Dissertationen zum Thema „Measurement tolerance“
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DeBusk, Gerald Kenneth. „An Examination of Organizatinal Performance Measurement System Utilization“. Diss., Virginia Tech, 2003. http://hdl.handle.net/10919/11130.
Der volle Inhalt der QuellePh. D.
Rojas, Elizabeth C. „Development and Validation of the Distress Tolerance Questionnaire (DTQ)“. Scholar Commons, 2017. http://scholarcommons.usf.edu/etd/6943.
Der volle Inhalt der QuelleMorrisette, Jennifer A. „The use of a piezoelectric actuator to improve precision of a coordinate measurement machine“. Thesis, Georgia Institute of Technology, 1997. http://hdl.handle.net/1853/17044.
Der volle Inhalt der QuelleWright, H. L. „Physiological measurement of the influence of Gz baseline on +Gz tolerance in flight“. Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1999. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp01/MQ43410.pdf.
Der volle Inhalt der QuelleSun, Fangting. „On lifetime maximization and fault tolerance measurement in wireless ad hoc and sensor networks“. College Park, Md.: University of Maryland, 2007. http://hdl.handle.net/1903/7843.
Der volle Inhalt der QuelleThesis research directed by: Dept. of Electrical and Computer Engineering . Title from t.p. of PDF. Includes bibliographical references. Published by UMI Dissertation Services, Ann Arbor, Mich. Also available in paper.
Jaša, Aleš. „1. Návrh kontrolních procesů vevýrobě bezpečtnostního ventilu“. Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2011. http://www.nusl.cz/ntk/nusl-229782.
Der volle Inhalt der QuellePetitcuenot, Mathieu. „Maîtrise de la qualité géométrique des pièces de formes complexes sur tout le cycle de conception et fabrication : Application à une aube de turbine“. Thesis, Cachan, Ecole normale supérieure, 2015. http://www.theses.fr/2015DENS0025.
Der volle Inhalt der QuelleMy PhD thesis is integrated into a context of functional dimensioning development in a 3D CAD environment at Snecma, a major player in the aerospace propulsion world. The objectives of this research work are varied but follow one goal: mastery quality geometry throughout the design, control and manufacturing cycle, by the deployment of the ISO standards of tolerancing.At first a functional definition ISO is proposed for parts with complex shapes that make up a turbo-machine while considering issues related to metrology and automatic control without contact. This definition requires some updates of existing standards. Another problem was to meet industrial demands in their entirety by considering the various types of engine parts.A second important part of the work is to develop control and analyze tools for complex 3D shapes for a better understanding of their geometry by separating local and global faults, which do not have the same functional impact.A third part develops a 3D manufacturing transfer strategy on complex workpieces on mounting “6 points” by considering the surface orientation problems.All work ensures compliance of functional requirements, on parts with complex shapes, from definition to the workpiece through the deployment of ISO standards of tolerancing.This work led to a publication in CIRP CAT 2014 China, a Snecma internal development of a quantification tool of global / local defects, a strong wich to develop a 3D transfer generic tool based on the work done, two awards Snecma creativity with one ranked second in 2013 on all the awards and a major change in the control method of form profiles specifications
SARAVANAN, SHANKAR. „EVALUATION OF SPHERICITY USING MODIFIED SEQUENTIAL LINEAR PROGRAMMING“. University of Cincinnati / OhioLINK, 2005. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1132343760.
Der volle Inhalt der QuelleLin-Steadman, Patricia V. „Studying Abroad and Intercultural Outcomes: Differences Experienced Between International Exchange Students and U.S. Study Abroad Students“. Digital Commons @ East Tennessee State University, 2020. https://dc.etsu.edu/etd/3800.
Der volle Inhalt der QuelleHowell, Catherine Johnson. „Tolerance limits based on indirect measurements“. Diss., Georgia Institute of Technology, 1993. http://hdl.handle.net/1853/24862.
Der volle Inhalt der QuelleMišún, Filip. „Návrh automatického cyklu pro posuzování způsobilosti měření obrobkovou sondou na obráběcím centru“. Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2021. http://www.nusl.cz/ntk/nusl-443252.
Der volle Inhalt der QuelleGater, Christian. „Fault-tolerant distributed measurement systems“. Thesis, University of Edinburgh, 1987. http://hdl.handle.net/1842/16990.
