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Auswahl der wissenschaftlichen Literatur zum Thema „Nano imprint lithographie“
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Zeitschriftenartikel zum Thema "Nano imprint lithographie"
Yang, Ki Yeon, Sung Hoon Hong, Heon Lee und Jeong Woo Choi. „Fabrication of Nano-Sized Gold Dot Array Using Bi-Layer Nano Imprint Lithography“. Materials Science Forum 510-511 (März 2006): 446–49. http://dx.doi.org/10.4028/www.scientific.net/msf.510-511.446.
Der volle Inhalt der QuelleYan, Le, Lei Yin und Hong Zhong Liu. „Nanoimprint Lithography of Multistep Loading“. Advanced Materials Research 383-390 (November 2011): 7214–19. http://dx.doi.org/10.4028/www.scientific.net/amr.383-390.7214.
Der volle Inhalt der QuelleChoi, Su Hyun, Do Hyeog Kim, Seonjun Kim, Woo Young Kim, Seok Kim und Young Tae Cho. „Tulip-Shaped Pattern Imprinting for Omni-Phobic Surfaces Using Partially Cured Photopolymer“. Applied Sciences 11, Nr. 4 (16.02.2021): 1747. http://dx.doi.org/10.3390/app11041747.
Der volle Inhalt der QuelleRessier, L., E. Palleau und S. Behar. „Electrical nano-imprint lithography“. Nanotechnology 23, Nr. 25 (31.05.2012): 255302. http://dx.doi.org/10.1088/0957-4484/23/25/255302.
Der volle Inhalt der QuelleLee, Heon, Ki Yeon Yang und Sung Hoon Hong. „Fabrication of 100nm Sized Patterns on Flexible Polyethylene-Terephthalate Substrate Using Monomer Based Thermal Curing Nanoimprint Lithography“. Solid State Phenomena 121-123 (März 2007): 657–60. http://dx.doi.org/10.4028/www.scientific.net/ssp.121-123.657.
Der volle Inhalt der QuelleLöber, Dennis, Subhayan Dey, Burhan Kaban, Fabian Roesler, Martin Maurer, Hartmut Hillmer und Rudolf Pietschnig. „3D Micro/Nanopatterning of a Vinylferrocene Copolymer“. Molecules 25, Nr. 10 (23.05.2020): 2438. http://dx.doi.org/10.3390/molecules25102438.
Der volle Inhalt der QuelleCrespo-Monteiro, Nicolas, Arnaud Valour, Victor Vallejo-Otero, Marie Traynar, Stéphanie Reynaud, Emilie Gamet und Yves Jourlin. „Versatile Zirconium Oxide (ZrO2) Sol-Gel Development for the Micro-Structuring of Various Substrates (Nature and Shape) by Optical and Nano-Imprint Lithography“. Materials 15, Nr. 16 (15.08.2022): 5596. http://dx.doi.org/10.3390/ma15165596.
Der volle Inhalt der QuelleHirai, Yoshihiko, und Yoshio Tanaka. „Application of Nano-imprint Lithography.“ Journal of Photopolymer Science and Technology 15, Nr. 3 (2002): 475–80. http://dx.doi.org/10.2494/photopolymer.15.475.
Der volle Inhalt der QuelleBottein, Thomas, Olivier Dalstein, Magali Putero, Andrea Cattoni, Marco Faustini, Marco Abbarchi und David Grosso. „Environment-controlled sol–gel soft-NIL processing for optimized titania, alumina, silica and yttria-zirconia imprinting at sub-micron dimensions“. Nanoscale 10, Nr. 3 (2018): 1420–31. http://dx.doi.org/10.1039/c7nr07491c.
Der volle Inhalt der QuelleKim, Hyong-Jun, Wanseo Kim und Hwanhee Cho. „Lambertian Extraction of Light from Organic Light-Emitting Devices Using Randomly Dispersed Sub-Wavelength Pillar Arrays“. Journal of Nanoscience and Nanotechnology 21, Nr. 7 (01.07.2021): 3909–13. http://dx.doi.org/10.1166/jnn.2021.19229.
