Thematische Bibliographien / Nanofocused X-Ray diffraction / Zeitschriftenartikel
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Zeitschriftenartikel zum Thema „Nanofocused X-Ray diffraction“

Autor: Grafiati
Veröffentlicht am 25. Mai 2024
Zuletzt aktualisiert am 31. Juli 2025

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1

Ren, Zhe, Francesca Mastropietro, Anton Davydok, et al. "Scanning force microscope forin situnanofocused X-ray diffraction studies." Journal of Synchrotron Radiation 21, no. 5 (2014): 1128–33. http://dx.doi.org/10.1107/s1600577514014532.

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A compact scanning force microscope has been developed forin situcombination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The newin situdevice allows forin situimaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by na
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2

Hruszkewycz, S. O., M. V. Holt, J. Maser, et al. "Coherent Bragg nanodiffraction at the hard X-ray Nanoprobe beamline." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 372, no. 2010 (2014): 20130118. http://dx.doi.org/10.1098/rsta.2013.0118.

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Bragg coherent diffraction with nanofocused hard X-ray beams provides unique opportunities for quantitative in situ studies of crystalline structure in nanoscale regions of complex materials and devices by a variety of diffraction-based techniques. In the case of coherent diffraction imaging, a major experimental challenge in using nanoscale coherent beams is maintaining a constant scattering volume such that coherent fringe visibility is maximized and maintained over the course of an exposure lasting several seconds. Here, we present coherent Bragg diffraction patterns measured from different
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3

Nicolas, Jan-David, Tobias Reusch, Markus Osterhoff, et al. "Time-resolved coherent X-ray diffraction imaging of surface acoustic waves." Journal of Applied Crystallography 47, no. 5 (2014): 1596–605. http://dx.doi.org/10.1107/s1600576714016896.

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Time-resolved coherent X-ray diffraction experiments of standing surface acoustic waves, illuminated under grazing incidence by a nanofocused synchrotron beam, are reported. The data have been recorded in stroboscopic mode at controlled and varied phase between the acoustic frequency generator and the synchrotron bunch train. At each time delay (phase angle), the coherent far-field diffraction pattern in the small-angle regime is inverted by an iterative algorithm to yield the local instantaneous surface height profile along the optical axis. The results show that periodic nanoscale dynamics c
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4

Chayanun, Lert, Susanna Hammarberg, Hanna Dierks, et al. "Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline." Crystals 9, no. 8 (2019): 432. http://dx.doi.org/10.3390/cryst9080432.

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The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV
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5

Zaluzhnyy, Ivan, Ruslan Kurta, Marcus Scheele, Frank Schreiber, Boris Ostrovskii, and Ivan Vartanyants. "Angular X-ray Cross-Correlation Analysis (AXCCA): Basic Concepts and Recent Applications to Soft Matter and Nanomaterials." Materials 12, no. 21 (2019): 3464. http://dx.doi.org/10.3390/ma12213464.

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Angular X-ray cross-correlation analysis (AXCCA) is a technique which allows quantitative measurement of the angular anisotropy of X-ray diffraction patterns and provides insights into the orientational order in the system under investigation. This method is based on the evaluation of the angular cross-correlation function of the scattered intensity distribution on a two-dimensional (2D) detector and further averaging over many diffraction patterns for enhancement of the anisotropic signal. Over the last decade, AXCCA was successfully used to study the anisotropy in various soft matter systems
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6

Abbey, Brian, Ruben A. Dilanian, Connie Darmanin, et al. "X-ray laser–induced electron dynamics observed by femtosecond diffraction from nanocrystals of Buckminsterfullerene." Science Advances 2, no. 9 (2016): e1601186. http://dx.doi.org/10.1126/sciadv.1601186.

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X-ray free-electron lasers (XFELs) deliver x-ray pulses with a coherent flux that is approximately eight orders of magnitude greater than that available from a modern third-generation synchrotron source. The power density of an XFEL pulse may be so high that it can modify the electronic properties of a sample on a femtosecond time scale. Exploration of the interaction of intense coherent x-ray pulses and matter is both of intrinsic scientific interest and of critical importance to the interpretation of experiments that probe the structures of materials using high-brightness femtosecond XFEL pu
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7

Bussone, Genziana, Rüdiger Schott, Andreas Biermanns, et al. "Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams." Journal of Applied Crystallography 46, no. 4 (2013): 887–92. http://dx.doi.org/10.1107/s0021889813004226.