Der volle Inhalt der QuelleGoormaghtigh, Frederic. „New insights into the persistence phenomenon“. Doctoral thesis, Universite Libre de Bruxelles, 2016. http://hdl.handle.net/2013/ULB-DIPOT:oai:dipot.ulb.ac.be:2013/235567.
Der volle Inhalt der QuelleDoctorat en Sciences
info:eu-repo/semantics/nonPublished
Broad, Andrea. „Endotoxin tolerance in context : microenvironments, measurements and toll-like receptor interactions“. Thesis, University of Newcastle Upon Tyne, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.443019.
Der volle Inhalt der QuelleBowyer, Matouš. „Multiparametrická diagnostika vysokootáčkového stroje“. Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2019. http://www.nusl.cz/ntk/nusl-402507.
Der volle Inhalt der QuelleCampos, José Alexandre de. „Avaliação experimental do desgaste de canto durante o processo de eletroerosão do AISI H13“. Universidade Tecnológica Federal do Paraná, 2014. http://repositorio.utfpr.edu.br/jspui/handle/1/1165.
Der volle Inhalt der QuelleThe manufacture of molds and dies are rich in detail and complex geometries, requiring more innovative and precise technologes. One of the processes that stands out in the manufacture of molds and dies, is to EDM by penetration (Electrical Discharge Machining - EDM). The cutting by electrical discharge is classified as a non-defined geometry manufacturing process where material removal is carried out by repeated electrical discharge between two electrodes electrically conductive. The tool wear is a major measurement parameters in machining performance by EDM. The biggest problem caused by the electrode corner wear is the tool geometry change during the machining by changing the geometric tolerance and dimensional cavity. This paper proposes dimensional evaluation of the electrode corner wear, during the machining of the EDM process, varying the front surface of the electrode angle. Another purpose is to create an index, called rounding rate, which takes into account the areas of electrode corner wear due to the removed area of the workpiece material. The results showed that the copper electrode, copper tungsten and graphite, has a large corner radius growth at the beginning of machining, stabilizing these values with higher process time. The front surface of the electrode angle influence directly on the electrode corner wear. Graphite electrodes showed no corner wear rounding behavior during the tests. For rounding rate index tungsten copper electrodes had the lowest value presented in the machining of AISI H13.
Kallakuri, PavanaSirisha. „A measurement based approach to designing fault-tolerant controllers for multivariable systems“. Thesis, Tennessee State University, 2016. http://pqdtopen.proquest.com/#viewpdf?dispub=10158554.
Der volle Inhalt der QuelleThis research introduces two new methodologies to design a set of controllers such that every controller in the set preserves closed-loop stability of a given multi variable plant under prescribed loop failures. The proposed approaches differ from existing techniques in two ways: First, these methods are strictly based on frequency response data of the plant that can be easily measured by experiments. No mathematical models or system identification processes are used. Second, while most control design methods find one controller, the proposed methods design a set of controllers satisfying the control objective. Two approaches are presented with examples illustrating the controller design. Integrity test results of the designed controllers under pre-specified loop failures are also presented.
Sillitoe, Judith Ann. „A Study of Sacral Tissue Tolerance to Pressure Using Transcutaneous Measurements of Oxygen and Carbon Dioxide“. Thesis, University of Southampton, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.509478.
Der volle Inhalt der QuelleAhn, Charlene Sonja Preskill John P. „Extending quantum error correction : new continuous measurement protocols and improved fault-tolerant overhead /“. Diss., Pasadena, Calif. : California Institute of Technology, 2004. http://resolver.caltech.edu/CaltechETD:etd-05192004-164713.
Der volle Inhalt der QuelleMezher, Rawad. „Randomness for quantum information processing“. Electronic Thesis or Diss., Sorbonne université, 2019. https://accesdistant.sorbonne-universite.fr/login?url=https://theses-intra.sorbonne-universite.fr/2019SORUS244.pdf.
