Dissertationen zum Thema „Oxide and sulphide thin films“
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Ray, Sekhar chandra. „Preparation and study of some oxide and sulphide thin films deposited by dip and chemical vapour deposition Techniques“. Thesis, University of North Bengal, 1998. http://hdl.handle.net/123456789/633.
Der volle Inhalt der QuelleThongchai, Prem. „An investigation into the thin film deposition of binary oxide, ternary oxide and binary sulphide materials“. Thesis, University of Bath, 2019. https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.767603.
Der volle Inhalt der QuelleWallace, Anthony James. „Tin oxide thin films“. Thesis, Brunel University, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.294556.
Der volle Inhalt der QuelleHu, Xiao. „Ultra-thin oxide films“. Thesis, University of Oxford, 2016. https://ora.ox.ac.uk/objects/uuid:d7373376-84f1-459e-bffb-f16ce43f02b7.
Der volle Inhalt der QuelleД`яченко, Олексій Вікторович, Алексей Викторович Дьяченко, Oleksii Viktorovych Diachenko, Анатолій Сергійович Опанасюк, Анатолий Сергеевич Опанасюк, Anatolii Serhiiovych Opanasiuk, D. Nam und H. Cheong. „Characterization Cupper Oxide thin films“. Thesis, Львівський національний університет ім. Івана Франка, 2015. http://essuir.sumdu.edu.ua/handle/123456789/48287.
Der volle Inhalt der QuelleWu, Chen. „Elemental growth of oxide thin films“. Thesis, University of Oxford, 2010. http://ora.ox.ac.uk/objects/uuid:ac82a52f-bb62-41d0-a604-3cf7a95e5aaf.
Der volle Inhalt der QuelleYang, Zheng. „Doping in zinc oxide thin films“. Diss., [Riverside, Calif.] : University of California, Riverside, 2009. http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:3359913.
Der volle Inhalt der QuelleIncludes abstract. Available via ProQuest Digital Dissertations. Title from first page of PDF file (viewed March 12, 2010). Includes bibliographical references. Also issued in print.
MARTINEZ, POZZONI UMBERTO LUIGI. „Oxide ultra-thin films on metals“. Doctoral thesis, Università degli Studi di Milano-Bicocca, 2009. http://hdl.handle.net/10281/7463.
Der volle Inhalt der QuelleBarrioz, Vincent. „Laser-fibre system for in-situ stress monitoring of thin films“. Thesis, Bangor University, 2003. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.273632.
Der volle Inhalt der QuelleSands, D. „Growth and characterisation of thin films of zinc sulphide on silicon“. Thesis, University of Bradford, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379798.
Der volle Inhalt der QuelleKiisk, Valter. „Optical investigation of metal-oxide thin films /“. Online version, 2006. http://dspace.utlib.ee/dspace/bitstream/10062/115/1/kiiskvalter.pdf.
Der volle Inhalt der QuelleHolden, Anthony Peter. „Tunnelling studies of very thin oxide films“. Thesis, University of Cambridge, 1994. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.336960.
Der volle Inhalt der QuellePonja, Sapna D. „Metal oxide thin films for optoelectronic applications“. Thesis, University College London (University of London), 2018. http://discovery.ucl.ac.uk/10045545/.
Der volle Inhalt der QuelleSilverman, Lee Arnold 1959. „Sol-gel derived tantalum oxide thin films“. Thesis, Massachusetts Institute of Technology, 1987. http://hdl.handle.net/1721.1/14835.
Der volle Inhalt der QuelleOwens, Jessica Margaret. „The sputter deposition of oxide thin films“. Thesis, University of Cambridge, 1997. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.627173.
Der volle Inhalt der QuelleJames, Amy Frances. „Tin-oxide thin films by thermal oxidation“. University of Western Cape, 2021. http://hdl.handle.net/11394/8239.
Der volle Inhalt der QuelleTin dioxide (SnO2) thin films are a worthy candidate for an electron transport layer (ETL) in perovskite solar cells, due to its suitable energy level, high electron mobility of 240 cm2 v-1 s- 1, desirable band gap of 3.6 - 4.0 eV, and ultimately proves to be suited for a low temperature thermal oxidation technique for ETL production. A variety of methods are available to prepare SnO2 thin films such as spin and dip coating and chemical bath deposition. However, the customary solid-state method, which incorporates thermal decomposition and oxidation of a metallic Sn precursor compound in an oxygen abundant atmosphere prevails to be low in cost, is repeatable and allows for large-scale processing.
Khokhlova, Mariya. „Interactions of cells with oxide thin films“. Thesis, Normandie, 2019. http://www.theses.fr/2019NORMC241.