Der volle Inhalt der QuelleDissertationen zum Thema "Nano imprint lithographie"
MALAQUIN, Laurent. „Dispositifs ultra-sensibles pour le nano-adressage electrique. Application a la detection de biomolecules“. Phd thesis, Université Paul Sabatier - Toulouse III, 2004. http://tel.archives-ouvertes.fr/tel-00009243.
Der volle Inhalt der QuelleRajarathinam, Venmathy. „Imprint lithography and characterization of photosensitive polymers for advanced microelectronics packaging“. Diss., Georgia Institute of Technology, 2010. http://hdl.handle.net/1853/34722.
Der volle Inhalt der QuelleKim, Jung Wuk [Verfasser]. „Application oriented nano-patterning methods based on the liquid transfer imprint lithography / Jung Wuk Kim“. München : Verlag Dr. Hut, 2015. http://d-nb.info/1070123978/34.
Der volle Inhalt der QuelleKrishnaswamy, Arvind. „Substrate Engineering to Control the Synthesis of Carbon Nanotubes“. University of Cincinnati / OhioLINK, 2014. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1413471369.
Der volle Inhalt der QuelleHsu, Shu-han, und 許淑涵. „Development of plastic molds and imprinted materials for micro/nano imprint lithography“. Thesis, 2009. http://ndltd.ncl.edu.tw/handle/39720775600011730199.
Der volle Inhalt der Quelle國立高雄大學
化學工程及材料工程學系碩士班
97
The study focusing on the development of nano/micro imprinting techniques and their applications included three major parts: fabrication of imprinted molds, development of alternative imprinting process, and design of imprintable materials. Two imprinting molds were fabricated: one was plastic hybrid mold and the other was ordered porous mold. In the building of plastic hybrid mold, a design using the protruded area with a thin layer of metal to mask the UV light to prepare a residual layer-free pattern. Three materials were tested as the masking layers: carbon black, electroless plated silver, and deposited gold. As limited in the size of carbon black, the plastic hybrid mold with more than 20 um lines was successfully fabricated. Another silver deposition on the protruded area was achieved by immobilizing a layer of tin salt as a reduction coating. However, the tin layer did not homogeneously and selectively bind to the protruded area of plastic molds, giving a failure deposition on the molds. The direct metal transfer techniques was conducted by using different adhesion work for those contact interfaces to stick and remove the protruded gold layer (negative type) or leave the protruded gold layer (negative type). The metal layer transfer was achieved for a 170 nm featured pattern in a 1.5 cm × 1.5 cm area, while the gold particle transfer technique was able to transfer few hundreds nanometer featured pattern in area of 4 cm diameter. Sintering process at a low temperature (150℃) was performed to stable the layered gold nanoparticles on the protruded area. However, heterogeneous distribution of particles was found after 2 hr of sintering. On the other hand, an ordered, self-assembly of composite film was prepared as a nanoporous mold. We synthesized poly(St-BA-AA) emulsion to blend with silica sol prior to coat and dry the composite, giving a large-areaed polymer film with ordered nanopore arrays with 340 nm of pore diameter, 400 nm of spacing, and 2.2 nm of depth. As for the development of imprinting process, we designed a novel water-based imprint process and its application to imprint an organic/inorganic composite. The process is available for imprinting variety of polymers which can be dispersed or emulsified in water, without using organic solvent, high temperature, heavy pressure. A recipe was tested as a water-based Epoxy prepolymer blended with base-catalyzed tetraethoxysilane precursor, giving a transparent 800nm featured pattern. Another test was conducted to fabricate a nonresidual layered pattern, owing to low viscosity of water-based imprintable recipe. In the design of imprintable materials, a novel UV-curable resist was explored for its two staged irradiation and curing. Using the UV resist, the hierarchical structure was able to build up and its depth was increased to ~523.6 nm without collapse the first micron featured pattern.
