressions of the infinite dimensional transfer function are derived for cantilever deflection and slope along the cantilever. Frequency response and transfer function infinite product expansion are obtained for the case where system outputs are set at the free end of the cantilever. The frequency response reflects the full complexity of cantilever dynamics affected by the presence of an infinite number of poles and zeros. An analytical expression for all the zeros and poles of the system is obtained. From the frequency response and pole-zero investigations it is shown how cantilever actuation and output measurement affect AFM operation and cantilever dynamics modelling. Transfer function analysis of AFM cantilevers opens the possibility of model based AFM operation to increase imaging and manipulation performance.
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Suter, Kaspar. "Tuning Fork AFM with Conductive Cantilever." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639700.

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Dutta, Sudipta, Mahesh Kumar Singh, and M. S. Bobji. "PROBING ATOMIC LEVEL INTERACTIONS IN NI NANORODS AND AFM CANTILEVER USING ATOMIC FORCE MICROSCOPY BASED F–D SPECTROSCOPY." In BALTTRIB. Aleksandras Stulginskis University, 2017. http://dx.doi.org/10.15544/balttrib.2017.34.

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Atomic force microscopy based force-displacement spectroscopy is used to quantify magnetic interaction force between sample and magnetic cantilever. AFM based F–D spectroscopy is used widely to understand various surface-surface interaction at small scale. Here we have studied the interaction between a magnetic nanocomposite and AFM cantilevers. Two different AFM cantilever with same stiffness but with and without magnetic coating is used to obtain F–D spectra in AFM. The composite used has magnetic Ni nanophase distributed uniformly in an Alumina matrix. Retrace curves obtained using both the cantilevers on magnetic composite and sapphire substrate are compared. It is found for magnetic sample cantilever comes out of contact after traveling 100 nm distance from the actual point of contact. We have also used MFM imaging at various lift height and found that beyond 100nm lift height magnetic contrast is lost for our composite sample, which further confirms our F–D observation.
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Kumanchik, Lee, Tony Schmitz, Jon Pratt, and John Ziegert. "Full Field Displacement Measurements of AFM Cantilevers During Loading." In ASME 2007 International Manufacturing Science and Engineering Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/msec2007-31041.

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Research collaboration between the University of Florida and National Institute of Standards and Technology is focused on the development of a reference standard for atomic force microscope (AFM) cantilever stiffness calibration. The end goal is production of flexure-based artifacts that exhibit low fabrication expense, stiffness adjustability by design, insensitivity to load application point, mechanical robustness, and good reproducibility. Experimental determination of AFM cantilever spring constants is important because the measured forces are inferred from the cantilever displacement and a linear relationship between force and displacement. As a first step in this study, we have constructed a test setup that enables us to: 1) monitor AFM cantilever behavior during loading; and 2) record the shape of the cantilever under test during contact to better understand boundary conditions. The fundamental metrology tool employed by the test setup is a three-dimensional optical profiler, or scanning white light interferometer. By locating the cantilever (and test surface) within the measurement area of the profiler, we are able to record “snapshots” of the cantilever shape under various loading conditions. Given the deflected shape, we can make comparisons between the actual shape and the profile that would be obtained by ideal (fixed-free) boundary conditions. Results for cantilevers with various stiffness values (spanning four orders of magnitude) are presented and comparisons with ideal deflected shapes are provided.
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King, William P., Thomas W. Kenny, and Kenneth E. Goodson. "Comparison of Piezoresistive and Thermal Detection Approaches to Atomic Force Microscopy Topography Measurement." In ASME 2002 International Mechanical Engineering Congress and Exposition. ASMEDC, 2002. http://dx.doi.org/10.1115/imece2002-33295.

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Atomic force microscope (AFM) cantilevers with integrated heaters can topographically map a surface with sub-nanometer vertical resolution, and lateral resolution defined by the shape of the tip. As a resistively heated atomic force microscope (AFM) cantilever scans over a surface, the conductance from the cantilever depends upon the distance between the cantilever to the substrate. By measuring the cantilever electrical resitance signal, which is a function of cantilever temperature, it is possible to topographically map surfaces based. This paper models thermal conductance from the cantilever to make predictions of cantilever sensitivity that compare well with data. The model also predicts noise-limited resolution. Comparing the thermal cantilever with an identically-sized piezoresistive cantilever, the thermal cantilever provides two to four orders of magnitude improvement in sensitivity and up to two orders of magnitude resolution improvement over the piezoresistive cantilever.
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Chakraborty, Ishita, and Balakumar Balachandran. "Noise and Contact in Dynamic AFM Operations." In ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2011. http://dx.doi.org/10.1115/detc2011-47955.

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In this article, the authors study the effects of Gaussian white noise on the dynamics of an atomic force microscope (AFM) cantilever operating in a dynamic mode by using a combination of numerical and analytical efforts. As a representative system, a combination of Si cantilever and HOPG sample is used. The focus of this study is on understanding the stochastic dynamics of a micro-cantilever, when the excitation frequencies are away from the first natural frequency of the system. In the previous efforts of the authors, period-doubling bifurcations close to grazing impacts have been reported for micro-cantilevers when the excitation frequency is in between the first and the second natural frequencies of the system. In the present study, it is observed that the addition of Gaussian white noise along with a harmonic excitation produces a near-grazing contact, when there was previously no contact between the tip and the sample with only the harmonic excitation. Moment evolution equations derived from a Fokker-Planck system are used to obtain numerical results, which support the statement that the addition of noise facilitates contact between the tip and the sample.
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Reports on the topic "AFM cantilever"

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Gates, Richard S. Certification of Standard Reference Material® 3461 Reference Cantilevers for AFM Spring Constant Calibration. Gaithersburg, MD: National Institute of Standards and Technology, 2022. http://dx.doi.org/10.6028/nist.sp.260-227.

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Gates, Richard S. Certification of Standard Reference Material® 3461 Reference Cantilevers for AFM Spring Constant Calibration. Gaithersburg, MD: National Institute of Standards and Technology, 2023. http://dx.doi.org/10.6028/nist.sp.260-227-upd1.

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