Der volle Inhalt der QuelleThis thesis is focused on the generation and understanding of particular kinds of quantum randomness. Randomness is useful for many tasks in physics and information processing, from randomized benchmarking , to black hole physics , as well demonstrating a so-called quantum speedup , and many other applications. On the one hand we explore how to generate a particular form of random evolution known as a t-design. On the other we show how this can also give instances for quantum speedup - where classical computers cannot simulate the randomness efficiently. We also show that this is still possible in noisy realistic settings. More specifically, this thesis is centered around three main topics. The first of these being the generation of epsilon-approximate unitary t-designs. In this direction, we first show that non-adaptive, fixed measurements on a graph state composed of poly(n,t,log(1/epsilon)) qubits, and with a regular structure (that of a brickwork state) effectively give rise to a random unitary ensemble which is a epsilon-approximate t-design. This work is presented in Chapter 3. Before this work, it was known that non-adaptive fixed XY measurements on a graph state give rise to unitary t-designs , however the graph states used there were of complicated structure and were therefore not natural candidates for measurement based quantum computing (MBQC), and the circuits to make them were complicated. The novelty in our work is showing that t-designs can be generated by fixed, non-adaptive measurements on graph states whose underlying graphs are regular 2D lattices. These graph states are universal resources for MBQC. Therefore, our result allows the natural integration of unitary t-designs, which provide a notion of quantum pseudorandomness which is very useful in quantum algorithms, into quantum algorithms running in MBQC. Moreover, in the circuit picture this construction for t-designs may be viewed as a constant depth quantum circuit, albeit with a polynomial number of ancillas. We then provide new constructions of epsilon-approximate unitary t-designs both in the circuit model and in MBQC which are based on a relaxation of technical requirements in previous constructions. These constructions are found in Chapters 4 and 5
Saathof, David. „An investigation of the measurement accuracy and productivity of a Waratah HTH 625c Processor Head“. Thesis, University of Canterbury. School of Forestry, 2014. http://hdl.handle.net/10092/10459.
Der volle Inhalt der QuelleGovinder, Kuvendran. „Theoretical analyses and design, construction and testing of a flow loop for the study of generalised forced and natural convection boiling heat transfer phenomena on typical light-water nuclear reactor fuel pin configurations“. Diss., University of Pretoria, 2019. http://hdl.handle.net/2263/71554.
Der volle Inhalt der QuelleDissertation (MSc)--University of Pretoria, 2019.
Mechanical and Aeronautical Engineering
MSc (Applied Science - Mechanics)
Unrestricted
Shaporin, Alexey. „Dynamic parameter identification techniques and test structures for microsystems characterization on wafer level“. Doctoral thesis, Universitätsbibliothek Chemnitz, 2010. http://nbn-resolving.de/urn:nbn:de:bsz:ch1-200901902.
Der volle Inhalt der QuelleIn this work a method for the characterization of microsystems with movable components is presented. The method allows to determine the relevant parameters and their variations on wafer level if the nominal shape of the structure and the type of deviations are known. The method is based on a comparison of the numerically calculated and experimentally measured Eigenfrequencies of the microsystems. For that purpose, the relationships between various Eigenfrequencies and the searched parameters are calculated by parameter variation analysis and the results of this analysis are approximated with appropriate functions. A Laser Doppler vibrometer based motion analyzer is used to determine the frequency response function of the micromechanical structure and extract Eigenfrequencies. The comparison of the measured and the calculated frequencies provides values for the searched parameters. The key element of the developed method is the measurement on special test structures that are placed in the wafer layout next to the actual microsystems and processed in the same technological process parallel to the actual microsystems. Algorithms for designing the test structures and their placement in the wafer layout are shown, taking into account the design of the actual microsystems and the function parameters of the technological process as well as material characteristics. As a result, a library of standard test structures for function relevant parameters is available. A general guideline for the measurement on the test structures is presented. The presented method is verified on various microsystems and extended to a whole class of microsystems with movable components
Venkataraman, Sunitha. „Systematic Analysis of the Small-Signal and Broadband Noise Performance of Highly Scaled Silicon-Based Field-Effect Transistors“. Diss., Georgia Institute of Technology, 2007. http://hdl.handle.net/1853/16232.
Der volle Inhalt der QuelleShaporin, Alexey. „Dynamic parameter identification techniques and test structures for microsystems characterization on wafer level“. Doctoral thesis, Chemnitz Univ.-Verl, 2009. http://d-nb.info/1000815250/04.
Der volle Inhalt der Quelle„Reconciling The Differences Between Tolerance Specification And Measurement Methods“. Master's thesis, 2014. http://hdl.handle.net/2286/R.I.26804.
Der volle Inhalt der QuelleDissertation/Thesis
Masters Thesis Mechanical Engineering 2014
Li, Jun-Jie, und 李俊杰. „Five-axis Machine Tool machanism errors tolerance measurement and compensation research“. Thesis, 2011. http://ndltd.ncl.edu.tw/handle/54661628193352628867.