Yi, Wu Chun, und 吳俊億. „Development of Nano Electroplate Imprint Lithography“. Thesis, 2006. http://ndltd.ncl.edu.tw/handle/56711018985957536420.
Der volle Inhalt der QuelleV, Anil Kumar T., und Anil Kumar T. V. „Nano Imprint Lithography and GaN GAA Nanowire“. Thesis, 2014. http://ndltd.ncl.edu.tw/handle/xqm526.
Der volle Inhalt der Quelle亞洲大學
資訊工程學系
102
Nanoimprint Lithography: Si master molds are generally patterned by electron-beam lithography (EBL) that is known to be a time consuming nano patterning technique. Thus, developing mold duplication process based on high throughput technique such as nanoimprint lithography can be helpful in reducing its fabrication time and cost. This study aims to develop capabilities in patterning nano structure using thermal nano-imprint lithography. The NEB22 A2, mr- I7000E series negative e-beam resist possess a variety of characteristics desirable for NIL, such as low viscosity, low bulk-volumetric shrinkage, high Young's modulus, high thermal stability, and excellent dry-etch resistance. The excellent oxygen-etch resistance of the barrier material enables a final transfer pattern that is about three times higher than that of the original NIL mold. Based on these imprint on negative photo resist approach is used for pattern transfer into silicon substrates. The result is a high-resolution pattern with feature sizes in the range of nanometer to several microns. We combine Simprint Core simulation software for simulating nanoimprint process and to achieve uniform RLT. Our research results in low RLT as 10-20nm thicknesses for mr-I 7020E photoresist. The simulation results and experimental results are matching. A plot of how RLT across the whole stamp region changes with imprinting duration is shown using simulation. The central, thick line shows the average RLT across the entire stamp; the thin lines indicate the stamp-average RLT plus and minus one standard deviation of the cross-stamp RLT values. Simulated and calibrated for uniform residual layer thickness (RLT) and the cross-sections of RLT are plotted. In cavity filling value of 0 denotes completely empty cavities; a value of 1 in a particular location means that cavities are completely filled in that region. We have achieved completely filled cavities, i.e., value of 1 at all locations. We have achieved RLT around 10nm and even RLT at all location in pattern using mr-I 7020E photoresist imprint. GaN GAA Nanowire: To increase typically low output drive currents from Si Nanowire field-effect transistors (FETs), we show a GaN based GAA Nanowire FET’s effectiveness. The theoretical study is focused on the three dimensional device designs, comparisons, random dopant fluctuation using IFM, and general variability issues including nanowire length, gate work function, and channel thickness are discussed. Performance of GaN GAA Nanowire is found to be increasing as Gate length is increased. Electrical characteristics of FETs including threshold voltage saturation, On/Off current ratio and sub threshold slope (SS) are analysed. GaN GAA structure let to gate control ability improvement compared to Si based Nanowire in electrical performance. The GaN GAA Nanowire subthreshold slope is ~62mV/decade, which is close to the theoretical limit 60 mV/decade and leads to very high Ion/Ioff ratio of 1010-1011. The GaN GAA Nanowire is a very promising candidate for high-performance.
Yin, Bailey Anderson. „Dual field nano precision overlay“. Thesis, 2010. http://hdl.handle.net/2152/ETD-UT-2010-08-1952.
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Huang, Tai-wei, und 黃泰瑋. „Two-Dimensional Photonic Crystal Devices Fabricatedby Nano-Imprint Lithography“. Thesis, 2007. http://ndltd.ncl.edu.tw/handle/01484942222603627441.