Der volle Inhalt der QuelleIn the present work we demonstrate how oxide thin films can be used as bioactive surfaces, a field of research which is still underexplored. For this purpose, thin films of TiO2, Al2O3, VOx and some others were deposited on glass substrates using the Pulsed Laser Deposition (PLD) technique, and adhesion, proliferation and differentiation of human bone marrow-derived mesenchymal stem cells were evaluated. Cell behavior was analyzed with respect to the various key surface parameters such as chemistry, wettability, morphology and the thickness of films.Our results indicate that thin films of TiO2 and Al2O3 can not only support mesenchymal stem cells adhesion and growth, but also can be used to influence osteogenic and chondrogenic differentiation path. Additionally, effect of oxide thin films on adhesion and growth of cancer cell lines was studied. We showed that culturing these cell lines on thin films affects their growth and, therefore, could be a valuable method to perform screening tests with drugs.This work will provide a better understanding of correlation between surface chemistry and cellular response, which has a high significance in the field of biomaterials fabrication
Isukapati, Sundar Babu. „Gallium Oxide Thin Films for Optoelectronic Applications“. Youngstown State University / OhioLINK, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=ysu1527125539086742.
Der volle Inhalt der QuelleDulal, Prabin. „Optoelectronic Characteristics of Indium Oxide Thin Films“. Bowling Green State University / OhioLINK, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=bgsu1562680154150056.
Der volle Inhalt der QuelleWang, Hao. „Cathodic electrodeposition of thin ceramic oxide films“. Thesis, Imperial College London, 2008. http://hdl.handle.net/10044/1/11950.
Der volle Inhalt der QuelleJiang, Fang-Xing. „Tantalum oxide thin films for microelectronic applications /“. Online version of thesis, 1995. http://hdl.handle.net/1850/11925.
Der volle Inhalt der QuelleHuang, Bin. „Mechanical characterization of thin films /“. View abstract or full-text, 2005. http://library.ust.hk/cgi/db/thesis.pl?MECH%202005%20HUANG.
Der volle Inhalt der QuelleHan, Sanggil. „Cu2O thin films for p-type metal oxide thin film transistors“. Thesis, University of Cambridge, 2018. https://www.repository.cam.ac.uk/handle/1810/285099.
Der volle Inhalt der QuelleYoon, Jongsik. „Nanostructured thin films for solid oxide fuel cells“. [College Station, Tex. : Texas A&M University, 2008. http://hdl.handle.net/1969.1/ETD-TAMU-3164.
Der volle Inhalt der QuelleBackholm, Jonas. „Electrochromic Properties of Iridium Oxide Based Thin Films“. Doctoral thesis, Uppsala universitet, Fasta tillståndets fysik, 2008. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-8505.
Der volle Inhalt der QuelleGarg, Ashish. „Growth and characterization of epitaxial oxide thin films“. Thesis, University of Cambridge, 2001. https://www.repository.cam.ac.uk/handle/1810/34609.
Der volle Inhalt der QuelleMolapo, David Theko. „Infrared studies of oxide catalysts and thin films“. Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp02/NQ32452.pdf.
Der volle Inhalt der QuelleVonk, Vedran. „Growth and structure of complex oxide thin films“. Enschede : University of Twente [Host], 2006. http://doc.utwente.nl/57134.
Der volle Inhalt der QuelleUnsworth, Larry David Brash J. L. „Protein adsorption to chemisorbed polyethylene oxide thin films“. *McMaster only, 2005.
Den vollen Inhalt der Quelle findenDepaz, Michael. „Processing and characterization of zinc oxide thin films“. [Tampa, Fla.] : University of South Florida, 2007. http://purl.fcla.edu/usf/dc/et/SFE0002235.
Der volle Inhalt der QuelleMurphy, Thomas Patrick. „Electrochromic properties of tin-nickel oxide thin films“. Thesis, Oxford Brookes University, 1997. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.284756.
Der volle Inhalt der QuelleHilou, H. W. „Electrical properties of R.F. sputtered thin oxide films“. Thesis, University of Nottingham, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.355425.
Der volle Inhalt der QuelleElfallal, Ibrahim Abdel-Wahab. „A study of indium tin oxide thin films“. Thesis, University of Salford, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.261449.
Der volle Inhalt der QuelleRauf, Ijaz Ahmad. „Structure and properties of indium oxide thin films“. Thesis, University of Cambridge, 1991. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.358371.
Der volle Inhalt der QuelleHou, Ya-Ching. „Surface far-infrared emission from oxide thin films“. Thesis, University of Cambridge, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.616237.
Der volle Inhalt der QuelleHong, Yuanjia. „Magnetic and Transport Properties of Oxide Thin Films“. ScholarWorks@UNO, 2007. http://scholarworks.uno.edu/td/615.
