Bücher zum Thema „Electronic device testing“

Skinner, A. J. Long-term results of accelerated life-tests on optocoupler devices. Leatherhead, Surrey, England: ERA Technology, 1992.

1943-, Agrawal Vishwani D., Hrsg. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Boston: Kluwer Academic, 2000.

International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics (1997 Kiev, Ukraine). International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics: 13-15 May 1997, Kiev, Ukraine. Herausgegeben von Svechnikov Sergeĭ Vasilʹevich, Valakh M. I͡A︡, SPIE Ukraine Chapter, Ukrainian Physical Society und Society of Photo-optical Instrumentation Engineers. Bellingham, Wash., USA: SPIE, 1998.

Vasilʹevich, Svechnikov Sergeĭ, Valakh M. I͡A︡, SPIE Ukraine Chapter, International Association of the Academies of Sciences. und Society of Photo-optical Instrumentation Engineers., Hrsg. International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: [proceedings] 11-13 May, 1995, Kiev, Ukraine. Bellingham, Wash: SPIE, 1995.

Guide to test methods, performance requirements, and installation practices for electronic sirens used on law enforcement vehicles. Washington, DC: U.S. Dept. of Justice, Office of Justice Programs, National Institute of Justice, 2000.

Wagner, Randall. Guide to test methods, performance requirements, and installation practices for electronic sirens used on law enforcement vehicles. Washington, DC: U.S. Dept. of Justice, Office of Justice Programs, National Institute of Justice, 2000.

Commission, United States International Trade. In the matter of certain hardware logic emulation systems and components thereof. Washington, DC: U.S. International Trade Commission, 1996.

Commission, United States International Trade. In the matter of certain hardware logic emulation systems and components thereof. Washington, DC: U.S. International Trade Commission, 1998.

ESD: Circuits and devices. Hoboken, NJ: John Wiley, 2006.

Bryant, Richard W. Fiber-optic test equipment: A worldwide analysis. Norwalk, CT: Business Communications Co., 1993.

IEEE International Conference on Microelectronic Test Structures (1997 Monterey, Calif.). 1997 IEEE International Conference on Microelectronic Test Structures proceedings: March 17-20, 1997, Monterey, California. Piscataway, NJ: IEEE Service Center, 1997.

International, Test Conference (34th 2003 Charlotte N. C. ). Proceedings: Board and system test track. Washington, D.C: International Test Conference, 2003.

Electronics technology handbook. New York: McGraw-Hill, 1999.

International Test Conference (34th 2003 Charlotte, N.C.). Proceedings International Test Conference 2003: [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA. Washington, D.C: International Test Conference, 2003.

1959-, Roberts Gordon W., Hrsg. Analog test signal generation using periodic [sigma delta]-encoded data streams. Boston: Kluwer Academic, 2000.

Cataldo, Andrea. Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011.

Chakrabarty, Krishnendu. Test resource partitioning for system-on-a-chip. Boston: Kluwer Academic Publishers, 2002.

Workshop on Mechanical Reliability of Polymeric Materials and Plastic Packages of IC Devices (1998 Paris, France). Proceedings of the 1998 Workshop on Mechanical Reliability of Polymeric Materials and Plastic Packages of IC Devices: Presented at Hotel Concorde Saint-Lazare, November 29-December 2, 1998, Paris, France. Herausgegeben von Suhir Ephraim. New York: American Society of Mechanical Engineers, 1998.

Pearton, S. J., K. S. Jones und H. Kanber. III-V Electronic and Photonic Device Fabrication and Performance: Volume 300. University of Cambridge ESOL Examinations, 2014.

S, Jones K., Pearton S. J, Kanber H und Materials Research Society, Hrsg. III-V electronic and photonic device fabrication and performance: Symposium held April 12-15, 1993, San Francisco, California, U.S.A. Pittsburgh, Pa: Materials Research Society, 1993.

Pearton, S. J., und K. S. Jones. Iii-V Electronic and Photonic Device Fabrication and Performance: Symposium Held April 12-15, 1993, San Francisco, California, U.S.A. (Materials Research Society Symposium Proceedings). Materials Research Society, 1993.

Adams, R. Dean. High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing). Springer, 2002.