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Grazing-incidence X-ray diffraction measurements on single GaAs nanowires (NWs) grown on a (111)-oriented GaAs substrate by molecular beam epitaxy are reported. The positions of the NWs are intentionally determined by a direct implantation of Au with focused ion beams. This controlled arrangement in combination with a nanofocused X-ray beam allows the in-plane lattice parameter of single NWs to be probed, which is not possible for randomly grown NWs. Reciprocal space maps were collected at different heights along the NW to investigate the crystal structure. Simultaneously, substrate areas with
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8

Li, Qian, Samuel D. Marks, Sunil Bean, et al. "Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure–property characterization." Journal of Synchrotron Radiation 26, no. 5 (2019): 1790–96. http://dx.doi.org/10.1107/s1600577519008609.

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A multimodal imaging instrument has been developed that integrates scanning near-field optical microscopy with nanofocused synchrotron X-ray diffraction imaging. The instrument allows for the simultaneous nanoscale characterization of electronic/near-field optical properties of materials together with their crystallographic structure, facilitating the investigation of local structure–property relationships. The design, implementation and operating procedures of this instrument are reported. The scientific capabilities are demonstrated in a proof-of-principle study of the insulator–metal phase
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9

Wallentin, Jesper, Daniel Jacobsson, Markus Osterhoff, Magnus T. Borgström, and Tim Salditt. "Bending and Twisting Lattice Tilt in Strained Core–Shell Nanowires Revealed by Nanofocused X-ray Diffraction." Nano Letters 17, no. 7 (2017): 4143–50. http://dx.doi.org/10.1021/acs.nanolett.7b00918.

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10

Marçal, Lucas A. B., Eitan Oksenberg, Dmitry Dzhigaev, et al. "In Situ Imaging of Ferroelastic Domain Dynamics in CsPbBr3 Perovskite Nanowires by Nanofocused Scanning X-ray Diffraction." ACS Nano 14, no. 11 (2020): 15973–82. http://dx.doi.org/10.1021/acsnano.0c07426.

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11

Wallentin, Jesper, Robin N. Wilke, Markus Osterhoff, and Tim Salditt. "Simultaneous high-resolution scanning Bragg contrast and ptychographic imaging of a single solar cell nanowire." Journal of Applied Crystallography 48, no. 6 (2015): 1818–26. http://dx.doi.org/10.1107/s1600576715017975.

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Simultaneous scanning Bragg contrast and small-angle ptychographic imaging of a single solar cell nanowire are demonstrated, using a nanofocused hard X-ray beam and two detectors. The 2.5 µm-long nanowire consists of a single-crystal InP core of 190 nm diameter, coated with amorphous SiO2and polycrystalline indium tin oxide. The nanowire was selected and aligned in real space using the small-angle scattering of the 140 × 210 nm X-ray beam. The orientation of the nanowire, as observed in small-angle scattering, was used to find the correct rotation for the Bragg condition. After alignment in re
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12

Wang, Wei, Bao Wang, Stan F. S. P. Looijmans, et al. "Epitaxy in Polybutene-1 Form II-on-Form I Cross-Nucleation Revealed by Nanofocused X-ray Diffraction on Ad Hoc Morphology." Macromolecules 54, no. 20 (2021): 9663–69. http://dx.doi.org/10.1021/acs.macromol.1c01797.

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13

Marçal, Lucas Atila Bernardes, Eitan Oksenberg, Dmitry Dzhigaev, et al. "In situ imaging of ferroelastic domain dynamics in CsPbBr3 perovskite nanowires by nanofocused scanning X-ray diffraction." Acta Crystallographica Section A Foundations and Advances 77, a2 (2021): C134. http://dx.doi.org/10.1107/s0108767321095477.

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14

Krywka, Christina, Henrike Neubauer, Marius Priebe, et al. "A two-dimensional waveguide beam for X-ray nanodiffraction." Journal of Applied Crystallography 45, no. 1 (2011): 85–92. http://dx.doi.org/10.1107/s0021889811049132.