Der volle Inhalt der Quelle明志科技大學
機電工程研究所
99
The purpose of the study is to compensate for geometric errors for five-axis machine tools in the static error so the study establishes the error model according to the relationship between geometric errors in five-axis machine tools. The model is to use the Homogeneous transformation matrix (HTM) to calculate five-axis kinematic equations, which is use matrix to multiplying workpiece coordinate system for the full five-axis machine tool sector errors, compared to machine mathematical relationship of coordinate system, and use the software to prove five-axis machine tool error compensation matrix. The study uses measurement machine tools to analyze each axis’ movement accuracy, micro laser interferometer, Coordinate Measuring Machine (CMM), laser auto-collimator, and 5D laser to measure each axis’ error to bring into five axis machine tools’ error compensation matrix and establishes full five-axis machine tool sector errors. The study uses Mastercam simulation cutting software to simulate NC codes of tool path in cutting material. Through the calculation of the Error Matrix by five-axis machine tools, the result is the revision of NC code showing that tolerance is 2μm after error correction. The study compares machining between 5-axis and 3-axis to confirm 5-axis machine tools are better than traditional 3-axis machine tools in tool path setting, NC code, processing time, and curve and surface milling. keywords: machine tool, five-axis machine tool, Homogeneous Transformation Matrix.
Jhao, Shu-Syun, und 趙俞勛. „Wide Measurement Range and High Supply Voltage Variation Tolerance All-Digital On-Chip Delay Measurement Circuit Design“. Thesis, 2014. http://ndltd.ncl.edu.tw/handle/19567490865686128832.
Der volle Inhalt der Quelle輔仁大學
電機工程學系碩士班
102
In this thesis, wide measurement range and high supply voltage variation Tolerance all-digital on-chip delay measurement (OCDM) circuit design are proposed. The OCDM circuits not only have a high immunity to supply voltage variations without extra self-biasing or calibration circuit, but also achieve high wide measurement range. The proposed OCDM circuit is implemented in TSMC 0.18μm standard CMOS technology, and simulation results show that measurement range can be improved to 1.2ns. Because using the vernier delay line with low supply sensitivity and two all-digital delay-locked loops, also the vernier delay line’s delay variation is about 1% with + 10% supply voltage variation. Also, the measurement resolution of this circuit is about 20.388ps with + 10% supply voltage variation.The proposed OCDM circuits can be implemented in all-digital design manner, making it very suitable for SOC application as well as system-level integration.
Yih, Hsing Jeng, und 熊正一. „Reserching for Evaluating of Coordinate Measurement Geometrical Tolerance and Constructing CAD Figure“. Thesis, 1993. http://ndltd.ncl.edu.tw/handle/33735341995144134091.
Der volle Inhalt der QuelleHUANG, Chien-hua, und 黃建華. „The Research and Analysis of Color Quality Tolerance for Fabrics by Using Different Measurement Methods“. Thesis, 2011. http://ndltd.ncl.edu.tw/handle/51625020556018975232.
Der volle Inhalt der Quelle亞東技術學院
纖維與材料應用產業研發碩士專班
99
The color and quality of fabric are very important for every customer, because correct color and quality present designers ideas accurately. Previously, most of color communications used color standard ships to be the reference basis in supply chain of textile. However, Spectrophotometer changes the way of color communications. According to analysis spectrophotometer, People discovered a serious blind spot in using color standards. Therefore, the communication of digital color control has became fashion nowadays. Even though the accuracy of spectrophotometer already can provides stable and authoritative analysis. But for reproducibility between human eyes and spectrophotometer, there hasn’t a specific research to expound the reliable. This research will focus on my company’s fabric, choose some appropriate fabric for spectrophotometer to measure, and proceed analysis. On the other hand, we have used digital single-lens reflex camera to be second tool for catching color to show. The reliable among spectrophotometer, digital single-lens reflex camera and human eyes is qualify for being trusted and used.
Hsiu-Fan, Lai, und 來修帆. „High Delay Resolution and High Supply Voltage Variation Tolerance All-Digital On-Chip Delay Measurement Circuit Design“. Thesis, 2014. http://ndltd.ncl.edu.tw/handle/22443159029347985607.