Der volle Inhalt der Quelle國立中央大學
電機工程研究所
95
In this study, photonic crystal wavelength division multiplexer (WDM) and polarization filter based on SOI substrate have been demonstrated. The WDM is used to separate the electromagnetic wave at the wavelength of 1.55μm and 1.31μm. The polarization filter can be applied to leach the optical signal of TM polarization in the range of wavelength 1.3μm ~2.1μm. We use the plane wave expansion method (PWE) to simulate the band-gap distribution of the periodical arrayed structure and used finite-differential time-domain (FDTD) method to study the steady state electromagnetic wave propagation simulation. The WDM was fabricated by e-beam lithography and polarization filter was processed by a novel technology “nano-imprint lithography” which has several extremely ascendant advantages: simple process, low production cost and high throughput efficiency. Waveguide measurement system was used in this experiment. The measurement result shows that the performance of the WDM and the polarization filter are both good. So it means that the design of the devices structure and devices process are successful in this study. And it is expectable that more and more nano-scale devices can be fabricated by E-beam lithography and NIL process by consulting the process parameters in this study.
Wei-Hsuan, Hsu. „Increasing uniformity in nano-imprint lithography by designing mold structure“. 2006. http://www.cetd.com.tw/ec/thesisdetail.aspx?etdun=U0016-1303200709321164.
Der volle Inhalt der QuelleBuchteile zum Thema "Nano imprint lithographie"
Pfadler, Thomas, Claudia M. Palumbiny, Wojciech Pisula, Holger C. Hesse, Xinliang Feng, Klaus Müllen, Peter Müller-Buschbaum und Lukas Schmidt-Mende. „Controlled Morphologies by Molecular Design and Nano-Imprint Lithography“. In Elementary Processes in Organic Photovoltaics, 215–42. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-28338-8_9.
Der volle Inhalt der QuelleSon, Ji Won, Nam Ho Song, Sung Han Rhim und Soo Ik Oh. „Prediction of Defects in Nano-Imprint Lithography Using FEM Simulation“. In The Mechanical Behavior of Materials X, 665–68. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-440-5.665.
Der volle Inhalt der QuelleRenn, Jyh Chyang, Yi An Yang und Cherng Shyong Chan. „Developing a Moving-Coil Actuator for Nano-Imprint Lithography System“. In Materials Science Forum, 1027–32. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-990-3.1027.
Der volle Inhalt der QuelleYang, Ki Yeon, Sung Hoon Hong, Heon Lee und Jeong Woo Choi. „Fabrication of Nano-Sized Gold Dot Array Using Bi-Layer Nano Imprint Lithography“. In Materials Science Forum, 446–49. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-995-4.446.
Der volle Inhalt der QuelleKim, Jung Yup, Jae Hyun Kim und Byung Ik Choi. „Mechanical Behavior Simulation of PMMA for Nano Imprint Lithography Using Molecular Dynamics“. In The Mechanical Behavior of Materials X, 979–82. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-440-5.979.
Der volle Inhalt der QuelleYang, Ki Yeon, Jong Woo Kim, Sung Hoon Hong und Heon Lee. „Patterning of the Self-Assembled Monolayer Using the Zero Residual Nano-Imprint Lithography“. In Solid State Phenomena, 523–26. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/3-908451-31-0.523.
Der volle Inhalt der QuelleLee, Heon, Ki Yeon Yang, Sung Hoon Hong, C. D. Schaper und Gun Young Jung. „Nano-Imprint Lithography of 100nm Sized Patterns Using Water Soluble PVA, Poly(Vinyl Alcohol), Template“. In Solid State Phenomena, 661–64. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/3-908451-30-2.661.
Der volle Inhalt der QuelleKonferenzberichte zum Thema "Nano imprint lithographie"
Choi, Jin, S. V. Sreenivasan und Doug Resnick. „UV Nano-Imprint Lithography for Manufacturing Applications“. In ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/detc2007-35527.
Der volle Inhalt der QuelleMendels, David A. „Multi-scale modelling of nano-imprint lithography“. In SPIE 31st International Symposium on Advanced Lithography, herausgegeben von Michael J. Lercel. SPIE, 2006. http://dx.doi.org/10.1117/12.656668.