Der volle Inhalt der QuelleLopez, Mark Gerard. „Aspects of electroforming in silicon oxide thin films“. Thesis, Keele University, 1994. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.385191.
Der volle Inhalt der QuelleDyachenko, A. V. „Spray pyrolysis deposition of magnesium oxide thin films“. Thesis, Сумський державний університет, 2014. http://essuir.sumdu.edu.ua/handle/123456789/34844.
Der volle Inhalt der QuelleVemuri, Venkata Rama Sesha Ravi Kumar. „Fabrication and characterization of zirconium oxide thin films“. To access this resource online via ProQuest Dissertations and Theses @ UTEP, 2009. http://0-proquest.umi.com.lib.utep.edu/login?COPT=REJTPTU0YmImSU5UPTAmVkVSPTI=&clientId=2515.
Der volle Inhalt der QuelleLiu, Yandi. „Block Copolymer Lithographyfor Nano-porous Oxide Thin Films“. Thesis, KTH, Skolan för elektroteknik och datavetenskap (EECS), 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-254331.
Der volle Inhalt der QuelleDenna avhandling fokuserar på användningen av en ny mönstringsteknik som kallas block-sampolymerlitografi som används för att överföra nano-porösa mönster från polymermaller till en underliggande oxidtunnfilm. Nano-porösa blocksampolymerfilmer framställs genom spinbeläggningspolymerlösning på skivor följt av glödgning, UV-exponering och utvecklingsprocesser. Reaktionjon etsning används sedan för att etsa oxidfilmerna baserat på mönstret av polymermaller och därefter blir polymeren avlägsnad. Den erhållna oxidmikrostrukturen karakteriseras av SEM, som visar en nanomesh av mikrodomäner med samma hålstorlek och densitet som det ursprungliga blocksampolymerskiktet. Fördelarna med block-sampolymerlitografi innefattar likformig nanomönstring, kostnadseffektivitet och enkel bearbetning. De nanoporösa oxidtunnfilmerna kan användas som en hard mask för nanomönstring i mikroelektronik och för energilagringsapplikationer.
Sánchez, Rodríguez Daniel. „Obtaining advanced oxide thin films at low temperatures by chemical methods. Thermal analysis of thin films“. Doctoral thesis, Universitat de Girona, 2015. http://hdl.handle.net/10803/328723.
Der volle Inhalt der QuelleThe aim of this work is to analyse chemical methods as a route to synthesise advanced oxides at low cost and low temperatures. In particular, we have explored the combustion synthesis of a catalytic perovskite-type oxide from heteronuclear cyano complex powders. We have also explored heat transfer to synthesise films via VCS and concluded that thin films will hardly experience combustion. In particular, we have analysed the conditions needed for a thermal explosion to occur in a solid sample reacting without any gas exchange with its surroundings. For that purpose, we have extended the Frank-Kamenetskii relationship to continuous heating systems and to cylindrical reactors. The experimental component of this work is based on thermal analysis methods (TA). We have developed a new method to measure thermal conductivity of powders by DSC. Finally, we have developed two analytical relationships to check the reliability of the sample temperature in TA experiments.
Snyder, Mark Q. „Modification of Semi-metal Oxide and Metal Oxide Powders by Atomic Layer Deposition of Thin Films“. Fogler Library, University of Maine, 2007. http://www.library.umaine.edu/theses/pdf/SnyderMQ2007.pdf.
Der volle Inhalt der QuelleLee, King Hung. „Ellipsometric studies of the nucleation of zinc sulphide films in ultra-high vacuum“. Thesis, Queen's University Belfast, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.335519.
Der volle Inhalt der QuelleRooth, Mårten. „Metal Oxide Thin Films and Nanostructures Made by ALD“. Doctoral thesis, Uppsala University, Department of Materials Chemistry, 2008. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-8898.
Der volle Inhalt der QuelleThin films of cobalt oxide, iron oxide and niobium oxide, and nanostructured thin films of iron oxide, titanium oxide and multilayered iron oxide/titanium oxide have been deposited by Atomic Layer Deposition (ALD). The metal oxides were grown using the precursor combinations CoI2/O2, Fe(Cp)2/O2, NbI5/O2 and TiI4/H2O. The samples were analysed primarily with respect to phase content, morphology and growth characteristics.
Thin films deposited on Si (100) were found to be amorphous or polycrystalline, depending on deposition temperature and the oxide deposited; cobalt oxide was also deposited on MgO (100), where it was found to grow epitaxially with orientation (001)[100]Co3O4||(001)[100]MgO. As expected, the polycrystalline films were rougher than the amorphous or the epitaxial films. The deposition processes showed properties characteristic of self-limiting ALD growth; all processes were found to have a deposition temperature independent growth region. The deposited films contained zero or only small amounts of precursor residues.