Agrawal, Vishwani D., und Michael L. Bushnell. Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17) (Frontiers in Electronic Testing). Springer, 2000.

Hamdioui, Said. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing). Springer, 2004.

M, Villaran, U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering. und Brookhaven National Laboratory, Hrsg. Selected fault testing of electronic isolation devices used in nuclear power plant operation. Washington, DC: Division of Engineering, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 1994.

Lockin Thermography Basics And Use For Evaluating Electronic Devices And Materials. Springer, 2010.

Chakrabarty, Krishnendu, Vikram Iyengar und Anshuman Chandra. Test Resource Partitioning for System-on-a-Chip (FRONTIERS IN ELECTRONIC TESTING Volume 20) (Frontiers in Electronic Testing). Springer, 2002.

Digital Microfluidic Biochips: Synthesis, Testing, and Reconfiguration Techniques. CRC, 2006.

Vasilʹevich, Svechnikov Sergeĭ, Valakh M. I͡A︡, Society of Photo-optical Instrumentation Engineers. Ukraine Chapter., Institut poluprovodnikov (Akademii͡a︡ nauk Ukraïny) und Society of Photo-optical Instrumentation Engineers., Hrsg. Selected papers on optics and photonics: Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics. Bellingham, Wash., USA: SPIE, 2003.

Clive, Hayzelden, Hetherington Crispin und Ross Frances, Hrsg. Electron microscopy of semiconducting materials and ULSI devices. Warrendale, Pa: Materials Research Society, 1998.

Reliability, packaging, testing, and characterization of MEMS/MOEMS VI: 23-24 January, 2007, San Jose, California, USA. Bellingham, Wash: SPIE, 2007.

In the matter of certain hardware logic emulation systems and components thereof: Modification of temporary exclusion order. Washington, DC: U.S. International Trade Commission, 1997.

L, Shuck Thomas, und Dryden Flight Research Facility, Hrsg. Flight-testing of the self-repairing flight control system using the F-15 highly integrated digital electronic control flight research facility. Edwards, Calif: National Aeronautics and Space Administration, Ames Research Center, Dryden Flight Research Facility, 1990.

L, Shuck Thomas, und Dryden Flight Research Facility, Hrsg. Flight-testing of the self-repairing flight control system using the F-15 highly integrated digital electronic control flight research facility. Edwards, Calif: National Aeronautics and Space Administration, Ames Research Center, Dryden Flight Research Facility, 1990.

L, Shuck Thomas, und Dryden Flight Research Facility, Hrsg. Flight-testing of the self-repairing flight control system using the F-15 highly integrated digital electronic control flight research facility. Edwards, Calif: National Aeronautics and Space Administration, Ames Research Center, Dryden Flight Research Facility, 1990.

L, Shuck Thomas, und Dryden Flight Research Facility, Hrsg. Flight-testing of the self-repairing flight control system using the F-15 highly integrated digital electronic control flight research facility. Edwards, Calif: National Aeronautics and Space Administration, Ames Research Center, Dryden Flight Research Facility, 1990.

Voldman, Steven H. Esd: Physics and Devices. Wiley & Sons, Incorporated, John, 2008.

Voldman, Steven H. ESD: Circuits and Devices. Wiley, 2015.

Voldman, Steven H. Esd: Circuits and Devices. Wiley & Sons, Incorporated, John, 2015.

Voldman, Steven H. Esd: Circuits and Devices. Wiley & Sons, Incorporated, John, 2015.

Voldman, Steven H. Esd: Circuits and Devices. Wiley & Sons, Incorporated, John, 2008.

Institute Of Electrical and Electronics Engineers und IEEE Electron Devices Society. 1997 IEEE International Conference on Microelectronics Test Structures Proceedings: March 17-20, 199Y, Monterey, California. Institute of Electrical & Electronics Enginee, 1997.

Roberts, G. W., und Benoit Dufort. Analog Test Signal Generation Using Periodic S-Encoded Data Streams (The Kluwer International Series in Engineering and Computer Science Volume 591) (The ... Series in Engineering and Computer Science). Springer, 2000.

Cataldo, Andrea, Egidio De Benedetto und Giuseppe Cannazza. Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications. Springer, 2011.

Cataldo, Andrea, Egidio De Benedetto und Giuseppe Cannazza. Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications. Springer, 2013.