Der volle Inhalt der QuelleChen, Cheng-Hung, Jia-Yush Yen, Lien-Sheng Chen und Shuo-Hung Chang. „Stitching Technology Using Hybrid Actuators in Nano Imprint“. In ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2008. http://dx.doi.org/10.1115/detc2008-49260.
Der volle Inhalt der QuelleMok, Jinho, Sukwon Lee, JeHyoung Ryu, Hyuk Kim, Sin Kwon, Seong-Gu Baek, Jung-Woo Park und Jungwoo Seo. „Micro Pattern Filling Simulation to See the Effects of Process Parametric Variables on Imprinting“. In ASME 2007 5th International Conference on Nanochannels, Microchannels, and Minichannels. ASMEDC, 2007. http://dx.doi.org/10.1115/icnmm2007-30014.
Der volle Inhalt der QuelleHoule, Frances A., Ann Fornof, Ratnam Sooriyakumaran, Hoa Truong, Dolores C. Miller, Martha I. Sanchez, Blake Davis et al. „Impact of curing kinetics and materials properties on imprint characteristics of resists for UV nano-imprint lithography“. In Advanced Lithography, herausgegeben von Qinghuang Lin. SPIE, 2007. http://dx.doi.org/10.1117/12.712298.
Der volle Inhalt der QuelleLodewijks, Kristof, Bharathkumar Mareddi, Rongchen Qin, Anabel De Proft, Bruno Figeys, Ugo Stella, Myriam Willegems et al. „Multispectral color filters based on self-aligned dual plasmonic gratings fabricated by nano-imprint lithography“. In Integrated Photonics Research, Silicon and Nanophotonics. Washington, D.C.: Optica Publishing Group, 2022. http://dx.doi.org/10.1364/iprsn.2022.iw4b.2.
Der volle Inhalt der QuelleYoshida, Kouji, Kouichirou Kojima, Makoto Abe, Shiho Sasaki, Masaaki Kurihara, Hiroshi Mohri und Naoya Hayashi. „Metrology for templates of UV nano imprint lithography“. In 27th Annual BACUS Symposium on Photomask Technology, herausgegeben von Robert J. Naber und Hiroichi Kawahira. SPIE, 2007. http://dx.doi.org/10.1117/12.746802.
Der volle Inhalt der QuelleHudek, Peter, Dirk Beyer, Timothy R. Groves, Olaf K. Fortagne, William J. Dauksher, David P. Mancini, Kevin J. Nordquist und Douglas J. Resnick. „Shaped beam technology for nano-imprint mask lithography“. In 20th European Conference on Mask Technology for Integrated Circuits and Microcomponents. SPIE, 2004. http://dx.doi.org/10.1117/12.568035.
Der volle Inhalt der QuelleIna, Hideki, Kazuyuki Kasumi, Eigo Kawakami und Kouji Uda. „Critical issues study of nano-imprint tool for semiconductor volume production“. In Advanced Lithography, herausgegeben von Michael J. Lercel. SPIE, 2007. http://dx.doi.org/10.1117/12.710443.
Der volle Inhalt der QuelleGlangchai, Luz Cristal S., Li Shi und Krishnendu Roy. „Nano-Imprint Fabrication of Injectable, Stimuli-Responsive Drug Delivery Vehicles“. In ASME 4th Integrated Nanosystems Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/nano2005-87069.
Der volle Inhalt der QuelleBerichte der Organisationen zum Thema "Nano imprint lithographie"
Burckel, David Bruce, Geoffrey L. Brennecka, Chu-Yeu Peter Yang, Elaine L. Yang und Charles A. Steinhaus. Integration of block-copolymer with nano-imprint lithography : pushing the boundaries of emerging nano-patterning technology. Office of Scientific and Technical Information (OSTI), Oktober 2012. http://dx.doi.org/10.2172/1055650.
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