Bücher zum Thema „Test device“
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Pappas, Deno M. Evaluation of a punch shear test device. Phg [Pittsburgh], PA: U.S. Dept. of the Interior, Bureau of Mines, 1990.
Den vollen Inhalt der Quelle findenMulroy, William J. Evaluation of a standard device for calibrating calorimeter test rooms. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1986.
Den vollen Inhalt der Quelle findenMulroy, William J. Evaluation of a standard device for calibrating calorimeter test rooms. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1986.
Den vollen Inhalt der Quelle findenTransport and Works Act 1992: The Breath Test Device Approval 1993. London: HMSO, 1993.
Den vollen Inhalt der Quelle findenHebner, R. E. Report of tests on Joseph Newman's device. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1986.
Den vollen Inhalt der Quelle findenKelly, David. Parallel test pattern generation for programmable logic devices. Dublin: University College Dublin, 1995.
Den vollen Inhalt der Quelle findenAdams, R. Dean. High performance memory testing: Design principles, fault modeling, and self-test. Boston: Kluwer Academic, 2003.
Den vollen Inhalt der Quelle findenInternational, Test Conference (34th 2003 Charlotte N. C. ). Proceedings: Board and system test track. Washington, D.C: International Test Conference, 2003.
Den vollen Inhalt der Quelle findenWen, Xiaoqing, Nicola Nicolici und Girard Patrick. Power-aware testing and test strategies for low power devices. New York: Springer, 2010.
Den vollen Inhalt der Quelle findenCovelli, Javier M. Ferroelectric memory devices and a proposed standardized test system design. Monterey, Calif: Naval Postgraduate School, 1992.
Den vollen Inhalt der Quelle findenGirard, Patrick, Nicola Nicolici und Xiaoqing Wen, Hrsg. Power-Aware Testing and Test Strategies for Low Power Devices. Boston, MA: Springer US, 2010. http://dx.doi.org/10.1007/978-1-4419-0928-2.
Der volle Inhalt der QuelleBryden, James E. Crash tests of work zone traffic control devices. Albany, N.Y: Engineering Research and Development Bureau, New York State Dept. of Transportation, 1990.
Den vollen Inhalt der Quelle finden24 nonfiction passages for test practice. New York: Scholastic Professional Books, 2002.
Den vollen Inhalt der Quelle findenMelʹnikov, A. A. Optimalʹnoe proektirovanie ėlektronno-opticheskikh ustroĭstv: Tekst lekt͡s︡iĭ. Moskva: Moskovskiĭ in-t radiotekhniki, ėlektroniki i avtomatiki, 1988.
Den vollen Inhalt der Quelle findenMiddleton, David B. Flight test of takeoff performance monitoring system. Hampton: National Aeronautics and Space Administration, Langley Research Center, 1994.
Den vollen Inhalt der Quelle findenMiddleton, David B. Flight test of takeoff performance monitoring system. Hampton, Va: National Aeronautics and Space Administration, Langley Research Center, 1994.
Den vollen Inhalt der Quelle findenHamdioui, Said. Testing static random access memories: Defects, fault models, and test patterns. Boston: Kluwer Academic, 2004.
Den vollen Inhalt der Quelle findenEngine emissions measurement handbook: HORIBA automotive test systems. Warrendale, Pennsylvania, USA: SAE International, 2014.
Den vollen Inhalt der Quelle findenRajagopal, Arudi. A comparison of optical gradation analysis devices to current test methods: Final report. Cincinnati, OH: Infrastructure Management and Engineering, 2012.
Den vollen Inhalt der Quelle findenSkinner, A. J. Long-term results of accelerated life-tests on optocoupler devices. Leatherhead, Surrey, England: ERA Technology, 1992.
Den vollen Inhalt der Quelle findenSafety evaluation of medical devices. New York: Marcel Dekker, 1997.
Den vollen Inhalt der Quelle findenSafety evaluation of medical devices. 2. Aufl. New York: M. Dekker, 2002.
Den vollen Inhalt der Quelle findenBryant, Richard W. Fiber-optic test equipment: A worldwide analysis. Norwalk, CT: Business Communications Co., 1993.
Den vollen Inhalt der Quelle findenAgency, Illinois Environmental Protection. A new era of clean air is dawning--: The Illinois Vehicle Emissions Test Program : enhanced inspection and maintenance. Springfield, Ill: Illinois Environmental Protection Agency, 1997.
Den vollen Inhalt der Quelle findenAndrei, Pavlov. CMOS SRAM circuit design and parametric test in nano-scaled technologies: Process-aware SRAM design and test. [Dordrecht]: Springer, 2008.