The nanostructured films were grown using anodic aluminium oxide (AAO) or carbon nanosheets as templates. Nanotubes could be manufactured by depositing a thin film which covers the pore walls of the AAO template uniformly; free-standing nanotubes retaining the structure of the template could be fabricated by removing the template. Multilayered nanotubes could be obtained by depositing multiple layers of titanium dioxide and iron oxide in the pores of the AAO template. Carbon nanosheets were used to make titanium dioxide nanosheets with a conducting graphite backbone. The nucleation of the deposited titanium dioxide could be controlled by acid treatment of the carbon nanosheets.
Söderlind, Fredrik. „Colloidal synthesis of metal oxide nanocrystals and thin films“. Doctoral thesis, Linköpings universitet, Institutionen för fysik, kemi och biologi, 2008. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-11831.
Der volle Inhalt der QuelleGlavic, Artur [Verfasser]. „Multiferroicity in oxide thin films and heterostructures / Artur Glavic“. Aachen : Hochschulbibliothek der Rheinisch-Westfälischen Technischen Hochschule Aachen, 2012. http://d-nb.info/1025883497/34.
Der volle Inhalt der QuelleYang, Hung-Pao 1980. „A study of P-type zinc oxide thin films /“. Thesis, McGill University, 2006. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=99550.
Der volle Inhalt der QuelleIn this report, reproducible p-type ZnO thin films sputtered on glass substrates are reported. On the same substrate, p-type ZnO film is local and surrounded by n-type ZnO regions. The thickness of the films is typically three microns after several hours of deposition by radio-frequency magnetron sputtering technique. Both p-type ZnO and n-type thin films are characterized by optical and electrical measurements at room temperature.
The crystal structure of p-type ZnO is examined by X-ray diffraction patterns. The X-ray diffraction patterns show that the material is polycrystalline and has (100) and (101) preferred orientation. Photoluminescence spectra of ZnO help to identify the energy levels in the material and spectra analysis reveals the presence of defects and dopants in the material. For p-type ZnO, the resistivity, the hole concentration and hole mobility are found to be 148.8 O-cm, 4.34 x 1018/cm3 and 1.72 x 10-2 cm2/V-sec respectively.
Yagoubi, Benabdella. „A study of some thin transition metal oxide films“. Thesis, Brunel University, 1989. http://bura.brunel.ac.uk/handle/2438/5348.
Der volle Inhalt der QuellePotter, D. „Zinc-based thin films for transparent conducting oxide applications“. Thesis, University College London (University of London), 2018. http://discovery.ucl.ac.uk/10041886/.
Der volle Inhalt der QuelleMin, Yongki 1965. „Properties and sensor performance of zinc oxide thin films“. Thesis, Massachusetts Institute of Technology, 2003. http://hdl.handle.net/1721.1/17032.
Der volle Inhalt der QuelleIncludes bibliographical references (p. 144-152).
This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
Reactively sputtered ZnO thin film gas sensors were fabricated onto Si wafers. The atmosphere dependent electrical response of the ZnO micro arrays was examined. The effects of processing conditions on the properties and sensor performance of ZnO films were investigated. Using AFM, SEM, XRD and WDS, the 02/Ar ratios during sputtering and Al dopant were found to control the property of ZnO films. Subsequent annealing at 700 C improved the sensor response of the films considerably although it had only minor effects on the microstructure. DC resistance, I-V curves and AC impedance were utilized to investigate the gas response of ZnO sensors. ZnO films prepared with high O2/Ar ratios showed better sensitivity to various gases, a feature believed to be related to their lower carrier density. Al doped ZnO showed measurable sensitivity even with lower resistance attributable to their porous microstructure. AC impedance identified two major components of the total resistance including Schottky barriers at the Pt-ZnO interfaces and a DC bias induced constriction resistance within the ZnO films. Time dependent drift in resistance of ZnO films has been observed. Without applied bias, the ZnO films showed a fast and a slow resistance change response when exposed to gases with varying oxygen partial pressure with both response components dependent on operating temperature. Even at the relatively low operating temperatures of these thin film sensors, bulk diffusion cannot be discounted. The oxygen partial pressure dependence of the sensor resistance and its corresponding activation energy were related to defect process controlling the reduction/oxidation behavior of the ZnO.
(cont.) In this study, time dependent DC bias effects on resistance drift were first discovered and characterized. The DC bias creates particularly high electric fields in these micro devices given that the spacing of the interdigited electrodes falls in the range of microns. The high electric field is believed to initiate ion migration and/or modulate grain boundary barrier heights, inducing resistance drift with time. Such DC bias resistance induced drift is expected to contribute to the instability of thin film micro array sensors designed for practical applications. Suggestions for stabilizing sensor response are provided.
by Yongki Min.
Ph.D.