Der volle Inhalt der Quelle輔仁大學
電機工程學系碩士班
102
In this thesis, two high delay resolution and high supply voltage variation tolerance all-digital on-chip delay measurement (OCDM) circuits for the high performance system-on-chip (SoC) applications are proposed. One is proposed OCDM circuit and the other is proposed wide-range OCDM circuit. Both of proposed OCDM circuits not only have a high immunity to supply voltage variations without extra self-biasing or calibration circuit, but also achieve high delay measurement resolution. The proposed OCDM circuit is implemented in TSMC 90nm standard CMOS technology, and simulation results show that delay measurement resolution can be improved to 1.04ps, and the average delay resolution is 11fs with + 10% supply voltage variation. The proposed wide-range OCDM circuit is implemented in TSMC 0.18μm CMOS technology, and simulation results show that delay measurement resolution can be improved to about 1ps, and the average delay variation is 0.692% with + 10% supply voltage variation. The proposed OCDM circuits can be implemented in all-digital design manner, making it very suitable for SOC application as well as system-level integration.
Jiang, Jia-Yu, und 姜家瑜. „The Measurement of Tolerance for College Students in Taiwan and the Exploration of its correlation with other variables“. Thesis, 2014. http://ndltd.ncl.edu.tw/handle/65992506733960204221.
Der volle Inhalt der Quelle國立臺南大學
教育學系測驗統計碩博士班
102
The purpose of this study is to understand college students' attitude of tolerance and its correlation with different background variables (gender, education level, related course experience, partisan orientation, religious belief, frequency of making Internet comments) in Taiwan. For the purpose of this research, researchers use "situational tolerance scale" as the research tool. The results showed that college students obtained average score of 61.80 on the scale, around in the middle of the possible range of total score. Overall scale reliability is .821 and most of the indices of goodness of fit from confirmatory factor analysis fall within the acceptable range. Results of ANOVA analysis for background variables indicated that different levels of education, related course experience, and frequency of making Internet comments are significantly correlated with the performance on the scale.
Huang, Kau-Lin, und 黃國林. „Chlorophyll fluorescence measurement distinguishing the tolerance and the susceptibility of papayas(Carica papaya L.) to Papaya ringspot virus“. Thesis, 2004. http://ndltd.ncl.edu.tw/handle/77574167770476640072.
Der volle Inhalt der Quelle國立臺灣大學
園藝學研究所
92
‘Tainunag No.2’ papaya cultivar is well known and popular in Taiwan, although it is susceptible to Papaya ringspoot virus ( PRSV ). Chlorophyll fluorescence is a tool to characterize photosystematic parameters of papaya plants under biotic stress of infection of the severe mottle with necrosis strain of Papaya ringspoot virus ( PRSV-SMN ) under the growth chamber condition. There were not significantly different of ratio of variable fluorescence to maximum fluorescence ( Fv/Fm ) among leaflets of the papaya leaf and among different leaf orders at phyllotaxy. However, the minimum fluorescence (Fo) in the lower part leaves was significantly higher compared to that of younger leaves while the Fv/Fm decreased. Parameters of chlorophyll fluorescence such as Fo, Fv, Fv/Fm were not significant different difference no matter when you measured during the day or at the night. Five weeks after inoculation of PRSV-SMN, fluorescence parameters, net photosynthetic rates (Pn), chlorophyll meter reading (CMR) and leaf temperature were dramatically changed at the infected leaves compared to that at the control plants. The ratio of variable fluorescence to minimum fluorescence (Fv/Fo), Fv/Fm and Pn significantly decreased 53%, 90% and 58% compared to that at the healthy control plants, respectively. So the disease severity progressed, the change of photosystematic parameters became more serious. Results might indicate that photosynthetic apparatus was serios damage due to virus infection. The viral susceptibility of ‘Thinung No.2’ was apparently able to analyze changes in parameters of fluorescence by chlorophyll fluorescence and gas exchange measurement.
Tzu-Wei, Chao. „Flip-chip transition measurement and design of performance improved inductors and higher process tolerance coupled mutual inductors in multilayer structure“. 2006. http://www.cetd.com.tw/ec/thesisdetail.aspx?etdun=U0001-2707200615252300.
Der volle Inhalt der QuelleChao, Tzu-Wei, und 趙子威. „Flip-chip transition measurement and design of performance improved inductors and higher process tolerance coupled mutual inductors in multilayer structure“. Thesis, 2006. http://ndltd.ncl.edu.tw/handle/37660440575992865804.