Den vollen Inhalt der Quelle findenRectifier, International. HEXFET databook: Power MOSFET application notes, product specifications, military/hi-rel devices, test capabilities, other products. El Segundo, Cal: International Rectifier, 1985.
Den vollen Inhalt der Quelle findenPolites, Michael E. Reconfiguring the RUM experiment to test circular scanning with rotating unbalanced-mass devices on gimbaled payloads. [Washington, DC]: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, 1992.
Den vollen Inhalt der Quelle findenOffice, Home. The Breath Test Device Approval. Stationery Office Books, 1997.
Den vollen Inhalt der Quelle findenOffice, Home. The Breath Test Device Approval. Stationery Office Books, 1997.
Den vollen Inhalt der Quelle findenThe Breath Test Device Approval 1993. Stationery Office Books, 1993.
Den vollen Inhalt der Quelle findenThe Breath Test Device (Scotland) Approval 1997. Stationery Office Books, 1997.
Den vollen Inhalt der Quelle findenA, Heasley Keith, Hrsg. Evaluation of a punch shear test device. Phg [Pittsburgh], PA: U.S. Dept. of the Interior, Bureau of Mines, 1991.
Den vollen Inhalt der Quelle findenThe Breath Test Device (No. 2) Approval 1993. Stationery Office Books, 1993.
Den vollen Inhalt der Quelle findenThe Breath Test Device (No. 2) Approval 1993. Stationery Office Books, 1993.
Den vollen Inhalt der Quelle findenMann, Laurie L. The Incomplete Man Test as a kindergarten screening device. 1985.
Den vollen Inhalt der Quelle findenBritain, Great. The Breath Test Device (Scotland) (No. 2) Approval 1997. Stationery Office Books, 1997.
Den vollen Inhalt der Quelle findenA, Iiyoshi, Hrsg. Design study of the large helical device. Nagoya, Japan: National Institute for Fusion Science, 1990.
Den vollen Inhalt der Quelle findenUnited States. National Highway Traffic Safety Administration, Hrsg. Review of biomechanical impact response and injury in the automotive environment: Phase 1 task B report : advanced anthropomorphic test device development program. [Washington, D.C.?]: U.S. Dept. of Transportation, National Highway Traffic Safety Administration, 1987.
Den vollen Inhalt der Quelle findenVučković, Jelena. Quantum optics and cavity QED with quantum dots in photonic crystals. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780198768609.003.0008.
Der volle Inhalt der QuelleEducational Testing Services. The Ets Test Collection Catalog Vol. 2: Vocational Tests and Measurement Devices. Oryx Press, 1987.
Den vollen Inhalt der Quelle findenThe Breath Test Devices Approval 1992. Stationery Office Books, 1993.
Den vollen Inhalt der Quelle findenThe Breath Test Devices Approval 1992. Stationery Office Books, 1992.
Den vollen Inhalt der Quelle findenGoodman, Wayne K., Nigel Kennedy, Kyle Lapidus und Brian H. Kopell. Deep Brain Stimulation for Intractable OCD. Herausgegeben von Christopher Pittenger. Oxford University Press, 2017. http://dx.doi.org/10.1093/med/9780190228163.003.0046.
Der volle Inhalt der QuelleGreat Britain. Scottish Office Home and Health Department., Hrsg. The breath test analysis devices approval 1992. Edinburgh: HMSO, 1993.
Den vollen Inhalt der Quelle findenTest devices for aeronautical research and technology. Washington, D.C: National Aeronautics and Space Administration, 1985.
Den vollen Inhalt der Quelle findenThe Breath Test Analysis Devices Approval 1992. Stationery Office Books, 1993.
Den vollen Inhalt der Quelle findenService, Educational Testing. The Ets Test Collection Catalog Volume 2 : Vocational Tests and Measurement Devices (E T S Test Collection Catalog 2nd ed). 2. Aufl. Oryx Pr, 1995.
Den vollen Inhalt der Quelle findenEducational Testing Service Test Collect. The ETS Test Collection Catalog Volume 1 : Achievement Tests and Measurement Devices (E T S Test Collection Catalog 2nd ed). 2. Aufl. Oryx Pr, 1992.
Den vollen Inhalt der Quelle findenUnited States. Food and Drug Administration, Hrsg. New devices aim at improving pap test accuracy. [Rockville, MD: Dept. of Health and Human Services, Public Health Service, Food and Drug Administration, 1997.
Den vollen Inhalt der Quelle findenCenter, Langley Research, Hrsg. Environmental test program for superconducting materials and devices. [Clemson, S.C.]: Dept. of Ceramic Engineering, College of Engineering, Clemson University, 1991.
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