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The micro- and nanofocus X-ray scattering (MINAXS) beamline of PETRA III is equipped with two consecutively arranged endstations, the last of which is the nanofocus endstation. The first in-beam commissioning of the experimental equipment was successfully performed at the end of 2010, using two-dimensionally confining hard X-ray silicon waveguides with cross sections of 50 nm × 50 µm to 50 nm × 2 µm for nanobeam generation. A full characterization of the waveguide-generated beams was performed, giving values for the beam geometries, the transmission efficiencies of the waveguides and absolute
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15

Odarchenko, Yaroslav, Martin Rosenthal, Jaime J. Hernandez, et al. "Assessing Fast Structure Formation Processes in Isotactic Polypropylene with a Combination of Nanofocus X-ray Diffraction and In Situ Nanocalorimetry." Nanomaterials 11, no. 10 (2021): 2652. http://dx.doi.org/10.3390/nano11102652.

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A combination of in situ nanocalorimetry with simultaneous nanofocus 2D Wide-Angle X-ray Scattering (WAXS) was used to study polymorphic behaviour and structure formation in a single micro-drop of isotactic polypropylene (iPP) with defined thermal history. We were able to generate, detect, and characterize a number of different iPP morphologies using our custom-built ultrafast chip-based nanocalorimetry instrument designed for use with the European Synchrotron Radiation Facility (ESRF) high intensity nanofocus X-ray beamline facility. The detected iPP morphologies included monoclinic alpha-pha
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16

Schaber, Clemens F., Silja Flenner, Anja Glisovic, et al. "Hierarchical architecture of spider attachment setae reconstructed from scanning nanofocus X-ray diffraction data." Journal of The Royal Society Interface 16, no. 150 (2019): 20180692. http://dx.doi.org/10.1098/rsif.2018.0692.

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When sitting and walking, the feet of wandering spiders reversibly attach to many surfaces without the use of gluey secretions. Responsible for the spiders' dry adhesion are the hairy attachment pads that are built of specially shaped cuticular hairs (setae) equipped with approximately 1 µm wide and 20 nm thick plate-like contact elements (spatulae) facing the substrate. Using synchrotron-based scanning nanofocus X-ray diffraction methods, combining wide-angle X-ray diffraction/scattering and small-angle X-ray scattering, allowed substantial quantitative information to be gained about the stru
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17

Анохин, Д. В., К. Н. Графская, Д. А. Иванов та ін. "Локализация моноклинной фазы в насцентных частицах сверхвысокомолекулярного полиэтилена". Физика твердого тела 62, № 8 (2020): 1326. http://dx.doi.org/10.21883/ftt.2020.08.49622.066.

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Annotation The X-ray analysis of a virgin particle taken directly from the synthesis products of an ultra-high molecular weight polyethylene (UHMWPE) and not subjected to any external stresses was carried out using nanofocus beamline ID13 European Synchrotron Radiation Facility (ESRF, Grenoble,France). In the X-ray diffraction curves obtained by scanning an arbitrarily selected portion of a particle with a size of (100 x 20) μm2 by a microbeam (0.3 x 0.3) μm2 with a step of 2 μm horizontally and 0.5 μm vertically, along with reflections from the orthorhombic phase, reflexes from the metastable
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18

Krause, Thilo, Michael Hanke, Zongzhe Cheng, et al. "Nanofocus x-ray diffraction and cathodoluminescence investigations into individual core–shell (In,Ga)N/GaN rod light-emitting diodes." Nanotechnology 27, no. 32 (2016): 325707. http://dx.doi.org/10.1088/0957-4484/27/32/325707.

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19

Melniko, A., A. Rodygin, K. Grafskaya, D. Anokhin, and D. Ivanov. "High temporal resolution nanocalorimetry and its combination with micro- and nanofocus x-ray diffraction for study of functional nanostructured materials." Nanoindustry Russia 70, no. 8 (2016): 60–66. http://dx.doi.org/10.22184/1993-8578.2016.70.8.60.66.

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20

Dubslaff, M., M. Hanke, M. Burghammer, et al. "In(Ga)As/GaAs(001) quantum dot molecules probed by nanofocus high resolution x-ray diffraction with 100 nm resolution." Applied Physics Letters 98, no. 21 (2011): 213105. http://dx.doi.org/10.1063/1.3593960.

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21

Melnikov, A. P., M. Rosenthal, M. Burghammer, D. V. Anokhin, and D. A. Ivanov. "Study of melting processes in semicrystalline polymers using a combination of ultrafast chip calorimetry and nanofocus synchrotron X-ray diffraction." Nanotechnologies in Russia 11, no. 5-6 (2016): 305–11. http://dx.doi.org/10.1134/s1995078016030113.