Der volle Inhalt der Quelle國立臺灣大學
電子工程學研究所
94
There are three topics in this thesis. The first topic is the flip-chip transition measurement up to millimeter wave frequency. The second is the design of performance improved inductors in the LTCC substrate. The last is the capacitor and coupled inductor with high process tolerance in the multilayer structure. The characteristics of the conventional flip-chip are studied and obtained by the simulation. Its narrowband and wideband improvements are simulated and presented. Then we propose two measurement methods to extract the property of the flip-chip up to millimeter wave frequency. One is back-to-back flip-chip measurement method and the other is PRM (port reduction method). The programmable termination in CMOS circuit is designed and simulated for PRM. To optimize the inductor design, the influence of the geometry on the inductor’s performance are introduced and analyzed. Then the spiral, multilayer, helical and solenoid inductors are designed and its performance on inductance, quality factor and self resonant frequency are compared. The spiral inductors with patterned or hollow ground are analyzed and designed to improve its performance. Finally, the center tapped inductors are designed for differential circuit with better symmetry property. All of inductors are designed in the LTCC substrate. The capacitor and coupled inductor with high process tolerance are proposed to withstand the misalignment between stacked layers due to process variation. The transmission zero circuit and bandpass filter implemented with these components are designed and simulated to test the performance of high process tolerance in the circuit level.
Zhao, Yaoyao. „An Integrated Process Planning System for Machining and Inspection“. Phd thesis, 2009. http://tel.archives-ouvertes.fr/tel-00726013.
Der volle Inhalt der Quelle黃名宏. „Jitter Tolerant Differential Non-linearity Measurement“. Thesis, 2007. http://ndltd.ncl.edu.tw/handle/59830491459141580458.
Der volle Inhalt der Quelle國立交通大學
電機學院碩士在職專班電機與控制組
96
As the prosperity of technology, circuit becomes more complicated and scale is going to be smaller. Thus, there’re many problems which are used to be treated as bias and can be ignored originally become much difficulty to overcome at present , jitter for example .Differential non-linearity measurement (Linear Ramp histogram method) introduced in IEEE 1057 can’t measure Differential non-linearity precisely within reasonable time frame in the case of turbulent jitter. To have accurate measurement of Differential non-linearity under the influence of jitter, we propose a method called “Cumulative Differential non-linearity” in this paper. It can measure Differential non-linearity with jitter allowed. We use the characteristic of jitter to analyze Differential non-linearity. Compared with the method of Linear Ramp histogram method, we can get more precise Differential non-linearity by less time of sampling in the same test environment with jitter effect.
Rakhmawati, Dwi Yuli, und 呂估麗. „Assessing Process Capability for Asymmetric Tolerances with Gauge Measurement Errors“. Thesis, 2015. http://ndltd.ncl.edu.tw/handle/86732400480098055373.
Der volle Inhalt der Quelle國立臺灣科技大學
工業管理系
103
Gauge measurement errors (GME) began to play an important role in many types of manufacturing industries because it would affect the estimation and assessment of the process capability. In recent years, the issue of process capability assessment in the presence of GME for cases with symmetric tolerances was investigated enthusiastically. However, even processes with symmetric tolerances are very common in practical situations, cases of asymmetric tolerances also occur in manufacturing industries. In this dissertation, generalized confidence interval (GCI), sampling distribution (SD), and modified sampling distribution (MSD) approaches are applied to assess the performances of processes with asymmetric tolerances in the presence of the GME. To examine and compare the performance of the proposed approaches, an exhaustive simulation under various conditions was conducted. The conclusion is that the proposed approaches appear quite satisfactorily for assessing process performance with asymmetric tolerances in the presence of GME in terms of the Coverage Rate (CR) and the Average Value of Lower Confidence Bound (AVLCB). Examples are presented to illustrate the applicability of the proposed approaches in real factory condition.
Ouyang, Yingkai. „A More Accurate Measurement Model for Fault-Tolerant Quantum Computing“. Thesis, 2009. http://hdl.handle.net/10012/4270.
Der volle Inhalt der QuelleChen, Kuo-Jui, und 陳國瑞. „Motion-Tolerant Automatic Remote Multiple Targets Physiological Signals Measurements“. Thesis, 2016. http://ndltd.ncl.edu.tw/handle/24240502777521030171.
Der volle Inhalt der Quelle元智大學
電機工程學系
104
Non-contact equipment for measuring physiological signal is a challenge task. Especially, to track multi-targets respiratory rate is much more difficult due to the vertical motion from upper-body is not conspicuous. Respiratory rate is an important physiological signal which is highly correlated to vital signs, diseases, and emotions. Therefore, a real-time robust image-based technique is developed for measuring multi-targets respiratory rate variation. In this work, we propose an ultrafast method to detect human body using depth information only. The front/back body of humans can be detected. In addition, under the demand of computation efficiency the salient area is found by Haar-like features from upper body. The vertical body motions estimated from optical flow through consecutive frames are decomposed by a median motion filter and smoothed by local mean filter. Finally, the respiratory rate is calculated by zero-crossing method. For performance evaluation, four kinds of experiment are conducted. The experiment results show that our proposed system for measuring respiratory rate has achieved a high accuracy using an extensive dataset.
Ahn, Charlene Sonja. „Extending Quantum Error Correction: New Continuous Measurement Protocols and Improved Fault-Tolerant Overhead“. Thesis, 2004. https://thesis.library.caltech.edu/1873/1/CSAthesisv4.pdf.
Der volle Inhalt der QuelleQuantum mechanical applications range from quantum computers to quantum key distribution to teleportation. In these applications, quantum error correction is extremely important for protecting quantum states against decoherence. Here I present two main results regarding quantum error correction protocols.
The first main topic I address is the development of continuous-time quantum error correction protocols via combination with techniques from quantum control. These protocols rely on weak measurement and Hamiltonian feedback instead of the projective measurements and unitary gates usually assumed by canonical quantum error correction. I show that a subclass of these protocols can be understood as a quantum feedback protocol, and analytically analyze the general case using the stabilizer formalism; I show that in this case perfect feedback can perfectly protect a stabilizer subspace. I also show through numerical simulations that another subclass of these protocols does better than canonical quantum error correction when the time between corrections is limited.
The second main topic is development of improved overhead results for fault-tolerant computation. In particular, through analysis of topological quantum error correcting codes, it will be shown that the required blowup in depth of a noisy circuit performing a fault-tolerant computation can be reduced to a factor of O(log log L), an improvement over previous results. Showing this requires investigation into a local method of performing fault-tolerant correction on a topological code of arbitrary dimension.
Köcher, Paul. „Hydraulic traits and their relevance for water use strategies in five broad-leaved tree species of a temperate mixed forest“. Doctoral thesis, 2012. http://hdl.handle.net/11858/00-1735-0000-0001-BC4A-8.
Der volle Inhalt der QuelleWEI-LING, LIN, und 林瑋玲. „On-Chip All-Digital Low-Power High Resolution Jitter Measurement Circuit with High Variation-Tolerant Working on 1GHz to 3GHz“. Thesis, 2016. http://ndltd.ncl.edu.tw/handle/61973217222778364682.
Der volle Inhalt der Quelle國立中正大學
電機工程研究所
104
System on chip has been a major development of the VLSI circuit. When many different circuits into a chip, the timing between circuits and circuits must be controlled accurately. PLL circuit is used to generate the source clock in the SoC system. If the clock jitter of the PLL circuit become too much, the mistakes of system operation will be generated. But it is difficult to measure the output clock jitter of the PLL circuit accurately by using external measuring equipments. It not only need to take the high cost of equipment but also the noise may cause that the measured result is not true to the original. For all these reasons, the built-in jitter measurement is be produced. The features of the On-Chip All-Digital High Resolution Jitter Measurement Circuit with High Variation-Tolerant working on 1GHz to 3GHz are high application, high-resolution, process variation, low power and without reference clock. This proposed circuit use self-sampling technique to eliminate the requirement of the reference clock and Calibration circuit to promote the process variation tolerance. in addition, this proposed circuit uses the time amplifier circuit to increase the high accuracy. The On-Chip All-Digital Low-Power High Resolution Jitter Measurement Circuit with High Variation-Tolerant working on 1GHz to 3GHz is designed in UMC 28nm process and TSMC 28nm process. The operating frequency range of this proposed circuit is from 1GHz to 3GHz. The total resolution of this proposed circuit is 0.59ps, power consumption is 0.62mW and the area of the chip is 0.0032mm2.