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22

Schroer, C. G., P. Boye, J. M. Feldkamp, et al. "Coherent X-Ray Diffraction Imaging with Nanofocused Illumination." Physical Review Letters 101, no. 9 (2008). http://dx.doi.org/10.1103/physrevlett.101.090801.

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23

Cornelius, Thomas W., Zhe Ren, Francesca Mastropietro, et al. "In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques." MRS Proceedings 1712 (2014). http://dx.doi.org/10.1557/opl.2014.909.

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ABSTRACTA scanning force microscope for in situ nanofocused X-ray studies (SFINX) has been developed which can be installed on diffractometers at synchrotron beamlines allowing for the combination with various techniques such as coherent X-ray diffraction and fluorescence. The capabilities of this device are demonstrated on Cu nanowires and on Au islands grown on sapphire (0001). The sample topography, crystallinity, and elemental distribution of the same area are investigated by recording simultaneously an AFM image, a scanning X-ray diffraction map, and a fluorescence map. Additionally, the
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24

Frisch, Marvin L., Longfei Wu, Clément Atlan, et al. "Unraveling the synergistic effects of Cu-Ag tandem catalysts during electrochemical CO2 reduction using nanofocused X-ray probes." Nature Communications 14, no. 1 (2023). http://dx.doi.org/10.1038/s41467-023-43693-2.

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AbstractControlling the selectivity of the electrocatalytic reduction of carbon dioxide into value-added chemicals continues to be a major challenge. Bulk and surface lattice strain in nanostructured electrocatalysts affect catalytic activity and selectivity. Here, we unravel the complex dynamics of synergistic lattice strain and stability effects of Cu-Ag tandem catalysts through a previously unexplored combination of in situ nanofocused X-ray absorption spectroscopy and Bragg coherent diffraction imaging. Three-dimensional strain maps reveal the lattice dynamics inside individual nanoparticl
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25

Bernardes Marçal, Lucas Atila, Nils Lamers, Susanna Hammarberg, et al. "Structural and chemical properties of anion exchanged CsPb(Br(1-x)Clx)3 heterostructured perovskite nanowires imaged by nanofocused x-rays." Nanotechnology, March 19, 2024. http://dx.doi.org/10.1088/1361-6528/ad355c.

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Abstract Over the last years metal halide perovskites have demonstrated remarkable potential for integration in light emitting devices. Heterostructures allow for tunable bandgap depending on the local anion composition, crucial for optoelectronic devices, but local structural effects of anion exchange in single crystals is not fully understood. Here, we investigate how the anion exchange of CsPbBr3 nanowires fully and locally exposed to HCl vapor affects the local crystal structure, using nanofocused x-rays. We study the nanoscale composition and crystal structure as function of HCl exposure
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26

Ricci, A., N. Poccia, G. Campi, et al. "Nanoscale phase separation in the iron chalcogenide superconductor K0.8Fe1.6Se2as seen via scanning nanofocused x-ray diffraction." Physical Review B 84, no. 6 (2011). http://dx.doi.org/10.1103/physrevb.84.060511.

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27

Krause, Thilo, Michael Hanke, Lars Nicolai, et al. "Structure and Composition of Isolated Core-Shell(In,Ga)N/GaNRods Based on Nanofocus X-Ray Diffraction and Scanning Transmission Electron Microscopy." Physical Review Applied 7, no. 2 (2017). http://dx.doi.org/10.1103/physrevapplied.7.024033.

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28

Zayonchkovskiy, Vyacheslav S., Irina A. Antoshina, Kyaw Kyaw Aung, Evgenij I. Isaev та Igor’ M. Milyaev. "Рентгенодифракционное исследование тонких металлических пленок с магнитными слоями сплава Fe-Cr-Co". Kondensirovannye sredy i mezhfaznye granitsy = Condensed Matter and Interphases 22, № 1 (2020). http://dx.doi.org/10.17308/kcmf.2020.22/2529.

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Цель статьи – определение фазового состава структур пленочных постоянных магнитов со слоями сплава Fe-Cr-Co микронного диапазона толщин, называемого сплавом Kaneko. Знание фазового состава необходимо для разработки физико-технологических подходов создания оптимальных структур на подложках монокристаллического кремния с пленочным постоянным магнитом на основе дисперсионно-твердеющего сплава с вектором намагниченности в плоскости кремниевой подложки.Методом магнетронного напыления на кремниевой подложке были получены трехслойные металлические пленки: слой дисперсионно-твердеющего сплава на основ
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